TWI275657B - Improved precursors for chemical vapour deposition - Google Patents
Improved precursors for chemical vapour deposition Download PDFInfo
- Publication number
- TWI275657B TWI275657B TW91134964A TW91134964A TWI275657B TW I275657 B TWI275657 B TW I275657B TW 91134964 A TW91134964 A TW 91134964A TW 91134964 A TW91134964 A TW 91134964A TW I275657 B TWI275657 B TW I275657B
- Authority
- TW
- Taiwan
- Prior art keywords
- precursor
- alkyl group
- vapor deposition
- chemical vapor
- ligand
- Prior art date
Links
Abstract
Description
1275657 九、發明說明: 【發明技術所屬領域】 本發明係有關於化學氣相沉積法先質的改進,_是使用化與 氣相沉積法生長三氧化鄉r02),二氧條咖2),氧備氧化ς (ZSO)與氧化铪/氧化矽(HS0)所須之先質,但非止於此。 【先前技術】 按’二氧化錯、二氧化給及其相關之zso與HS0石夕化物之 薄膜有其重要的觀顧,尤其他·有高介電常數,轉接# 又非常穩定,使得它們成為代替二氧切做為在生產赠體電路 的新生代MOSFET裝置之閑式介錢的首要聊。祕學氣相沉 積法沉積這些物質是很吸引人賴術,它有潛力可提供大面積之 生長,良好的成份控制,均勻的薄膜,以及小於大小的裝 置具有優異的、-致的階層覆蓋,這在微電子顧上特別重要。 一個成功的金屬有機化學氣相沉積(M〇CVD)過程,主要要求 乃使用的先質在氣相轉移時需具有恰當的物理性質,及沉積時 有適當的反應性。同時,在氣化與沉積之間要有足細溫度視窗 ,在大部份的電子品應用上,氧化物沉積的溫度視窗通常限於5〇〇 C,以避免石夕積體電路性能下降及金屬内部相互連結。 已知的Zr、Hf化學氣相沉積法先質存在著一些問題,例如, 鹵化物如四氯化鍅與四氯化铪是低揮發性固體,基材之溫度須達 800°C或以上才能使該氧化物沉積其上;金屬二丙酮化物冷 -diketonates,例如[Zr(thd)4] 沖(1=2,2,6,6七加11^%11哪1&1於-3,5』〇1^6)亦須要高溫(>6〇〇它) 1275657 的基材,以便氧化物生長,這些均不符合電子產業的要求。金屬 烷氧化物雖然所須沉積溫度較低而受青睞,但是,多數的[Zr(0R)4] 與[Hf(OR)4]複合物是二分子體或多分子體,其揮發性有限,因為 可預知Zr(IV)與Hf(IV)易於擴大其配位數至6,7或8的傾向。為 了防止聚合,可防聚合的配位物,如tert-丁氧基(tert-butoxide)曾 被使用’其中像[Zr(OBu)4](D.C· Bradley, Chem· Rev· 1989, 89,1317) 與[H^OBAKS.Pakswer & R Skoug,in,,Thin dielectric oxide fib made by oxygen assisted pyrolysis of alkoxides,,,The Electrochem.參1275657 IX. Description of the Invention: [Technical Field] The present invention relates to the improvement of the precursor of chemical vapor deposition, _ is the use of vaporization and vapor deposition to grow trioxide (r02), dioxin 2), Oxygen-prepared cerium oxide (ZSO) and cerium oxide/cerium oxide (HS0) are required to be precursors, but not limited to this. [Prior Art] According to 'dioxygenation, dioxygenation and its associated zso and HS0 asahi compound films have important considerations, especially he has a high dielectric constant, and the transfer # is very stable, making them Becoming the first place to replace the dioxo as a free-form for the new generation of MOSFET devices in the production of gift circuits. The deposition of these substances by the secret gas vapor deposition method is very attractive, and it has the potential to provide large-area growth, good composition control, uniform film, and device of less than size with excellent, layered coverage. This is especially important in microelectronics. A successful metal organic chemical vapor deposition (M〇CVD) process requires that the precursors used have appropriate physical properties for gas phase transfer and appropriate reactivity for deposition. At the same time, there must be a fine temperature window between gasification and deposition. In most electronic applications, the temperature window of oxide deposition is usually limited to 5〇〇C to avoid the degradation of the performance of the integrated circuit and metal. Internally connected to each other. There are some problems in the known Zr and Hf chemical vapor deposition methods. For example, halides such as antimony tetrachloride and antimony tetrachloride are low-volatile solids, and the temperature of the substrate must be 800 ° C or above. The oxide is deposited thereon; the metal diacetate is cold-diketonates, such as [Zr(thd)4] rush (1=2, 2, 6, 6 7 plus 11^% 11 which 1 & 1 to -3,5 〇1^6) also requires high temperature (>6〇〇) 1275657 substrate for oxide growth, which does not meet the requirements of the electronics industry. Although metal alkoxides are favored for lower deposition temperatures, most of the [Zr(0R)4] and [Hf(OR)4] complexes are di- or multi-molecules with limited volatility. Because it is foreseeable that Zr(IV) and Hf(IV) tend to expand their coordination number to 6, 7 or 8. In order to prevent polymerization, anti-polymeric ligands such as tert-butoxide have been used 'where [Zr(OBu)4] (DC Bradley, Chem. Rev. 1989, 89, 1317) And [H^OBAKS.Pakswer & R Skoug,in,,Thin dielectric oxide fib made by oxygen assisted pyrolysis of alkoxides,,,The Electrochem.
Soc·,Los Angeles,CA,USA,1970, 619-636)已經成功地以化學氣 相沉積法生長二氧化锆與二氧化铪。然而,這些單核先質含有不 飽和4配位數的金屬核,且此tert_butoxide配位物在微量水份存在 即會產生为解反應,由於這種對空氣或水份具高敏感度,使得它 們在化學氣相沉積反應器内易造成事先反應,這種反應也會導致 儲存時間的縮短’尤其是以溶液射出之化學氣相沉積之應用為甚 〇 【發明内容】 ® 本發明的目標即是在提供化學氣概毅術歡且轉發的 鈦、錯與铪先質。 我們發現,l_f 氧基 mmP]可有效抑祕與給燒氧複合物的聚合,亦可增加其常溫的穩 定性。 “ 依上述發現,本發明提供使用於金屬有機化學氣相沉積法的鈦 、錯、給與鑭先質具有⑽1(R2)CH2X 方程式的雜物,其中 1275657 ’ R是Η或烧基,R2是一可被選擇性置換的烧基,χ選自〇R及 NR2,R為烷基或一置換的烷基。 根據本發明第一較佳實例,該化學氣相沉積法的先質具有如下 方程式: mclxcocr^r^^x]^ 其中,Μ是選自鈦'鍅與铪的金屬,l是一配位物,X是〇〜 3的數目’R、R與X則如前面之定義。 較受用的配位物L是一個含有1〜4個碳原子的烷氧基,其f 以 tertiaiy-butoxide (OBu1)最受青睞,當然其他如 iso_prop〇xide (〇Pri) 亦可使用。 方程式0CR1(R2)CH2X中技術之較佳配位物是μ曱氧基-2_甲 基-2-propanolate (mmp)。但其他可供反應的烷氧配位物亦可在本發 明的使用中達到抑制鈦、鍅與铪烷氧化物聚合所需功能及作用;上 述這些其他可供反應的烷氧配位物包括〇CH(Me)CH2〇Me, OCEt2CH2OMe5 OCH(But)CH2OEt? OC(Bvl)2CH2〇^ φ OCpr^CHaOEt,0呵邮。氏顺2, 〇。州仰^ OCXButXCHzOPr%,但不限於此。 本發明更進一步提供金屬有機化學氣相沉積法之鈦、锆與铪的 先質,它包含將mmpH與對應的金屬氧化物或金屬烷基胺以適當 摩爾比反應而得。 此新的烷氧複合物,ΖΓ(ΟΒιή2(ιηιηρ;)2,Ζι·(;ιηιηρ;)4, HfKOBJMmmph及Hf(mmp)4,可藉由加入適當摩爾比的腿阳 於Zr(OBU%和HfiOBV)4中反應合成而得。這些複合物具有適用於 1275657 金屬有機化學氣相沉積所須的高蒸氣壓,而錄&(叫化合物, 更不易與空氣、濕氣起反應,而且其中的R為—絲,使得他們 在進行金屬有機化學氣相沉積比較容易處理與使用。而這些新的錯 (Zr)、铪_複合物之所以具有低空氣敏感度的原因,乃在 [ZitOBu%]及[HfiOBu%]中所含具高水氣敏感度⑴如丁氧基為 mmp配合物所置換’因此較不易產生水解作用。而且增加中心的 原子鍅(Zr)與铪(Hf)的配位數的話,就更能抑制水解作用。 根據本發明第二較佳實例,可延伸至其他較大原子帶高正電# 金屬,例如鑭La,其先質具如下方程式:Soc., Los Angeles, CA, USA, 1970, 619-636) has successfully grown zirconium dioxide and cerium oxide by chemical vapor deposition. However, these mononuclear precursors contain a metal core with an unsaturated 4 coordination number, and the tert_butoxide ligand is decomposed in the presence of traces of water, which is highly sensitive to air or moisture. They are prone to cause a prior reaction in a chemical vapor deposition reactor, and this reaction also leads to a shortening of storage time, especially in the case of chemical vapor deposition using solution injection. [Invention] The object of the present invention is It is a precursor of titanium, wrong and sputum that is provided by the chemical gas. We have found that l_f oxy-mP] is effective in inhibiting the polymerization of the oxygen-suppressing complex and increasing its stability at room temperature. According to the above findings, the present invention provides a titanium, agglomerate, and a ruthenium precursor having a (10) 1 (R 2 ) CH 2 X equation for use in a metal organic chemical vapor deposition process, wherein 1275657 'R is a ruthenium or a ruthenium group, and R 2 is A selectively replaceable alkyl group, the fluorene selected from the group consisting of 〇R and NR2, and R is an alkyl group or a substituted alkyl group. According to a first preferred embodiment of the present invention, the precursor of the chemical vapor deposition method has the following equation : mclxcocr^r^^x]^ where Μ is a metal selected from the group consisting of titanium '鍅 and 铪, l is a ligand, and X is the number of 〇~3', R, R and X are as defined above. The ligand L to be used is an alkoxy group having 1 to 4 carbon atoms, and f is most favored by tertiaiy-butoxide (OBu1), and others such as iso_prop〇xide (〇Pri) can also be used. Equation 0CR1 ( A preferred ligand for the technique in R2) CH2X is μ曱oxy-2-methyl-2-propanolate (mmp). However, other alkoxylate ligands which can be reacted can also be inhibited in the use of the present invention. The functions and functions required for the polymerization of titanium, ruthenium and decane oxides; these other alkoxylate ligands which can be reacted include 〇CH(Me)CH2〇Me OCEt2CH2OMe5 OCH(But)CH2OEt? OC(Bvl)2CH2〇^ φ OCpr^CHaOEt, 0 邮 。. 氏2, 〇.州仰^ OCXButXCHzOPr%, but is not limited thereto. The present invention further provides metal organic chemical vapor phase The precursor of titanium, zirconium and hafnium in the deposition method, which comprises reacting mmpH with a corresponding metal oxide or metal alkylamine in an appropriate molar ratio. This new alkoxy complex, ΖΓ(ΟΒιή2(ιηιηρ;) 2, Ζι·(;ιηιηρ;) 4, HfKOBJMmmph and Hf(mmp)4, which can be synthesized by adding a suitable molar ratio of leg yang to Zr (OBU% and HfiOBV) 4. These complexes have suitable for use in 1275657 Metallic organic chemical vapor deposition required high vapor pressure, and recorded & (called compounds, more difficult to react with air, moisture, and R is - silk, making them in metal organic chemical vapor deposition It is easier to handle and use. The reason why these new (Zr) and 铪_complexes have low air sensitivity is high moisture sensitivity in [ZitOBu%] and [HfiOBu%] (1) If the butoxy group is replaced by the mmp complex, it is less prone to hydrolysis. Moreover, by increasing the coordination number of the central atomic enthalpy (Zr) and hydrazine (Hf), the hydrolysis can be more inhibited. According to the second preferred embodiment of the present invention, it can be extended to other large atomic bands and high positive electricity. For example, 镧La, which has the following equation:
LafOCR^R^^XJs 其中,R1是Η或烷基,R2是一可被選擇性置換的烷基,χ選 自OR及NR2 ’ R為烧基或一置換的烧基。 雖然其他可供反應的烷氧配位物亦可使用…—這些包括 OCH(Me)CH2OMe? OCEt2CH2OMe? OCHCBu^^OEt, OCCBu^^OEt, OCCPr^^OEt, OCH(But)CH2NEt2? 肇 OC(Pri)2CH2〇C2H4〇Me 及 ΟΟχΒι^χα^ΟΡι·1)2,但不限於此。但,最 好的是用的配位物是1 -甲氧基-2-甲基-2- propanolate [OCMe2CH2OMe]。 根據第二較佳實例,本發明亦可提供一較佳製造先質的方法, 它包含將mmpH與La{N(SiMe3)2;h以適當摩爾比反應而得。 使用本發明的先質,可以傳統的金屬有機化學氣相沉積法獲得 單一或混合的氧化層或薄膜,其法為將先質置於一金屬有機鼓泡器 ,或者以液體射出金屬有機化學氣相沉積法,乃將先質溶於適當的 1275657 惰性有機賴,織咖熱的統裝置料統;亦仰其他的化 學氣相沉積法’如原子層沉積法(ALD),藉本發明的歸獲得錯、 铪與鈦氧化物的薄膜。 尸本發明的先質可藉金屬有機化學氣相沉積法獲得二氧化錯、二 氧化給、—氧化鈦與二氧化二鑭的賊;亦可用混合的先質,以獲 得氧化錯、氧化給與氧化鑭的複合薄膜,如zs〇、腦與嫩合物 〇 本發明的先質柯與其他先質混賴得複合的氧錄,例子營 括從 Bi(mmp)3 /Τι(ΟΡΓ)2 (mmp)2 或 Bi(mmp)3/Ti(mmp)4 的混合物獲得 bismuth-titanate 複合膜。 【實施方式】 本發明可以所附圖示進一步描述; 第一圖係顯示Μ(ΟΒιι%(πιιηρ)2 (M=Zr或Hi)的想像結構。 弟一圖係顯示Zr(mmp)4與Hf(mmp)4有相似的結構。 第三圖係顯示使用ZifOBi^minph或HfiOBu^minph, 鲁 以液體射出金屬有機化學氣相沉積法生長的Zr〇2與 Hf〇2薄膜之雷射Raman光譜。 現在’猎由以下數例子進一步描述本發明。 例一 ΖΓ(ΟΒιι)2(ιηιηρ)2 的製備 取 2.8ml(2.69g,XOmmol)的 ZrCOBu)4 溶於己烷(ca.4〇ml),然後 將mmpH(1.6ml,1.44g, 13.9mmol)逐漸滴入,並將此混合物加熱,使 其產生逆流,並持續混攪2小時,接著使其冷卻至室溫,在壓力減 I275657 少的情形下揮發物就會蒸發出去,白色的結晶固體即可從己燒中再 大析出’即為本產物。 熔點:96-101°C (未校正) 微量分析··計算值C : 48.71%,Η : 9.10% 實際值 C : 46.32%,Η : 8.77% 4 NMR : (400MHz,d8_tol)1.19(s,12Η, OC(CH3)2CH2OCH3),1.37(s,18H,OC(CH3)3), 3.23(s,4H,OC(CH3)2Cg2〇CH3),3·40 (s,6H, · OC(CH3)2CH2OCii3)。 13CNMR : 34.1(OC(£H3)2CH2OCH3),38.5(OC(£H3)3), 65.4(OC(CH3)2CH2C^H3),78.6(OQCH3)2CH2OCH3 及 〇C(CH3)3)? 90.5(OC(CH3)2CH2OCH3) 〇 IR : (u cm·1,Nujol,NaCl)3588(w),3422(w), 2725(w),2360(w),1356(s),1277(m),1227(m), 1206⑻,1177 ⑻,1115(s),1080⑻,1012(s), 974(s), · 936(s),801 ⑻,782⑻,595(s). Ζι^ΟΒι^ΜππηρΚ的想像結構如第一圖所示。 例二LafOCR^R^^XJs wherein R1 is an anthracene or an alkyl group, and R2 is an alkyl group which is optionally substituted, and is selected from OR and NR2'R is a burnt group or a substituted burnt group. Although other alkoxy ligands available for reaction can also be used... these include OCH(Me)CH2OMe? OCEt2CH2OMe? OCHCBu^^OEt, OCCBu^^OEt, OCCPr^^OEt, OCH(But)CH2NEt2? 肇OC( Pri) 2CH2〇C2H4〇Me and ΟΟχΒι^χα^ΟΡι·1)2, but are not limited thereto. However, it is preferred that the ligand used is 1-methoxy-2-methyl-2-propanolate [OCMe2CH2OMe]. According to a second preferred embodiment, the present invention also provides a preferred method of producing a precursor comprising reacting mmpH with La{N(SiMe3)2;h in an appropriate molar ratio. Using the precursor of the present invention, a single or mixed oxide layer or film can be obtained by conventional metal organic chemical vapor deposition by placing the precursor in a metal organic bubbler or injecting metal organic chemical gas into the liquid. The phase deposition method dissolves the precursor into the appropriate 1275657 inert organic ray, and the other chemical vapor deposition method, such as atomic layer deposition (ALD), by the invention. A film of the wrong, antimony and titanium oxide is obtained. The precursor of the invention can obtain thieves of dioxins, dioxygenation, titania and bismuth dioxide by metal organic chemical vapor deposition; and can also use mixed precursors to obtain oxidation and oxidation. A composite film of cerium oxide, such as zs 〇, brain and tender 〇 氧 氧 与 与 与 与 与 与 与 与 与 与 与 与 与 与 与 与 与 与 与 与 与 与 与 与 与 与 与 与 与 与 与 与 与 与 与 与 与 与 与A mixture of mmp)2 or Bi(mmp)3/Ti(mmp)4 obtained a bismuth-titanate composite film. [Embodiment] The present invention can be further described with reference to the accompanying drawings; the first figure shows the imaginary structure of Μ(ΟΒι%%(πιιηρ) 2 (M=Zr or Hi). The first figure shows Zr(mmp)4 and Hf (mmp) 4 has a similar structure. The third figure shows the laser Raman spectrum of Zr〇2 and Hf〇2 films grown by liquid metal organic chemical vapor deposition using ZifOBi^minph or HfiOBu^minph. The invention is further described by the following examples. Example 1 Preparation of ΟΒ (ΟΒιι) 2 (ιηιηρ) 2 2.8 ml (2.69 g, XO mmol) of ZrCOBu) 4 was dissolved in hexane (ca. 4 〇 ml), Then mmpH (1.6 ml, 1.44 g, 13.9 mmol) was gradually added dropwise, and the mixture was heated to cause a countercurrent, and stirring was continued for 2 hours, followed by cooling to room temperature, and the pressure was reduced by I275657. The lower volatiles will evaporate, and the white crystalline solid can be further precipitated from the sinter. Melting point: 96-101 ° C (uncorrected) Minor analysis · Calculated value C : 48.71%, Η : 9.10% Actual value C : 46.32%, Η : 8.77% 4 NMR : (400MHz, d8_tol) 1.19 (s, 12Η , OC(CH3)2CH2OCH3), 1.37(s,18H,OC(CH3)3), 3.23(s,4H,OC(CH3)2Cg2〇CH3),3·40 (s,6H, · OC(CH3)2CH2OCii3 ). 13CNMR: 34.1 (OC(£H3)2CH2OCH3), 38.5 (OC(£H3)3), 65.4 (OC(CH3)2CH2C^H3), 78.6 (OQCH3)2CH2OCH3 and 〇C(CH3)3)? 90.5 (OC (CH3)2CH2OCH3) 〇IR : (u cm·1,Nujol,NaCl)3588(w), 3422(w), 2725(w), 2360(w),1356(s),1277(m),1227( m), 1206(8), 1177 (8), 1115(s), 1080(8), 1012(s), 974(s), · 936(s), 801 (8), 782(8), 595(s). The imaginary structure of Ζι^ΟΒι^ΜππηρΚ The first picture shows. Case 2
Zr(mmp)4的製備 取 2.0g(5.2mmol)的 Zi^OPr% · PrOH 溶於己烧(ca.40ml),然後 將mmpH(2.6ml,2.35g,22.5mmol)逐漸滴入,將此混合物加熱,使其 產生逆流,並持續混攪2小時,接著使其冷卻至室溫,在壓力減少的 情形下揮發物就會蒸發出去,獲得白色的黏油狀物即為本產物(產出 10 1275657 率:2.4g,94%)。Preparation of Zr(mmp)4 2.0 g (5.2 mmol) of Zi^OPr%· PrOH was dissolved in hexane (ca. 40 ml), and then mmpH (2.6 ml, 2.35 g, 22.5 mmol) was gradually added dropwise. The mixture is heated to produce a countercurrent, and the mixture is continuously stirred for 2 hours, and then allowed to cool to room temperature. When the pressure is reduced, the volatiles are evaporated to obtain a white viscous oil which is the product (output 10 1275657 rate: 2.4g, 94%).
Zr(mmp)4亦可自Zr(NR2)4複合物合成而得,如:將mmpH(6.9g, 65.8mmol)逐漸滴入與己烷(50cm3)混攪的[Zr(NEt2)4] (5 〇g,13 2mm〇1) 溶液。此混合物在逆流的情形下沸騰2小時,接著冷卻至室溫,利用 真空使揮發物排出即得本產物(產出率:6.25g,94%)。 微量分析:計算值C : 47.67%,Η : 8.82% 實際值 C : 47.80%,Η : 8.79% 4 NMR : (400MHz,d8-tol) : 1.21 (s,OC(CH3)2CH2OCH3), _ 3.16(s,OC(CH3)2CH2〇CH3) 3.27(s, OC(CH3)2CH2OCii3)。 13CNMR : (l〇〇MHz,d8-tol) : 32.1(OC(£H3)2CH2OCH3), 64.8(OC(CH3)2CH2O£H3),76.0(C^(CH3)2CH2OCH3), 88.5(OC (CH3)£H2OCH3)。 IR : (y cm·1,Nujol,NaCl)3589(w),3448(w,br), 2724(m),2346(w),1377(s),1322(m),1279(m), 馨 1239(m),1176(s),1134(m),1114(s),1081(m)5 1018⑻,996(m),982⑻,958(m),937(m), 917(m),845(m),804(m),784(m),594⑻. 例三Zr(mmp)4 can also be synthesized from the Zr(NR2)4 complex, such as: gradually adding mmpH (6.9g, 65.8mmol) into [Zr(NEt2)4] mixed with hexane (50cm3) ( 5 〇g, 13 2mm〇1) solution. This mixture was boiled for 2 hours in the case of a countercurrent, and then cooled to room temperature, and the volatile product was discharged by vacuum to give the product (yield: 6.25 g, 94%). Microanalysis: Calculated C: 47.67%, Η: 8.82% Actual C: 47.80%, Η: 8.79% 4 NMR: (400MHz, d8-tol): 1.21 (s, OC(CH3)2CH2OCH3), _ 3.16 ( s, OC(CH3)2CH2〇CH3) 3.27(s, OC(CH3)2CH2OCii3). 13CNMR: (l〇〇MHz, d8-tol): 32.1 (OC(£H3)2CH2OCH3), 64.8 (OC(CH3)2CH2O£H3), 76.0 (C^(CH3)2CH2OCH3), 88.5 (OC (CH3) £H2OCH3). IR : (y cm·1,Nujol,NaCl)3589(w),3448(w,br), 2724(m),2346(w),1377(s),1322(m),1279(m), 馨1239(m), 1176(s), 1134(m), 1114(s), 1081(m)5 1018(8),996(m),982(8),958(m),937(m), 917(m),845 (m), 804(m), 784(m), 594(8). Example 3
Hf(OBu)2(mmp)2 取 3.5ml(4.0g,8.5mmol)的 HfifOBu% 溶於己烧(40ml)成一黃色液 體,然後將mmpH(2.0ml,1.79g,19.0mmol)逐漸滴入,將此混合物加 熱,使其產生逆流,並持續混攪2小時,接著使其冷卻至室溫,在壓 11 1275657 力減少的情形下,揮發物就會蒸發出去,白色的結晶固體即可從己烷 中再次析出,即為本粗產物(產出率:4.4g,97%)。 熔點:100-104°C(未校正) 微量分析:計算值C : 40.71%,Η : 7.61% 實際值 C : 38.93%,Η : 7.30% hNMR : (400MHz,d8-tol) : (5=1.18(s,12H,OC(CH3)2CH2 OCH3),1 ·3 8(s,18H,OC(CH3)3), 3.21 (s512H9OC(CH3)2CH2〇CH3)5 · 3.42(s,12H,OC(CH3)2CH2OQi3)。 13C NMR : (100 MHz d8-tol) : 5 =34.4 (OC(QH3)2CH2OCH3 I 38.6(OC(CH3)3)9 65.7 (〇C(CH3)2CH2OCH3)5 78.0, 79.1(OC(CH3)2 £H2OCH3 及 0£(CH3)3), 90.9(OC(CH3)2QHpCH3)。 IR · (υ cm'1,Nujol,NaCl) : 3441(w)52726(m)5 2256(w),1272⑻,1177(S),1O74(S),1O16(S),976(S),8O2(S),782(S),0 593(s).Hf(OBu)2(mmp)2 3.5 ml (4.0 g, 8.5 mmol) of HfifOBu% was dissolved in hexane (40 ml) to form a yellow liquid, then mmpH (2.0 ml, 1.79 g, 19.0 mmol) was gradually added dropwise. The mixture is heated to produce a countercurrent, and the mixture is continuously stirred for 2 hours, and then allowed to cool to room temperature. Under the pressure of 11 1275657, the volatile matter evaporates and the white crystalline solid can be evaporated from the The alkane was precipitated again, which was the crude product (yield: 4.4 g, 97%). Melting point: 100-104 ° C (uncorrected) Microanalysis: Calculated value C: 40.71%, Η: 7.61% Actual value C: 38.93%, Η: 7.30% hNMR : (400MHz, d8-tol) : (5=1.18 (s, 12H, OC(CH3)2CH2 OCH3), 1 · 3 8 (s, 18H, OC(CH3)3), 3.21 (s512H9OC(CH3)2CH2〇CH3)5 · 3.42(s,12H,OC(CH3) 2CH2OQi3). 13C NMR: (100 MHz d8-tol): 5 = 34.4 (OC(QH3)2CH2OCH3 I 38.6(OC(CH3)3)9 65.7 (〇C(CH3)2CH2OCH3)5 78.0, 79.1 (OC( CH3)2 £H2OCH3 and 0£(CH3)3), 90.9(OC(CH3)2QHpCH3). IR · (υ cm'1,Nujol,NaCl) : 3441(w)52726(m)5 2256(w), 1272(8), 1177(S), 1O74(S), 1O16(S), 976(S), 8O2(S), 782(S), 0 593(s).
Hf(OBut)2(mmp)2的想像結構如第一圖所示。 例四The imaginary structure of Hf(OBut)2(mmp)2 is as shown in the first figure. Example 4
Hf(mmp)4的製備 取 4.0ml(5.56g,11.9mmol)的[Hf(NEt2)4]溶於己烷(6〇ml),然後將 Hmmp(7.0ml,6.3g,60mmol)逐漸滴入,將此混合物加熱,使其產生 逆流,並持續混擾90分鐘,接著使其冷卻至室溫,利用真空使揮發 物排出,留下白色的黏油狀物即為本產物(產出率:6.88g,97.5%) 12 1275657 微量分析:計算值C : 40.63%,Η : 7.52% 實際值 C : 39.85%,Η : 7·32% lR NMR : 1.30(s,24H,OC(CH3)2CH2OCH3),3.28(s,8H, OC(CH3)2C^OCH3),3·36 (s,12H, OC(CH3)2CH2OC^3)。 13CNMR : 34.74(OC(〇I3)2CH2OCH3),65.16(OC(CH3)2 CH2O^H3),79.83(OQCH3)2CH2OCH3), 90.25(OC(CH3)2^H2OCH3)。 修 IR: (Nujol/ NaCl) : 3585(w),3450(w,br),2722(m),1366(s),1356(vs), 1268(s),1242(s),1214(vs),1177(vs),1115(vs),1079(vs), 1045(vs),1026(vs),996(vs),975(vs),936(vs),912(m),802(s),779(s), 594(vs).Preparation of Hf(mmp)4 4.0 ml (5.56 g, 11.9 mmol) of [Hf(NEt2)4] was dissolved in hexane (6 〇ml), then Hmmp (7.0 ml, 6.3 g, 60 mmol) was gradually added dropwise The mixture was heated to give a countercurrent and continued to be disturbed for 90 minutes, then allowed to cool to room temperature, and the volatiles were discharged by vacuum, leaving a white viscous oil as the product (yield: 6.88g, 97.5%) 12 1275657 Microanalysis: Calculated C: 40.63%, Η: 7.52% Actual C: 39.85%, Η: 7·32% lR NMR: 1.30 (s, 24H, OC(CH3)2CH2OCH3) , 3.28 (s, 8H, OC(CH3)2C^OCH3), 3·36 (s, 12H, OC(CH3)2CH2OC^3). 13C NMR: 34.74 (OC(〇I3)2CH2OCH3), 65.16 (OC(CH3)2 CH2O^H3), 79.83 (OQCH3)2CH2OCH3), 90.25 (OC(CH3)2^H2OCH3). Repair IR: (Nujol/ NaCl): 3585 (w), 3450 (w, br), 2722 (m), 1366 (s), 1356 (vs), 1268 (s), 1242 (s), 1214 (vs) , 1177 (vs), 1115 (vs), 1079 (vs), 1045 (vs), 1026 (vs), 996 (vs), 975 (vs), 936 (vs), 912 (m), 802 (s) , 779(s), 594(vs).
Hf(mmp)4的想像結構如第二圖所示。 例五 ZKOPPHmmph 的製備 · 取1.068(2.75111111〇1)的21'(0?1^)4.?1^011溶於己烷((^4〇1111),然 後將 1_ 曱氧基-2-曱基-2_propanol [mmpH](0.65ml,0.57g,5.5mmol) 逐漸滴入,將此混合物加熱,使其產生逆流,並持續混攪2小時, 接著使其冷卻至室溫,在壓力減少的情形下,揮發物就會蒸發出去 ,留下的黏油狀物即為本產物。 微量分析:計算值C : 46.23%,Η : 8.73% 實際值 C : 44.17%,Η : 8.47% ^NMR : (400MHz? d8-tol) : 1.26(s?OC(CH3)2 CH20CH3), 13 1275657 1.32(d,OCH(CH3)2),3.26(2, OC(C丛)2CH2OCH3),3.36 (s,OC(CH3)2CH2OC互3),4.46(m,OCSCH3)2)。 13CNMR : (100MHz,d8-tol) : 32.1(OC(£//3)2CH2OCH3), 34.2(OCH(£H3)2),64.9(OC(CH3)2CH20〇I3), 76.1,76.4(O^H(CH3)2 及 0£(CH3)2CH20CH3), 88.6(OC(CH3)2^2〇CH3)。 IR : (υ cm-1,Nujol,NaCl) 3589(w),3423(w),2724(w),2282(w), 1239(w),1175(m),1115(m),1019(m),959(m). . 例六The imaginary structure of Hf(mmp)4 is as shown in the second figure. Example 5 Preparation of ZKOPPHmmph · Take 1.068 (2.75111111〇1) of 21' (0?1^)4.?1^011 dissolved in hexane ((^4〇1111), then 1_ 曱oxy-2-曱Base-2_propanol [mmpH] (0.65 ml, 0.57 g, 5.5 mmol) was gradually added dropwise, and the mixture was heated to give a countercurrent, and stirring was continued for 2 hours, followed by cooling to room temperature, in the case of a decrease in pressure. Next, the volatiles will evaporate, leaving the viscous oil as the product. Microanalysis: Calculated value C: 46.23%, Η: 8.73% Actual value C: 44.17%, Η: 8.47% ^ NMR : ( 400MHz? d8-tol): 1.26(s?OC(CH3)2 CH20CH3), 13 1275657 1.32(d,OCH(CH3)2), 3.26(2, OC(C)2CH2OCH3), 3.36 (s, OC( CH3) 2CH2OC mutual 3), 4.46 (m, OCSCH3) 2). 13CNMR: (100MHz, d8-tol): 32.1(OC(£//3)2CH2OCH3), 34.2 (OCH(£H3)2), 64.9 (OC(CH3)2CH20〇I3), 76.1,76.4 (O^H (CH3)2 and 0£(CH3)2CH20CH3), 88.6(OC(CH3)2^2〇CH3). IR : (υ cm-1, Nujol, NaCl) 3589(w), 3423(w), 2724(w), 2282(w), 1239(w), 1175(m), 1115(m), 1019(m) ), 959(m). . Example 6
TiipPrMmmp)〗的製備 將 mmpH(2.81g,27mmol)逐漸滴入溶於己烷(20ml)的 Τί(ΟΡι04 (3.84g,13.5mmol)溶液。此混合物在逆流的情形下沸騰90分鐘,接 著使其冷卻,又利用真空使揮發物排出,即得此一無色油狀產物。 微量分析:TiC16H3604 計算值 C : 51.61%,Η : 9.75% | 實驗值 C : 51.20%,Η : 9.92% 1Β^ΜΚ(06Ό50Ό3άϊ30°〇 δ U(26H5d?(C^3)2CH; CHsOCHKCShC); δ 3·2(10Η, 2 singlets,CH3OC氹(CH3)2C); δ 4·5(2Η, m,(CH3)2C®· l3C{lR} NMR(C6D5CD35 30°C) : 32(OC(ai3)2CH2OCH3)? 33.4(OCH(CH3)2)5 64.4(OC(CH3)2CH2OCH3)? 81.7(OC(CH3)2CH2〇CH3 86.5(OCH(CH3)2)? 88(OC(CH3)2GH2OCH3)。 1275657 IR (Nujol,cm-1) 2972s,2928s,2869s,2625w,1463m,1376m,1360s, 1331m,1277m,1126s,1001s,850s,778m·,629s· 例七Preparation of TiipPrMmmp)) mmpH (2.81 g, 27 mmol) was gradually dropped into a solution of 己烷ί (ΟΡ4 (3.84 g, 13.5 mmol) dissolved in hexane (20 ml). This mixture was boiled for 90 minutes in the case of countercurrent, followed by After cooling, the volatiles are discharged by vacuum to obtain the product as a colorless oil. Microanalysis: TiC16H3604 Calculated value C: 51.61%, Η: 9.75% | Experimental value C: 51.20%, Η: 9.92% 1Β^ΜΚ( 06Ό50Ό3άϊ30°〇δ U(26H5d?(C^3)2CH; CHsOCHKCShC); δ 3·2(10Η, 2 singlets, CH3OC凼(CH3)2C); δ 4·5(2Η, m,(CH3)2C® · l3C{lR} NMR (C6D5CD35 30°C): 32(OC(ai3)2CH2OCH3)? 33.4(OCH(CH3)2)5 64.4(OC(CH3)2CH2OCH3)? 81.7(OC(CH3)2CH2〇CH3 86.5 (OCH(CH3)2)? 88(OC(CH3)2GH2OCH3). 1275657 IR (Nujol, cm-1) 2972s, 2928s, 2869s, 2625w, 1463m, 1376m, 1360s, 1331m, 1277m, 1126s, 1001s, 850s, 778m·, 629s· Example 7
Ti(mmp)4的製備 將MmpH(4.41g,42mmol)逐漸滴入溶於己烧(20ml)的 Ti(NEt2)4 (2.85g,3ml; 8.47mmol)淡棕色溶液。此混合物在逆流的 情形下沸騰1·5小時,接著使其冷卻,又利用真空使揮發物排出 ,即得淡棕色油狀產物Ti(mmp)4。 < 微量分析:TiC2〇H44〇8 計算值 C : 52.17%,Η : 9.63% 實驗值 C : 51.95%,Η : 9.97% 'Η NMR(C6D5CD3 at 30°C) 5 1.3(24H5s5CH3OCH2 (CH3)2 C); δ 3·2(20Η,2 singlets, C7/3OQ^2(CH3)2C); VT 4 NMR 顯示從_50°C to+50°C陡峭而明顯的波峰,無寬幅是很清楚的。 l3C{lR}mAR(C6O5CO3, 30°〇: 31.9(00(αί3)2〇Η2ΟΟΗ3)5 | 64.5(OC(CH3)2CH2O^H3),81.7(0£(CH3)2CH20CH3), 87(OC(CH3)2£H2OCH3)。 IR (Nujol,cm·1) 2975s,2931s,2876s,2829m,2625w,1461m,1360s, 1331m,1277m,12406m,1116s,1004s,850m·,796s,775s,625s. 例八Preparation of Ti(mmp)4 MmpH (4.41 g, 42 mmol) was gradually added dropwise to a pale brown solution of Ti(NEt2)4 (2.85 g, 3 ml; 8.47 mmol) dissolved in hexane (20 ml). This mixture was boiled for 1.5 hours in the case of a countercurrent, and then allowed to cool, and the volatiles were discharged by a vacuum to obtain a product (Ti (mmp) 4 as a pale brown oil. < Microanalysis: TiC2〇H44〇8 Calculated value C: 52.17%, Η: 9.63% Experimental value C: 51.95%, Η: 9.97% 'Η NMR (C6D5CD3 at 30°C) 5 1.3(24H5s5CH3OCH2 (CH3)2 C); δ 3·2 (20Η, 2 singlets, C7/3OQ^2(CH3)2C); VT 4 NMR shows a steep and distinct peak from _50°C to +50°C, no width is very clear of. l3C{lR}mAR(C6O5CO3, 30°〇: 31.9(00(αί3)2〇Η2ΟΟΗ3)5 | 64.5(OC(CH3)2CH2O^H3), 81.7(0£(CH3)2CH20CH3), 87(OC(CH3) 2£H2OCH3). IR (Nujol, cm·1) 2975s, 2931s, 2876s, 2829m, 2625w, 1461m, 1360s, 1331m, 1277m, 12406m, 1116s, 1004s, 850m·, 796s, 775s, 625s.
La(mmp)3的製備 取 2.89g(4.6mmol)的 La{N(SiMe3)2}3 溶於曱苯(50ml),然後 將mmpH(2.2ml,1.96g,18.7mmol)逐漸加入,在室溫持續擾拌21 15 1275657 小時,並_真空移崎發物,留下的棕色獅狀物即為本產物( 產出率:1.8g,87%相對於鑭)。 微量分析:LaC15H33〇6 計算值 C : 40.18%,η : 7.43% 實際值 C : 40.01%,η : 7.38% 例九 從 ZitOBu^mmph,Zr(mmp)4,Ηί(〇Βχι%(ππηρ)2 及Preparation of La(mmp)3 2.89 g (4.6 mmol) of La{N(SiMe3)2}3 was dissolved in toluene (50 ml), then mmpH (2.2 ml, 1.96 g, 18.7 mmol) was gradually added to the chamber. The temperature continued to disturb 21 15 1275657 hours, and _ vacuum shifted the hairpin, leaving the brown lion as the product (yield: 1.8g, 87% vs. 镧). Microanalysis: LaC15H33〇6 Calculated value C: 40.18%, η: 7.43% Actual value C: 40.01%, η: 7.38% Example 9 from ZitOBu^mmph, Zr(mmp)4, Ηί(〇Βχι%(ππηρ)2 and
Hf(mmp)4沉積出氧化鍅與氧化铪。 這四個化合物為以金屬有機化學氣相沉積法沉積二氧化锆與 二氧化給薄膜之極佳先質。下表—乃使躲舰丨化學氣相沉積 法,以相同的一般條件所產出的二氧化锆與二氧化铪薄膜。 表一 為一以 ΖΓ(ΟΒι4(ιηιηρ)2,ΖΓ(πιιηρ)4,Ηί(ΟΒιι%(πιπιρ)2 或Hf(mmp)4 deposits cerium oxide and cerium oxide. These four compounds are excellent precursors for the deposition of zirconium dioxide and dioxide to metal films by metal organic chemical vapor deposition. The following table—the zirconium dioxide and cerium oxide films produced by the same general conditions for the 丨 丨 chemical vapor deposition method. Table 1 is one of ΖΓ(ΟΒι4(ιηιηρ)2,ΖΓ(πιιηρ)4,Ηί(ΟΒιι%(πιπιρ)2 or
Hf(mmp)4為先質,使用液體射出化學氣相沉積法生長二氧化锆與 二氧化铪薄膜的生長條件。 基材溫度 350-650°C 反應器壓力 20-30 mbar 先質溶液濃度 0.1M於曱苯 先質溶液射出速率 4-8 cm3 hr"1 蒸發器J31I溫度 130-150〇C 氣氣載體流速 400-600 cn^min·1 氧氣流速 100-150 cm3min-1 16 1275657 基材 氧化物生長速率Hf(mmp)4 is a precursor, and growth conditions of zirconium dioxide and ruthenium dioxide films are grown by liquid injection chemical vapor deposition. Substrate temperature 350-650 ° C Reactor pressure 20-30 mbar Precursor solution concentration 0.1M in the reaction rate of the benzene benzene precursor solution 4-8 cm3 hr"1 Evaporator J31I temperature 130-150 〇C gas carrier flow rate 400 -600 cn^min·1 Oxygen flow rate 100-150 cm3min-1 16 1275657 Substrate oxide growth rate
義㈣Raman 義可確定是二氧化 鍅或二氧化铪;第二圖係顯示從Zr(0But)2(mm办或 Η’ΛΟηπιρ)2生長的二氧化結與二氧化給薄膜光譜;與結晶體 資料比對,這些薄膜多數屬於α或單斜晶系。 【圖式簡單說明】 · 第一圖係顯不ΜρΒι^ιηιηρ)2 (M=Zr或Hf)的想像結構。 第一圖係顯示Zr(mmp)4與Hf(mmp)4有相似的結構。 第三圖係顯示使用Zr(OBut)2(mmp)24 Hf(〇But)2 體射出金屬有· b學氣相沉積法生長的Ζι〇2與励2薄膜之雷 射Raman光譜。 【主要元件符號說明】 17The meaning of (4) Raman can be determined to be cerium oxide or cerium oxide; the second figure shows the spectrum of the dioxide and the dioxide which are grown from Zr(0But)2(mm or Η'ΛΟηπιρ)2; Yes, most of these films belong to the alpha or monoclinic system. [Simple description of the diagram] · The first figure shows the imaginary structure of ΒρΒι^ιηιηρ)2 (M=Zr or Hf). The first figure shows that Zr(mmp)4 has a similar structure to Hf(mmp)4. The third graph shows the Raman spectra of Ζι〇2 and Excited 2 films grown using Zr(OBut)2(mmp)24 Hf(〇But)2 body-exposed metal. [Main component symbol description] 17
Claims (1)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB0125724A GB0125724D0 (en) | 2001-10-26 | 2001-10-26 | Improved precursors for metalorganic chemical vapour deposition |
GB0129080A GB0129080D0 (en) | 2001-12-04 | 2001-12-04 | Improved precursors for chemical vapour deposition |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200300801A TW200300801A (en) | 2003-06-16 |
TWI275657B true TWI275657B (en) | 2007-03-11 |
Family
ID=9927019
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW91134964A TWI275657B (en) | 2001-10-26 | 2002-12-02 | Improved precursors for chemical vapour deposition |
Country Status (2)
Country | Link |
---|---|
GB (1) | GB0129080D0 (en) |
TW (1) | TWI275657B (en) |
-
2001
- 2001-12-04 GB GB0129080A patent/GB0129080D0/en not_active Ceased
-
2002
- 2002-12-02 TW TW91134964A patent/TWI275657B/en not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
TW200300801A (en) | 2003-06-16 |
GB0129080D0 (en) | 2002-01-23 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP4472338B2 (en) | An improved precursor for chemical vapor deposition. | |
JP6596737B2 (en) | Metal complexes containing amidoimine ligands | |
JP5161787B2 (en) | Cyclopentadienyl-type hafnium and zirconium precursors and their use in atomic layer deposition | |
US8962875B2 (en) | Metal-enolate precursors for depositing metal-containing films | |
EP2322530B1 (en) | Group 4 metal precursors for metal-containing films | |
KR20090054922A (en) | Metal complexes of tridentate beta-ketoiminates | |
JP5698161B2 (en) | Metal complexes for metal-containing film deposition | |
KR20120072986A (en) | Organometallic precursors for thin-film deposition of metal oxide or silicon-containing metal oxide, and deposition process of the thin films therefrom | |
TW202140500A (en) | Zinc compound, raw material for forming thin film, thin film, and method for manufacturing thin film | |
TWI839104B (en) | Preparation of lanthanide-containing precursors and deposition of lanthanide-containing films | |
KR102286114B1 (en) | Group iv transition metal compounds, preparation method thereof and process for the formation of thin films using the same | |
KR102375179B1 (en) | Alkoxide compound, raw material for forming thin film, method for producing thin film, and alcohol compound | |
TWI275657B (en) | Improved precursors for chemical vapour deposition | |
JP2003013227A (en) | Vapor deposition method for forming atom layer by using group iv metal precursor | |
KR101151462B1 (en) | Methods for deposition of group 4 metal containing films | |
KR20220058190A (en) | Group 3 metal precusor and thin film containing metal | |
KR102415479B1 (en) | Alkoxide compound, thin film-forming starting material, thin film formation method and alcohol compound | |
KR102567107B1 (en) | Group iv transition metal compounds, preparation method thereof and process for the formation of thin films using the same | |
KR20140136146A (en) | Silicon-containing organic metal precursor compound, a method for the preparation thereof, and method of manufacturing a silicon metal-oxide thin film | |
KR102639298B1 (en) | Organic metal compound, composition for depositing thin film comprising the organic metal compound, manufacturing method for thin film using the composition, thin film manufactured from the composition, and semiconductor device including the thin film |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |