TW200742843A - Apparatus and method using atomic-force microscope (AFM) as base for performing tensile test - Google Patents

Apparatus and method using atomic-force microscope (AFM) as base for performing tensile test

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Publication number
TW200742843A
TW200742843A TW095115959A TW95115959A TW200742843A TW 200742843 A TW200742843 A TW 200742843A TW 095115959 A TW095115959 A TW 095115959A TW 95115959 A TW95115959 A TW 95115959A TW 200742843 A TW200742843 A TW 200742843A
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TW
Taiwan
Prior art keywords
tensile test
stretched material
afm
base
atomic
Prior art date
Application number
TW095115959A
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English (en)
Chinese (zh)
Other versions
TWI302984B (https=
Inventor
Chien-Hong Liu
Wen-Yuh Jywe
De-Hua Fang
Jau-Guei Chen
Original Assignee
Nat Huwei University Of Science And Technology
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Application filed by Nat Huwei University Of Science And Technology filed Critical Nat Huwei University Of Science And Technology
Priority to TW095115959A priority Critical patent/TW200742843A/zh
Publication of TW200742843A publication Critical patent/TW200742843A/zh
Application granted granted Critical
Publication of TWI302984B publication Critical patent/TWI302984B/zh

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  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
TW095115959A 2006-05-04 2006-05-04 Apparatus and method using atomic-force microscope (AFM) as base for performing tensile test TW200742843A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW095115959A TW200742843A (en) 2006-05-04 2006-05-04 Apparatus and method using atomic-force microscope (AFM) as base for performing tensile test

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW095115959A TW200742843A (en) 2006-05-04 2006-05-04 Apparatus and method using atomic-force microscope (AFM) as base for performing tensile test

Publications (2)

Publication Number Publication Date
TW200742843A true TW200742843A (en) 2007-11-16
TWI302984B TWI302984B (https=) 2008-11-11

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ID=45070600

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095115959A TW200742843A (en) 2006-05-04 2006-05-04 Apparatus and method using atomic-force microscope (AFM) as base for performing tensile test

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TW (1) TW200742843A (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
RU2521267C1 (ru) * 2012-11-08 2014-06-27 Николай Викторович Шадринов Устройство для исследования материалов в деформированных состояниях методом атомно-силового микроскопа

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Publication number Publication date
TWI302984B (https=) 2008-11-11

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