TWI346785B - Electrical resistance measurement method and component inspection process - Google Patents

Electrical resistance measurement method and component inspection process

Info

Publication number
TWI346785B
TWI346785B TW096134858A TW96134858A TWI346785B TW I346785 B TWI346785 B TW I346785B TW 096134858 A TW096134858 A TW 096134858A TW 96134858 A TW96134858 A TW 96134858A TW I346785 B TWI346785 B TW I346785B
Authority
TW
Taiwan
Prior art keywords
measurement method
electrical resistance
inspection process
resistance measurement
component inspection
Prior art date
Application number
TW096134858A
Other languages
English (en)
Other versions
TW200823465A (en
Inventor
Yoshiaki Hiratsuka
Akio Ikeda
Masaharu Suzuki
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Publication of TW200823465A publication Critical patent/TW200823465A/zh
Application granted granted Critical
Publication of TWI346785B publication Critical patent/TWI346785B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
    • G01N27/04—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance
    • G01N27/20—Investigating the presence of flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Electrochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
TW096134858A 2006-11-30 2007-09-19 Electrical resistance measurement method and component inspection process TWI346785B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006322949A JP5070823B2 (ja) 2006-11-30 2006-11-30 抵抗測定方法、および部品検査プロセス

Publications (2)

Publication Number Publication Date
TW200823465A TW200823465A (en) 2008-06-01
TWI346785B true TWI346785B (en) 2011-08-11

Family

ID=39486933

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096134858A TWI346785B (en) 2006-11-30 2007-09-19 Electrical resistance measurement method and component inspection process

Country Status (5)

Country Link
US (1) US7911214B2 (zh)
JP (1) JP5070823B2 (zh)
KR (1) KR101009627B1 (zh)
CN (1) CN101191805B (zh)
TW (1) TWI346785B (zh)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5205848B2 (ja) * 2007-07-31 2013-06-05 富士通株式会社 抵抗測定方法、および部品検査プロセス
TWI396851B (zh) * 2009-08-31 2013-05-21 Yamaha Motor Co Ltd Method and detection device for riveting part of wire terminal
US10391582B2 (en) * 2011-07-21 2019-08-27 Ford Global Technologies, Llc System and method of welding a workpiece
KR101179038B1 (ko) 2011-08-31 2012-09-03 전태구 자동 화재 감지선용 보빈의 저항값 측정장치
CN106771614B (zh) * 2016-11-23 2019-06-21 奕瑞影像科技（太仓）有限公司 一种平板探测器电阻测试治具
CN109613337B (zh) * 2019-01-10 2021-01-15 王久钰 基于测量电阻的数量测量方法

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3818279A (en) * 1973-02-08 1974-06-18 Chromerics Inc Electrical interconnection and contacting system
JPS53129379U (zh) * 1977-03-22 1978-10-14
JPS5679262A (en) 1979-11-30 1981-06-29 Fujitsu Ltd Testing method for leadless parts
JPS57154069A (en) * 1981-03-19 1982-09-22 Matsushita Electric Ind Co Ltd Measuring device for electric resistance
JPH0731217B2 (ja) * 1986-02-24 1995-04-10 日本電信電話株式会社 表面抵抗測定方法
JPS63163266A (ja) * 1986-12-26 1988-07-06 Nippon Steel Corp コンクリート中鋼材の腐食検出プローブ
JPH10215683A (ja) * 1997-02-10 1998-08-18 Idec Izumi Corp 植物の表面電位計測用ペーストおよびそれを用いた植物の表面電位計測用電極。
JP2000088900A (ja) * 1998-09-08 2000-03-31 Advantest Corp 表面・体積抵抗測定装置
TW428090B (en) 1999-04-17 2001-04-01 United Microelectronics Corp Measuring method of resistor test key pattern
JP2001345364A (ja) 2000-06-02 2001-12-14 Nec Yamagata Ltd モニター用抵抗素子及び抵抗素子相対精度測定方法
JP3705736B2 (ja) * 2000-08-29 2005-10-12 株式会社リガク 熱電気測定装置の試料組立体

Also Published As

Publication number Publication date
CN101191805A (zh) 2008-06-04
JP2008139046A (ja) 2008-06-19
US20080180115A1 (en) 2008-07-31
US7911214B2 (en) 2011-03-22
JP5070823B2 (ja) 2012-11-14
CN101191805B (zh) 2011-01-26
TW200823465A (en) 2008-06-01
KR101009627B1 (ko) 2011-01-21
KR20080049609A (ko) 2008-06-04

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees