1247888 九、發明說明： 【發明所屬之技術領域】 本發明係關於一種測試系統及方法，詳言之，係關於一 種測試CMOS影像感測器之系統及方法。 【先前技術】 參考圖1所示，美國專利US6,625,558揭示之測試CMOS 影像感測器之系統10包括一測試頭（test head) 11、一光源控 制器（light source controller)12、一影像處理器（image processor) 13及一測試機（tester) 14。該承載部11用以承接一 待測CMOS影像感測器（圖未示出）。該光源控制器12用以產 生測試光至該待測CMOS影像感測器。 測試開始時，首先由該影像處理器13或該測試機14發出 控制信號使該光源控制器12用以產生設定之測試光至該待 測CMOS影像感測器。該待測CMOS影像感測器接收該測試 光後，該測試頭11輸出影像資料波形至該影像處理器13。 該影像處理器13包括一介面卡131及數位處理器132，該介 面卡131用以接收該承載部輸出之影像資料波形，該數位處 理器132處理得對應之像素資料。該影像處理器13依據處理 後之像素資料，判定該待測CMOS影像感測器之良否。該測 試機14連接至該影像處理器13，用以控制該影像處理器13 及儲存該影像處理器13之資料。 在該習知測試CMOS影像感測器之系統1〇中，該介面卡 13 1及數位處理器132係設置於該影像處理器13或者是該測 試頭11内。該影像處理器13及該測試頭11與該介面卡13 1之 94538.doc 1247888 資料格式及資料輸出接線係依不同之測試系統製造公司而 有所不同。每-測試系統製造公司所設計之資料格式及資 料輸出接線完全不同’例如：無法將甲公司之影像處理器 與乙公司之承載部連接使用。或者，數位處理器132係固定 設置於該影像處理器13中，無法依照需求自由擴充。 ，因此，有必要提供-種創新且具進步性的測試cm〇s影像 感測器之系統及方法，以解決上述問題。 【發明内容】 本發明之目的在於提供—種測試CM〇s影像感測器之系 統及方法。該測試CMOS影像感測器之系統包括：一承載 部、-光源控制器、-介面卡及—影像處理器。該承載部 用以承接-㈣C應影像感測^該光源控聽用以產生 測試光至該待測CMOS影像感測器。該介面卡具有一訊號處 理邵、-可調整接線部及-輸出埠。該訊號處理部用以接 收孩待測⑽S影像感測器輸出之測試資料，並處理得❹ 讀出資料，該可調整接線部依據一設定之輸出模式，調 整輸出資料之接線與該輸出4之連接。該影像處理器決定 該設定之輸出模式，其具有—輸人蟀，該輸人蟀係與該輸 出埠相對應’用以接收該介面卡之輸出資料，以判定該待 測CMOS影像感測器之良否。 因此，本發明測試CMOS影像感測器之系統係利用該介面 卡〈該可調整接㈣，依據不同f彡像處m出模式， 調整輸出資料之接線至該輸㈣之連接，使得該輸出璋之 輸出接腳可以彈性地調整，以符合該設定之輸出模式，並 94538.doc 1247888 -口 4 w像處理器之輸入埠。故，本發明測試cM〇s影像感 測时之系統可以運用不同測試系統製造公司之影像處理 器而不需侷限於某一廠牌之影像處理器。因此，本發明 測試CMOS影像感測器之系統内元件之相容性提高。 【實施方式】 參考圖2所tf，其顯示本發明測試(：]^〇3影像感測器之系 統2〇之示意圖。該測試〇]^〇3影像感測器之系統汕包括：一 承載部21、一光源控制器22、一介面卡23、一影像處理器 24及一測試機25。該承載部2丨用以承接一待測cM〇s影像感 測器（圖未示出）。該光源控制器22用以產生測試光至該待測 CMOS影像感測器。 測試開始時，首先將該待測CM〇s影像感測器設置至該承 載4 21，例如具有載入及解載（i〇a(j/unia(j)待測元件（dut， device under test)，及能輸入/輸出訊號功能之機台。由該 影像處理器24或該測試機25發出控制信號使該光源控制器 22用以產生設定之測試光至該待測cM〇s影像感測器。在本 實施例中，係由該影像處理器24控制該光源控制器22發出 设定之測試光。該待測CMOS影像感測器接收該測試光後， 會依據該測試光，輸出對應之測試資料（本實施例中為影像 資料波形）至該承載部21。該承載部21將影像資料波形輸出 至該介面卡23。 配合參考圖3，該介面卡23具有一訊號處理部231、一可 調整接線部232及一輸出埠233。該訊號處理部231用以接收 該承載部21輸出之影像資料波形，並處理得對應之輸出資 94538.doc 1247888 料（本實施例中為像素資料）。該可調整接線部232依據一設 足之輸出模式，調整像素資料之接線至該輸出埠233之連 接。孩可調整接線部232可利用跳線或其他調整方式，調整 像素資料之接線至該輸出埠233之連接，使得該輸出埠233 之輸出接腳（包括A部分及B部分等）可以彈性地調整，以符 合該設定之輸出模式。 孩影像處理器24決定該設定之輸出模式，亦即該介面卡 23之可調整接線部232係依據該影像處理器24之輸出模 式，而調整接線之連接，以配合該影像處理器24。因此， 該w像處理态24具有一輸入埠（圖未示出），該輸入埠係與該 介面卡23之輸出埠233相對應，用以接收該介面卡23輸出之 像素資料，以判定該待測CMOS影像感測器之良否。 茲測試機25連接至該影像處理器24，用以控制該影像處 时24及儲存該影像處理器24之資料。較佳地，該影像處 理咨24與該測試機25均給予一網址，以網路連接，俾利於 資料之傳遞。 因此，本發明測試CMOS影像感測器之系統20係利用該介 面卡23之該可調整接線部232，依據不同影像處理器以之輸 出模式，調整像素資料之接線至該輸出埠233之連接，使得 該輸出埠233之輸出接腳（包括A部分及B部分等）可以彈性 地凋正，以符合該設定之輸出模式，並配合該影像處理器 24之輸入埠。故本發明測試CMOS影像感測器之系統20可以 運用不同測試系統製造公司之影像處理器，而不需侷限於 某一廠牌又影像處理器，並可自由擴充影像處理器24容量 94538.doc I247888 大小。因此，本發明測試CMOS影像感測器之系統内元件之 相容性提高。 f隹上述實施例僅為說明本發明之原理及其功效，而非用 以限制本發明。因此，習於此技術之人士可在不達背本發 明之精神對上述實施例進行修改及變化。本發明之權利範 圍應如後述之申請專利範圍所列。 【圖式簡單說明】 圖1為習知測試CMOS影像感測器之系統示意圖； 圖2為本發明測試CM0S影像感測器之系統示意圖；及 圖3為本發明介面卡之示意圖。 【主要元件符號說明】 10 習知之測試CMOS影像感測器之系統 11承載部 13影像處理器 12 光源控制器 14 測試機 20 本發明測試CMOS影像感測器之系統 21 承載部 22 光源控制器 23 介面卡 24 影像處理器 25 測試機 13 1 介面卡 132數位處理器 231訊號處理部 232可調整接線部 233輸出埠 94538.doc1247888 IX. INSTRUCTIONS: TECHNICAL FIELD OF THE INVENTION The present invention relates to a test system and method, and more particularly to a system and method for testing a CMOS image sensor. [Background] Referring to FIG. 1, a system 10 for testing a CMOS image sensor disclosed in US Pat. No. 6,625,558 includes a test head 11, a light source controller 12, and an image processing. Image processor 13 and a tester 14. The carrying portion 11 is configured to receive a CMOS image sensor to be tested (not shown). The light source controller 12 is configured to generate test light to the CMOS image sensor to be tested. At the beginning of the test, the image processor 13 or the test machine 14 first sends a control signal to cause the light source controller 12 to generate the set test light to the CMOS image sensor to be tested. After the test CMOS image sensor receives the test light, the test head 11 outputs an image data waveform to the image processor 13. The image processor 13 includes an interface card 131 and a digital processor 132. The interface card 131 receives the image data waveform outputted by the carrier, and the digital processor 132 processes the corresponding pixel data. The image processor 13 determines whether the CMOS image sensor to be tested is good or not based on the processed pixel data. The test machine 14 is connected to the image processor 13 for controlling the image processor 13 and storing the data of the image processor 13. In the system 1 of the conventional test CMOS image sensor, the interface card 13 1 and the digital processor 132 are disposed in the image processor 13 or the test head 11. The image processor 13 and the test head 11 and the interface card 13 1 94538.doc 1247888 data format and data output wiring system are different according to different test system manufacturing companies. The data format and data output wiring designed by each test system manufacturing company are completely different. For example, it is impossible to connect the image processor of Company A with the carrier of Company B. Alternatively, the digital processor 132 is fixedly disposed in the image processor 13 and cannot be freely expanded as needed. Therefore, it is necessary to provide an innovative and progressive system and method for testing cm〇s image sensors to solve the above problems. SUMMARY OF THE INVENTION It is an object of the present invention to provide a system and method for testing a CM〇s image sensor. The system for testing a CMOS image sensor includes: a carrier, a light source controller, an interface card, and an image processor. The carrying portion is configured to receive - (4) C image sensing. The light source is controlled to generate test light to the CMOS image sensor to be tested. The interface card has a signal processing Shao, an adjustable wiring portion, and an output port. The signal processing unit is configured to receive test data output by the child (10) S image sensor, and process the read data, and the adjustable wiring unit adjusts the wiring of the output data and the output according to a set output mode. connection. The image processor determines the output mode of the setting, and has an input port corresponding to the output port to receive the output data of the interface card to determine the CMOS image sensor to be tested. Good or not. Therefore, the system for testing a CMOS image sensor of the present invention utilizes the interface card <the adjustable connection (4), and adjusts the connection of the output data to the connection of the input (4) according to different m-modes of the image, so that the output is The output pin can be flexibly adjusted to match the set output mode, and the 94538.doc 1247888-port 4 w-like processor input port. Therefore, the system for testing cM〇s image sensing of the present invention can use different test systems to manufacture the company's image processor without being limited to a certain image processor. Therefore, the compatibility of the components in the system for testing the CMOS image sensor of the present invention is improved. [Embodiment] Referring to Figure 2, tf, which shows a schematic diagram of a system for testing (:) image sensor of the present invention. The system of the image sensor includes: a carrier The portion 21, a light source controller 22, an interface card 23, an image processor 24, and a testing machine 25. The carrying portion 2 is configured to receive a cM〇s image sensor (not shown) to be tested. The light source controller 22 is configured to generate test light to the CMOS image sensor to be tested. When the test starts, the CM s image sensor to be tested is first set to the load 421, for example, loaded and unloaded. (i〇a(j/unia(j) device under test, and a machine capable of input/output signal function. The image processor 24 or the test machine 25 sends a control signal to make the light source The controller 22 is configured to generate the set test light to the cM s image sensor to be tested. In this embodiment, the image processor 24 controls the light source controller 22 to emit the set test light. After receiving the test light, the CMOS image sensor outputs the corresponding test data according to the test light (this In the embodiment, the image data waveform is transmitted to the carrying portion 21. The carrying portion 21 outputs the image data waveform to the interface card 23. Referring to FIG. 3, the interface card 23 has a signal processing portion 231 and an adjustable wiring portion. 232 and an output port 233. The signal processing unit 231 is configured to receive the image data waveform outputted by the carrying unit 21, and process the corresponding output material (in this embodiment, pixel data). The wiring portion 232 adjusts the connection of the pixel data to the output port 233 according to the output mode of the set foot. The child adjustable wiring portion 232 can adjust the wiring of the pixel data to the output port 233 by using a jumper or other adjustment manner. The connection is such that the output pin (including part A and part B, etc.) of the output port 233 can be flexibly adjusted to conform to the set output mode. The image processor 24 determines the output mode of the setting, that is, the interface card. The adjustable wiring portion 232 of 23 adjusts the connection of the wiring to match the image processor 24 according to the output mode of the image processor 24. Therefore, the w image processing state 24 There is an input port (not shown) corresponding to the output port 233 of the interface card 23 for receiving the pixel data output by the interface card 23 to determine whether the CMOS image sensor to be tested is good or not. The test machine 25 is connected to the image processor 24 for controlling the image location 24 and storing the data of the image processor 24. Preferably, the image processing protocol 24 and the testing machine 25 are each given a web address. Therefore, the system 20 for testing the CMOS image sensor of the present invention utilizes the adjustable wiring portion 232 of the interface card 23 to adjust pixels according to the output mode of different image processors. The connection of the data to the output port 233 causes the output pin of the output port 233 (including the A portion and the B portion, etc.) to be elastically withered to conform to the set output mode, and cooperates with the image processor 24 Input 埠. Therefore, the system 20 for testing the CMOS image sensor of the present invention can use different test systems to manufacture the image processor of the company, without being limited to a certain brand and image processor, and can freely expand the image processor 24 capacity 94538.doc I247888 size. Therefore, the compatibility of the components in the system for testing the CMOS image sensor of the present invention is improved. The above examples are merely illustrative of the principles of the invention and its utility, and are not intended to limit the invention. Therefore, those skilled in the art can make modifications and changes to the above embodiments without departing from the spirit of the invention. The scope of the invention should be as set forth in the appended claims. BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a schematic diagram of a conventional system for testing a CMOS image sensor; FIG. 2 is a schematic diagram of a system for testing a CMOS image sensor according to the present invention; and FIG. 3 is a schematic diagram of an interface card of the present invention. [Main Component Symbol Description] 10 Conventional Test CMOS Image Sensor System 11 Bearer 13 Image Processor 12 Light Source Controller 14 Test Machine 20 System for Testing CMOS Image Sensor of the Invention 21 Load Carrying Port 22 Light Source Controller 23 Interface card 24 image processor 25 test machine 13 1 interface card 132 digital processor 231 signal processing unit 232 can adjust the wiring portion 233 output 埠94538.doc