1279545 九、發明說明： 【發明所屬之技術領域】 一本七月係有關於一種測試用探針之技術領域，特別係指 一種利用一體成型之電導探針。 【先前技術】 按，目前探針已廣汐施田 ^〃泛應用於各種測試領域，如印刷電路 扳測試、晶圓測試、ic封駐、θι卜Φ 望比 11封衣測忒、通訊產品及液晶面板測試 卜’白雜針做為測試媒介。除此之外，現階段探針亦逐漸 月精、破電子7C件發展，主要是目為探針尺寸規格愈來愈 細且具有導電性、低電阻 H目此顧予探針高頻訊號 2輸之功’而可做為手機等無線通訊產品之收發天線及各類 电子產口口充电杰、連接器之銜接接點。未來探針將不再只於 演測試魏的角色，亦將於電子元件的領域上佔領不可Ζ 之位置。 、 惟就目前測試用探針之技術領域而言，其產品結構 存在構件組絲雜、外形體積大，以及電阻錄大等缺二， 茲例舉二案例說明於后： 首先請參閱第一圖，一種『低阻抗之探針結構』（以下欣 稱習用一）’該習用-主要之構成要件包括—錄金套筒間 (9 1 )，其-端為-内縮之内縮側’另—端設有—止擔側， 以及介於該止擋側及内縮侧之間的一作動空間（9 1 1 ) · 锻金針部（9 2 )，由該鑛金套筒之止擋側置人至該作動空間 1279545 缩側.亚路出該鐘金針部於該鍍金套筒（91)之内 Ί _(93)由該止撞側置入該作動空間 (9 4 )，Α内亚接觸至該鑛金針部；及-鑛錫的座體 η 〃具有—底槽，並於該底槽焊錫，由該鍍金套筒 9 :物置入該作動空間(911)，使該鑛金彈菁 之底㈣心座& ( 9 4 )之底槽接觸，經該座體（9 4 ) L與該鍍金彈簧（9 3 )結合，以及座體 炫融與鑛金套筒（91)結合，以構成一 低P抗之操針結構。 且低射魏雜狀各喊餅外層鑛上一 押，-=值之f金屬層』，此外再利用該鍍金針部上設一凹 ::令:嫩成構件結合為-體式構造 ，n^tr飯成構件繁多而形成製造、組裝成本的增加 段二一金屬層，及以錫焊方式固結構件之手 對^增加不必要之加工成本，當然探針之外形體積亦 ==而不利於精密測試之所需。再她—利用焊接 ^式將座肢、鍍金套_構聽接為—體，翻 ：：：#：^ ^ — 其次如第二圖所示，另—習用案『測試用或接 切』(以下簡稱習用二)，該習_^ 1279545 頭單元（8 1)，其具有同心圓之 觸或用以量测接觸裝 & 以與待測物做接 位於該接觸端針頭;=妾:一_^^ 接觸或用以量測接觸裝置倣連接物做 門：_針頭單元(81)内壁及終端針：元 間’用以緩衝測試時探針 82) 是以鑄造方式製作。 及純免力之用；其中該探針 上述習用二之組成構件雖然較少，且翻時所佔 衣工間較小’惟鱗最佳之結構設計。其、、、 組裝及鑛屬騎加工成本_費不斐，且當探=== 號傳輸時，因訊號經過之元件越 仃私〇κ .^ 之夕，則產生之電阻值也相對 而制二即有此缺失存在。另外習用二使用時亦呈有 電感效應大之缺失，其原因略述於后。 /、 請再參閱第三圖所示，探針測試過程中，其傳輪之電子 訊號必然會通過『彈簧構件』，而—般探針内之彈簧經 時，其線關仍魅聽型態，故電子訊號通過時會循著線 圈之螺旋結構路徑流動，不僅電阻值與路徑長度呈正比，且 亦因電感效應大而影響訊號之傳輸效率與品質，實有進—步 改善之必要。 夕 有鑑於此，本發明人為改善上述探針結構測試使用之缺 失，乃決心憑其從事相關行業製造、研發之多年經驗，遂終 日苦思力索、私研發’終研創出本創作『―體成型之電導 1279545 才采針』。 【發明内容】 本發明之主要目的係提供一種『一體成型之電導俨針 =令測試時用以傳輸電子訊號之探針其能以―體成二;’ 衣成’以大巾辦低製造、加工成本’並縮減其測試組裝护佔 用之空間。 1寸 …本發明之另—目的’係以最簡易之手段達到降低探針測 试時產生之電阻值，並確實消除電感效應。 【實施方式】 凊先麥閱第四圖〜第九圖所示，本發明『― =:』。其係將一具導電之金屬線材纏繞具若干螺旋狀二 抓針（1 Q )，該探針（i 〇 )二端各繞結—接導部（工丄、 二:’該二接導部⑴、11’）之線圈可為圓徑由小 ==化，形成概㈣_之狀，使其对微彈力 或者線圈呈等徑之結構。又各該接導部（11、^ 2=可呈密集接觸之結構型態，或呈彈鬆狀之構造，: 接導集綱之結構變化，係視使需求而定。其次該二 性）之間_繞—具有彈性回復力之彈 螺物^純段（12) 彡成寬鬆之 系疋狀構m，而具有可彈性壓 令該彈性段經外力施舉而步能於使用時， ^ 土形成元整密集接觸之結構型態。 虽利用上述之探針轉應用於電子訊號之傳輸㈣時， 1279545 係如第八圖所示，將探針置於需傳輸電子訊號之介面機構中 ’例如晶_m赌針卡縣肋，令聰針二端之接導部 (11、1 r )分別與訊號起始端（2 2)(如探針卡之基 板適處），以及訊號終端（2 2)(如IC板背面焊接之錫^ 接觸。當進行電子訊號傳輸程序時，因為該探針（丄⑸整 體線圈結構經壓縮後係呈現『完全密集』之一體式型態，而 無任7隙存在，故可供電子訊號迅速通過（如第九圖所示 y確貝具有降低電阻、消除電感效應之效用，且因為其與訊 γ而（2 2)接觸之接導部（i 2)係為線圈構部，而該 1 妾導部（1 1)結構本身亦具有微彈力特性，故能緩和並減 =如錫球等構部接觸時之壓迫力道，降低長時間高溫測試 才對錫球造成的不良影響。 制I上逑’凊再茶閱第十圖〜第十四圖所示，本發明設古十 =之實施例結構變化，係可視使用需求作適當改變，即當 二使其雜段（1 2 )所提供之彈性回復力足 夠應付使㈣麵，該雜 結構上並柯任㈣L— 構為早—長形狀， 彈 4^ ’惟右振針因尺寸較精密細小時，其 ，又（1 2)所產生之彈性回復力 :： ，則可於該彈砂彳！ Q、 職使用而求k 1 3，）2間繞結轩_之簧結段（1 3、 助，避免探針菁結段（1 3、1 3,)產生之微彈力輔 ! 3 足之情形。而所謂之菁結段(13、 )係線圈外徑呈由大至小再由小而大結構變化之局部 1279545 彈性體結構，該簧結段（i 3)纏繞時線圈可呈密集接觸之 結構型悲，或呈彈鬆狀之構造，其彈鬆或密集接觸之結構變 化，亦視使需求而定，而不論是接導部（1 1、1 1，） Μ 性段（1 2 )或簀結段（1 3、i 3，），其繞設時線圈數之 變化係視探針使用之場合經計算壓縮後之總長作適當之增減 調整。1279545 IX. Description of the invention: [Technical field to which the invention pertains] A seventh-day technical field relating to a test probe, in particular, a conductivity probe using an integral molding. [Prior Art] Press, the probe has been widely used in various test fields, such as printed circuit board test, wafer test, ic seal, θι Bu Φ, Wangbi 11 seal test, communication products And LCD panel test Bu 'white needle as a test medium. In addition, at this stage, the probes are gradually developing the 7C parts of the moon fine and broken electrons. The main purpose is to make the probe size specifications more and more fine and conductive, low resistance H. It can be used as a transceiver antenna for wireless communication products such as mobile phones and as a connection point for various electronic products. Future probes will no longer be used only to test the role of Wei, but also occupy an indispensable position in the field of electronic components. However, as far as the technical field of the current test probe is concerned, the product structure has a short component, a large volume, and a large resistance record. For example, the second case is explained later: First, please refer to the first figure. , a "low-impedance probe structure" (hereinafter referred to as the use of one) 'this habit - the main components include - gold sleeve (9 1), the end - the end of the contraction side 'other - the end is provided with a stop side, and an actuating space (9 1 1 ) between the stop side and the retracted side. The forged gold needle portion (9 2 ) is supported by the stop side of the gold sleeve Place the person to the working space 1279545. The side of the gold needle part of the clock is inside the gold-plated sleeve (91) _ _ (93) is placed into the operating space (9 4 ) from the collision side, Α内亚Contacting the gold needle portion of the mine; and - the seat body η 〃 of the tin ore has a bottom groove, and the solder is soldered in the bottom groove, and the gold plating sleeve 9 is placed into the operating space (911) to make the gold ore The bottom (4) heart seat & (9 4) bottom groove contact, through the body (9 4 ) L combined with the gold-plated spring (9 3 ), and the seat body fusion and the gold sleeve (91) knot , To constitute a low operating pin configuration of an anti-P. And the low-shot Wei miscellaneous each shouts the cake on the outer layer of the mine, the value of the f metal layer, and then uses the gold-plated needle to set a concave:: order: the tender member is combined into a body structure, n^ Tr rice into a variety of components to form a manufacturing, assembly cost increase section of the two metal layers, and the use of soldering solid parts to increase the unnecessary processing costs, of course, the shape of the probe outside the volume == is not conducive The need for precision testing. Then she used the welding ^ type to connect the seat and gold-plated sleeves to the body, and turned:::#:^ ^ — Next, as shown in the second figure, the other case is "testing or cutting" ( Hereinafter referred to as the second (2), the _^ 1279545 head unit (8 1), which has a concentric circle touch or is used to measure the contact device & to connect with the object to be tested at the contact end needle; = 妾: one _^^ Contact or use to measure the contact device to make a door: _ needle unit (81) inner wall and terminal needle: the element between the 'test buffer 82 for buffer test' is made by casting. And the pure force-free use; wherein the probes of the above-mentioned conventional two are relatively few components, and the time-consuming occupation of the garment room is smaller. The cost of the assembly, mining, and mining is _feifei, and when the transmission is detected by the === number, the resistance value generated by the signal is relatively different. Second, there is this deficiency. In addition, the use of the second use also has a large lack of inductance effect, the reasons are outlined later. /, Please refer to the third figure. During the probe test, the electronic signal of the transmission wheel will pass the "spring member", and the spring inside the probe will pass through the time. Therefore, when the electronic signal passes, it will follow the spiral structure path of the coil, and the resistance value is proportional to the path length, and the inductance effect is large, which affects the transmission efficiency and quality of the signal, and there is a need for further improvement. In view of this, the inventors of the present invention are determined to improve the use of the above-mentioned probe structure test, and are determined to carry out the long-term experience of manufacturing and research and development in related industries. The molded conductance 1279545 is only used for needles. SUMMARY OF THE INVENTION The main object of the present invention is to provide an "integrally formed electric conductivity pin = a probe for transmitting an electronic signal during testing, which can be made into a body"; Processing costs' and reduce the space occupied by its test assembly. 1 inch ... the other purpose of the present invention is to achieve the easiest way to reduce the resistance generated during probe testing and to eliminate the inductive effect. [Embodiment] The present invention is described as "― =:" as shown in the fourth to ninth drawings. The utility model is characterized in that a conductive metal wire is wound with a plurality of spiral two grasping needles (1 Q ), and the two ends of the probe (i 〇) are wound around each other - a guiding portion (worker, two: 'the two guiding portions The coils of (1) and 11') may have a circular diameter of small ==, and form a shape of (4)_, so that the microelastic force or the coil has a structure of equal diameter. And each of the guiding portions (11, ^ 2 = structure that can be in dense contact, or a structure that is loosely loose, the structure of the guiding assembly changes, depending on the demand. Secondly, the two sexes) Between the _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ The soil forms a structural form in which the elements are densely contacted. Although the probe is applied to the transmission of the electronic signal (4), the 1279545 is placed in the interface mechanism for transmitting the electronic signal as shown in the eighth figure, for example, the crystal _m gambling card county rib, The two ends of the Cong pin (11, 1 r ) are respectively connected to the signal start end (2 2) (such as the probe card substrate) and the signal terminal (2 2) (such as the solder on the back side of the IC board ^ Contact. When the electronic signal transmission program is carried out, because the probe (the overall coil structure of 丄(5) is compressed and appears to be a "completely dense" one-piece type, and no 7-slot exists, the electronic signal can be quickly passed ( As shown in the ninth figure, y yue has the effect of reducing the resistance and eliminating the inductance effect, and because the contact portion (i 2) which is in contact with the γ (2 2) is a coil structure, the 1 妾 guide The structure of the part (1 1) also has micro-elastic properties, so it can alleviate and reduce the pressing force when the structure is in contact with the solder ball, and reduce the adverse effect of the long-time high-temperature test on the solder ball.凊再茶 Read the tenth to fourteenth, the structure of the embodiment of the present invention The appropriate change can be made according to the needs of the use, that is, when the elastic recovery force provided by the second section (12) is sufficient to cope with the (four) plane, the heterostructure is combined with the (four) L-structure as an early-long shape, 4^ 'By the right vibrating needle due to the finer size, the elastic restoring force generated by (1 2)::, can be used in the elastic sand! Q, job seeking k 1 3,) 2 Between the 轩 轩 _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ The outer diameter of the coil is a large 1276045 elastic structure with large to small and small and large structure changes. When the spring knot (i 3) is wound, the coil can be in a dense contact structure or a loose structure. The structural change of loose or intensive contact is also dependent on the demand, whether it is the guiding part (1 1 , 1 1), the 段 section (1 2 ) or the 箦 section (1 3, i 3, The change in the number of coils when it is wound depends on the total length of the compression after the probe is used, and is appropriately adjusted.
承上述本叙明一體成型式之探針不僅大幅降低探針製 造成本，並能提昇探針本身之雜力，同時亦可降低電阻， 消_感效應。完全跳脫傳統探針需由若干構件組成，且使 用喊生之電阻及電姐絲大，或者需透複電錢成作 業W牛低笔阻、電感效應之領域層次，而能確實大幅提昇 產業技術。 綜上所述，本發明『-體成型之電導探針』，確實是一件 極^實雜及進步性禮計乃符合發明專财請要件，爱依 ^提出:請，祈請惠予審查並早日辭專利，至感德便。 【圖式簡單說明】 為第—種習麟針之組合剖面圖。 ^二圖：係、為第二種制探針之組合剖面圖。 第三圖：係為探針傳輸電子訊號時彈料現之狀態示意 外觀示意圖。 鈿後之外觀示意圖。 第四圖·係為本發明第一實施例之 第五圖：係為本發明第一實施例壓 1279545 弟六圖 係為本發明由第一 觀示意圖。 實施例衍生變化之第二實 施例外 圖·係為本發明第三實施例之成品外觀示意圖。 乐7圖·係為本發明實際使用於探針卡上之實施 第九圖：係A士 a 、 圖。 ^ 你马本發明傳輸電子訊號呈現之狀態示意圖。 第十圖·係為本發明第四實施例之成品外觀示意圖。The one-piece probe described above not only greatly reduces the probe manufacturing cost, but also enhances the hybrid force of the probe itself, and also reduces the resistance and the sensation effect. The complete jump of the traditional probe needs to be composed of several components, and the use of the resistance of the shouting and the electric sister is large, or the need to pass the electricity to make the operation of the W-low pen resistance, the field effect of the inductance effect, and can significantly improve the industry. technology. In summary, the "conductor-shaped conductivity probe" of the present invention is indeed a very complicated and progressive ritual that meets the requirements of the invention of special wealth, and loves to raise: please, pray for review And resign the patent as soon as possible, to the sense of virtue. [Simple description of the diagram] is a sectional view of the combination of the first-type cultivar. ^ 二图: The system is a combined sectional view of the second type of probe. The third picture shows the appearance of the current state of the bullet when the probe transmits the electronic signal. A schematic diagram of the appearance afterwards. The fourth drawing is a fifth drawing of the first embodiment of the present invention: the first embodiment of the present invention is a pressure of 1279545, and the sixth drawing is a first schematic view of the present invention. The second embodiment of the embodiment is a schematic diagram of the appearance of the finished product of the third embodiment of the present invention. Le 7 diagram is the actual implementation of the invention on the probe card. Figure IX: Department A, diagram. ^ You Ma said the state of the transmission of electronic signals. Fig. 10 is a schematic view showing the appearance of the finished product of the fourth embodiment of the present invention.
一圖：係為本發明由第四實施例衍生變化之第五實施例 外觀示意圖。 | 一、 ——圖：係為本發明第五實施例壓縮後之外觀示意圖。 =十二圖：係為本發明第六實施例之成品外觀示意圖。 弗十四圖：係為本發明第六實施例壓縮後之外觀示意圖。 【主要元件符號說明】 探針：（1 0 ) 彈性段（12) 訊號起始端：（2 1 ) 線材：（1) 接導部：（1工、 簧結段：（1 3、 訊號終端：2 2Figure 1 is a schematic view showing the appearance of a fifth embodiment of the present invention which is derived from the fourth embodiment. I. - Figure: is a schematic view of the appearance of the fifth embodiment of the present invention after compression. = Twelve diagrams: is a schematic view of the appearance of the finished product of the sixth embodiment of the present invention. Fig. 14 is a schematic view showing the appearance of the sixth embodiment of the present invention after compression. [Main component symbol description] Probe: (1 0 ) Elastic segment (12) Signal start: (2 1 ) Wire: (1) Guide: (1 work, spring knot: (1 3, signal terminal: twenty two