TW200606753A - Image processing apparatus and method - Google Patents

Image processing apparatus and method

Info

Publication number
TW200606753A
TW200606753A TW094123201A TW94123201A TW200606753A TW 200606753 A TW200606753 A TW 200606753A TW 094123201 A TW094123201 A TW 094123201A TW 94123201 A TW94123201 A TW 94123201A TW 200606753 A TW200606753 A TW 200606753A
Authority
TW
Taiwan
Prior art keywords
image
partial
partial images
generates
magnification
Prior art date
Application number
TW094123201A
Other languages
Chinese (zh)
Other versions
TWI366150B (en
Inventor
Kazuhito Horiuchi
Original Assignee
Olympus Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Olympus Corp filed Critical Olympus Corp
Publication of TW200606753A publication Critical patent/TW200606753A/en
Application granted granted Critical
Publication of TWI366150B publication Critical patent/TWI366150B/en

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/70—Determining position or orientation of objects or cameras
    • G06T7/73—Determining position or orientation of objects or cameras using feature-based methods
    • G06T7/75—Determining position or orientation of objects or cameras using feature-based methods involving models
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T3/00—Geometric image transformations in the plane of the image
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Image Processing (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Editing Of Facsimile Originals (AREA)
  • Image Analysis (AREA)

Abstract

An image processing apparatus of the present invention includes: a first imaging means which sticks partial images of an object with certain overlapping areas, generates a whole or partial object image having a certain size, and takes an image of the object by a first magnification to obtain a first image information; a second imaging means which takes an image of the object by a second magnification greater than the first magnification to obtain partial image information; an image model generation means which generates a model of the object image generated by sticking the partial images in accordance with an overlapping ratio representing a ratio between the size of the object image and the overlapping areas of the partial image; an imaging position calculation means which determines a location of the object image generated from the partial images in the first image information; and a high definition image generation means which generates the object image by sticking the partial images in accordance with the location.
TW094123201A 2004-07-09 2005-07-08 Image processing apparatus and method TWI366150B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004203108 2004-07-09

Publications (2)

Publication Number Publication Date
TW200606753A true TW200606753A (en) 2006-02-16
TWI366150B TWI366150B (en) 2012-06-11

Family

ID=35783868

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094123201A TWI366150B (en) 2004-07-09 2005-07-08 Image processing apparatus and method

Country Status (5)

Country Link
JP (1) JP4709762B2 (en)
KR (1) KR100888235B1 (en)
CN (1) CN1981302B (en)
TW (1) TWI366150B (en)
WO (1) WO2006006525A1 (en)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101029460B1 (en) * 2009-04-10 2011-04-15 에스엔유 프리시젼 주식회사 image centering method
SG178966A1 (en) * 2009-09-03 2012-04-27 Ccs Inc Illumination/image-pickup system for surface inspection and data structure
JP2011087183A (en) * 2009-10-16 2011-04-28 Olympus Imaging Corp Imaging apparatus, image processing apparatus, and program
JP5784718B2 (en) * 2010-06-15 2015-09-24 コーニンクレッカ フィリップス エヌ ヴェ Image processing method for microscopy
JP6212314B2 (en) * 2013-07-22 2017-10-11 株式会社ミツトヨ Image measuring apparatus and program
US11336831B2 (en) * 2018-07-06 2022-05-17 Canon Kabushiki Kaisha Image processing device, control method, and program storage medium
JP7277283B2 (en) * 2019-06-25 2023-05-18 株式会社Fuji tolerance setting system, circuit board inspection machine, tolerance setting method, circuit board inspection method
CN110441234B (en) * 2019-08-08 2020-07-10 上海御微半导体技术有限公司 Zoom lens, defect detection device and defect detection method

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2522611B2 (en) * 1991-07-05 1996-08-07 大日本スクリーン製造株式会社 Length measuring device
JPH0560533A (en) * 1991-09-04 1993-03-09 Nikon Corp Pattern inspection device
EP0639023B1 (en) * 1993-08-13 1997-06-04 Agfa-Gevaert N.V. Method for producing frequency-modulated halftone images
JP3333012B2 (en) * 1993-09-10 2002-10-07 オリンパス光学工業株式会社 Image synthesis device
JP3424138B2 (en) * 1994-05-11 2003-07-07 カシオ計算機株式会社 Transparent substrate alignment method
CN1204101A (en) * 1997-06-26 1999-01-06 伊斯曼柯达公司 Integral images with transitions
JPH11271645A (en) * 1998-03-25 1999-10-08 Nikon Corp Microscopic image display device
JP2000059606A (en) * 1998-08-12 2000-02-25 Minolta Co Ltd High definition image preparation system
US6470094B1 (en) * 2000-03-14 2002-10-22 Intel Corporation Generalized text localization in images

Also Published As

Publication number Publication date
CN1981302B (en) 2010-12-29
JP4709762B2 (en) 2011-06-22
KR20070026792A (en) 2007-03-08
JPWO2006006525A1 (en) 2008-04-24
TWI366150B (en) 2012-06-11
KR100888235B1 (en) 2009-03-12
CN1981302A (en) 2007-06-13
WO2006006525A1 (en) 2006-01-19

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MM4A Annulment or lapse of patent due to non-payment of fees