TWI377387B - Active device array substrates and repairing methods thereof - Google Patents

Description

1377387 0710203ITW 26596twf.doc/n IX. Description of the Invention: [Technical Field] The present invention relates to an active device array substrate and a repair method thereof, and particularly relates to an active device array substrate having a good repair rate and Repair method. [Prior Art] Although the liquid crystal display technology has become hot, the display panel inevitably generates some defects during the manufacturing process, and these defects cause sensory discomfort when the display is developed. If you directly discard these defective display panels, the manufacturing costs will increase dramatically. In general, it is very difficult to rely solely on the improvement of process technology to achieve zero defects, so the repair technology of liquid crystal display panels becomes quite important. In conventional liquid crystal display panels, the germanium on the active device array substrate is usually repaired by means of laser welding or laser cutting. FIG. 1A is a schematic diagram of a conventional active device array substrate. Referring to FIG. 1A, a conventional active device array substrate 1A includes a substrate u, a plurality of pixel units 12, a plurality of scanning lines 14, a plurality of data lines 16, and a repair line 18. The array of the unitary units 12 is disposed in the active area a of the substrate 11. The scan line 14 and the data line 16 extend into the active area a to be electrically connected to the halogen unit 12. In addition, the repair line 18 will surround the active area A. It is worth noting that if the data line 16 located in the active area A has a broken line X. This will cause the signal to not be smoothly transmitted to the corresponding pixel unit 12, thereby causing defects in the display. 1377387 0710203ITW 26596twf.doc/n

Group IB Please refer to the schematic diagram of the Figure _ substrate. The cross-J method is to repair the repair line 18 and the data line 一条 a repair line 18 can only be repaired - the second line of the broken line ^: ,, 资 斜 嫱 α ^ ^ ^ ^ I I I I I I I I I I I I. If it is broken, the law will effectively improve the money method for repair. The overall repair rate will be ... the ancient ones are rising. The right is to configure additional space on the plurality of substrates 11. Repair line 18, you need to occupy

SUMMARY OF THE INVENTION In view of the above, the present invention provides an active device array substrate, which has a good repair rate and has a good area. The present invention provides a repair method capable of repairing the active device array of the present invention. Substrate.

The invention provides an active device array substrate, which comprises a substrate, a singular pixel unit, a plurality of first-signal lines, a plurality of second signal lines, a plurality of first-short-circuit bars, and a plurality of first-_ components, a first bus bar, at least a reconstruction bar, a plurality of second shorting bars, a plurality of second switching elements and a second bus bar. Wherein the substrate has an active region and a peripheral circuit region surrounding the active region, and the pixel unit is disposed in the active region. In addition, the first signal line and the second signal line are both disposed in the active area and electrically connected to the pixel unit, and the first signal line and the second signal line extend outward to the peripheral line area, where the first signal line At least one of the second signal lines is intersected, and the second signal line intersects at least one of the first signal lines. The first shorting bar described above is disposed in the peripheral line region. The first switching element is disposed in the peripheral circuit area, and each of the first switching elements is electrically connected between the corresponding first short circuit 6 1377387 0710203ITW 26596twf.doc/n pole and the first signal line. The first bus bar is electrically connected to the first switching element. The reconstruction rod is disposed in the peripheral line area. One end of the rebuilding rod spans the first shorting bar, and the other end of the rebuilding rod extends outwardly to cross one end of the first signal element that is not connected to the first switching element. The second shorting bar and the second opening element are disposed in the peripheral circuit area. Each of the second switching elements is electrically connected between the corresponding second shorting bar and the second signal line. The second bus line is electrically connected to the second switching element.

In an embodiment of the invention, the active device array substrate described above further includes a plurality of reconstruction bars. One end of the rebuilding rod spans the first shorting bar, respectively, and the other end of the rebuilding rod extends outward to cross one end of the first switching element that is not connected to the first switching element. The present invention provides a repairing method suitable for repairing the active element array substrate described above. When the first signal line is broken, the repair of the present invention

By the end of the money pole - the first line corresponding to the signal line: the shorting rod 'wire is connected to the end of the other end of the scale line of the reconstruction rod - the signal line is not connected to the - switching element - and The first switching element connected to the disconnection signal line forms a path. In the embodiment of the invention, the method of forming the first switching element to form a path includes connecting the source and the drain of the first switching element. In an embodiment of the present invention, the active device array substrate further includes: electrically isolating the first busbar from the first switching component on the first signal line connected to the disconnected wire, and forming the path of the first switching element . ^本(四)之的实施例' The method of forming the path of the first switch tree includes connecting the source and the gate of the first carrier, and connecting the 7 0710203ITW 26596twf.doc/n With wide poles. The present invention provides an active device array substrate including a substrate, a plurality of pixel units, a plurality of first signal lines, a plurality of second signal lines, a plurality of first shorting bars, a plurality of first switching elements, and a first a bus bar, a plurality of second shorting bars, a plurality of second switching elements, a second bus bar, a plurality of first reconstruction bars and a plurality of second reconstruction bars. Wherein, the substrate has an active area and a peripheral line area surrounding the active area. The pixel unit is configured in the active area. The first signal line and the second signal line are both disposed in the active area and electrically connected to the pixel unit, and the first signal line and the second signal line extend outward to the peripheral line area, wherein the first signal line is at least - The second signal line intersects, and the second signal line intersects at least one of the first signal lines. Further, the first-short-circuit bar is disposed in the peripheral line (four) core. Further, the first-switching element is disposed in the peripheral line region. Each of the first switching elements is electrically connected between the corresponding first shorting bar and the first signal. The above-mentioned first-conductor wire electrical property, connected to the (5) off component. The second shorting bar is disposed in the peripheral line region. The = switch element is arranged in the peripheral line _. Wherein, the second shorting bar electrically connected to the second wire is connected to the second wire breaking member. The above-mentioned - reconstruction rod ^ ίί,:. The first reconstructed 捍-end extends across the #-end of the first-reconstruction pole, and does not cross the second reconstruction rod disposed in the peripheral line area. The other end of the shorting bar connector is not connected to the first switching element and extends outward to be respectively modified with the second 1377387 0710203ITW26596 tw/n, which is suitable for repairing the above-mentioned active element. When the signal line is broken, the repair method of the present invention includes the first signal of the disconnection and the signal line and the first signal of the disconnection by one end of the first reconstruction rod and the first switch (4) The end is connected such that the first reconstruction cup first short circuit and the second reconstruction rod form a passage. The invention proposes a plurality of element units based on an active element array, a plurality of first news elements, a political wall, a Qiandi a line, a second line of a eve, a plurality of poles, and a plurality of -_ The component, the first-conductor wire, the plurality of fr-line bars, the plurality of second switching elements, the second bus bar, the at least the younger-reconstruction bar, the at least the second reconstruction bar, and the at least the third reconstruction substrate have an active Zone and surrounding area around the active zone. Within the secret society. In addition, the first signal line and the second signal ^ are placed in the main (4) and are electrically connected to the pixel unit. The signal lines and lines extend outward to the peripheral line area, wherein the first signal line to the second to the eighth one The second signal line crosses, and the second signal line crosses at least the 2nd-Xinlin cross. In addition, the H-Road is placed in the surrounding line. The first switching element is disposed in the peripheral line region. In the middle, each of the first and the closing J pieces is connected to the corresponding first-short-pole and the first-signal line, and the first connecting element is electrically connected. The second short rod is disposed in the peripheral line region. The second switching element is disposed in the peripheral line product. The second switching element is electrically connected to the corresponding second short circuit between the second signal line and the second signal line. The second bus bar is electrically connected to the second switch π. The first reconstruction rod described above is disposed in the peripheral circuit area. This first weight 9 1377387 0710203ITW 26596twf.doc/n rod spans the first signal line and the first weight is shorted. The second reconstruction rod is disposed in the peripheral circuit area. One of the two ends is not connected to the first switching element across the first signal line: = the end of the second reconstruction rod, and the end of the third reconstruction rod spans the second short-circuited end. Build the 'other' of the other end

The present invention proposes a repair method suitable for repairing a front array substrate. When the first signal line is disconnected, the invention includes: connecting the end of the first signal line of the disconnection to the first rod complement, connecting the second reconstruction rod, and making the second short rod and the third rod = Yu Diyi reconstructs the rod and the second reconstruction rod to form a passage. ,

The rod extends outward and crosses the repairing traitor of the first invention to achieve the purpose of repairing the first-signal line by rebuilding the rod and the shorting rod. This can effectively save the layout area of the reconstruction rod on the substrate. In addition, the repairing method of the present invention can repair the plurality of broken line-signal lines' to effectively improve the repair rate of the wire element array substrate of the present invention. The above described features and advantages of the present invention will be more apparent from the following description. [Embodiment] FIG. 2A is a schematic view of an active device array substrate according to a first embodiment of the present invention. Referring to FIG. 2A, the active device array substrate 1 of the present invention includes a substrate 110, a plurality of pixel units 120, a plurality of first signal lines 13〇, a plurality of first s-number lines 140, and a plurality of first lines. a shorting bar si, a plurality of first switching elements T1, a first bus bar B1, at least one reconstruction bar R, a plurality of second 1377387 0710203ITW 26596twf.doc/n shorting bars S2, a plurality of second switching elements T2 and a first Two bus wires B2. In detail, the substrate 110 has an active area A and a peripheral line area B surrounding the active area A. In addition, the pixel unit 120 is disposed in the active area A, and is electrically connected to the corresponding first signal line 130 and the second signal line 140. As shown in FIG. 2A, the first signal line 130 and the second signal line 14 向外 extend from the active area A to the peripheral line area B, wherein the first signal line 13 交叉 intersects at least one of the second signal lines 140, and The second signal line MO at least • intersects one of the first signal lines 130. In practice, the second signal line 140 is, for example, a scan line, and the first signal line 13 is a data line. Specifically, the switching signal and the display signal can be transmitted to the pixel unit 120 through the second signal line 14 and the first signal line 130, respectively. In addition, the active device array substrate 100 of the present invention may further include a plurality of pads 112. As shown in Fig. 2A, these pads 112 can be connected to the ends of the respective lines. For the purpose of detection, a first shorting bar (Shorting Bar) S1 and a second shorting bar S2 are disposed in the peripheral line area B. In addition, the first opening/closing element T1 is electrically connected between the corresponding first shorting bar S1 and the first signal line 130. On the other hand, the first bus bar Bi is electrically connected to the first switching element T1' to transmit a signal to control the opening or closing of all the first switching elements T1. The second switching element T2 shown in FIG. 2A is electrically connected between the corresponding second shorting bar S2 and the second signal line 140. Similarly, the second bus bar B2 is electrically connected to all of the second switching elements T2 to transmit signals to control the opening or closing of the second switching element T2. Specifically, the signal can be turned on by the first bus element B1 and the second bus line B2, and the first switching element T1 and the second switching element T2 11 1377387 0710203ITW 26596twf.d〇c/n are turned on. Then, the detection signal can be transmitted to the pixel unit ι2〇 at different positions by the first shorting bar and the second shorting bar S2 at different positions to detect whether the pixel unit 120 has an abnormality. In particular, this

The reconstruction 捍R of the invention is disposed in the peripheral line area B. One end of the rebuilding rod R spans the first shorting bar S1, and the other end of the rebuilding rod R extends outwardly across the first signal line 13 that is not connected to the first switching element τι.

Fig. 2B is a schematic view of the active element array substrate after the repair of the first embodiment of the present invention. Please refer to FIG. 2B, when the first signal line 13 is disconnected (such as χ

The repairing method of the present invention comprises: connecting the first shorting bar si (such as d,)' corresponding to the first signal line 130 of the broken line by the end of the reconstruction rod 11 and by rebuilding the rod R - The terminal of the disconnection of the terminal - the signal line (10) is not connected to the end of the first switching element T1 (as at a). In addition, the ^ is connected to the disconnection line - the line m is closed to the element τι to form a path such as at C3). It should be noted here that the above connection method is, for example, laser welding. The switching element T1 can be connected to a source (not shown) button (not shown) by the lightning body f to form a ^. Those skilled in the art having access to different types of information may not be deliberately limited. = This - to ' With the first-short-bar reconstruction rod r, the two ends of the signal line 130 can be channeled for repair purposes. χ: The reconstruction rod & can be repaired by the first shorting bar si. This can effectively save the layout of the substrate 110 (Layout). 12 1377387 0710203ITW 26596twf.doc/n The two ends of the first bus bar B1 are electrically connected to the interfaces 112 and 112', respectively. As shown in FIG. 3B, when the first interrogation line 13G is disconnected (for example, X, the repair method of the present invention can further enable the first switching element T11 on the first-conductor wire (1) and the first-signal line 13〇 of the disconnection. The insulating insulation 'and the first switching element T1 form a path. The manner of the above-mentioned one-sided insulation to be described here is, for example, laser cutting (Laser

Cuttmg) #方式Separates the first choke wire m from the first switching element • T1. Further, the method of forming the first switching element T1 into a via includes connecting the source and the drain of the first switching element T1 (not labeled =) and the secret and gate connecting the first switching element T1 in a laser-soldering manner ( Not marked). It should be noted that the input signal can be input by the pads 112 and 112 during the detection, and the detection function is not adversely affected. Second Embodiment 曰 The second embodiment is similar to the first embodiment, and the same portions will not be described again. The main difference between the two is: the number of reconstruction bars. The active device array substrate of this embodiment includes a plurality of reconstruction bars. Fig. 4A is a diagram showing the second embodiment of the present invention. The active device array substrate 300 of the embodiment of the present invention includes a plurality of reconstruction rods. One of the ends of the reconstruction rods R spans the respective first shorting bars S1. In this case, the other end of the reconstruction rod R extends outward to cross one end of the first signal line 13 without being connected to the first switching element T1. Fig. 4B is a schematic view of the active element array substrate after repair of the second embodiment of the present invention. Referring to FIG. 4B, when the first signal line 13A has a plurality of broken lines (such as X and X), it can be repaired by the first embodiment of the present invention 13 1377387 〇710203ITW26596twf.doc/n. The method is to fix it. The disconnection line X is correspondingly repaired in such a manner that the first shorting bar S1 at C1' is electrically connected to the rebuilding rod R, and the first signal line 130 at C2' is electrically connected to the rebuilding rod R. In addition, the switching element T1 connected to the first signal line 130 of the disconnection is formed into a path (e.g., at C3'), thereby achieving the purpose of repair. The third embodiment of the second embodiment is similar to the first embodiment, and the same portions will not be described again. The main difference between the two is the layout of the first reconstruction rod and the second reconstruction rod in this embodiment. Fig. 5A is a schematic view showing an active element array substrate of a third embodiment of the present invention. Referring to FIG. 5A, the active device array substrate 400 of the present embodiment has a plurality of first reconstruction rods R1 and a plurality of second reconstruction rods R2. The first reconstruction rod R1 and the second reconstruction rod R2 are disposed in the peripheral line region B. In particular, one of the first reconstruction rods R1 straddles the corresponding first chord line 130, and the other end of the first reconstruction rod R1 extends outwardly to straddle the corresponding second shorting rod S2. In addition, one end of the second reconstruction rod R2 extends across the first signal line 130 and is not connected to the first switching element T1, and the other end of the reconstruction rod R2 extends outward to be respectively connected to the second shorting rod S2. . In practice, the second reconstruction rod R2 may be formed by extending the second shorting cup S2. Fig. 5B is a schematic view showing the active element array substrate after repair according to the third embodiment of the present invention. Referring to FIG. 5B, when the first signal 130 is disconnected (such as at X), the repairing method of the present invention can be connected to the first signal line 13〇 and the second short circuit respectively disconnected by the two ends of the first reconstruction rod R1. Rod S2 (as at C5 and C6). In addition, the first signal line 130 is not connected to the first switching element T1 (as at C4) by the one end of the second rebuilding rod R2, and the first rectifying rod IU is connected to the first switching element T1, such as C4. The second shorting bar S2 forms a passage with the second rebuilding rod R2, thereby achieving the purpose of repairing. Fourth Embodiment The fourth embodiment is similar to the first embodiment, and the same portions will not be described again. The main difference between the two is the layout of the first reconstruction rod, the second reconstruction rod and the third reconstruction unit in this embodiment. Fig. 6A is a schematic view showing an active element array substrate according to a fourth embodiment of the present invention. Referring to FIG. 6A, the active device array substrate 5 of the present embodiment has a plurality of first reconstruction bars ri, a plurality of second reconstruction R2s, and a second reconstruction bar R3. The first reconstruction rod ri, the second reconstruction cup R2 and the second reconstruction rod R3 are disposed in the peripheral line region b. In particular, the first reconstruction rods R1 span all of the first signals 130+ and the first reconstruction rods R1 extend outwardly and across the second shorts. One end of the second 'reconstruction rod R2 straddles all of the first-signal line 130 and the other end of the switch 7L. The special thorn is that the end of the third reconstruction rod spans the end of the second reconstruction rod R2, and the other end of the third reconstruction rod spans the end of the corresponding second short rod S2. Fig. 6B is a schematic diagram of an active device array after repair according to a fourth embodiment of the present invention. Please refer to FIG. 6B, when the first signal 13 is disconnected (eg, X 1 = the repair method of the present invention is to use the first signal line of the disconnection to connect to the first reconstruction rod R1 (such as C5), and the other end Connecting the rod R3, as shown at C4) and making the second short-circuit lever, the HI-heavy/rod R1 on the third reconstruction path and the second reconstruction rod R2 to form a return connection, for example, by laser splicing The way of fusion is as shown in Fig. 15 1377387 0710203ITW 26596twf.doc/n 6B at C6, C7 and C8', and the repairing effect can be achieved. In summary, the repairing method of the present invention can achieve the purpose of repairing the disconnection of the first signal line by rebuilding the rod and the shorting rod, thereby effectively saving the layout area of the reconstruction rod on the substrate. In addition, the repairing method of the present invention can repair the first signal lines of the plurality of broken wires, thereby effectively improving the repair rate of the active device array substrate of the present invention. Although the present invention has been disclosed in the above preferred embodiments, it is not intended to limit the invention, and any one of ordinary skill in the art can make some modifications and refinements without departing from the spirit and scope of the invention. Therefore, the scope of the invention is defined by the scope of the appended claims. BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1A is a schematic view of a conventional active device array substrate. FIG. 1B is a schematic view of a conventional repaired active device array substrate. Fig. 2A is a schematic illustration of an active device array substrate of a first embodiment of the present invention. Fig. 2B is a schematic view showing the active element array substrate after repair according to the first embodiment of the present invention. Fig. 3A is a schematic view showing another active device array substrate of the first embodiment of the present invention. Fig. 3B is a schematic view showing the active element array substrate after repair according to the second embodiment of the present invention. Figure 4 is a schematic illustration of an active device array substrate in accordance with a second embodiment of the present invention. 4A is a schematic view of an active device array base 1377387 0710203ITW 26596twf.doc/n board after repair according to a second embodiment of the present invention. Fig. 5A is a schematic view of an active device array substrate of a third embodiment of the present invention. Fig. 5B is a schematic view showing the active element array substrate after repair according to the third embodiment of the present invention. Fig. 6A is a schematic illustration of an active device array substrate in accordance with a fourth embodiment of the present invention. Φ is a schematic view of an active device array substrate after repair according to a fourth embodiment of the present invention. [Description of main component symbols] 10, 100, 200, 300, 400, 500: Active device array substrate 11: Substrate 12, 120: Alizardin unit 14. Scanning line 16: Data line _ 18: Repairing lines 112, 112': Interface 130: first signal line 140: second signal line A: active area B: peripheral line area B1: first bus line B2: second bus line S1: first shorting bar 17 1377387 0710203ITW 26596twf.doc/n S2 : Second shorting bar T1 : First switching element T2 : Second switching element R : Reconstruction rod R1 : First reconstruction rod R2 : Second reconstruction rod R3 : Third reconstruction rod X, X′ : Broken line C BuCl , C2, C2', C3, C4, C5, C6, C7, C8: Repair

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Claims (1)

1377387 X. Patent application scope: l An active device array substrate, comprising: a substrate having an active region and a plurality of pixel units surrounding a peripheral line of the active region, disposed in the active region; and a plurality of first signals a first line of the signal line extending outwardly to the peripheral line area, and a second signal line disposed in the active area and associated with the line The plurality of second signal lines extend outward to the peripheral line area, wherein each of the first signal lines of the L intersects at least one of the second signal lines, and each of the two signal lines is at least Intersecting with one of the first signal lines; a plurality of first shorting bars disposed in the peripheral circuit area; - a first switching element disposed in the peripheral circuit area, each of the first switching elements being electrically connected Between the corresponding first-short-circuit bar and the first-sense line; ~ one, a bus bar electrically connected to the first-switching elements; - the end spans the first short-circuiting bars, - the mountain at least - the reconstruction rod is disposed in the peripheral circuit area, and the reconstruction rod is configured to connect the plurality of second shorting bars connected to the epitaxial switching element at the other end of the sticks, and configure a second switching element, Disposed in the peripheral circuit area; disposed in the side line area, each of the second shorting bars and the second signal 1377387 0710203ITW 26596twf, doc/n a second bus line electrically connected to the second switches element. 2. For example, the active element array substrate described in the first application of the patent application, further including a ridge rebuilding rod, one end of each of the rebuilding rods respectively spans the first short, the other end of the rod Extending outwardly to connect the first signal lines to one of the first switching elements. A private-Jie-type patching method is suitable for repairing the main 兀P job board of the first application of the patent scope. When the first--Xin Linqi, the miscellaneous method is dry and the lever ί borrows the corresponding signal line. The signal line does not form a path with the f-element of the first '. The method of forming a passage (10) in the first switch piece described in the third paragraph of the patent scope is to make the pole and the drain. ^Include the connection of the 7G piece - source (4) Please refer to the repair method described in the third paragraph of Patent No. 11, including: Electrical insulation of the switching element, the first part of the message - 6. If the application is specific: r pieces form the path. The first-switching element forms a path:::::: complementing method, wherein the pole and the source 7 are connected to the active tree array substrate, including: an interpole region; the substrate 'having an active region and surrounding the Yang A plurality of pixel units are disposed in the active area; a plurality of first signal lines are disposed in the active area and electrically connected to the pixel units. The first signal lines extend outward to the peripheral circuit ^; a plurality of first signal lines are disposed in the active area and electrically connected to the pixel unit, and the second signal lines extend outward to the periphery a line ^, wherein each of the first signal lines intersects at least one of the second signal lines, and each of the second signal lines intersects at least one of the first signal lines; φ a plurality of first shorting bars disposed at the line a plurality of first switching elements are disposed in the peripheral circuit region, and each of the switching elements is electrically connected between the corresponding first and second short lines; ^^ n - the first flowing wire, t Connecting the first _ switching elements; multiple second short circuits And disposed in the peripheral circuit area; P two f-switching elements are disposed in the peripheral circuit area, and each of the first members is electrically connected to the corresponding second shorting bar and the second: the connecting wire, Electrically connecting the second switching elements; the 壬方二木-reconstruction rods are disposed in the peripheral circuit area, the first crossing the first signal lines, and the first:=Building: the first two ^ One end of the reconstruction rod is disposed in the peripheral circuit region 'the second connection end, the first line is not short with the second switching elements and the second ends; the other end of the reconstruction rod extends outwardly, In the case of 21 1377387 0710203ITW 26596twf.doc/n, the repair method is suitable for repairing. The patent scope is included in the array substrate. When the first signal line is broken, the repair method is wrongly caused by the second reconstruction rod. The ends are respectively connected to the second shorting bar and by the end of the second reconstruction rod The first signal line is not connected to one of the first switching elements, t is such that the second pole, the second shorting rod and the second reconstructing rod form a pass. The active element array substrate includes: The substrate ' has an active area and a plurality of pixel units surrounding the active area, and is disposed in the active area; a plurality of first-signal lines are disposed in the active area and are electrically connected to the books Connecting the L-signal lines to the peripheral line area: the second signal line of the eve strip is disposed in the main secret and extends to the montages and the second signal lines extend outward to The surrounding line ί, 2 The first signal line intersects at least one of the second signal lines' each of the younger brothers - the shouting line is at least intersected with the towel-strip-signal line; a plurality of first shorting bars are disposed in the peripheral line area; An _ component is disposed in the peripheral circuit area, and each of the first switch 7L is electrically connected between the first and the short line of the ride; the first 弟 第 7th bus line is electrically connected Some of the first switching elements; a plurality of second shorting bars disposed in the peripheral circuit region; a plurality of second switching elements disposed in the peripheral circuit region, each of the 22nd /J / / «JO / 0710203ITW 26596 tw The doc/n two-switch TL is electrically connected between the lines; which should be the second short-circuit bar and the second-second bus wire 'electrical at least one first reconstruction pinch, also take the brother-one switch 兀And the rebuilding rod spans the plurality of first sections in the peripheral circuit area, the first crosses the second shorting bars I′ and the first reconstruction bar extends outward and at least one second weight captures xm Φ Two reconstruction rods - end span = peripheral line area, the first piece connected to the end; and μ two A signal line is not disposed in the peripheral line region with the first switch element reconstruction reconstruction rods, the third =:::= the end of the second reconstruction rod, and the third reconstruction rod is further cross-pinned Corresponding to the end of the second short turn. The method of supplementing the moving element strain is suitable for repairing the main 1* board of the ninth application patent area. # The first method is broken when the signal line is broken. „One of the first signal lines is connected to the first Rebuilding the rod and the furnaces - the first reconstruction rod 'and the second shorting rod, the third heavy road is dry connected to the fourth to the fourth reconstruction rod and the second reconstruction rod f4 to form a passage 23