TWI327671B - Electrical connector and method thereof and electronic module - Google Patents

Description

1.327671 IX. Description of the Invention: [Technical Field of the Invention] The present invention relates to a set of electronic connections between two electronic components, 'the connector' is particularly related to a group of one drive 1C and one The electronic connector of the display panel's pixel section. [Prior Art] The display panel usually includes a pixel region and a plurality of data lines DL and gate lines GL connected to the pixel regions, such as a liquid crystal display (LCD) panel. As shown in Fig. 1, these data lines and gate lines are connected to a plurality of integrated circuit drivers or driver 1C such as data drive wafer 10 or gate drive wafer 20. All of the driver wafers include a bond pad area 210 having a plurality of electrical conductor pads (not shown) for connecting a plurality of electrical conductors to the connector region 220 in the pixel region. On, as shown in Figure 2. Since the spacing SI between adjacent wires at the wafer end is smaller than the spacing SP between adjacent wires at the end of the pixel region, a fan-out (φ FS) pattern is used to unwind the wire from the wafer end. To the Susie District. In this expanded sample, the wire at the sample boundary is always much longer than the wire in the middle portion. For example, wire A is shorter than wire B, wire B is shorter than wire C, and so on. If the wires are made of the same material and have the same thickness and width, the resistance of the longer wires will be greater than the resistance of the shorter wires. As shown in Figure 3, in order to reduce the difference in resistance between the wires of a developed sample, different zigzag path samples were used on the middle portion of the wire. In particular, Na et al. (US Patent No. 6, 104, 465)

Client's Docket No,: AU0503080 TT's Docket No:0632-A50666-TW/Final/Jasonkung 5 Connector sample 'It has a - straight line area and the same: the Λ line area and the bend in the bend area ^ ^ ^ ^ ^ £ The rifling line may include several different ridges such as a wave shape and a ridge line shape.

Kim specializes (US Patent No. $ iqi, each of which leads to the right one ϋ1) reveals an unfolding JtR eight- ’, '〃 has a 乍 wire part connected to a wide tomb line 4 knives. The error is to adjust the long-term production of the wide wire portion, to reduce the difference in resistance between the wires. X increases the resistance value sample, U.S. Patent No. I, 7,450 reveals an unfolding to ί - I: I has a narrow wire portion, - a wide wire portion between the middle f H two narrow wire portion width and a wide wire The portion of the width of the door that is free of the inclined portion of the wire. Use the 觅 port to change the wire width or use the adjustment width to guide the difference between the wires of the sample. = === Use different indentation paths to reduce the difference in resistance values. Such as ΐ Γ Γ: Kyrgyzstan: a suture-shaped path with allowable - wire path visibility (swath Wldth). For example, the wire A has a mineral tooth width ^ with a c, the wire 6 has a silver tooth and a B, and the wires C, D, and E respectively have a tooth width |, 1 with an i width ^: ^... (4) The length of the shape of the path will follow the silver two =. Therefore, in order to reduce the difference in resistance between the wires, the width of the S-toothed tooth of the intermediate wire is greater than the width of the tooth-shaped tooth of the two-line. As shown in Figure 3, Wa is greater than Wc,

Wc Bellow is larger than Wd and We. Therefore, the path length difference in the wire can be

Client's Docket N〇.: AU0503080 TT s Docket N〇: 〇 632-A50666-TW/FinaVJasonkung 6 1327671 The reduction of oxygen in the rice is roughly eliminated „ 昍 昍 、 、 、 、 、 、 、 、 、 、 、 、 、 、 To display the unfolded sample (such as the sample shown in Figure 3), the effect of the segment reduces the difference in resistance between the wires. The shape of the rudder cannot be rudder. Therefore, it is necessary to provide a (S) path length of the S. , Mingjia a saw [invention content]

In view of the above, the present invention provides a method for reducing the path between the electronic wires in the unfolded sample of the Μ 厍 婵 a = = = = = = = = = = = = = The wires between the display panels can have more than two zigzag zigzag widths. For the above purpose, a deployment sample having two or more spread sections is applied between the -drive wafer (IC) and the display panel to reduce and eliminate the difference in path length between the electronic leads in the unfolded sample. . Therefore, the wire partially driven between the wafer and the display panel has more than two orthodontic tooth widths. ...in a deployed sample having two expanded sections, for example, a first expanded section enlarges the spacing between two adjacent wires at the wafer end & to an intermediate space Fwj SM, and a second expanded section Further expanding this, the interval SM to the interval sp is at the end of the pixel region. With the two expansion sections, the first zigzag extension is applied to a portion of the wire between the wafer end and the first deployment section, and the second zigzag extension is applied to the first deployment section and the second Expand on some of the wires between the segments. In general, the zigzag serration width of the first tooth profile extension will be greater than the zigzag serration width of the first zigzag extension.

Chengs Docket No.: AU0503080 π s Docket N〇: 0632-A50666-TW/Fmayjasonkung 1327671 Open area expansion ' allows the unfolded sample to have one or more expanded sections between the second 00 and the dans. The above and other objects, features, and advantages of the invention will be apparent from the description of the appended claims. ν 17 ^ The present invention utilizes a plurality of integrated circuits (drive wafers) and a display panel mil ° ^ ^: ^ or more of the expansion sections set in the _ expansions to be used twice or twice. The above expands the width between adjacent wires. As shown in Fig. 4A_4B, the segment view expands the wafer end two adjacent wires _ between the 1 segment FS2 and further expands the two &sM to the interfeSp at the end of the pixel region. This two-toothed toothed path can be applied to at least two sections. As shown in Fig. 5, the ^== segment is now located approximately at the wafer end and the first unfolding segment 曰 1 and the sigmoid-shaped path segment ZS2 is large = now between the second unfolding segment FS2. Generally speaking, the width of the ore-shaped ore tooth of the path segment ZS1 of the f 2 second ore zone is small: the zigzag serration width of the zone segment ZS2. For example, the ore shape of the ore-shaped path section (4) width A1 h is smaller than its —-mine tooth-shaped road; ^A_|π· 7 q. The zigzag serrated width of the 峪仫 峪仫 Α Α α α α α α α α α α α α α α α α α α α α α α α α α α α α α α α α α α α α α α α α α α α α α The path length of A is more than the width of the single tooth.

Client’s Docket No.: AU0503080 TT5s Docket No:0632-A50666-TW/Final/Ja: tsonkung 1327671 More effective. According to the wire spacing & at the end of the crystal moon and the spacing sP at the pixel end, and according to the distance between the wafer and the halogen region, there may be more than j expansion segments on the right side, so that more than two mineral teeth may be The implementation is on it. For example, it can have two people to expand the wire spacing, as shown in Figure 6. As shown, the first segment FS1 expands the wire spacing at the wafer end & to the first = s =, and the second expanded segment FS2 expands the first intermediate to the second intermediate interval. 2. The third expansion section FS3 then uses: = ^ end = two intermediate intervals Sm2 to expand to the interval "section" at the pixel end. The expansion mode, the storage path can be applied in at least three areas, and the end of the month is not the same. The first tooth profile path section ZS1 is located approximately between the 曰 = = expansion section FS1, the second ore profile Γ 2nd t first-expansion section fsi and the second expansion section FS2 section is2 2: mine: The shape path section ZS3 is located between the second deployment area I and the second expansion section FS3. In general, the zigzag tooth width of the same-shaped path section ZS1 is smaller than the first opening, and the path section ZS2 Zigzag serrated width, and the basin is in the ===彳(4) segment ZS2(4)(4) The ore tooth width is smaller than: the mine back, the path segment ZS3 has the ore tooth shape width. Brother - In summary, in accordance with the present invention The display panel is connected to the halogen region, and is used to electrically connect the driving chip to the book and set in one or more unfolded samples. wherein to 2: there are at least two expanded segments. For example, The seventh caller is connected to each driver chip such as data drive crystal > 5 710 or gate drive W 72G to pixel (4) - The electronic conductor of the segment = one 9 LSZ / t / l = open region of the unfolded sample. Therefore, two shows. Can also be applied to the parent expansion sample, as shown in Figure 5 ^ 5: The cut-off path sample shown is just the extension line in the i-line "edge" with increasing: degree. Therefore, the resistance value of the wire can also be I. The wire can be a wave-like shape as shown in Fig. 8B; also r is irregular. In addition, some of them lead to the second. '乂1 case^' is close to the wire F of the pixel end or a section of the wire e of the same wire width of the near-wafer end to reduce the resistance value of the wire. (addlt is in the "or" or "extended" section - plus a dentate pattern _^, ^) sample to increase the path length of the wire. If the ninth, Jin is not, can be in the younger - expand the section (four), the implementation of a fine. Similarly, it is also possible to force 2 = one first additional ore-shaped path section azS2 on the second unfolding section. Path length drop: A method of difference in length between wires of an unfolded sample for electrically connecting a drive wafer to a section of the pixel region of the plate. Anyone skilled in the art can also easily use the present invention to electrically connect two electronic modules or components between electronic leads disposed in the unfolded sample.

Therefore, although the present invention has been disclosed above in the preferred embodiments, the present invention is not intended to limit the invention, and any person skilled in the art will be able to make some changes and _ without departing from the spirit and scope of the invention. Therefore, the scope of the invention is defined by the scope of the appended claims. X

Clients Docket N〇.:AU0503080 TT's Docket No.O632-.450666-TW/Final/Jasonkung 10 1327671 [Simplified Schematic] Figure 1 is a schematic diagram showing the plural in a pixel area of a conventional display panel The data driving chip and the gate driving chip are electrically connected to the - data line and the gate line. Fig. 2 is a schematic view showing a conventional unfolded sample for connecting a solder pad region of a driving wafer and at least a segment of a halogen region by an electronic wire. Figure 3 is a schematic diagram showing a typical zigzag path length extension of a conventionally developed sample. • 4A-4B is a schematic view showing an unfolded sample for connecting a solder pad region of a driving wafer and at least a segment of a halogen region using an electronic wire in accordance with an embodiment of the present invention. Figure 5 is a schematic diagram showing the zigzag path length extension of an unfolded sample in accordance with an embodiment of the present invention. Fig. 6 is a schematic view showing an unfolded sample according to another embodiment of the present invention. Fig. 7 is a schematic view showing a display panel having a complex drive φ wafer electrically connected to a halogen region by a plurality of electronic wires disposed in a developed sample according to the present invention. Figure 8A is a schematic view showing a zigzag sample. Figure 8B is a schematic view showing another zigzag sample. Figure 9 is a schematic diagram showing an applied zigzag sample of one or more ' in the unfolded section. [Main component symbol description] 10~ tribute drive wafer,

Client's Docket No.: AU0503080 TT's Docket No: 0632-A50666-TW/Final/Jasonkung 11 1327671 20~Interpolar drive chip, DL~ data line; GL~gate line; - 210~ solder pad area; . 220~ connection S], Sm, Sp, SmI, Sjy [2 ~ wire spacing, ZS ~ miscellaneous road section, AF ~ wire, WA, WA1, WA2, WB, wc' WD, WE ~ sawtooth width; #FS1~1nd expansion section; FS2~2nd expansion section; FS3~3rd expansion section; ZS1~1nd zigzag path section; ZS2~2nd zigzag path section; ZS3~3rd sawtooth Shape path section; 710 ~ tribute robbing wafer, 720 ~ gate drive wafer; φ AZS1 ~ first applied zigzag path section; AZS2 ~ second plus zigzag path section.

Client's Docket N〇.:AU0503080 TT5s Docket No:0632-A50666-TW/Final/Jasonkung

Claims (1)

Amendment date 91 is 4%2## (more) is replacing the true patent No. 95125033. The scope of the patent application is revised. The scope of the patent application: - The electric 1 H H sub-connection method is used for - the first electronic component and a second An electronic component includes a plurality of first-electron connections, and the second electronic component includes a plurality of t-th terminals having a first-to-one connection: a c-terminal has a second number of electrons greater than the first interval Including a look-up flute φ, "C〇ndUCt〇r" set by a connection sample, such that each of the electronic wires can connect one of the π sub-connections to a corresponding second electron Connecting, the second sample has a first end adjacent to the first electronic component, a second end of the first electronic component, at least two of the first end and the second gate a fan-out section and an intermediate section disposed between the two expansion sections. The electronic connection method includes the following steps: The first end of the first end of the segment will be from the first end The electronic wires are flared outwardly to increase the spacing between adjacent wires to a third interval greater than the first interval; in the first intermediate segment of the connected sample, from the first deployment An electronic conductor extending further toward the second end; and in a second deployment section, the electronic conductors from the first intermediate section are flared outwardly toward the connected sample The second end is further configured to increase an interval between adjacent wires to a fourth interval greater than the third interval, wherein at least a portion of the connection sample is interposed between the first deployment segment and the second deployment segment The intermediate portion of the electronic lead is provided with a first winding sample 'to increase the length of the part of the electronic wire 0632-A50666-TW 13 /0/1 ·· Beer Year's Edge Strip (more) The replacement of the page is revised in the date of the patent application. The scope of the patent application is revised. The partition is substantially equal to the second interval. At least the electronic connection method described in the first paragraph of the patent application, wherein the middle portion is This is near The first end of the sample is 4 Γ * the line is provided - the second curved sample. At least part of the electronic connection method of the item, wherein 5 is placed in the first unfolded section by the curved sample system. At least part of the method of electronic connection according to Item 1, wherein 6 is placed in the first unfolding section by a bite. The blanking section (4) 1 pin is an electronic connecting branch, and the sample is 4*. "Zone=segment; 电子, etc., in which the second Ηρα〆 progresses toward the second end, wherein the 曰 region 4 is further between the second end of the second unfolding μ; and the unfolding area 祆And in the second expansion section of the connection sample, in the future, the electronic lead wire such as Bai Shichu_Shi Ri Ri is facing out #M from the 苐 - the middle section of the cow, you "expanded" toward the connection sample The second end, the interval between the adjacent:::adjacent wires is increased to -the greater than the second:: the electronic connection method described in item 6 of the patent scope is included. The sample is provided by the _step increment " sub-wires - the second bend, ^ find. Changyan of the I-point electronic lead. The electronic connection method described in claim 7 of the patent scope, wherein 0632-A50666-TW 14 丄 327671 丄 327671 99% 4 Guang 2 carving (more) is replacing the page No. (10) 033, the scope of the patent is amended, the correction interval is the fifth interval. The system is substantially equal to the second interval. 9. The electronic link as described in the scope of claim 2 is also provided at least in part of the first/eighth electronic conductor of the connected sample - the second f-shaped sample, the present. &% middle part at least 1ttr warehouse patent range, the electronic connection method described in item 1, the middle part of the "electrical book" in the middle section of the expansion section is also known: for a second bending sample . a second 1n: connector is configured to provide a first electronic component and an electronic connection of -π:::, the first electronic component includes a plurality of first and first electronic terminals The second electronic component includes a second interval of a plurality of second electronic connection intervals, the electronic connector comprising: greater than the "second" electronic wire, disposed in a connection sample, such that each -== wire can be such a _ connector of the first _ electronic connection end, wherein the connection sample has a proximity to the first electric: two ends: a second end adjacent to the second electronic component, t, f" At least two expansion sections and an intermediate section between the two deployment sections, wherein the connection is a first-to-one expansion section, adjacent to the first end, wherein And the electronic wires of the & are opened in the first unfolding section to make a third interval between adjacent wires; the main is greater than the first interval, the second: the expanded segment and the first The electronic conductors in the two-end deployment && are oriented toward the 0632-A50666-TW 15 1327671 Patent No. 95125033 Patent Application Revision This second extension; and revision date | 993⁄4 43⁄4 2## (more) replacement page ____________ second expansion section, between the first intersessional section and the Two ends = 'where the electronic conductors from the first intermediate section are flared outwardly, to further increase the spacing between adjacent conductors to a fourth interval greater than the third interval, μ - less An electronic wire partially connected to the intermediate portion of the first-to-expansion segment of the connection sample is provided with a first test sample to increase the length of the partial electronic wires. The electronic connector described in the above paragraph is substantially equal to the second interval. 13. The electronic wire system of the connecting sample in the connecting sample near the connecting sample A second curved sample is provided. 14. At least the second curved sample is disposed in the first expanded section as described in claim 13: wherein: 15. First curved sample system In the first-expansion zone: the electronic connector described in claim n of the patent scope, and the second compartment, the second extension section and the second end extension end The electronic conductors in the segment are oriented toward the third, ΐ ίί expansion section 'between the second intermediate section and the second her: door, wherein the electronic conductors are deployed outwardly to advance Having adjacent guides less than eight, 4 曰 to a fifth interval greater than 泫 fourth interval, wherein up to 4 knives in the money sample are between the second unfolded section and the 2nd 0632-A50666-TW 16 1327671 Patent application No. 95126033, this amendment date is amended. ##43⁄4 2!^more) replacement page | The electronic wire of the middle part between the open sections is provided with a -m "curve" to further increase the partial electronic wires. length. The electronic connector of claim 16, wherein the fifth spacer is substantially equal to the second interval. 18. An electronic module comprising: a substrate; a second electronic component having a plurality of first electrical spacings disposed on the substrate: an electrical first terminal adjacent to the first electrical connection end; The β-ray element has a plurality of first electronic connection terminals disposed on the substrate, and the second electronic connection ends are greater than the second interval of the first interval; To provide an electronic connection between the first electronic component and the second component, the electronic connector includes: two electronic wires 'a set of electronic wires connected to the sample, the first electronic connection terminal a first 踹_sample having a scorpion close to the first electronic component, adjacent to one of the second electronic components < at least two expansions between the second end and the second end ==: two of these Expanding an intermediate section between the sections, wherein the connecting basin second: unfolding section is disposed adjacent to the first end, and is sandwiched in 1 to increase the interval between adjacent wires to two: , abduction third interval; greater than 5 hai first interval - first - intermediate zone Segment, between the first-expanding section and the second end 0632-A50666-TW 17 1327671 No. 95125033 Patent application scope revision (-- strict 1,1 by 氺白兮哲β revision date '19 every 4 screens 2 boxes of IK more) The replacement page U comes from the 丨 丨 second end extension in the first deployment section of the 5 hai, and the 卞绎踝 卞绎踝 朝向 朝向 该Between the first and middle sections, wherein the electrons from the first intermediate section are two = on to increase the __ of the phase line to - greater than: the fourth interval of the interval, Wherein at least a portion of the second-expansion segment and the second unfolding segment two are provided with a first f-curve sample to increase the electrons of the portion 2 = the fourth application patent claim 18 a module, wherein the fourth spacer is substantially equal to the second interval. 2 [卞 The electronic module of claim 18, wherein the electronic lead of the knife in the connected sample near the inter-terminal portion is provided with a second curved sample: the middle material range of the younger brother is 18th The electronic module of the present invention, wherein the first curved sample is disposed in the first-expansion section. The electronic module of claim 20, wherein the 乂 第 第 脊 脊 脊 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 0632-A50666-TAV 18