201017192 九、發明說明： 【發明所屬之技術領域】 “本發明有關於-種靡縫置，且特別是有關於—種用於測 試顯示卡的測試裝置。 【先前技術】 ❹ 顯示卡在出廠之前需要針對其各個接口連接器 =證if 1目前的測試方法是將主機板上各個_的視^輸 、甬^連接减齡對㈣齡11。觀触細連接器類型 視訊圖像矩陣(VGA)、數純頻_片口電視(τν)接口 】來需要接到具有相對應連接器類型的顯示器不同的 ϋΐ::如圖1所示’測試時，顯示卡插設接在主機板上， 同類型的視訊輸出接口連接器分別接到對應201017192 IX. Description of the invention: [Technical field to which the invention pertains] "The present invention relates to a type of quilting, and in particular to a test device for testing a display card. [Prior Art] ❹ Display card before leaving the factory Need to address each interface connector = certificate if 1 The current test method is to connect each _ of the motherboard on the _, 甬 ^ connection ageing pair (four) age 11. View contact connector type video image matrix (VGA) , the number of pure frequency _ film port TV (τν) interface to need to receive a display with the corresponding connector type different:: As shown in Figure 1 'test, the display card is connected to the motherboard, the same type The video output interface connectors are respectively connected to the corresponding
主機ϊ、ι ίϊ連接LCD顯示器；w接口連接器連接電視。 2通^主機板運行測試程式（如3DM 顯祖·嶋咖针_像& 此做法存在以下問題： 性，以Sii判斷工具，帶有很強的個人主觀 有各種Hi L為了測試各種類型的囷像連接器，必須連接具 空間多，成型的圖像連接器的顯示器，造成測試時，佔用 201017192 【發明内容】 種顯示卡測試裝置及其測試方法 ，以解決上 本發明提供 述問題。 供示棚驟置，她接主機板，主機板包 生ΐ-圖ϋ設有顯示卡’顯示卡依據預設公式產 數ί產儲存模組、The host ϊ, ι ϊ ϊ connected to the LCD display; w interface connector to connect to the TV. 2 pass ^ motherboard running test program (such as 3DM ancestor 嶋 针 _ _ _ & This practice has the following problems: Sex, Sii judgment tool, with a strong personal subjective have various Hi L in order to test various types of The image connector must be connected to a display with a large amount of space and a molded image connector, which causes the test to occupy 201017192. The invention relates to a display card test device and a test method thereof, to solve the problems provided by the present invention. She is connected to the motherboard, and the motherboard is packaged. The display card is equipped with a display card. The display card is based on the preset formula.
且 ：ί：ΓΓ 5-™^^ ' 用以比杈第一圖像數據與第二圖像數據。 本發明緒供_麵示卡_試綠，肋測試—顯示 的性能。財法包括以下步驟：接收該顯示卡依據一預設 =產生的圖像數據；依據該預設公式產生—第二圖像^ 據，比較該第一圖像數據與該第二圖像數據。 本發明有益效果為，相比於先前技術，本發明採用 g ^動比贿示卡和測職置產生_像數據，比人眼更為 為讓本㈣之上述和無㈣、舰和優離更 懂’下文特舉較佳實施例，並配合所附圖式，作詳細說明如%易 【實施方式】 圖2所示為本發明一較佳實施例的顯示卡測試 功能方塊圖。 的 請參考圖2，本實施例所測試的顯示卡3〇〇在被測試時， 201017192 疋被插設在主機板4〇〇上。主機板4〇〇包括多個傳輸埠 當然，主機板400還包括中央處理器（CPU)、記 體、硬碟等運行測試程式所需要的設備（如圖3所示）。硬 碟用來儲存測試程式，記憶體用來運行測試程式，cpu用來 將指令輸入至顯示卡300。 ，示卡測試裝置200包括傳輸模組2(n、儲存模組2〇2、 Φ Φ 於山±生模組2〇3和比較模組204，其中傳輸埠包括多個圖像 ，出連接器4〇la〜她和-個數據傳輸連接器·。在 施例中，圖像輸出連接器401a〜4〇lc分別為VGA、Dvi、τν ,種顯示卡連接器類型，傳輸模組201包括VGA、DVI、τν 三種顯示卡連接n與—USB連接器，上述vga、园、 ST細虞’ ^連接器用以傳輸控制命令(通 例如：主機板400透過圖像輸出連接器4 織公摘產生的第—職輯齡至 、、且。主機板400透過數據傳輸連接器4〇Μ傳遞圖 之2的其他錄。本發明並;ϊ；_概公式為何，只: 可透過不醜型的圖像連接器傳輸即可。 園冢數據 玫2所示，顯示卡測試裝置200的傳輸模組201透過多 條傳輸線205與傳輸埠401a〜4〇ld耦接。 上述儲存模組202分別耦接傳輸模組2〇1 數據產生模組2G3以及比較模組2G4 〇 數據傳輸連接器4〇id也連接至傳輸模組2〇1 主機板400 _像數狀外的其他數據 例如是腦連接器。上述顯示卡測試裝置 201017192 公式產生組2G2 ’同樣地’依據與上述相同的預設 組202 ^ 3 並且第二圖像數據也被儲存至儲存模 出連接器401、If本實施例+ ’主機板4〇0包括三種圖像輸 侧傳^測^4 &、4〇1C，主機板4〇0的數據傳輸連接器 200接通至顯示卡測試裝置2GG ’顯示卡測試裝置 像It 時，數據產生馳2G3即開始產生第二圖 ，，卡300可針對圖像輸出連接器4〇la、4〇ib、4〇ic分 接徂t Ϊΐ _圖像數據或相_圖像數據，而本實施例所 或相組加亦可分職生三種不同㈣像數據 第一 曰0ir*較儲槪组202⑽第一圖像數據和 像數據疋否相同，並提供一比較結果且將其傳送至主機 以下對預②公式作詳細描述，圖3所示為本發明一圭 施例的主機板和顯示卡測試裝置的細部功能方塊圖。And : ί:ΓΓ 5-TM^^ ' is used to compare the first image data with the second image data. The invention provides an indication of the performance of the _ face card _ green test, rib test - display. The financial method comprises the steps of: receiving image data generated by the display card according to a preset =; generating a second image according to the preset formula, comparing the first image data with the second image data. The beneficial effects of the present invention are that, compared with the prior art, the present invention uses the g^dynamic ratio bribe card and the measurement position to generate _image data, which is more than the human eye to make the above (4) and none (four), ship and superior DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENT(S) The following is a detailed description of the preferred embodiment of the present invention. FIG. 2 is a block diagram showing a test function of a display card according to a preferred embodiment of the present invention. Please refer to FIG. 2, when the display card 3 tested in this embodiment is tested, 201017192 疋 is inserted on the motherboard 4〇〇. The motherboard 4 includes a plurality of transmissions. Of course, the motherboard 400 also includes a central processing unit (CPU), a record, a hard disk, and the like required to run the test program (as shown in FIG. 3). The hard disk is used to store the test program, the memory is used to run the test program, and the CPU is used to input the command to the display card 300. The card testing device 200 includes a transmission module 2 (n, a storage module 2〇2, a Φ Φ in a mountain module 2〇3, and a comparison module 204, wherein the transmission port includes a plurality of images, and the connector is output. 4〇la~her and a data transmission connector. In the embodiment, the image output connectors 401a to 4〇lc are VGA, Dvi, τν, respectively, a type of display card connector, and the transmission module 201 includes a VGA. , DVI, τν three kinds of display card connection n and - USB connector, the above vga, garden, ST fine ^ ' ^ connector for transmitting control commands (for example: the motherboard 400 through the image output connector 4 woven The first board is up to and from the motherboard 400. The host board 400 transmits the other records of the figure 2 through the data transmission connector. The present invention is also used; ϊ; _ general formula, only: can pass through non-ugly images The transmission module 201 of the display card test device 200 is coupled to the transmission ports 401a to 4〇ld through a plurality of transmission lines 205. The storage modules 202 are respectively coupled to the transmission mode. Group 2〇1 data generation module 2G3 and comparison module 2G4 〇data transmission connector 4〇id is also connected The transmission module 2〇1 motherboard 400_ other data other than the number is, for example, a brain connector. The above display card test device 201017192 formula generates the group 2G2 'samely' according to the same preset group 202 ^ 3 and the above The image data is also stored in the storage module 401, If the embodiment + 'the motherboard 4 〇 0 includes three types of image transmission side detection ^ 4 & 4 〇 1 C, the motherboard 4 〇 0 When the data transmission connector 200 is turned on to the display card test device 2GG 'display card test device like It, the data generation 2G3 starts to generate the second picture, and the card 300 can be used for the image output connector 4〇la, 4〇ib 4〇ic tap 徂t Ϊΐ _ image data or phase _ image data, and this embodiment or phase group plus can also be divided into three different types of life (four) image data first 曰 0 ir * compared to the 槪 槪 group 202 (10) An image data and image data are the same, and a comparison result is provided and transmitted to the host. The pre-2 formula is described in detail below. FIG. 3 shows a motherboard and a display card test device according to an embodiment of the present invention. Detailed function block diagram.
主機板400至少包括CPU 402 及顯示卡300。 、晶片組403、硬碟404以 硬碟4〇4内儲存有-測試程式。測試時，cpu 4〇2調用硬 = 404内的測試程式，並將—圖形處理的命令傳送至顯示卡 jUU 0 f ί CPU402送來的數據會進入顯示卡300的圖形晶片301 巧理。當圖形晶片301處理完後，相關數據會被送到顯示 ^己憶體(VGARAM)302暫b寺儲存。然後，數位圖像數據會被 达入隨機存儲數位類比轉換器（Rand()m Ac_ Mem()iy DigitdThe motherboard 400 includes at least a CPU 402 and a display card 300. The chipset 403 and the hard disk 404 store the test program in the hard disk 4〇4. During the test, cpu 4〇2 calls the test program in hard = 404, and transfers the command of the graphics processing to the display card. jUU 0 f ί The data sent by the CPU 402 enters the graphics chip 301 of the display card 300. After the graphics chip 301 is processed, the relevant data is sent to the display MVRAM 302 temporary b temple for storage. Then, the digital image data is fed into the random storage digital analog converter (Rand()m Ac_ Mem() iy Digitd
Analog Converter ’ ramDAC) 303轉換成計算機顯示需要的 201017192 再將轉換完的類比數據(或數位數 類比數據。最後RAMDAC再將轉指 據)送到顯示器而成為所看到的圖像。Analog Converter ' ramDAC) 303 is converted to the computer display required 201017192 and then the converted analog data (or digital analog data. Finally RAMDAC will transfer the reference) to the display to become the image seen.
*值，R、G、B分別表示該像素點的紅、綠、 y、R、G、B的數值能夠較佳地描述一個像素 點的座標位置和灰度。 ’ 如圖3所示，顯示卡測試裝置2〇〇還包括一個儲存器2〇7 , 用來儲存相關的測試程式。儲存器2〇7較佳的是一個系統可編 程寄存器(In-System Programmable Configuration PROMs)，儲 存在5亥糸統可編程寄存器内的測試程式可以依需要自行編 寫，只要同主機板400内的硬碟404所儲存的測試程式相同即 顯示卡測試裝置200中的傳輸模組201、儲存模組202、 數據產生模組203、比較模組204和儲存器207設置在電路板 206 上。 儲存模組202、數據產生模組203以及比較模組204整合 在同一晶片208中’該晶片208可以是可編程控制器 (Field-Programmable Gate Arrays，FPGA)，通過測試者的編程， 該晶片208可以依照所需要的預設公式來產生圖像數據。 主機板400由數據傳輸連接器發送測試通知給顯示卡測 試裝置200後，數據產生模組203調用儲存器207内的測試程 式並按照同顯示晶片相同的預設公式來計算出第二圖像數據。 圖4所示為本實施例的顯示卡測試流程圖。 201017192 請同時參考圖2和圖4。在本實施例中，例如在榮幕 度6為1_*12〇〇的情況下，一個螢幕的畫面需要計算出^ 1 内纖示卡細在—__隔（例如是_) 内计异出一個像素點pixel(n)的座標值和R、G、b值。 驟S5〇2和步驟S506 ’顯示卡測試裝置2⑻接收第 據 pixel(n)，並儲存在儲存模組2〇2内。 冢数據 在開始測試時’主機板4〇〇發送一個測試通知至顯示 j裝置（广驟S504)。顯示卡測試裝置接收到測試通知後，數 ❹ 參 ，產，模組203 g卩調用與被測試的顯示卡·同樣的測試程 式’按照與姻試的顯示卡同制預設公式產生同一個時 間，内的第二圖像數據pixel⑽，並儲存在儲存模 (步驟 S508 和 S510)。 著，執行步驟S512，比較同一個時間間隔内的第一圖 ^據P1xel(n)和第二圖像數據pixel(n’成否—致。比較第一圖 像數據p1Xd(n)和第二圖像數據pixel(n，)是否一致時，是比較二 者，，標值和R'G、B值，只要有一個數值不相同，即判斷 pixel (η)和 pixei(n’)不一致。 劫，ΐ執行步驟S514和S516 ’若Pixel⑻和PixelCn，}-二則第一計數值N加1，若pixei (n)和pixel(ni)不一致， 則第一汁數值]VI加1。 显卡300的輸出數據中，若一個螢幕的信號傳輸完 拉、彳會輪出一個螢幕同步信號。顯示卡測試裝置200檢測是 否接收到螢幕同步信號，來判斷是否測試完畢（步驟S518)。 ιηηί未測試完畢，則回到步驟“汜和S504，繼續對顯示卡 進行對"L—個時間間隔内產生的第—圖像數據和第二圓像數據 11 201017192 S52〇fn’十則傳送M * N的值至主機板400 (步驟 =二=二====示卡 _ 在本實施例中，例如設置像素點正確的 主機板働上可以連接一個顯示裝置來顯示測試結果。 本發明較佳實_提供了—麵示相 測試的顯示卡30。的數據輸_，採 、，接至待 ，，生數據，並且即時比對二者是否:== = 術’本發明省去了多個不同連接器的顯示器，減少了 ^先費月^技 參 内，當可作些許之更動‘範圍 附之申請專利範圍所界定者為準。 隻靶圍虽視後 12 201017192 【圖式簡單說明】 圖1所示為常用的顯示卡測試裝置。 圖2所示為本發明一較佳實施例的顯示卡測試裝置的功 能方塊圖。 圖3所示為本發明一較佳實施例的主機板和顯示卡測試 裝置的細部功能方塊圖。 圖4所示為本實施例的顯示卡測試流程圖。 【主要元件符號說明】 200 :顯示卡測試裝置 201 :傳輸模組 202 :儲存模組 203 :傳輸模組 204 :比較模組 .205 :傳輸線 206 :電路板 207 :儲存器 208 :晶片 403 :晶片組 S502〜S520 :步驟 300 :顯示卡 301 :圖形晶片 302 :顯示卡記憶體 303 ： RAMDAC 400 :主機板 401a〜401c :圖像輸出連接器 401d :數據傳輸連接器 402 ： CPU 404 :硬碟 13* Values, R, G, and B respectively indicate that the values of red, green, y, R, G, and B of the pixel point can better describe the coordinate position and gradation of one pixel. As shown in FIG. 3, the display card test apparatus 2A further includes a storage unit 2〇7 for storing the relevant test program. The memory 2〇7 is preferably an In-System Programmable Configuration PROMs, and the test program stored in the 5th programmable program register can be written as needed, as long as it is the same as the hard disk in the motherboard 400. The test modules stored in the disc 404 are the same, that is, the transport module 201, the storage module 202, the data generating module 203, the comparison module 204, and the storage 207 in the card testing device 200 are disposed on the circuit board 206. The storage module 202, the data generation module 203, and the comparison module 204 are integrated in the same wafer 208. The wafer 208 may be a Field-Programmable Gate Array (FPGA), which is programmed by a tester. Image data can be generated in accordance with a preset formula required. After the motherboard 400 sends a test notification to the display card testing device 200 by the data transmission connector, the data generation module 203 calls the test program in the storage 207 and calculates the second image data according to the same preset formula as the display wafer. . FIG. 4 is a flow chart showing the test of the display card of the embodiment. 201017192 Please also refer to Figure 2 and Figure 4. In this embodiment, for example, in the case that the degree of glory 6 is 1_*12 ,, the screen of one screen needs to calculate that the inner-fiber display card is fine-----interval (for example, _) The coordinate value of a pixel pixel(n) and the R, G, and b values. Step S5〇2 and step S506' show that the card test device 2 (8) receives the data pixel(n) and stores it in the storage module 2〇2.冢 Data At the start of the test, the motherboard 4 sends a test notification to the display j device (Sp. S504). After the display card test device receives the test notification, the number of parameters, production, module 203 g 卩 call the same test program as the test card tested, and generate the same time according to the same formula as the display card of the test. The second image data pixel (10) is stored in the storage mode (steps S508 and S510). Step S512 is executed to compare the first map data P1xel(n) and the second image data pixel in the same time interval (n' is negative. The first image data p1Xd(n) and the second graph are compared. If the data pixel(n,) is consistent, compare the two, the value and the R'G and B values. As long as there is a different value, it is judged that pixel (η) and pixei (n') are inconsistent. Steps S514 and S516 'If Pixel(8) and PixelCn,}-two, the first count value N is incremented by 1. If pixei (n) and pixel(ni) do not match, the first juice value]VI is incremented by 1. The output of the graphics card 300 In the data, if a screen signal is transmitted and pulled, a screen synchronization signal is rotated. The display card testing device 200 detects whether a screen synchronization signal is received to determine whether the test is completed (step S518). ιηηί is not tested, then Going back to the steps "汜 and S504, continuing to perform the first image data and the second circular image data 11 201017192 S52〇fn' generated in the "L_time interval of the display card, the value of M*N is transmitted to Motherboard 400 (step = two = two ==== card _ In this embodiment, for example, setting the image A display device can be connected to the display panel to display the test result. The present invention provides a display card 30 for the phase-in-phase test. The data is transmitted, collected, and received. Data, and instant comparison of whether the two: == = surgery 'The invention saves the display of a number of different connectors, reducing the number of months before the ^ ^ technology, when you can make some changes to the scope of the application The definition of the patent scope shall prevail. Only the target circumference is regarded as the rear 12 201017192 [Simplified description of the drawings] Figure 1 shows a commonly used display card test device. Figure 2 shows a display card test according to a preferred embodiment of the present invention. Figure 4 is a detailed functional block diagram of a motherboard and a display card testing device according to a preferred embodiment of the present invention. Figure 4 is a flow chart showing the test card of the present embodiment. DESCRIPTION OF SYMBOLS 200: Display card test apparatus 201: Transmission module 202: Storage module 203: Transmission module 204: Comparison module 205: Transmission line 206: Circuit board 207: Storage 208: Wafer 403: Wafer group S502~ S520: Step 300 : Display Card 301 : Graphics Chip 302 : Display Card Memory 303 : RAMDAC 400 : Motherboard 401a to 401c : Image Output Connector 401d : Data Transfer Connector 402 : CPU 404 : Hard Disk 13