DE602006014093D1 - Kompakte darstellung der überarbeitungen von anbieter-hardware-modulen - Google Patents

Kompakte darstellung der überarbeitungen von anbieter-hardware-modulen

Info

Publication number
DE602006014093D1
DE602006014093D1 DE602006014093T DE602006014093T DE602006014093D1 DE 602006014093 D1 DE602006014093 D1 DE 602006014093D1 DE 602006014093 T DE602006014093 T DE 602006014093T DE 602006014093 T DE602006014093 T DE 602006014093T DE 602006014093 D1 DE602006014093 D1 DE 602006014093D1
Authority
DE
Germany
Prior art keywords
revisions
hardware modules
compact presentation
provider hardware
provider
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602006014093T
Other languages
English (en)
Inventor
Ankan Pramanick
Mark Elston
Toshiaki Adachi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of DE602006014093D1 publication Critical patent/DE602006014093D1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31907—Modular tester, e.g. controlling and coordinating instruments in a bus based architecture

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Stored Programmes (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
DE602006014093T 2005-03-02 2006-03-02 Kompakte darstellung der überarbeitungen von anbieter-hardware-modulen Active DE602006014093D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/070,957 US8214800B2 (en) 2005-03-02 2005-03-02 Compact representation of vendor hardware module revisions in an open architecture test system
PCT/JP2006/304517 WO2006093327A1 (en) 2005-03-02 2006-03-02 Compact representation of vendor hardware module revisions in an open architecture test system

Publications (1)

Publication Number Publication Date
DE602006014093D1 true DE602006014093D1 (de) 2010-06-17

Family

ID=36560858

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602006014093T Active DE602006014093D1 (de) 2005-03-02 2006-03-02 Kompakte darstellung der überarbeitungen von anbieter-hardware-modulen

Country Status (8)

Country Link
US (1) US8214800B2 (de)
EP (1) EP1853933B1 (de)
JP (1) JP5207738B2 (de)
KR (1) KR20070114306A (de)
CN (1) CN101133339B (de)
DE (1) DE602006014093D1 (de)
TW (1) TWI365407B (de)
WO (1) WO2006093327A1 (de)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050289530A1 (en) * 2004-06-29 2005-12-29 Robison Arch D Scheduling of instructions in program compilation
US7624386B2 (en) 2004-12-16 2009-11-24 Intel Corporation Fast tree-based generation of a dependence graph
US7506336B1 (en) * 2005-06-29 2009-03-17 Emc Corporation System and methods for version compatibility checking
KR20090082341A (ko) * 2006-07-10 2009-07-30 아스테리온, 인크. 테스팅 시스템에서 프로세싱을 수행하는 시스템 및 방법
US8838755B2 (en) 2007-03-23 2014-09-16 Microsoft Corporation Unified service management
US9652210B2 (en) * 2007-08-28 2017-05-16 Red Hat, Inc. Provisioning a device with multiple bit-size versions of a software component
KR100916784B1 (ko) 2007-11-09 2009-09-14 현대자동차주식회사 차량용 자동 변속기의 기어 트레인
US8949155B2 (en) * 2008-12-31 2015-02-03 Microsoft Corporation Protecting privacy of personally identifying information when delivering targeted assets
US8543658B2 (en) * 2009-12-10 2013-09-24 Ebay Inc. Presenting a gemstone in a setting
KR101231746B1 (ko) * 2009-12-18 2013-02-08 한국전자통신연구원 ＳａａＳ 환경에서의 소프트웨어 개발 시스템
CN105224430B (zh) * 2015-10-29 2018-11-20 艾德克斯电子（南京）有限公司 一种测试系统及测试方法
CN110119287A (zh) * 2019-05-15 2019-08-13 深圳市好成绩网络科技有限公司 一种单板适配多个外设的方法
CN112685322B (zh) * 2021-01-12 2022-10-04 武汉思普崚技术有限公司 一种客制化测试方法、装置及系统

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5892949A (en) * 1996-08-30 1999-04-06 Schlumberger Technologies, Inc. ATE test programming architecture
US6182275B1 (en) * 1998-01-26 2001-01-30 Dell Usa, L.P. Generation of a compatible order for a computer system
US20030037174A1 (en) * 2000-10-02 2003-02-20 David Lavin Common adapter/connector architecture
US6868513B1 (en) * 2000-10-26 2005-03-15 International Business Machines Corporation Automated multi-device test process and system
US6598060B2 (en) 2000-12-27 2003-07-22 Microsoft Corporation Method and system for creating and maintaining version-specific properties in a distributed environment
US7050923B2 (en) * 2001-08-15 2006-05-23 National Instruments Corporation Network-based system for configuring a measurement system using configuration information generated based on a user specification
JP3736451B2 (ja) * 2001-12-18 2006-01-18 ブラザー工業株式会社 アドレス推定システム、ネットワークデバイス、アドレス推定方法およびアドレス推定プログラム
CA2369228A1 (en) * 2002-01-24 2003-07-24 Alcatel Canada Inc. System and method for managing configurable elements of devices in a network element and a network
US7184917B2 (en) * 2003-02-14 2007-02-27 Advantest America R&D Center, Inc. Method and system for controlling interchangeable components in a modular test system
US7197417B2 (en) * 2003-02-14 2007-03-27 Advantest America R&D Center, Inc. Method and structure to develop a test program for semiconductor integrated circuits
TWI344595B (en) * 2003-02-14 2011-07-01 Advantest Corp Method and structure to develop a test program for semiconductor integrated circuits
US20040225459A1 (en) 2003-02-14 2004-11-11 Advantest Corporation Method and structure to develop a test program for semiconductor integrated circuits
US7210087B2 (en) 2004-05-22 2007-04-24 Advantest America R&D Center, Inc. Method and system for simulating a modular test system
US8082541B2 (en) * 2004-12-09 2011-12-20 Advantest Corporation Method and system for performing installation and configuration management of tester instrument modules

Also Published As

Publication number Publication date
JP5207738B2 (ja) 2013-06-12
EP1853933A1 (de) 2007-11-14
TW200701065A (en) 2007-01-01
US8214800B2 (en) 2012-07-03
WO2006093327A1 (en) 2006-09-08
CN101133339A (zh) 2008-02-27
KR20070114306A (ko) 2007-11-30
EP1853933B1 (de) 2010-05-05
JP2008531982A (ja) 2008-08-14
CN101133339B (zh) 2011-06-08
TWI365407B (en) 2012-06-01
US20060200816A1 (en) 2006-09-07

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Legal Events

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8364 No opposition during term of opposition