TWI273233B - Device of inspecting defects after breaking display panel and inspection method thereof - Google Patents

Device of inspecting defects after breaking display panel and inspection method thereof Download PDF

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Publication number
TWI273233B
TWI273233B TW93132076A TW93132076A TWI273233B TW I273233 B TWI273233 B TW I273233B TW 93132076 A TW93132076 A TW 93132076A TW 93132076 A TW93132076 A TW 93132076A TW I273233 B TWI273233 B TW I273233B
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Taiwan
Prior art keywords
panel
linear displacement
image
scanning
motion
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TW93132076A
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Chinese (zh)
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TW200613720A (en
Inventor
Hung-Ming Li
Jr-Yi Tzeng
Guo-Feng Peng
Jia-Shin Liang
Mu-Fa Jian
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Gallant Prec Machining Co Ltd
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Priority to TW93132076A priority Critical patent/TWI273233B/en
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Publication of TWI273233B publication Critical patent/TWI273233B/en

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Abstract

The present invention provides a device of inspecting defects after breaking display panel and inspection method thereof. The inspection device includes a carrier and at least an image capturing section. The carrier has a panel with a side at least it can provide a first linear displacement motion and a rotation motion. The image capturing section has a first scanner and a second scanner, in which the scanning sides of the first scanner and the second scanner mutually correspond and separated by a scanning space, and provide a second linear displacement motion to adjust a scanning position. By performing at least once the first linear displacement motion and at least once the rotation motion, the carrier allows the side to pass through the scanning space, such that the image capturing section captures the images of the top and the bottom surfaces abutting on the side to inspect defect thereof.

Description

1273233 九、發明說明: 【發明所屬之技術領域】 本發明是有關於一種面板裂片後缺陷檢測裝置以及檢測方法,尤 其是指一種透過至少一影像擷取裝置來檢測裂片後面板之側邊正面以 及底面缺陷之面板裂片後缺陷檢測裝置以及檢測方法。 【先前技術】 隨著大尺寸薄膜電晶體液晶顯示(TFI1LCD)技術演進與玻璃基板 擴大化,薄膜電晶體液晶顯示應用產品由資訊科技的應用產品,例如 電腦顯示螢幕、筆記型電腦等,正逐漸擴展至影音以及家電用的市場, 其中尤其在家用電視等大型顯示器已經在國内外逐漸升溫,可以與電 漿電視以及内投影電視等未來數位電視的競爭者於市場中一較高下。 由於薄膜電晶體液晶顯示係利用控制液晶排列方向,讓光線通過液晶 時產生不同的折射率,再配合彩色濾光片與偏光板(pdarizer)作用產生 影像,具有高解析度的顯示能力與低耗能、極輕薄的優點,使其有機 會成為下一世代高晝質數位電視(HDTV,High_Defmiti〇n Tdevisi〇n)的 主流產品,再加上國内的面板大廠不遺餘力的投入更高代數的面板量 產技術,使得目前液晶電視(Liquid Crystai Display及丨^以〇11)在未來具 有尚產量低價格的潛力,可於全球廣大的家電市場中佔有一席之地。 在面板的製程當中可以概分為前段(Array)、中段(ceu)以及後段 (ModuleAssembly)。在中段製程中大概可分為灑間隔物、貼合、裂片、 灌注液晶以及封口軸段。其巾在裂片階段巾,因為綱容易碎裂的 特性’常常使_面板尤其在邊緣區域產生不良的情況,所以在玻璃 面板進行裂片加工之後,對於加工後之玻璃面板品質檢測相當的重 要。不過目前對於該裂片製程階段的檢測多依賴於人力目視的檢測, 所以不論在檢出效率以及準確性等皆纽善的空間。尤其是在面板尺 5 1273233 十逐漸增大離況下,人叫目概_來越不容易 ,而且人力也會 因為疲勞崎低缺_觸力。综合上述如何以自動化制的方式來 解決目前的_以及不便之處,實__域之f界需要投入心力解 決0 【發明内容】 、本發_主要目的是提供—種面板烈後缺陷檢測裝置以及檢測 方法’其係侧自動化·錄的方式來達顺升鱗、降低成本以 及克服大型面板不易檢測之目的。 本毛明的-人要目的疋提供一種面板裂片後缺陷檢測裝置以及檢測 方法,其係影細取裝絲練與面_邊_接之頂面以及底 面之衫像,達到提南缺陷檢測率之目的。 為了達到上述之目的,本發明係提供一種面板裂片後缺陷檢測裝置 以及檢測方法,該檢測裝置其係包括有—載台部以及至少_影像娜 部三該載台部’其係可承載具有至少—側邊之面板。該載台部可提供 二第-線性位移運動以及-旋轉運動。該影像麻部其係具有一第一 及一第二掃描體’該第一掃描體與該第二掃描體之掃描側相 對應且以—掃描空間為區隔。該影像擷取部,其係可提供一第二線性 位移運動調整掃描位置。其中,該載”可藉由至少—次該第一線性 位移運動以及至少-次該旋轉運動使該侧邊通過該掃描空間,而使該 影像擷取部擷取與該側邊相鄰接之頂面以及與制邊轉接之底蚊 影像,以檢測缺陷。 一 為了達到上述之目的,本發明更提供—種面板裂片後缺陷檢測方 〆/、係可檢查一面板周圍邊緣之缺陷,該面板其係呈 該檢測方法其係包括有下列步驟:⑻提^古诗达, 1273233 供承載該蛛从雜細嫌—雜 :=r;旋轉運動,該_取部可 向,独該第二線性位移運動將心 使進仃“―線性位移運動,使該側邊通過該掃描空間, 相取與該侧邊相鄰接之頂面區域影像以及與該側邊 域縣;⑷於崎_如,雌轉運動將 "、疋、疋角度’使得與該側邊相鄰之另-側邊平行於該第-線 陳移運動方向’並㈣第二線性位移運動將該影細取部調整至適 當位置;(e)重複該步驟(啦該步驟⑼,直到該若干個側邊全部取像完 畢,⑴完成影像資料處理; 【實施方式】 >為使貴審查委員能對本發明之特徵、目的及功能有更進一步的 認知與瞭,,下文特將本發明之裝置的相關細部結構以及财的理念 原由進彳于綱’以使得審查委員可以了解本發明之特點,詳細說明陳 述如下 —凊參閱圖一所示,該圖係為本發明面板裂片後缺陷檢測裝置之較佳 實施例立體組合示意圖。該面板裂片後缺陷檢測裝置 2其係可以檢測 面板周圍之缺損、破、裂以及殘料等缺陷或不良。該面板裂片後缺陷 檢測裝置2其係具有一載台部21卩及-對影像擷取部22。該載台部 21,其係可承载一面板9,該面板9其係具有至少一側邊91,該側邊 相鄰接有一頂面92以及一底面93。 该載台部其係具有一線性導軌體211、一旋轉體212以及一載盤體 213。該線性導執體211,其係可提供一線性位移運動61。該旋轉體 1273233 線性位移運動62正交。 在前述所述之光線,其係為提供檢測面板缺陷時所需之亮度。基本 上為了達到實施檢測的目的,該光線的提供可以分為三類,一為軸向 光源(參閱圖三A),其係為將提供一光源71,使該光源所發射出來之 光線經由設置於該影像掃描器74之一光軸孔72再經由反射的物理現 象將光線導入到該面板73。其二為正向光源(參閱圖三B),其係為提 供該光源71,利用該光源所發射出來之光線投射到該面板乃之正面, 以提供影像掃描ϋ 74掃描所須之亮度。以及背光源(參剩三c),其 係為提供該光源7;1,利贱光賴發射出來之光線投朗該面板73 之背面。而在本實施例中所實施的光源方式係為利用軸向光源,透過 影像掃描ϋ 74打到面板上,以提供影像掃描器74足夠之亮度來檢測 面板之缺陷。 、 -為了壯龍述整個裝置之檢财法的流程,請輯參閱圖四所 示’ δ謂係為本發明面板裂片後缺陷檢測方法流程圖。該檢測流程3 其係可檢查-矩形面板5之缺陷,雜形面板5其係具有—對短側邊 51、52以及-對長側彡53、54 ’該對短側邊以及長側邊相鄰接有一頂 面55以及一底面56,該檢測方法其係包括有下列步驟: 、 31提供-缺陷檢測裝置2(參閱圖五Α),該缺陷檢測裝置2其係包括 有-載台部21以及-對影像擷取部22。該載台部21可提供承载 該矩形面板5以及提供該矩形面板5於一線性導執體211兩端之 間進行-第-線性位移運動61以及一旋轉運動63,該影像操取部 22可以-第二線性位移 62輕掃描位置,該影像擷取部2 其係更具有-第-掃描體223以及-第二掃描體224,該第一婦描 體223與該第二掃描體224之掃描側相對應且以-掃描空間^ 為區隔,該影像擷取部22可於該掃描空間22S中掃描影像。1中, 該對影像揭取部22之該第二線性位移運動62係於同一直線上, l273233 且該對影像娜部22以該第-線性位移運動61為巾心線,分別 位於該第一線性位移運動61之兩側。 刀 32於該線性導軌體211之一端係將該矩形面板5置放於該載台部η, 使輯紐側邊51、52平行於該第一線性位運動W行進方向,並 3^以該第^線性位移運動62將該對影像擷取部22調整至適當位置; 進行該第-線性位移運動61,使該對短侧邊51、52通過該田象 ,取^2之掃描空間225,使得該第一掃描體223掃描掏取二 Μ、52相鄰接之頂面%影像以及該第二掃描體224掃描 操取與該短側邊51、52相鄰接之底面%影像(參關 ^線性導β軌體211之另一端以該旋轉運動_亥面板5旋轉九 使付與_域丨5卜52浦之該對長側邊Β、$行 於該第一線性位移運動61方 娜w / 弟二線性位移運動62將 该對衫像擷取部22調整至適當位置; ^仃忒第-雜位移運動61,使該細邊53、54通過 =之掃描節25,使得該第一掃描體223掃二: 54相祕之頂® 55影像以及該第二掃描體224掃洲 取與該長側邊53,相鄰―成㈣^田擁 作; 相岫接之底面56影像,以完成影像擷取動 36完成影像資料處理; 其中’該步驟%其係更包括有下列步驟: 361進行影像測長演算; 362進行缺陷判斷; 363顯示缺陷資料以及存入資料庫。 測,嶋(如六邊形)進行檢 位移運動61 ^ ρ 之角度使得·邊平行於該第一線性 方向,並貫施複數次該第一線性位移運動61、複數次該 10 1273233 =嫌=獅62以及複數她_動63,隨即完成整個檢測 之〜私。其中該缺陷檢測裝置2可以檢測面板尺寸丨吋至幻吋。 請^續參酬六所示,關係為糊本翻面板裂片後缺陷檢測裝 置、-且成之k測機台前視示_。該缺陷檢測機台4料且有一載 4卜-對影像擷取部42、—柱體43、—大理石桌部私、、至少一 ^ ,震器45以及-支撐部46。該載台部41係位於該大理石桌部44之 ^上,騎景綱取部42係與雜體43相連接,雜體Μ係連接 於献理石桌部44,該空氣避震器45係位_大理石桌部44桌面之 與該纽石桌部44相連接’以提供該載台部41以及該對影 二=42防震以及平衡。該支撐部46额該空氣避震器45連接可 提供支撐該大理石桌部44。 -綠t中該載台部41其係更包括有—載盤體411、—旋轉體412以及 ^ ¥執體413。該影像擷取部42其係更包括有一滑軌體42卜至 二弟-掃描體422、-支架423以及至少—第二掃描體424。至於該 ^ ^以及該聰職取部42之運作方式已齡前祕細說明中 撰述,在此不多做說明。 除此之外軸在概實施财_—對之影像娜裝置來達到檢 二之目的,在本發明之精神之下單—影像擷取裝置也可以達到目 =要侧复數次該旋轉運動63以及配合複數次之該第一線性位移 運動61,同樣可以達到檢測之效果。 r唯让所述者’僅為本發明之較佳實施例,當不能以之限制本發明 P大凡依本發明申請專利範圍所做之均等變化及修飾, 仍將不 狀縣所在,亦不脫離本發明之 故都應 發明的進一步實施狀況。 s T、口上述、本發明由於具有操作容易、製造簡單以及裝配容易之特 斤乂可以献業界之需求,境而提高該產業之競爭力,誠已符合 1273233 發明專利法所規定申請發明所需具備之要件,故爰依法呈提發明專利 之申請,謹請貴審查委員允撥時間惠予審視,並賜準專利為禱。1273233 IX. Description of the Invention: [Technical Field] The present invention relates to a panel split defect detecting device and a detecting method, and more particularly to detecting a side surface of a rear panel of a splitting piece through at least one image capturing device and Panel crack defect detection device and detection method for bottom defect. [Prior Art] With the evolution of large-size thin film transistor liquid crystal display (TFI1LCD) technology and the expansion of glass substrates, thin film transistor liquid crystal display applications are gradually applied by information technology applications such as computer display screens and notebook computers. Expanded to the market for audio and video and home appliances, especially in large-scale displays such as home TVs, which have gradually warmed up at home and abroad, and can compete with competitors of future digital TVs such as plasma TVs and internal projection TVs in the market. Since the thin film transistor liquid crystal display system controls the alignment direction of the liquid crystal to generate different refractive indexes when the light passes through the liquid crystal, and then works with a color filter and a polarizer to generate an image, and has high resolution display capability and low consumption. The advantages of being able to be extremely thin and light make it an opportunity to become the mainstream product of the next generation of high-definition digital TV (HDTV, High_Defmiti〇n Tdevisi〇n), plus the domestic panel makers spare no effort to invest in higher algebra The mass production technology of the panel makes the current LCD TV (Liquid Crystai Display and 丨^以〇11) have the potential of low output in the future, and can occupy a place in the global home appliance market. In the process of the panel, it can be divided into the front segment (Array), the middle segment (ceu), and the rear segment (ModuleAssembly). In the middle process, it can be divided into sprinkler spacers, lamination, splitting, perfusion liquid crystal and sealing shaft segments. The towel is in the sipe stage, because the characteristics of the cleavage are often caused to cause defects in the panel, especially in the edge region. Therefore, after the slab processing of the glass panel, the quality inspection of the processed glass panel is quite important. However, at present, the detection of the splicing process stage relies on the detection of human visual inspection, so there is room for goodness in both detection efficiency and accuracy. Especially in the case that the panel ruler 5 1273233 is gradually increasing, the more difficult it is, the more difficult it is, and the manpower will be lacking due to fatigue. In summary, how to solve the current _ and inconvenience in an automated way, the real world __ domain needs to be put into the heart to solve 0 [invention], the main purpose is to provide a kind of panel after the defect detection device And the detection method's system side automation and recording method to achieve the scale, reduce costs and overcome the difficulty of large panels. Ben Maoming's purpose is to provide a panel crack detection device and a detection method, which are used to capture the surface of the surface and the bottom surface of the surface. The purpose. In order to achieve the above object, the present invention provides a panel split defect detecting device and a detecting method, the detecting device comprising a carrier portion and at least an image bearing portion capable of carrying at least - Side panel. The stage portion provides two-first linear displacement motion and - rotational motion. The imaging hem has a first and a second scanning body. The first scanning body corresponds to the scanning side of the second scanning body and is separated by a scanning space. The image capturing unit is configured to provide a second linear displacement motion to adjust the scanning position. Wherein, the load may be caused by the first linear displacement motion and the at least one rotation motion to pass the side edge through the scanning space, so that the image capturing portion is adjacent to the side edge The top surface and the mosquito image transferred to the edge to detect the defect. In order to achieve the above purpose, the present invention further provides a defect detection after the panel splitting, which can inspect the defects around the edge of a panel. The panel is in the detection method and includes the following steps: (8) mentioning the ancient poetry, 1273233 for carrying the spider from the miscellaneous miscellaneous: miscellaneous: = r; rotary motion, the _ take-up can be, the second The linear displacement motion will cause the heart to move into a "linear displacement motion, so that the side passes through the scanning space, and the top surface area image adjacent to the side edge is taken along with the side domain county; (4) Yu Qi_ru , the female rotation movement will be ", 疋, 疋 angle 'such that the other side adjacent to the side is parallel to the first-line aging movement direction' and (four) the second linear displacement movement adjusts the shadow To the appropriate position; (e) repeat the step (this step (9) until All of the sides are imaged, (1) image data processing is completed; [Embodiment] > In order to enable the reviewing committee to further understand the features, objects and functions of the present invention, the present invention will be further described below. The detailed structure of the device and the concept of the financial concept are intended to enable the reviewing committee to understand the characteristics of the present invention. The detailed description is as follows - see Figure 1, which is a panel crack detection device for the present invention. The preferred embodiment of the present invention is a three-dimensional combination diagram. The panel split defect detecting device 2 can detect defects or defects such as defects, breaks, cracks and residual materials around the panel. The panel split defect detecting device 2 has a load. a table portion 21 and a pair of image capturing portions 22. The stage portion 21 is configured to carry a panel 9 having at least one side edge 91 adjacent to a top surface 92 and A bottom surface 93. The stage portion has a linear rail body 211, a rotating body 212 and a carrier body 213. The linear guiding body 211 provides a linear displacement movement 61. The rotating body 1273233 linear displacement motion 62 is orthogonal. In the foregoing light, it is required to provide the brightness required for detecting the defect of the panel. Basically, for the purpose of performing the detection, the supply of the light can be divided into three categories. An axial light source (see FIG. 3A) is provided with a light source 71 such that the light emitted by the light source passes through a physical phenomenon disposed in the optical axis hole 72 of the image scanner 74 and then reflected. The light is introduced into the panel 73. The second is a forward light source (see Fig. 3B), which is to provide the light source 71, and the light emitted by the light source is projected onto the front side of the panel to provide image scanning. The brightness required for scanning, and the backlight (remaining three c), is to provide the light source 7; 1, the light emitted by the light is applied to the back of the panel 73. In the embodiment, the light source mode is implemented by using an axial light source to scan the image through the image scanning unit 74 to provide sufficient brightness of the image scanner 74 to detect defects of the panel. - In order to describe the flow of the entire device's procurement method, please refer to Figure 4 for the δ predicate as the flow chart of the defect detection method after the panel split. The detection flow 3 is capable of inspecting the defects of the rectangular panel 5, which has a pair of short sides 51, 52 and a pair of long sides 、 53, 54 'the pair of short sides and long sides Adjacent to a top surface 55 and a bottom surface 56, the detection method includes the following steps: 31, providing a defect detecting device 2 (see FIG. 5A), the defect detecting device 2 including a stage portion 21 And the image capturing unit 22. The stage portion 21 can provide the rectangular panel 5 and provide the rectangular panel 5 between the two ends of a linear guide body 211 - a linear displacement movement 61 and a rotational movement 63. The image manipulation portion 22 can a second linear displacement 62 light scanning position, the image capturing portion 2 further having a -first scanning body 223 and a second scanning body 224, the first female body 223 and the second scanning body 224 scanning The side is corresponding and separated by a scanning space, and the image capturing unit 22 can scan an image in the scanning space 22S. 1 , the second linear displacement motion 62 of the pair of image extracting portions 22 is on the same line, l273233 and the pair of image capturing portions 22 are the first linear displacement motion 61 as the center line of the towel, respectively located at the first Both sides of the linear displacement motion 61. The knife 32 is placed on the stage portion η at one end of the linear rail body 211, so that the side edges 51, 52 move parallel to the first linear position W, and The second linear displacement motion 62 adjusts the pair of image capturing portions 22 to an appropriate position; the first linear displacement motion 61 is performed such that the pair of short sides 51, 52 pass through the field image, and the scanning space 225 is taken. The first scanning body 223 scans the top surface % image of the adjacent two sides, 52 and the second scanning body 224 scans and captures the bottom surface % image adjacent to the short side edges 51, 52 (see The other end of the linear guide β rail body 211 is rotated by the rotary motion_the fifth panel 5 to make the pair of long side edges $, and the first linear displacement motion 61 The squared w/two linear displacement motion 62 adjusts the pair of shirts to the appropriate position 22; ^ 仃忒 first-missing movement 61, so that the thin sides 53, 54 pass the scan section 25 of = The first scanning body 223 sweeps two: 54 phase top 3 image and the second scanning body 224 sweeps the side and the long side 53 adjacent to the "four" ^ field; The image of the bottom surface 56 is connected to complete the image capturing operation 36 to complete the image data processing; wherein 'the step % includes the following steps: 361 performs image length measuring; 362 performs defect judgment; 363 displays defect data and deposits The data is measured, 嶋 (such as a hexagon) is subjected to a displacement motion 61 ^ ρ such that the edge is parallel to the first linear direction, and the first linear displacement motion is applied 61 times, the plurality of times 10 1273233 = suspicion = lion 62 and plural _ move 63, then complete the entire test ~ private. The defect detection device 2 can detect the panel size 吋 to the illusion. Please continue to participate in the six, the relationship is paste The defect detecting device of the flipping slab, and the front detecting device of the measuring machine _. The defect detecting machine 4 is material and has a load of 4 b - the image capturing portion 42, the column 43, the marble table a private part, at least one, a shock absorber 45, and a support portion 46. The stage portion 41 is located on the marble table portion 44, and the riding frame portion 42 is connected to the hybrid body 43. Connected to the stone table 44, the air shock absorber 45 is tied to the table_marble table 44 tabletop is connected to the stone table 44 to provide the stage 41 and the pair of shadows=42 for shock and balance. The support portion 46 is connected to the air absorber 45 to provide support for the marble table 44. The green portion t of the stage portion 41 further includes a carrier body 411, a rotating body 412, and a mounting body 413. The image capturing portion 42 further includes a sliding rail body 42 The second brother-scanned body 422, the scaffold 423, and at least the second scanned body 424. As for the operation of the device and the operation of the device, the description has been made in the in-depth explanation, and will not be described here. In addition to this, the axis is implemented by the image-based device to achieve the purpose of detecting the second. In the spirit of the present invention, the single-image capturing device can also achieve the target. And the first linear displacement motion 61 matched with the plurality of times can also achieve the detection effect. R is merely a preferred embodiment of the present invention, and when it is not possible to limit the ordinary changes and modifications made by the present invention to the scope of the patent application of the present invention, it will remain in the county and will not leave. Further developments of the invention are contemplated by the present invention. s T, mouth, the above, the invention has the advantages of easy operation, simple manufacture and easy assembly, and can provide the needs of the industry, thereby improving the competitiveness of the industry, and has met the requirements of the invention patented in accordance with the 1273323 invention patent law. If you have the necessary requirements, you will be required to file an invention patent in accordance with the law. Please ask your review committee to allow time for review and grant the patent as a prayer.

12 1273233 【圖式簡單說明】 圖一係為本發明面板裂片後缺陷檢測裝置之較佳實施例立體組合 示意圖。 圖二係為本發明面板裂片後缺陷檢測裝置之較佳實施例中之第二 掃描體立體示意圖。 圖三A至圖三C為檢測光源示意圖。 圖四A係為本發明之較佳實施例之面板裂片後缺陷檢測方法流程 圖。 圖四B係為本發明之較佳實施例之面板裂片後缺陷檢測方法流程 中之資料處理流程示意圖。 圖五A係為本發明面板裂片後缺陷檢測裝置之較佳實施例檢測面 板立體示意圖。 、 /㈣本發明面板則後缺陷檢崎置之紐實施例面板通 過知^田區域正視示意圖。 視示圖轉利用本發明面板裂片後缺陷檢測裝置組成之檢纖台前 圖號說明: 2-面板衣片後缺陷檢測装詈 21- 載台部 211- 線性導軌體 212- 旋轉體 213- 载盤體 22- 影像操取部 221-滑軌部 222_支架 13 1273233 223- 第一掃描體 2231- 線掃描攝影機 223 la-光軸孔 2232- 線掃描攝影機 2232a-光軸孔 . 224- 第二掃描體 . 2241-線性掃描攝影機 224 la-影像折向鏡 2241b-光軸孔 φ 225- 掃描空間 3- 檢測流程 31〜36-步驟 361〜363-步驟 4- 缺陷檢測機台 41- 載台部 411_載盤體 412- 旋轉體 413- 線性導執體 · 42- 影像擷取體 _ 421- 滑軌部 422- 第一掃描體 423- 支架 424- 第二掃描體 43_柱體 44_大理石桌部 45-空氣避震器 1412 1273233 BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a perspective view of a preferred embodiment of a panel split defect detecting device of the present invention. Fig. 2 is a perspective view showing the second scanning body in the preferred embodiment of the panel split defect detecting device of the present invention. Figure 3A to Figure 3C are schematic diagrams of the detection source. Figure 4A is a flow chart showing a method for detecting defects after panel splitting according to a preferred embodiment of the present invention. Figure 4B is a schematic diagram of the data processing flow in the flow of the method for detecting defects after panel splitting according to a preferred embodiment of the present invention. Fig. 5A is a perspective view showing a detecting panel of a preferred embodiment of the panel split defect detecting device of the present invention. / (4) The panel of the present invention is a schematic view of the front panel of the defect-preventing substation. The front view of the fiber inspection table consisting of the defect detection device after the panel splitting of the present invention is illustrated: 2-panel after piece defect detection device 21-stage portion 211- linear guide body 212-rotating body 213- Disk body 22 - image manipulation portion 221 - slide portion 222_ bracket 13 1273233 223 - first scanning body 2231 - line scanning camera 223 la - optical axis hole 2223 - line scanning camera 2232a - optical axis hole. 224 - second Scanning body. 2241-Linear scanning camera 224 la-image folding mirror 2241b-optical axis hole φ 225- scanning space 3 - detection flow 31~36-step 361~363-step 4- defect inspection machine 41-stage 411_carrier body 412-rotating body 413- linear guide body·42- image capturing body_421-sliding portion 422-first scanning body 423-bracket 424-second scanning body 43_cylinder 44_marble Table 45-air shock absorber 14

Claims (1)

切233 十、申請專利範圍·· 匕種面板裂片後缺陷檢概置,其係包括有: 1台部,其係可轉—面板,該面板其储有至少 =部可提供該面板進行-第—線性位移運動以及-旋轉 至少一影像擷取部,其係具有: 二執,其係位於销台部之_側,該滑軌 第二線性位移運動之一支架; ,、穷r進仃一 至少-第-掃娜, 與該側邊相鄰接之—頂面;以&amp; 《“體可知描 至係與該支架相連接,該第二掃描體之婦描 側邊相掃描側相對應,該第二掃描體可掃描與該 2,卩:«物娜 第=:r _裝置,其侧 苐一$偾构 &amp;一 y 4取邛以及一第二影像擷取部,該 像掏取部係以該第-線性動^弟:影像娜部與該第二影 位移運動之兩侧。 動為中心線,分別位於該第-線性 I如台第1項所述之面板判後缺陷檢聰置,其中該載 二^導軌體,其係可提供該第—線性位移運動,· 軌體相連接且可提供該旋轉運動,該旋 错由_弟一線性位移運動於該線性導執體上移動;以及 1273233 —載盤體,其係無_體相連接且可提供承_硫,並藉由該 旋轉運動進行轉動。 •如申明專利犯圍第丨項所述之面板裂片後缺陷檢測裝置,其中該第 一線性位移運域鄕二_位製動正交。 •如申:專利乾圍第丨項所述之面板裂片後缺陷檢測裝置,其中該第 一掃描體係為—線掃觸影機(Line Sean Camera)。 •如申叫專利粑圍第1項所述之面板裂片後缺陷檢測裝置,其中該第 二掃描體係為-線掃描攝影機(Line Scan Camera)。 士申:專利I巳圍第1項所述之面板裂片後缺陷檢測裝置,其中該第 %^田,更包括有—光軸孔,其係可以提供光線進人以提供掃描時 所給之梵度。 8·如申明專利城第丨項所述之面板則後缺陷檢 二掃描體係更包括有: ^ 光軸孔,其係可以提供光線進入以提供掃描時所需之亮度;以 及 一,像折向鏡,其係、位於該第二掃描體之前端,可將該底面之影 像透過反射導入至該第二掃描體。 , 9·如專利細第丨項所述之面板裂片後缺陷檢測裝置,其係更具 有: 一 理部 ]大理石桌面’制提供置放該載台部以及該影像處 , 卓其綠於献理石桌部桌面之與該大理石 ^_輕,贿倾載”以及該影細取雜震與平衡,·以 -支料,其係與辭衡部連接可提供支撐該大理石桌部。 .如申請專利範圍第!項所述之面板裂片後缺陷檢測裝置、,其令該面 17 1273233 板尺寸係為1 p寸至65 11寸。 11· 一種面板裂片後缺陷檢測方法,其係可檢查一面板周圍邊緣之缺 陷,該面板其係具有若干個側邊,該檢測方法其係包括有下列步驟: (a)提供一缺陷檢測裝置,該缺陷檢測裝置其係包括有一載台部 以及至少一影像擷取部,該載台部可提供承載該面板以及提 供該面板於進行一第一線性位移運動以及一旋轉運動,該影 像擷取邛可以一第二線性位移運動調整掃描位置,該影像棵 取部可進行掃描與該側邊相鄰接之一頂面以及一底面; ⑼將該面板置放於該載台部,使該側邊平行於該第一線性位移 運動仃進方向’並以該第二線性位移運動將該影像操取部調 整至適當位置; ⑹進行該第-線性位移運動,使該側邊通過該影像操取部,使 得該影像擷取部擷取該頂面以及該底面之影像; ⑷以該旋轉運動將該面板旋轉特定肢,使得與該側邊相鄰之 側邊平行於該第一線性位移運動方向,並以該第二線性 位移運動將該影像擷取部調整至適當位置。 進一步重複該步驟(C)至該步驟(d), 像0 12.1口申2利範圍第11項所述之面板裂片後缺陷檢測方法,其係可 以擷取該若干個側邊之全部影 圍f 11項所述之面板裂片後缺陷檢測方法,射該 乂…()後係進一步包括有一步 本〆、x 包含下列步驟·· 7剛心像貝科處理,該步驟(f)其係 (fi)進行影像測長演算; (£2)進行缺陷判斷; (β)顯示缺陷資料以及存入資料庫。 ’其中該第 14·如申請專利範11項所述之面板細缺陷_方法 1273233 一線性位移運動與該第二線性位移運動正交。 19Cut 233 Ten, the scope of application for patents · 匕 面板 面板 面板 面板 面板 面板 缺陷 面板 面板 面板 面板 面板 面板 面板 面板 面板 面板 面板 面板 面板 面板 面板 面板 面板 面板 面板 面板 面板 面板 面板 面板 面板 面板 面板 面板 面板 面板 面板 面板 面板 面板 面板 面板 面板- linear displacement motion and - rotation of at least one image capturing portion, which has: two holdings, which are located on the side of the pin table portion, the second linear displacement movement of the sliding rail is one of the brackets; At least - the first - the second, adjacent to the side - the top surface; with &&quot; "the body can be seen to connect to the stent, the second scanning body corresponding to the scanning side of the scanning side The second scanning body can be scanned with the 2, 卩: «物娜第=:r _ device, the side of which is a 偾 偾 &&; y 4 邛 and a second image capturing portion, the image Taking the first linear motion: the image Na and the two sides of the second shadow displacement movement. The motion is the center line, and the panel is located in the first linear I, as described in the first item of the table. Inspecting the Cong, where the two rails are provided, which provide the first linear displacement motion, and the rails are connected and available a rotational motion that moves on the linear guide body by a linear displacement motion; and a 1273233 - carrier body that is _ body-connected and provides sulphur, and is performed by the rotational motion Rotating. • A panel splitting defect detection device as described in the patent stipulations, wherein the first linear displacement domain is orthogonal to the second _bit brake. • Ru Shen: Patent Dry Wai Dimension The panel cleavage defect detecting device, wherein the first scanning system is a Line Sean Camera. The panel cleavage defect detecting device according to Item 1 of the patent application, wherein The second scanning system is a line scan camera. The invention relates to a panel splitting defect detecting device according to the first aspect of the invention, wherein the first % field further includes an optical axis hole. The system can provide light into the person to provide the Brahman given when scanning. 8·If the panel described in the third paragraph of the Patent City, the post-defect detection system further includes: ^ Optical axis hole, which can provide Light enters to provide the scan And a folding mirror, which is located at a front end of the second scanning body, and can transmit the image of the bottom surface to the second scanning body through reflection. 9 is as described in the patent specification The panel cleavage defect detecting device further has: a faculty] marble tabletop system for providing and placing the gantry portion and the image portion, and the gems are placed on the tabletop of the stone table and the marble is light. The bribes are dumped and the shadows are taken from the earthquake and balance. The support is connected to the rhetoric to provide support for the marble table. Such as the scope of patent application! The panel splitting defect detecting device described in the item is such that the surface of the surface of the 12 1273233 is 1 p inch to 65 11 inch. A method for detecting a defect after panel splitting, which is capable of inspecting a defect of a peripheral edge of a panel, the panel having a plurality of sides, the detection method comprising the following steps: (a) providing a defect detecting device, The defect detecting device includes a stage portion and at least one image capturing portion, the stage portion can provide the panel and provide the panel for performing a first linear displacement motion and a rotation motion, and the image capturing device The scan position can be adjusted by a second linear displacement movement, and the image picking portion can scan a top surface and a bottom surface adjacent to the side edge; (9) placing the panel on the stage portion, so that the side The side parallel to the first linear displacement movement direction 'and adjusts the image manipulation portion to an appropriate position by the second linear displacement motion; (6) performing the first linear displacement motion, causing the side to pass the image operation Taking a portion such that the image capturing portion captures an image of the top surface and the bottom surface; (4) rotating the panel with a specific limb by the rotational motion such that a side adjacent to the side edge is parallel In the first linear displacement motion direction, the image capturing portion is adjusted to an appropriate position by the second linear displacement motion. Further repeating the step (C) to the step (d), the panel splitting defect detecting method described in Item 11 of the 12.1 section 2, which can capture all the shadows of the plurality of sides. The method for detecting defects after panel splitting according to item 11 is to further include a step 〆, x includes the following steps: 7 rigid heart like Becco processing, the step (f) is (fi) Perform image length measurement; (£2) perform defect judgment; (β) display defect data and deposit it into the database. </ RTI> <RTIgt; </ RTI> <RTIgt; </ RTI> <RTIgt; </ RTI> <RTIgt; </ RTI> <RTIgt; 19
TW93132076A 2004-10-22 2004-10-22 Device of inspecting defects after breaking display panel and inspection method thereof TWI273233B (en)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8023721B2 (en) 2008-08-18 2011-09-20 Chunghwa Picture Tubes, Ltd. Panel inspection device and inspection method of panel
TWI656673B (en) * 2017-12-22 2019-04-11 旭東機械工業股份有限公司 Display panel shading layer image acquisition method and inspection device thereof

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8023721B2 (en) 2008-08-18 2011-09-20 Chunghwa Picture Tubes, Ltd. Panel inspection device and inspection method of panel
TWI656673B (en) * 2017-12-22 2019-04-11 旭東機械工業股份有限公司 Display panel shading layer image acquisition method and inspection device thereof

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