TWI365407B - Compact representation of vendor hardware module revisions in an open architecture test system - Google Patents

Compact representation of vendor hardware module revisions in an open architecture test system

Info

Publication number
TWI365407B
TWI365407B TW095106853A TW95106853A TWI365407B TW I365407 B TWI365407 B TW I365407B TW 095106853 A TW095106853 A TW 095106853A TW 95106853 A TW95106853 A TW 95106853A TW I365407 B TWI365407 B TW I365407B
Authority
TW
Taiwan
Prior art keywords
test system
hardware module
open architecture
compact representation
architecture test
Prior art date
Application number
TW095106853A
Other languages
English (en)
Other versions
TW200701065A (en
Inventor
Ankan Pramanick
Mark Elston
Toshiaki Adachi
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of TW200701065A publication Critical patent/TW200701065A/zh
Application granted granted Critical
Publication of TWI365407B publication Critical patent/TWI365407B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31907—Modular tester, e.g. controlling and coordinating instruments in a bus based architecture

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Stored Programmes (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Tests Of Electronic Circuits (AREA)
TW095106853A 2005-03-02 2006-03-01 Compact representation of vendor hardware module revisions in an open architecture test system TWI365407B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US11/070,957 US8214800B2 (en) 2005-03-02 2005-03-02 Compact representation of vendor hardware module revisions in an open architecture test system

Publications (2)

Publication Number Publication Date
TW200701065A TW200701065A (en) 2007-01-01
TWI365407B true TWI365407B (en) 2012-06-01

Family

ID=36560858

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095106853A TWI365407B (en) 2005-03-02 2006-03-01 Compact representation of vendor hardware module revisions in an open architecture test system

Country Status (8)

Country Link
US (1) US8214800B2 (zh)
EP (1) EP1853933B1 (zh)
JP (1) JP5207738B2 (zh)
KR (1) KR20070114306A (zh)
CN (1) CN101133339B (zh)
DE (1) DE602006014093D1 (zh)
TW (1) TWI365407B (zh)
WO (1) WO2006093327A1 (zh)

Families Citing this family (13)

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US20050289530A1 (en) * 2004-06-29 2005-12-29 Robison Arch D Scheduling of instructions in program compilation
US7624386B2 (en) 2004-12-16 2009-11-24 Intel Corporation Fast tree-based generation of a dependence graph
US7506336B1 (en) * 2005-06-29 2009-03-17 Emc Corporation System and methods for version compatibility checking
US8065663B2 (en) * 2006-07-10 2011-11-22 Bin1 Ate, Llc System and method for performing processing in a testing system
US8838755B2 (en) * 2007-03-23 2014-09-16 Microsoft Corporation Unified service management
US9652210B2 (en) * 2007-08-28 2017-05-16 Red Hat, Inc. Provisioning a device with multiple bit-size versions of a software component
KR100916784B1 (ko) 2007-11-09 2009-09-14 현대자동차주식회사 차량용 자동 변속기의 기어 트레인
US8949155B2 (en) * 2008-12-31 2015-02-03 Microsoft Corporation Protecting privacy of personally identifying information when delivering targeted assets
US8543658B2 (en) * 2009-12-10 2013-09-24 Ebay Inc. Presenting a gemstone in a setting
KR101231746B1 (ko) * 2009-12-18 2013-02-08 한국전자통신연구원 ＳａａＳ 환경에서의 소프트웨어 개발 시스템
CN105224430B (zh) * 2015-10-29 2018-11-20 艾德克斯电子（南京）有限公司 一种测试系统及测试方法
CN110119287A (zh) * 2019-05-15 2019-08-13 深圳市好成绩网络科技有限公司 一种单板适配多个外设的方法
CN112685322B (zh) * 2021-01-12 2022-10-04 武汉思普崚技术有限公司 一种客制化测试方法、装置及系统

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5892949A (en) * 1996-08-30 1999-04-06 Schlumberger Technologies, Inc. ATE test programming architecture
US6182275B1 (en) * 1998-01-26 2001-01-30 Dell Usa, L.P. Generation of a compatible order for a computer system
US7016811B2 (en) * 2001-08-15 2006-03-21 National Instruments Corporation Network-based system for configuring a programmable hardware element in a measurement system using hardware configuration programs generated based on a user specification
US20030037174A1 (en) * 2000-10-02 2003-02-20 David Lavin Common adapter/connector architecture
US6868513B1 (en) * 2000-10-26 2005-03-15 International Business Machines Corporation Automated multi-device test process and system
US6598060B2 (en) 2000-12-27 2003-07-22 Microsoft Corporation Method and system for creating and maintaining version-specific properties in a distributed environment
JP3736451B2 (ja) * 2001-12-18 2006-01-18 ブラザー工業株式会社 アドレス推定システム、ネットワークデバイス、アドレス推定方法およびアドレス推定プログラム
CA2369228A1 (en) * 2002-01-24 2003-07-24 Alcatel Canada Inc. System and method for managing configurable elements of devices in a network element and a network
US20040225459A1 (en) 2003-02-14 2004-11-11 Advantest Corporation Method and structure to develop a test program for semiconductor integrated circuits
US7184917B2 (en) * 2003-02-14 2007-02-27 Advantest America R&D Center, Inc. Method and system for controlling interchangeable components in a modular test system
US7197417B2 (en) * 2003-02-14 2007-03-27 Advantest America R&D Center, Inc. Method and structure to develop a test program for semiconductor integrated circuits
TWI344595B (en) * 2003-02-14 2011-07-01 Advantest Corp Method and structure to develop a test program for semiconductor integrated circuits
US7210087B2 (en) 2004-05-22 2007-04-24 Advantest America R&D Center, Inc. Method and system for simulating a modular test system
US8082541B2 (en) * 2004-12-09 2011-12-20 Advantest Corporation Method and system for performing installation and configuration management of tester instrument modules

Also Published As

Publication number Publication date
EP1853933A1 (en) 2007-11-14
JP2008531982A (ja) 2008-08-14
JP5207738B2 (ja) 2013-06-12
CN101133339A (zh) 2008-02-27
EP1853933B1 (en) 2010-05-05
CN101133339B (zh) 2011-06-08
KR20070114306A (ko) 2007-11-30
US20060200816A1 (en) 2006-09-07
WO2006093327A1 (en) 2006-09-08
TW200701065A (en) 2007-01-01
US8214800B2 (en) 2012-07-03
DE602006014093D1 (de) 2010-06-17

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees