TWI226671B - Tape carrier package - Google Patents
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- TWI226671B TWI226671B TW92128767A TW92128767A TWI226671B TW I226671 B TWI226671 B TW I226671B TW 92128767 A TW92128767 A TW 92128767A TW 92128767 A TW92128767 A TW 92128767A TW I226671 B TWI226671 B TW I226671B
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- 239000000758 substrate Substances 0.000 claims abstract description 74
- 239000011521 glass Substances 0.000 claims abstract description 48
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims abstract description 36
- 230000000903 blocking effect Effects 0.000 claims abstract description 20
- 238000009413 insulation Methods 0.000 claims abstract description 14
- 239000010949 copper Substances 0.000 claims abstract description 13
- 229910052802 copper Inorganic materials 0.000 claims abstract description 12
- 239000002184 metal Substances 0.000 claims description 15
- 229910052751 metal Inorganic materials 0.000 claims description 15
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 claims description 9
- 239000004973 liquid crystal related substance Substances 0.000 claims description 9
- 239000000463 material Substances 0.000 claims description 9
- 239000004020 conductor Substances 0.000 claims description 6
- 239000004642 Polyimide Substances 0.000 claims description 5
- 229920001721 polyimide Polymers 0.000 claims description 5
- 229910000679 solder Inorganic materials 0.000 claims description 4
- 238000005520 cutting process Methods 0.000 claims description 3
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 claims description 3
- 229910052759 nickel Inorganic materials 0.000 claims description 3
- 238000007789 sealing Methods 0.000 claims 1
- 238000000034 method Methods 0.000 description 6
- 238000010586 diagram Methods 0.000 description 4
- 238000003698 laser cutting Methods 0.000 description 4
- 239000000853 adhesive Substances 0.000 description 3
- 230000001070 adhesive effect Effects 0.000 description 3
- 230000006378 damage Effects 0.000 description 2
- 238000002161 passivation Methods 0.000 description 2
- 239000002699 waste material Substances 0.000 description 2
- 230000003139 buffering effect Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 239000010408 film Substances 0.000 description 1
- 238000011990 functional testing Methods 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- RHZWSUVWRRXEJF-UHFFFAOYSA-N indium tin Chemical compound [In].[Sn] RHZWSUVWRRXEJF-UHFFFAOYSA-N 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 239000002994 raw material Substances 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
Abstract
Description
1226671 五、發明說明(1) 【發明所屬之技術領域】 本發明是有關於一種捲帶式載體封裝件,且特別是有 關於一種避免短路之捲帶式載體封裝件。 【先前技術】 對於一般液晶顯示器(liquid crystal monitor,LCD )的製程’一般前製程之方式係在偏光板貼附於薄膜電晶 體(thin film transistor,TFT)基板之後才對TFT基板進 行功能測試(function test),若測試完成之TFT基板有瑕 疵時必須捨棄,往往也造成已貼附之偏光板必須捨棄,導 致偏光板之浪費。為避免原料之浪費並節省製造成本,在 T F T基板進行第一次切割後,並於貼附偏光板之前,先對 TFT基板進行2G3D或2G2D之預測試(pre — test),以先篩選 掉不良之TFT基板。 請同時參照第1 A圖與第1 B圖。第1A圖繪示乃一傳統液 晶顯示模組之部分示意圖,第1 B圖繪示乃第1 a圖中沿著剖 面線IB-1B’方向之剖面圖。在第1B圖中,顯示器模組1〇() 包括一 TFT基板之玻璃基板11〇與一捲帶式載體封裝件 (tape carrier package,TCP)120。玻璃基板11()上具一 顯示區160、多個銦錫氧化(Indium Tin 〇xide, ίΤ(υ引腳 111,並配置有多條走線132以及多條導線131。導線丨3ΐ係 與一測試單兀1 3 〇電性連接,而顯示區i 6 〇係藉由丨τ〇引腳 111與走線132連接,走線丨32再與導線丨31實質上垂直排列 並部分連接,且藉由導線131與測試單元16〇電性連接,使1226671 V. Description of the invention (1) [Technical field to which the invention belongs] The present invention relates to a tape and reel carrier package, and in particular to a tape and reel carrier package to avoid short circuit. [Previous technology] For a general liquid crystal monitor (LCD) process, the general pre-process method is to perform a functional test on the TFT substrate after the polarizer is attached to a thin film transistor (TFT) substrate ( function test). If the TFT substrate that has been tested is defective, it must be discarded, which often results in the attached polarizers having to be discarded, resulting in waste of the polarizers. In order to avoid waste of raw materials and save manufacturing costs, after the TFT substrate is cut for the first time and before the polarizer is attached, a 2G3D or 2G2D pre-test is performed on the TFT substrate to screen out the defects first. TFT substrate. Please refer to both Figure 1 A and Figure 1 B. Fig. 1A is a partial schematic view of a conventional liquid crystal display module, and Fig. 1B is a cross-sectional view taken along the line IB-1B 'in Fig. 1a. In FIG. 1B, the display module 10 () includes a glass substrate 11 of a TFT substrate and a tape carrier package (TCP) 120. The glass substrate 11 () is provided with a display area 160, a plurality of indium tin oxide (Indium Tin 111) pins, and is configured with a plurality of wires 132 and a plurality of wires 131. The wires 3 and 1 are The test unit 1300 is electrically connected, and the display area i 6 〇 is connected to the trace 132 through 丨 τ〇 pin 111, and the trace 丨 32 is substantially vertically aligned with the conductor 丨 31 and partially connected. The wire 131 is electrically connected to the test unit 16 so that
1226671 五、發明說明(2) - 測试單元1 6 〇得以對顯示區1 6 0進行測試。 在第1B圖中’捲帶式載體封裝件12〇利用捲帶式載體 封裝件引腳(TCP lead) 140來與玻璃基板110上之IT〇引腳 111上下連接’其連接處係利用異向性導電膠(ACF)丨5〇使 電性能在垂直方向上下導通。TCP引腳14〇包括一軟質基板 1 21、一銅導線圖案層1 2 2與一絕緣層1 2 3。軟質基板1 21之 材質例如是聚醯亞胺(polyimide,pi),在軟質基板12ι上 有一層銅導線圖案層1 2 2。絕緣層1 2 3例如是一防銲阻絕層 (Solder Resist, SR),覆蓋於銅導線圖案層122上之部分 區域。 於第1A圖中,多條導線131與多條走線132僅以三條橫 向排列之導線(short ing bar) 131a、131b與131c,以及 四條縱向排列之走線132a、132b、132c與132d來說明。導 線1 31 a、1 3 1 b與1 31 c係分別與走線1 3 2之一端電性連接。 導線131a、131b與131c係分別對應至與玻璃基板11〇之顯 示區160中之一行紅色次晝素(sub-pixel)、一行綠色次晝 素與一行藍色次晝素電性連接。於導線131a、131b與131c 上覆蓋有一絕緣層(Passivation Layer,PL)133。 走線132a、132b、132c與132d位在絕緣層133之上, 且走線132a、132b、132c與132d上覆蓋有一絕緣層135, 亦在絕緣層133之上。導線131a、1 31b以及131c分別與走 線132a與132d、132b以及132c兩兩垂直,且於交會處分別 形成導通孔134a與134d、134b以及134c。導線13la藉由絕 緣層133中之導通孔134a與134d,使得導線131a與走線1226671 V. Description of the invention (2)-The test unit 160 can test the display area 160. In FIG. 1B, “the tape carrier package 120 uses the tape carrier package lead (TCP lead) 140 to connect up and down with the IT pin 111 on the glass substrate 110.” The conductive conductive adhesive (ACF) 丨 50 makes the electrical performance conductive up and down in the vertical direction. The TCP pin 14 includes a flexible substrate 1 21, a copper wire pattern layer 1 2 2 and an insulating layer 1 2 3. The material of the flexible substrate 1 21 is, for example, polyimide (pi), and a copper wire pattern layer 1 2 2 is formed on the flexible substrate 12m. The insulating layer 1 2 3 is, for example, a solder resist (SR), and covers a part of the area on the copper wire pattern layer 122. In FIG. 1A, the plurality of wires 131 and the plurality of wires 132 are illustrated by only three short arranging wires 131a, 131b, and 131c, and four longitudinally arranged wires 132a, 132b, 132c, and 132d. . The wires 1 31 a, 1 3 1 b, and 1 31 c are electrically connected to one end of the wires 1 3 2 respectively. The leads 131a, 131b, and 131c are electrically connected to one row of red sub-pixels, one row of green sub-pixels, and one row of blue sub-pixels in the display area 160 of the glass substrate 110, respectively. A conductive layer (Passivation Layer, PL) 133 is covered on the wires 131a, 131b, and 131c. The traces 132a, 132b, 132c, and 132d are located on the insulation layer 133, and the traces 132a, 132b, 132c, and 132d are covered with an insulation layer 135, which is also on the insulation layer 133. The wires 131a, 1 31b, and 131c are perpendicular to the wires 132a and 132d, 132b, and 132c, respectively, and through holes 134a and 134d, 134b, and 134c are formed at the intersections, respectively. The conducting wire 131a passes through holes 134a and 134d in the insulating layer 133, so that the conducting wire 131a and the wiring
TW1207F(友達).ptd 第6頁 1226671 五、發明說明(3) 132a與132d能夠電性連接。導線131b藉由絕緣層133中之 導通孔134b,使得導線131b與走線132b能夠電性連接。導 線131c藉由絕緣層133中之導通孔134c,使得導線131c與 走線132c能夠電性連接。 每個走線1 32係分別連接至相對應的玻璃基板11 〇上之 ITO引腳111,故玻璃基板11 〇之顯示區1 60中每一行次晝素 (sub-pixel)將藉由玻璃基板11〇上之多個I TO引腳111與其 相對應之走線1 3 2連接。縱向排列之多條走線1 3 2再分別與 三條橫向排列之導線1 3 1 a、1 31 b與1 3 1 c電性連接,再藉由 導線1 3 1與測試單元1 3 0電性連接,便能夠使測試單元1 3 〇 對玻璃基板11 0之顯示區1 6 0進行測試,如第1A圖所示。 待測试結束後’利用一雷射光束(1 a s e r b e a m)以平行 導線1 3 1之方向,將電性連接玻璃基板11 〇與測試單元丨3 〇 的走線132切斷,使導線131c與IT0引腳111之間形成一阻 斷區域(laser cutting line) 139。此時,玻璃基板ι1〇 與測試單元130之電性連接中斷。 請參照第1C圖,第1 C圖繪示乃第1 b圖中a部分於接合 時之示意圖。依照上述之傳統作法,玻璃基板丨丨〇與捲帶 式載體封裝件120在接合之前,需先中斷玻璃基板丨1〇與測 試單元130之電性連接。由於雷射切割為瞬間的高溫,在 切割走線132b的過程中,走線132b會被熔融並切割出一缺 口,以達到使玻璃基板110與測試單元丨30電性隔離之目、 的,並形成阻斷區域139。然而,在雷射高溫熔融的過程 中,以金屬材質構成之走線132b因高溫使得走線1321)之金TW1207F (AUO) .ptd Page 6 1226671 V. Description of the Invention (3) 132a and 132d can be electrically connected. The conducting wire 131b is electrically connected to the wiring 132b through the via 134b in the insulating layer 133. The conductive line 131c can be electrically connected to the wiring 132c through the through hole 134c in the insulating layer 133. Each trace 1 32 is connected to the corresponding ITO pin 111 on the corresponding glass substrate 11 〇, so each row of sub-pixels in the display area 1 60 of the glass substrate 11 〇 will be through the glass substrate A plurality of I TO pins 111 on 110 are connected to their corresponding traces 1 2 2. The multiple wires arranged vertically 1 3 2 are respectively electrically connected to three horizontally arranged wires 1 3 1 a, 1 31 b, and 1 3 1 c, and then electrically connected to the test unit 1 3 0 through the wires 1 3 1 When connected, the test unit 130 can test the display area 160 of the glass substrate 110, as shown in FIG. 1A. After the test is finished, use a laser beam (1 aserbeam) to cut the wiring 132 electrically connecting the glass substrate 11 〇 and the test unit 丨 3 〇 in a direction parallel to the wires 1 31 to make the wires 131c and IT0 A laser cutting line 139 is formed between the pins 111. At this time, the electrical connection between the glass substrate ι10 and the test unit 130 is interrupted. Please refer to Fig. 1C. Fig. 1C shows the schematic diagram of part a in Fig. 1b when it is joined. According to the above-mentioned traditional method, before the glass substrate 丨 〇 and the tape carrier package 120 are bonded, the electrical connection between the glass substrate 丨 10 and the test unit 130 needs to be interrupted. Because the laser cutting is instantaneous high temperature, during the cutting of the wiring 132b, the wiring 132b will be melted and cut a gap to achieve the purpose of electrically isolating the glass substrate 110 from the test unit 30, and A blocking region 139 is formed. However, in the process of laser melting at high temperature, the wiring 132b made of a metal material due to the high temperature makes the wiring 1321) gold.
1226671 五、發明說明(4) 屬材質熔融而向上越過阻斷區域139,溢散至絕緣層135之 表面上,形成金屬殘渣1 329。因此,當TCP引腳140與玻璃 基板110之ITO引腳in進行接合時,於阻斷區域139處, TCP引腳140之銅導線圖案層122便會與溢散至絕緣層135表 面上之金屬殘渣1 3 2 9接觸,造成電性短路,損害整個顯示 器模組之品質,其影響實不容小覷。 【發明内容】1226671 V. Description of the invention (4) The material is melted and passes over the blocking area 139 upwards, spills onto the surface of the insulating layer 135, and forms a metal residue 1 329. Therefore, when the TCP pin 140 is bonded to the ITO pin in of the glass substrate 110, at the blocking area 139, the copper wire pattern layer 122 of the TCP pin 140 and the metal spilled onto the surface of the insulating layer 135 Residues of 1 3 2 9 will cause electrical short circuit and damage the quality of the entire display module. The influence cannot be ignored. [Summary of the Invention]
有4監於此,本發明的目的就是在提供一種捲帶式載體 封裝件(Tape Carrier Package,TCP),其延伸覆蓋之絕 緣層能夠避免捲帶式載體封裝件與玻璃基板上測試完成殘 留之金屬殘渣接觸,減少電性短路之現象。 根據本發明的目的,提出一種捲帶式載體封裝件 (TCP),用以電性連接一玻璃基板。玻璃基板上 顯示區、多條走線與多條導線,導線係與一測試單、有 連接。在TCP與玻璃基板連接之前,領、 電十 盥導唆遠桩,α你、目丨4 s -料肋 ”、、員不£係先猎由走線 二連接,以使測试早兀對顯示區進行測試。且去 測試後,於走線上係形成一阻斷區域, 田兀成 測試單元之電性連接…,TCP包括 員示區輿In view of this, the object of the present invention is to provide a tape carrier package (Tape Carrier Package, TCP), the extended covering of which can prevent the tape carrier package and the glass substrate from remaining after the test is completed. Contact with metal residues to reduce electrical shorts. According to the purpose of the present invention, a tape and reel carrier package (TCP) is provided for electrically connecting a glass substrate. The display area, multiple traces and multiple wires on the glass substrate are connected to a test sheet. Before the TCP is connected to the glass substrate, the collar, the electric guide, the remote pole, the α, the head, the 4 s-material rib, and the driver are connected firstly by the second line to make the test early. The display area is tested. After the test is performed, a blocking area is formed on the wiring. Tian Wucheng test unit's electrical connection ... TCP includes the display area.
導線圖案層與一絕緣層。銅導線圖案層係配置二板、-銅 上’而絕緣層係覆蓋銅導線圖案層之部分區域。= f後’TCP係與玻璃基板接合’絕緣層係與、疋成接貝1 根據本發明的再一目的 提出一種顯示器模組,包括The wire pattern layer and an insulating layer. The copper wire pattern layer is arranged on the second board, -on copper, and the insulating layer covers a part of the copper wire pattern layer. = f 后 ’TCP system is bonded to the glass substrate’ The insulation layer is connected to the substrate 1 According to another object of the present invention, a display module is provided, including
1226671 五、發明說明(5; " ' " ----~ 一玻璃基板與一捲帶式載體封裝件(Tape ca]rHe:r Package,TCP)。玻璃基板上係具有一顯示區、多條走 與多條導線,導線係與一測試單元電性連接。在Tcp與玻 璃基,連接之前,顯示區係先藉由走線與導線連接/以 測試早疋對顯示區進行測試。且當完成測試後,於走線上 係形成一阻斷區域,用以阻斷顯示區與測試單元之電性連 接。TCP係與玻璃基板電性連接,TCP包括一軟質基板、一 銅導線圖案層與一絕緣層。銅導線圖案層係配置二軟質基 板上’而絕緣層係覆蓋銅導線圖案層之部分區域。於完^ 測試之後,TCP係與玻璃基板接合,絕緣層係與阻斷區 接觸。 為讓本發明之上述目的、特徵、和優點能更明顯易 懂,下文特舉一較佳實施例,並配合所附圖式,作詳細說 明如下: 、° 【實施方式】 請參照第2圖,其飨示乃依照本發明較佳實施例之一 液晶顯示模組之剖面圖。在第2圖中,顯示器模組2 〇 〇包括 一例如是TFT基板之玻璃基板1 10與一捲帶式載體封裝件 (TCP)220。玻璃基板110上具一顯不區、多個銦錫氧化 (Indium Tin Oxide, I TO)引腳111,並配置有多條導線 (shorting bar) 131,例如是第2圖中之導線131a、131b 與131c以及多條走線132(未顯示於圖上),於第2圖中僅以 132b做說明。1226671 V. Description of the invention (5; " '" ---- ~ A glass substrate and a tape carrier package (Tape ca) rHe: r Package, TCP). The glass substrate has a display area, Multiple wires and multiple wires, and the wire system is electrically connected to a test unit. Before the Tcp is connected to the glass substrate, the display area is connected by the wires and the wires / tested to test the display area. After the test is completed, a blocking area is formed on the trace to block the electrical connection between the display area and the test unit. TCP is electrically connected to the glass substrate. TCP includes a soft substrate, a copper wire pattern layer, and An insulating layer. The copper wire pattern layer is disposed on two flexible substrates, and the insulating layer covers a part of the copper wire pattern layer. After the test, the TCP is bonded to the glass substrate, and the insulating layer is in contact with the blocking area. In order to make the above-mentioned objects, features, and advantages of the present invention more comprehensible, a preferred embodiment is given below in conjunction with the accompanying drawings to describe in detail as follows: [°] [Embodiment] Please refer to FIG. 2 , Its indication A cross-sectional view of a liquid crystal display module according to a preferred embodiment of the present invention. In FIG. 2, the display module 2000 includes a glass substrate 110 such as a TFT substrate and a tape carrier package (TCP). 220. The glass substrate 110 has a display area, a plurality of Indium Tin Oxide (I TO) pins 111, and is provided with a plurality of shorting bars 131, such as the lead 131a in the second figure , 131b and 131c, and multiple traces 132 (not shown in the figure), only 132b is described in the second figure.
TW1207F(友達).ptd 第9頁 1226671 五、發明說明(6) 導線1 3 1 a、1 31 b與1 3 1 c係與一測試單元(未顯示於圖 中)電性連接,且導線131a、131b與131c分別與走線132之 一端電性連接。於導線1 3 1 a、1 3 1 b與1 31 c上覆蓋有一絕緣 層(Passivation Layer, PL)133。走線 132b 位在絕緣層 1 33之上,且走線132b上覆蓋有一絕緣層1 35,亦在絕緣層 133之上。導線131b與走線132b垂直,且於交會處形成一 導通孔134b。導線131b藉由絕緣層133中之導通孔134b, 使付導線1 3 1 b與走線1 3 2 b能夠電性連接。而顯示區1 6 0係 藉由IT0引腳111與走線132連接,走線132再與導線131實 質上垂直排列並部分連接,且藉由導線丨3 1與測試單元電 性連接,使測試單元得以對顯示區1 6 〇進行測試。 待測试結束後’利用一雷射光束(1 a s e r b e a m)以平行 導線131之方向,將電性連接玻璃基板丨1〇與測試單元的走 線132b阻斷分隔,使導線131c與ιτο引腳ill之間形成一阻 斷區域139,例如是一雷射切割區域(laser cutting line)。此時,玻璃基板110與測試單元之電性連接中斷。 捲帶式載體封裝件220利用捲帶式載體封裝件引腳 (TCP lead) 240來與玻璃基板11〇上之j τ〇引腳lu上下連 接,其連接處係利用異向性導電膠(ACF)15〇使電性能在垂 直方向上下導通。與習知所不同的是,捲帶式載體封 220之TCP引腳240包括一軟質基板221、一銅導線圖案午 222與一絕緣層223。軟質基板221之材質例如是聚醯亞 (polyimide,PI),在軟質基板221上有一層銅導 222。絕緣層223例如是一防銲阻絕層(s〇lder “以时茶層TW1207F (Youda) .ptd Page 9 1226671 V. Description of the invention (6) Leads 1 3 1 a, 1 31 b and 1 3 1 c are electrically connected to a test unit (not shown in the figure), and lead 131a , 131b, and 131c are electrically connected to one end of the wiring 132, respectively. A conductive layer (Passivation Layer, PL) 133 is covered on the wires 1 3 1 a, 1 3 1 b, and 1 31 c. The trace 132b is located on the insulation layer 133, and the trace 132b is covered with an insulation layer 135 and also on the insulation layer 133. The lead 131b is perpendicular to the trace 132b, and a via 134b is formed at the intersection. The conducting wire 131b enables the auxiliary conducting wire 1 3 1 b and the wiring 1 3 2 b to be electrically connected through the via hole 134 b in the insulating layer 133. The display area 160 is connected to the trace 132 through the IT0 pin 111, and the trace 132 is arranged substantially vertically and partially connected to the lead 131, and is electrically connected to the test unit through the lead 321 to make the test The unit was able to test the display area 160. After the test is finished, use a laser beam (1 aserbeam) to electrically connect the glass substrate and the wiring 132b of the test unit in a direction parallel to the conducting wire 131, so that the conducting wire 131c and ιτο pin ill A blocking region 139 is formed therebetween, such as a laser cutting line. At this time, the electrical connection between the glass substrate 110 and the test unit is interrupted. Tape and reel carrier package 220 uses tape and reel carrier package pins (TCP lead) 240 to connect up and down with j τ〇 pin lu on the glass substrate 110, and its connection is made of anisotropic conductive adhesive (ACF 15) Make the electrical performance conductive up and down in the vertical direction. Different from the conventional one, the TCP pin 240 of the tape carrier seal 220 includes a soft substrate 221, a copper conductor pattern 222, and an insulating layer 223. The material of the flexible substrate 221 is, for example, polyimide (PI), and there is a layer of copper conductor 222 on the flexible substrate 221. The insulating layer 223 is, for example, a solder resist layer
1226671 ------- 五、發明說明(7) 2SUt銅導線圖案層222上之部分區域,且絕緣層 穿件引腳?4^ f與阻斷區域139接觸之處。當捲帶式載體封 =牛引腳24G舆麵基板川之引腳⑴進行接合時,對於 iii=融/過程卜於絕緣層135表面上所形成之 於第2圖中),在此因絕緣層223阻隔 了原金屬殘渣1 329與銅導線圖案層222的直接接觸,便可 =效避免電性短路的發生,降低損害顯示器品質之可能 另外,凊參照第3圖,其繪示乃依照本發明較佳實施 例之另一液晶顯示模組之剖面圖。第3圖與第2圖 是,TCP引腳240不僅將絕緣層223延伸覆蓋至與阻斷區域 觸ΐί署於;露未覆蓋絕緣層223之銅導線圖案層 上,更认置一層具有一厚度之緩衝層27〇。緩衝声 的目的係用來減少銅導線圖案層222與絕緣層223之^ 之厚度差距。緩衝層270可以是於銅導線圖案層222上所設 置的金屬凸塊(bump),或者是一層導電膜。而金屬凸 材夤例如疋鎳(nickel, Ni)或銅(COpper,Cu)等金屬。 本發明上述實施例所揭露之捲帶式載體封裝件, 增加產出效能,更減少測試機台之購買與使用並節省成 本。最重要的是,捲帶式載體封裝件(Tcp)在玻璃美 之銅導線圖案層受到絕緣層(SR)的保護’避免銅^線圖案 層在以雷射切割形成之阻斷區域上受到刮傷或是盥 溢散之金屬殘渣產生電性短路(sh〇rt)之現象。另 絕緣層延伸覆蓋至與阻斷區域接觸時,同時亦覆蓋了導通 TW1207F(友達).ptd 第11頁 1226671 五、發明說明(8) 孔,可避免原與導通扎接觸之铜導線圖案層受到刮傷或是 與熔融之溢散之金屬殘渣產生電性短路(sh〇ri)之現象。 綜上所述,雖然本發明 ^ κ , 然其並非用以限 :月已从-較佳實施例揭露如上’ 本發明之精神和發明二任何熟習此技藝者,在不脫離 本發明之保護r ^圍内,當可作各種之更動與潤飾,因此 準。 Μ當視後附之巾請專利範圍所界定者為 TW1207F(友達).ptd 第12頁 1226671 圖式簡單說明 【圖式簡單說明】 第1 A圖繪示乃一傳統液晶顯示模組之部分示意圖。 第1 B圖繪示乃第1 A圖中沿著剖面線1 B-1 B’方向之剖面 圖。 第1C圖繪示乃第1B圖中A部分於接合時之示意圖。 第2圖繪示乃依照本發明較佳實施例之一液晶顯示模 組之剖面圖。 第3圖繪示乃依照本發明較佳實施例之另一液晶顯示 模組之剖面圖。 圖式標號說明 I 0 0、2 0 0 :顯示器模組 II 0 :玻璃基板 III : ITO 引腳 120、220 :捲帶式載體封裝件 1 2 1、2 2 1 :軟性基板 122、 222 :銅導線圖案層 123、 223 :絕緣層(SR) 1 3 0 :測試單元 1 3 1 a、1 3 1 b、1 3 1 c :導線 132、 132a、132b、132c :走線 1 329 :金屬殘渣 133、 135 :絕緣層(PL) 134a、134b、134c、134d :導通孔1226671 ------- V. Description of the invention (7) Part of the 2SUt copper wire pattern layer 222, and where the insulating layer lead pin? 4 ^ f is in contact with the blocking region 139. When the tape-and-reel carrier seal = the pin of the 24G substrate board is connected, the iii = melt / process is formed on the surface of the insulating layer 135 (see Figure 2). The layer 223 blocks the direct contact between the original metal residue 1 329 and the copper wire pattern layer 222, which can effectively avoid the occurrence of electrical short circuit and reduce the possibility of damaging the quality of the display. In addition, referring to FIG. A cross-sectional view of another liquid crystal display module according to a preferred embodiment of the present invention. 3 and 2 show that the TCP pin 240 not only extends the insulating layer 223 to cover the contact area with the blocking area; it also exposes a layer of copper wire pattern that does not cover the insulating layer 223 with a thickness Its buffer layer is 27 °. The purpose of buffering sound is to reduce the thickness difference between the copper wire pattern layer 222 and the insulating layer 223. The buffer layer 270 may be a metal bump provided on the copper wire pattern layer 222 or a conductive film. On the other hand, metal projections such as nickel (Ni) or copper (Cupper, Cu) are used. The tape-and-reel carrier package disclosed in the above embodiments of the present invention increases output efficiency, further reduces the purchase and use of test equipment, and saves costs. The most important thing is that the tape carrier package (Tcp) is protected by the insulating layer (SR) on the glass wire pattern layer of copper, to prevent the copper wire pattern layer from being scratched on the blocking area formed by laser cutting. Injuries or spilled metal residues cause electrical shorts. In addition, when the insulation layer is extended to contact the blocking area, it also covers the conduction TW1207F (AUO) .ptd Page 11 1226671 V. Description of the invention (8) The hole can prevent the copper wire pattern layer originally contacting the conduction wire from being affected. Scratches or electrical shorts with molten metal residues. In summary, although the present invention ^ κ, it is not intended to be limited: the above has been disclosed from the preferred embodiment-the spirit of the invention and the invention. Anyone skilled in the art will not depart from the protection of the invention. ^ Within the range, it can be modified and retouched, so it is accurate. Please refer to the attached patent for the definition of TW1207F (AUO) .ptd Page 121226671 Simple illustration [Schematic description] Figure 1A is a partial schematic diagram of a traditional LCD module . Figure 1B is a cross-sectional view taken along the section line 1 B-1 B 'in Figure 1A. Figure 1C is a schematic diagram of the part A in Figure 1B when it is joined. FIG. 2 is a cross-sectional view of a liquid crystal display module according to a preferred embodiment of the present invention. FIG. 3 is a cross-sectional view of another liquid crystal display module according to a preferred embodiment of the present invention. Description of figure numbers I 0 0, 2 0 0: Display module II 0: Glass substrate III: ITO pins 120, 220: Tape-and-reel carrier package 1 2 1, 2 2 1: Flexible substrates 122, 222: Copper Wire pattern layers 123, 223: Insulation layer (SR) 1 3 0: Test unit 1 3 1 a, 1 3 1 b, 1 3 1 c: Wire 132, 132a, 132b, 132c: Trace 1 329: Metal residue 133 135: Insulation layer (PL) 134a, 134b, 134c, 134d: Vias
TW1207F(友達).ptd 第13頁 1226671 圖式簡單說明 139 140 150 270 阻斷區域 240 : TCP弓丨腳 異向性導電膠 緩衝層TW1207F (AUO) .ptd Page 13 1226671 Simple illustration of the diagram 139 140 150 270 Blocking area 240: TCP bow 丨 Anisotropic conductive adhesive Buffer layer
TW1207F(友達).ptd 第14頁TW1207F (AUO) .ptd Page 14
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TW92128767A TWI226671B (en) | 2003-10-16 | 2003-10-16 | Tape carrier package |
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Cited By (1)
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US7528897B2 (en) | 2006-02-17 | 2009-05-05 | Au Optronics Corp. | Circuit and a display using same |
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US7528897B2 (en) | 2006-02-17 | 2009-05-05 | Au Optronics Corp. | Circuit and a display using same |
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