TWI302984B - - Google Patents

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Publication number
TWI302984B
TWI302984B TW95115959A TW95115959A TWI302984B TW I302984 B TWI302984 B TW I302984B TW 95115959 A TW95115959 A TW 95115959A TW 95115959 A TW95115959 A TW 95115959A TW I302984 B TWI302984 B TW I302984B
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TW
Taiwan
Prior art keywords
stretched
atomic force
tensile
probe
force microscope
Prior art date
Application number
TW95115959A
Other languages
English (en)
Chinese (zh)
Other versions
TW200742843A (en
Inventor
Chien Hong Liu
Wen Yuh Jywe
De-Hua Fang
Liang-Wen Ji
chao-gui Chen
Original Assignee
Univ Nat Formosa
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Publication date
Application filed by Univ Nat Formosa filed Critical Univ Nat Formosa
Priority to TW095115959A priority Critical patent/TW200742843A/zh
Publication of TW200742843A publication Critical patent/TW200742843A/zh
Application granted granted Critical
Publication of TWI302984B publication Critical patent/TWI302984B/zh

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  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
TW095115959A 2006-05-04 2006-05-04 Apparatus and method using atomic-force microscope (AFM) as base for performing tensile test TW200742843A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW095115959A TW200742843A (en) 2006-05-04 2006-05-04 Apparatus and method using atomic-force microscope (AFM) as base for performing tensile test

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW095115959A TW200742843A (en) 2006-05-04 2006-05-04 Apparatus and method using atomic-force microscope (AFM) as base for performing tensile test

Publications (2)

Publication Number Publication Date
TW200742843A TW200742843A (en) 2007-11-16
TWI302984B true TWI302984B (https=) 2008-11-11

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Family Applications (1)

Application Number Title Priority Date Filing Date
TW095115959A TW200742843A (en) 2006-05-04 2006-05-04 Apparatus and method using atomic-force microscope (AFM) as base for performing tensile test

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TW (1) TW200742843A (https=)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
RU2521267C1 (ru) * 2012-11-08 2014-06-27 Николай Викторович Шадринов Устройство для исследования материалов в деформированных состояниях методом атомно-силового микроскопа

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
RU2521267C1 (ru) * 2012-11-08 2014-06-27 Николай Викторович Шадринов Устройство для исследования материалов в деформированных состояниях методом атомно-силового микроскопа

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Publication number Publication date
TW200742843A (en) 2007-11-16

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MM4A Annulment or lapse of patent due to non-payment of fees