TWI366150B - Image processing apparatus and method - Google Patents

Image processing apparatus and method

Info

Publication number
TWI366150B
TWI366150B TW094123201A TW94123201A TWI366150B TW I366150 B TWI366150 B TW I366150B TW 094123201 A TW094123201 A TW 094123201A TW 94123201 A TW94123201 A TW 94123201A TW I366150 B TWI366150 B TW I366150B
Authority
TW
Taiwan
Prior art keywords
processing apparatus
image processing
image
processing
Prior art date
Application number
TW094123201A
Other languages
English (en)
Other versions
TW200606753A (en
Inventor
Kazuhito Horiuchi
Original Assignee
Olympus Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Olympus Corp filed Critical Olympus Corp
Publication of TW200606753A publication Critical patent/TW200606753A/zh
Application granted granted Critical
Publication of TWI366150B publication Critical patent/TWI366150B/zh

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T3/00—Geometric image transformations in the plane of the image
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/70—Determining position or orientation of objects or cameras
    • G06T7/73—Determining position or orientation of objects or cameras using feature-based methods
    • G06T7/75—Determining position or orientation of objects or cameras using feature-based methods involving models
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Image Processing (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Editing Of Facsimile Originals (AREA)
  • Image Analysis (AREA)
TW094123201A 2004-07-09 2005-07-08 Image processing apparatus and method TWI366150B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004203108 2004-07-09

Publications (2)

Publication Number Publication Date
TW200606753A TW200606753A (en) 2006-02-16
TWI366150B true TWI366150B (en) 2012-06-11

Family

ID=35783868

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094123201A TWI366150B (en) 2004-07-09 2005-07-08 Image processing apparatus and method

Country Status (5)

Country Link
JP (1) JP4709762B2 (zh)
KR (1) KR100888235B1 (zh)
CN (1) CN1981302B (zh)
TW (1) TWI366150B (zh)
WO (1) WO2006006525A1 (zh)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101029460B1 (ko) * 2009-04-10 2011-04-15 에스엔유 프리시젼 주식회사 영상 센터링 방법
KR20120068014A (ko) * 2009-09-03 2012-06-26 씨씨에스 가부시키가이샤 표면 검사용 조명·촬상 시스템 및 데이터 구조
JP2011087183A (ja) * 2009-10-16 2011-04-28 Olympus Imaging Corp 撮影装置、画像処理装置、およびプログラム
JP5784718B2 (ja) * 2010-06-15 2015-09-24 コーニンクレッカ フィリップス エヌ ヴェ 顕微鏡検査法の画像処理方法
JP6212314B2 (ja) * 2013-07-22 2017-10-11 株式会社ミツトヨ 画像測定装置およびプログラム
US11336831B2 (en) 2018-07-06 2022-05-17 Canon Kabushiki Kaisha Image processing device, control method, and program storage medium
JP7277283B2 (ja) * 2019-06-25 2023-05-18 株式会社Fuji 許容値設定システム、基板検査機、許容値設定方法、基板検査方法
CN110441234B (zh) * 2019-08-08 2020-07-10 上海御微半导体技术有限公司 一种变焦筒镜、缺陷检测装置及缺陷检测方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2522611B2 (ja) * 1991-07-05 1996-08-07 大日本スクリーン製造株式会社 測長装置
JPH0560533A (ja) * 1991-09-04 1993-03-09 Nikon Corp パターン検査装置
DE69403581T2 (de) * 1993-08-13 1998-02-05 Agfa Gevaert Nv Verfahren zum Erzeugen frequenzmodulierter Halbtonbilder
JP3333012B2 (ja) * 1993-09-10 2002-10-07 オリンパス光学工業株式会社 画像合成装置
JP3424138B2 (ja) * 1994-05-11 2003-07-07 カシオ計算機株式会社 透明基板の位置合わせ方法
CN1204101A (zh) * 1997-06-26 1999-01-06 伊斯曼柯达公司 带有过渡的组合图像
JPH11271645A (ja) * 1998-03-25 1999-10-08 Nikon Corp 顕微鏡画像表示装置
JP2000059606A (ja) * 1998-08-12 2000-02-25 Minolta Co Ltd 高精細画像作成システム
US6470094B1 (en) * 2000-03-14 2002-10-22 Intel Corporation Generalized text localization in images

Also Published As

Publication number Publication date
KR20070026792A (ko) 2007-03-08
CN1981302B (zh) 2010-12-29
JP4709762B2 (ja) 2011-06-22
WO2006006525A1 (ja) 2006-01-19
TW200606753A (en) 2006-02-16
JPWO2006006525A1 (ja) 2008-04-24
KR100888235B1 (ko) 2009-03-12
CN1981302A (zh) 2007-06-13

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Legal Events

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MM4A Annulment or lapse of patent due to non-payment of fees