TWI326003B - - Google Patents

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Publication number
TWI326003B
TWI326003B TW95109931A TW95109931A TWI326003B TW I326003 B TWI326003 B TW I326003B TW 95109931 A TW95109931 A TW 95109931A TW 95109931 A TW95109931 A TW 95109931A TW I326003 B TWI326003 B TW I326003B
Authority
TW
Taiwan
Prior art keywords
reticle
photoresist
pattern
structural substrate
light
Prior art date
Application number
TW95109931A
Other languages
English (en)
Chinese (zh)
Other versions
TW200736845A (en
Inventor
Chao Heng Chien
Hui Min You
Original Assignee
Kuender & Co Ltd
Lenghways Technology Co Ltd
Tatung Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kuender & Co Ltd, Lenghways Technology Co Ltd, Tatung Co filed Critical Kuender & Co Ltd
Priority to TW095109931A priority Critical patent/TW200736845A/zh
Publication of TW200736845A publication Critical patent/TW200736845A/zh
Application granted granted Critical
Publication of TWI326003B publication Critical patent/TWI326003B/zh

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  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Preparing Plates And Mask In Photomechanical Process (AREA)
TW095109931A 2006-03-22 2006-03-22 Mask and exposure method for producing high depth photoresist TW200736845A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW095109931A TW200736845A (en) 2006-03-22 2006-03-22 Mask and exposure method for producing high depth photoresist

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW095109931A TW200736845A (en) 2006-03-22 2006-03-22 Mask and exposure method for producing high depth photoresist

Publications (2)

Publication Number Publication Date
TW200736845A TW200736845A (en) 2007-10-01
TWI326003B true TWI326003B (enExample) 2010-06-11

Family

ID=45074302

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095109931A TW200736845A (en) 2006-03-22 2006-03-22 Mask and exposure method for producing high depth photoresist

Country Status (1)

Country Link
TW (1) TW200736845A (enExample)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104076597B (zh) * 2013-03-26 2016-03-02 北京京东方光电科技有限公司 一种紫外线掩膜板及其制备方法和封框胶的固化方法

Also Published As

Publication number Publication date
TW200736845A (en) 2007-10-01

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees