TW201129804A - Elastic contact device - Google Patents

Elastic contact device

Info

Publication number
TW201129804A
TW201129804A TW99105756A TW99105756A TW201129804A TW 201129804 A TW201129804 A TW 201129804A TW 99105756 A TW99105756 A TW 99105756A TW 99105756 A TW99105756 A TW 99105756A TW 201129804 A TW201129804 A TW 201129804A
Authority
TW
Taiwan
Prior art keywords
contact device
elastic contact
elastomers
elastomer
extension part
Prior art date
Application number
TW99105756A
Other languages
Chinese (zh)
Other versions
TWI484189B (en
Inventor
wei-zheng Gu
xin-hong Lin
zhao-ping Xie
ming-qi Chen
zhi-hao He
Qi-Zhao Zhang
hui-bin Yang
jun-zhong Huang
Yong-Jin Hong
Original Assignee
Mpi Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mpi Corp filed Critical Mpi Corp
Priority to TW99105756A priority Critical patent/TW201129804A/en
Publication of TW201129804A publication Critical patent/TW201129804A/en
Application granted granted Critical
Publication of TWI484189B publication Critical patent/TWI484189B/zh

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Abstract

An elastic contact device includes a first elastomer and a second elastomer for transmitting high-frequency test signal and ground level, respectively; and at least one extension part arranged in one of the elastomers. The extension part is electrically connected with one of the first and second elastomers, so as to produce a capacitance with respect to the other elastomer. By adjusting the capacitance, the characteristic impedance of the high-frequency signal can be changed. The elastic contact device further includes a base made of hollowed insulation material. The base has a top and a bottom. Each of the first and second elastomers has two ends inserted into the top and bottom of the base, respectively. The extension part is arranged between the top and the bottom.
TW99105756A 2010-02-26 2010-02-26 Elastic contact device TW201129804A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW99105756A TW201129804A (en) 2010-02-26 2010-02-26 Elastic contact device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW99105756A TW201129804A (en) 2010-02-26 2010-02-26 Elastic contact device

Publications (2)

Publication Number Publication Date
TW201129804A true TW201129804A (en) 2011-09-01
TWI484189B TWI484189B (en) 2015-05-11

Family

ID=50180052

Family Applications (1)

Application Number Title Priority Date Filing Date
TW99105756A TW201129804A (en) 2010-02-26 2010-02-26 Elastic contact device

Country Status (1)

Country Link
TW (1) TW201129804A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI630393B (en) * 2017-09-04 2018-07-21 中華精測科技股份有限公司 Probe card device and rectangular probe thereof
TWI640783B (en) * 2017-09-15 2018-11-11 中華精測科技股份有限公司 Probe card device and round probe
CN109425818A (en) * 2017-09-04 2019-03-05 中华精测科技股份有限公司 Probe card device and its rectangular probe

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6798224B1 (en) * 1997-02-11 2004-09-28 Micron Technology, Inc. Method for testing semiconductor wafers
TWI265297B (en) * 2005-06-09 2006-11-01 Hon Tech Inc Examination machine for electronic component test socket
TW200839247A (en) * 2007-03-22 2008-10-01 Asp Test Technology Ltd Microminiaturized high frequency probe assembly
TWM332849U (en) * 2007-11-29 2008-05-21 Chunghwa Prec Test Tech Co Ltd High speed socket

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI630393B (en) * 2017-09-04 2018-07-21 中華精測科技股份有限公司 Probe card device and rectangular probe thereof
CN109425818A (en) * 2017-09-04 2019-03-05 中华精测科技股份有限公司 Probe card device and its rectangular probe
CN109425818B (en) * 2017-09-04 2020-09-08 中华精测科技股份有限公司 Probe card device and rectangular probe thereof
TWI640783B (en) * 2017-09-15 2018-11-11 中華精測科技股份有限公司 Probe card device and round probe

Also Published As

Publication number Publication date
TWI484189B (en) 2015-05-11

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees