TWI360614B - Valve door with ball coupling - Google Patents

Valve door with ball coupling Download PDF

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Publication number
TWI360614B
TWI360614B TW096123367A TW96123367A TWI360614B TW I360614 B TWI360614 B TW I360614B TW 096123367 A TW096123367 A TW 096123367A TW 96123367 A TW96123367 A TW 96123367A TW I360614 B TWI360614 B TW I360614B
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Taiwan
Prior art keywords
ball
valve member
cavity
sealing surface
valve
Prior art date
Application number
TW096123367A
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Chinese (zh)
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TW200809123A (en
Inventor
Hyungsam Sam Kim
Jae-Chull Lee
William N Sterling
Paul Brown
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Applied Materials Inc
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67763Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
    • H01L21/67772Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading involving removal of lid, door, cover
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67126Apparatus for sealing, encapsulating, glassing, decapsulating or the like
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67155Apparatus for manufacturing or treating in a plurality of work-stations
    • H01L21/67196Apparatus for manufacturing or treating in a plurality of work-stations characterized by the construction of the transfer chamber

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Physical Vapour Deposition (AREA)
  • Pressure Vessels And Lids Thereof (AREA)
  • Details Of Valves (AREA)

Description

1360614 九、發明說明: 【發明所屬之技術領域】 本發明的實施方式主要關於用於密封真空處理系統中 的基板通道的真空隔離閥門。 【先前技術】1360614 IX. INSTRUCTIONS OF THE INVENTION: TECHNICAL FIELD OF THE INVENTION Embodiments of the present invention generally relate to vacuum isolation valves for sealing substrate passages in vacuum processing systems. [Prior Art]

薄膜電晶體(TFT)普遍用於主動矩陣顯示器,諸如 電腦和電視監視器、行動電話顯示器、個人數位助理(PDA) 及越來越多的其他裝置。一般地,平板顯示器包括兩個玻 璃板,該兩玻璃板具有液晶材料層嵌入其間。至少一個玻 璃板包括設置在其上的導電薄膜,該導電薄膜與電源連 接。從電源提供給該導電薄膜的功率改變晶體材料的配 向,形成圖案顯示。Thin film transistors (TFTs) are commonly used in active matrix displays such as computer and television monitors, mobile phone displays, personal digital assistants (PDAs), and a growing number of other devices. Typically, a flat panel display includes two glass panels with a layer of liquid crystal material interposed therebetween. At least one of the glass sheets includes a conductive film disposed thereon, the conductive film being connected to a power source. The power supplied from the power source to the conductive film changes the alignment of the crystal material to form a pattern display.

隨著市場對於平板顯示技術的接受,對於更大顯示 器、更多產量和更低製造成本的需求促使設備製造商爲平 板顯示器製造商開發容納更大尺寸的玻璃基板的新系統。 現有的玻璃基板處理設備通常配置爲容納最高至約5平方 米的基板。在不久的將來預想配置容納超過5平方米基板 尺寸的處理設備。 玻璃基板處理通常在叢集設備(cluster tool)中通過 將基板經歷多個依次製程以在基板上形成元件、導體和絕 緣體而實施。這些製程的每個通常在配置爲實施單個步驟 的生産製程的製程腔中實施。爲了有效地完成全部次序的 處理步驟,叢集設備包括多個與中央傳送腔連接的製程 5 1360614 腔。安裝在傳送腔中的機械手臂輔助製程腔和負載閉鎖腔 之間的基板傳送。負載閉鎖腔允許基板在叢集設備的真空 環境和工廠介面的周圍環境之間傳送。這種用於玻璃基板 處理的叢集設備可從美國加州的 Santa Clara市的應用材 料公司的全資擁有子公司AKT公司購買。 由於用於製造平板顯示器的基板尺寸變大’用於這些 基板的製造設備也在尺寸上變得更大。相應地’將真空腔 (或負載閉鎖腔)彼此隔離的門或閘變得更九,或尤其是 更長,原因在於兩個腔之間的槽式開口必須變得更寬以容 納大寬度的基板通過槽式開口。閥門不斷增加的尺寸對兩 個腔之間通過設置在圍繞閥門和腔壁之間的狹槽開口的合 成橡膠密封而維持的良好的隔離密封帶來技術挑戰。 第1A圖示出了通過腔主體1〇6形成並利用傳統的真 空隔離閥門 U0選擇性密封的基板通道的部分截面 圖。傳統的真空隔離閥門通常由具有較長橫向跨度的鋁的 平板構件組成。如第1 A-〗B圖所示’通過與剛性旋轉軸1 04 連接的閘1 02向閥門1 1 〇的中心施加閉合力。閥門1 1 〇通 過與轴104連接的致動器118在密封通道108的位置(第 1 A圖所示)和通道1 〇 8的打開位置之間旋轉。密封件11 6 設置在閥門11 〇和腔主體10 6之間。 爲獲得良好腔隔離而要求載入密封件116的力很大。 如箭頭1 1 2所示,施加在閥門1 1 〇中心附近的高負載導致 閥門1 1 0的中心附近具有較高的負載力而閥門端部附近具 有基本上較小的密封力。如虛線的軸120所示,由於閥門 6 1360614As the market embraces flat panel display technology, the need for larger displays, higher throughput and lower manufacturing costs has prompted device manufacturers to develop new systems for flat panel display manufacturers that accommodate larger sized glass substrates. Existing glass substrate processing equipment is typically configured to accommodate substrates up to about 5 square meters. In the near future, it is expected to configure a processing device that accommodates a substrate size of more than 5 square meters. Glass substrate processing is typically performed in a cluster tool by subjecting the substrate to a plurality of sequential processes to form components, conductors, and insulators on the substrate. Each of these processes is typically implemented in a process chamber configured to perform a single step production process. In order to efficiently complete the processing steps of the entire sequence, the cluster device includes a plurality of processes 5 1360614 cavities connected to the central transfer chamber. The robotic arm mounted in the transfer chamber assists in substrate transfer between the process chamber and the load lock chamber. The load lock cavity allows the substrate to be transferred between the vacuum environment of the cluster device and the environment of the factory interface. This clustering device for glass substrate processing is available from AKT, a wholly owned subsidiary of Applied Materials, Inc. of Santa Clara, California. Since the size of substrates for manufacturing flat panel displays has become large, manufacturing equipment for these substrates has also become larger in size. Correspondingly, the door or gate that isolates the vacuum chambers (or load lock chambers) from each other becomes nine or more, because the slot openings between the two chambers must be wider to accommodate large widths. The substrate passes through the slotted opening. The ever-increasing size of the valve presents a technical challenge to the good isolation seal between the two chambers maintained by a synthetic rubber seal disposed around the slot opening between the valve and the chamber wall. Fig. 1A shows a partial cross-sectional view of a substrate passage formed through the chamber body 1〇6 and selectively sealed by a conventional vacuum isolation valve U0. Conventional vacuum isolation valves typically consist of a flat member of aluminum having a longer lateral span. As shown in Fig. 1A-B, the closing force is applied to the center of the valve 1 1 through the gate 102 connected to the rigid rotating shaft 104. The valve 1 1 is rotated by an actuator 118 coupled to the shaft 104 between the position of the seal passage 108 (shown in Figure 1A) and the open position of the passage 1 〇 8 . A seal 11 6 is disposed between the valve 11 〇 and the chamber body 106. The force required to load the seal 116 is large in order to achieve good cavity isolation. As indicated by arrow 113, the high load applied near the center of the valve 1 1 导致 results in a higher load force near the center of the valve 1 10 0 and a substantially smaller sealing force near the valve end. As indicated by the dashed axis 120, due to the valve 6 1360614

110在設置在腔主體106的壁内的轴承支架114和連接 閥門1 1 0的中心的閘1 0 2之間具有較長的跨度,軸1 〇 4 負載下可能彎曲。在閥門110在閉合位置時,軸104的 曲進一步惡化閥門的端部處的密封件的低負載條件。閥 的邊緣處的較低的密封力可導致通過通道108的不期望 露。 爲了對於更加均勻的密封負載提供更加剛性的閥門 閥門和/或軸可由更厚的材料或具有更高模量的材料 造。然而,由於高強度材料通常較爲昂貴,並且在操作 間較大的負載閉鎖腔可能需要具有足夠的間隙以容納具 較大、高強度的門,因此這種方式增加負載閉鎖腔的成才 由於腔本身增加的材料和製造成本,以及抽空較大真空 積需要增加泵功率,因此較大的負載閉鎖腔並不合需要 另外,增加的真空容積通常需要增加對系統産量具有不 影響的抽真空時間。 已提出採用彎曲的真空隔離閥門以解決這些問題, 且在共同轉讓並先前引入的2004年6月14日申請的標 爲“CURVED SLIT VALVE DOOR”的美國專利申請序 號No. 10/867,100中對其進行了描述。彎曲的真空隔 閥門的實施提出新的工程挑戰。例如,由於當按壓平面 腔壁以密封真空隔離閥門通道時閥門密封表面變成平面 因此應當容納彎曲的真空隔離閥門的投影長度的變化以 止閥門致動機構的過度磨損。另外,由於真空隔離閥門 對閥門密封表面旋轉,因此真空隔離閥門和閥門密封表 至 在 彎 門 泄 製 期 有 k 0 容 〇 利 並 題 列 離 的 防 相 面 7The 110 has a long span between the bearing bracket 114 disposed in the wall of the chamber body 106 and the gate 1 0 2 connecting the center of the valve 110. The shaft 1 〇 4 may bend under load. When the valve 110 is in the closed position, the curvature of the shaft 104 further deteriorates the low load condition of the seal at the end of the valve. The lower sealing force at the edge of the valve can result in undesirable exposure through the passage 108. To provide a more rigid valve for a more uniform sealed load, the valve and/or shaft can be made of a thicker material or a material with a higher modulus. However, since high strength materials are generally expensive and large load lock chambers between operations may need to have sufficient clearance to accommodate larger, high strength doors, this approach increases the load lock cavity due to the cavity. The increased material and manufacturing costs themselves, as well as the large vacuum build-up, require increased pump power, so larger load lock chambers are not desirable. Additionally, the increased vacuum volume typically requires an increase in vacuum time that does not affect system throughput. A curved vacuum isolation valve has been proposed to solve these problems, and is commonly assigned and previously incorporated by reference to U.S. Patent Application Serial No. 10/867,100, filed on Jun. 14, 2004, entitled "CURVED SLIT VALVE DOOR" It is described. The implementation of a curved vacuum barrier presents new engineering challenges. For example, since the valve sealing surface becomes flat when the planar cavity wall is pressed to seal the vacuum isolation valve passage, the change in the projected length of the curved vacuum isolation valve should be accommodated to prevent excessive wear of the valve actuation mechanism. In addition, since the vacuum isolation valve rotates on the valve sealing surface, the vacuum isolation valve and the valve sealing table have a k 0 tolerance and a separation prevention surface during the bending process of the curved door.

Claims (1)

1360614 _ . 丨φί ι V月v/0修正替I珠 十、申請專利範圍: 1. 一種腔,包括: 一腔主體,其具有一第一基板進出口; 一閥Π構件,其具有可定位地選擇性密封該第 進出口的一密封面; 一第一桿臂,其具有與貫穿該腔主體設置的一 耦接的一第一端:以及 一第一球狀接頭,其將該桿臂與該閥門構件这 中該第一球狀接頭允許該閥門構件圍繞至少兩個相 相對該第一桿臂圍繞該第一球狀接頭的中心在至少 面上旋轉; 一第二球狀接頭; 第一彳于臂,其具有與貫穿該腔主體設置的一 耦接的一第一端,以及藉由該第二球狀接頭與該真 闕Π構件的一第二端耦接的一第二端,其中該第二 頭允許該閥門構件圍繞至少兩個軸旋轉並相對該第 圍繞該第一球狀接頭的中心在至少兩個平面上旋轉 中該等第一和第二球狀接頭進一步包括: 一球; 載體’其俘獲該球並允許該球在其中旋轉 連接構件,其延伸通過該球及該載體,該 件將該閥門構件耦接至該各自桿臂,其中該球是位 於該閥門構件中之一凹部處。 —基板 第一軸 接,其 旋轉並 兩個平 第二軸 空隔離 球狀接 二桿臂 ,且其 :及 連接構 在形成 27 Γ360614 2. 如申請專利範圍第1項所述的腔,其中該腔主體進 包括: 複數個堆疊的單基板傳送腔。 3. 如申請專利範圍第1項所述的腔,其中該密封面具 曲率。 4. 如申請專利範圍第1項所述的腔,其t該腔爲一化 相沈積腔、一負載閉鎖腔、一計量腔、一熱處理腔, 物理氣相沈積腔、一負載閉鎖腔、一基板傳送腔或一 腔的其中之一。 5. —種處理系統,包括: 一傳送腔;以及 一負載閉鎖腔,與該傳送腔耦接,該負載閉鎖腔έ 一腔主體,其具有至少一個基板傳送腔,該 一個基板傳送腔具有一第一基板進出口及至少一個第 板進出口,其中在該基板傳送腔上的一實質平坦密封 至少圍繞該第一基板進出口; 一閥門構件,其具有一彎曲密封面,可定位 靠該基板傳送腔的該平坦密封表面,以選擇性密封該 一步 有凸 學氣 或一 真空1360614 _ . 丨φί ι V月v/0 Revision for I Beads, Patent Application Range: 1. A cavity comprising: a cavity body having a first substrate inlet and outlet; a valve member having a positionable Selectively sealing a sealing surface of the first inlet and outlet; a first lever arm having a first end coupled to a portion disposed through the cavity body: and a first ball joint, the lever arm The first ball joint in the valve member allows the valve member to rotate at least on at least two of the first rod arms about the center of the first ball joint; a second ball joint; An arm having a first end coupled to a portion disposed through the body of the cavity, and a second end coupled to a second end of the body member by the second ball joint And wherein the second head allows the valve member to rotate about the at least two axes and to rotate in at least two planes relative to the center of the first ball joint in at least two planes, the first and second ball joints further comprising: a ball; the carrier 'captures the ball and allows The ball is rotated therein by a connecting member that extends through the ball and the carrier, the member coupling the valve member to the respective lever arm, wherein the ball is located at a recess in the valve member. - the first axis of the substrate is connected, the two of which are rotated and the two of the second axis are isolated from the ball-shaped two-armed arm, and: and the connection is formed in the form of 27 Γ 360614 2. The cavity according to claim 1 of the patent application, wherein The cavity body includes: a plurality of stacked single substrate transfer chambers. 3. The cavity of claim 1, wherein the sealing mask has a curvature. 4. The cavity according to claim 1, wherein the cavity is a phase deposition cavity, a load lock cavity, a metering cavity, a heat treatment cavity, a physical vapor deposition cavity, a load lock cavity, and a One of the substrate transfer chambers or a cavity. 5. A processing system comprising: a transfer chamber; and a load lock chamber coupled to the transfer chamber, the load lock chamber, a chamber body having at least one substrate transfer chamber, the one substrate transfer chamber having a a first substrate inlet and outlet and at least one first plate inlet and outlet, wherein a substantially flat seal on the substrate transfer chamber surrounds at least the first substrate inlet and outlet; a valve member having a curved sealing surface for positioning against the substrate Transmitting the flat sealing surface of the chamber to selectively seal the step with a convex or a vacuum 丨括: 至少 二基 表面 地抵 第一 28 Γ360614 基板進出口; 一桿臂;以及 一球狀接頭,當該閥門構件的該密封 基板傳送腔的該平坦密封表面接觸而變平時, 構件圍繞至少兩個軸旋轉並相對該桿臂圍繞該 令心在至少兩個平面上旋轉的方式將該桿臂與 連接,其中該球狀接頭進一步包括: 一球; 一載體’其俘獲該球並允許該球在其中名 一連接構件,其延伸通過該球及該載體 件將該閥門構件耦接至該桿臂,其中該球是位 閥門構件中之一凹部。 6. 如申請專利範圍第5項所述的系統,其中該 的該桿臂進一步包括: 一凹部,其具有設置在其中的該球和該載 7. 如申請專利範圍第6項所述的系統,其中負 該閥門構件進一步包括: 一凹部,其具有設置在其中的一彈性襯套 該連接構件延伸穿過貫穿該彈性襯套形成的一 允許該連接構件相對該閥門構件橫向移動β 面受力與該 允許該閥Η 球狀接頭的 該閥門構件 曼轉;及 ,該連接構 在形成於該 負載閉鎖腔 載閉鎖腔的 ,並且其中 間隙孔,以 29 1360614 8. 如申請專利範圍第5項所述的系統,其中該負載閉鎖腔 的該閥門構件進一步包括: 一凹部,其具有設置在其中的該球和該載體。 9. 如申請專利範圍第8項所述的系統,其中該閥門構件的 該凹部形成在一密封壓蓋的向外之該密封面中。 1 0 ·如申請專利範圍第9項所述的系統,其中該負載閉鎖 腔的該桿臂進一步包括: 一凹部,其具有設置在其中的一彈性襯套,並且其中 該連接構件延伸穿過貫穿該彈性襯套形成的一間隙孔,以 允許該連接構件相對該桿臂橫向移動。 1 1.如申請專利範圍第5項所述的系統,其中該球和該載 體由不銹鋼製造。Further comprising: at least two base surfaces abutting the first 28 Γ 360614 substrate inlet and outlet; a lever arm; and a ball joint, when the flat sealing surface of the sealing substrate transfer cavity of the valve member is flattened, the member surrounds at least The two shafts rotate and are coupled to the lever arm in a manner that rotates in at least two planes about the detent, wherein the ball joint further comprises: a ball; a carrier that captures the ball and allows the The ball is in the name of a connecting member that extends through the ball and the carrier member to couple the valve member to the lever arm, wherein the ball is a recess in the valve member. 6. The system of claim 5, wherein the lever arm further comprises: a recess having the ball and the load disposed therein. 7. The system of claim 6 The negative valve member further includes: a recess having an elastic bushing disposed therein, the connecting member extending through a portion formed through the elastic bushing to permit lateral movement of the connecting member relative to the valve member And the valve member that allows the valve ball joint; and the connection is formed in the load lock chamber to lock the lock cavity, and wherein the clearance hole is 29 1360614 8. As claimed in the fifth item The system wherein the valve member of the load lock chamber further comprises: a recess having the ball and the carrier disposed therein. 9. The system of claim 8 wherein the recess of the valve member is formed in the outward sealing surface of the sealing gland. The system of claim 9, wherein the lever arm of the load lock chamber further comprises: a recess having an elastic bushing disposed therein, and wherein the connecting member extends through The elastic bushing defines a clearance hole to allow the connecting member to move laterally relative to the lever arm. 1 1. The system of claim 5, wherein the ball and the carrier are made of stainless steel. 12. —種用於密封一基板進出口的方法,包括以下步驟: 致動一第一桿臂和一第二桿臂,以旋轉一閥門構件的 一彎曲密封面至接觸一平坦密封表面,其中該平坦密封表 面圍繞界定於一負載閉鎖腔及一傳送腔之間的一基板進出 口,該等桿臂藉由各自球狀接頭與該閥門構件連接;以及 將該閥門構件的該彎曲密封面抵靠該平坦密封表面而 變平,以密封該基板進出口,其中該變平步驟導致該閥門 30 丄 丄 Η· * « 構件的多個端部固繞至少 在至少兩個平 兩個軸旋轉且圍繞該等球狀接頭 面上旋轉 13.如申請專利範圍第12 進一步包括: 項所述的方法,其中該變平步驟 鑼 圍繞貫穿經由料”接頭限定 門構件,以實質 的一第一軸旋轉該閥 以及 將該彎曲密封面與該平坦密封表面對齊: 當該闕門構件變平時, ^ ^^ ^ 圍繞貫穿各自球狀接頭限定的 第一軸和第三軸旋轉該 叫π構件的該等端部。 項所述的方法,其中該變平步驟 14.如申請專利範圍第12 進一步包括: 橫向向外移動該間門構件的該等端部。 15.如申請專利範圍第M 疋的方法,其中該等球狀接 頭之至少一者包括延伸貫穿一 員穿球的—連接構件,並且其中 橫向向外移動該閥門構件之噠耸 、 疋这等端部的步驟進一步包括: 向外移動該連接構件.的一域 编其中該連接構件的向外 移動係旋轉該球。 該變平步驟 16.如申請專利範園第12項所述的方法,其中 進一步包括· 31 1360614 旋轉設置在該閥門構件的一凹部中的球。 17. 如申請.專利範圍第12項所述的方法,其中該變 進一步包括: ' 旋轉設置在該等桿臂之至少一者的一凹部中的 18. 如申請專利範圍第12項所述的方法,其中旋轉 ^ 構件的該彎曲密封面至接觸該平坦密封表面的步驟 步包括: 在將該閥門構件的該等端部接觸該平坦密封 前,將該閥門構件的一中心部分接觸該平坦密封表 中該等球狀接頭將該閥門構件的該等端部耦接至 臂。 平步驟 一球。 該閥門 ,進一 表面之 面,其 該等桿 3212. A method for sealing an inlet and outlet of a substrate, comprising the steps of: actuating a first arm and a second arm to rotate a curved sealing surface of a valve member to contact a flat sealing surface, wherein The flat sealing surface surrounds a substrate inlet and outlet defined between a load lock chamber and a transfer chamber, the rod arms are connected to the valve member by respective ball joints; and the curved sealing surface of the valve member is abutted Flattening by the flat sealing surface to seal the substrate inlet and outlet, wherein the flattening step causes the plurality of ends of the valve 30 *·*« to be rotated at least in at least two flat two axes and The method of claim 12, further comprising: the method of claim 12, wherein the flattening step 限定 defines a door member extending through the joint through the material to rotate substantially in a first axis The valve and aligning the curved sealing surface with the flat sealing surface: when the pedal member is flattened, ^^^^ surrounds the first axis defined through the respective ball joint The third axis rotates the ends of the π member. The method of claim </ RTI> wherein the flattening step 14 further comprises: moving the ends of the door member laterally outwardly. 15. The method of claim M, wherein at least one of the ball joints includes a connecting member extending through a ball, and wherein the valve members are laterally outwardly moved, and the ends are The step of the portion further includes: moving a direction of the connecting member outwardly, wherein the outward movement of the connecting member rotates the ball. The flattening step 16. The method of claim 12, wherein the method of claim 12, wherein Further comprising: 31 1360614 rotating a ball disposed in a recess of the valve member. The method of claim 12, wherein the change further comprises: 'rotating at least one of the lever arms The method of claim 12, wherein the step of rotating the curved sealing surface of the member to contact the flat sealing surface comprises the step of contacting the flat sealing surface : a central portion of the valve member contacts the ball joints in the flat seal table to couple the ends of the valve member to the arms prior to contacting the end portions of the valve member with the flat seal. Flat step a ball. The valve, into the surface of a surface, the rods 32
TW096123367A 2006-06-28 2007-06-27 Valve door with ball coupling TWI360614B (en)

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KR100929718B1 (en) 2009-12-03
TW200809123A (en) 2008-02-16

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