TWI334132B - Error correction system and related method thereof - Google Patents

Description

1334132 IX. Description of the invention: [Technical field to which the invention pertains] In particular, the error correction of the optical disk drive The present invention relates to an error correction system system and a method thereof. [Prior Art] With the advancement of technology, the number of optical discs __ and the data stored on them has increased, so the rhyme needs to be erroneously and the correct machine can read the correct data. The first figure shows the error correction system of the related art. As shown in the figure i, the error correction system 100 includes a data buffer 1〇1, a demodulator 1〇3, a syndrome generator 1〇5, a symptom value memory 1〇7, an ECC. (_r c槪cti〇nc〇 (4) The decoder should be... linear 卽 贿 贿 ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( When the amount of data in ιοί is sufficient for decoding, the ecc block (ECC block) stored in the data buffer 〇1 is read out to perform PI/p 状 值 value calculation and linear E 〇 c. In the case of an error, the PIECC action is performed to correct the error data stored in the data buffer 101, and the syndrome value stored in the symptom value memory 107 is also updated. And the 'ECC action in the next direction (in this case, P0) directly extracts the symptom value stored in the symptom value memory '107, instead of calculating the symptom value according to the data in the data buffer ιοί. However, such a structure lacks the Ecc in the η direction, and the W4132 is poor. Performance. Moreover, such a structure lacks the problem of overcoming the frame sync shift. The related art mentioned above, and other related technologies have also been developed, but also have other disadvantages because of its side effects. These disadvantages can be briefly described as follows. If only the P0 symptom value calculation is performed on the fly It can't overcome the frame lock = step =. Moreover, if the system has the pre-EDC mechanism, it can not overcome the difficult synchronization offset. The silk secret has the last coffee _, its secret silk performance. 2 has the pre-symptom value calculation , it has a higher cost ^ system in the demodulator and ~, IIECC between the pieces do not have memory components, the system can not overcome the _1 synchronization offset caused by the loss of synchronous shell 4, and because of data buffering The correction week on the device has a poorer width. The Gnthefly table is processed before entering the data buffer. Beko is in the field of invention. Therefore, one of the objects of the present invention is to provide an error correction system. , which avoids the above disadvantages and maintains the above advantages. The present invention - the implementation of the error - more m includes: a demodulator 'to receive and demodulate the original data to generate an ECC block; a pre-pi Ecc solution The deciphering $ is used to perform a '亍H ECC action on the ecc block from the demodulator to generate a corrected Ecc area; a data buffer for storing the ECC block and the Correcting the post-block; a non-linear edc confirming device, 7 1334132 for performing a non-linear EDC operation based on the ECC block stored in the data buffer to generate an EDC result; a symptom generator Generating at least one syndrome value according to one of the ECC blocks stored in the data buffer; an ecc decoder 'for performing an ECC action according to the syndrome value; and an EDC corrector for Correcting the EDC result according to one of the ECC actions; wherein the syndrome value comprises a PI symptom value and a P0 symptom value, wherein at least one of the code words comprises at least one of a PI code word and a P0 code word. . Embodiments of the present invention also disclose a method of error correction corresponding to the system. Packet 3 (a) receives and demodulates the original data to generate an ECC block; (b) performs a PIECC action on the ECC block from the step (4). To generate a corrected ECc block, (c) storing the Ecc block and the corrected ECC block; (6) performing a non-linear EDC action according to the ECC block stored in the step (4) to generate an ED (: result; () generating at least one symptom value according to the __ρ code word and one (7) code word of the ECC block stored in the step (6); (f) performing an Ecc action according to the symptom value; and (the illusion_the ECC action A result corrects the EDC result; wherein the syndrome value comprises at least one of a PI symptom value and a P0 symptom value. Another embodiment of the present invention discloses a error correction system comprising: a demodulation class For receiving and demodulating the original data to generate an -ECC block; - storing the ECC block and correcting the ECC block; and pre-pi ECC, the horse is connected to the demodulator, Used to apply a PI ECC action to the ECC block from the demodulator to generate the correction ([Chi] block; a memory device, with

I 1334132 to store a portion of the EC6 block from the data buffer; a non-linear EDC. acknowledgment means for performing a non-linear 'EDC action on the ECC block in the data buffer to generate an EDC a p〇 syndrome generator for generating a p〇 syndrome value according to the P0 codeword of the portion of the ECC block in the memory component; a PI syndrome generator for Generating a PI symptom value according to the part of the ECC block stored in the memory component; an Ecc decoder for performing an ECC action according to the symptom value and the p〇 symptom value; and An EDC corrector for correcting the EDC result based on the result of the ECC action. Embodiments of the present invention also disclose error correction methods corresponding to the system, including: (a) receiving and demodulating original data to generate an ECC block; (b) performing an ECC block from the step (a) PI ECC action to generate a portion of the EC (: block, (6) store the ECC block and the portion of the ECC block; (d) the ECC block stored in the step to perform a non-linear EDC action to generate An ED (the result '(e) generates a p〇 symptom value according to the p〇 codeword of the part of the ECC block stored in the step (b); (f) according to the storage stored in the step (c) The portion of the ecc block generates a Π symptom value; (g) according to the PI symptom value and the P0 symptom value, wherein the ECC action is performed on the ECC block stored in the step (6); Root, generating the PI symptom value according to the part of the ECC block stored in the step (6); 1 correcting the EDC result according to the result of the ECC action. [Embodiment] Used in the specification and the subsequent patent application scope Some vocabulary to refer to the general knowledge of the 7L parts of the temple should be understandable, the hardware manufacturer ^ b 曰 不同 曰 曰 曰 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 Xiang. In the entire manual and subsequent requests = "include" mentioned in Tanaka is an open-ended term, so it should be interpreted as "package 3 < not limited to". Finance, "domain" - word in The wire contains any direct and indirect electrical connection means. @本, if described in the text - the first device - the second device, means that the U can be directly electrically connected to the U, or through other means or means of connection The grounding is electrically connected to the second device. Fig. 2 is a diagram showing the environment of the error correction system according to the first embodiment of the present invention. As shown in Fig. 2, the error correction system 11 includes a data buffer 11 〇1, demodulator 1103, on the fly EDC confirmation component 11〇5 (as described above, the data is pre-processed before being entered into the data buffer), a syndrome generator 1107, a sign Shape memory u〇9, a gee decoder ιιη An EDC memory 1113 and an EDC correction unit 1115. The demodulator 11〇3 is configured to receive and demodulate the original data from the optical disc 1102 to generate an included data, a ρι codeword, and a PO codeword (p The ECC block of 〇codeword. The pre-EDC acknowledgment element 1105 is operative to generate an EDC result based on the data from the demodulator 11 。 5. The data buffer 1101 is used to store the Ecc block and the EDC result. The value generator 1107 generates PI and PO syndrome values based on the ?1 codeword and the PO codeword stored in the data buffer iioi. The symptom value memory 11〇9 is used to store the PI symptom value and the PO symptom value. The ECC decoder 111 is configured to perform error correction on the data of the gee block in the data buffer iioi according to the PI symptom value and the P0 symptom value in the syndrome 1109132 and according to the errata result. The PI symptom value and the p〇 symptom value in the symptom value memory 1109 are corrected. The EDC memory 1113 is used to buffer EDC results. The EDC Corrector 1115 corrects the EDC result based on the errata result from the ECC decoder mi.

In this example, the ECC action in the next direction (i.e., the error correction action) is directly read from the syndrome value memory 1109. In addition, the symptom value memory 11〇9 and the EDC brother memory element 1113 can be integrated into the data buffer n 11Q1 '. This variation should also be within the scope of the present invention. The operation of the error correction system 11A can be briefly described as follows: The data demodulated by the demodulator 11〇3 is transferred to the pre-EDC confirmation element 1105 and the data buffer 11〇1, and the EDC result is stored to the data buffer. Then the data decoded by Newton is stored in the data buffer, and the next action is started: f buffer! (9) The stored EDC wire is read and stored in the EDC memory ni3. The data buffer is read with the ECC block of the data, PI, and p〇 codewords. The PI and p〇 values are generated according to the PI and PQ codewords. The ECC action is performed. If the error data is found in the data buffer 11〇1, the error is corrected, and the syndrome correction circuit (not shown) in the ECC decoder 11u updates the corresponding symptom value, and the EDC memory 1113 The coffee-smelling fruit was also updated through the coffee correction device 1115. Then, the ECC_ in the down-direction directly reads the syndrome value of the young value, but does not read the new calculation of the ECC block (4) in the data buffer cry 11 (5) 4132 101. The two Ecc actions continue to intersect until the predetermined number of actions is reached or no more error data exists. Figure 3 is a block diagram of an error correction system 1200 in accordance with a second embodiment of the present invention. Compared with the error correction system remuneration, the error correction system blue contains more - the pre-PIECC code ^ (4) (as mentioned above, the pre-referential data is before the data buffer 11 is entered, the bribe pair is from the de-weaving pair The action of the PI ECC is performed and the ECC result in the data buffer u(1) is corrected based on the result of the errata. Therefore, the error correction system is different from the error correction system. The P injury is different. The data from the demodulator is sent to the pre-PI Ecc decoder 1201 in addition to the above-mentioned π pieces, and the EDC result is added to the rider's mi towel. The pre-piEcc decoder is stored in the data buffer n 11G1 towel. The data rides the pre-PI Ecc action, and the pre-EDC confirms that the component Cong directly performs the EDC action on the data from the demodulator 11〇3. The detailed action and the second action after the sufficiently decoded data is stored in the data buffer 11〇1 The figure is similar and can be easily derived from the above description, so it will not be described again here. Fig. 4 is a block diagram showing the error correction system 13 (10) according to the third embodiment of the present invention. Compared with the error correction system 1200 The error correction system 13 further includes a memory element 13〇1 located between the pre-EDC confirmation component 1105 and the pre-Pi ECC decoder 丄2〇1. Therefore, a portion of the demodulated data from the demodulator 11〇3 The row is temporarily stored in the memory component 1301. The pre-piECC decoder 1201 performs a PIECC operation on the ECc block in the memory component 1301. 12 Moreover, the pre-S EDC confirms that the component is more lightly connected to the memory component. Ϊ́3〇ι performs an EDC action on the master data in the ECC block to generate an edc result. The other actions of the error correction system 130G are the same as the error correction system 12(8), so no further description is made here. FIG. 5 depicts The block diagram of the error correction system of the fourth embodiment of the invention is similar to the error correction system 12, the error correction system includes a data buffer n liGi, -saki n_, "pre-EDC confirmation component 11〇5, and one The pre-PIECC decoder 12 (U. However, the error correction system 14 further includes a memory element just, a p〇 sign generator, an ECC decoder 1405, and a π sign generator 14〇7 , a pi symptom value memory 14〇9 An EDC memory 1411 and an EDC correction unit 1413. The demodulator 11〇3 is configured to receive and demodulate the raw data (Γawdata) to generate an ECC block. The pre-EDC confirmation component 1105 is used to master the ECC block. The data is subjected to an EDC action to generate an EDC result. The data buffer 1101 is used to store the ECC block and the EDC result. The I > I ECC decoder 1201 is used to directly perform the data of the Ecc block from the demodulator 11〇3. The PI ECC action is performed in advance, and the EDC result in the lean buffer 1101 is corrected based on the errata result generated by the pre-pi ECC action. The memory component 1401 is used to temporarily store a portion of the column from the ECC block of the data buffer 1101. The PO symptom value generator 1403 is configured to generate a p〇 symptom value based on the p〇 code word in the memory element 1401. The syndrome value memory 1409 is used to store a portion of the PI symptom value from the syndrome value generator 14A. The ECC decoder 1405 performs error correction based on the PI syndrome value or the PO symptom value. The PI syndrome generator 1407 is configured to generate a PI syndrome value based on the ECC block of 13 1334132 in the memory component 1401. The EDC memory 1411 is used to temporarily store the fat c results. The EDC Corrector 1413 is used to correct the EDC result based on the errata result from the ECC decoder. The error correction action can be briefly described as τ: the demodulated data from the demodulator blue is transmitted to the listening EDC confirming element_, the pre-piEcc decoder 1201, and the data buffer 11〇1. The pre-piECC decoder 12〇1 directly performs a pre-n ECC action on the ECC(4) data from the demodulator 1103, and pre-EDC confirms that the component Cong calculates the EDC result, wherein the EDC result is stored in the data buffer 1UU' and the EDC confirmation component is pre-EDC. 11〇5 Update the EDC result according to the result of the ρι Café errata and then start the execution of the underlying action after the cipher code (4): The EDC result is read from the data buffer 11〇1 and stored in the EDC. Inside the memory 1411. A portion of the ECC block is temporarily stored in the (4) component tape, and the POEO: wave is applied to the line data of the memory component 1401 to produce an errata result. Next, the error data in the data buffer u〇i is corrected and the EDC corrector 1413 updates the EDC result in the EDC memory 1411 based on the errata data. Then, the PI symptom generator 14〇7 reads the corrected line data from the memory element 1401 to generate an η symptom value, wherein the falsification value is stored in the Π 值 value memory η〇9, After all the data were processed by the P0 ECC action, the pi symptom value was read from the PI symptom value memory 1409 and the PIECC^ was executed. Then the 'error memory element 1401 and the error data 14 1334132 in the data buffer 11〇1 are read and the EDC result in the EDC memory is updated. The EDC correction unit 1413 is updated. The Π and P〇ECC actions continue to alternate until The number of executions reaches a predetermined number or no error data exists. Moreover, the error correction system 14 may further include an s δ hex element, which is located between the pre-EDC acknowledgment element 1105 and the pre-pi ECC decoder 1201. The embodiment shown in the figure to Fig. 8 is the same as the embodiment of Figs. 3 to 5 'the difference is that the EDC confirmation component of the 3rd to 5th bribes is a pre-EDC confirmation 5 tolerance element', that is, EDC The confirmation component is located before the data buffer, but in the embodiment shown in Figures 6 to 8, the EDC confirmation component is located behind the data buffer. Therefore, the embodiments shown in Figures 6 to 8 are The embodiments of Figs. 3 to 5 differ in operation. Fig. 6 is a block diagram showing an error correction system 15A according to a fifth embodiment of the present invention. Please refer to Figs. 3 and 6. The structure of Figure 3 and Figure 6 is similar. The error correction system 1500 has a non-linear EDC confirmation component ι5〇1 located after the data buffer 11〇1, instead of the pre-EDC confirmation component 11〇5 located before the data buffer 11〇1, so the error correction system 12〇〇 The error correction system 1500 has different actions. For the error correction system 1500, the data demodulated by the demodulator 11〇3 is transferred to the data buffer 1101 and the pre-Π ECC decoder 12〇1, and then pre-PI ECC decoding. The device 12〇1 directly performs the pi ecc 15 1334132 action on the data from the demodulator 11〇3. Then, after the sufficiently decoded data is stored in the data buffer 11〇1, the bottom action is started: the data buffer 1101 The ECC block containing the data and the ρι/ρ〇 codeword is read, and the PI'p〇 symptom value is generated according to the π, p〇 codeword and stored to the symptom value slot 11Q9. _g_第The Ecc action of the direction is performed. While the ECC block is being read from the data buffer 1101, the non-linear EDC confirms that the piece 1501 performs a non-linear EDC action on the ECC block to generate an EDC result and the EDC result is stored in EDC memory 11 13. If the data buffer is found, there is an error > it is corrected, and the corresponding symptom value is updated by a symptom correction circuit (not shown) in the ECC decoder (1)1, and EDC The result of edc in the hidden body 1113 is updated by the EDC corrector 1115. Then, the ECC action of the lower = direction (in this case, p〇) is directly read and stored in the syndrome value, the sign of the body 11 (39) Instead of calculating the syndrome value based on the data in the data buffer 1101, the value is calculated. The ECC action in both directions will be the number of executions or the number of executions reaches a predetermined number or no error # material exists. It should be noted that a detailed description of the linear and non-linear EDC actions can be found in the patent of the patent application No. 11/53128Q, which is filed by the same applicant and the same inventor. Figure 3 shows a block diagram of an error correction system 1600 in accordance with a sixth embodiment of the present invention.箪4 isw — The structure of the figure is similar to that of Figure 7, but the error correction system 1600 is located in the non-heterogeneous EDC confirmation component after the buffer 11Q1, and the pre-EDC confirmation component 11 before reading the data buffer is cut. 5, therefore 16 1334132 error correction system 1300 and error correction system 1600 have different actions. The data demodulated by the demodulator 1103 is stored to the memory element 1203. The memory component 12〇3 is used to temporarily store a part of the column of the ECC block, and then pre-pi ECC decoder π(1) is used to perform a PI ECC action on the ECC block in the memory component 1203 to generate a corrected ECC block. . The error correction system shown in Figure 7 is similar to the error correction system shown in Figure 8, so it will not be repeated here. In comparison with the conventional technique shown in Fig. 1, the error correction system shown in Fig. 7 includes - pre-PIECC decoding H Cong and memory component coffee. Moreover, the error correction of 7F in Fig. 7 is that the EDC Gushu of Qianshi towel is a nonlinear EDC confirmation component instead of a linear EDC confirmation component. Therefore, the error correction system is because the pre-Ecc decoder has better performance and can reduce the bandwidth because of the hidden body; τ: member 1203. Moreover, the use of non-linear EDC acknowledgment components can also help overcome the problem of frame lock sync offset. Fig. 8 is a block diagram of the error correction system 17A according to the seventh embodiment of the present invention. Please refer to Figure 5 and Figure 8 for the structure of Figure 5 and Figure 8. The error correction system 17 has a nonlinear EDC confirmation component 17〇1 located after the data buffer U(1) instead of the data buffer. The pre-determination element 1105 before the leg, thus the error correction system and error correction system 1700 has a different action. For the error correction system 17(8), the data demodulated by the solution is transmitted to the bedding buffer benefit 11〇1 and the pre-nec decoder. The PI ECC action is then performed directly on the data from the demodulator 1103 in advance by the 17 U34132 H ECC decoder 1201. Then, after the sufficiently decoded data is stored in the data buffer 11〇1, the bottom action is started: the ECC block is read from the data buffer ιι〇1, and the non-linear EDC confirmation component 1701 performs the non-ECC block. Linear EDC action to generate - EDC results 'This EDC result is stored in EDC memory 1411. Portions of the ECC block in the data buffer 1101 are read and temporarily stored in the memory element 1401' and a p〇 ECC action is performed in the line data of the memory element 14〇1 to produce an errata result. The EDC result in the EDC memory 1411 is then updated by the EDC Corrector 1413 based on the errata result. Then, the p-value generator generates the corrected line data from the memory element 1401 to generate a PI symptom value, and the PI symptom value is stored in the PI symptom value memory 14〇9, All line data. After being processed by the PO ECC action, the PI symptom value is read from the ρι symptom value memory 14〇9 and the PI ECC action is performed. Next, the error data in the memory element 14〇1 and the data buffer 1101 is corrected and the EDC result in the EDC memory 1411 is correspondingly updated by the EDC corrector 1413. Figures 9 through 12 illustrate other embodiments of the present invention that also have an EDC validation component after the data buffer. Figure 9 illustrates an error correction system 1800 in accordance with an eighth embodiment of the present invention. As shown in FIG. 9, the error correction system 1800 includes a data buffer 1801, a demodulator 1803, a pre-PI symptom generator 1805, a PI symptom memory 1807, and a p-value. The generator 18〇9, the PO symptom value memory 1811, an ECC decoder 1813, a non-linear EDC confirmation 18 1334132 recognition component 1815, an EDC memory 1817, and an EDC correction device 1819. The demodulator 1803 is configured to receive and demodulate the original data from the optical disc to generate an ECC block containing the data, the PI codeword, and the PO codeword. The data buffer 1801 is used to store ECC blocks. The pre-pi syndrome generator 1805 is configured to generate a syndrome value from the PI codeword of the ECC block. The pi symptom value memory 18〇7 is used to store the pi symptom value. The PO syndrome generator 1805 is configured to generate a p〇 eigenvalue based on the PO codeword of the ECC block. The non-linear EDC validation component 1815 is operative to perform a non-linear EDC action on the master data of the ECC block to produce an EDC result. The PO symptom value memory 1811 is used to store the P〇 symptom value. The ECC decoder 1813 performs a pi ECC action on the gee block according to the pi symptom value in the PI symptom value § 忆 体 18〇7; the PI ECC errata result, and the memory in the memory ang according to the 〇 〇 〇 value The ΡΟ 状 value performs a POIECC action on the ECC block to produce a ρ 〇 ECC errata result. EDC memory 18 is used to temporarily store EDC results. The EDC Corrector 1819 corrects the EDC result based on the Π ECC errata result from the ECC decoder 1813 or the p〇 Ecc errata result. The action of the error correction system 1800 can be briefly described as follows: the bunker from the demodulator is sent to the pre-PI syndrome generator 18〇5 and the data buffer 18(1), and the PI symptom value is stored in the PI symptom value. The memory is 18〇7. Then, when enough decoded data is stored in the data buffer, the next step is executed. The coffee decoder 1813 performs a PI ECC action on the data buffer delete (10) data according to the η symptom value in the syndrome value memory__, and the EPIC decoder view 19 1334132 a symptom value correction circuit corresponding update PI The syndrome value in the memory value 18〇7, and at the same time the EDC result in the EDC memory 1817 corresponding to the EDC corrector 1819. Moreover, the 'ECC block is read from the data buffer 18〇1, and the p〇 symptom generator 1809 generates a P0 symptom value, which is stored in the p〇 symptom value memory 1811, and the ECC decoder 1813 and the nonlinear EDC confirmation component 1815 perform a POECC action according to the result of the syndrome value and perform a nonlinear EDC action on the master data in the data buffer 18〇1, wherein the result of the nonlinear EDC action is stored in the Edc memory 1817. . The ECC decoder 1813 corrects the error data in the data buffer dirty, while the ECC decoder 1813 updates the syndrome value in the symptom value memory 1807 corresponding to the syndrome value correcting circuit, and at the same time the EDC corrector 1819 corresponds. Update the EDC results in EDC memory 1817. The downward-direction ECC action directly reads the symptom value stored in the symptom value memory instead of calculating the syndrome value based on the data buffer 18〇1 _. The PI and PO ECC actions are held alternately until the number of executions reaches a predetermined number or no error data exists. The PI symptom value memory 1807 can be integrated into the data buffer 18〇1 as shown in the figure. Figure 1 is a block diagram showing an error correction system 1900 in accordance with a ninth embodiment of the present invention. In addition to the PI symptom value memory, the error correction system 19GG shown in Figure 1 is roughly the same as the error correction system shown in Figure 9. 1334132 Therefore, the error correction system connection method and action will be corrected. It is different from the error correction system 1800. The error correction secret 1_ action can be briefly described as follows. The demodulated data from the resolution 18〇3 is spread to the pre-H syndrome value and the f-buffer leg, and the PI symptom value is stored in the data buffer 18〇1. Then, after the enough decoded data # is stored in the data buffer 18〇1, the bottom action is started: the Ecc decoder 1813 performs a Dan ECC action according to the ρι symptom stored in the data buffer 18〇1 and corrects (10) The data in the buffer, and the syndrome correction circuit (not shown) in the ECC decoder update the corresponding symptom value, and the EDC result in the edc memory 1817 is also updated by the EDC corrector 1819. Then the ECC block is read from the data buffer 18〇1 and? The syndrome value generator 18〇9 is stored in the pQ symptom value memory 1811 according to the ECC block Newton PQ symptom value. After the P〇 symptom generator 18〇9 calculates the p〇 symptom value, the poEcc action is performed. The ECC decoder 1813 and the non-linear EDC confirming component 1815 perform a POECC action according to the result of the syndrome value and perform a nonlinear EDC action on the data in the data buffer 18〇1, wherein the result of the nonlinear EDC action is stored in the EDC memory. In 1817. The ECC decoder 1813 corrects the error data in the data buffer 1801, and simultaneously updates the p〇 symptom value in the PO symptom value memory 1811 corresponding to a syndrome correction circuit in the ECC decoder 1813 and the data buffer 1801. The PI symptom value, and at the same time, the EDC result in the updated EDC memory 1817 corresponding to the correction device 1819. The ECC action in the next direction directly reads the syndrome value stored in the P0 syndrome memory 21:Γ or the data buffer 1801, instead of the hash value in the data buffer _. The ΡΙ and PQ ECC actions will continue to alternately execute the number of _ _ - the predetermined number or no error dump. The pre-PI syndrome generator 1805 can be integrated into the pre-SPI Ecc decoder as shown in FIG.帛11_ shows the block of the corruption correction system 2_ according to the tenth embodiment of the present invention. In this embodiment, the demodulated data from the demodulator 18〇3 is transmitted to the pre-π ECC decoder 2(8) and the data buffer 180, and the syndrome generator in the pre-PI ECC decoder generates the ρι sign. The value is stored in the PI symptom value memory 1807. The pre-PI Ecc decoder 2〇〇1 directly performs the PIECC action on the data from the demodulator 1803, and the correction value corresponding to the syndrome value correction circuit in the pre-Hecc decoder 2GG1 is in the memory value 18〇7 PI symptom value.

Then, when the sufficiently decoded data is stored in the data buffer 18〇1, the underlying action is started. The ECC block is read from the data buffer 18〇1, and the p〇 symptom generator 1809 generates a PO symptom value and stores it in the P〇 symptom value 1811. The Ecc decoder 1813 and the nonlinear EDC confirming component 1815 respectively perform the Ecc action in the first direction and the nonlinear EDC action based on the result of the syndrome value in the data in the data buffer ι8〇. The result of the non-linear EDC action is stored in the EDC memory 1817. Then the 'ECC decoder 1813 corrects the error data in the data buffer, and the correction of the syndrome correction circuit in the ECC decoder 1813 corresponds to the corresponding correction? The PI and p〇 symptom values in the syndrome value 1807 and the PO symptom value memory 1811, and the EDC results in the EDC 22 memory 1817 are also updated by the EDC corrector 1819. The ECC action in the lower direction directly reads the syndrome value stored in the symptom value memory 18〇7, instead of calculating the syndrome value based on the data in the data buffer job. The pi and P〇 ECC actions continue to alternate until the number of executions reaches a predetermined number or no error data exists. The PI symptom value memory 1807 in Fig. 11 can be integrated into the data buffer U07 as shown in Fig. 12. Fig. 12 is a view showing the manner of the error correction system 21GG according to the eleventh embodiment of the present invention. In this embodiment, the value of the ρι symptom is stored in the data buffer stomach towel instead of the ρι 录 体 卜 其他 其他 其他 其他 其他 其他 其他 其他 其他 其他 其他 其他 其他 其他 其他 其他 其他 其他 其他 其他 其他 其他 其他 其他 其他 其他 其他 其他 其他 其他 其他Figures 13 through 15 illustrate block diagrams of other embodiments of the present invention. These % cases have a pre-EDC confirmation component, a syndrome generator or a 疋-pre-ECC component in front of the data buffer, and have phase-components after the data buffer. Figure 13 is a block diagram showing an error correction system 2200 in accordance with a twelfth embodiment of the present invention. As shown in FIG. 13, the error correction system 22 includes a data buffer 220-demodulator 2203, a pre-EDC confirmation component 22〇5, a pre-argument generator 2207, and a PI syndrome. The memory 22 has a p2 value generating state 2211, a PO symptom value memory 2213, an ECC decoder, > EDC memory 2217, and an eDC corrector 2219. Demodulator 2213 is operative to receive the original data that should be demodulated from the vehicle to produce an ECC block containing the data, the H codeword, and the 23 1334132 P0 codeword. The EDC validation component 22〇5 performs an EDC action on the master data from the demodulated H 2203 to produce an EDC result. Data buffer 2203 is used to store ECC blocks and EDC results. The pre-pig symptom generator 2207 is configured to generate a PI syndrome based on the ECC block from the demodulator 2201. The PO symptom value memory 2209 is used to store the positive sign value from the p〇 symptom value generator. The ECC decoder 2215 performs an ECC action based on the PI 丨 P0 syndrome value to generate an errata result. The EDC memory 2217 is used to temporarily store the EDC results. The EDC Corrector 2219 is used to correct the EDC results based on the errata results from the ECC decoder 2215. The error correction system 2200 can be described as follows. The demodulated data from the demodulator 2203 is transmitted to the syndrome generator 2207, the pre-EDC confirmation component 22〇5, and the data buffer H, which is in the PI recording memory 2209 and EDC. The result is stored in the data buffer 22〇1 0. Then, when the sufficiently decoded data is stored in the data buffer 2201, the next action is started. The data buffer 22G1 _ EDC wire is read and read in the EDC memory 2217. The ECC decoder 2215 performs an ECC action in one direction according to the PI symptom value stored in the pi selection value memory 22〇9, and the symptom correction circuit (not shown) in the ECC decoder 2215 updates the PI flag. The value of the PI and p〇 values in the memory value 2213 of the value memory 22〇9*p〇, and the EDC result in the EDC memory are also updated by the EDC corrector 2219. The ECC block in the data buffer is read and the p〇 value generator 2211 calculates the p〇 symptom value and stores it in the P0 symptom value memory block 2213. When the motion in one direction is completed 24 1334132, the ECC action in the next direction directly reads the syndrome value stored in the syndrome memory 22〇9 and 2211 instead of the data buffer 22〇1. The data is calculated for the syndrome value. The forward ECC action will be sent to Wei Wei until the number of executions reaches a predetermined number or no error data exists. Figure I4 does not depict a block diagram of the error correction system 7〇〇 according to the thirteenth aspect of the present invention. As shown in FIG. 14, the error correction system includes a data buffer 50 demodulator 503, a pre-EDC confirmation component 6A, a pre-pig symptom generator 507, and a PI symptom memory 505. - P〇 symptom generator 509, - symptom value memory 5U, an ECC jammer 513 ... edc memory 605, and - EDC corrector 603. The ECC decoder 513 performs ECC_ according to the ρι or p〇 syndrome value to generate a secret result. The EDC clock 4 is used to temporarily store the EDC (fruit. The EDC corrector 603 is used to correct the EDC result based on the errata result from the Ecc decoder 513. The action of the error correction system 700 can be as follows. From the demodulator 5〇3 The demodulated data is transmitted to the pre-signal value generator 5〇7, the pre-coffee confirmation element 601, and the data buffer pass, wherein the H-choke value is stored in the ρι symptom value memory 505 and the EDC result is stored in Within the data buffer 501. Then, when enough data is stored in the (4) buffer, the next action is started. The EDC result in the data buffer 5〇1 is read and stored in the 605. The ECC decoder 513 performs the - (10) ECC action '_ECC decoder 5i3_ symptom correction circuit (not shown) to update the symptom value memory 5U according to the value of the shape 25 1334132 stored in the data buffer $5〇1. Within the PI_ symptom value, the coffee result in the coffee memory 6〇5 is also updated by the coffee correction device. The ECC block of the poor material buffer pair _ take and the 〇 〇 健 健 , , The symptom value is stored and stored in the symptom value memory 511. When the "direction" action is completed After the 'lower-square (four) ECC_ system direct _ existence of the symptom value in the recorded value memory 511 ' instead of calculating the syndrome value according to the data in the data buffer 5 〇 1. Both (10) ECC action will _ (four) perform a long execution The reading reaches a predetermined number or no error data exists. Fig. 15 is a block diagram showing the error correction system 2300 according to the fourteenth embodiment of the present invention, which is compared with the error correction system shown in Fig. 13. The error correction button has a more - pre-"ECC decoder track, and the pre-mortem value generator 22G7 is integrated into the pre-PIECC decoder fiber. Therefore, the error correction system 2200 and 2300 connection relationship and action are not @ The operation of the error correction system 2300 can be as follows: the demodulated data from the demodulator 22〇3 is passed on the CC decoder, the pre-registration component 2205, and the data buffer 22 (H' where Pm is The value is stored in the text value memory 2209 and the EDC result is stored in the data buffer 22 。 1. Then, when the sufficiently decoded data is stored in the data buffer 22 〇 1, the underlying action is started. Device The EDC result is read and stored in the mc memory side (2)7' and the PO symptom value is generated as calculated p〇 symptom value and stored in the 26 1334132 symptom value memory. The ECC decoder 2215 is based on the P0 symptom value. The ECC action in one direction is performed, and the syndrome correction circuit (not shown) in the ECC decoder 2215 updates the corresponding p〇 symptom value in the P0 symptom memory 2213, and the EDC in the EDC memory 2217. The result is also updated by the EDC corrector 2219. The ECC decoder 2215 then performs an ECC action in the other direction based on the PI syndrome value, while the syndrome correction circuit (not shown) in the ECC decoder 2215 updates the syndrome value memory. The corresponding syndrome value in the body 2213 is also updated by the EDC corrector 2219 in the EDC result in the EDC memory 2217. The ECC action in the next direction directly reads the syndrome values stored in the PI symptom value memory 22〇9 and the p〇 symptom value memory 2213. Ecc actions in both directions will continue to alternate until the number of executions reaches a predetermined number or no error data exists. The pi symptom value memory 2209 in the error correction system 2300 can be integrated into the data buffer H as shown in Fig. 6. The tenth eye is a block diagram of the error correction system 2400 according to the tenth embodiment of the present invention. In the error correction system 〇: the value of the job from the pre-PIECC decoder 2301 is stored in the data buffer employment instead of the symptom value memory 2209. Since the error correction system period action can be easily derived from the description of the error correction system 23 (8) and the error correction (4) 2 structure, it will not be repeated here. The second to second drawings illustrate block diagrams of other embodiments of the present invention. These embodiments have a pre-EDC confirmation component in the data_n, the record generator 27 1334132 or a syndrome memory, and have the same components after the data buffer. Figure 17 is a block diagram showing an error correction system in accordance with a sixteenth embodiment of the present invention. As shown in FIG. 17, the error correction system 2500 includes a data buffer 2501, a demodulator 2503, a pre-EDC confirmation device 2505, a pre-symmetric value generator 2507, symptom value memories 2509 and 2511, and a An ECC decoder 2513, an EDC memory 2515, and an EDC corrector 2517. The demodulator 2503 is configured to receive the original data from the optical disc to generate an ECC block containing the data, the PI codeword, and the PO codeword. The data buffer 2501 is used to store ECC blocks. The pre-symptom value generator 2507 is configured to generate a syndrome value from the n-codeword or the p-codeword. The symptom value memory 2509 is used to store the syndrome value from the pre-symptom value generator 2507. The syndrome value s 2+ is used to store the syndrome value from the data buffer 2511. The ECC decoder 2513 is operative to perform a ρι or PO ECC action based on the syndrome value stored in the memory 2511 to generate a Pi or P errata result. The EDC memory 2515 is used to temporarily store the coffee result from the data buffer 25〇1. The edc corrector 2517 is used to correct the edc result based on the H or p errata result from the ECC decoder 2517. In the buffer 2501. The actions of the error correction system 2500 can be briefly described as follows. The demodulation data from the demodulator 25〇3 is still sent to Jingmei, and the device is 25〇5. 25〇7. After collecting the 250s from the café _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ The EDC results are read into EDC memory 2515. The syndrome value result is read to the symptom value memory 2511, and the ECC decoder 2513 performs the ECC action in one direction, and the syndrome correction circuit (not shown) in the ECC decoder 2513 updates the corresponding symptom value. At the same time, the EDC result in the EDC memory 2515 is also updated by the EDC corrector 2517. This action will continue until each column is updated. After all the columns have been corrected, the ECC decoder 2513 performs the ECC action in the other direction according to the P0 syndrome value, and the syndrome correction circuit (not shown) in the ECC decoder 2513 updates the corresponding symptom. The value, while the EDC result in the EDC memory 2515 is also updated by the EDC Corrector 2517. This action will continue until each line is updated. After all the lines are processed, the lower-direction coffee action directly reads the symptom value stored in the symptom value memory plus, instead of calculating the sign based on the data in the data buffer coffee. The two parties (10) coffee action read Wei Wei until the number of orders reached - the predetermined number or no error (four) exists. The results of the symptoms of the memory of the needles and the symptoms of the memory are not limited to the temporary storage to the data buffer, as shown in Figure 18, so the error corrections are 2500 and 2_ Fine action

A block diagram of the error correction system of the example of the ww J brother seventeen in accordance with the present invention. The operation of the error contending system 2600 can be briefly described. The demodulation data from the demodulation benefit 2503 is transmitted to the data buffer 2501, the pre-EDC confirmation device 25〇5, and the pre-signal generation state 2507. The result of the syndrome is stored in the syndrome memory 25〇9, and the EDC result is stored in the data buffer 25〇1. Then, when the sufficiently decoded data is stored in the data buffer 25〇1, the underlying action is started. The EDC results are read into EDC memory 2515. The ECC decoder 2513 performs an Ecc operation in one direction based on the syndrome value in the syndrome memory 25〇9. The syndrome value correction circuit (not shown) in the ECC decoder 2513 updates the syndrome memory 2509. The corresponding syndrome value, while the EDC result in the EDC memory 2515 is also updated by the EDC corrector 2517. This action will continue until each column is updated. After all the columns have been corrected, the ECC decoder 2513 applies the ECC action in the other direction according to the p〇 symptom value result, and the syndrome correction circuit (not shown) in the ECC decoder 2513 updates the corresponding one. The EEG value of the EDC memory is also updated by the EDC Corrector 2517. This action will continue until each line is updated. After all the lines have been processed, the ECC action in the next direction directly reads the syndrome value stored in the symptom value memory 2511 instead of calculating the syndrome value based on the data in the data buffer 25〇1. The ECC actions in both directions will continue to be alternated until the number of executions reaches a predetermined number or no error data exists. The error correction system 2500 can further include a pre-pIECC decoder 27(1) as shown in Fig. 19 of 30 1334132. ® 19 ® illustrates a block diagram of an error correction system 2700 in accordance with an eighteenth embodiment of the present invention, the actions of which are as follows. The demodulated data from the demodulator 25〇3 is sent to the data buffer 2501, the pre-EDC confirming means 25〇5, and the pre-signal value generator 2507. The syndrome values and EDC results are stored in the data buffer 2501. The pre-PIECC decoder 2701 performs a -piECC action on the ECC block in the data buffer 2501 according to the syndrome value of the syndrome generator to generate the syndrome value result and the EDC result, which are all stored in the data buffer 25〇1. . At the same time, the syndrome correction circuit (not shown) in the ECC decoder 2513 updates the corresponding symptom value in the syndrome memory, and the EDC result in the data buffer 2501 is also updated by the EDC corrector 2517. Then, when the sufficiently decoded data is stored in the data buffer 25〇1, the underlying action is started. The syndrome value result is read to the symptom value memory 2511, and the Ecc decoder 2513 performs the ECC action in one direction, and the syndrome correction circuit (not shown) in the ECC decoder 2513 updates the corresponding symptom value. At the same time, the EDC result in the EDC memory 2515 is also updated by the EDC corrector 2517. Then, the PI symptom value result is read to the symptom value memory 2511, and the ECC decoding flag 2513 performs the ECC action in the other direction, and the syndrome value correction circuit (not shown) in the ECC decoder 2513 updates the corresponding one. The syndrome value, while the EDC result in the EDC memory 2515 is also updated by the EDC corrector 2517. The lower ECC action is directly reading the symptom value in the training of the symptomatic memory, rather than calculating the symptom based on the data. The ECC action in both directions will be executed by the execution of the money - the predetermined number or no error data exists. The result of the syndrome value of the symptom value memory 2511 is not limited to the temporary storage to the data buffer 25〇1, as shown in Fig. 20, so the error correction system 27〇〇 and the 2 lion's action and connection relationship are different. . Fig. 2 is a diagram showing the scale of the error correction system 2_ according to the nineteenth embodiment of the present invention, the operation of which can be as follows. The demodulated data from the demodulator is transferred to the data buffer 25'1, the pre-edc confirming means 2505, and the pre-signal value generator 25'7. The pre-PI ECC decoder 2701 performs a piECC action on the ECC block in the data buffer 2501 based on the syndrome value of the syndrome generator to update the syndrome value in the syndrome memory 25〇9. The result of the syndrome value is stored in the path value memory μ and the EDC result is stored in the data buffer 25〇1. At the same time, the syndrome correction circuit (not shown) in the Ecc decoder Mu updates the corresponding symptom value of the symptom value memory 2, and the EDC result of the E15 memory 2515 is also updated by the EDC corrector 2517. . Then, when enough decoded data is stored in the data buffer 25〇1, the underlying action is started. The EDC results are read into EDC memory 2515. The Ecc decoding 32 1334132 2513 performs the ECC action in the other direction according to the syndrome value in the syndrome memory 2509, and the syndrome correction circuit (not shown) in the ECC decoder 2513 updates the corresponding syndrome value. At the same time, the EDC result in the EDC memory 2515 is also updated by the EDC corrector 2517. Then, the result of the PI symptom value is read to the symptom value memory 2509, and the ECC decoder 2513 performs the ECC action in one direction, and the syndrome correction circuit (not shown) in the ECC decoder 2513 updates the corresponding sign. The value, while the EDC result in the EDC memory 2515 is also updated by the EDC corrector 2517. The ECC action in the next direction directly reads the symptom value stored in the symptom value memory 25〇9, instead of calculating the symptom value based on the data in the data buffer lOi. ECC actions in both directions will continue to alternate until the number of executions reaches a predetermined number or no error data exists. Fig. 21 is a diagram showing the error correction method of the error correction system 11 shown in Fig. 2. The method includes the following steps: Step 3001: Receive and demodulate original data to generate an ECC block. Step 3003 Perform an EDC action according to the information of the ECC block to generate an EDC result. Step 3005. 33 1334132 Store the ECC block and the EDC result. Step 3007: Generate at least a symptom based on the stored -Π codeword and the -p〇 codeword of the ECC block. Step 3009 Perform an ECC action step 3011 according to the symptom value to correct the ECC result according to the result of the ECC action. According to the ECC of the Η or Ρ0 trait value, the number of rewards is up to the value of the sacred value or the horrible value. If the method corresponds to the error correction of the third embodiment, it further includes: performing a piECC action on the ECC block from step 3〇01 to correct the error data and repair the IEDC result according to the result of the HECC action. If this method corresponds to the error correction of the 4th Lin (4), it also includes: the storage comes from. Step 3〇〇1 of the ECC block and perform the –PI ECC action on the stored ECC block. Moreover, step 3〇〇3 performs an EDC action after the η Ecc action to generate an EDC result. 34 丄兮丄 Other fine features have been revealed in Section 2 and will not be repeated. In the description of FIG. 4, the original data is received and demodulated in this step 3101 to generate an -Ecc block; Step 3103 is performed according to the data of the ECC block to generate a brain result; Step 3105 is to store the ECC. Block and the EDC result; Step 3107: Performing a PIECC action on the ECC block to correct the ECC block and correcting the EDC result according to one of the PIECC actions. Step 3109 temporarily storing a portion of the stored ECC a block; step 3111: generating a p 〇 35 35 ... 4132 value according to one of the ECC blocks temporarily stored in step 3109; step 3113 generating a Pi symptom value according to one of the ECC blocks Step 3115 performs an ECC action according to at least one of the syndrome value and the P0 symptom value; and step 3117 corrects the EDC result according to one of the ECC actions. The ECC action according to the Η or Ρ0 symptom value will be alternately repeated until the number of repetitions remains - the predetermined value of the sister has the wrong data. Further details have been disclosed in the fifth description, and thus are omitted here. Figure 23 of the s green does not correspond to the error correction method of the error correction system 1500 shown in Fig. 6, which includes: Step 3201 Receive and demodulate the original data to generate an -ECC block Step 3203 36 1334132 For the ECC area from step 3201 The block performs a PIECC action to generate a corrected ECC block. Step 3205 Stores the ECC block and corrects the ECC block. Step 3207 performs a non-linear EDC action on the ECC block stored in step 3205 to generate a £DC result. Step 3209 generates at least one syndrome value according to the codeword and the p〇 codeword of the ECC block stored in step 3205. Step 3211 performs an ECC action according to the syndrome value. Step 3213 corrects the jgDc result based on the result of the ECC action. The symptom value of this method includes at least one of a PI symptom value and a p〇 symptom value. The ECC action according to the Η or K) symptom value will be alternately repeated until the number of repetitions reaches a predetermined value or no error data exists. 37 If the method shown in Fig. 21 corresponds to the 1_', it further includes: the change of the storage county from the step gamma to Fig. 7 can be known from the above description. The error shown in the figure corrects part of the ECC block of System+. Other If the 21st ride method corresponds to the first

Contains the value of the ρι pattern generated by storing the step gamma for step 3〇11.

In the description of the figure, it will not be described here. Figure 24 illustrates an error correction method corresponding to the error correction system 1700 shown in Figure 8, which includes: Step 3301 Receive and demodulate the original data to generate an ECC block. Step 3303 Store the ECC block and correct the ECC block. Step 3305 38 1334132 Perform a PI ECC action on the ECC block from step 3301 to generate a corrected ECC block. Step 3307 Perform a non-linear EDC action according to the ECC block in step 3303 to generate an EDC result. Step 3309. According to step 3303. The PO code word of the ECC block generates a p〇 value value step 3311. The ECC block in step 3303 is subjected to a Gee action step 3313 according to the PI symptom value or the p〇 symptom value. According to the ECC block in step 3303 The pi code word generation - ρι symptom value step 3315 corrects the EDC result based on one of the ECC actions. Descriptions Other detailed features have been disclosed in the description of Fig. 8, and therefore no longer 1800 Fig. 25 illustrates the error correction method corresponding to the error correction system and the 1900 shown in Figs. 9 to 20. 39 1334132 Step 3401 Receive and demodulate the original data to generate an ECC block Step 3403 Generate a falsification value according to the PI codeword of the ECC block in step 3401 Step 3405 Store the ECC block Step 3407 According to step 3405 The PO code word generation of the ECC block - p〇 symptom value step 3409 performs a non-linear EDC action according to the ECC block in step 3405 to generate an EDC result. Step 3411 According to the H symptom value and the PO symptom value, at least - the implementation - ECC action. Step 3413 According to the ECC surface (the silk correction EDC result. The symptom value of the method includes at least one of the PI symptom value and the PO symptom value. According to the 40 峨 峨 到 若 若 若 若 若 若 若 若 若 若 若13 and the error correction system shown in the figure. This method generates a ρ 〇 I I according to the Ecc block stored in step _ and step 3403 is used to generate the pj trait value. Corresponding to the error correction system shown in Figures 15 and 16, step 3403 performs a pj Ecc action. If the method shown in Fig. 25 corresponds to the error correction system shown in Fig. 17, it further includes storing the syndrome value and The symptom value is provided to step 34〇9. If the method of the 25th riding corresponds to the error correction system of the 19th riding, the method further includes storing the symptom value and providing the symptom value to the step. Corresponding to the error correction system shown in Fig. 2, it further includes correcting the data of the ECC block stored in step 3405 and the EDC result, and correcting the stored symptom value. The foregoing system has different structures and different benefits. For example, symptom value memory and symptom values Correction of the use of the circuit can reduce the bandwidth consumption of the data buffer. 'EDC § The use of the memory and the EDC correction device can also reduce the bandwidth consumption of the data buffer. Moreover, the present invention provides the use of the syndrome memory. The value correction 丄 334132 circuits, EDC memory and corrections, and pI, p〇Ecc to provide error correction systems for different types of cancer. Therefore, the present invention can meet different needs. The above is only a preferred implementation of the present invention. For example, the average variation and modification of the scope of the patent application of the present invention are covered by the present invention. [Simple Description of the Drawing] FIG. 1 can not depict the block diagram of the error correction system of the related art. A block diagram of an error correction system according to a first embodiment of the present invention is shown. A third figure shows a block diagram of an error correction system according to a second embodiment of the present invention. The figure shows a block diagram of a error correction system according to a third embodiment of the present invention. The fifth embodiment shows a block diagram according to a fourth embodiment of the present invention. The sixth figure (four) is according to the present invention. A block diagram of the error of the fifth embodiment. ~ Fig. 7 is a block diagram showing a sixth embodiment of the invention. ~ Fig. 8 is a diagram showing an error according to the seventh embodiment of the present invention. Fig. 9 is a block diagram of the eighth embodiment of the present invention _ error correction system. Fig. 10 is a block diagram of the error correction system according to the ninth embodiment of the present invention. Figure 11 is a block diagram showing the error correction according to the tenth embodiment of the error correction system according to the tenth embodiment of the present invention. The square can not ride the twelfth according to the present invention. The method of the error correction system of the embodiment shows a block diagram of the system of the error correction system according to the thirteenth (10) of this (4). The figure is a block diagram of the error correction system according to the fourteenth embodiment of the present invention. τ A block diagram of the error correction system according to the fifteenth implementation of this judgment. θ is a block diagram of the error correction system according to the sixteenth embodiment of the present invention, which is given to the spear τ. 9 is a block diagram showing the error correction system according to the seventeenth embodiment of the present invention. The error correction system of the tenth embodiment of the present invention is shown in FIG. 2, and the block of 'the' is not in accordance with the nineteenth embodiment of the present invention. The error correction system 43 1334132 is shown in FIG. Figure flow chart. Figure 22 is a flow chart corresponding to Figure 5. Figure 23 is a flow chart corresponding to Figure 6. The error correction __correction method error correction system error correction method error JL system error correction method flow chart. Fig. 24 is a flow chart showing the error correction method of the error correction system corresponding to Fig. 9 to Fig. 25, showing the error correction method corresponding to the error correction system of Fig. 8. [Main component symbol description] Error correction system 100, 700, 1100, 1200, 1300, 1400, 1500, 1600, 1700 1800, 1900, 2000, 2100, 2200, 2300, 2400, 2500, 2600, 2700, 2800 data buffer 101, 501, 1101, 1801, 2201, 2501 Demodulator 103, 503, 1103, 1803, 2203, 2503 Symptom generator 105, 1107, 2507 Symmetric memory 107, 511, 1109 ECC decoder 1〇 9, 513, 1111, 1405, 1813, 2215, 2513 Linear EDC Confirmation Element 111 EDC Memory 113, 605, 1113, 1411, 1817, 2217, 2515 EDC Corrector 115, 603, 1115, 1413, 1819, 2219, 2517 Pre-EDC confirmation component 601, 1105 44 1334132 Pre-PIECC decoder 1201, 2001, 2301, 2701 Memory component 1301, 1401 PI symptom memory 505, 1409, 1807, 2209 PI symptom generator 507, 1407, 2207 PO symptom generator 509, 1403, 1805, 1809, 2211 Nonlinear EDC confirmation component 1501, 1601, 1701, 1815 PO symptom memory 1811, 2213 EDC confirmation component 2205 Symmetric memory 2509 2511 45

Claims (1)

1334132 X. Application for Patent Park: 1. A error correction system, comprising: a demodulator, rib receiving and thawing start data to generate -ECC block; pre-PIECC solution to the mother, consumption to the demodulator, Performing a PIECC action on the ECC block from the demodulator to generate a corrected ecc block; a data buffer for storing the ECC block and the corrected ecc block; the non-line EDC is confirmed Means for performing a non-linear EDC action based on the / ECC block in the data buffer to generate an -edc result; a syndrome generator for utilizing the ecc region stored in the data buffer One codeword of the block to generate at least one syndrome value; - an ECC decoder for performing an Ecc action based on the syndrome value; and an EDC Corrector' for correcting the edc result according to one of the ECC actions; The syndrome value includes at least one of a PI symptom value and a p〇 symptom value, the code word including at least one of a PI code word and a P0 code word. 2. The error correction system of claim 1, further comprising a memory component to store a portion of the ECC block from the demodulator. 3. The error correction system of claim 2, wherein the portion of the ECC block stored in the memory component is stored in the data buffer after being processed by the pre-picc decoding piano. Device. 46 4. If the error correction system of the patent of the application of the second patent, the symptom generator generates the PQ symptom value stored to the signature value, and the pre-PIECC solution The woven memory is buffered to the data buffer, whereby the ECC decoder corrects the 〇 〇 来自 value from the syndrome memory and the PI sigma value from the data buffer. 5. The error correction system of claim 4, further comprising: - a symptom value memory for storing the PI symptom value generated by the pre-pi ecc decoding set; wherein the ECC decoder is based on The ρι symptom value in the ρι symptom value memory performs the Ecc action on the ECC block. 6. The error correction as described in item 1 of the patent application, wherein the original data is stored in a disc. a error correction system comprising: a demodulator 'to receive and demodulate the original data to generate an ECC block; a pre-PIECC decoder to which the demodulator is lightly coupled to the demodulator The ECC block performs a Ε χ (χ action to generate a corrected ECC block; - food easing) to store the ECC (1_ and the corrected Ε χ χ χ — — — — — — — — — — — 件For storing a portion of the ECC block from the data buffer; a non-linear EDC confirming device for applying a non-linear EDC action to the ECc block in the data buffer to generate an -EDc result 47 1334132 A PO symptom generator 'for generating a P〇 value according to the P0 code word of the part of the Ecc block in the memory element; a π syndrome generator for Generating a PI symptom according to the part of the ECC block stored in the memory component; an ECC decoder, configured to perform an ECC action according to at least one of the PI symptom value and the p〇 symptom value; And an EDC corrector for correcting the ECC result based on the result of the ECc action. The error correction system of claim 7, wherein the p〇 syndrome generator generates the p〇 symptom value according to the ECC block in the memory component, and then the ECC decoder according to the p〇 syndrome The value is subjected to a p〇ECC action on the ECC block in the memory element. 9. The error correction system of claim 7, wherein the PI symptom generator is based on the memory element The ECC block generates the PI symptom value, and then the ECC decoder performs a PIECC action on the ECC block in the memory element according to the pi symptom value. The error correction system is described, wherein the original data is stored in a disc. U. - A method of error correction, comprising: (a) receiving and demodulating the original data to generate an ECC block; 48 (b) from the The ECC block of step (a) performs a PIECC action to generate - a corrected ECC block; (c) stores the ECC block and the corrected ECC block; (d) the ECC area stored according to the step (6) The block performs a nonlinear EDC action to generate an EDC result; (7) Generating at least one symptom value according to one of the ECC block and the p-code word stored in the step (6); (f) performing an ECC action according to the symptom value; and (g) operating according to the ECC A result corrects the EDC result; wherein the symptom value comprises a PI symptom value and a P〇 symptom value of at least one of them. 12. If the error correction method of the application profile is included in the step The symptom value is stored in (e). 13. The error correction method as described in claim 5, further comprising a step (al): storing a portion of the Ecc block from the step (4). 14. The error correction method according to claim 13 of the patent application, further comprising storing the portion of the _ (al) scale after processing by the step (8). 15. The error correction method of claim 12, wherein the step (6) produces the stored K) symptom value, the step of generating the ρι symptom value, 49 1334132 and the Η symptom value and The value of the P sign is stored to a different storage element. 16. The error correction method described in claim 15 is further included. The value of the PI symptom generated by the step (b) is stored. 17. An error correction method comprising: (a) receiving and demodulating original data to generate an ECC block; (9) performing a piEcc action on the ECC block from the step (8) to generate - a partial ECC block; c) storing the ECC block and the part of the ECC block; (9) performing a non-linear ugly action on the ECC block stored in the step (6) to generate an EDC result; (e) according to the step (c) The p〇 code word of the part of the ECC block stored in the block generates a P0 symptom value; (7) according to the part stored in the step (C): the block generates a symptom value; (g) Performing an ECC action according to the PI symptom value and the P0 symptom value at least one pair of the ECC block stored in the step (c); (h) according to the part of the ECC area stored in the step (6) The block generates the PI symptom value; (1) correcting the EDC result based on the result of the ECC action. 18. The error correction method according to claim 17, wherein the step (g) generates the PO symptom value, and then the step (i) performs the 50 1334132 ECC action according to the p〇 symptom value. 19. The error correction method of claim 17, wherein the step (1) generates the PI symptom value, and then the step (h) performs a PIECC action based on the PI symptom value. 20. The method of error correction as described in claim 17 is stored in a disc. , where the original capital XI, schema: 51