TWI382191B - - Google Patents
Info
- Publication number
- TWI382191B TWI382191B TW97113811A TW97113811A TWI382191B TW I382191 B TWI382191 B TW I382191B TW 97113811 A TW97113811 A TW 97113811A TW 97113811 A TW97113811 A TW 97113811A TW I382191 B TWI382191 B TW I382191B
- Authority
- TW
- Taiwan
Links
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW97113811A TW200944809A (en) | 2008-04-16 | 2008-04-16 | LED light source testing fixture and LED testing method using the same |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW97113811A TW200944809A (en) | 2008-04-16 | 2008-04-16 | LED light source testing fixture and LED testing method using the same |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200944809A TW200944809A (en) | 2009-11-01 |
TWI382191B true TWI382191B (enrdf_load_stackoverflow) | 2013-01-11 |
Family
ID=44869506
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW97113811A TW200944809A (en) | 2008-04-16 | 2008-04-16 | LED light source testing fixture and LED testing method using the same |
Country Status (1)
Country | Link |
---|---|
TW (1) | TW200944809A (enrdf_load_stackoverflow) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI447409B (zh) * | 2010-12-31 | 2014-08-01 | Advanced Optoelectronic Tech | 發光二極體封裝結構檢測裝置及檢測方法 |
CN102680912A (zh) * | 2011-03-09 | 2012-09-19 | 展晶科技(深圳)有限公司 | 光源检测装置 |
CN102650676A (zh) * | 2012-05-02 | 2012-08-29 | 威力盟电子(苏州)有限公司 | Led测试装置以及led测试方法 |
CN102654558A (zh) * | 2012-05-03 | 2012-09-05 | 威力盟电子(苏州)有限公司 | Led测试装置 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4842526A (en) * | 1988-02-02 | 1989-06-27 | Digital Equipment Corporation | Test fixture for electronic components |
US5485096A (en) * | 1994-04-05 | 1996-01-16 | Aksu; Allen | Printed circuit board tester having a test bed with spring probes and easily replaceable switch cards |
US6530279B1 (en) * | 2002-03-07 | 2003-03-11 | Screening Systems, Inc. | Fixture for holding electronic components for vibration testing |
US6750973B2 (en) * | 2002-02-20 | 2004-06-15 | Agilent Technologies, Inc. | Test structure for simultaneously characterizing two ports of an optical component using interferometer-based optical network analysis |
-
2008
- 2008-04-16 TW TW97113811A patent/TW200944809A/zh not_active IP Right Cessation
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4842526A (en) * | 1988-02-02 | 1989-06-27 | Digital Equipment Corporation | Test fixture for electronic components |
US5485096A (en) * | 1994-04-05 | 1996-01-16 | Aksu; Allen | Printed circuit board tester having a test bed with spring probes and easily replaceable switch cards |
US6750973B2 (en) * | 2002-02-20 | 2004-06-15 | Agilent Technologies, Inc. | Test structure for simultaneously characterizing two ports of an optical component using interferometer-based optical network analysis |
US6530279B1 (en) * | 2002-03-07 | 2003-03-11 | Screening Systems, Inc. | Fixture for holding electronic components for vibration testing |
Also Published As
Publication number | Publication date |
---|---|
TW200944809A (en) | 2009-11-01 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |