TWI319934B - Touch sensor and signal generation method thereof - Google Patents

Touch sensor and signal generation method thereof

Info

Publication number
TWI319934B
TWI319934B TW095120752A TW95120752A TWI319934B TW I319934 B TWI319934 B TW I319934B TW 095120752 A TW095120752 A TW 095120752A TW 95120752 A TW95120752 A TW 95120752A TW I319934 B TWI319934 B TW I319934B
Authority
TW
Taiwan
Prior art keywords
signal generation
touch sensor
generation method
touch
sensor
Prior art date
Application number
TW095120752A
Other languages
English (en)
Other versions
TW200701639A (en
Inventor
Byung-Joon Moon
Jae-Surk Hong
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of TW200701639A publication Critical patent/TW200701639A/zh
Application granted granted Critical
Publication of TWI319934B publication Critical patent/TWI319934B/zh

Links

Classifications

    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K17/00Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/94Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the way in which the control signals are generated
    • H03K17/96Touch switches
    • H03K17/962Capacitive touch switches
    • H03K17/9622Capacitive touch switches using a plurality of detectors, e.g. keyboard
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K2217/00Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00
    • H03K2217/94Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00 characterised by the way in which the control signal is generated
    • H03K2217/9401Calibration techniques
    • H03K2217/94031Calibration involving digital processing
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K2217/00Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00
    • H03K2217/94Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00 characterised by the way in which the control signal is generated
    • H03K2217/96Touch switches
    • H03K2217/9607Capacitive touch switches
    • H03K2217/96071Capacitive touch switches characterised by the detection principle
    • H03K2217/960715Rc-timing; e.g. measurement of variation of charge time or discharge time of the sensor

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Electronic Switches (AREA)
  • Pulse Circuits (AREA)
TW095120752A 2005-06-16 2006-06-12 Touch sensor and signal generation method thereof TWI319934B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020050052111A KR100683249B1 (ko) 2005-06-16 2005-06-16 접촉센서 및 이의 신호 발생 방법

Publications (2)

Publication Number Publication Date
TW200701639A TW200701639A (en) 2007-01-01
TWI319934B true TWI319934B (en) 2010-01-21

Family

ID=37532477

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095120752A TWI319934B (en) 2005-06-16 2006-06-12 Touch sensor and signal generation method thereof

Country Status (6)

Country Link
US (1) US7956850B2 (zh)
JP (1) JP4739410B2 (zh)
KR (1) KR100683249B1 (zh)
CN (1) CN101194172B (zh)
TW (1) TWI319934B (zh)
WO (1) WO2006135152A1 (zh)

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KR100802656B1 (ko) * 2006-06-22 2008-02-14 주식회사 애트랩 접촉 감지 센서 및 이의 동작 방법
US8456434B2 (en) 2006-06-22 2013-06-04 Atlab Inc. Touch sensor and operating method thereof
KR101063537B1 (ko) * 2009-02-23 2011-09-07 주식회사 애트랩 커패시턴스 측정 회로
KR100938879B1 (ko) 2007-06-28 2010-01-27 주식회사 애트랩 접촉 감지 센서 및 이 센서의 자동 감도 조절방법
KR100957836B1 (ko) * 2008-06-02 2010-05-14 주식회사 애트랩 터치패널 장치 및 이의 접촉위치 검출방법
KR100982282B1 (ko) * 2008-09-19 2010-09-15 주식회사 애트랩 센서, 센서의 센싱 방법, 및 센서의 필터
KR100971501B1 (ko) * 2008-10-24 2010-07-21 주식회사 애트랩 접촉센서 장치
JP5120460B2 (ja) * 2008-10-28 2013-01-16 富士通株式会社 携帯端末および入力制御方法
US20110068810A1 (en) * 2009-04-03 2011-03-24 Tpo Displays Corp. Sensing method and driving circuit of capacitive touch screen
KR101103825B1 (ko) * 2009-10-19 2012-01-06 주식회사 애트랩 멀티 터치를 감지할 수 있는 터치 패널 및 이 장치의 멀티 터치 감지 방법
US9041682B2 (en) * 2009-10-23 2015-05-26 Atmel Corporation Driving electrodes with different phase signals
KR101073309B1 (ko) * 2009-11-24 2011-10-12 삼성모바일디스플레이주식회사 터치 스크린 시스템 및 그 구동방법
TWI407357B (zh) * 2010-02-02 2013-09-01 Novatek Microelectronics Corp 物件感測裝置、觸控感測系統及觸控感測方法
CN102156562B (zh) * 2010-02-12 2013-08-21 联咏科技股份有限公司 对象感测装置、触控感测系统及触控感测方法
TWI414988B (zh) * 2010-03-02 2013-11-11 Sitronix Technology Corp Touch sensing device with capacitive effect
TWI510049B (zh) * 2010-03-11 2015-11-21 Htc Corp 可自動切換手持模式/非手持模式之手持式裝置及其相關控制方法
TW201211847A (en) * 2010-09-13 2012-03-16 Raydium Semiconductor Corp Touch sensing apparatus
KR101114561B1 (ko) * 2011-01-25 2012-02-27 주식회사 애트랩 커패시턴스 측정 회로
KR101327886B1 (ko) 2011-06-10 2013-11-11 (주)멜파스 터치 패널 시스템과 지연 보상 방법
CN102890575B (zh) * 2011-07-22 2016-09-14 国民技术股份有限公司 一种触摸感应定位装置及系统
DE102011081769A1 (de) * 2011-08-30 2013-02-28 BSH Bosch und Siemens Hausgeräte GmbH Haushaltsgerät mit Erkennung einer Fehlbetätigung
US8847898B2 (en) 2011-09-07 2014-09-30 Atmel Corporation Signal-to-noise ratio in touch sensors
TWI457799B (zh) * 2011-09-15 2014-10-21 Au Optronics Corp 觸控顯示面板
US8810537B2 (en) * 2012-02-15 2014-08-19 Apple Inc. Quadrature demodulation for touch sensitive devices
TWI464637B (zh) * 2012-02-17 2014-12-11 Elan Microelectronics Corp 觸控面板的類比數位轉換參數動態調整方法
CN103365455B (zh) * 2012-04-09 2016-06-01 群康科技(深圳)有限公司 曲面触感回馈触控屏幕及其触感回馈驱动方法
US9262023B2 (en) * 2012-07-09 2016-02-16 Atmel Corporation Drive signals for a touch sensor
KR101499024B1 (ko) * 2012-11-28 2015-03-06 에이디반도체(주) 정전용량 센서 장치
TWI502443B (zh) * 2013-10-09 2015-10-01 Ili Technology Corp 應用於觸控面板基線校正的面板時間延遲檢測電路
CN105610422B (zh) * 2014-11-18 2018-05-18 远翔科技股份有限公司 触控感测系统
KR102565658B1 (ko) * 2019-06-20 2023-08-09 엘지디스플레이 주식회사 터치표시장치, 터치구동회로 및 구동방법
TWI743526B (zh) * 2019-07-30 2021-10-21 緯創資通股份有限公司 自適應觸控面板系統及其自適應方法

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Also Published As

Publication number Publication date
JP4739410B2 (ja) 2011-08-03
CN101194172B (zh) 2012-08-08
KR100683249B1 (ko) 2007-02-15
US7956850B2 (en) 2011-06-07
KR20060131579A (ko) 2006-12-20
CN101194172A (zh) 2008-06-04
WO2006135152A1 (en) 2006-12-21
US20080204422A1 (en) 2008-08-28
JP2008544599A (ja) 2008-12-04
TW200701639A (en) 2007-01-01

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees