TWI265297B - Examination machine for electronic component test socket - Google Patents

Examination machine for electronic component test socket

Info

Publication number
TWI265297B
TWI265297B TW94119097A TW94119097A TWI265297B TW I265297 B TWI265297 B TW I265297B TW 94119097 A TW94119097 A TW 94119097A TW 94119097 A TW94119097 A TW 94119097A TW I265297 B TWI265297 B TW I265297B
Authority
TW
Taiwan
Prior art keywords
tester
pins
examination machine
socket
holding mechanism
Prior art date
Application number
TW94119097A
Other languages
Chinese (zh)
Other versions
TW200643431A (en
Inventor
Li-Da Jang
Original Assignee
Hon Tech Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hon Tech Inc filed Critical Hon Tech Inc
Priority to TW94119097A priority Critical patent/TWI265297B/en
Application granted granted Critical
Publication of TWI265297B publication Critical patent/TWI265297B/en
Publication of TW200643431A publication Critical patent/TW200643431A/en

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

The present invention provides an electronic component test socket examination machine, which employs a movable base of a driving mechanism to link and drive an intermediate mechanism to perform vertical displacement. The vertical rack of the intermediate mechanism is used for mounting a holding mechanism and the carrier of the holding mechanism is allowed to perform vertical displacement. An examination mechanism with a tester is mounted on the horizontal rack of the intermediate mechanism and a detector connected with the carrier of the holding mechanism is installed below the tester. Also, an electric testing unit is separately connected with the tester and a loader for loading and moving the under testing socket. When the driving mechanism drives the tester to press against the pins of the testing socket, a conductive loop is formed and the electric testing unit can be used for detecting the resistance of the pins and, when the tester is pushed by the reactive force of the pins, the tester can use the holding mechanism to perform reverse displacement so to press against the examination machine and allow the examination machine to detect the spring flexibility of the pins. Hence, automatic testing of test socket pins can be accomplished for cost reduction and test quality improvement.
TW94119097A 2005-06-09 2005-06-09 Examination machine for electronic component test socket TWI265297B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW94119097A TWI265297B (en) 2005-06-09 2005-06-09 Examination machine for electronic component test socket

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW94119097A TWI265297B (en) 2005-06-09 2005-06-09 Examination machine for electronic component test socket

Publications (2)

Publication Number Publication Date
TWI265297B true TWI265297B (en) 2006-11-01
TW200643431A TW200643431A (en) 2006-12-16

Family

ID=38122176

Family Applications (1)

Application Number Title Priority Date Filing Date
TW94119097A TWI265297B (en) 2005-06-09 2005-06-09 Examination machine for electronic component test socket

Country Status (1)

Country Link
TW (1) TWI265297B (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI412770B (en) * 2009-12-22 2013-10-21 Zhen Ding Technology Co Ltd Apparatus and method for testing printed circuit board
TWI427296B (en) * 2011-10-04 2014-02-21 Advanced Semiconductor Eng Probe card and testing method
CN110794176A (en) * 2018-08-03 2020-02-14 矽品精密工业股份有限公司 Detection device

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW201129804A (en) * 2010-02-26 2011-09-01 Mpi Corp Elastic contact device
TWI823666B (en) * 2022-11-04 2023-11-21 穎崴科技股份有限公司 Probe suction nozzle unit, automatic probe replacement machine and automatic probe replacement method

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI412770B (en) * 2009-12-22 2013-10-21 Zhen Ding Technology Co Ltd Apparatus and method for testing printed circuit board
TWI427296B (en) * 2011-10-04 2014-02-21 Advanced Semiconductor Eng Probe card and testing method
CN110794176A (en) * 2018-08-03 2020-02-14 矽品精密工业股份有限公司 Detection device
CN110794176B (en) * 2018-08-03 2022-05-31 矽品精密工业股份有限公司 Detection device

Also Published As

Publication number Publication date
TW200643431A (en) 2006-12-16

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