，丨月ή日修正本 九、發明說明： 【發明所屬之技術領域】 本發明係有關一種修復 係有關-種修復平面顯 ’不 之方法，且尤 製程後產生-亮料= 法在單元修復 、係使用雷射轉換成暗像素以減少產 。°缺陷率、導致產品利用性的改進。，時，為了改進製程 效率’在轉換成為暗像素之製程後，t-光透射小於某一 值時’並不使用雷射將亮像素轉換成暗像素，&而應用一 分配器將一修復製程施加於未轉換成暗像素之紅(R)、綠 (G)、藍(B)及黑(BK)色像素’從而使整體製程最佳化。 【先前技術】丨 ή ή 修正 修正 、 、 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 九 发明 发明 九 九 九 九 九 九 九 九 九 九 九 九 九 九 九 九 九 九 九 九 九 九 九 九 九 九 九 九 九Use laser to convert to dark pixels to reduce production. ° Defect rate, resulting in improved product utilization. , in order to improve the process efficiency 'after conversion to dark pixel process, when t-light transmission is less than a certain value' does not use laser to convert bright pixels into dark pixels, & The process is applied to red (R), green (G), blue (B), and black (BK) color pixels that are not converted to dark pixels to optimize the overall process. [Prior Art]
大體上，顯不器係作為人及電子裝置間之介面。此一 顯π器具有資訊顯示裝置之作用，其將各種類型之電子裝 置輸出的電子資訊信號轉換成光學資訊信號，以允許人能 視覺辨識此資訊。在此等顯示器中，平面顯示器面板包括 液晶顯示器（LCD)、電漿顯示器面板（pop)、場發射顯示器 (FED)、有機發光二極體（〇LED)等等。 第1圖係顯示習知薄膜電晶體液晶顯示器（tft_lcd) 的斷面圖。 如第1圖申顯示，TFT-LCD係配置以包括一 TFT陣列基 材（101)、一偏光器（102)、一像素電極（103)、一累積式電 容器（104)、一 配向層（alignment layer)(105)、一 密封件 (106)、一 間隔件（107)、TFT(108)、液晶（109)、一 共同電 5 1342073 極（ΙΤΟ)(1 10)、一彩色濾光片（1 n)、一黑矩陣（1 12)、一濾 色器基材（113)、一焊墊（114)等等。 一液晶（LC)單元製程係包括在製造TFT_LCD(其係平 面顯示器面板之一）的整體製程中。 此LC單元製程指製造—單位1^(：單元之製程，其中一驅 動電路被提供給完整之TFT基材及彩色濾光片基材，使得 該單位LC單元能由信號驅動。 LC單元製程之特徵係當與TFT製程或彩色濾光片製程 相比時，其通常不需要—重複製程。可將整體單元製程 粗略地分成一配向層形成製程（用於對準LC分子）、一單元 間隙形成製程、—液晶注入製程、及一偏光膜附接製程。 個別製程具有不同特點，因此需要不同製程，例如一 聚合物薄膜形成製程、—磨擦製程、一使用真空之液晶注 入製程等等。 在液晶單元製程前，會施行單元修復製程以修復“單 元。 然而，習知技術中沒有用於修復在單元修復製程後產 生的亮像素之方法。因此，係需要一種修復亮像素的方法。 同樣地，應提出-種能最佳化整敢製程之修復製程。 【發明内容】 因此，本發明已考慮到以 一目的係提供一種修復平面顯 產品缺陷率，如同使用雷射將 上問題而進行，且本發明之 不器面板之方法，其可減少 單元修復製程後產生之一亮 6 1342073 像素轉換成一暗像素，因而可政進產品利用性。同時，該 方法可使整體修復製程最佳化，因為在將亮像素轉換成為 暗像素後’當光透射係小於一特定值時，並不使用雷射將 亮像素轉換成暗像素之製程，反而應用一分配器將一修復 製程施加於未轉換成暗像素之紅（R)、綠（G)、藍（B)及黑（BK) 色像素，從而改進製程效率。 依據本發明之一態樣’以上及其他目的可藉由提出一 種修復平面顯示器面板之方法而達到，其包含：施行一單 元修復製程（cell repair process);確定在該單元修復製程 後一亮度缺陷是否產生：當已產生該亮度缺陷時，施行一 修復製程以將該亮像素轉換成一暗像素；在該修復製程後 確定-光透射是否小於某一值；及當該光透射係小於一特 定值時，使用一分配器修復未轉換成暗像素之紅（r)、綠 (G)、藍（B)、及黑（BK)色像素。 確定亮度缺陷是否產生之+软 ,., 往王疋步驟，在一缺陷由一戋多種 原因產生時可較佳地確定一哀 ^ 儿度缺疋否發生，該多種原 因係：一液晶内之粒子、w九 1極斷路、像素至資料線短路、 非晶矽（a-Si)殘基、像素通 ^ Λ 延短路、具不良特徵的TFT、像 素至像素橫跨資料線短路、 保 孔、S/D斷路、及像素 ⑨無接觸 1豕言橫跨閘極線短路。 施行修復製程之步驟昜 &好係使用雷射施行。 當光透射超過某一值味 再次施行。 ’，施行修復製程之步驟最好係 7 1342073 【實施方式】 現將參考附圖詳述一種修復具有本發明平面顯示器面 板此構造之方法的較佳具體實施例。 第2圖係描述一種依據本發明之具體實施例修復平面 頗示器面板的方法之流程圖。 首先，係施行―典型單元修復製程（S10)〇之後，會作 出關於是否已產生亮度缺陷之判定（S20)。當該判定係肯 定時，或已產生該亮度缺陷時’施行一修復處理使—亮像 素轉換成一暗像素（S3 0)。之後，接著讀取光透射値以確定 其是否小於某一數值（S40) ^當該光透射値小於某—數值 時，未曾轉換成暗像素之紅（R)、綠（G)、藍（B)及黑（Βκ) 像素係藉由使用一分配器轉換（S50)。 在此，一關於是否已發生亮度缺陷之判定係如第3及4 圖中所示般施行。 第3圖係顯示缺陷係由於平面顯示器面板上之粒子產 生的實例之斷面圖，該缺陷可藉由第2圓的方法解決。第4 圖係顯示各種類型之缺陷產生於平面顯示器面板上之實例 的俯視圖，該等缺陷可藉由第2圖的方法解決。 如第3及4圖中顯示，當因一或多數原因而產生一缺陷 時，已確定有亮度缺陷發生，該些原因包括液晶内之粒子 (1)、閘極斷路（2)、像素至資料線短路（3)、非晶矽殘基（4)， 像素通道短路（5)、具不良特徵之TFT(6)、像素至像素橫跨 資料線短路（7)、像素下之資料線殘餘（8)、無接觸孔（9)、 S/D斷路（1〇)、像素至像素橫跨閘極線短路（Η)一、TFT通道 8 1342073 孔遺漏（12)、高TFT關閉電流（13)、像素至閘極線短路（14)、 及低TFT開啟電流（15)。 一雷射施行將亮像素轉換成暗像素之製程。 同時，當光透射値超過某一數值時，其意指尚未達到 一適當效率，其中將亮像素轉換成暗像素之修復製程會重 覆施行。 根據本發明修復具有某一構造之平面顯示器面板的方 法之較佳具體實施例，將會參考附圖更詳細描述。 ® 若確定相關功能及構造之詳細解釋會使本發明之概念 不明確，則將省略詳細解釋。後續欲解釋之名詞係考慮本 發明之功能來定義’其可能依據使用者、操作員或前例之 意圖有所不同。因此，各名詞應基於本發明之說明書涵蓋 的内容來理解。 首先，本發明係關於使用雷射將一在單元修復製程後 產生之亮像素轉換成暗像素，來減少產品缺陷率以改進產 品利用性。 • 習知技術未曾提供在施行單元修復製程後用以修復亮 像素，或在施行單元修復製程後且接著完成一液晶單元製 程之任何製程。 在此，亮像素代表由於在該彩色濾光片上形成一完整 像素之R、G、及B子像素中之某一子像素，不管所施加之 電壓為何-直運轉而顯示在一監視器上之獨一色彩的彩色 光片同樣地，該亮像素甚至可產生在一黑矩陣（BK)中。 當該某子像素持續在開啟狀態時（即若其持續為一亮 9 1342073 像素），單色（黑或白）靜止狀態的問題可能發生在专 上。因此，本發明之操作方式係使該某子像素恆名 態（即一暗像素）。 即，該TFT製程期間產生之亮度缺陷轉換成暗 對於一在TFT及彩色遽光片之附接製程期間產生的 素，亦將該亮度缺陷在一單元製程中轉換成暗像青 此亮度缺陷係在以下情况中產生。即，缺陷產 於TFT製程期間中之異物的產生、τρτ異常操作， 製程進行中時由於人工插入異物造成的短路\ 可將產生亮度缺陷之情況分類為如第3及4圓中 (1) 液晶内之粒子 (2) 閘極斷路 (3) 像素至資料線短路 (4) 非晶梦（a-Si)殘基 (5) 像素通道短路In general, the display is used as an interface between humans and electronic devices. The display device has the function of an information display device that converts electronic information signals output by various types of electronic devices into optical information signals to allow a person to visually recognize the information. In such displays, the flat panel display panel includes a liquid crystal display (LCD), a plasma display panel (pop), a field emission display (FED), an organic light emitting diode (〇LED), and the like. Fig. 1 is a cross-sectional view showing a conventional thin film transistor liquid crystal display (tft_lcd). As shown in FIG. 1, the TFT-LCD is configured to include a TFT array substrate (101), a polarizer (102), a pixel electrode (103), a cumulative capacitor (104), and an alignment layer. Layer) (105), a sealing member (106), a spacer member (107), a TFT (108), a liquid crystal (109), a common electric 5 1342073 pole (ΙΤΟ) (1 10), a color filter ( 1 n), a black matrix (1 12), a color filter substrate (113), a pad (114), and the like. A liquid crystal (LC) cell process is included in the overall process of fabricating a TFT_LCD, which is one of the flat display panels. The LC cell process refers to a fabrication-unit 1^: cell process in which a driver circuit is provided to a complete TFT substrate and a color filter substrate such that the unit LC cell can be driven by a signal. LC cell process The characteristics are generally not required to be duplicated when compared to TFT process or color filter process. The overall cell process can be roughly divided into an alignment layer formation process (for aligning LC molecules) and a cell gap formation. Process, liquid crystal injection process, and a polarizing film attachment process. Individual processes have different characteristics, so different processes are required, such as a polymer film forming process, a rubbing process, a vacuum liquid crystal injection process, and the like. Before the unit process, a unit repair process is performed to repair the "unit. However, there is no method in the prior art for repairing bright pixels generated after the unit repair process. Therefore, a method for repairing bright pixels is required. Similarly, A repair process capable of optimizing the process of the whole process should be proposed. [Invention] Therefore, the present invention has been considered for a purpose. Providing a method for repairing a defect rate of a flat display product, as in the case of using a laser, and the method of the present invention, which can reduce one of the bright pixels generated by the unit repair process and convert into a dark pixel, thereby At the same time, this method can optimize the overall repair process, because after converting bright pixels into dark pixels, when the light transmission system is less than a specific value, the laser is not used to convert the bright pixels into In the dark pixel process, a repair process is applied to apply a repair process to red (R), green (G), blue (B), and black (BK) color pixels that are not converted into dark pixels, thereby improving process efficiency. One aspect of the present invention can be achieved by providing a method for repairing a flat panel display panel, comprising: performing a cell repair process; determining whether a brightness defect is caused after the unit repair process Generating: when the brightness defect has been generated, performing a repair process to convert the bright pixel into a dark pixel; determining - light transmission after the repair process Whether it is less than a certain value; and when the light transmission system is less than a specific value, use a dispenser to repair red (r), green (G), blue (B), and black (BK) colors that are not converted into dark pixels. Pixel. Determine whether the brightness defect is generated by the soft,., Wang Wang step, when a defect is generated by a variety of reasons, it is better to determine whether a defect occurs, the multiple reasons are: a liquid crystal Internal particles, w 9-pole open circuit, pixel to data line short circuit, amorphous 矽 (a-Si) residue, pixel pass 延 delay short circuit, TFT with poor characteristics, pixel to pixel short across data line, Hole, S/D open circuit, and pixel 9 no contact 1 rumor short circuit across the gate line. The steps to perform the repair process are performed using lasers. When the light transmission exceeds a certain value, the scent is applied again. The step of performing the repair process is preferably 7 1342073. [Embodiment] A preferred embodiment of a method of repairing the structure having the flat display panel of the present invention will now be described in detail with reference to the accompanying drawings. Figure 2 is a flow chart depicting a method of repairing a flat panel of a flat panel in accordance with an embodiment of the present invention. First, after the "typical unit repair process (S10)" is performed, a determination is made as to whether or not a brightness defect has occurred (S20). When the decision is made, or the luminance defect has been generated, a repair process is performed to convert the bright pixel into a dark pixel (S30). Then, the light transmission 値 is read to determine whether it is smaller than a certain value (S40). When the light transmission 値 is smaller than a certain value, the red (R), green (G), and blue (B) are not converted into dark pixels. And black (Βκ) pixels are converted by using a splitter (S50). Here, a determination as to whether or not a brightness defect has occurred is performed as shown in Figs. 3 and 4. Fig. 3 is a cross-sectional view showing an example of a defect due to particles on a flat display panel, which can be solved by the second circle method. Fig. 4 is a plan view showing an example of various types of defects occurring on a flat display panel, which can be solved by the method of Fig. 2. As shown in Figures 3 and 4, when a defect occurs for one or more reasons, a brightness defect has been determined, including particles in the liquid crystal (1), gate open (2), and pixel-to-data. Line short circuit (3), amorphous germanium residue (4), pixel channel short circuit (5), TFT (6) with poor characteristics, pixel to pixel short across data line (7), data line residual under pixel ( 8), no contact hole (9), S/D open circuit (1〇), pixel to pixel short circuit across the gate line (Η), TFT channel 8 1342073 hole missing (12), high TFT off current (13) , pixel to gate line short circuit (14), and low TFT turn-on current (15). A laser performs a process of converting bright pixels into dark pixels. Meanwhile, when the light transmission 値 exceeds a certain value, it means that an appropriate efficiency has not been reached, and the repair process of converting bright pixels into dark pixels is repeated. A preferred embodiment of a method of repairing a flat panel display panel having a certain configuration in accordance with the present invention will be described in more detail with reference to the accompanying drawings. ® If a detailed explanation of the relevant functions and constructions is made to make the concept of the invention unclear, a detailed explanation will be omitted. The following terms to be interpreted are defined in consideration of the functions of the present invention, which may differ depending on the intention of the user, the operator or the former. Therefore, each noun should be understood based on what is covered by the description of the present invention. First, the present invention relates to the use of a laser to convert a bright pixel generated after a unit repair process into a dark pixel to reduce the defect rate of the product to improve product usability. • Conventional techniques have not provided any process for repairing bright pixels after performing a cell repair process, or after performing a cell repair process and then completing a liquid crystal cell process. Here, the bright pixel represents a sub-pixel of the R, G, and B sub-pixels that form a complete pixel on the color filter, and is displayed on a monitor regardless of the applied voltage. The same color of the color light film Similarly, the bright pixel can even be produced in a black matrix (BK). When the sub-pixel continues to be on (ie, if it continues to be bright 9 1342073 pixels), the problem of monochrome (black or white) quiescent state may occur exclusively. Therefore, the operation mode of the present invention is to make the certain sub-pixels have a constant name (i.e., a dark pixel). That is, the brightness defect generated during the TFT process is converted into darkness for a pixel generated during the attachment process of the TFT and the color light film, and the brightness defect is also converted into a dark image in a unit process. Produced in the following cases. That is, the defect is caused by the generation of foreign matter during the TFT process, the abnormal operation of τρτ, and the short circuit caused by the manual insertion of foreign matter during the process. The case where the brightness defect is generated can be classified as the 3rd and 4th circles (1) Particles inside (2) Gate open circuit (3) Pixel to data line short circuit (4) Amorphous dream (a-Si) residue (5) Pixel channel short circuit
(6) 具不良特徵之TFT (7) 像素至像素橫跨資料線短路 (8) 彳象素下之資料線殘餘 (9) 無接觸孔 (10) S/D斷路 (1 1)像素至像素橫跨閉極線短路 (1 2) TFT通道孔遺漏 (13) 高TFT關閉電流 (14) 像素至閘極線短路 1視器 _關閉狀 像素》 亮像 〇 生係由 及當TFT 所示。 10 1342073. (1 5)低T F T開啟電流。 之後，如第5及6圖中顯示，會施行使用雷射形成—黑 矩陣之製程》(6) TFT with bad characteristics (7) Pixel to pixel short across data line (8) 资料 Remaining data line under pixel (9) No contact hole (10) S/D open circuit (1 1) pixel to pixel Short circuit across the closed-pole line (1 2) Missing TFT channel hole (13) High TFT turn-off current (14) Pixel-to-gate line short-circuit 1 _ _ close-up pixel 》 Bright image is shown by the TFT and when the TFT is shown. 10 1342073. (1 5) Low T F T turn-on current. After that, as shown in Figures 5 and 6, the process of using a laser to form a black matrix will be performed.
第5圖係顯示應用第2圖修復平面顯示器面板的方法之 實例的斷面圖，其中使用額外雷射（3波長）（Α)來處理黑矩 陣，因此濾色器係以黑矩陣稍微覆蓋。第6圖係顯示藉由第 2圖之方法使用雷射將亮像素轉換成暗像素的範例性製程 之概念圖，其中L、601、609與611個別地表示為雷射、玻 璃、液晶與濾色器。 當形成黑矩陣時，已產生亮度缺陷於其中之彩色渡光 片接著係用黑矩陣覆蓋。在此’ 一貫穿深度可藉由控制雷 射之強度來調整。 第7a至7d圖係顯示藉由第2圖之方法將亮像素轉換成 暗像素的製程之概念圖。第7a圖顯示R子像素（7〇1)、G子像 素（702)及B子像素（703)，且第7b圊顯示一像素（7〇4)βFig. 5 is a cross-sectional view showing an example of a method of repairing a flat display panel using Fig. 2, in which an additional laser (3 wavelength) (Α) is used to process the black matrix, so that the color filter is slightly covered with a black matrix. Figure 6 is a conceptual diagram showing an exemplary process for converting bright pixels into dark pixels using a laser by the method of Figure 2, wherein L, 601, 609, and 611 are individually represented as laser, glass, liquid crystal, and filter. Color. When a black matrix is formed, the color photo-transistor in which luminance defects have been generated is then covered with a black matrix. Here, a penetration depth can be adjusted by controlling the intensity of the laser. Figures 7a through 7d show conceptual diagrams of a process for converting bright pixels to dark pixels by the method of Figure 2. Fig. 7a shows an R sub-pixel (7〇1), a G sub-pixel (702), and a B sub-pixel (703), and the 7b-th shows a pixel (7〇4) β.
如第7c圖中所示，當產生該亮度缺陷時，一亮現象（7〇5) 係產生在某一子像素中。然後，如第7d圖中所示，雷射係 用來修復該某子像素’從而將其轉換成暗像素（7〇6)。 因此，本發明使用雷射將修復製程後產生之亮像素轉 換成暗像素，從而減少產品缺陷率及改進產品利用性。 然而，因為使用雷射施行將亮像素轉換成暗像素之製 程花費較長時間，製程效率可能會稍微降低。因此，本發 明之操作方式係使用雷射將某一數量之亮像素轉換成暗像 11 1342073 係將亮像素轉換成R、G、B及BK像素》 更明確言之，在施行將亮像素轉換成暗像素之某—數 量的修復製程以後，使用雷射之修復製程係终止，而後讀 出光透射値以測量效率。即，確定光透射値是否小於某— 數值。當光透射値小於某一數值時，其暗示已獲得一用於 該面板的所欲效率。否則，即未達到所欲效率。該某—值 取決於該產品的消費者。 當光透射値小於某一數值時，確定已獲得一所欲玟 率。因此，使用雷射轉換成為暗像素不再施行。而是藉由 考慮製程效率，未轉換成暗像素的R、G、8及8&像素係使 用一分配器轉換成獨一像素。 若光透射值超過該某數值，確定其未達到用於面板之 所欲效率。因此，使用雷射將亮像素轉換成一暗像素之修 復製程會重覆施行》 如以上描述，在根據本發明修復平面顯示器面板的方 法中在單元修復製程後產生之亮像素係使用雷射轉換成 暗像素，從而減少產品缺陷率及改進產品利用性。 同樣地，當將免像素轉換成暗像素後光透射値小於某 數值時’並；ί；使用雷射將亮像素轉換成暗像素之製程， 本發明之搡作方式反而應用一分配器修復未被轉換成暗像 素之R 〇、Β、及ΒΚ像素，從而最佳化整體修復製程及增 加製程效率。 如目前所描述，雖然本發明之較佳具趙實施例已揭示 用於示範目的，但本發明不受其限制，而是各種修改、變 12 1342073 化及等效者均可用。因此， 揭不之本發明範疇及精神下 適當地改變來應用。 在不脫離隨附申請專利範圍中 ，本發明之較佳具體實施例可 【圖式簡單說明】 本發明之以上及其他目的、特徵及其他優點，將可自 以上結合附圖之說明令更清楚地瞭解，其中： 第1圖係顯示習知平面顯示器面板之斷面圖； 第2圖係描述依據本發明之具體實施例修復平面顯示 器面板的方法之流程囷： 第3圖係顯示其中缺陷係由於平面顯示器面板上之粒 子產生的實例之斷面圆，缺陷可藉由第2圖的方法解決； 第4圖係顯示其中各種類型之缺陷係產生於平面顯示 器面板上的實例之俯視圖，缺陷可藉由第2圖的方法解決； 第5囫係顯示其中應用修復第2圖之平面顯示器面板的 方法之實例的斷面圖； 第6圖係顯不藉由第2圊之方法使用雷射將一亮像素轉 換成一暗像素的範例性製程之概念圖；及 第7a至7d圖係顯示藉由第2圖之方法將一亮像素轉換 成一暗像素的製程之概念圖。 13 1342073.As shown in Fig. 7c, when the luminance defect is generated, a bright phenomenon (7〇5) is generated in a certain sub-pixel. Then, as shown in Fig. 7d, the laser system is used to repair the certain sub-pixels' to convert them into dark pixels (7〇6). Therefore, the present invention uses a laser to convert bright pixels generated after the repair process into dark pixels, thereby reducing product defect rate and improving product usability. However, since it takes a long time to convert a bright pixel into a dark pixel using a laser, the process efficiency may be slightly lowered. Therefore, the operation mode of the present invention uses a laser to convert a certain number of bright pixels into a dark image. 11 1342073 converts bright pixels into R, G, B, and BK pixels. More specifically, in performing bright pixel conversion After a certain number of repair processes for dark pixels, the repair process using the laser is terminated, and then the light transmission is read to measure the efficiency. That is, it is determined whether the light transmission 値 is smaller than a certain value. When the light transmission 値 is less than a certain value, it implies that a desired efficiency for the panel has been obtained. Otherwise, the desired efficiency is not achieved. The value—depends on the consumer of the product. When the light transmission 値 is smaller than a certain value, it is determined that a desired rate has been obtained. Therefore, the use of laser conversion to dark pixels is no longer performed. R, G, 8, and 8& pixels that are not converted to dark pixels are converted to unique pixels using a splitter by considering process efficiency. If the light transmission value exceeds the certain value, it is determined that it does not reach the desired efficiency for the panel. Therefore, the repair process of converting a bright pixel into a dark pixel using a laser will be repeated. As described above, in the method of repairing a flat display panel according to the present invention, the bright pixel generated after the unit repair process is converted into a laser using a laser. Dark pixels, which reduce product defect rates and improve product usability. Similarly, when the light transmission 値 is converted to a dark pixel and the light transmission 値 is smaller than a certain value, and the process of converting the bright pixel into a dark pixel by using the laser, the method of the present invention applies a dispenser repair instead. It is converted into R 〇, Β, and ΒΚ pixels of dark pixels to optimize the overall repair process and increase process efficiency. As described above, although the preferred embodiment of the present invention has been disclosed for exemplary purposes, the invention is not limited thereto, but various modifications, variations, and equivalents are available. Therefore, it is not appropriate to change the scope and spirit of the invention to apply it. The above and other objects, features and other advantages of the present invention will become apparent from the It is understood that: Fig. 1 is a cross-sectional view showing a conventional flat display panel; Fig. 2 is a flow chart showing a method of repairing a flat display panel according to a specific embodiment of the present invention: Fig. 3 shows a defect system therein Due to the cross-section of the example produced by the particles on the flat panel display panel, the defect can be solved by the method of FIG. 2; FIG. 4 is a top view showing an example in which various types of defects are generated on the flat panel display panel, and the defect can be Solved by the method of FIG. 2; the fifth line shows a cross-sectional view of an example in which the method of repairing the flat display panel of FIG. 2 is applied; and FIG. 6 shows that the laser is not used by the method of the second method A conceptual diagram of an exemplary process for converting a bright pixel into a dark pixel; and Figures 7a through 7d show a process for converting a bright pixel to a dark pixel by the method of Figure 2 Concept map. 13 1342073.
【主要元件符號說明】 1 液晶内之粒子 2 閘極斷路 3 像素至資料線短路 4 非晶矽（a-Si)殘基 5 像素通道短路 6 具不良特徵之TFT 7 像素至像素橫跨資料線 8 像素下之資料線殘餘 短路 9 無接觸孔 10 S/D斷路 11 像素至像素橫跨閘極線 12 TFT通道孔遺漏 短路 13 高TFT關閉電流 14 像素至閘極線短路 15 低TFT開啟電流 101 TFT陣列基材 102 偏光器 103 像素電極 104 累積式電容器 105 配向層 106 密封件 107 間隔件 108 TFT 109 液晶 110 共同電極 111 彩色濾光片 112 黑矩陣 113 濾色器基材 114 焊墊 601 玻璃 609 液晶 611 濾色器 701 R子像素 702 G子像素 703 B子像素 704 像素 705 亮現象 706 暗像素 14 1342073. A 額外雷射 S10 、 S20 ' S30 ' S40、 L雷射 S50 步驟[Main component symbol description] 1 Particles in the liquid crystal 2 Gate open circuit 3 pixels to data line short circuit 4 Amorphous germanium (a-Si) residue 5 Pixel channel short circuit 6 TFT with bad characteristics 7 pixels to pixel across data line Data line residual short circuit under 8 pixels 9 No contact hole 10 S/D open circuit 11 pixel to pixel across gate line 12 TFT channel hole missing short circuit 13 high TFT off current 14 pixel to gate line short circuit 15 low TFT turn-on current 101 TFT array substrate 102 polarizer 103 pixel electrode 104 accumulation capacitor 105 alignment layer 106 seal 107 spacer 108 TFT 109 liquid crystal 110 common electrode 111 color filter 112 black matrix 113 color filter substrate 114 pad 601 glass 609 Liquid crystal 611 color filter 701 R sub-pixel 702 G sub-pixel 703 B sub-pixel 704 pixel 705 bright phenomenon 706 dark pixel 14 1342073. A additional laser S10, S20 'S30 'S40, L laser S50 step
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