TWI265297B - Examination machine for electronic component test socket - Google Patents
Examination machine for electronic component test socketInfo
- Publication number
- TWI265297B TWI265297B TW94119097A TW94119097A TWI265297B TW I265297 B TWI265297 B TW I265297B TW 94119097 A TW94119097 A TW 94119097A TW 94119097 A TW94119097 A TW 94119097A TW I265297 B TWI265297 B TW I265297B
- Authority
- TW
- Taiwan
- Prior art keywords
- tester
- pins
- examination machine
- socket
- holding mechanism
- Prior art date
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
The present invention provides an electronic component test socket examination machine, which employs a movable base of a driving mechanism to link and drive an intermediate mechanism to perform vertical displacement. The vertical rack of the intermediate mechanism is used for mounting a holding mechanism and the carrier of the holding mechanism is allowed to perform vertical displacement. An examination mechanism with a tester is mounted on the horizontal rack of the intermediate mechanism and a detector connected with the carrier of the holding mechanism is installed below the tester. Also, an electric testing unit is separately connected with the tester and a loader for loading and moving the under testing socket. When the driving mechanism drives the tester to press against the pins of the testing socket, a conductive loop is formed and the electric testing unit can be used for detecting the resistance of the pins and, when the tester is pushed by the reactive force of the pins, the tester can use the holding mechanism to perform reverse displacement so to press against the examination machine and allow the examination machine to detect the spring flexibility of the pins. Hence, automatic testing of test socket pins can be accomplished for cost reduction and test quality improvement.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW94119097A TWI265297B (en) | 2005-06-09 | 2005-06-09 | Examination machine for electronic component test socket |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW94119097A TWI265297B (en) | 2005-06-09 | 2005-06-09 | Examination machine for electronic component test socket |
Publications (2)
Publication Number | Publication Date |
---|---|
TWI265297B true TWI265297B (en) | 2006-11-01 |
TW200643431A TW200643431A (en) | 2006-12-16 |
Family
ID=38122176
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW94119097A TWI265297B (en) | 2005-06-09 | 2005-06-09 | Examination machine for electronic component test socket |
Country Status (1)
Country | Link |
---|---|
TW (1) | TWI265297B (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI412770B (en) * | 2009-12-22 | 2013-10-21 | Zhen Ding Technology Co Ltd | Apparatus and method for testing printed circuit board |
TWI427296B (en) * | 2011-10-04 | 2014-02-21 | Advanced Semiconductor Eng | Probe card and testing method |
CN110794176A (en) * | 2018-08-03 | 2020-02-14 | 矽品精密工业股份有限公司 | Detection device |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW201129804A (en) * | 2010-02-26 | 2011-09-01 | Mpi Corp | Elastic contact device |
TWI823666B (en) * | 2022-11-04 | 2023-11-21 | 穎崴科技股份有限公司 | Probe suction nozzle unit, automatic probe replacement machine and automatic probe replacement method |
-
2005
- 2005-06-09 TW TW94119097A patent/TWI265297B/en active
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI412770B (en) * | 2009-12-22 | 2013-10-21 | Zhen Ding Technology Co Ltd | Apparatus and method for testing printed circuit board |
TWI427296B (en) * | 2011-10-04 | 2014-02-21 | Advanced Semiconductor Eng | Probe card and testing method |
CN110794176A (en) * | 2018-08-03 | 2020-02-14 | 矽品精密工业股份有限公司 | Detection device |
CN110794176B (en) * | 2018-08-03 | 2022-05-31 | 矽品精密工业股份有限公司 | Detection device |
Also Published As
Publication number | Publication date |
---|---|
TW200643431A (en) | 2006-12-16 |
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