TWI233999B - Testing jig for connector socket of electronic component - Google Patents
Testing jig for connector socket of electronic component Download PDFInfo
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- TWI233999B TWI233999B TW93109480A TW93109480A TWI233999B TW I233999 B TWI233999 B TW I233999B TW 93109480 A TW93109480 A TW 93109480A TW 93109480 A TW93109480 A TW 93109480A TW I233999 B TWI233999 B TW I233999B
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1233999 五、發明說明(1) 【發明所屬之技街領域』 本發明係有關於〜^t 、 奸片A 、 種測試治具,庫用於雷2 插座的測試,更特別 μ用於電子元件連接 點的接地阻值,用曰:種精由阻質判斷電路確認連接 【先前技術; 確認連接點焊接狀態的測試治具。 目珂電腦可執行平台於設計時,大 :級的空間,因此許多可升級的元件,目前;1233999 V. Description of the invention (1) [Technical field to which the invention belongs] The present invention relates to ~ ^ t, traitor A, and a kind of test fixture. The library is used for the test of the Thunder 2 socket, and more particularly μ is used for electronic components. The ground resistance value of the connection point is stated as follows: a kind of fine-quality determination circuit to confirm the connection [prior art; test fixture to confirm the welding status of the connection point. Mu Ke computer executable platform at the time of design, large space: so many upgradeable components, currently;
^插座與主機板連接,以方便使用者未來升級的 機板的製作流程,大多利用表面黏著技術(f ace' Mounting Technology,SMT)來處理元件與印刷電路板 (Printed Circuit: Board ’ PCB)之間的焊接問題,但於表 面黏著技術作業時所需使用到的錫膏、印刷機(s〇丨der^ The socket is connected to the motherboard to facilitate the user's future board manufacturing process. Most of them use face 'mounting technology (SMT) to process components and printed circuit boards (Printed Circuit: Board' PCB). Soldering problems, but the solder paste and printing machine (s〇 丨 der
Paste Printer)、置件機(Stencil Pick & piacePaste Printer), Stencil Pick & piace
Ref low Oven )甚至是製程參數的設定,都可能會影響表 面黏著技術的製作品質。例如’錫貧粘度不足,或過錫爐 的時間過快,都可能造成冷焊或空焊的情形產生,但一般 冷焊或空焊的狀況,旅揲法利用肉眼可輕易察知,必須等 到主機板到達測試階段日守’發生了不穩定的狀況才能夠察 覺。 … 因此當主機板製作兀成到達測試階段,卻產生無法開 機或不穩定狀況之而需要檢修以確認問題時,大多都會先 確認是否有冷焊或空焊的狀況。舉例來說,以習知的方式 確認主機板上電子元件的連接插座是否有冷焊或空焊為例 ,工程師需要^ 的量測,連接插座插與主機板之間,數Ref low Oven) or even the setting of process parameters may affect the production quality of surface adhesion technology. For example, 'Insufficient tin viscosity or too fast time passing through a tin furnace may cause cold welding or air welding, but the general cold welding or air welding conditions can be easily detected by the naked eye using the naked eye. You must wait until the host The board arrived at the test stage and the day guard 'could not be detected until an unstable condition occurred. … Therefore, when the motherboard production has reached the test stage, but it cannot be turned on or is unstable, and needs to be repaired to confirm the problem, most of them will first confirm whether there is cold welding or air welding. For example, in a conventional way, to confirm whether there is cold welding or air welding of the connection sockets of the electronic components on the motherboard, the engineer needs to make a measurement of the connection between the socket and the motherboard.
1233999 發明說明(2) 百個連接點的接地阻值, 有空焊或冷焊的狀況。 此1 _上述數百個連接點是否 另外’當主機板故障 ,當維修完成廿胳1社,向而要先將連接插座先取下 確切叙 將連接插座焊接回去時,仍需要書靳一一 “:數百個連接點的接地阻值。而要重新 間,個i::::::電子元件的連接插座與主機板之 ,而需的確認工作也可能會因為稱-疏忽 電子元件的廠牌盥型i且::f接點的對地阻值,會隨著 各有不同的接地阻值r因ΐ疋同—型號但不同連接點而 ,利用量測^ τ ^ 口此工程師都需要花費兩倍的時間 作。j另一正常主機板並--比對,才能完成確認工 提昇競爭乂冓t述率的世代中’減少時間的浪費將可大大 提昇競^ 口此如何減少测試程序並縮短檢測時間以 【發明:i】已成為相關人員思考方向之-。 插座ΐ:ΐ為解決上述問冑,而提供-種電子元件連接 ,連接、χ、/α /、用以於需要確認連接插座與主機板之間 況,#々焊接狀况日守’利用查看燈號顯示模組的顯示狀 :迅速^認是否有冷焊或空焊的情形。 明据命""於先刚技術無法解決的問題與存在之缺點,本發 u 種%子元件連接插座之測試治具,包含有下列模1233999 Description of the invention (2) The ground resistance of one hundred connection points is in the condition of empty welding or cold welding. This 1 _Is the above hundreds of connection points additional? When the motherboard fails, when the repair is completed, the company must first remove the connection socket first, and then solder the connection socket back. You still need a book. : The ground resistance value of hundreds of connection points. To re-interconnect, i ::::::: electronic components are connected to the motherboard and the necessary confirmation work may also be due to weighing-negligent electronic component factory The brand resistance of the brand i and :: f contacts will vary with the different ground resistance values r due to different —models but different connection points. The measurement is required by the engineer ^ τ ^ It takes twice as much time to do it. J Another normal motherboard does not-compare to complete the confirmation process. In the generation where the competition rate is improved, 'reducing the waste of time will greatly improve the competition. How can this reduce testing? Procedures and shorten the detection time [Invention: i] has become the direction of thinking of related personnel. Socket ΐ: ΐ In order to solve the above problems, we provide-a kind of electronic component connection, connection, χ, / α /, for needs Check the condition between the connection socket and the motherboard. # 々 焊 状"Ri Shou" used to check the display status of the light display module: quickly identify whether there is cold welding or air welding. It is clear that problems and shortcomings that Yu Xiangang's technology cannot solve, this issue u Test fixtures for various types of sub-component connection sockets, including the following modules
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五、發明說明(3) 組:量測接腳、阻值剌- 藉由量測接腳與連接¥=:二及:號顯示模組。其中, 連接點之接地阻值,產:Ϊ合’而阻值判斷單元將根據 示模电A + π Γ·產生相應的輸出電壓,再利用燈號顯 供、、且根據輸出電壓 I -貝 的焊接狀況。 土刀換喊不狀悲,以提示使用者連接點 有關本發明具體可扞與 如下: 仃之貝施方式,鲶就配合圖式說明 【貫施方式】 第—:Τ閱:第1圖」所示以中央處理器之連接插座作為 接%二=1。兄明本發明’其係為中央處理器連接插座之連 接』的,試機制示意圖;測試機制包含有電源之1 ::關皁元30、連接插座2 0 0與測試治具1〇。。透:; 凡3〇切換使電源供應單元2〇提供測試電壓 ::關早 ’並利用J:内邻京丨丨斷责> 、弋〆口 乂、1 0 0 是否二、::: 確認連接插座2 0 0之接地阻值, 而測試治具m主要包含(A): 冷,寺缺陷的標準。 單元5〇 ·及測接腳40;("阻值判斷 早兀旦及(C)燈唬顯示模組60,兹分別詳細說明如下· (A )里測接腳4 0用以與連接點丨〇電性耦合,。各旦 接腳40透過連接插座20。與連接點丨〇電性麵二時:^ =測 量測接腳40與連接點10係為同一接點,因此當測 1。〇〇須要連接點1 〇之接地阻值時,可透過量測接腳Μ取得 上述的連接點1 0,係指連接插座2 〇 〇與主機板之 利用焊接所搞合的數百個接點之一,其中每一連接點j 〇,V. Description of the invention (3) Group: Measuring pins and resistance value 剌-By measuring pins and connecting ¥ =: 二 和: No. display module. Among them, the grounding resistance value of the connection point is produced: the coupling value and the resistance value judgment unit will generate the corresponding output voltage according to the model voltage A + π Γ, and then use the light to display the supply, and according to the output voltage I-bay Welding condition. The earthen knife is not sorrowful in order to remind the user to connect the points. The present invention can be specifically defended as follows: 仃 的 贝 施 式, I will cooperate with the illustration of the method [implementation method] Section-: T read: Figure 1 " The connection socket of the CPU is shown as the connection% 2 = 1. Xiong Ming, the invention is a schematic diagram of the test mechanism for the connection of the central processing unit socket. The test mechanism includes a power source of 1 :: SO3, a socket of 200, and a test fixture of 10. . Transparent :; Where the 30 switching makes the power supply unit 20 provide the test voltage :: off early, and use J: Neighbor Beijing 丨 丨 Responsibility >, 弋 〆 口 乂, 1 0 0 Whether it is two ::: Confirm The ground resistance value of the connection socket 2 0 0, and the test fixture m mainly includes (A): cold, temple defect standards. Unit 50 and test pin 40; (" Resistance value judgment early Wudan and (C) lamp bluff display module 60, are described in detail respectively as follows: (A) test pin 40 is used to connect with the connection point丨 〇Electrical coupling. Each pin 40 passes through the connection socket 20. When it is electrically connected to the connection point 2: ^ = The measurement pin 40 and the connection point 10 are the same contact, so when measuring 1. 〇〇 When the ground resistance of connection point 10 is required, the above connection point 10 can be obtained by measuring pin M, which refers to the hundreds of contacts connected to socket 200 and the motherboard by welding. One, where each connection point j 〇,
第7頁 1233999 五、發明說明(4) 一接地阻值,此接地阻值 接點Η : = 型號主機板中之同-連 會有太大的;::或冷知的情形發生時’接地阻值並不 Γ. 2 0 0 Λ ; ^ ^4° ^ ^ ^ ^ ^ ^ ^ ^ ^ 之中央處理崙的接腳定義相同。 雷τ/Ζ)/且值判斷單元5〇與量測接腳40連接,並於接收到 應單元2〇與開關單—所提供的測欠 :=所r連接點10之接地阻值,其内部:: 值判畊電路,確認連接點10的接 並產生相應的輸出電壓。 1疋否,I於預δ又值, 接供:Π斷單元50接收測試電壓係由電源供應單元20所 ,'、、測试啟動的信號,而測試電壓係與中央處理器所 須之工作電壓相同。正堂的+ 主、、W ΠΓ y=b m 4- 40 ^ ^ ΛΑ „ . 吊的f月况下,使用者會於量測接腳 4〇,貝的與連接點10電性耦合時才會送出測試電壓。上述 所k到的電^源供應I元2〇可為外接式的冑源供應器(叩wer SUPP y 、父流電轉換器(AC adap ter )、不斷電系統 = iMnterruptlble p〇wer supply)、外接式電池,或者内 建於測試治具1 0 0中之扣式電池。 開關單元30則可控制電源供應單元2〇輸出之測試電壓 丄因此,使用者可利用開關單元3 0,控制測試程序是否執 行而開關單兀3 0與電源供應單元2 〇可整合而設置於測試 治具1 0 0内部。 阻值判斷單元5 0中之判斷電路的設置,係根據各連接 點10接地阻值之不同,而需要各別地設計。因此在一般的Page 7 1233999 V. Description of the invention (4) A grounding resistance, this grounding resistance contact Η: = the same as in the model motherboard-the connection will be too large:: or when a cold-known situation occurs' grounding The resistance value is not Γ. 2 0 0 Λ; Thunder τ / Z) / and the value judging unit 50 is connected to the measuring pin 40, and upon receiving the response unit 20 and the switch sheet—the provided measurement error: = the ground resistance value of the r connection point 10, which Internal :: value judgment circuit, confirm the connection of connection point 10 and generate corresponding output voltage. 1 疋 No, I is equal to the value of the pre-δ, and the power supply: The interruption unit 50 receives the test voltage from the power supply unit 20, and the test start signal, and the test voltage is related to the work required by the central processing unit. The voltage is the same. The main + of the main hall, W ΠΓ y = bm 4- 40 ^ ^ ΛΑ „. In the month of f, the user will measure the pin 40, and it will be sent out when it is electrically coupled with the connection point 10. Test voltage. The above-mentioned electric power supply I 2 can be external power supply (叩 wer SUPP y, AC adap ter), uninterruptible power system = iMnterruptlble p〇 wer supply), an external battery, or a button battery built into the test fixture 100. The switch unit 30 can control the test voltage output by the power supply unit 20. Therefore, the user can use the switch unit 30 Control whether the test program is executed and the switch unit 30 and the power supply unit 2 can be integrated and set inside the test fixture 100. The setting of the judgment circuit in the resistance value judgment unit 50 is based on the connection point 10 Different ground resistance values require separate designs. Therefore, in general
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狀況下,測試治具丨00上的阻值判斷單元5〇的數量, 測試之連接點1G的數量相同,而可以同時 的、欲 點1 〇。 | $的連接 請參閱「第2圖_ 路部分,提出具體詳細 阻值判斷單元5 〇係 阻53、第三電阻54、放 第一電阻51連接開關單 輸入端與電容器52,電 4〇、放大器55之負輸入 關單元3 0、放大器5 5之 54連接第二電阻53、放 器5 5連接電容器5 2、量 53、弟二電阻54、與第 為輸出端與燈號顯示模 ,其針對阻值判斷單元50的判斷卞 說明: % 第 電 由第一電阻51、電容器5 2 大器55與第四電阻56所組成ό ^ ^ 兀30、量測接腳40、放大器55之中 容器5 2連接第一電阻5 !、量負 端盥一接祕☆山 楚 ^ 、j接腳 而”接地鳊,弟二電阻53連接f 正輸入端與第三電阻54 ;第三電二 大器5 5之正輪入端與接地端,放大 測接腳40、第一電阻51、第二電阻 四電阻56,第四電阻56連接55放大 組6 0 。 垃阻值判斷單元5〇的設置’必須 ,當$測接腳4 〇產哇沾拉i丄如/士 ^ . r ^ ^ 、接也阻值,介於預設值時,傳送至 敌大為b 5負輪入端盥值 ^ ^55^#^ ^ ^/、傳迗至正輪入端的電壓值,經由放大 叩5^、屯阻乐四電阻56後之輸出電壓,需 示模組顯示;當捲地阳杜a 、,电&而了以驅動燈唬顯 預設值時,則;預設接地阻值,*介於 II ^ ^ ^私I不可驅動燈號顯示模組顯示。 關於弟一電阻51 、雷交 54的設置方式,麻於μ私奋叩52、弟二電阻53、第三電阻 ^ m }- π β Λ力的作法由工程師先於一狀況穩定的 王板板上,取得遠技 …、的接地阻值,做為接地阻值之預設Under the condition, the number of resistance value judging units 50 on the test fixture 00 and the number of connection points 1G for the test are the same, but the desired points 10 can be simultaneously. For the connection of $, please refer to the “Figure 2 _ Circuit” section, and propose specific resistance judgment unit 5 〇 Series resistance 53, third resistance 54, put the first resistance 51 to connect the single input terminal of the switch and capacitor 52, electrical 40, The negative input OFF unit 30 of the amplifier 55, 54 of the amplifier 5 5 are connected to the second resistor 53, the amplifier 5 5 is connected to the capacitor 5 2, the quantity 53, the second resistor 54 is the output terminal and the signal display mode, and Judgment for the resistance value judging unit 50 Explanation: The first battery is composed of the first resistor 51, the capacitor 5 2 and the fourth resistor 56 and the fourth resistor 56. ^ ^ 30, the measurement pin 40, the container in the amplifier 55 5 2 Connect the first resistor 5 !, the negative terminal is connected to the ☆ mountain Chu ^, j pin and "grounded", the second resistor 53 is connected to the f positive input terminal and the third resistor 54; the third electric two The positive end of the 5th wheel and the ground end, the amplification test pin 40, the first resistance 51, the second resistance four resistances 56, and the fourth resistance 56 are connected to the 55 amplification group 60. The setting of the resistance value judgment unit 50 is required. When $ Measurement pin 4 is produced by 沾 拉 丄 such as / / ^. R ^ ^, and the resistance value is between the preset value, it is transmitted to the enemy. B 5 is the input value of the negative wheel input end ^ ^ 55 ^ # ^ ^ ^ /, the voltage value transmitted to the positive end of the positive wheel, and the output voltage is amplified by 叩 5 ^, Tuner Lesi resistor 56, and the module is required. Display; when winding the sun, a, electric & to drive the lamp to display the preset value, then; the preset ground resistance value, * between II ^ ^ ^ private I can not drive the light signal display module display . Regarding the setting method of the first resistance 51 and the lightning resistance 54, the method of using the Yu Yu 52, the second resistance 53, and the third resistance ^ m}-π β Λ force is performed by an engineer before a stable king board. To obtain the ground resistance of remote technology ..., as the default value of ground resistance
1233999 五、發明說明(6) 值,再經由適當的計管, 。因此當上述元件配;之用配置上述各元件的最佳值 點的接地阻值而產生相:的:二化輸出電壓將只會根據連接 (C )燈號顯示模組6〇連 阻值判斷單元50的輪 妾卩值判畸早元50,並根據 列所述,當連接% ϋt,切換相應的顯示狀態。如上 60會相應的顯示狀能· # 工烊的狀况,燈號顯示模組 示模_會相應“顯:ί:”:冷::;:, ”號顯示模組6"…產生、= = =: 狀恶,一般都以使傺號链— 巴/且琥而不顯不 來代表,因此使:= 組1°„不發光或產生紅色燈號 發光與不發光或產生产泸=f燈唬顯不模組60的狀態為 質。 產生“虎的顏色’判斷連接插座的焊接品 實務上’中央處理器連容 若逐-的檢測所有的連接點仍=費;多夕=接:此= 明更j出,可同時檢測多個連接點的測試模卞二口此本發 一凊芩閱「第3圖」所示本發明第二實施例之例 示=,其係藉由同時使用多組第一實施例所揭= 之機^ 組’用以確認連接插座2◦◦中多個連接點10是否有 冷焊或空焊的情形產生。 疋合有 於此實施例中測試模組丨〇 〇主要包含( 1 口:及⑻機板70,其中將多隻量測接腳4〇、多個阻值松广 斷單兀50與多個燈號顯示模組6〇整合在機板7〇上而成為測 1233999 五 '發明說明(7) " ~一- 試模組100。而多隻量測接腳4〇的設置方式須於連接插座 2。0 0之插腳規格相同而加以設置,以利插。並且與多個燈 唬顯不模組60相應的設置於機板70的兩面,而其主要的系 統連接方式、運作方式係與元件設置方式,皆與第一實施 例相同,在此不再贅述。 、 請參閱「第4圖」係為本發明第二實施例之使用狀態 圖,以下將藉由「第3圖」「第4圖」說明測試模組100運 用主機板上之狀態。 當連接插座2 0 0與利用焊接方式與主機板上耦合後, 使用者^將測試模組丨00中多之量測接腳4〇(第一測試接腳 4 至第n測試接腳4 〇 n )透過連接插座2 〇 〇上多個連接點丄〇 L第/一連接點1〇1至第n連接點10n)電性耦合後,利用開關 單兀3 0將電源供應單元2 〇所提供的測試電壓傳送至多個阻 值判斷模级50 (第一阻值判斷模組501至第η阻值判斷模組 5 0η) ’即會各別地確認多個連接點丨〇的接地阻值,是否介 於預^設值’並產生相應的輸出電壓,而多個燈號顯示模組 6〇(第一燈號顯示模組6(η至第η燈號顯示模組6〇η)會根據 相應的輪出電壓’分別的切換顯示狀態;當多個燈號顯示 模組6 0切換成顯示的狀態,代表其相應的多個連接點1 〇並 無冷焊或空焊的狀態,相反的當多個燈號顯示模組60切換 成不顯示的狀態,即代表可能發生無冷焊或空焊的狀態。 ^ =上所述者’僅為本發明其中的實施例而已,並非用 來限疋本發明的實施範圍;即凡依本發明申請專利範圍所 作的均等變化與修飾,皆為本發明專利範圍所涵蓋。1233999 Fifth, the invention description (6) value, and then through the appropriate meter,. Therefore, when the above-mentioned components are matched, the phase resistance of the best value points of the above-mentioned components is used to generate the phase: The output voltage will only be judged based on the 60-connection resistance value of the (C) lamp number display module. The unit 妾 卩 value of the unit 50 judges the early element 50, and according to the column, when the% % t is connected, the corresponding display state is switched. As shown above, the corresponding status of the 60 will be displayed. # 工 烊 的 , State, the light module display module _ will correspondingly "display: ί:": cold ::;:, "" display module 6 " ... produced, = = =: Evil is generally represented by making the chain of 傺 — — // but not displayed, so that: = group 1 ° „No light or red light is emitted and no light or light is generated = f The state of the light-blind display module 60 is quality. Generate "Tiger's color" to judge the soldering products connected to the socket. In practice, the central processing unit will detect all the connection points still = fee; multiple nights = connect: this = Ming more j out, can detect multiple The test mode of the connection point is as follows: This article firstly reads an example of the second embodiment of the present invention shown in "Figure 3", which is a mechanism disclosed by using multiple sets of the first embodiment simultaneously. The group 'is used to confirm whether there are cold welding or empty welding at a plurality of connection points 10 in the connection socket 2. The test module in this embodiment includes: (1 port: and the machine board 70, among which a plurality of measurement pins 40, a plurality of resistance values loose and a single unit 50 and a plurality of The light signal display module 60 is integrated on the machine board 70 and becomes the test 1233999 Five 'invention description (7) " ~-Test module 100. And the setting method of multiple measurement pins 40 must be connected The socket 2. 0 0 has the same pin specifications and is set to facilitate plugging. And corresponding to the multiple light display module 60 is installed on both sides of the board 70, and its main system connection mode, operation mode and The component setting method is the same as that of the first embodiment, and is not repeated here. Please refer to "Fig. 4" is a diagram of the use state of the second embodiment of the present invention. The “picture 4” illustrates the state of the test module 100 on the main board. After connecting the socket 2 0 and coupling with the main board by soldering, the user ^ will measure more pins 4 in the test module 丨 00. (The first test pin 4 to the n-th test pin 4 〇 n) through a plurality of connection points on the socket 2 〇 〇L / One connection point 101 to the nth connection point 10n) After being electrically coupled, the switch unit 30 is used to transmit the test voltage provided by the power supply unit 20 to a plurality of resistance determination mode stages 50 (the first resistance value). The judgment module 501 to the n-th resistance judgment module 5 0η) 'will individually confirm the ground resistance values of the multiple connection points, whether they are within a preset value' and generate corresponding output voltages, and more Each light display module 6 (the first light display module 6 (η to η light display module 6〇η) will switch the display state according to the corresponding output voltage '; when multiple lights The display module 60 is switched to the display state, which indicates that its corresponding multiple connection points 10 are not cold-welded or air-welded. Conversely, when multiple light-signal display modules 60 are switched to the non-display state, that is, Represents a state where no cold welding or air welding may occur. ^ = The above is only an embodiment of the present invention, and is not intended to limit the scope of implementation of the present invention; Equal changes and modifications are all covered by the patent scope of the present invention.
1233999 圖式簡單說明 第1圖係為本發明藉由中央處理器之連接插座作為第 一實施例之測試機制示意圖; 第2圖係本發明之實施例將阻值判斷單元5 0之電路具 體化之測試機制示意圖; 第3圖係為本發明藉由中央處理器之連接插座作為第 二實施例之測試機制示意圖;及 第4圖係為本發明藉由中央處理器之連接插座作為第 二實施例之使用狀態圖。 【圖式符號說明】1233999 Brief description of the diagram. The first diagram is a schematic diagram of the testing mechanism of the first embodiment of the present invention by using the socket of the central processing unit. The second diagram is the embodiment of the present invention embodying the circuit of the resistance determination unit 50. Schematic diagram of the test mechanism; Figure 3 is a schematic diagram of the second embodiment of the test mechanism using a socket of the central processing unit; and Figure 4 is a schematic diagram of the second embodiment of the invention using a socket of the central processing unit Example of using state diagram. [Illustration of Symbols]
10 連接點 20 電源供應單元 30 開關單元 40 量測接腳;多隻量測接腳 401 第一量測接腳 40η 第η量測接腳 50 阻值判斷單元;多個阻值判斷單元 501 第一阻值判斷單元 50η 第η阻值判斷單元 51 .第一電阻 52 電容器 53 第二電阻 54 第三電阻 55 放大器 56 第四電阻 第12頁 1233999 圖式簡單說明 60 燈號顯示模組;多個燈號顯示模組 601 第一燈號顯示模組 60η 第η燈號顯示模組 7 0 機板 100 測試治具;測試模組 2 0 0 連接插座10 connection points 20 power supply unit 30 switch unit 40 measurement pins; multiple measurement pins 401 first measurement pin 40η first η measurement pin 50 resistance judgment unit; multiple resistance judgment units 501th A resistance judging unit 50η, a η resistance judging unit 51. The first resistor 52, the capacitor 53, the second resistor 54, the third resistor 55, the amplifier 56, the fourth resistor, page 12, 1233999, a simple description of the 60 light signal display module; multiple Light display module 601 First light display module 60η No η light display module 7 0 Board 100 test fixture; test module 2 0 0 socket
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TWI763291B (en) * | 2021-02-02 | 2022-05-01 | 佳世達科技股份有限公司 | Test fixture and test assembly line |
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