TWI298823B - Spin-on-glass anti-reflective coatings for photolithography - Google Patents

Spin-on-glass anti-reflective coatings for photolithography Download PDF

Info

Publication number
TWI298823B
TWI298823B TW89111272A TW89111272A TWI298823B TW I298823 B TWI298823 B TW I298823B TW 89111272 A TW89111272 A TW 89111272A TW 89111272 A TW89111272 A TW 89111272A TW I298823 B TWI298823 B TW I298823B
Authority
TW
Taiwan
Prior art keywords
group
decane
phenyl
spin
absorbent
Prior art date
Application number
TW89111272A
Other languages
Chinese (zh)
Inventor
Spear Richard
P Hacker Nigel
Baldwin Teresa
Kennedy Joseph
Original Assignee
Allied Signal Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Allied Signal Inc filed Critical Allied Signal Inc
Priority to TW89111272A priority Critical patent/TWI298823B/en
Application granted granted Critical
Publication of TWI298823B publication Critical patent/TWI298823B/en

Links

Landscapes

  • Paints Or Removers (AREA)

Description

A7 B7 1298823 五、發明説明(1 ) 技術*領域 本發明通常關於旋塗玻璃材料,明確而言,係關於光石 印術抗反射層之光吸收性旋塗玻璃材料及製造材料之方 法。 背景 為了配合較快性能之需求,積體電路裝置外觀之特性尺 寸已連績被減小。具有較小外觀大小之裝置之製造在許多 傳統用於半導體製造之方法中引起新挑戰。此等製法中最 重要者之一為光石印術。 長期認同的是,在由光石印術製成之圖案中線寬變易能 導致光反射出半導體晶元上底層之光學干擾。由於底層之 表面狀態光阻劑厚度之變易亦引起線寬變易。塗敷在光阻 劑層下方之抗反射塗層(ARC)被用以防止受照射來之反射 之干擾。另外,抗反射塗層局部平面化晶元表面狀態,有 助於改良步驟上線寬變易,因為光阻劑厚度更均勻。 有機聚合物膜,特別是傳統上用以暴露光阻劑之在丨線 (365 nm)及g線(436 nm)下,近來使用248 nm波長下吸收 者,已用作抗反射塗層。然而,有機ARC與有機光阻劑分 享許多化學特性之事實會限制有用加工次序。另外,有機 ARC會與光阻劑層互混。避免互混之一解決方式為導入熱 固性黏合劑作為有機ARC之附加成份,例如,述於u s專 利5,693,691,Flaim等人。染料亦可混入有機ARC内,以及 視需要,附加添加劑如濕潤劑、黏著促進劑、防腐劑及塑 化劑,如述於US專利4,910,122, Arnold等人。 64746-970318.docA7 B7 1298823 V. INSTRUCTIONS (1) TECHNICAL FIELD The present invention relates generally to spin-on glass materials, and more specifically to light-absorbing spin-on glass materials and materials for making refractory anti-reflective layers. Background In order to meet the demand for faster performance, the characteristic size of the appearance of the integrated circuit device has been reduced. The fabrication of devices with smaller form factors poses new challenges in many conventional methods for semiconductor fabrication. One of the most important of these methods is the lithography. It has long been recognized that line width variation in patterns made by lithographic printing can cause light to reflect optical interference from the underlying layer of the semiconductor wafer. The change in the thickness of the photoresist on the surface of the underlayer also causes the line width to become easier. An anti-reflective coating (ARC) applied beneath the photoresist layer is used to prevent interference from the reflected reflections. In addition, the anti-reflective coating partially planarizes the surface state of the wafer, which helps to improve the line width over the improved step because the photoresist is more uniform in thickness. Organic polymer films, particularly those conventionally used to expose photoresists at the 丨 line (365 nm) and g line (436 nm), have recently been used as absorbers at 248 nm and have been used as anti-reflective coatings. However, the fact that organic ARCs share many chemical properties with organic photoresists limits the useful processing order. In addition, the organic ARC will be intermixed with the photoresist layer. One solution to avoid intermixing is to introduce a thermosetting binder as an additional component of organic ARC, for example, as described in U.S. Patent 5,693,691, Flaim et al. Dyes may also be incorporated into the organic ARC, and if desired, additional additives such as wetting agents, adhesion promoters, preservatives, and plasticizers, as described in U.S. Patent 4,910,122, Arnold et al. 64746-970318.doc

12988231298823

含氧氮化矽為另一用作抗反射塗層之材料。然而,含氧 氮化石夕作為術係藉破壞干擾過程而非藉吸收性意指需 要極緊密之含氧氮化物厚度之控制及材料不會如arc般在 商度可變易表面狀態上作業良好。另夕卜,含氧氮化梦通常 藉化學蒸氣沈積來沈積’而光阻劑層通常使用旋轉塗佈器 塗敷。附加化學蒸氣沈積法會加入加工複雜性。 另一可用作抗反射層之材料類為含有染料之旋塗玻璃 (SOG)組合物。Yau等人,us專利4,587,138揭示一種染料 如基本黃#11,以約1重量%之量與旋塗玻璃混合。 4人卩8專利5,100,503揭示一種含有無機染料如丁丨〇2, Ci:2〇7 ’ M0O4 ’ Mn〇4 ’或Sc〇4及黏著促進劑之交聯聚有機 矽氧烷。Allman又教示旋塗玻璃組合物亦作為平面化層。 然而,目前揭示之旋塗玻璃,染料組合並不最適於曝露至 深紫外線’特別是248及193 nm光源,其變成用以產生具 有小型外觀大小之裝置。此外,並非所有染料可被容易混 入絕對旋塗玻璃組合物内。 需要一種吸收性旋塗玻璃抗反射塗料,其可強烈又均句 地於深紫外線光譜區内吸收。對ARC層希望是不能透過光 阻顯像劑。亦希望提供一種將一類吸收性化合物混入各種 S 0 G材料同時保持最初旋塗玻璃材料之所欲特性之方法。 概述 用於深紫外線光石印術之抗反射塗料包含一種或多種混 入旋塗玻璃(SOG)材料之有機吸收性化合物。旋塗玻璃材 料料包括甲基矽氧烷、甲基矽倍半氧烷、苯基矽氧烧、苯 64746-970318.doc 本紙張尺度適用中國國家標準(CNS) A4規格(210X 297公釐) 1298823Cerium oxynitride is another material used as an anti-reflective coating. However, the use of oxynitride as a system to disrupt the interference process rather than absorbance means that the control and material of the oxynitride-containing thickness that is required to be extremely tight does not work well as a function of the arbitrarily variable surface condition. In addition, oxynitride dreams are typically deposited by chemical vapor deposition' and the photoresist layer is typically applied using a spin coater. Additional chemical vapor deposition adds processing complexity. Another material that can be used as an antireflection layer is a spin-on-glass (SOG) composition containing a dye. Yau et al., U.S. Patent 4,587,138, discloses a dye, such as Basic Yellow #11, mixed with spin-on glass in an amount of about 1% by weight. 4,100,503 discloses a crosslinked polyorganosiloxane containing an inorganic dye such as butyl hydrazine 2, Ci: 2 〇 7 'M0O4 'Mn 〇 4 ' or Sc 〇 4 and an adhesion promoter. Allman also teaches that the spin-on glass composition also acts as a planarization layer. However, in the currently disclosed spin-on glass, the dye combination is not optimal for exposure to deep ultraviolet rays, particularly 248 and 193 nm light sources, which become used to create devices having a small form factor. In addition, not all dyes can be easily incorporated into the absolute spin-on glass composition. There is a need for an absorbent spin-on glass anti-reflective coating that absorbs strongly and uniformly in the deep ultraviolet spectral region. It is desirable for the ARC layer to be opaque to the photoresist. It would also be desirable to provide a method of mixing a class of absorbent compounds into various S0G materials while maintaining the desired properties of the original spin-on glass material. Overview Anti-reflective coatings for deep UV photolithography contain one or more organically absorbing compounds mixed into a spin-on-glass (SOG) material. Spin-on glass materials include methyl decane, methyl sesquioxanes, phenyl oxoximes, benzene 64746-970318.doc This paper scale applies to China National Standard (CNS) A4 specifications (210X 297 mm) 1298823

基矽倍半氧烷、甲基苯基矽氧烷、曱基苯基矽倍半氧烷及 矽酸鹽聚合物。如本文所用,旋塗玻璃材料亦包括通式 (Ho-i.GSiOmoh之氫矽氧烷聚合物及氫矽倍半氧烧,其具 有式(HSiOu),其中X大於約8。亦包括氫矽倍半氧燒與燒 氧氫化矽氧烷或羥基氫化矽氧烷之共聚物。旋塗玻璃材料 又包括通式(Hw.cSiOmGWRw GSi〇1 w Q)m之有機氫化矽 氧烧與通式(HSiO^WRSiO^k之有機氫化矽倍半氧燒聚 合物,其中m大於0,η與m之總數大於約8及尺為烷基或芳 基。混入吸收化合物之旋塗玻璃材料之塗佈溶液被用以形 成抗反射膜在積體電路裝置之各種層上。 適用於本發明之吸收化合物在波長低於約375 nm或低於 約260 run下會強烈吸收。特別是,適合吸收性化合物在至 少約10 nm寬波長範圍環繞波長如248 nm,193 nm,或其他 紫外線波長如365 nm下’其可用於光石印術會強烈吸收。 適當化合物之色基通常具有1至3個苯環,其可被或不被溶 合。可混合之吸收性化合物具有接附至色基之可達反應 基,反應基包括羥基、胺基、羧酸基及用矽鍵合至丨個,2 個或3個烷氧基或鹵原子取代基之經取代甲石夕烧基。反應 基可被直接鍵合至色基或反應基可透過烴橋件接附至色 基。 適當有機吸收化合物之例包括2,6-二羥蒽醌酸、9_惠竣 酸、9-蒽甲醇、茜素、醌茜、櫻草靈、2_經基_4(3_三乙氧 甲石夕烧丙氧基二苯嗣、玫紅酸、三乙氧甲矽烷丙基 審亞胺、9-E魏-曱基三乙氧石夕烧、苯基三乙氧矽烷、偶 64746-970318.doc _6· 本紙張尺度適用中國國家標準(CNS) A4規格(210X297公董) 1298823 A7 4 發明説明( 氮化合物,如4 -苯基偶氮酚及其混合物。 物根據本發明之另一態樣,提供合成吸收性旋塗玻璃組合 之方法。旋塗玻璃材料傳統上自矽烷反應物合成,例 女IT 9 —- ^ 二:乙氧矽烷、四乙氧矽烷、甲基三乙氧矽烷、二甲基 二乙氧矽烷、四曱氧矽烷、甲基三曱氧矽烷、三甲氧矽 广、二甲基二甲氧矽烷、苯基三乙氧矽烷、苯基三甲氧矽 γ 一苯基二乙氧矽烷及二苯基二甲氧矽烷。鹵代矽烷, ,別是氯矽烷,例如,三氯矽烷、甲基三氯矽烷、乙基三 氣矽烷、苯基三氣矽烷、四氣矽烷、二氯矽烷、甲基二氯 ,烷、二甲基二氯矽烷、氯三乙氧矽烷、氯三甲氧矽烷、 氯甲基二乙氧矽烷、氯乙基三乙氧矽烷、氯苯基三乙氧矽 氯甲基三甲氧矽烷、氯乙基三甲氧矽烷及氣苯基三甲 氧石夕烷亦被用作矽烷反應物。 製造吸收旋塗玻璃組合物之方法包括組合一種或多種烷 氧石夕燒’或一種或多種_代矽烷,一種或多種可混合有機 吸收化合物,酸/水混合物,如硝酸/水混合物及一種或多 種溶劑以形成反應混合物;及回流反應混合物以形成吸收 性旋塗玻璃組合物。如此形成之旋塗玻璃組合物係用一種 或多種溶劑稀釋以提供產生各種厚度薄膜之塗佈溶液。製 造吸收性旋塗玻璃組合物之替代方法包括使用齒代矽烷及 相轉移觸媒之方法亦被提供。 根據本發明之另一態樣,提供化學組合物9 -蒽酸-甲基 三乙氧矽烷之吸收性化合物。合成9 -蒽羧-甲基三乙氧石夕 烷之方法包括組合9-蒽羧酸、氯甲基三乙氧矽烷、三.乙胺 64746-970318.doc -7· 本紙張尺度適用中國國家標準(CNS) A4規格(210X297公釐) Ϊ298823 A7 ______B7___ 五、發明説明(5 ) 及溶劑以形成反應混合物;回流反應混合物;冷卻回流之 -反應混合物以形成沈澱物及殘餘溶液;及過瀘殘餘溶液以 產生液態9 -蒽羧-曱基三乙氧矽烷。 附圖之簡單說明 圖1 a及1 b例示根據本發明具體例混入旋塗玻璃組合物 之吸收性化合物之化學式。 圖2 a-2h例示在光石印術過程中,使用根據本發明具體 例之吸收性旋塗玻璃組合物作為抗反射塗層。 詳細說明 用於深紫外線光石印術之抗反射塗料包括一種或多種混 入旋塗玻璃(SOG)材料内之有機吸收性化合物。吸收性旋 塗玻璃組合物溶解於適當溶劑内以形成塗佈溶液並在製造 半導體裝置時塗敷至各種材料層。吸收性旋塗玻璃抗反射 塗層被設計成容易整合入現存半導體製造過程中。提供整 合之特性包括抗顯影劑性、在標準光阻加工時之熱安定性 及對底層之選擇性移除。 根據本發明之態樣用於組合物之旋塗玻璃材料包括甲基 矽氧烷、甲基矽倍丰氧烷、苯基矽氧烷、苯基矽倍半氧 烷、甲基苯基矽氧烷、甲基苯基矽倍半氧烷及矽酸鹽聚合 物。如本文所用,旋塗玻璃材料亦包括通式〇Si〇i Η 1 之氫矽氧烷聚合物及氫矽倍半氧烷聚合物,其具有式 (HSiOi.Ox其中X大於約8。亦包括氫矽倍半氧烷與烷氧氫 化矽氧烷或羥基氫化矽氧烷之共聚物。旋塗玻璃材料又包 括通式(Hw.oSiO^2 G)n(R(}丨QSi〇i 5 2之有機氫化矽氧烷 64746-970318.doc _8_ 本紙張尺度適财® S家辟(CNS) A4規格(21G X 297公釐) ---------- A7 B7 1298823 五、發明説明(6 ) 聚合物,通式(HSiO^MRSiO^Ui有機氫化矽倍半氧燒 聚合物,其中m大於〇,η與m之總數大於約8及R為燒基或 务基。若干有用有機氫化石夕氧烧聚合物具有η與^之總數 為約8至約5000,其中R為CVC20烷基或C6-C12芳基。有機 氫化矽氧烷及有機氫化矽倍半氧烷聚合物可替代表示旋塗 聚合物。特定例包括甲基氫化矽氧烷、乙基氫化矽氧燒、 丙基氫化矽氧烷、第三丁基,氫化矽氧烷、苯基氫化石夕氧 烧、甲基氫化矽倍半氧烷、乙基氫化矽倍半氧烷、丙基氫 化矽倍半氧烷、第三丁基氫化矽倍半氧烷、苯基氫化矽倍 半氧烷及其組合。 許多茶及蒽底化合物在248 nm及以下具有顯著吸收性。 苯底’此處同樣稱為苯基底化合物在波長短於2〇〇 下具 有顯著吸收性。雖然此等萘、蒽及苯基底化合物時常被稱 為染料,但此處所用之術語為吸收性化合物,因為此等化 合物之吸收性不限於光譜可見區内之波長。然而,並非所 有該吸收性化合物可混入旋塗玻璃内用作ARC材料。適用 於本發明之吸收性化合物具有吸收尖条在至少約1〇 ^爪寬 波長範圍,中心環繞波長如248 nm,193 nm或其他紫外線 波長如365 rnn,其可用於光石印術。僅具窄吸收尖峯,例 如,低於2 nm寬,環繞此等波長之吸收化合物不受歡迎。 適當吸收化合物之色基通常具有丨個,2個或3個苯環, 其可或不可被熔合。不可混合吸收化合物具有接附至色基 之可達反應性基,反應性基包括羥基、胺基、羧酸基及用 矽鍵合至1個,2個或3個”離去基,,如烷氧基或鹵原子之經 64746-970318.doc 0 • 9 - 本紙張尺度適財B ®家料(CNi) A4規格(210 X297公6 1298823The base sesquioxane, methylphenyl siloxane, decyl phenyl sesquioxane and phthalate polymers. As used herein, a spin-on glass material also includes a hydroquinone polymer of the formula (Ho-i.GSiOmoh and hydroquinone sesquioxalate having the formula (HSiOu) wherein X is greater than about 8. Also includes hydroquinone. a copolymer of sesquioxalic acid and a hydrogenated oxyhydrogenated alkane or a hydroxyhydrogen hydride. The spin-on glass material further comprises an organic hydrogenated oxime of the formula (Hw.cSiOmGWRw GSi〇1 w Q)m and a formula ( An organic hydrogenated hydrazine sesquioxide polymer of HSiO^WRSiO^k, wherein m is greater than 0, the total number of η and m is greater than about 8 and the size is alkyl or aryl. The coating solution of the spin-on glass material mixed with the absorbing compound Used to form an antireflective film on various layers of integrated circuit devices. Absorbing compounds suitable for use in the present invention absorb strongly at wavelengths below about 375 nm or below about 260 run. In particular, suitable for absorbent compounds At least about 10 nm wide wavelength range around wavelengths such as 248 nm, 193 nm, or other UV wavelengths such as 365 nm, which can be used for photolithography to absorb strongly. The chromophore of a suitable compound usually has 1 to 3 benzene rings. Can be or not fused. The miscible compound can have Attached to the chromophore up to the reactive group, the reactive group includes a hydroxyl group, an amine group, a carboxylic acid group, and a substituted formazan bonded to the oxime, 2 or 3 alkoxy or halogen atom substituents The reactive group may be directly bonded to the chromo group or the reactive group may be attached to the chromophore through the hydrocarbon bridge. Examples of suitable organic absorbing compounds include 2,6-dihydroxy decanoic acid, 9 oxime acid, 9-蒽methanol, alizarin, hydrazine, primrose, 2_ carbyl _4 (3_3 ethoxylate sulphide propoxy benzoquinone, rosaceic acid, triethoxy methacrylate Imine, 9-E Wei-Mercaptotriethoxylate, Phenyltriethoxyoxane, Even 64746-970318.doc _6· This paper scale applies to China National Standard (CNS) A4 specification (210X297 Gongdong) 1298823 A7 4 DESCRIPTION OF THE INVENTION (Nitrogen compounds such as 4-phenyl azophenol and mixtures thereof. According to another aspect of the invention, a method of synthesizing an absorbent spin-on glass combination is provided. Spin-on glass materials are conventionally derived from decane. Synthesis, female IT 9 —- ^ 2: ethoxy decane, tetraethoxy decane, methyl triethoxy decane, dimethyl diethoxy decane, tetraoxan oxane, A Trioxoxane, trimethoprim, dimethyldimethoxydecane, phenyltriethoxydecane, phenyltrimethoxine gamma-phenyldiethoxydecane, and diphenyldimethoxydecane. Halodecane , , is chlorodecane, for example, trichlorodecane, methyltrichlorodecane, ethyl trioxane, phenyl trioxane, tetraoxane, dichlorodecane, methyl dichloride, alkane, dimethyl Chlorodecane, chlorotriethoxy decane, chlorotrimethoxy decane, chloromethyldiethoxy decane, chloroethyltriethoxy decane, chlorophenyltriethoxy chloromethyltrimethoxy decane, chloroethyltrimethoxy decane The gas phenyl trimethoxide is also used as a decane reactant. A method of making an absorbing spin-on glass composition comprising combining one or more alkoxides or one or more decanes, one or more miscible organic absorbing compounds, an acid/water mixture, such as a nitric acid/water mixture, and or A plurality of solvents are formed to form the reaction mixture; and the reaction mixture is refluxed to form an absorbent spin-on glass composition. The spin-on glass composition thus formed is diluted with one or more solvents to provide a coating solution for producing films of various thicknesses. Alternative methods of making absorbent spin-on glass compositions, including the use of dentate and phase transfer catalysts, are also provided. According to another aspect of the present invention, there is provided an absorbent composition of the chemical composition 9 - decanoic acid-methyltriethoxy decane. The method for synthesizing 9-fluorene carboxy-methyltriethoxy oxane includes a combination of 9-fluorene carboxylic acid, chloromethyltriethoxy decane, and triethylamine 64746-970318.doc -7. Standard (CNS) A4 size (210X297 mm) Ϊ298823 A7 ______B7___ V. Description of invention (5) and solvent to form a reaction mixture; refluxing the reaction mixture; cooling the reflux-reaction mixture to form a precipitate and residual solution; The solution is used to produce liquid 9-indole carboxy-indenyl triethoxy decane. BRIEF DESCRIPTION OF THE DRAWINGS Figures 1 a and 1 b illustrate the chemical formula of an absorbent compound incorporated into a spin-on glass composition according to a specific example of the present invention. Figures 2 a-2h illustrate the use of an absorbent spin-on glass composition in accordance with an embodiment of the present invention as an anti-reflective coating during photolithography. DETAILED DESCRIPTION Anti-reflective coatings for deep UV photolithography include one or more organically absorbing compounds incorporated into a spin-on-glass (SOG) material. The absorbent spin-on glass composition is dissolved in a suitable solvent to form a coating solution and applied to various material layers in the manufacture of a semiconductor device. Absorbent spin-on glass anti-reflective coatings are designed to be easily integrated into existing semiconductor manufacturing processes. Features that provide integration include resistance to developer, thermal stability during standard photoresist processing, and selective removal of the underlying layer. A spin-on glass material for use in a composition according to aspects of the present invention includes methyl oxa oxide, methyl fluorenoxane, phenyl oxoxane, phenyl sesquioxanes, methyl phenyl oxime Alkane, methylphenyl sesquioxanes and silicate polymers. As used herein, a spin-on glass material also includes a hydroquinone polymer of the formula 〇Si〇i Η 1 and a hydroquinone sesquioxane polymer having the formula (HSiOi.Ox wherein X is greater than about 8. Also included Copolymer of hydroquinone sesquioxane with alkoxyhydroxane or hydroxyhydrogen hydride. The spin-on glass material further comprises the formula (Hw.oSiO^2 G)n(R(}丨QSi〇i 5 2 Organic Hydrogen Oxide 64746-970318.doc _8_ This Paper Scale Optima® S Home (CNS) A4 Specification (21G X 297 mm) ---------- A7 B7 1298823 V. Description of Invention (6) polymer, general formula (HSiO^MRSiO^Ui organohydrogenated hydrazine sesquioxide polymer, wherein m is greater than 〇, the total number of η and m is greater than about 8 and R is a burnt group or a molybdenum. Several useful organic hydrogens The fossil oxy-fired polymer has a total number of η and ^ of from about 8 to about 5000, wherein R is a CVC20 alkyl group or a C6-C12 aryl group. The organohydrogenated hydrazine and the organic hydrazine sesquioxane polymer are substituted. Spin-coated polymer. Specific examples include methylhydroperoxane, ethyl hydrogen hydride, propyl hydrogen hydride, tert-butyl, hydrogen hydride, phenyl hydrogen hydride, Hydrogenated sesquioxanes, ethyl hydrazine sesquioxanes, propyl hydrogen sesquioxanes, tert-butyl hydrazine sesquioxanes, phenyl hydrazine sesquioxanes, and combinations thereof. Tea and ruthenium compounds have significant absorption at 248 nm and below. Benzene bottoms are also referred to herein as phenyl-based compounds with significant absorption at wavelengths shorter than 2 。. Although such naphthalene, anthracene and phenyl-based compounds are often It is called a dye, but the term used herein is an absorbent compound because the absorbency of such compounds is not limited to the wavelength in the visible region of the spectrum. However, not all of the absorbent compounds can be incorporated into spin-on glass for use as an ARC material. The absorbent compound suitable for use in the present invention has an absorption tip having a wavelength range of at least about 1 〇 claw width, a center surrounding wavelength such as 248 nm, 193 nm or other ultraviolet wavelength such as 365 rnn, which can be used for photolithography. Narrow absorption peaks, for example, less than 2 nm wide, are undesirable for absorbing compounds of such wavelengths. Suitable chromophores for absorbing compounds typically have one, two or three benzene rings, which may or may not be Fused. The non-mixable absorbing compound has a reactive group attached to the chromophore, the reactive group includes a hydroxyl group, an amine group, a carboxylic acid group, and is bonded to one, two or three "departing groups" with hydrazine. For example, alkoxy or halogen atom 64746-970318.doc 0 • 9 - This paper scale is suitable for B ® household material (CNi) A4 specification (210 X297 public 6 1298823

取代甲矽烷基。乙氧或甲氧基或氣原子時常被用作離去 基。因此,適當反應性基包括矽乙氧基、矽二乙氧基、矽 二乙氧基、⑨甲氧基、;^二甲氧基、♦三甲氧基、氯甲石夕 烷基,二氣甲矽烷基及三氯甲矽烷基。反應性基可被直接 鍵合至色基,例如,於苯基三乙氧石夕院内,或反應性基可 透過烴橋件接附至色基,例如,於9_蒽羧_甲基三乙氧矽 烧内。包括石夕二乙氧基在色基上,例如,被發現有利於, 特別是促進吸收性S0G膜之安定性。含偶氮基,_N=N_, 及可達反應性基之吸收化合物,特別是含有連合苯環之偶 氮基者,尤其當希望吸收性約3 6 5 nm時,亦可使用。 在吸收性旋塗玻璃組合物中,吸收性化合物可被空隙地 混入旋塗玻璃母體内。此外,吸收性化合物係以化學方式 鍵合至旋塗玻璃聚合物内。不受任何理論所限制,本發明 人等建議可混合吸收化合物經由可達反應基鍵合至旋塗玻 璃聚合物支柱提供有益結果。 適用於本發明之吸收性化合物之例包括2,6-二羥蒽@昆酸 ⑴,9·蒽羧酸(2),9-蒽甲醇(3),茜素(4),醌茜(5),櫻草 靈(6),2 -羥基-4 ( 3 -三乙氧甲矽烷丙氧基)-二苯蒙I (7),玫 紅酸(8),三乙氧甲矽烷丙基-i,8-莕亞胺(9),及9 -蒽羧-曱 基三乙氧矽烷(1〇),苯基三乙氧矽烷(11),4-苯基偶氮盼 (12)及其組合。吸收性化合物1·12之化學式示於圖ia-ib。 可得有利結果,例如,用9 -蒽酸-甲基三乙氧矽烷(10)與 α -蒽甲醇(3),2-羥基-4(3-三乙氧甲矽烷丙氧基)-二苯酮(7) 及玫紅酸(8)之組合,及與苯基三乙氧矽烷(11)之組合。 64746-970318.doc -10- 本紙張尺度適用中國國家標準(CNS) Α4規格(210 X 297公釐) A7 B7 1298823 五、發明説明(8 ) 吸收性化合物1 - 9及1 2可市面上獲自,例如,Aldrich化 學公司(密耳瓦基市,WI)。吸收性化合物1 0係使用下述 酉旨化法合成。吸收性化合物11市面上可獲自Gelest公司 (Tullytown,PA)。除了吸收性化合物(11)以外之苯基底吸收 性化合物之例’其許多亦市面上獲自Gelest公司,包括具 有接附至苯環或經取代苯基如曱基苯基、氣苯基及氯甲基 苯基之石夕底反應基之結構。特定苯基底吸收性化合物包括 苯基二甲氧矽烧、苄基三氯矽烷、氯甲基苯基三甲氧矽 烧、苯基三氟石夕烧、僅舉數例。包含1或2個”離基’,之二 苯基石夕烧,如二苯基甲基乙氧矽烷、二苯基二乙氧矽烷及 二苯基二氯石夕烧、又僅舉數例,亦為適當可混合吸收性化 合物。 合成9-蒽羧-曱基三乙氧矽烷(1〇)之方法使用9_蒽羧酸(2) 及氯甲基二乙氧矽烧作為反應物。反應物係與三乙胺及甲 基異丁酮(MIBK)組合,事先經4又分子篩乾燥,以形成反 應混合物’其被加熱以回流並回流約6至1 〇小時。回流 後,反應混合物被冷卻隔夜,導致大量固態沈澱物。殘餘 溶液被旋塗蒸發,透過矽膠柱過濾及旋轉蒸發第二次,以 產生9-蒽酸-甲基三乙氧矽烷(1〇)作為深琥珀色油狀液體, 其可被純化。 根據本發明之另一態樣,提供合成吸收性旋塗玻璃組合 物之方法。旋塗玻璃材料通常由各種矽烷反應物合成,包 括,例如,二乙氧矽烷(HTE〇s)、四乙氧矽烷(TE〇s)、曱 基三乙氧矽烷(MTEOS)、二甲基二乙氧矽烷、四甲氧矽烷 64746-970318.doc lt -11 - 本紙張尺度適用f國國家標準(CNS) A4規格(210X297公y----- A7 B7 1298823 五、發明説明(9 ) (TMOS)、甲基三甲氧石夕烧(MTMOS)、三甲氧石夕烧、二甲基 二甲氧矽烷、苯基三乙氧矽烷(PTEOS)、苯基三甲氧矽烷 (PTMOS)、二苯基二乙氧矽烷及二苯基二甲氧矽烷。鹵代 矽烷,特別是氯矽烷如三氯矽烷、曱基三氯矽烷、乙基三 氯矽烷、苯基三氯矽烷、四氯矽烷、二氯矽烷、甲基二氣 矽烷、二甲基二氯矽烷、氯三乙氧矽烷、氯三甲氧矽烷、 氯甲基三乙氧矽烷、氯乙基三乙氧矽烷、氯苯基三乙氧矽 烷、氯甲基三甲氧矽烷、氯乙基三甲氧矽烷及氣苯基三甲 氧矽烷亦被用作矽烷反應物。為了製造吸收旋塗玻璃組合 物,吸收性化合物如吸收性化合物1 - 1 2或其組合在SOG材 料之合成時係與矽烷組合。 在第一方法中,反應混合物,包括石夕烧反應物,例如, HTEOS 或 TEOS及MTEOS,或 TMOS及MTMOS ;或替代地, 四氯石夕烧及甲基三氯碎烧,一種或多種吸收性化合物如吸 收性化合物1 - 1 2 ;溶劑或溶劑之組合;酸/水混合物,被 形成於反應容器内。適當溶劑包括丙酮、2 -丙醇及其他簡 單醇類、酮類及酯類如1 -丙醇、MIBK,丙氧丙醇及乙酸 丙酯。酸/水混合物為,例如,硝酸與水。其他非質子酸 或酸性酐如乙酸、甲醯酸、磷酸、鹽酸或乙酸酐可替代用 於酸混合物内。所得混合物被回流約1與2 4小時之間以產 生吸收性S 0 G聚合物溶液。 吸收性SOG可用適當溶劑稀釋以達成塗佈溶液,其產生 各種厚度之薄膜。適當稀釋溶劑包括丙酮、2 -丙醇、乙 醇、丁醇、甲醇、乙酸丙酯、乳酸乙酯及丙二醇丙醚,市 64746-970318.doc - 12- 本紙張尺度適用中國國家標準(CNS) A4規格(210X 297公釐) 1298823Substituting the carboxyalkyl group. Ethoxy or methoxy or gas atoms are often used as leaving groups. Thus, suitable reactive groups include decyloxy, decyloxy, decyloxy, 9 methoxy, dimethyloxy, 1,3-trimethoxy, chloromethyl sulfanyl, dioxane Formyl and trichloromethane. The reactive group may be bonded directly to the chromophore, for example, in phenyl triethoxylate, or the reactive group may be attached to the chromophore via a hydrocarbon bridge, for example, at 9-蒽carboxy-methyl three Ethylene oxime is burnt inside. Including, on the chromophore, it has been found to be advantageous, for example, to promote the stability of the absorptive SOG film. Absorbing compounds containing an azo group, _N=N_, and a reactive group, particularly those containing a phenyl ring of a phenyl ring, may also be used, especially when it is desired to have an absorbance of about 3 5 5 nm. In the absorbent spin-on glass composition, the absorbent compound can be incorporated into the spin-coated glass matrix by voids. In addition, the absorbent compound is chemically bonded to the spin-on glass polymer. Without being bound by any theory, the inventors suggest that a hybrid absorbing compound provides beneficial results via a reachable reactive group bonded to a spin-on glass polymer pillar. Examples of the absorbent compound suitable for use in the present invention include 2,6-dihydroxyindole@quinic acid (1), 9-indole carboxylic acid (2), 9-fluorenyl alcohol (3), halogen (4), hydrazine (5). ), primrose (6), 2-hydroxy-4 (3-triethoxymethyl decylpropoxy)-diphenylene I (7), rosin (8), triethoxy methoxypropyl propyl i,8-indoleimine (9), and 9-fluorene carboxy-mercaptotriethoxy decane (1 fluorene), phenyl triethoxy decane (11), 4-phenyl azo (12) and combination. The chemical formula of the absorptive compound 1·12 is shown in Figure ia-ib. Favorable results can be obtained, for example, with 9-decanoic acid-methyltriethoxydecane (10) and α-indole methanol (3), 2-hydroxy-4(3-triethoxymethylnonanepropoxy)-di A combination of benzophenone (7) and rosin acid (8), and a combination with phenyltriethoxy decane (11). 64746-970318.doc -10- This paper scale applies to China National Standard (CNS) Α4 specification (210 X 297 mm) A7 B7 1298823 V. Description of invention (8) Absorbent compounds 1 - 9 and 1 2 are commercially available From, for example, Aldrich Chemical Company (Milwaukee City, WI). The absorptive compound 10 was synthesized by the following method. Absorbent Compound 11 is commercially available from Gelest Corporation (Tullytown, PA). Examples of phenyl bottom absorbent compounds other than the absorbent compound (11) are also commercially available from Gelest, including those attached to a benzene ring or a substituted phenyl group such as nonylphenyl, phenyl and chlorine. The structure of the base of the methyl phenyl group. Specific phenyl bottom absorbent compounds include phenyl dimethoxy oxime, benzyl trichloro decane, chloromethyl phenyl trimethoate, and phenyl trifluorocarbon sinter, to name a few. Containing 1 or 2 "officyl", diphenyl sulphur, such as diphenylmethyl ethoxy decane, diphenyl diethoxy decane, and diphenyl chlorite, to name a few, It is also a suitable miscible compound. The method of synthesizing 9-fluorene carboxy-mercaptotriethoxy decane (1 〇) is carried out using 9-indole carboxylic acid (2) and chloromethyldiethoxy oxime as a reactant. The system is combined with triethylamine and methyl isobutyl ketone (MIBK), previously dried by molecular sieves to form a reaction mixture, which is heated to reflux and reflux for about 6 to 1 hour. After reflux, the reaction mixture is cooled. Overnight, resulting in a large amount of solid precipitate. The residual solution was spin-coated and evaporated, filtered through a silica gel column and rotary evaporated for a second time to produce 9-decanoic acid-methyltriethoxysilane (1 〇) as a dark amber oily liquid. It can be purified. According to another aspect of the invention, a method of synthesizing an absorbent spin-on glass composition is provided. Spin-on glass materials are typically synthesized from various decane reactants, including, for example, diethoxy decane (HTE®). s), tetraethoxy decane (TE〇s), decyl triethoxy decane (MTE) OS), dimethyldiethoxy decane, tetramethoxy decane 64746-970318.doc lt -11 - This paper scale applies to national standard (CNS) A4 specification (210X297 public y----- A7 B7 1298823 five , invention description (9) (TMOS), methyl methicone (MTMOS), trimethoate, dimethyl dimethoxy decane, phenyl triethoxy decane (PTEOS), phenyl trimethoxy decane (PTMOS), diphenyldiethoxyoxane and diphenyldimethoxydecane. Halogenated decane, especially chlorodecane such as trichlorodecane, decyltrichlorodecane, ethyltrichlorodecane, phenyltrichloromethane , tetrachlorodecane, dichlorodecane, methyl dioxane, dimethyl dichlorodecane, chlorotriethoxy decane, chlorotrimethoxy decane, chloromethyl triethoxy decane, chloroethyl triethoxy decane, chlorine Phenyltriethoxyoxane, chloromethyltrimethoxydecane, chloroethyltrimethoxydecane, and phenyltrimethoxyoxane are also used as the decane reactant. For the manufacture of an absorption spin-on glass composition, an absorbent compound such as absorbency Compound 1 - 2 2 or a combination thereof is combined with decane in the synthesis of the SOG material. In the first method, the reaction is mixed. Compounds, including lithene calcined reactants, for example, HTEOS or TEOS and MTEOS, or TMOS and MTMOS; or alternatively, tetrachlorite and methyl trichloroacetate, one or more absorbent compounds such as absorbent compounds 1 - 1 2 ; a combination of solvent or solvent; an acid/water mixture, formed in a reaction vessel. Suitable solvents include acetone, 2-propanol and other simple alcohols, ketones and esters such as 1-propanol, MIBK , propoxypropanol and propyl acetate. The acid/water mixture is, for example, nitric acid and water. Other aprotic acids or acidic anhydrides such as acetic acid, formic acid, phosphoric acid, hydrochloric acid or acetic anhydride can be used in the acid mixture. The resulting mixture was refluxed between about 1 and 24 hours to produce an absorbent S0G polymer solution. The absorbent SOG can be diluted with a suitable solvent to achieve a coating solution which produces films of various thicknesses. Suitable dilution solvents include acetone, 2-propanol, ethanol, butanol, methanol, propyl acetate, ethyl lactate and propylene glycol propyl ether. City 64746-970318.doc - 12- This paper scale applies to China National Standard (CNS) A4 Specifications (210X 297 mm) 1298823

m r❶pas°i-p。具有高沸點之稀釋溶劑如乳酸乙酯 薄膜破發現為有益。據信高沸點溶劑可降低汽泡 交聯頂層下方變成被截雷二;、沸點溶劑會在薄膜 . 現後在烘培加工步驟時當驅離 、二隙。可用於本發明之附加溶劑包括乙二醇二甲 喊:,替代稱為肪、苯甲趟、二丁喊、二丙喊、丙二醇乙酸 ’醚及戊醇。;F見需要,界面活性劑如3m公(明尼阿波利 市,廳)提供之產品F⑽,細〇公司(日本)所提供之產 品…咖刪,亦被加入塗佈溶液内。塗佈溶液通常為 約0.5與20重量%間聚合物。使用前,塗佈溶液由標準過壚 技術過滤。 根據形成吸收性S0G材料之第二方法,反應混合物,包 括矽烷反應物,一種或多種吸收性化合物如吸收性化合物 1 - 1 2,及溶劑或溶劑之組合被形成於反應容器内。反應 混合物被加熱以回流並回流約丨與2 4小時之間。矽烷反應 物與溶劑如上述第一方法所述。酸/水混合物,如上述 般,被加入反應混合物同時攪拌。所得混合物被加熱以回 流並回流約1與2 4小時之間以產生吸收性s〇G聚合物。吸 收性SOG如上述般被稀釋並過濾以形成塗佈溶液。 形成吸收性有機氫化石夕氧烧材料之方法包括形成包含非 極性溶劑與極性溶劑之雙相溶劑與相轉移觸媒之混合物; 加入一種或多種有機三鹵代矽烷、氫化三_代矽烷及一種 或多種吸收性化合物如吸收性化合物1 _丨2,以提供雙相 反應混合物;及反應雙相反應混合物1與2 4小時之間,以 -13- 64746-970318.doc 本紙張尺度適用中國國家標準(CNS) A4規格(210 X 297公釐) 1298823 A7 A7 ______B7_ 五、發明説明(彳1 ) 產生吸收性有機氫化矽氧烧聚合物。相轉移觸媒包括但不 於氟化四丁叙及氣化苄基三甲錄。典型非極性溶劑包括但 不限於戊烷、己烷、庚烷、環己烷、苯、甲苯、二甲苯、 鹵化溶劑如四氣化碳及其混合物。有用極性溶劑包括水、 醇類及醇與水混合物。吸收性聚合物溶液如上述被稀釋並 過濾以形成塗佈溶液。 吸收性SOG塗佈溶液通常藉傳統旋塗沈積技術,視特定 製造過程而定,塗敷至半導體加工所用之各種層。此等技 術包括分配旋轉、厚度旋轉及熱烘焙步驟以產生吸收性 SOG抗反射膜。典型方法包括1〇〇〇與4〇〇〇 rpm下約2〇秒之 尽度》疋轉及在8 0 C與3 0 0 C間各約1分鐘之二個或三個供培 步驟。根據本發明之吸收性S0G抗反射膜顯示反射指數為 約1·3與約2.0之間,消光係數大於〇·〇7。如以下實例15_17 所示’可得大於0.4之消光係數。相對照地,介電材料如 二氧化矽、矽酸鹽及甲基矽氧烷之消光係數在波長大於 190 nm下約 〇。 在製造積體電路(1C)裝置之光石印過程中,使用根據本 發明之吸收性旋塗玻璃材料作為抗反射層之一般方法示於 圖2a-2h。如圖2a所示,介電層22沈積在基材2〇上。基 材20為矽基材或基材20在1(::裝置中由一種或多種金屬互 連層所構成。介電層22可由各種介電材料所組成,包括, 例如,自TEOS衍生之二氧化石夕層、矽烧底二氧化矽層、 熱生長之氧化物,或化學蒸氣沈積製成之甲基氫化矽氧烷 或此入其他元素或化合物之二氧化石夕。介電層22通常為光 64746-970318.doc · 14 _ 本紙尺麟财8 S家標準(CNS) A4規格(21GX 297公釐) ---- 1298823 A7 ______B7 五、發明説明(12 ) 學透明介質。吸收性S0G抗反射塗層24被塗敷在介電層 2 2 (圖2 b)上方’其係由傳統正光阻劑之光阻劑層2 6覆 蓋,以產生圖2c所示之堆積物。圖2(:之堆積物透過罩3〇 曝光至务、外線照射3 2,如圖2 d所示。在曝光時,吸收性 SOG ARC層2 4吸收傳達過光阻劑之紫外線3 2。因為介電 層22在紫外線波長範圍内透明,所以若吸收性8〇6 ARc 層24未存在時,紫外線32會反射脫離底部矽層2〇,降低 臨界尺寸,例如,曝光光阻劑之臨界尺寸2 7。在此實例 中,正光阻劑提供直接影像傳送。m r❶pas°i-p. A dilution solvent having a high boiling point such as an ethyl lactate film is found to be beneficial. It is believed that the high-boiling solvent reduces the bubble under the top layer of the cross-link to become trapped; the boiling solvent will be in the film. Now it is driven away from the two gaps during the baking process. Additional solvents which may be used in the present invention include ethylene glycol dimethyl acrylate: alternatives are known as fat, benzamidine, dibutyl sulfonate, dipropylene propylene glycol, propylene glycol acetate ether and pentanol. ;F See the need, surfactants such as 3m (Minneapolis, Hall) products F (10), the products provided by the company (Japan) ... coffee, also added to the coating solution. The coating solution is typically between about 0.5 and 20% by weight polymer. The coating solution was filtered by standard over-twisting techniques prior to use. According to a second method of forming an absorbent SOG material, a reaction mixture, including a decane reactant, one or more absorbent compounds such as an absorbent compound 1 - 12, and a solvent or a combination of solvents are formed in the reaction vessel. The reaction mixture was heated to reflux and refluxed between about 2 and 24 hours. The decane reactant and solvent are as described in the first method above. The acid/water mixture, as described above, was added to the reaction mixture while stirring. The resulting mixture is heated to reflux and reflux between about 1 and 24 hours to produce an absorbent s?G polymer. The absorbable SOG was diluted and filtered as described above to form a coating solution. The method for forming an absorbing organohydrogenus oxy-ceramic material comprises forming a mixture of a biphasic solvent comprising a non-polar solvent and a polar solvent and a phase transfer catalyst; adding one or more organic trihalogenated decane, hydrogenated tri-decane and one Or a plurality of absorbing compounds such as the absorbing compound 1 _ 丨 2 to provide a biphasic reaction mixture; and the reaction biphasic reaction mixture between 1 and 24 hours, in the range of -13-64746-970318.doc. Standard (CNS) A4 size (210 X 297 mm) 1298823 A7 A7 ______B7_ V. INSTRUCTIONS (彳1) An absorbent organic hydrogenated oxy-oxygenated polymer is produced. Phase transfer catalysts include, but are not limited to, fluorinated tetrabutyl and gasified benzyl trimethyl. Typical non-polar solvents include, but are not limited to, pentane, hexane, heptane, cyclohexane, benzene, toluene, xylene, halogenated solvents such as tetra-carbonated carbon, and mixtures thereof. Useful polar solvents include water, alcohols, and mixtures of alcohols and water. The absorbent polymer solution was diluted and filtered as described above to form a coating solution. Absorbent SOG coating solutions are typically applied to various layers used in semiconductor processing by conventional spin-on deposition techniques, depending on the particular manufacturing process. These techniques include dispensing rotation, thickness rotation, and thermal baking steps to produce an absorbent SOG anti-reflective film. Typical methods include about 2 sec. at 1 Torr and 4 rpm, and two or three cultivating steps of about 1 minute between 80 C and 300 C. The absorptive SOG antireflective film according to the present invention exhibits a reflectance index of between about 1.3 and about 2.0, and an extinction coefficient greater than 〇·〇7. An extinction coefficient greater than 0.4 can be obtained as shown in the following example 15_17. In contrast, the extinction coefficients of dielectric materials such as ceria, citrate and methyl decane are about 〇 at wavelengths greater than 190 nm. The general method of using the absorptive spin-on glass material according to the present invention as an anti-reflective layer in the photolithography process of the integrated circuit (1C) apparatus is shown in Figures 2a-2h. As shown in Figure 2a, a dielectric layer 22 is deposited on the substrate 2A. The substrate 20 is a tantalum substrate or substrate 20 consisting of one or more metal interconnect layers in a device. The dielectric layer 22 can be composed of various dielectric materials, including, for example, two derived from TEOS. a oxidized stone layer, a bismuth oxide layer, a thermally grown oxide, or a methyl hydride hydride formed by chemical vapor deposition or a dioxide dioxide of other elements or compounds. The dielectric layer 22 is usually For light 64746-970318.doc · 14 _ This paper ruler Lin Shou 8 S standard (CNS) A4 specification (21GX 297 mm) ---- 1298823 A7 ______B7 V. Invention description (12) Learn transparent medium. Absorbent S0G An anti-reflective coating 24 is applied over the dielectric layer 2 2 (Fig. 2b) which is covered by a photoresist layer 26 of a conventional positive photoresist to produce the deposit shown in Figure 2c. The deposit is exposed through the cover 3 to the outside and the external line 3 2 as shown in Fig. 2d. During exposure, the absorptive SOG ARC layer 24 absorbs the ultraviolet light 3 3 that transmits the photoresist. Because of the dielectric layer 22 is transparent in the ultraviolet wavelength range, so if the absorptive 8〇6 ARc layer 24 is not present, the ultraviolet light 32 will reflect off the bottom layer. 2〇, reduce the critical dimension, for example, the critical dimension of the exposure photoresist 27. In this example, the positive photoresist provides direct image transfer.

曝光堆積物被顯像以產生圖2 ^之堆積物。吸收性sqg ARC層2 4對傳統光阻顯像溶液如氫化四甲銨2.5%溶 有抗性。相對照地,具有若干光阻材料之化學特性之有機 ARC層對光阻顯像劑更敏感。此外,預期吸收性s〇(} aRc 層對還原化學、氣體底光阻汽提過程有抗性,而有機ARC 卻無抗性。因此,使用吸收性S〇G層會便利光阻再作業, 而不需再塗敷ARC層。 其次’圖型透過光阻層2 6内開口於吸收性s〇G ARC層内 蝕刻’以產生圖2 f之蝕刻過堆積物。對光阻劑具有高度選 擇性之氟碳餘刻被用以蝕刻吸收s〇G ARC層2 4。吸收性 SOG對氟碳姓刻之回應提供吸收性s〇G在需要氧電漿蝕刻 之有機ARC層上之附加優點。氧氣電漿蝕刻會降低顯像之 光阻劑之臨界尺寸,因為有機物底光阻劑亦會被氧氣電漿 餘刻。氟碳電漿消耗較氧氣電漿更少光阻劑。在較短紫外 線波長下,焦點需要之深度在圖2d所示之曝光步驟下會限 64746-970318.doc _ 15 _ 本紙張尺度適用中國國家標準(CNS) A4規格(210X297公董) ' 1298823The exposed deposits were developed to produce the deposit of Figure 2^. The absorptive sqg ARC layer 24 is resistant to 2.5% of conventional photoresist imaging solutions such as tetramethylammonium hydride. In contrast, an organic ARC layer having the chemical properties of several photoresist materials is more sensitive to photoresist developers. In addition, it is expected that the absorptive s〇(} aRc layer is resistant to reduction chemistry and gas-base photoresist stripping, while organic ARC is not resistant. Therefore, the use of an absorptive S〇G layer facilitates photoresist rework. It is not necessary to apply the ARC layer. Secondly, the pattern is etched through the opening of the photoresist layer 26 in the absorptive layer AG ARC layer to produce the etched deposit of FIG. 2 f. The photoresist has a high selectivity. The fluorocarbon residue is used to etch the s?G ARC layer 24. The absorption of SOG in response to the fluorocarbon replies provides the added advantage of absorbing 〇G on the organic ARC layer requiring oxygen plasma etching. Oxygen plasma etching will reduce the critical size of the developed photoresist because the organic bottom photoresist will also be enriched by oxygen plasma. Fluorocarbon plasma consumes less photoresist than oxygen plasma. At the wavelength, the depth required for the focus will be limited to 64746-970318.doc _ 15 in the exposure step shown in Figure 2d. _ This paper scale applies to the Chinese National Standard (CNS) A4 specification (210X297 Gongdong) ' 1298823

制光阻背丨層2 6之厚度。例如,據評估在丨93 nm下,光阻劑 層之厚度應約為3〇〇 nm。因此,當該等短波長開始被使用 時’具有可對光阻劑選擇性蝕刻之Arc層很重要。 氟石反蝕刻被連續透過介電層2 2以產生圖2 g之堆積物。 ^連績蝕刻過程時,光阻劑層2 6被部份消耗。最後,光阻 知層2 6使用氧氣電漿或氫還原化學汽提,而SOG ARC層 則使用緩衝氧化物蝕刻,如標準氫氟酸/水混合物,或水 ^生或非水性有機胺汽提。有利的是,s〇G ARC層可用對底 部介電層顯示良好選擇性之溶液汽提。因此,圖2卜211所 不之一般光石印法例示吸收性S〇g材料作為抗反射塗層之 加工優點。 合成吸收性SOG材料之方法以及吸收性化合物1 〇,9 _蒽 羧-甲基三乙氧矽烷之合成例示於下列實例中。 實例1 含9 -蒽竣-甲基三乙氧石夕烧之吸收性s〇G之合成 在1升燒瓶中’297 g 2 -丙醇、148 g丙醇、123 g TEOS、 6〇 g 9-蒽羧-甲基三乙氧矽烷、〇 6 g 〇] M硝酸及72 g去離 子水被組合。燒瓶回流4小時。115 g丁醇、488 g 2_丙醇、 245 g丙酮、329 g乙醇、53 g去離子水及3.8 g 10% FC 430 (3 Μ公司,明尼阿波利市,MN )加入溶液中。過濾溶液。 分配溶液’然後3000 rpm厚度旋轉20秒,在80 °C及180 °C下 烘培各1分鐘。用N&K Technology型號12〇〇分析器測定光 學特性。薄膜厚度為1635乂。在248 nm下,折射指數(n)為 1.373及消光係數(k)為0.268。所有下列實例皆使用相同旋 64746-970318.doc -16. 本紙張尺度適用中國國家標準(CNS) A4規格(210 X 297公董) A7 B7 1298823 五、發明説明(14 ) 轉及烘焙加工參數及測定技術。 實例2 含有9-蒽甲醇、2-羥基-4(3-三乙氧甲矽烷丙氧基二苯 酮及玫紅酸之吸收性SOG之合成 在1升燒瓶中,297 g 2-丙醇、148 g丙酉同、123 g TEOS、 77 g MTEOS、25 g 9·蒽甲醇、10 g 2-羥基-4(3-三乙氧甲矽 烧丙氧基)_二苯酮、5 g玫紅酸、0.6 g 〇·ι μ硝酸及72 g去 離子水被組合。燒瓶被回流4小時。in g丁醇、459 g 2_丙 醇、230 g丙酮、309 g乙醇、50 g去離子水及3.75 g 1〇% FC 430 (3 Μ公司,明尼阿波利市,Μ N )加入此溶液中。厚度 = 1436A,n=1.479,k=0.1255 實例3 含有9 -蒽曱醇、2 -羥基-4(3-三乙氧甲石夕烧丙氧基卜二苯 酮及玫紅酸之吸收性SOG之合成 在1升燒瓶中,297 g2-丙醇、148g丙酮、93g TEOS、77 g MTEOS、20 g 9-蒽甲醇、60 g 2_羥基_4(3-三乙氧甲矽烷 丙氧基)-二苯酮、5 g玫紅酸、0.5599 g 〇·1 Μ硝酸及71.90 g去離子水被組合。燒瓶被回流4小時。57 g丁醇、88 g 2- 丙醇、44 g丙酮、59 g乙醇、9_5 g去離子水及3.75 g 10% FC 430 (3 Μ公司,明尼阿波利市,MN)加入此溶液中。 厚度=4248又,n=1.525,k=0.228 實例4 含有9 -蒽甲醇、2 -羥基-4(3-三乙氧甲矽烷丙氧基)·二苯 酮及玫紅酸之吸收性SOG之合成 64746-970318.doc -17- 本紙張尺度適用中國國家標準(CNS) A4規格(210 X 297公釐) 1298823 A7 B7 五、發明説明(15 ) 在1升燒瓶中,297 g 2_丙醇、148 g丙醇、1〇8 g TE〇s、 77 g MTEOS、10 g 9·蒽甲醇、60 g 2-羥基_4(3•三乙氧甲矽 烷丙氧基)·二苯酮、5 g玫紅酸、0.5 599 g 〇.1 μ硝酸及72 g 去離子水被組合。燒瓶被回流4小時。57 g丁醇、88 g 2-丙 醇、44 g丙酮、59 g乙醇、9.5 g去離子水及3 75 g 1〇% FC 430 (3 Μ公司,明尼阿波利市,MN)加入此溶液中。厚度 =4275 A,n=1.529,k=0.124 實例5 含有2-羥基-4(3·三乙氧曱矽烷丙氧基)_ 二苯酮之吸收性SOG之合成 在1升燒甑中,297 g 2 -丙醇、148 g丙醇、123 g TEOS、 51 g MTEOS、60 g 2-羥基-4(3_三乙氧甲矽烷丙氧基)_二苯 _、0.6 g 0· 1 Μ硝酸及72 g去離子水被組合。燒瓶被回流4 小時。57g 丁醇、88g2-丙醇、44g丙酮、59g乙醇、9.5 g 去離子水及3.75 g 10% FC 430 (3 Μ公司,明尼阿波利市, ΜΝ)加入此溶液中。厚度= 3592又,n= 1.563,k=0.067 實例6 含有9-蒽甲醇之吸收性SOG之合成 在1升燒瓶中,297 g 2 -丙醇、148 g丙酮、123 g TEOS、 77 g MTEOS、10 g 9-E 甲醇、〇·6 g 〇·1 Μ硝酸及 72 g去離 子水被組合。燒瓶被回流4小時。57 g丁醇、88 g 2-丙醇、 44 g丙酮、59 g乙醇、9.5 g去離子水及3.75 g 10% FC 430 (3 Μ公司,明尼阿波利市,Μ N)加入此溶液中。厚度 ==:3401 α 5 π=1.433 5 k=0.106 -18 - 64746-970318.doc 本紙張尺度適用中國國家標準(CMS) A4規格(210 X 297公釐) 1298823 A7 ____B7 五、發明説明(16 ) f例7 含有9·蒽甲醇、2 -羥基_4(3-三乙氧甲矽烷丙氧基)-二苯 酮及玫紅酸之吸收性SOG之合成 在1升燒瓶中,297 g 2 -丙醇、148 g丙酮、123 g TEOS、 77 g MTEOS、20 g 2-羥基-4(3_三乙氧甲矽烷丙氧基)-二苯 酉同、25 g 9-蒽甲醇、5 g玫紅酸、〇·6 g 01 μ硝酸及72 g去 離子水被組合。燒瓶被回流4小時。57 g 丁醇、88 g 2-丙 醇、44 g丙酮、59 g乙醇、9·5 g去離子水及3.75 g 10% FC 430 (3 Μ公司,明尼阿波利市,MN)加入此溶液中。厚度 =3503 a 5 n=1.475 5 k=0.193 實例8 含有9-蒽甲醇、2-羥基-4(3-三乙氧甲矽烷丙氧基)_二苯 酮及玫紅酸之吸收性SOG之合成 在1升燒瓶中,297 g 2 -丙醇、148 g丙酮、123 g TEOS、 77 g MTEOS、5 g 2-羥基-4(3-三乙氧甲矽烷丙氧基二苯 嗣、25 g 9-蒽甲醇、5 g玫紅酸、〇·6 g 〇·ΐ Μ硝酸及72 g去 離子水被組合。燒瓶被回流4小時。57 g 丁醇、88 g 2-丙 醇、4 4 g丙酮、5 9 g乙醇、9.5 g去離子水及3.75 g 10% FC 430 (3 Μ公司,明尼阿波利市,MN)加入此溶液中。厚度 ΑΒΑ,n=1.454,k=0.175 實例9 含有9·蒽甲醇、2-羥基-4(3-三乙氧甲矽烷丙氧基二苯 酮、玫紅酸、自昆茜及茜素之吸收性SOG之合成 在1升燒瓶中,297 g 2 -丙醇、148 g丙酮、123 g TEOS、 64746-970318.doc . 19. I紙張尺度適用t ® S家標準(CNS) A4規格(21G X 297公釐)' 1298823The thickness of the photoresist backing layer 26. For example, it is estimated that at 丨93 nm, the thickness of the photoresist layer should be approximately 3 〇〇 nm. Therefore, it is important to have an Arc layer that is selectively etchable to the photoresist when the short wavelengths are initially used. The fluorite back etch is continuously passed through the dielectric layer 2 2 to produce the deposit of Figure 2g. When the etching process is continued, the photoresist layer 26 is partially consumed. Finally, the photoresist layer 26 uses oxygen plasma or hydrogen reduction chemical stripping, while the SOG ARC layer uses buffered oxide etching, such as a standard hydrofluoric acid/water mixture, or aqueous or non-aqueous organic amine stripping. . Advantageously, the s〇G ARC layer can be stripped by a solution that exhibits good selectivity to the bottom dielectric layer. Therefore, the general lithographic printing method of Fig. 2 211 exemplifies the processing advantages of the absorbent S〇g material as an antireflection coating. A method of synthesizing an absorbent SOG material and a synthesis of an absorbing compound 1 〇, 9 蒽 carboxy-methyl triethoxy decane are shown in the following examples. Example 1 Synthesis of Absorbent s〇G containing 9-fluorene-methyltriethoxylate in a 1 liter flask '297 g 2 -propanol, 148 g of propanol, 123 g of TEOS, 6 〇g 9 - hydrazine carboxy-methyltriethoxy decane, 〇6 g 〇] M nitric acid and 72 g deionized water were combined. The flask was refluxed for 4 hours. 115 g of butanol, 488 g of 2-propanol, 245 g of acetone, 329 g of ethanol, 53 g of deionized water, and 3.8 g of 10% FC 430 (3 Μ, Minneapolis, MN) were added to the solution. Filter the solution. The solution was dispensed and then rotated at a thickness of 3000 rpm for 20 seconds and baked at 80 ° C and 180 ° C for 1 minute each. Optical properties were measured using a N&K Technology Model 12® analyzer. The film thickness was 1635 乂. At 248 nm, the refractive index (n) was 1.373 and the extinction coefficient (k) was 0.268. All the following examples use the same rotation 64746-970318.doc -16. This paper scale applies to China National Standard (CNS) A4 specification (210 X 297 dongdong) A7 B7 1298823 V. Description of invention (14) Transfer and baking processing parameters and Determination technique. Example 2 Synthesis of Absorbent SOG Containing 9-Methanol, 2-Hydroxy-4(3-Triethoxycarbonylpropoxybenzophenone and Rose Benic Acid in a 1 liter flask, 297 g 2-propanol, 148 g of propionate, 123 g of TEOS, 77 g of MTEOS, 25 g of 9·methanol, 10 g of 2-hydroxy-4(3-triethoxymethylpyrrolidine)-benzophenone, 5 g of rose Acid, 0.6 g 〇·ι μ nitric acid and 72 g deionized water were combined. The flask was refluxed for 4 hours. In g butanol, 459 g 2-propanol, 230 g acetone, 309 g ethanol, 50 g deionized water and 3.75 g 1〇% FC 430 (3 Μ, Minneapolis, Μ N ) was added to this solution. Thickness = 1436A, n = 1.479, k = 0.1255 Example 3 Containing 9-nonanol, 2-hydroxyl - Synthesis of 4(3-triethoxymethylcarbazide propoxy benzophenone and rose acid absorption SOG in a 1 liter flask, 297 g 2-propanol, 148 g acetone, 93 g TEOS, 77 g MTEOS, 20 g of 9-indole methanol, 60 g of 2_hydroxy-4(3-triethoxymethanepropaneoxy)-benzophenone, 5 g of rosacenic acid, 0.5599 g of 〇·1 Μ nitric acid and 71.90 g of deionized water The flask was refluxed for 4 hours. 57 g butanol, 88 g 2-propanol, 44 g acetone, 59 g ethanol, 9_5 g Deionized water and 3.75 g of 10% FC 430 (3 Μ, Minneapolis, MN) were added to this solution. Thickness = 4248 again, n = 1.525, k = 0.228 Example 4 contains 9 - hydrazine, 2 Synthesis of -hydroxy-4(3-triethoxymethanepropaneoxy) benzophenone and rose acid absorption SOG 64746-970318.doc -17- This paper scale applies to China National Standard (CNS) A4 specification (210 X 297 mm) 1298823 A7 B7 V. INSTRUCTIONS (15) In a 1 liter flask, 297 g of 2-propanol, 148 g of propanol, 1〇8 g of TE〇s, 77 g of MTEOS, 10 g of 9 · 蒽 methanol, 60 g 2-hydroxy_4 (3 • triethoxymethyl decyl propyloxy) benzophenone, 5 g rosmarinic acid, 0.5 599 g 〇.1 μ nitric acid and 72 g deionized water are combined The flask was refluxed for 4 hours. 57 g butanol, 88 g 2-propanol, 44 g acetone, 59 g ethanol, 9.5 g deionized water and 3 75 g 1〇% FC 430 (3 Μ, Minneapolis) City, MN) was added to this solution. Thickness = 4275 A, n = 1.529, k = 0.144 Example 5 Absorbent SOG containing 2-hydroxy-4(3 · triethoxydecylpropoxy) benzophenone Synthesis in 1 liter of simmer, 297 g of 2-propanol, 148 g of propanol, 123 g of TEOS, 51 g MTEOS, 60 g of 2-hydroxy-4(3_triethoxymethanepropaneoxy)-diphenyl _, 0.6 g of 0·1 decanoic acid and 72 g of deionized water were combined. The flask was refluxed for 4 hours. 57 g of butanol, 88 g of 2-propanol, 44 g of acetone, 59 g of ethanol, 9.5 g of deionized water, and 3.75 g of 10% FC 430 (Minneapolis, Minneapolis, ΜΝ) were added to the solution. Thickness = 3592 again, n = 1.563, k = 0.067 Example 6 Synthesis of Absorbent SOG containing 9-Methanol. In a 1 liter flask, 297 g of 2-propanol, 148 g of acetone, 123 g of TEOS, 77 g of MTEOS, 10 g of 9-E methanol, 〇·6 g 〇·1 Μ nitric acid and 72 g of deionized water were combined. The flask was refluxed for 4 hours. 57 g butanol, 88 g 2-propanol, 44 g acetone, 59 g ethanol, 9.5 g deionized water and 3.75 g 10% FC 430 (3 Μ, Minneapolis, Μ N) were added to this solution. . Thickness==:3401 α 5 π=1.433 5 k=0.106 -18 - 64746-970318.doc This paper scale applies to Chinese National Standard (CMS) A4 specification (210 X 297 mm) 1298823 A7 ____B7 V. Description of invention (16 f Example 7 Synthesis of Absorbent SOG containing 9·蒽methanol, 2-hydroxy-4(3-triethoxymethanepropaneoxy)-benzophenone and rosmarinic acid in a 1 liter flask, 297 g 2 -propanol, 148 g acetone, 123 g TEOS, 77 g MTEOS, 20 g 2-hydroxy-4(3_triethoxymethoxydecylpropoxy)-diphenyl hydrazine, 25 g 9-hydrazine methanol, 5 g Rose erythric acid, 〇·6 g 01 μ nitric acid and 72 g deionized water were combined. The flask was refluxed for 4 hours. 57 g butanol, 88 g 2-propanol, 44 g acetone, 59 g ethanol, 9·5 g deionized water and 3.75 g 10% FC 430 (3 Μ, Minneapolis, MN) were added to this solution. in. Thickness = 3503 a 5 n = 1.475 5 k = 0.193 Example 8 Absorbent SOG containing 9-mercaptomethanol, 2-hydroxy-4(3-triethoxymethanepropaneoxy)-benzophenone and rosacenic acid Synthesized in a 1 liter flask, 297 g 2 -propanol, 148 g acetone, 123 g TEOS, 77 g MTEOS, 5 g 2-hydroxy-4(3-triethoxymethylnonanepropoxydiphenyl hydrazine, 25 g 9-蒽methanol, 5 g of rosmarinic acid, 〇·6 g 〇·ΐ Μ nitric acid and 72 g of deionized water were combined. The flask was refluxed for 4 hours. 57 g butanol, 88 g 2-propanol, 4 4 g Acetone, 59 g ethanol, 9.5 g deionized water, and 3.75 g 10% FC 430 (3 Μ, Minneapolis, MN) were added to this solution. Thickness ΑΒΑ, n = 1.454, k = 0.175 Example 9 contains 9. Synthesis of absorbing methanol, 2-hydroxy-4(3-triethoxymethanepropane oxybenzophenone, rosmarinic acid, self-enhancing and alizarin in a 1 liter flask, 297 g 2 -propanol, 148 g acetone, 123 g TEOS, 64746-970318.doc. 19. I paper scale for t ® S home standard (CNS) A4 size (21G X 297 mm) ' 1298823

77 g MTEOS、20 g 2-經基-4(3-三乙氧曱石夕烷丙氧基)_二苯 酮、25 g 9_蒽甲醇、5 g玫紅酸、2 g酿茜、2 g茜素、0.6 g • 1 Μ肖I及72 g去離子水被組合。燒瓶被回流4小時。g 丁醇、88g2_丙醇、44g丙酮、59g乙醇、95§去離子水 及3.7 g 10/〇 FC 430 (3 Μ公司,明尼阿波利市,MN)加入 此〉谷液中。厚度=3554 又,n= 1.489,k=0.193 實例1 0 含有9·蒽甲醇、2·羥基-4(3-三乙氧甲矽烷丙氧基)_二苯 ’、玫紅酸及茜素之吸收性s〇G之合成 在1升燒瓶中,297 g 2 -丙醇、148 g丙酮、123 g TEOS、 51·5 g MTEOS、5 g 2-羥基-4(3-三乙氧甲矽烷丙氧基)_二苯 酮、25 g 9-蒽曱醇、5 g玫紅酸、2 g茜素、〇·5599 g 〇1以硝 酸及71.90 g去離子水被組合。燒瓶被回流4小時。56 68 g丁 醇、87.99 g 2-丙醇、44.10 g丙酮、59.31 g乙醇、9_55 g去 離子水及3.75 g 10% FC 430 (3 Μ公司,明尼阿波利市, ΜΝ)加入此溶液中。厚度=31〇9又,n= 1.454,k=0.193。 實例1 1 . 含有9 -蒽羧-甲基三乙氧矽烷之吸收性SOG之合成 在1升燒瓶中,297 g2 -丙醇、148g丙酮、123g TEOS、 77 g MTEOS、30 g 9-蔥甲醇羧-曱基三乙氧矽烷、0.6 g 0· 1 Μ硝酸及72 g去離子水被組合。燒瓶被回流4小時。57 g 丁醇、88 g 2_丙醇、44 g丙酮、59 g乙醇、9.5 g去離子水 及3·7 g 10% FC 430 (3 Μ公司,明尼何波利市,MN)加入 此溶液中。厚度=301〇A,n=1.377,k=0.163。 -20- 64746-970318.doc 本紙張尺度適用中國國家標準(CNS) A4規格(210X297公釐) A7 B777 g MTEOS, 20 g 2-Phosyl-4(3-triethoxyphthalocylideneoxy)-benzophenone, 25 g 9-蒽 methanol, 5 g rosmarinic acid, 2 g brewing, 2 g 茜, 0.6 g • 1 I Xiao I and 72 g deionized water were combined. The flask was refluxed for 4 hours. g Butanol, 88 g of 2-propanol, 44 g of acetone, 59 g of ethanol, 95 § deionized water, and 3.7 g of 10/〇 FC 430 (3 Μ, Minneapolis, MN) were added to this solution. Thickness = 3554 Further, n = 1.489, k = 0.193 Example 1 0 contains 9·蒽methanol, 2·hydroxy-4(3-triethoxymethanepropaneoxy)-diphenyl', rosmarinic acid and alizarin Synthesis of Absorbing s〇G in a 1 liter flask, 297 g 2 -propanol, 148 g acetone, 123 g TEOS, 51·5 g MTEOS, 5 g 2-hydroxy-4(3-triethoxymethyl decane Oxy) benzophenone, 25 g of 9-nonanol, 5 g of rosmarinic acid, 2 g of alizarin, and 5,599 g of hydrazine 1 were combined with nitric acid and 71.90 g of deionized water. The flask was refluxed for 4 hours. 56 68 g butanol, 87.99 g 2-propanol, 44.10 g acetone, 59.31 g ethanol, 9_55 g deionized water and 3.75 g 10% FC 430 (3 Μ, Minneapolis, ΜΝ) were added to this solution. . Thickness = 31 〇 9 again, n = 1.454, k = 0.193. Example 1 1. Synthesis of an absorbent SOG containing 9-fluorene carboxy-methyltriethoxy decane in a 1 liter flask, 297 g of 2-propanol, 148 g of acetone, 123 g of TEOS, 77 g of MTEOS, 30 g of 9-onion methanol Carboxy-mercaptotriethoxysilane, 0.6 g of 0·1 decanoic acid and 72 g of deionized water were combined. The flask was refluxed for 4 hours. 57 g butanol, 88 g 2-propanol, 44 g acetone, 59 g ethanol, 9.5 g deionized water and 3·7 g 10% FC 430 (3 Μ, Minneapolis, MN) In solution. Thickness = 301 〇 A, n = 1.377, k = 0.163. -20- 64746-970318.doc This paper size is applicable to China National Standard (CNS) A4 specification (210X297 mm) A7 B7

1298823 實例1 2 含有9 -蒽甲醇之吸收性s〇g之合成 在 1 升:^ 瓶中,297 g2 -丙醇、i48g丙酮、i23g TEOS、 77 g MTEOS 10 g 9 -蒽甲醇被組合。溶液被回流6小時。 0.6 g 0·1 Μ硝酸與72 g去離子水之混合物加入燒瓶中。燒 瓶被回流4小時。57g丁醇、88g2_丙醇、44 g丙酮、 乙醇、9.5 g去離子水及3·75 g 1〇% FC 43〇 (3 M公司,明尼 阿波利市’ Μ N )加入此溶液中。 實例1 3 含有9 -慈羧-甲基三乙氧矽烷之吸收性s〇g之合成 在1升燒瓶中,297 g 2 -丙醇、148 g丙酮、90 g TMOS、 59 g MTMOS、60 g 9-蒽羧·甲基三乙氧矽烷、〇 6 g 〇」M 硝Ssl及72 g去離子水被組合。燒瓶被回流4小時。11 5羟丁 醇、488 g 2-丙醇、245 g丙酮、329 g乙醇、53 g去離子水 及3.8 g 10% FC 430 (3 M公司,明尼阿波利市,MN)加入 此溶液中。 實例1 4 9 -蒽羧-甲基三乙氧矽烷之合成 在2升燒瓶中,已在4又分子篩上乾燥之9〇.〇 g 9_蒽羧酸、 86.0亳升氯甲基三乙氧矽烷、66毫升三乙胺及ι·25 [曱基 異丁醇(MIBK)被攪拌,緩慢加熱以回流並回流8.5小時。 溶液轉送至2xL Teflon瓶並留下隔夜。大量固態沈澱物形 成。MIBK溶液被潷析並旋轉蒸發至約20〇 g。加入等量之 己烧並混合。沈澱物形成。製備具2〇%乙酸乙酯/8〇%.己烧 64746-970318.doc 本紙張尺度適用中國國家標準(CNS) A4規格(210X 297公嫠) A7 B7 1298823 五、發明説明(19 ) 漿液之1.75吋徑X 2吋高矽膠管柱。MIBK/己烷溶液在壓力 下通過管枉,用800亳升20%乙酸乙醋/ 8〇〇/0己烷洗滌管 柱。將溶液過濾至0.2 /zm並旋轉蒸發。當溶劑停止進行 時’溫度升至3 5 °C歷6 0分鐘。可得深琥珀色油狀液態產物 (85 g) 〇 實例1 5 含有9 -蒽羧-甲基三乙氧矽烧之吸收性s〇g之合成 在1升燒瓶中’297 g (4.798莫耳)、2-丙醇、148 g (2.558 莫耳)丙酮、123 g (0.593 莫耳)TEOS、77 g (0.432 莫耳) MTEOS、45 g (0.102莫耳)9-蒽羧-甲基三乙氧矽烷、〇 6 g 0.1 Μ硝酸及72 g (3.716莫耳)去離子水被組合。燒瓶被回 流4小時。43 g (0.590莫耳)丁醇及1260 g (8·344莫耳)乳酸 乙酯加入此溶液中。厚度=1156 乂,η=ι·5〇2,k=0.446 實例1 6 含有9 -蒽羧-甲基三乙氧矽烷之吸收性s〇g之合成 在1升燒瓶中,297 g (4·798莫耳)、2-丙醇、148 g (2.558 莫耳)丙酮、123 g (〇·593 莫耳)TEOS、77 g (0.432 莫耳) MTEOS、30 g (0.102莫耳)9·蒽羧-甲基三乙氧矽烷、〇 6 g 0·1 Μ硝馱及72 g (3.716莫耳)去離子水被組合。燒瓶被回 流4小時。57 g (0.769莫耳)丁醇、88 g (1·422莫耳)2_丙 醇、44 g (0.758莫耳)丙酮、59 g (1 227莫耳)乙醇、9 5 g(0.528莫耳)去離子水及3 7 g 1〇% FC 43〇加入此溶液中。 厚度=1385 又,n=1.324,k=0.533。 實例1 7 64746-970318.doc1298823 Example 1 2 Synthesis of absorbable s〇g containing 9-mercaptoethanol In a 1 liter: ^ bottle, 297 g of 2-propanol, i48 g of acetone, i23 g of TEOS, 77 g of MTEOS 10 g of 9-indole methanol were combined. The solution was refluxed for 6 hours. A mixture of 0.6 g of 0·1 nitric acid and 72 g of deionized water was added to the flask. The flask was refluxed for 4 hours. 57 g of butanol, 88 g of 2-propanol, 44 g of acetone, ethanol, 9.5 g of deionized water, and 3.75 g of 1% by weight of FC 43 (3 M Company, Minneapolis's Μ N) were added to this solution. Example 1 3 Synthesis of Absorbing s〇g Containing 9-Ci Carboxy-Methyltriethoxyoxane In a 1 liter flask, 297 g 2 -propanol, 148 g acetone, 90 g TMOS, 59 g MTMOS, 60 g 9-oxime carboxymethyltriethoxy decane, 〇6 g 〇"M nitrate Ssl and 72 g deionized water were combined. The flask was refluxed for 4 hours. 11 5 hydroxybutanol, 488 g 2-propanol, 245 g acetone, 329 g ethanol, 53 g deionized water and 3.8 g 10% FC 430 (3 M Company, Minneapolis, MN) were added to this solution. . Example 1 Synthesis of 4 9 -fluorene carboxy-methyltriethoxy decane In a 2 liter flask, 9 〇g 9 蒽 carboxylic acid, 86.0 liters of chloromethyltriethoxylate, which had been dried on a 4 molecular sieve. Hydrane, 66 ml of triethylamine and ι·25 [mercaptoisobutanol (MIBK) were stirred, heated slowly to reflux and reflux for 8.5 hours. The solution was transferred to a 2xL Teflon bottle and left overnight. A large amount of solid precipitate is formed. The MIBK solution was decanted and rotary evaporated to approximately 20 〇 g. Add the same amount of simmer and mix. A precipitate formed. Preparation with 2〇% ethyl acetate / 8〇%. hexane 64746-970318.doc This paper scale applies to China National Standard (CNS) A4 specification (210X 297 metric tons) A7 B7 1298823 V. Description of invention (19) Slurry 1.75 X diameter X 2 吋 high 矽 hose column. The MIBK/hexane solution was passed through a tube under pressure and the column was washed with 800 liters of 20% ethyl acetate / 8 〇〇 / 0 hexane. The solution was filtered to 0.2 /zm and rotary evaporated. When the solvent stopped, the temperature rose to 35 ° C for 60 minutes. A dark amber oily liquid product (85 g) is obtained. Example 1 5 Synthesis of 9-蒽carboxy-methyltriethoxy oxime absorption s〇g in a 1 liter flask '297 g (4.798 mol) ), 2-propanol, 148 g (2.558 mol) acetone, 123 g (0.593 mol) TEOS, 77 g (0.432 mol) MTEOS, 45 g (0.102 mol) 9-fluorene carboxy-methyl triethyl Oxane, 〇6 g 0.1 Μ nitric acid and 72 g (3.716 mol) deionized water were combined. The flask was refluxed for 4 hours. 43 g (0.590 mol) butanol and 1260 g (8·344 mol) of ethyl lactate were added to this solution. Thickness = 1156 乂, η = ι·5〇2, k = 0.446 Example 1 6 Synthesis of Absorbent s〇g containing 9-fluorene carboxy-methyltriethoxy decane In a 1 liter flask, 297 g (4· 798 mol), 2-propanol, 148 g (2.558 mol) acetone, 123 g (〇·593 mol) TEOS, 77 g (0.432 mol) MTEOS, 30 g (0.102 mol) 9·蒽carboxyl Methyltriethoxyoxane, 〇6 g 0·1 ΜNitrate and 72 g (3.716 mol) deionized water were combined. The flask was refluxed for 4 hours. 57 g (0.769 mol) butanol, 88 g (1·422 mol) 2_propanol, 44 g (0.758 mol) acetone, 59 g (1 227 mol) ethanol, 9 5 g (0.528 mol) Deionized water and 3 7 g of 1〇% FC 43〇 were added to this solution. Thickness = 1385 Again, n = 1.324, k = 0.533. Example 1 7 64746-970318.doc

A7 B7 1298823 五、發明説明(20 ) 含有9 -蒽羧-甲基三乙氧矽烷之吸收性s〇G之合成 在1升燒瓶中,297 g (4.798莫耳)、2-丙醇、148 g (2.558 莫耳)丙酮、123 g (0.593 莫耳)TEOS、77 g (0.432 莫耳) MTEOS、45 (0.102莫耳)9·蒽羧-甲基三乙氧矽烷、〇 6 § 0·1 Μ硝酸及72 g (3.716莫耳)去離子水被組合。燒瓶被回 流4小時。43 g (0.590莫耳)丁醇及981 g (8 3〇1莫耳)丙醇 一對加此溶液中。厚度=1407又,η=1·334,k=〇551。 實例1 8 含有9 -蒽魏-甲基三乙氧矽烧之吸收性s〇G之合成 一没有氮氣入口、乾冰冷凝器及機械攪拌器之6xL加套 反應器裝入5000 mL己烷、720 mL乙醇、65 mL水及12〇 g 10重量%氣化四丁銨水合物溶液於水中。混合物在2 5它下 以攪拌均衡0.5小時。三氯矽烷(377·4 g,2.78莫耳)、曱基 三氣矽烷(277.7 g,1·86莫耳)及9_蒽羧_甲基三乙氧矽烷 (203.8 g,0.46莫耳)之混合物加入使用蠕動泵之反應器内 歷7 0分鐘。當矽烷與吸收性化合物之加成完成時,己烷被 泵抽過線歷1 0分鐘。攪拌反應2·3小時,除去乙醇/Η" 層,然後殘餘己烷溶液經3微米(/Zm)濾器,然後1//m濾器 過濾。(3957 g,45·92莫耳)己烷加入此溶液中。 實例1 9 含有9 -蒽羧-甲基三乙氧石夕烧之吸收性s〇g之合成 在5升燒瓶中’508.8 g (3.10莫耳)三乙氧矽烧(HTEOS)、 135.8g(0.31莫耳)9 -蒽羧·甲基三乙氧矽烷及5〇88g(8.77 莫耳)丙酮係藉磁性攪拌混合並冷卻至2〇〇c以下。5〇8 8 g 64746-970318.doc _23_ 本紙張尺度適用中國國家標準(CNS) A4規格(210X297公董) A7 B7 1298823 五、發明説明(21 ) (8.77莫耳)丙_、46.69 §(2.59莫耳112〇,〇〇〇〇9莫耳·^ 〇.〇2 N硝酸及37.03 g (2.06莫耳)去離子水之混合物透過^ 液漏斗緩慢加入5升燒瓶中混合物内歷4 5分鐘,保持溫度 在20°C以下。溶液被回流8小時。4631 g (3〇 67莫耳 乙酯加入此溶液内。 實例2 0 含有本基二乙氧石夕烧之吸收性gj〇G之合成 在1升燒瓶中,297 g (4.798莫耳)、2-丙醇、148 g (2 558 莫耳)丙酮、123 g (0.593 莫耳)TEOS、104 g (0·432莫耳)苯 基三乙氧矽烷、0.6 g 0.1 Μ硝酸及72 g (3.716莫耳)去離子 水被組合。燒瓶被回流4小時。57 g (〇 769莫耳)丁醇、Μ g (1.422莫耳)2-丙醇、44 g (0.758莫耳)丙酮、59 g (1 227 莫耳)乙醇、9·5 g (〇·528莫耳)去離子水加入此溶液中。厚 度=1727Α,η=1·957,k=0.384。 實例2 1 含有苯基三乙氧矽烷之吸收性8〇〇之合成 在1升燒瓶中,297 g (4.798莫耳)、2-丙醇、148 g (2.558 莫耳)丙酮、93 g (0.448 莫耳)TEOS、37 g (0.209 莫耳) MTEOS、100g(0.418莫耳)苯基三乙氧矽烷、〇 6g〇 ^撾硝 酸及72 g (3.716莫耳)去離子水被組合。燒瓶被回流4小 時。57 g (0.769莫耳)丁醇、88 g (1 422莫耳)2;醇、44 g (0.758莫耳)丙酮、59 g (1.227莫耳)乙醇、9·5 g (0·528莫耳) 去離子水加入此溶液中。厚度=1325又14.923,k=0.364。 實例2 2 64746-970318.docA7 B7 1298823 V. INSTRUCTIONS (20) Synthesis of Absorbent s〇G containing 9-fluorene carboxy-methyltriethoxy decane in a 1 liter flask, 297 g (4.798 mol), 2-propanol, 148 g (2.558 mol) acetone, 123 g (0.593 mol) TEOS, 77 g (0.432 mol) MTEOS, 45 (0.102 mol) 9 · 蒽 carboxy-methyl triethoxy decane, 〇 6 § 0·1 Niobium nitrate and 72 g (3.716 mol) of deionized water were combined. The flask was refluxed for 4 hours. 43 g (0.590 mol) butanol and 981 g (8 3 〇 1 mol) propanol are added to this solution. Thickness = 1407 and η = 1 334, k = 〇 551. Example 1 8 Synthesis of Absorbing s〇G containing 9-fluorene-methyl-triethoxy oxime-- A 6xL jacketed reactor without nitrogen inlet, dry ice condenser and mechanical stirrer was charged with 5000 mL of hexane, 720 mL ethanol, 65 mL water and 12 〇g 10% by weight vaporized tetrabutylammonium hydrate solution in water. The mixture was equilibrated under a pressure of 0.5 for 0.5 hours. Trichloromethane (377·4 g, 2.78 mol), mercaptotrioxane (277.7 g, 1.86 mol) and 9-蒽carboxy-methyltriethoxydecane (203.8 g, 0.46 mol) The mixture was added to the reactor using a peristaltic pump for 70 minutes. When the addition of decane to the absorbing compound is complete, hexane is pumped through the line for 10 minutes. The reaction was stirred for 2.3 hours, the ethanol/Η" layer was removed, and the residual hexane solution was passed through a 3 micron (/Zm) filter and then filtered through a 1//m filter. (3957 g, 45·92 mol) hexane was added to this solution. Example 1 9 Synthesis of Absorbent s〇g containing 9-fluorene carboxy-methyltriethoxylate in a 5 liter flask '508.8 g (3.10 mol) triethoxy oxime (HTEOS), 135.8 g ( 0.31 moles of 9-fluorene carboxymethyltriethoxy decane and 5 〇 88 g (8.77 moles) of acetone were mixed by magnetic stirring and cooled to 2 〇〇c or less. 5〇8 8 g 64746-970318.doc _23_ This paper scale applies to China National Standard (CNS) A4 specification (210X297 dongdong) A7 B7 1298823 V. Invention description (21) (8.77 Moer) C _, 46.69 § (2.59 Moir 112 〇, 〇〇〇〇9 莫·^ 〇.〇2 N nitric acid and 37.03 g (2.06 mol) deionized water mixture was slowly added to the mixture in a 5 liter flask through a liquid funnel for 45 minutes. Keep the temperature below 20 ° C. The solution was refluxed for 8 hours. 4631 g (3 〇 67 moles of ethyl ester was added to the solution. Example 2 0 The synthesis of the absorption gj〇G containing the base diethoxylate In a 1 liter flask, 297 g (4.798 mol), 2-propanol, 148 g (2 558 mol) acetone, 123 g (0.593 mol) TEOS, 104 g (0·432 mol) phenyl triethyl Oxy decane, 0.6 g 0.1 Μ nitric acid and 72 g (3.716 mol) of deionized water were combined. The flask was refluxed for 4 hours. 57 g (〇769 mol) butanol, Μ g (1.422 mol) 2-propanol 44 g (0.758 mol) acetone, 59 g (1 227 mol) ethanol, 9·5 g (〇·528 mol) deionized water was added to the solution. Thickness = 1727 Α, η = 1 957, k =0.384. Example 2 1 Absorption of phenyltriethoxyoxane 8 合成 in a 1 liter flask, 297 g (4.798 moles), 2-propanol, 148 g (2.558 moles) of acetone, 93 g (0.448 moles) TEOS, 37 g (0.209 mol) MTEOS, 100 g (0.418 mol) phenyl triethoxy decane, hydrazine 6 g hydrazine nitric acid and 72 g (3.716 mol) deionized water were combined. The flask was refluxed for 4 hours. 57 g (0.769 mol) butanol, 88 g (1 422 mol) 2; alcohol, 44 g (0.758 mol) acetone, 59 g (1.227 mol) ethanol, 9·5 g (0·528 mol) Deionized water was added to the solution. Thickness = 1325 and 14.923, k = 0.364. Example 2 2 64746-970318.doc

12988231298823

含有苯基三乙氧矽烷之吸收性S0G之合成 在1升燒瓶中,297 g (4.798莫耳)、2-丙醇、148 g (2 558 莫耳)丙酮、119 g (0.573 莫耳)TE〇s、27 g (〇153莫耳) MTEOS、74 g (0.306莫耳)苯基三乙氧我、〇 6 g ^ 酸及72 g (3.716莫耳)去離子水被組合。燒瓶被回流4小 時。57 g (0.769莫耳)丁醇、88 g (1 422莫耳)2_丙醇、料g (0.758莫耳)丙酮、59 g (1.227莫耳)乙醇、9.5 g (0.528莫耳) 去離子水加入此溶液中。厚度=1286又,n=1.889,卜〇286。 實例2 3 含有苯基三乙氧矽烷之吸收性S〇g之合成 在1升燒瓶中,297 g (4.798莫耳)、2-丙醇、148 g (2.558 莫耳)丙酮、73 g (0.351 莫耳)TEOS、45 g (0.251 莫耳) MTEOS、121 g (0.503莫耳)苯基三乙氧矽烷、〇 6 g 〇」]^硝 酸及72 g (3·716莫耳)去離子水被組合。燒瓶被回流4小 時。57 g (0.769莫耳)丁醇、88 g (1.422莫耳)2-丙醇、44 g (0.758莫耳)丙酮、59 g (1.227莫耳)乙醇、9.5 g (0.528莫耳) 去離子水加入此溶液中。厚度=1〇47又,n=1 993,k=〇 378。 實例2 4 含有苯基三乙氧矽烷與2-羥基-4(3-三乙氧甲矽烷丙氧 基)-二苯酮之吸收性SOG之合成 在1升燒瓶中,297 g (4.798莫耳)、2 -丙醇、148 g (2_558 莫耳)丙酮、73 g (〇·351 莫耳)TEOS、45 g (0.251 莫耳) MTEOS、103 g (0.428莫耳)苯基三乙氧矽烷、12 g (0.0298 莫耳)2 -羥基-4(3-三乙氧甲矽烷丙氧基)-二苯酮、0.6 g -25- 64746-970318.doc 本紙張尺度適用中國國家標準(CNS) A4規格(210X 297公釐) 1298823 ________B7 五、發明説明(23 ) 〇&1 Μ硝酸及72 g (3.716莫耳)去離子水被組合。燒瓶被回 小時。57 g (0.769莫耳)丁醇、88 g (1.422莫耳)丙 醇、44 g (0.758莫耳)丙酮、59 g (1 227莫耳)乙醇、9·5 g (〇_528莫耳)去離子水加入此溶液中。厚度=isi4又, n=1.969,k=0.325。 雖然本發明已參照特殊例說明,其說明僅為本發明應用 之實例而不應視為限制性。所揭示實例之特性之各種修正 及組合在下列中請專利範圍所界定之本發明範圍内。 64746-970318.docSynthesis of Absorbent SOG Containing Phenyltriethoxyoxane in a 1 liter flask, 297 g (4.798 moles), 2-propanol, 148 g (2 558 moles) of acetone, 119 g (0.573 moles) TE 〇s, 27 g (〇153 mol) MTEOS, 74 g (0.306 mol) phenyl triethoxy I, 〇6 g ^ acid and 72 g (3.716 mol) deionized water were combined. The flask was refluxed for 4 hours. 57 g (0.769 mol) butanol, 88 g (1 422 mol) 2_propanol, feed g (0.758 mol) acetone, 59 g (1.227 mol) ethanol, 9.5 g (0.528 mol) deionized Water is added to this solution. Thickness = 1286 and n = 1.889, divination 286. Example 2 3 Synthesis of Absorbent S〇g Containing Phenyltriethoxyoxane In a 1 liter flask, 297 g (4.798 mol), 2-propanol, 148 g (2.558 mol) acetone, 73 g (0.351 Mole) TEOS, 45 g (0.251 mol) MTEOS, 121 g (0.503 mol) phenyl triethoxy decane, 〇6 g 〇"] nitric acid and 72 g (3·716 mol) deionized water combination. The flask was refluxed for 4 hours. 57 g (0.769 mol) butanol, 88 g (1.422 mol) 2-propanol, 44 g (0.758 mol) acetone, 59 g (1.227 mol) ethanol, 9.5 g (0.528 mol) deionized water Add to this solution. Thickness = 1 〇 47 again, n = 1 993, k = 378 378. Example 2 4 Synthesis of Absorbent SOG Containing Phenyltriethoxyoxane with 2-Hydroxy-4(3-Triethoxycarbonylpropoxy)-benzophenone In a 1 liter flask, 297 g (4.798 mol) ), 2-propanol, 148 g (2_558 mol) acetone, 73 g (〇·351 mol) TEOS, 45 g (0.251 mol) MTEOS, 103 g (0.428 mol) phenyl triethoxy decane, 12 g (0.0298 mol) 2 -hydroxy-4(3-triethoxymethanepropaneoxy)-benzophenone, 0.6 g -25- 64746-970318.doc This paper scale applies to the Chinese National Standard (CNS) A4 Specifications (210X 297 mm) 1298823 ________B7 V. INSTRUCTIONS (23) 〇&1 Μ Nitric acid and 72 g (3.716 mol) deionized water are combined. The flask was returned to the hour. 57 g (0.769 mol) butanol, 88 g (1.422 mol) propanol, 44 g (0.758 mol) acetone, 59 g (1 227 mol) ethanol, 9·5 g (〇_528 mol) Deionized water is added to this solution. Thickness = isi4 again, n = 1.969, k = 0.325. Although the present invention has been described with reference to the specific examples, the description is merely illustrative of the application of the invention and should not be construed as limiting. Various modifications and combinations of the features of the disclosed examples are within the scope of the invention as defined by the appended claims. 64746-970318.doc

Claims (1)

1298823 A8 B8 C8 D8 六、申請專利範園 1 · 一種吸收性旋塗玻璃組合物,其包含石夕氧炫聚合物與可 混合有機吸收性化合物,其可在至少約i 0 nm寬波長範 圍’在波長低於約375 nm之範圍強烈吸收光線,其中有 機吸收性化合物包含一至三個笨環及一反應性基,該反 應性基係選自由羥基、胺基、羧酸基及以矽鍵結至至少 一個選自烧氧基及鹵原子所組成之群之取代基之甲矽燒 基所組成之群。 2 ·根據申請專利範圍第1項之組合物,其中範圍為低於約 260 nm之波長。 3 ·根據申請專利範圍第1項之組合物,其中有機吸收性化合 物包含一反應性基,該反應性基係選自矽乙氧基、矽二 乙氧基、矽三乙氧基、矽甲氧基、矽二甲氧基、矽三甲 氧基、氣甲矽烷基、二氯曱矽烷基及三氣曱矽烷基所組 成之群。 · 根據申請專利範圍第Ί項之組合物,其中有機吸收性化合 物包含矽三乙氧反應性基。 其中反應性基係直接 其中反應性基透過烴 根據申請專利範圍第1項之組合物, 鍵結至苯環。 6 ·根據申請專利範圍第1項之組合物 橋接附至苯環。 7·根據申請專利範圍第!項之組合物,其中有機吸收性化合 物進一步包含偶氮基。 8. 根據申請專利範圍第7項之組合物,其中有機 物包含吸收性化合物,其係選自2,心二 吸收性化合 羥蒽醌酸 64746-970318.doc1298823 A8 B8 C8 D8 VI. Patent Application 1 · An absorbent spin-on glass composition comprising an anthraquinone polymer and a miscible organic absorbing compound which can be in a wide wavelength range of at least about i 0 nm The light is strongly absorbed in a range of wavelengths below about 375 nm, wherein the organically absorbable compound comprises from one to three stupid rings and a reactive group selected from the group consisting of hydroxyl groups, amine groups, carboxylic acid groups, and hydrazine linkages. a group consisting of at least one formazan group selected from the group consisting of a group of alkoxy groups and halogen atoms. 2. A composition according to the scope of claim 1 wherein the range is less than about 260 nm. 3. The composition according to claim 1, wherein the organic absorbing compound comprises a reactive group selected from the group consisting of ruthenium ethoxylate, ruthenium diethoxy, ruthenium triethoxy, and armor. A group consisting of an oxy group, a decyldimethoxy group, a ruthenium trimethoxy group, a gas methyl sulfonyl group, a chlorinated alkyl group, and a trihaloalkylene group. The composition of claim 3, wherein the organically absorbable compound comprises a ruthenium triethoxy reactive group. Wherein the reactive group is directly wherein the reactive group is permeated through the hydrocarbon. According to the composition of claim 1, the bond is bonded to the benzene ring. 6 · The composition according to item 1 of the patent application is bridged to the benzene ring. 7. According to the scope of the patent application! The composition of the invention, wherein the organic absorbent compound further comprises an azo group. 8. The composition according to claim 7, wherein the organic substance comprises an absorbent compound selected from the group consisting of 2, a heart-absorbable hydroxamic acid 64746-970318.doc 1298823 A8 B8 C8 D8 六、申請專利範園 (anthraflavic acid)、9-蒽羧酸、9-蒽甲醇、茜 素、S昆茜、櫻草靈、2 -羥基·4(3-三乙氧甲矽烷丙氧 基)-二苯酮、玫紅酸、三乙氧甲矽烷丙基义^莕亞胺、 9 -蒽幾-甲基三乙氧矽烷、苯墓三乙氧矽烷、4_苯基偶 氮酚及其混合物所組成之群。 9. 根據申請專利範圍第1項之組合物,其中有機吸收性化合 物包含吸收性化合物,其係選自9 _蒽甲醇、茜素、醌 茜、2 -羥基-4(3-三乙氧甲矽烷丙氧基卜二苯酮、玫紅 酉义9 -蒽竣-甲基二乙氧石夕烧、苯基三乙氧石夕烧及其混 合物所組成之群。 10. 根據申请專利範圍弟9項之組合物,其中有機吸收性化合 物包含9 -惠觀_甲基三乙氧發烧。 11. 根據申請專利範圍第9項之組合物,其中有機吸收性化合 物包含苯基三乙氧矽烷。 12. 根據申請專利範圍第i項之組合物,其中矽氧烷聚合物為 一種聚合物,其係選自曱基矽氧烷、曱基矽倍半氧烷、 苯基矽氧烷、苯基矽倍半氧烷、曱基苯基矽氧烷、曱基 苯基矽倍半氧烷及矽酸鹽聚合物所組成之群。 土 13. 根據中請專利範圍第1G項之組合物,其中妙氧烧聚合物 為一種聚合物,選自曱基矽氧烷、甲基矽倍半氧烷、苯 基石夕氧燒、苯基㈣半氧院、甲基苯基梦氧院、^基苯 基矽倍半氧烷及矽酸鹽聚合物所組成之群。 土 14. 根據申請專利範圍第i項之組合物,其中矽氧烷聚合 -種選自氫矽氧烷、氫矽倍半氧烷、有機氫化矽氧烷及 64746-970318.doc1298823 A8 B8 C8 D8 VI. Application for patented garden (anthraflavic acid), 9-anthracene carboxylic acid, 9-anthracene methanol, alizarin, S Kunyu, primrose, 2-hydroxy-4 (3-triethoxy) Decanepropoxy)-benzophenone, rosacenic acid, triethoxymethyl decyl propyl imine, 9-fluorenyl-methyl triethoxy decane, benzene tomb triethoxy decane, 4 phenyl a group of azophenols and mixtures thereof. 9. The composition according to claim 1, wherein the organic absorbing compound comprises an absorbing compound selected from the group consisting of 9 蒽 methanol, alizarin, hydrazine, 2-hydroxy-4 (3-triethoxy) a group consisting of decane propoxy benzophenone, rose quinone 9-indole-methyl diethoxylate, phenyl triethoxylate and a mixture thereof. The composition of claim 9, wherein the organic absorbing compound comprises a ninth oxime-methyl ethoxy oxime. 11. The composition according to claim 9 wherein the organic absorbing compound comprises phenyltriethoxy decane. 12. The composition according to claim ii, wherein the siloxane polymer is a polymer selected from the group consisting of mercapto oxiranes, mercapto sesquioxanes, phenyl siloxanes, benzenes. a group consisting of sesquioxanes, nonylphenyl sulfoxane, nonylphenyl sesquioxanes, and phthalate polymers. Soil 13. According to the composition of claim 1G of the patent scope, Wherein the oxy-oxygenated polymer is a polymer selected from the group consisting of mercaptooxynonane, methyl sesquioxanes, and phenyl groups. a group consisting of Shixi Oxygen, phenyl (tetra) hemioxide, methyl phenyl oxymethane, phenyl sulfonium sesquioxane and bismuth silicate polymers. Soil 14. According to the scope of application patent item i a composition wherein the siloxane is polymerized from the group consisting of hydroquinone, hydroquinone sesquioxane, organohydrogenated oxane, and 64746-970318.doc 12988231298823 有機氫化矽倍半氧烷聚合物所組成之群之聚合物;及一 種氫矽倍半氧烷與烷氧氫化矽氧烷或羥基氫化矽氧烷之 共聚物。 15.根據中請專利範圍第14項之組合物,其切氧烧聚合物 為選自以下通式所組成之群之聚合物: 2·0)χ,其中 X 大於約 8,及(H(M 〇Si〇i 5 2 〇)n(R〇 i 〇Si〇ia polymer of a group consisting of an organic hydrogenated sesquioxane polymer; and a copolymer of hydroquinone sesquioxane with an alkoxy hydride or a hydroxyhydrogen hydride. 15. The composition of claim 14, wherein the oxy-fired polymer is a polymer selected from the group consisting of: 2·0) χ, wherein X is greater than about 8, and (H( M 〇Si〇i 5 2 〇)n(R〇i 〇Si〇i 2.0)m,其中m大於〇,11與111之總數為約8至約5〇〇〇及R為 Ci-C2〇烧基或C6-C12芳基。 16·根據申請專利範圍第i、2、3、8、9、1〇、12或13項 之組合物’其係用於積體電路裝置。 17. —種塗佈溶液,其包含根據申請專利範圍第i項之吸收性 旋塗玻璃組合物及溶劑或溶劑混合物。 訂 18. 根據申請專利範圍第丨7項之塗佈溶液,其中溶液為約〇 5 與約2 0重1 %間吸收性旋塗玻璃組合物。 19·根據申請專利範圍第丨8項之塗佈溶液,其中溶劑選自乳 酸乙酯與丙二醇丙醚所組成之群。2.0) m, wherein m is greater than 〇, the total number of 11 and 111 is from about 8 to about 5 Å and R is a Ci-C 2 fluorenyl or C6-C12 aryl group. 16. The composition of item i, 2, 3, 8, 9, 1 , 12 or 13 of the patent application' is used in an integrated circuit device. 17. A coating solution comprising an absorbent spin-on glass composition according to item ii of the patent application and a solvent or solvent mixture. The coating solution according to item 7 of the patent application, wherein the solution is an absorbent spin-on glass composition of between about 5 and about 20% by weight. 19. The coating solution according to item 8 of the patent application, wherein the solvent is selected from the group consisting of ethyl lactate and propylene glycol propyl ether. 20.根據申請專利範圍第丨7項之塗佈溶液,其係用於一裝 置。 . 、 21·根據申請專利範圍第2 〇項之塗佈溶液,其中塗佈溶液包 括約1 %與約2 〇重量❶間吸收性旋塗玻璃組合物。 22·根據申請專利範圍第2丨項之塗佈溶液,其中至少部份旋 塗玻璃組合物可被選擇性移除。 23· —種含有吸收性旋塗玻璃組合物之薄膜,該組合物包含 石夕氧烧聚合物與可混合有機吸收性化合物,其可在至少 64746-970318.doc 1298823 - C8 _;___D8 六、申請專利範圍~^ 龜 約10 nm寬波長範圍,在波長低於約375 nm之範圍強烈 吸收光線’其中有機吸收性化合物包含一至三個苯環及 一反應性基,該反應性基係選自由羥基、胺基、羧酸基 及以矽鍵結至至少一個選自烷氡基及_原子所組成之群 之取代基之甲矽烷基所組成之群。 24·根據申請專利範圍第23項之薄膜,其中範圍為低於約26〇 nm之波長。 25. 根據申請專利範圍第23項之薄膜,其中有機吸收性化合 物包含吸收性化合物,其係選自2,6-二羥蒽酿酸、9 _惠 羧酸、9 _蒽甲醇、茜素、醌茜、櫻草靈、2 -羥基·4(3-二乙氧甲石夕烧丙氧基)-二苯酮、玫紅酸、三乙氧甲石夕 烷丙基-1,8-莕亞胺、9-蒽羧-甲基三乙氧矽烷及其混合 物所組成之群。 26. 根據申請專利範圍第23項之薄膜,其中有機吸收性化合 物包含吸收性化合物,其係選自9 _蒽甲醇、茜素、酉昆 茜、櫻草靈、2 -羥基-4(3-三乙氧甲矽烷丙氧基卜二苯 酮、玫紅酸、9-蒽羧·甲基三乙氧矽烷及其混合物所組 成之群。 27. 根據申請專利範圍第23項之薄膜,其中有機吸收性化合 物包含9 -蒽羧-甲基三乙氧矽烷。 28. 根據申請專利範圍第23項之薄膜,其中石夕氧烷聚合物為 一種聚合物,包括甲基矽氧烷、甲基矽倍半氧烷、甲基 苯基矽氧烷、苯基矽氧烷、甲基苯基矽倍半氧烷及矽ς 鹽聚合物。 64746-970318.doc20. A coating solution according to item 7 of the patent application, which is for use in a device. The coating solution according to claim 2, wherein the coating solution comprises about 1% by weight and about 2% by weight of the bismuth absorbent spin-on glass composition. 22. The coating solution of claim 2, wherein at least a portion of the spin-on glass composition is selectively removable. 23. A film comprising an absorbent spin-on glass composition comprising an agglomerated polymer and a miscible organically absorbable compound, which may be at least 64746-970318.doc 1298823 - C8 _;___D8 Patent application scope ~^ The turtle has a wide wavelength range of about 10 nm and strongly absorbs light in a wavelength range of less than about 375 nm. The organic absorbing compound contains one to three benzene rings and a reactive group selected from a group consisting of a hydroxyl group, an amine group, a carboxylic acid group, and a methoxyalkyl group bonded to at least one substituent selected from the group consisting of an alkano group and a _ atom. 24. A film according to claim 23, wherein the range is less than about 26 〇 nm. 25. The film according to claim 23, wherein the organic absorbing compound comprises an absorbing compound selected from the group consisting of 2,6-dihydroxy phthalic acid, 9 _ carboxylic acid, 9 蒽 蒽 methanol, 茜 、, Bismuth, primrose, 2-hydroxy·4(3-diethoxymethylglycolate)-benzophenone, rosacenic acid, triethoxymethyl ketone propyl 1,8-anthracene A group of imines, 9-fluorene carboxy-methyltriethoxy decane, and mixtures thereof. 26. The film according to claim 23, wherein the organic absorbing compound comprises an absorbing compound selected from the group consisting of 9 蒽 蒽 methanol, 茜 酉, 酉 茜 茜, primula, 2-hydroxy-4 (3- a group consisting of triethoxymethane propane benzophenone, rosmarinic acid, 9-fluorene carboxymethyltriethoxy decane, and mixtures thereof. 27. A film according to claim 23, wherein the organic The absorbing compound comprises 9-fluorene carboxy-methyltriethoxy decane. 28. The film according to claim 23, wherein the oxaxy oxane polymer is a polymer comprising methyl decane, methyl hydrazine. Silsesquioxanes, methyl phenyl siloxanes, phenyl siloxanes, methyl phenyl sesquioxanes and strontium salt polymers. 64746-970318.doc A8 B8 C8 D8 1298823 六、申請專利範圍 29.根據申請專利範圍第26項之薄膜,其中矽氧烷聚合物為 一種聚合物,包括曱基矽氧烷、甲基矽倍半氧烷、甲基 苯基矽氧烷、苯基矽氧烷、甲基苯基砍倍半氧烷及矽^ 鹽聚合物。 30·根據申請專利範圍第23項之薄膜,其中至少部份旋塗玻 璃組合物可被選擇性移除。 31.根據申請專利範圍第2 3項之薄膜,其中至少一個苯環包 括二或三個稠合苯環。 32· —種薄膜,其包括含根據申請專利範圍第1項之旋塗玻璃 組合物之塗佈溶液及溶劑。 33.根據申清專利範圍第3 2項之薄膜,其中塗佈溶液包括約 1 %與約2 0重量%間吸收性旋塗玻璃組合物。 34· —種製造吸收性旋塗玻璃組合物之方法,其包括: 組合一種或多種選自烷氧矽烷與_代矽烷所組成之群 之矽烷反應物、一種或多種可混合有機吸收性化合物、 酸/水混合物及一種或多種形成反應混合物之溶劑;及 回流反應混合物以形成吸收性旋塗玻璃組合物,其中 有機吸收性化合物包含一至三個苯環及一反應性基,該 反應性基係選自由羥基、胺基、羧酸基及以矽鍵結至至 少一個選自烷氧基及齒原子所組成之群之取代基之甲矽 烷基所組成之群。 35·根據申請專利範圍第3 4項之方法,其中一種或多種有機 吸收性化合物進一步包含偶氮基。 36·根據申請專利範圍第3 5項之方法,其中一種或多種有機 64746-970318.doc 本紙張尺度適用中國國家標準(CNS) A4規格(210X297公釐) 1298823 g C8 __ D8 六、申請專利範圍 吸收性化合物包含一吸收性化合物,其係選自2,6-二經 蒽醌酸、9 -蒽羧酸、9 -蒽甲醇、茜素、醌茜、櫻草 靈、2_羥基-4(3-三乙氧甲矽烷丙氧基)-二苯酮、玫紅 酸、三乙氧甲矽烷丙基-1,8-荅亞胺、9-蒽羧-曱基三乙 氧矽烷、苯基三乙氧矽烷、4 -苯基偶氮酚及其混合物 所組成之群。 37.根據申請專利範圍第3 4項之方法,其中一種或多種石夕烧 反應物係選自三乙氧矽烷、四乙氧矽烷、甲基三乙氧石夕 烷、二甲基二乙氧矽烷、四甲氧矽烷、甲基三甲氧石夕 烷、三甲氧矽烷、二甲基二甲氧石夕烷、苯基三乙氧石夕 烷、苯基三甲氧矽烷、二苯基二乙氧矽烷及二苯基二 甲氧矽烷、三氯矽烷、曱基三氣矽烷、乙基三氣石夕 烧、苯基三氣石夕烧、四氯石夕烧、氯三乙氧碎烧、氯三 甲氧矽烷、氯甲基三乙氧矽烷、氯乙基三乙氧石夕烧、 氯苯基三乙氧矽烷、氯甲基三甲氧矽烷、氯乙基三甲 氧矽烷及氯苯基三甲氧矽烷所組成之群。 38·根據申請專利範圍第3 7項之方法,其中一種或多種石夕烧 反應物為四乙氧矽烷及甲基三乙氧矽烧。 39.根據申請專利範圍第34項之方法,其中酸/水混合物為硝 酸/水混合物。 40· —種製造吸收性旋塗玻璃組合物之方法,其包括: 組合一種或多種烧氧石夕烧,或一種或多種^代矽烷; 一種或多種可混合有機吸收性化合物;及一種或多種溶 劑以形成第一反應混合物; -6 - 64746-970318.doc 本紙張尺度適用中國國家標準(CNS) A4規格(210 X 297公釐) 1298823 A8 B8 C8 D8 六、申請專利範圍 回流第一反應混合物; 將酸/水混合物加入第一反應混合物以形成第二反應混 合物; 回流第二反應混合物以形成°灰收性旋塗玻璃組合物, 其中有機吸收性化合物包含一至三個苯環及一反應性 基,該反應性基係選自由羥基、胺基、羧酸基及以矽鍵 結至至少一個選自烧氧基及鹵原子所組成之群之取代基 之甲矽烷基所組成之群。 41· 一種製造含有吸收性旋塗玻璃聚合物之塗佈溶液之方 法,其包括: 組合一種或多種烷氧矽烷,或一種或多種_代矽烷; 一種或多種可混合有機吸收性化合物;酸/水混合物;及 一種或多種溶劑以形成反應混合物;及 回流反應混合物以形成吸收性旋塗玻璃聚合物,其中 有機吸收性化合物包含一至三個苯環及一反應性基,該 反應性基係選自由羥基、胺基、羧酸基及以矽鍵結至至 少一個選自烷氧基及鹵原子所組成之群之取代基之甲石夕 烧基所組成之群。 42.根據申請專利範圍第4 1項之方法,其進一步包括將一種 或多種稀釋溶劑加入吸收性旋塗玻璃組合物内以產生塗 佈溶液。 43·根據申請專利範圍第4 2項之方法,其中塗佈溶液為約 0.5%與約20%間吸收性旋塗玻璃聚合物。 44. 一種製造吸收性旋塗玻璃組合物之方法,其包括: 64746-970318.doc 本紙張尺度適用中國國家標準(CNS) A4規格(210 X 297公釐) 1298823 - C8 D8 _____ 六、申請專利範圍 組合極性溶劑、非極性溶劑及相轉移觸媒以形成第一 反應混合物; 將有機三鹵代矽烷、氫化_代矽烷及一種或多種可混 合有機吸收性化合物加入第一反應混合物以形成第二 反應混合物;及 讓第二反應混合物反應以形成吸收性旋塗破璃組合 物,其中有機吸收性化合物包含一至三個苯環及一反應 性基,該反應性基係選自由羥基、胺基、羧酸基及以矽 鍵結至至少一個選自烧氧基及鹵原子所組成之群之取代 基之曱矽烷基所組成之群。 45· —種有機吸收性化合物,其為9·蒽羧-甲基三乙氧矽 燒。 46· —種製造9 -蒽羧-甲基三乙氧矽烷之方法,其包括: 組合9-蒽羧酸、氯甲基三乙氧矽烷、三乙胺及溶劑以 形成反應鹿合物; 回流反應混合物; 冷卻經回流反應混合物以形成沈澱物及殘餘溶液;及 過濾殘餘溶液以產生液態9_蒽羧甲基三乙氧矽烷。 47·根據申請專利範圍第4 6項之方法,其中過濾殘餘溶液包 括: 旋轉蒸發殘餘溶液; 將經旋轉蒸發之溶液通過矽膠管柱;及 旋轉蒸發通過矽膠管柱之溶液。 64746-970318.doc 本紙張尺度適用中國國家標準(CNS) A4規格(210X297公釐)A8 B8 C8 D8 1298823 VI. Scope of application 29. The film according to claim 26, wherein the siloxane polymer is a polymer comprising mercapto oxirane, methyl sesquioxanes, methyl groups Phenyl oxirane, phenyl sulfoxane, methyl phenyl sesquioxane and bismuth salt polymers. 30. The film of claim 23, wherein at least a portion of the spin-on glass composition is selectively removable. 31. The film of claim 23, wherein at least one benzene ring comprises two or three fused benzene rings. 32. A film comprising a coating solution and a solvent comprising a spin-on glass composition according to claim 1 of the scope of the patent application. 33. The film of claim 32, wherein the coating solution comprises between about 1% and about 20% by weight of the absorbent spin-on glass composition. 34. A method of making an absorbent spin-on glass composition, comprising: combining one or more decane reactants selected from the group consisting of alkoxy decane and decane, one or more miscible organic absorbing compounds, An acid/water mixture and one or more solvents forming a reaction mixture; and refluxing the reaction mixture to form an absorbent spin-on glass composition, wherein the organically absorbable compound comprises one to three benzene rings and a reactive group, the reactive group A group consisting of a hydroxyl group, an amine group, a carboxylic acid group, and a germyl group bonded to at least one substituent selected from the group consisting of an alkoxy group and a tooth atom is selected. 35. The method of claim 34, wherein the one or more organic absorbing compounds further comprise an azo group. 36. According to the method of claim 35, one or more of the organic 64746-970318.doc This paper scale applies to the Chinese National Standard (CNS) A4 specification (210X297 mm) 1298823 g C8 __ D8 VI. Patent application scope The absorbent compound comprises an absorbent compound selected from the group consisting of 2,6-diperic acid, 9-anthracene carboxylic acid, 9-anthracene methanol, alizarin, anthraquinone, primulin, 2-hydroxy-4 ( 3-triethoxymethanepropanyloxy)-benzophenone, rosacenic acid, triethoxymethyl decyl propyl-1,8- quinone imine, 9-fluorene carboxy-fluorenyl triethoxy decane, phenyl A group consisting of triethoxy decane, 4-phenyl azophenol, and mixtures thereof. 37. The method according to claim 34, wherein one or more of the ceramsite reactants are selected from the group consisting of triethoxy decane, tetraethoxy decane, methyl triethoxy oxane, dimethyl diethoxy Decane, tetramethoxy decane, methyl methoxy sulfoxide, trimethoxy decane, dimethyl dimethoxide, phenyl triethoxy oxane, phenyl trimethoxy decane, diphenyl diethoxy Decane and diphenyl dimethoxy decane, trichloro decane, decyl trioxane, ethyl trigas sulphate, phenyl triphos, sulphur tetrachloride, chlorotriethoxy sulphur, chlorine Trimethoxy decane, chloromethyltriethoxy decane, chloroethyltriethoxylate, chlorophenyltriethoxy decane, chloromethyltrimethoxy decane, chloroethyltrimethoxy decane, and chlorophenyltrimethoxy decane The group formed. 38. The method of claim 37, wherein one or more of the smelting reactants are tetraethoxy decane and methyltriethoxy oxime. 39. The method of claim 34, wherein the acid/water mixture is a nitric acid/water mixture. 40. A method of making an absorbent spin-on glass composition, comprising: combining one or more anthracites, or one or more decanes; one or more miscible organic absorbing compounds; and one or more Solvent to form the first reaction mixture; -6 - 64746-970318.doc This paper scale applies to China National Standard (CNS) A4 specification (210 X 297 mm) 1298823 A8 B8 C8 D8 VI. Patent application scope reflux first reaction mixture Adding an acid/water mixture to the first reaction mixture to form a second reaction mixture; refluxing the second reaction mixture to form a gray-collective spin-on glass composition, wherein the organically absorbable compound comprises one to three benzene rings and a reactivity The reactive group is selected from the group consisting of a hydroxyl group, an amine group, a carboxylic acid group, and a methoxyalkyl group bonded to at least one substituent selected from the group consisting of alkoxy groups and halogen atoms. 41. A method of making a coating solution comprising an absorbent spin-on glass polymer, comprising: combining one or more alkoxydecanes, or one or more decyl decanes; one or more miscible organic absorbing compounds; acid/ a water mixture; and one or more solvents to form a reaction mixture; and refluxing the reaction mixture to form an absorbent spin-on glass polymer, wherein the organically absorbable compound comprises one to three benzene rings and a reactive group, and the reactive group is selected a group consisting of a free hydroxyl group, an amine group, a carboxylic acid group, and a ruthenium group bonded to at least one substituent selected from the group consisting of an alkoxy group and a halogen atom. 42. The method of claim 41, further comprising adding one or more diluent solvents to the absorbent spin-on glass composition to produce a coating solution. 43. The method of claim 4, wherein the coating solution is between about 0.5% and about 20% of an absorbent spin-on glass polymer. 44. A method of making an absorbent spin-on glass composition comprising: 64746-970318.doc This paper scale applies to the Chinese National Standard (CNS) A4 specification (210 X 297 mm) 1298823 - C8 D8 _____ VI. Patent application Combining a polar solvent, a non-polar solvent, and a phase transfer catalyst to form a first reaction mixture; adding an organotrihalomethane, a hydrogenated decane, and one or more miscible organic absorbing compounds to the first reaction mixture to form a second a reaction mixture; and reacting the second reaction mixture to form an absorbent spin-on glass composition, wherein the organically absorbable compound comprises one to three benzene rings and a reactive group selected from the group consisting of hydroxyl groups, amine groups, a group consisting of a carboxylic acid group and a decyl group bonded to at least one substituent selected from the group consisting of alkoxy groups and halogen atoms. 45. An organically absorbable compound which is 9 蒽 carboxy-methyltriethoxy oxime. 46. A method for producing 9-fluorene carboxy-methyltriethoxy decane, comprising: combining 9-fluorene carboxylic acid, chloromethyltriethoxy decane, triethylamine, and a solvent to form a reaction deer; The reaction mixture is cooled to reflux the reaction mixture to form a precipitate and a residual solution; and the residual solution is filtered to give a liquid 9-hydrazine carboxymethyltriethoxy decane. 47. The method according to claim 46, wherein the filtering residual solution comprises: rotary evaporation of the residual solution; passing the rotary evaporated solution through a gel column; and rotary evaporation of the solution through the gel column. 64746-970318.doc This paper size applies to China National Standard (CNS) A4 specification (210X297 mm)
TW89111272A 2000-12-07 2000-12-07 Spin-on-glass anti-reflective coatings for photolithography TWI298823B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW89111272A TWI298823B (en) 2000-12-07 2000-12-07 Spin-on-glass anti-reflective coatings for photolithography

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW89111272A TWI298823B (en) 2000-12-07 2000-12-07 Spin-on-glass anti-reflective coatings for photolithography

Publications (1)

Publication Number Publication Date
TWI298823B true TWI298823B (en) 2008-07-11

Family

ID=45069508

Family Applications (1)

Application Number Title Priority Date Filing Date
TW89111272A TWI298823B (en) 2000-12-07 2000-12-07 Spin-on-glass anti-reflective coatings for photolithography

Country Status (1)

Country Link
TW (1) TWI298823B (en)

Similar Documents

Publication Publication Date Title
TWI308585B (en) Spin-on-glass anti-reflective coatings for photolithography
TWI304833B (en) Spin-on-glass anti-reflective coatings for photolithography
KR100804873B1 (en) Spin-on-glass anti-reflective coatings for photolithography
US8889334B2 (en) Spin-on anti-reflective coatings for photolithography
KR100804870B1 (en) Absorbing compounds for spin-on glass anti-reflective coatings for photolithography
TWI449756B (en) Silsesquioxane resins
KR100818678B1 (en) Spin-On Glass Anti-Reflective Coatings For Photolithography
TWI298823B (en) Spin-on-glass anti-reflective coatings for photolithography
JP2011221549A (en) Spin-on anti-reflection film for photo-lithography
TWI260330B (en) Spin-on-glass anti-reflective coatings for photolithographyd
KR100917241B1 (en) Spin-on anti-reflective coatings for photolithography
JP2009280822A (en) Spin-on glass antireflective coating for photolithography
JP2009175747A (en) Spin-on antireflective coating for photo-lithography

Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees