TWI233999B - Testing jig for connector socket of electronic component - Google Patents

Testing jig for connector socket of electronic component Download PDF

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Publication number
TWI233999B
TWI233999B TW93109480A TW93109480A TWI233999B TW I233999 B TWI233999 B TW I233999B TW 93109480 A TW93109480 A TW 93109480A TW 93109480 A TW93109480 A TW 93109480A TW I233999 B TWI233999 B TW I233999B
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Taiwan
Prior art keywords
resistor
test
resistance
electronic component
item
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TW93109480A
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Chinese (zh)
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TW200533936A (en
Inventor
I-Hsin Chan
Guo-Jian Luo
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Mitac Int Corp
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Publication of TW200533936A publication Critical patent/TW200533936A/en

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Abstract

A testing jig for connector socket of electronic component is used to ascertain the soldering condition of each contact between a connector socket of an electronic component and a main board. Whether the grounding resistance value of an electrically-coupled contact is within the range of preset values is ascertained by a resistance value determination unit and a measuring pin. An indicator display module is further enabled to switch to the corresponding display state, providing user a direct indicator confirming if the contact has any condition of cold solder and solder open to enhance the testing efficiency.

Description

1233999 五、發明說明(1) 【發明所屬之技街領域』 本發明係有關於〜^t 、 奸片A 、 種測試治具,庫用於雷2 插座的測試,更特別 μ用於電子元件連接 點的接地阻值,用曰:種精由阻質判斷電路確認連接 【先前技術; 確認連接點焊接狀態的測試治具。 目珂電腦可執行平台於設計時,大 :級的空間,因此許多可升級的元件,目前;1233999 V. Description of the invention (1) [Technical field to which the invention belongs] The present invention relates to ~ ^ t, traitor A, and a kind of test fixture. The library is used for the test of the Thunder 2 socket, and more particularly μ is used for electronic components. The ground resistance value of the connection point is stated as follows: a kind of fine-quality determination circuit to confirm the connection [prior art; test fixture to confirm the welding status of the connection point. Mu Ke computer executable platform at the time of design, large space: so many upgradeable components, currently;

^插座與主機板連接,以方便使用者未來升級的 機板的製作流程,大多利用表面黏著技術(f ace' Mounting Technology,SMT)來處理元件與印刷電路板 (Printed Circuit: Board ’ PCB)之間的焊接問題,但於表 面黏著技術作業時所需使用到的錫膏、印刷機(s〇丨der^ The socket is connected to the motherboard to facilitate the user's future board manufacturing process. Most of them use face 'mounting technology (SMT) to process components and printed circuit boards (Printed Circuit: Board' PCB). Soldering problems, but the solder paste and printing machine (s〇 丨 der

Paste Printer)、置件機(Stencil Pick & piacePaste Printer), Stencil Pick & piace

Ref low Oven )甚至是製程參數的設定,都可能會影響表 面黏著技術的製作品質。例如’錫貧粘度不足,或過錫爐 的時間過快,都可能造成冷焊或空焊的情形產生,但一般 冷焊或空焊的狀況,旅揲法利用肉眼可輕易察知,必須等 到主機板到達測試階段日守’發生了不穩定的狀況才能夠察 覺。 … 因此當主機板製作兀成到達測試階段,卻產生無法開 機或不穩定狀況之而需要檢修以確認問題時,大多都會先 確認是否有冷焊或空焊的狀況。舉例來說,以習知的方式 確認主機板上電子元件的連接插座是否有冷焊或空焊為例 ,工程師需要^ 的量測,連接插座插與主機板之間,數Ref low Oven) or even the setting of process parameters may affect the production quality of surface adhesion technology. For example, 'Insufficient tin viscosity or too fast time passing through a tin furnace may cause cold welding or air welding, but the general cold welding or air welding conditions can be easily detected by the naked eye using the naked eye. You must wait until the host The board arrived at the test stage and the day guard 'could not be detected until an unstable condition occurred. … Therefore, when the motherboard production has reached the test stage, but it cannot be turned on or is unstable, and needs to be repaired to confirm the problem, most of them will first confirm whether there is cold welding or air welding. For example, in a conventional way, to confirm whether there is cold welding or air welding of the connection sockets of the electronic components on the motherboard, the engineer needs to make a measurement of the connection between the socket and the motherboard.

1233999 發明說明(2) 百個連接點的接地阻值, 有空焊或冷焊的狀況。 此1 _上述數百個連接點是否 另外’當主機板故障 ,當維修完成廿胳1社,向而要先將連接插座先取下 確切叙 將連接插座焊接回去時,仍需要書靳一一 “:數百個連接點的接地阻值。而要重新 間,個i::::::電子元件的連接插座與主機板之 ,而需的確認工作也可能會因為稱-疏忽 電子元件的廠牌盥型i且::f接點的對地阻值,會隨著 各有不同的接地阻值r因ΐ疋同—型號但不同連接點而 ,利用量測^ τ ^ 口此工程師都需要花費兩倍的時間 作。j另一正常主機板並--比對,才能完成確認工 提昇競爭乂冓t述率的世代中’減少時間的浪費將可大大 提昇競^ 口此如何減少测試程序並縮短檢測時間以 【發明:i】已成為相關人員思考方向之-。 插座ΐ:ΐ為解決上述問冑,而提供-種電子元件連接 ,連接、χ、/α /、用以於需要確認連接插座與主機板之間 況,#々焊接狀况日守’利用查看燈號顯示模組的顯示狀 :迅速^認是否有冷焊或空焊的情形。 明据命""於先刚技術無法解決的問題與存在之缺點,本發 u 種%子元件連接插座之測試治具,包含有下列模1233999 Description of the invention (2) The ground resistance of one hundred connection points is in the condition of empty welding or cold welding. This 1 _Is the above hundreds of connection points additional? When the motherboard fails, when the repair is completed, the company must first remove the connection socket first, and then solder the connection socket back. You still need a book. : The ground resistance value of hundreds of connection points. To re-interconnect, i ::::::: electronic components are connected to the motherboard and the necessary confirmation work may also be due to weighing-negligent electronic component factory The brand resistance of the brand i and :: f contacts will vary with the different ground resistance values r due to different —models but different connection points. The measurement is required by the engineer ^ τ ^ It takes twice as much time to do it. J Another normal motherboard does not-compare to complete the confirmation process. In the generation where the competition rate is improved, 'reducing the waste of time will greatly improve the competition. How can this reduce testing? Procedures and shorten the detection time [Invention: i] has become the direction of thinking of related personnel. Socket ΐ: ΐ In order to solve the above problems, we provide-a kind of electronic component connection, connection, χ, / α /, for needs Check the condition between the connection socket and the motherboard. # 々 焊 状"Ri Shou" used to check the display status of the light display module: quickly identify whether there is cold welding or air welding. It is clear that problems and shortcomings that Yu Xiangang's technology cannot solve, this issue u Test fixtures for various types of sub-component connection sockets, including the following modules

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五、發明說明(3) 組:量測接腳、阻值剌- 藉由量測接腳與連接¥=:二及:號顯示模組。其中, 連接點之接地阻值,產:Ϊ合’而阻值判斷單元將根據 示模电A + π Γ·產生相應的輸出電壓,再利用燈號顯 供、、且根據輸出電壓 I -貝 的焊接狀況。 土刀換喊不狀悲,以提示使用者連接點 有關本發明具體可扞與 如下: 仃之貝施方式,鲶就配合圖式說明 【貫施方式】 第—:Τ閱:第1圖」所示以中央處理器之連接插座作為 接%二=1。兄明本發明’其係為中央處理器連接插座之連 接』的,試機制示意圖;測試機制包含有電源之1 ::關皁元30、連接插座2 0 0與測試治具1〇。。透:; 凡3〇切換使電源供應單元2〇提供測試電壓 ::關早 ’並利用J:内邻京丨丨斷责> 、弋〆口 乂、1 0 0 是否二、::: 確認連接插座2 0 0之接地阻值, 而測試治具m主要包含(A): 冷,寺缺陷的標準。 單元5〇 ·及測接腳40;("阻值判斷 早兀旦及(C)燈唬顯示模組60,兹分別詳細說明如下· (A )里測接腳4 0用以與連接點丨〇電性耦合,。各旦 接腳40透過連接插座20。與連接點丨〇電性麵二時:^ =測 量測接腳40與連接點10係為同一接點,因此當測 1。〇〇須要連接點1 〇之接地阻值時,可透過量測接腳Μ取得 上述的連接點1 0,係指連接插座2 〇 〇與主機板之 利用焊接所搞合的數百個接點之一,其中每一連接點j 〇,V. Description of the invention (3) Group: Measuring pins and resistance value 剌-By measuring pins and connecting ¥ =: 二 和: No. display module. Among them, the grounding resistance value of the connection point is produced: the coupling value and the resistance value judgment unit will generate the corresponding output voltage according to the model voltage A + π Γ, and then use the light to display the supply, and according to the output voltage I-bay Welding condition. The earthen knife is not sorrowful in order to remind the user to connect the points. The present invention can be specifically defended as follows: 仃 的 贝 施 式, I will cooperate with the illustration of the method [implementation method] Section-: T read: Figure 1 " The connection socket of the CPU is shown as the connection% 2 = 1. Xiong Ming, the invention is a schematic diagram of the test mechanism for the connection of the central processing unit socket. The test mechanism includes a power source of 1 :: SO3, a socket of 200, and a test fixture of 10. . Transparent :; Where the 30 switching makes the power supply unit 20 provide the test voltage :: off early, and use J: Neighbor Beijing 丨 丨 Responsibility >, 弋 〆 口 乂, 1 0 0 Whether it is two ::: Confirm The ground resistance value of the connection socket 2 0 0, and the test fixture m mainly includes (A): cold, temple defect standards. Unit 50 and test pin 40; (" Resistance value judgment early Wudan and (C) lamp bluff display module 60, are described in detail respectively as follows: (A) test pin 40 is used to connect with the connection point丨 〇Electrical coupling. Each pin 40 passes through the connection socket 20. When it is electrically connected to the connection point 2: ^ = The measurement pin 40 and the connection point 10 are the same contact, so when measuring 1. 〇〇 When the ground resistance of connection point 10 is required, the above connection point 10 can be obtained by measuring pin M, which refers to the hundreds of contacts connected to socket 200 and the motherboard by welding. One, where each connection point j 〇,

第7頁 1233999 五、發明說明(4) 一接地阻值,此接地阻值 接點Η : = 型號主機板中之同-連 會有太大的;::或冷知的情形發生時’接地阻值並不 Γ. 2 0 0 Λ ; ^ ^4° ^ ^ ^ ^ ^ ^ ^ ^ ^ 之中央處理崙的接腳定義相同。 雷τ/Ζ)/且值判斷單元5〇與量測接腳40連接,並於接收到 應單元2〇與開關單—所提供的測欠 :=所r連接點10之接地阻值,其内部:: 值判畊電路,確認連接點10的接 並產生相應的輸出電壓。 1疋否,I於預δ又值, 接供:Π斷單元50接收測試電壓係由電源供應單元20所 ,'、、測试啟動的信號,而測試電壓係與中央處理器所 須之工作電壓相同。正堂的+ 主、、W ΠΓ y=b m 4- 40 ^ ^ ΛΑ „ . 吊的f月况下,使用者會於量測接腳 4〇,貝的與連接點10電性耦合時才會送出測試電壓。上述 所k到的電^源供應I元2〇可為外接式的冑源供應器(叩wer SUPP y 、父流電轉換器(AC adap ter )、不斷電系統 = iMnterruptlble p〇wer supply)、外接式電池,或者内 建於測試治具1 0 0中之扣式電池。 開關單元30則可控制電源供應單元2〇輸出之測試電壓 丄因此,使用者可利用開關單元3 0,控制測試程序是否執 行而開關單兀3 0與電源供應單元2 〇可整合而設置於測試 治具1 0 0内部。 阻值判斷單元5 0中之判斷電路的設置,係根據各連接 點10接地阻值之不同,而需要各別地設計。因此在一般的Page 7 1233999 V. Description of the invention (4) A grounding resistance, this grounding resistance contact Η: = the same as in the model motherboard-the connection will be too large:: or when a cold-known situation occurs' grounding The resistance value is not Γ. 2 0 0 Λ; Thunder τ / Z) / and the value judging unit 50 is connected to the measuring pin 40, and upon receiving the response unit 20 and the switch sheet—the provided measurement error: = the ground resistance value of the r connection point 10, which Internal :: value judgment circuit, confirm the connection of connection point 10 and generate corresponding output voltage. 1 疋 No, I is equal to the value of the pre-δ, and the power supply: The interruption unit 50 receives the test voltage from the power supply unit 20, and the test start signal, and the test voltage is related to the work required by the central processing unit. The voltage is the same. The main + of the main hall, W ΠΓ y = bm 4- 40 ^ ^ ΛΑ „. In the month of f, the user will measure the pin 40, and it will be sent out when it is electrically coupled with the connection point 10. Test voltage. The above-mentioned electric power supply I 2 can be external power supply (叩 wer SUPP y, AC adap ter), uninterruptible power system = iMnterruptlble p〇 wer supply), an external battery, or a button battery built into the test fixture 100. The switch unit 30 can control the test voltage output by the power supply unit 20. Therefore, the user can use the switch unit 30 Control whether the test program is executed and the switch unit 30 and the power supply unit 2 can be integrated and set inside the test fixture 100. The setting of the judgment circuit in the resistance value judgment unit 50 is based on the connection point 10 Different ground resistance values require separate designs. Therefore, in general

12339991233999

狀況下,測試治具丨00上的阻值判斷單元5〇的數量, 測試之連接點1G的數量相同,而可以同時 的、欲 點1 〇。 | $的連接 請參閱「第2圖_ 路部分,提出具體詳細 阻值判斷單元5 〇係 阻53、第三電阻54、放 第一電阻51連接開關單 輸入端與電容器52,電 4〇、放大器55之負輸入 關單元3 0、放大器5 5之 54連接第二電阻53、放 器5 5連接電容器5 2、量 53、弟二電阻54、與第 為輸出端與燈號顯示模 ,其針對阻值判斷單元50的判斷卞 說明: % 第 電 由第一電阻51、電容器5 2 大器55與第四電阻56所組成ό ^ ^ 兀30、量測接腳40、放大器55之中 容器5 2連接第一電阻5 !、量負 端盥一接祕☆山 楚 ^ 、j接腳 而”接地鳊,弟二電阻53連接f 正輸入端與第三電阻54 ;第三電二 大器5 5之正輪入端與接地端,放大 測接腳40、第一電阻51、第二電阻 四電阻56,第四電阻56連接55放大 組6 0 。 垃阻值判斷單元5〇的設置’必須 ,當$測接腳4 〇產哇沾拉i丄如/士 ^ . r ^ ^ 、接也阻值,介於預設值時,傳送至 敌大為b 5負輪入端盥值 ^ ^55^#^ ^ ^/、傳迗至正輪入端的電壓值,經由放大 叩5^、屯阻乐四電阻56後之輸出電壓,需 示模組顯示;當捲地阳杜a 、,电&而了以驅動燈唬顯 預設值時,則;預設接地阻值,*介於 II ^ ^ ^私I不可驅動燈號顯示模組顯示。 關於弟一電阻51 、雷交 54的設置方式,麻於μ私奋叩52、弟二電阻53、第三電阻 ^ m }- π β Λ力的作法由工程師先於一狀況穩定的 王板板上,取得遠技 …、的接地阻值,做為接地阻值之預設Under the condition, the number of resistance value judging units 50 on the test fixture 00 and the number of connection points 1G for the test are the same, but the desired points 10 can be simultaneously. For the connection of $, please refer to the “Figure 2 _ Circuit” section, and propose specific resistance judgment unit 5 〇 Series resistance 53, third resistance 54, put the first resistance 51 to connect the single input terminal of the switch and capacitor 52, electrical 40, The negative input OFF unit 30 of the amplifier 55, 54 of the amplifier 5 5 are connected to the second resistor 53, the amplifier 5 5 is connected to the capacitor 5 2, the quantity 53, the second resistor 54 is the output terminal and the signal display mode, and Judgment for the resistance value judging unit 50 Explanation: The first battery is composed of the first resistor 51, the capacitor 5 2 and the fourth resistor 56 and the fourth resistor 56. ^ ^ 30, the measurement pin 40, the container in the amplifier 55 5 2 Connect the first resistor 5 !, the negative terminal is connected to the ☆ mountain Chu ^, j pin and "grounded", the second resistor 53 is connected to the f positive input terminal and the third resistor 54; the third electric two The positive end of the 5th wheel and the ground end, the amplification test pin 40, the first resistance 51, the second resistance four resistances 56, and the fourth resistance 56 are connected to the 55 amplification group 60. The setting of the resistance value judgment unit 50 is required. When $ Measurement pin 4 is produced by 沾 拉 丄 such as / / ^. R ^ ^, and the resistance value is between the preset value, it is transmitted to the enemy. B 5 is the input value of the negative wheel input end ^ ^ 55 ^ # ^ ^ ^ /, the voltage value transmitted to the positive end of the positive wheel, and the output voltage is amplified by 叩 5 ^, Tuner Lesi resistor 56, and the module is required. Display; when winding the sun, a, electric & to drive the lamp to display the preset value, then; the preset ground resistance value, * between II ^ ^ ^ private I can not drive the light signal display module display . Regarding the setting method of the first resistance 51 and the lightning resistance 54, the method of using the Yu Yu 52, the second resistance 53, and the third resistance ^ m}-π β Λ force is performed by an engineer before a stable king board. To obtain the ground resistance of remote technology ..., as the default value of ground resistance

1233999 五、發明說明(6) 值,再經由適當的計管, 。因此當上述元件配;之用配置上述各元件的最佳值 點的接地阻值而產生相:的:二化輸出電壓將只會根據連接 (C )燈號顯示模組6〇連 阻值判斷單元50的輪 妾卩值判畸早元50,並根據 列所述,當連接% ϋt,切換相應的顯示狀態。如上 60會相應的顯示狀能· # 工烊的狀况,燈號顯示模組 示模_會相應“顯:ί:”:冷::;:, ”號顯示模組6"…產生、= = =: 狀恶,一般都以使傺號链— 巴/且琥而不顯不 來代表,因此使:= 組1°„不發光或產生紅色燈號 發光與不發光或產生产泸=f燈唬顯不模組60的狀態為 質。 產生“虎的顏色’判斷連接插座的焊接品 實務上’中央處理器連容 若逐-的檢測所有的連接點仍=費;多夕=接:此= 明更j出,可同時檢測多個連接點的測試模卞二口此本發 一凊芩閱「第3圖」所示本發明第二實施例之例 示=,其係藉由同時使用多組第一實施例所揭= 之機^ 組’用以確認連接插座2◦◦中多個連接點10是否有 冷焊或空焊的情形產生。 疋合有 於此實施例中測試模組丨〇 〇主要包含( 1 口:及⑻機板70,其中將多隻量測接腳4〇、多個阻值松广 斷單兀50與多個燈號顯示模組6〇整合在機板7〇上而成為測 1233999 五 '發明說明(7) " ~一- 試模組100。而多隻量測接腳4〇的設置方式須於連接插座 2。0 0之插腳規格相同而加以設置,以利插。並且與多個燈 唬顯不模組60相應的設置於機板70的兩面,而其主要的系 統連接方式、運作方式係與元件設置方式,皆與第一實施 例相同,在此不再贅述。 、 請參閱「第4圖」係為本發明第二實施例之使用狀態 圖,以下將藉由「第3圖」「第4圖」說明測試模組100運 用主機板上之狀態。 當連接插座2 0 0與利用焊接方式與主機板上耦合後, 使用者^將測試模組丨00中多之量測接腳4〇(第一測試接腳 4 至第n測試接腳4 〇 n )透過連接插座2 〇 〇上多個連接點丄〇 L第/一連接點1〇1至第n連接點10n)電性耦合後,利用開關 單兀3 0將電源供應單元2 〇所提供的測試電壓傳送至多個阻 值判斷模级50 (第一阻值判斷模組501至第η阻值判斷模組 5 0η) ’即會各別地確認多個連接點丨〇的接地阻值,是否介 於預^設值’並產生相應的輸出電壓,而多個燈號顯示模組 6〇(第一燈號顯示模組6(η至第η燈號顯示模組6〇η)會根據 相應的輪出電壓’分別的切換顯示狀態;當多個燈號顯示 模組6 0切換成顯示的狀態,代表其相應的多個連接點1 〇並 無冷焊或空焊的狀態,相反的當多個燈號顯示模組60切換 成不顯示的狀態,即代表可能發生無冷焊或空焊的狀態。 ^ =上所述者’僅為本發明其中的實施例而已,並非用 來限疋本發明的實施範圍;即凡依本發明申請專利範圍所 作的均等變化與修飾,皆為本發明專利範圍所涵蓋。1233999 Fifth, the invention description (6) value, and then through the appropriate meter,. Therefore, when the above-mentioned components are matched, the phase resistance of the best value points of the above-mentioned components is used to generate the phase: The output voltage will only be judged based on the 60-connection resistance value of the (C) lamp number display module. The unit 妾 卩 value of the unit 50 judges the early element 50, and according to the column, when the% % t is connected, the corresponding display state is switched. As shown above, the corresponding status of the 60 will be displayed. # 工 烊 的 , State, the light module display module _ will correspondingly "display: ί:": cold ::;:, "" display module 6 " ... produced, = = =: Evil is generally represented by making the chain of 傺 — — // but not displayed, so that: = group 1 ° „No light or red light is emitted and no light or light is generated = f The state of the light-blind display module 60 is quality. Generate "Tiger's color" to judge the soldering products connected to the socket. In practice, the central processing unit will detect all the connection points still = fee; multiple nights = connect: this = Ming more j out, can detect multiple The test mode of the connection point is as follows: This article firstly reads an example of the second embodiment of the present invention shown in "Figure 3", which is a mechanism disclosed by using multiple sets of the first embodiment simultaneously. The group 'is used to confirm whether there are cold welding or empty welding at a plurality of connection points 10 in the connection socket 2. The test module in this embodiment includes: (1 port: and the machine board 70, among which a plurality of measurement pins 40, a plurality of resistance values loose and a single unit 50 and a plurality of The light signal display module 60 is integrated on the machine board 70 and becomes the test 1233999 Five 'invention description (7) " ~-Test module 100. And the setting method of multiple measurement pins 40 must be connected The socket 2. 0 0 has the same pin specifications and is set to facilitate plugging. And corresponding to the multiple light display module 60 is installed on both sides of the board 70, and its main system connection mode, operation mode and The component setting method is the same as that of the first embodiment, and is not repeated here. Please refer to "Fig. 4" is a diagram of the use state of the second embodiment of the present invention. The “picture 4” illustrates the state of the test module 100 on the main board. After connecting the socket 2 0 and coupling with the main board by soldering, the user ^ will measure more pins 4 in the test module 丨 00. (The first test pin 4 to the n-th test pin 4 〇 n) through a plurality of connection points on the socket 2 〇 〇L / One connection point 101 to the nth connection point 10n) After being electrically coupled, the switch unit 30 is used to transmit the test voltage provided by the power supply unit 20 to a plurality of resistance determination mode stages 50 (the first resistance value). The judgment module 501 to the n-th resistance judgment module 5 0η) 'will individually confirm the ground resistance values of the multiple connection points, whether they are within a preset value' and generate corresponding output voltages, and more Each light display module 6 (the first light display module 6 (η to η light display module 6〇η) will switch the display state according to the corresponding output voltage '; when multiple lights The display module 60 is switched to the display state, which indicates that its corresponding multiple connection points 10 are not cold-welded or air-welded. Conversely, when multiple light-signal display modules 60 are switched to the non-display state, that is, Represents a state where no cold welding or air welding may occur. ^ = The above is only an embodiment of the present invention, and is not intended to limit the scope of implementation of the present invention; Equal changes and modifications are all covered by the patent scope of the present invention.

1233999 圖式簡單說明 第1圖係為本發明藉由中央處理器之連接插座作為第 一實施例之測試機制示意圖; 第2圖係本發明之實施例將阻值判斷單元5 0之電路具 體化之測試機制示意圖; 第3圖係為本發明藉由中央處理器之連接插座作為第 二實施例之測試機制示意圖;及 第4圖係為本發明藉由中央處理器之連接插座作為第 二實施例之使用狀態圖。 【圖式符號說明】1233999 Brief description of the diagram. The first diagram is a schematic diagram of the testing mechanism of the first embodiment of the present invention by using the socket of the central processing unit. The second diagram is the embodiment of the present invention embodying the circuit of the resistance determination unit 50. Schematic diagram of the test mechanism; Figure 3 is a schematic diagram of the second embodiment of the test mechanism using a socket of the central processing unit; and Figure 4 is a schematic diagram of the second embodiment of the invention using a socket of the central processing unit Example of using state diagram. [Illustration of Symbols]

10 連接點 20 電源供應單元 30 開關單元 40 量測接腳;多隻量測接腳 401 第一量測接腳 40η 第η量測接腳 50 阻值判斷單元;多個阻值判斷單元 501 第一阻值判斷單元 50η 第η阻值判斷單元 51 .第一電阻 52 電容器 53 第二電阻 54 第三電阻 55 放大器 56 第四電阻 第12頁 1233999 圖式簡單說明 60 燈號顯示模組;多個燈號顯示模組 601 第一燈號顯示模組 60η 第η燈號顯示模組 7 0 機板 100 測試治具;測試模組 2 0 0 連接插座10 connection points 20 power supply unit 30 switch unit 40 measurement pins; multiple measurement pins 401 first measurement pin 40η first η measurement pin 50 resistance judgment unit; multiple resistance judgment units 501th A resistance judging unit 50η, a η resistance judging unit 51. The first resistor 52, the capacitor 53, the second resistor 54, the third resistor 55, the amplifier 56, the fourth resistor, page 12, 1233999, a simple description of the 60 light signal display module; multiple Light display module 601 First light display module 60η No η light display module 7 0 Board 100 test fixture; test module 2 0 0 socket

Claims (1)

1233999 六、申請專利範圍 1. 一種電子元件 與主機板間之 一量測接 一阻值判 電源供應單元 值,透過其内 一預設值相同 一燈號顯 據該輸出電壓 電壓之顯示狀 2 ·如申請專利範 治具,其中該 該測試電壓。 連接插座之測試治且, 一連接,點的焊接狀ς用/確認'連接插座 腳,與該連接點電性耦合; 匕各· 所單元,電性連接於今旦 4·曰u 、 。亥里測接腳,根攄一 供之一測試電壓會兮$ ^ 铃該連接點之一接地阻 部之阻值判斷電路刹齡Y 、, 1电峪刦畊该接地阻值是否與 ,並產生相應之一輸出電壓;及 示模組,電性連接於該阻值判斷單元,根 ,將該燈號顯示模組切換為相應於該輸出 態。 圍第1項所述之電子元件連接插座之測試 测試治具更包含該電源供應單元用以產生 3 ’ 士申明專利範圍第2項所述之電子元件連接插座之測試 治具,其中^該電源供應單元係選自由電源供應器(P〇wer s u p p 1 y )、父流電轉換器(a c a d a p t e r )、不斷電系統( uninterruptible power suppiy)、外接式電池以及扣 式電池所構成之組合中其中之一。 4·如申請專利範圍第1項所述之電子元件連接插座之測試 治具’其中該測試治具更包含一開關單元,用以控制該 測試電壓是否輪出至該阻值判斷單元。 5 ·如申請專利範圍第1項所述之電子元件連接插座之測試 治具’其中該卩且值判斷單元係包含有一電容器、一第一 電阻 弟一電阻、一第三電阻、一第四電阻與一放大1233999 VI. Application for patent scope 1. An electronic component and a motherboard are measured and connected to a resistance value to determine the value of the power supply unit. The output voltage and voltage are displayed through a preset signal with the same value 2 · If you apply for a patent, the test voltage. The test of the connection socket is as follows: one connection, the soldering of the connection point / confirmation, the connection socket pin is electrically coupled with the connection point; each unit is electrically connected to the current day. If you measure the pin, the test voltage will be based on the supply voltage. ^ The resistance value of the ground resistance at one of the connection points will be used to determine the circuit brake age Y, and 1 if the ground resistance is equal to A corresponding output voltage is generated; and the display module is electrically connected to the resistance judging unit, and the light signal display module is switched to correspond to the output state. The test fixture for testing the electronic component connection socket described in item 1 further includes the power supply unit for generating the test fixture for the electronic component connection socket described in item 2 of the patent scope of the 3's patent, of which ^ this The power supply unit is selected from the group consisting of a power supply (Power supp 1 y), a parent current converter (acadapter), an uninterruptible power suppiy, an external battery, and a button battery one. 4. The test fixture of the electronic component connection socket according to item 1 of the scope of the patent application, wherein the test fixture further includes a switching unit for controlling whether the test voltage is rotated out to the resistance judgment unit. 5 · The test fixture of the electronic component connection socket as described in item 1 of the scope of the patent application, wherein the value judgment unit includes a capacitor, a first resistor, a resistor, a third resistor, and a fourth resistor With a zoom 1233999 ;、申請專利範圍 _ 器。 3 ·如申請專利範圍筮 治具,其項所述之電子元件連接插座之測試 該放大哭之負钤A電阻連接該開關單元、該量測接腳、 電阻、該旦、^入端與該電容器;該電容器連接該第一 該第二電ΐ連接:門:ί大器:負輸入端與-接地端; 第三電阻· ϊΐ :關早…亥放大器之正輸入端與該 輪入端與該:m接!第二電:、該放大器之正 哭、兮旦 而,δ亥放大為連接該第一電阻、該電容 ^该ϊ測接腳、纺赞-帝咖 a # 阻·兮楚千 °亥弟一黾阻、该弟三電阻與該第四電 。,以弟四电阻連接該放大器輸出端與該燈號顯示模組 户:^ f = 圍第1項所述之電子元件連接插座之測試 二二:中該預設值係為一正常主機板中之同一連接點 之接地阻值。 丈優”、、£ 8m利範圍以項所述之電子元件連接插座之測試 士 /、>'、中田口亥連接點之该接地阻值與該預設值相同 日T ’該燈號顯示模組切換成為顯示狀態。 I:申凊專利範圍第:[項所述之電子元件連接插座之測試 =具,其中當該連接點之該接地阻值與該預設值不相同 1 ¥,該燈號顯示模組切換成為不顯示狀態。 〇·「種電子元件連接插座之測試模組,用以確認一 連接插座與主機板間之複數個連接點的焊接狀況,該 測試模組包含: 枝板,具有相對之一第一側面與一第二側面;1233999;, patent application scope _ device. 3 · If the scope of the patent application is for a fixture, the test of the electronic component connection socket described in the item, the negative resistance of the amplifier, the A resistance is connected to the switch unit, the measurement pin, the resistance, the input terminal, and the Capacitor; the capacitor is connected to the first and the second electrical connection: the gate: the large device: the negative input terminal and the-ground terminal; the third resistor · ϊΐ: off early ... the amplifier's positive input terminal and the wheel input terminal and The: m pick up! Second electricity :, the amplifier is crying, and once, δHai is amplified to connect the first resistor, the capacitor ^ the test pin, spinning and scoring-Di Ka a # resistance · Xi Chuqian The resistance, the third resistance and the fourth electricity. Connect the output terminal of the amplifier to the light display module with a four-resistor resistor: ^ f = test 22 of the electronic component connection socket described in item 1 above: The default value is a normal motherboard Ground resistance at the same connection point. “Excellent”, £ 8m profit range, the tester of the electronic component connection socket described in the item /, > ', the ground resistance value of the connection point of Zhongtiankouhai is the same as the preset value. The module is switched to the display state. I: The scope of the patent application for the patent: [Test of electronic component connection sockets described in [item = equipment], where the ground resistance value of the connection point is different from the preset value 1 ¥, the The light display module is switched to a non-display state. ○ "A test module for electronic component connection sockets is used to confirm the welding status of a plurality of connection points between a connection socket and a motherboard. The test module includes: A plate having a first side and a second side opposite to each other; 第15頁 1233999 、申叫專利範圍 複數個量測接腳,設置於該機板之該第一侧面, 與該連接點電性耦合; 複數個阻值判斷單元,設置於該機板之該第二侧 面’與該量測接腳電性連接,用以接收一電源供應單 元^供之一測試電壓與該連接點之複數個接地阻值, 亚透過其内部之複數個阻值判斷電路,判斷各該接地 阻值是否與其相應之一預設值相同,以產生相應之一 輸出電壓;及 複數個燈號顯示模組,設置於該機板之該第二側 面’與該阻值判斷單元電性連接,根據各該輸出電壓 將各該燈號顯示模組切換為相應於各該輸出電壓之顯 示狀態。 11 ·如申请專利範圍第1 〇項所述之電子元件連接插座之測 試模組,其中該機板之該第二侧面更包含該電源供應 單元’用以產生該測試電壓。 1 2 ·如申請專利範圍第11項所述之電子元件連接插座之測 試模組’其中該電源供應單元係選自由電源供應器 (power supply)、交流電轉換器(AC adapter )、 不断電糸統(uninterruptible power supply)、外接 式電池以及扣式電池所構成之組合其中之一。 1 3 ·如申請專利範圍第1 0項所述之電子元件連接插座之測 試模組,其中該機板之該第二側面更包含一開關單元 ,用以控制該測試電壓是否輸出至該阻值判斷單元。 1 4,如申請專利範圍第1 0項所述之電子元件連接插座之測 第16頁 1233999 六、申請專利範圍 〜 試权組’其中該阻值判斷單元係包含有複數個電容器 、複數個第一電阻、複數個第二電阻、複數個第三電 阻、複數個第四電阻與複數個放大器。 1 5 ·如申請專利範圍第丨4項所述之電子元件連接插座之測 試模組’其中該第一電阻連接該開關單元、該量測接 腳L該放大器之負輸入端與該電容器;該電容器連接 該第一電阻、該量測接腳、該放大器之負輸入端與一 接地端;該第二電阻連接該開關單元、該放大器之正 輸入端與該第三電阻;該第三電阻連接該第二電阻、 該放大器之正輸入端與該接地端;該放大器連接該第 二電阻、該電容器、該量測接腳、該第二電阻、該第 二電阻與該第四電阻;該第四電阻連接該放大器輸 立而與该燈號顯示模組。 16. 如申請專利範圍第1〇項所述之電子元件連接插座之蜊 試模組,其中該預設值係為正常主機板中同一姓 之接地阻值。 17. 如申請專利範圍第10項所述之電子元件連接插座之蜊 試模組’其中當各該阻值判斷單元之該接地阻值與其 相應之該預設值相同時,與各該阻值判斷單元電連之 各該燈號顯示模組,切換成為顯示狀態。 18. 如申請專利範圍第10項所述之電子元&連接插座之剛 試模組’其中當各該阻值判斷單元之該接地阻值與其 相應之ό亥預没值不相同時’與各該阻值判斷單元電連 之各遠燈说痛不板組’切換成為不顯示狀雜。1233999, the patent range of the application, a plurality of measuring pins are provided on the first side of the board, and are electrically coupled with the connection point; a plurality of resistance judgment units are provided on the first board of the board. The two sides' are electrically connected to the measuring pin for receiving a test voltage from a power supply unit and a plurality of ground resistance values of the connection point. Whether each of the ground resistances is the same as its corresponding preset value to generate a corresponding one of the output voltages; and a plurality of light signal display modules are disposed on the second side of the board and the resistance judging unit. According to the respective output voltages, each of the signal display modules is switched to a display state corresponding to each of the output voltages. 11 · The test module for an electronic component connection socket as described in Item 10 of the scope of patent application, wherein the second side of the board further includes the power supply unit 'for generating the test voltage. 1 2 · The test module of the electronic component connection socket according to item 11 of the scope of the patent application, wherein the power supply unit is selected from a power supply, an AC adapter, and an uninterruptible power system. (Uninterruptible power supply), an external battery and a button battery. 1 3 · The test module for an electronic component connection socket as described in item 10 of the scope of patent application, wherein the second side of the board further includes a switch unit for controlling whether the test voltage is output to the resistance value Judgment unit. 1 4. Test of electronic component connection sockets as described in item 10 of the scope of patent application. Page 16 1233999 6. Scope of patent application ~ trial right group, where the resistance judgment unit includes a plurality of capacitors and a plurality of first capacitors. A resistor, a plurality of second resistors, a plurality of third resistors, a plurality of fourth resistors, and a plurality of amplifiers. 1 5 · The test module for an electronic component connection socket according to item 4 of the scope of the patent application, wherein the first resistor is connected to the switch unit, the measurement pin L, the negative input terminal of the amplifier, and the capacitor; the The capacitor is connected to the first resistor, the measurement pin, the negative input terminal of the amplifier and a ground terminal; the second resistor is connected to the switching unit, the positive input terminal of the amplifier and the third resistor; the third resistor is connected The second resistor, the positive input terminal of the amplifier, and the ground terminal; the amplifier is connected to the second resistor, the capacitor, the measurement pin, the second resistor, the second resistor, and the fourth resistor; the first resistor Four resistors are connected to the amplifier input and the light display module. 16. The clam test module of the electronic component connection socket described in item 10 of the scope of patent application, wherein the preset value is the ground resistance value of the same surname in the normal motherboard. 17. The clam test module of the electronic component connection socket described in item 10 of the scope of patent application, wherein when the ground resistance value of each resistance judgment unit is the same as its corresponding preset value, Each of the signal display modules electrically connected to the judgment unit is switched to a display state. 18. The just-tested module of the electronic element & socket as described in item 10 of the scope of the patent application, wherein when the ground resistance value of each of the resistance judging units is different from its corresponding predetermined value, and Each of the remote lamps of each resistance determination unit is said to be incapable of switching to a non-display state. 12339991233999 第18頁Page 18
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