TWI225969B - Photosensitive resin composition, patterning method, and electronic components - Google Patents

Photosensitive resin composition, patterning method, and electronic components Download PDF

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Publication number
TWI225969B
TWI225969B TW089119305A TW89119305A TWI225969B TW I225969 B TWI225969 B TW I225969B TW 089119305 A TW089119305 A TW 089119305A TW 89119305 A TW89119305 A TW 89119305A TW I225969 B TWI225969 B TW I225969B
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Taiwan
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resin composition
photosensitive resin
group
precursor
formula
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TW089119305A
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Chinese (zh)
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Akihiro Sasaki
Noriyoshi Arai
Makoto Kaji
Toshiki Hagiwara
Brian C Auman
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Hitachi Chem Dupont Microsys
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    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/039Macromolecular compounds which are photodegradable, e.g. positive electron resists
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G73/00Macromolecular compounds obtained by reactions forming a linkage containing nitrogen with or without oxygen or carbon in the main chain of the macromolecule, not provided for in groups C08G12/00 - C08G71/00
    • C08G73/06Polycondensates having nitrogen-containing heterocyclic rings in the main chain of the macromolecule
    • C08G73/10Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/038Macromolecular compounds which are rendered insoluble or differentially wettable
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/038Macromolecular compounds which are rendered insoluble or differentially wettable
    • G03F7/0387Polyamides or polyimides
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/46Manufacturing multilayer circuits
    • H05K3/4644Manufacturing multilayer circuits by building the multilayer layer by layer, i.e. build-up multilayer circuits
    • H05K3/4673Application methods or materials of intermediate insulating layers not specially adapted to any one of the previous methods of adding a circuit layer
    • H05K3/4676Single layer compositions

Abstract

A photosensitive resin composition comprising an aromatic polyimide precursor, wherein a 10 mum thick layer of precursor has light transmittance at a wavelength of 365 nm of at least 1% and a 10 mum thick polyimide film made from the resin composition by imidation ring closure and deposited on a silicon substrate results in a residual stress of at most 25 MPa. The composition can be patterned through i-line exposure followed by development with alkaline solutions, and can be imidized into low-stress polyimide patterns. Electronic components having the polyimide patterns have high reliability.

Description

1225969 A7 B7 五、發明說明(1 ) L發明領域 (請先閱讀背面之注音?事項再填寫本頁) 本發明係關於一種感光性樹脂組成物,使用該組成物 圖案化之方法,以及使用該感光性樹脂組成物製備之電子 組件。 2 ·相關技術之說明 近來於半導體業,已使用具有良好耐熱性之有機物質 例如聚醢亞胺樹脂,用作為層間絕緣材料以替代習知無機 材料,原因乃在於其具有良好特性。半導體積體電路以及 印刷電路之電路圖案化需要許多複雜的步驟,例如於基材 表面上形成抗触劑薄膜,於預定位置經由選擇性曝光及餘 刻去除薄膜之不需要的部份,以及清洗如此處理後的基材 表面。因此希望開發耐熱感光性材料用作為抗光蝕劑,其 於經由曝光及顯像而被圖案化後可直接用作為絕緣層。 經濟部智慧財產局員工消費合作社印製 耐熱感光性材料曾經提議使用例如包含感光性聚醢亞 胺、環狀聚丁二烯等作為基本聚合物。尤其感光性聚醢亞 胺類特別值得注目,原因在於其耐熱性良好且可去除雜質 (例如水,溶劑,聚合物之感光基,光引發劑,敏化劑等)。 此種感光性聚醯亞胺中曾經提議一種包含聚醯亞胺前驅物 及二鉻酸鹽之系統(參考JP_B 49-17374)。該提議之系統之 優點為具有有用的光敏感度及良好薄膜形成能力,但缺點 為其儲存安定性不佳以及鉻離子會殘留於聚醯亞胺中。由 於此種缺點,故此種系統無法付諸實際使用。 為了解決此等問題’曾經提議一種混合聚釀亞胺前驅 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 1 311836 1225969 A71225969 A7 B7 V. Description of the invention (1) Field of invention (please read the note on the back? Matters before filling out this page) The present invention relates to a photosensitive resin composition, a method for patterning the composition, and using the same Electronic component made of photosensitive resin composition. 2 · Description of related technologies Recently, in the semiconductor industry, organic substances having good heat resistance, such as polyimide resins, have been used as interlayer insulation materials instead of conventional inorganic materials because of their good characteristics. The patterning of semiconductor integrated circuits and printed circuits requires many complicated steps, such as forming an anti-contact film on the surface of the substrate, removing unnecessary parts of the film by selective exposure and leaving aside at a predetermined position, and cleaning The surface of the substrate thus treated. Therefore, it is desirable to develop a heat-resistant photosensitive material for use as a photoresist, which can be directly used as an insulating layer after being patterned through exposure and development. Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs. Heat-resistant photosensitive materials have proposed the use of, for example, photosensitive polyimide and cyclic polybutadiene as basic polymers. In particular, photosensitive polyimide is worthy of attention because of its good heat resistance and its ability to remove impurities (such as water, solvents, photopolymers of polymers, photoinitiators, sensitizers, etc.). A system comprising a polyimide precursor and a dichromate has been proposed in such a photosensitive polyimide (refer to JP_B 49-17374). The advantages of the proposed system are useful light sensitivity and good film formation capabilities, but the disadvantages are poor storage stability and the presence of chromium ions in the polyimide. Because of this disadvantage, such a system cannot be put into practical use. In order to solve these problems, a hybrid polyimide precursor was proposed. The paper size is applicable to Chinese National Standard (CNS) A4 (210 X 297 mm) 1 311836 1225969 A7

經濟部智慧財產局員工消費合作社印製 五、發明說明(2 ) 物與含感光基之化合物之方法(例如參考JP_A M l⑽ 等)’以及一種組合聚醯亞胺前驅物與具有感光基之化合物Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs. 5. Description of the invention (2) Method of compound and photosensitive compound (for example, refer to JP_A M l⑽, etc.) and a combination of polyimide precursor and compound with photosensitive group.

之方法,因而將感光基導入聚醯亞胺前驅物(參考JP_A 56-24343,60-100143 等)〇 伸因該簟古、土 > e t 也成 ^ J彳一 u邊寻方法之感光性聚醯亞 胺前驅物主要係衍生自芳族單體,該種芳族單體具有良好 耐熱性及良好機械性質,但由於聚醯亞胺前驅物本身之光 吸收性故紫外光透射率低,結果於聚醯亞胺薄膜之曝光區 的光化學反應經常不足(亦即感光性低)。結果使用前述感 光性聚醯亞胺前驅物用於圖案化經常成問題,其在於聚醯 亞胺薄膜之感光性低’形成的圖案之侧面圖以及解析度不 佳。隨著業界半導體的集成程度的提高,半導體裝置設計 法則變得愈來愈精細,且要求半導體裝置具有更高的解析 程度。 製造半導體裝置時,採用1·· 1投射器(稱做投射鏡) 以及縮小投射器(稱做步進器),例如用以替代習知具有平 行光線的接觸/近端投射器俾成像為較細微的電路圖案。用 於步進器,可使用單色光例如來自超高壓汞燈之高功率振 蘯光或準分子雷射束。所謂的g線步進器為最普遍的步進 器。此種步進器使用得自超高壓汞燈的g線可見光(波長 436毫微米)。但為了滿足近來更加精細的工作法則的要 求’外加於步進器的光波長係需縮短的。此種情況下,使 用i線步進器(波長:365毫微米)替代g線步進器(波長: 436毫微米)。 但如前述,設計用於接觸/近端投射器、投射鏡及g線 (請先閱讀背面之注意事項再填寫本頁) |裝--------訂---------線· 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 2 311836 1225969 A7 B7 五、發明說明〇 ) (請先閱讀背面之注意事項再填寫本頁) 步進器的習知感光性聚醯亞胺基本聚合物之^線透光率不 佳,以及通過聚合物的i線透射比接近〇。因此使用丨線步 進器圖案化習知感光性聚醯亞胺產生的圖案不佳。用於製 仏半導體裝置之LOC(引線於晶片上)高密度封裝體系統, 需要厚層聚醯亞胺膜作為表面保護。於厚層聚醯亞胺臈之 例,光透射比不良的問題又更惡化。如此高度希望具有高土 線透射率且可使用i線步進器圖案化成為良好圖案的感光 性聚醯亞胺類。就此方面而言,曾經報告將某些取代基導 入感光性聚酿亞胺主鏈的芳香環可有效提高聚醯亞胺類之 1線透射比(參考JP_A 8-337652等)。 用作為半導體裝置之基材的碎晶圓直徑變大。直經的 加大結果造成另一項問題為,塗布以表面保護作用聚醯亞 胺薄膜之石夕晶圓由於聚醯亞胺薄膜與下方矽晶圓間的熱膨 脹係數差異結果比先前趣曲得更多。此種情況下,意圖找 出具有熱膨脹係數比習知聚醯亞胺更小的感光性聚醯亞胺 類。通常具有剛性桿狀分子結構之聚醯亞胺類之熱膨脹性 較低。但具有剛性桿狀分子結構之典型聚醯亞胺之i線透 經濟部智慧財產局員工消費合作社印製 光度低。因此光圖案化此類型聚醯亞胺的能力通常低。 發明概述 根據前述目的,本發明提供具有較高i線透光度之芳 族聚醯亞胺前驅物,其可被醯亞胺化成為於矽晶圓上具有 低熱膨脹係數及低機械應力之聚醯亞胺樹脂,以及提供包 含前驅物之感光性樹脂組成物。該組成物也具有良好耐熱 性、高感光性及高解析度等優點。 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 3 311836 1225969 A7 B7 五、發明說明(4 ) 本發明也提供可使用水性鹼溶液顯像之感光性樹脂組 成物,該水性鹼溶液比以溶劑為主的顯像劑更符合環保。 (請先閱讀背面之注意事項再填寫本頁) 本發明也提供一種獲得具有良好側面圖之聚醯亞胺圖 案之圖案化方法。該方法使用前述感光性樹脂組成物。由 於i線透射比高及感光度高,故組成物之聚醯亞胺前驅物 經由1線曝光方便加工獲得高解析度圖案。於醯亞胺化後 形成的聚醯亞胺薄膜具有良好耐熱性以及於矽晶圓上之機 械應力低等優點。 根據本發明之圖案化方法之另一優點為環保的水性驗 溶液可用於該方法顯像。 本發明進一步提供具有高解析度聚醯亞胺圖案之可靠 的電子組件。電子組件中,形成的聚醯亞胺圖案具有良好 側面圖及高度耐熱性及其剩餘應力極小。 特別本發明提供下列之較佳具體實施例: 經濟部智慧財產局員工消費合作社印製 (1) 一種感光性樹脂組成物包含一種芳族聚醯亞胺前 驅物,其中厚10微米之前驅物層具有於365毫微米之光透 射比至少1 %,以及經由醯亞胺化環閉合而由聚醢亞胺組 成物製成且沈積於矽基材上之厚10微米的聚醢亞胺薄膜 可獲得剩餘應力至多25百萬巴斯卡。 (2) (1)之感光性樹脂組成物,其中通過由芳族聚醯亞胺 前驅物製成的厚10微米薄膜於365毫微米波長之光透射比 至少為5%。 (3) —種感光性樹脂組成物,包含一種芳族聚醯亞胺前 驅物’其中該芳族聚醯亞胺前驅物具有通式⑴之重複結構 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公爱) 4 311836 1225969 A7 五、發明說明(5 ) 單位:><x, ><>-或一<>- 其中A及B分別表示三價或四價芳族基;以及Χ&γ 自分別表示未與Α或Β共輛接合之至少一個二彳賈美 (4)(3)之感光性樹脂組成物,其中具有式(〗)之結構式 之芳族聚醯亞胺前驅物具有通式(II)之重複結構單位··Method, so the photosensitive group is introduced into the precursor of polyimide (refer to JP_A 56-24343, 60-100143, etc.) 〇 Because of the ancient, soil > et also become the sensitivity Polyimide precursors are mainly derived from aromatic monomers. The aromatic monomers have good heat resistance and good mechanical properties, but due to the light absorption of the polyimide precursors, the UV light transmission is low. As a result, the photochemical reaction in the exposed area of the polyimide film is often insufficient (ie, the sensitivity is low). As a result, the use of the aforementioned photosensitive polyfluorene imide precursor for patterning is often problematic because the side view of the pattern formed by the low sensitivity of the polyfluorine imide film and the resolution are not good. With the increase of the degree of integration of semiconductors in the industry, the design rules of semiconductor devices have become more and more sophisticated, and semiconductor devices have been required to have a higher degree of analysis. When manufacturing semiconductor devices, a 1 ·· 1 projector (called a projection lens) and a reduced projector (called a stepper) are used, for example, to replace the conventional contact / near-end projector with parallel light. Subtle circuit pattern. For the stepper, monochromatic light such as high-powered chirped light from an ultrahigh-pressure mercury lamp or an excimer laser beam can be used. The so-called g-line stepper is the most common stepper. This stepper uses g-line visible light (wavelength 436 nm) from an ultra-high pressure mercury lamp. However, in order to satisfy the requirements of more recent finer working rules, the wavelength of the light applied to the stepper needs to be shortened. In this case, use an i-line stepper (wavelength: 365 nm) instead of a g-line stepper (wavelength: 436 nm). But as mentioned above, it is designed for contact / proximity projector, projection lens and g-line (please read the precautions on the back before filling this page) | Installation -------- Order ------- --Line · This paper size is in accordance with Chinese National Standard (CNS) A4 (210 X 297 mm) 2 311836 1225969 A7 B7 V. Description of the invention 〇) (Please read the precautions on the back before filling this page) Stepper The conventional light-sensitive polyfluorene imide basic polymer has a poor linear light transmittance, and the i-ray transmittance through the polymer is close to zero. Therefore, the use of a linear stepper to pattern the conventional photosensitive polyimide produces poor patterns. The LOC (lead-on-wafer) high-density package system used to fabricate semiconductor devices requires a thick polyimide film as a surface protection. In the case of thick polyimide, the problem of poor light transmission is worsened. It is highly desirable that the photosensitive polyimide has a high soil transmittance and can be patterned into a good pattern using an i-line stepper. In this regard, it has been reported that the introduction of certain substituents into the aromatic ring of the photosensitive polyimide backbone can effectively improve the 1-line transmittance of polyimide (refer to JP_A 8-337652, etc.). The diameter of a broken wafer used as a substrate for a semiconductor device becomes larger. The result of the increase in straight length caused another problem. The difference in thermal expansion coefficient between the polyimide film and the underlying silicon wafer caused by the Shixi wafer coated with a polyimide film with a surface protection effect was better than the previous song. More. In this case, it is intended to find a photosensitive polyimide having a coefficient of thermal expansion smaller than that of the conventional polyimide. Polyimide with rigid rod-like molecular structure usually has low thermal expansion. However, the typical polyimide i-rays with a rigid rod-shaped molecular structure are printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs. Therefore the ability to photo-pattern this type of polyimide is generally low. SUMMARY OF THE INVENTION According to the foregoing object, the present invention provides an aromatic polyfluorene imide precursor having a high i-line transmittance, which can be amidated to a polymer having a low thermal expansion coefficient and a low mechanical stress on a silicon wafer. Fluorene imine resin, and a photosensitive resin composition containing a precursor. This composition also has advantages such as good heat resistance, high sensitivity, and high resolution. This paper size is in accordance with Chinese National Standard (CNS) A4 (210 X 297 mm) 3 311836 1225969 A7 B7 V. Description of the invention (4) The present invention also provides a photosensitive resin composition that can be developed using an aqueous alkaline solution. Aqueous alkaline solutions are more environmentally friendly than solvent-based imaging agents. (Please read the notes on the back before filling this page) The present invention also provides a patterning method for obtaining a polyimide pattern with a good side view. This method uses the aforementioned photosensitive resin composition. Due to the high i-line transmittance and high sensitivity, the polyimide precursor of the composition can be easily processed through 1-line exposure to obtain a high-resolution pattern. The polyimide film formed after the imidization has good heat resistance and low mechanical stress on silicon wafers. Another advantage of the patterning method according to the present invention is that an environmentally friendly aqueous test solution can be used for the development of the method. The present invention further provides a reliable electronic component having a high-resolution polyimide pattern. The polyimide pattern formed in electronic components has good side views, high heat resistance, and minimal residual stress. In particular, the present invention provides the following preferred embodiments: Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs (1) A photosensitive resin composition comprising an aromatic polyimide precursor, wherein the precursor layer is 10 micrometers thick A polyimide film having a light transmittance of at least 1% at 365 nanometers and a polyimide film made of a polyimide composition and deposited on a silicon substrate via closure of the imidium ring and obtained on a silicon substrate is available Residual stress up to 25 million Baska. (2) The photosensitive resin composition of (1), wherein the light transmittance at a wavelength of 365 nm of a thin film of 10 µm thick made of an aromatic polyimide precursor is at least 5%. (3) A photosensitive resin composition comprising an aromatic polyimide precursor 'wherein the aromatic polyimide precursor has a repeating structure of the general formula ⑴ This paper applies Chinese National Standard (CNS) A4 Specifications (210 X 297 public love) 4 311836 1225969 A7 V. Description of the invention (5) Unit: > < x, > < >-or one < >-where A and B represent trivalent or A tetravalent aromatic group; and X & γ, respectively, represents a photosensitive resin composition of at least one diamidine (4) (3) that is not bonded to A or B, and has a structural formula of () The aromatic polyfluorene imide precursor has a repeating structural unit of the general formula (II) ...

<D 各< D each

I (II) (請先閱讀背面之注意事項再填寫本頁) 經濟部智慧財產局員工消費合作社印製 其中A及B分別表示四價芳族基;X及γ各自分別表示未 與A或B共輛接合之二價基;Z表示至少一個二價芳族 基;R1及R2各自分別表示羥基或一價有機基。 (5) (1)或(2)之感光性樹脂組成物,其中芳族聚醯亞胺 前驅物為(3)或(4)之組成物。 (6) (4)之感光性樹脂組成物,其中式(Π)之Ri或r2為 具有感光基之一價有機基。 (7) (4)之感光性樹脂組成物,其中式(II)之R1或R2為 下式基: -0 n+hr4r5-r6 -0-R6 或 -NH-R6 式中,R4及R5各自分別表示烴基及R6表示一價有機基。 木紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 311836 I裝---I----訂--I------線. 1225969 經濟部智慧財產局員工消費合作社印製 A7 B7 五、發明說明(6 ) (8) (7)之感光性樹脂組成物,其中R6為含有碳-碳未飽 和雙鍵之基。 (9) (7)之感光性樹脂組成物,其中式(Π)之R1或R2為 下式基: -〇n+hr4r5-r6 式中,R4及R5各自分別表示烴基及R6表示含有碳_碳未飽 和雙鍵之一價有機基。 (10) (7)之感光性樹脂組成物,其中式(η)之Ri或R2 為下式基: _0_R6 , 式中,R6表示一價有機基。 (11) (1)至(10)中任一項之感光性樹脂組成物,其中芳 族聚醯亞胺前驅物可溶於水性鹼溶液。 (12) (10)之感光性樹脂組成物,其中於式(η)之z為且 有羧基或酚系經基之基。 (13) (10)之感光性樹脂組成物,其中式(π)之z為通式 (III)之基:I (II) (Please read the notes on the back before filling out this page) Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs, where A and B represent tetravalent aromatic radicals, respectively; X and γ respectively indicate that they are not related to A or B A divalent group bonded together; Z represents at least one divalent aromatic group; R1 and R2 each represent a hydroxyl group or a monovalent organic group, respectively. (5) The photosensitive resin composition of (1) or (2), wherein the aromatic polyfluorene imide precursor is the composition of (3) or (4). (6) The photosensitive resin composition of (4), wherein Ri or r2 of the formula (Π) is a monovalent organic group having a photosensitive group. (7) The photosensitive resin composition of (4), wherein R1 or R2 of formula (II) is a group of the following formula: -0 n + hr4r5-r6 -0-R6 or -NH-R6 wherein R4 and R5 are each Respectively represents a hydrocarbon group and R6 represents a monovalent organic group. Wood paper scale is applicable to China National Standard (CNS) A4 (210 X 297 mm) 311836 I --- I ---- Order--I ------ line. 1225969 Staff Consumption of Intellectual Property Bureau, Ministry of Economic Affairs A7 B7 printed by the cooperative V. Description of the photosensitive resin composition of (6) (8) (7), in which R6 is a group containing a carbon-carbon unsaturated double bond. (9) The photosensitive resin composition of (7), wherein R1 or R2 of the formula (Π) is a group of the following formula: -On + hr4r5-r6 In the formula, R4 and R5 each represent a hydrocarbon group and R6 represents a carbon-containing group. Carbon unsaturated double bond is a monovalent organic group. (10) The photosensitive resin composition of (7), wherein Ri or R2 in the formula (η) is a group of the following formula: _0_R6, where R6 represents a monovalent organic group. (11) The photosensitive resin composition according to any one of (1) to (10), wherein the aromatic polyfluorene imide precursor is soluble in an aqueous alkaline solution. (12) The photosensitive resin composition of (10), wherein z in the formula (η) is a group having a carboxyl group or a phenolic group. (13) The photosensitive resin composition of (10), wherein z in the formula (π) is a base of the general formula (III):

式中,Ζ’表示單鍵,Ο,CH2,S或S〇2; R11至R18各自分 別表示Η,COOH,OH,含1至10個碳原子之烷基,含 至10個碳原子之氟烧基’含1至10個碳原子之氟烷氧基 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 311836 ---,---^-----·裝--------訂---------線 (請先閱讀背面之注意事項再填寫本頁)In the formula, Z ′ represents a single bond, 0, CH2, S, or S〇2; R11 to R18 each represent Η, COOH, OH, an alkyl group having 1 to 10 carbon atoms, and fluorine containing 10 to 10 carbon atoms. Burnt-based 'fluoroalkoxy group containing 1 to 10 carbon atoms This paper is sized for the Chinese National Standard (CNS) A4 (210 X 297 mm) 311836 ---, --- ^ ----- · pack- ------- Order --------- Line (Please read the precautions on the back before filling this page)

1225969 A7 五、發明說明(7 ) 或鹵原子,以及其中選擇性地尺11至尺1 S中之至少一者為 COOH 或 〇H。 (14)(3)至(13)中任一項之感光性樹脂組成物,其中χ 及Υ分別表不羰基,氧基,硫基,亞磺醯基,磺醯基,含 1至5個碳原子之選擇性取代伸烷基,選擇性取代亞胺基, 選擇性取代伸矽烷基或任何此等基團的組合。 (1 5)(14)之感光性樹脂組成物,其中χ及γ各自分別 表示氧基,硫基,磺醢基,選擇性取代亞甲基或選擇性取 代伸矽烷基。 (16) (1 5)之感光性樹脂組成物,其中χ為選擇性取代 亞甲基及Y為氧基。 (17) (3)至(16)中任一項之感光性樹脂組成物,其中A 及B皆為苯環。 (18) (1 )至(1 7)中任—項之感光性樹脂組成物,其進一 步含有一種光聚合引發劑,且具有負型感光特性。 (19) ⑴至(17)中任_項之感光性樹脂組錢,其進一 步含有一種可於光產生酸之化合物,及其具有正型感光特 性。 消 (20) —種形成圖案之方法,包含施用(丨)至(19)中任一 項之感光性樹脂組成物至基材上,以及乾燥、曝光該組成 物,顯像該組成物,以及加熱該組成物而形成圖案層。 (2 1)(20)之圖案化方法,其中丨線輻射用作為曝光步驟 的光源。 , (22)(2〇)或(21)之圖案化方法,其中基材為具有直徑至 1本紙張尺度適用中國國家標準(CNSM4規格咖x巧公髮) 311836 7 1225969 A7 B7 -- 五、發明說明(8 ) 少為12吋之矽晶圓。 (請先閱讀背面之注意事項再填寫本頁) (23) 電子組件,具有根據(2〇)至(22)項中任一項之方法 之圖案化層。 (24) (23)之電子組件,係用於半導體裝置,其中圖案化 層係用於表面保護膜或層間絕緣膜。 本發明之進一步目的、特色及優點由後文較佳具體實 施例之詳細說明連同附圖一起考慮將顯然自明。 圖式之簡單說明 第1A圖至第1E圖顯不具有多層互連結構之半導體裝 置製法。 第2 A圖至第2C圖概略舉例說明負型及正型感光性樹 脂組成物之用途。 發明之詳細說明 經濟部智慧財產局員工消費合作社印製 負型及正型感光性樹脂組成物之功能舉例說明於第 2A至2C圖。第2A圖顯示紫外光24通過一光罩2〇投射 至感光性樹脂組成物層22上。光24曝光部份26,留下部 伤2 5未經曝光。於負型感光性樹脂組成物,曝光部份為交 聯或聚合接著硬化,而未曝光部份25藉顯像劑去除露出曝 光部份26之圖案,如第2C圖之說明。於正型感光性樹脂 組成物,曝光部份26係藉光線作用而變成更為可溶。如此 曝光部份26藉顯像劑去除,留下未曝光部份25之圖案。 如後文討論,本發明之感光性樹脂組成物包括負型及正型 組成物。 本發明之感光性樹脂組成物包含芳族聚醯亞胺前 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 8 311836 1225969 B7 五、發明說明(9 ) f方族聚醯亞胺前驅物含有帶有芳香環之重複單位至少 =於其中。特別,前驅物包括芳族聚醯胺酸;芳族聚醯 胺酸醋,係經由部份或全部醋化酸之幾基而衍生自芳族聚 醯胺酸;以及芳族聚醯胺酸酿胺’係經由部份或全部酿胺 化芳族聚醯胺酸之羧基而衍生自芳族聚醯胺酸。 用於本發明之芳族聚醢亞胺前驅物較佳為其中於波長 365毫微米透射通過前驅物製成的且具有厚度_米薄膜 之光透射比至少為1%,較佳至少3%,更佳至少,又 更佳至少10%。若光透射比小於1%,則難以獲得具有良 好側面圖之可被圖案化成為高解析度圖案的感光性樹脂組 成物。特佳光透射比為10%至8〇%。聚醯亞胺前驅物薄臈 可經由施用聚醯亞胺前驅物於溶劑之溶液至基材上接著乾 燥形成。於波長365毫微米通過聚醯亞胺薄膜之光透射比 可使用分光光度計(例如日立υ_3410型號得自日立公司) 測量。 經濟部智慧財產局員工消費合作社印製 也較佳本發明之芳族聚醯亞胺前驅物經由醢亞胺化環 閉合形成聚醯亞胺薄膜,以及當沈積於矽晶圓上時,具有 剩餘應力不大於25百萬巴斯卡。若剩餘應力係大於^百 萬巴斯卡,則由本發明之含前驅物組成物製成的聚釀亞胺 薄膜之缺點在於當於矽晶圓上形成時或當用於矽晶片時, 矽晶圓翹曲且矽晶片内部的剩餘應力大。更佳根據本發明 之剩餘應力為0至20百萬巴斯卡。聚醯亞胺薄膜之剩餘應 力係於室溫25°C例如使用薄膜應力計(例如坦科爾 (Tencor)FLX-2320 型號)測量。 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公复) 9 311836 1225969 A7 五、發明說明(10 ) 根據本發明較佳本發明之感光性樹脂組成物之芳族聚 醯亞胺前驅物具有上式⑴重複單位(階梯結構)於重複單位 (請先閱讀背面之注意事項再填寫本頁) 中原則上具有則述結構式的聚醯亞胺前驅物滿足前文對 薄膜於365毫微米波長之光透射比以及所得聚酿亞胺薄膜 之剩餘應力的要求。 、 人組成芳族聚醯亞胺前驅物之重複單位通常表示指示包 含下列之單位:包含衍生自用作為前驅物之一種起始化人 物之四叛酸二酐等之綾酸殘基,以及衍生自也用作為另: 種起始化合物之二胺之胺殘基。如上反應計畫中,式結 構單位可為羧酸殘基或二羧酸殘基之一部份或可為二胺 殘基或一胺殘基之一部份。 尤其較佳為具有式⑴結構單位之芳族聚醯亞胺前驅 物,或更佳具有式(11)重複單位’原因在於前驅物於醯亞胺 化後具有高度桿狀結才冓,以及原因在於所#聚酿亞胺之剩 餘應力低之故。 式⑴及中’ 各自表示三價或四價芳族基(但 經濟部智慧財產局員工消費合作社印製 於式(II)為四價芳族基)。此處所指芳族基為帶有芳香環如 苯環、萘環、蒽環、吡啶環、呋喃環、喹啉環等之基。二 或多個芳香環可經由任何鍵結彼此鍵結而獲得芳族基。但 較佳芳族基含有一個芳香環。該基之芳香環可為經=代: 較佳X及Y二基鍵結至A及8位於…芳香環之鄰位 或對位位置,例如如下式所示: 私紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 311836 1225969 五、發明說明(Π )1225969 A7 V. Description of the Invention (7) or a halogen atom, and wherein at least one of the feet 11 to feet 1 S is COOH or OH. (14) The photosensitive resin composition according to any one of (3) to (13), wherein χ and Υ respectively represent a carbonyl group, an oxy group, a thio group, a sulfinyl sulfenyl group, and a sulfonyl group, containing 1 to 5 The carbon atom is optionally substituted with an alkylene, an imine, a silyl or any combination of these. (15) The photosensitive resin composition of (14), wherein χ and γ each represent an oxy group, a thio group, a sulfofluorenyl group, a selective methylene group or a silyl group. (16) The photosensitive resin composition according to (15), wherein χ is a selectively substituted methylene group and Y is an oxy group. (17) The photosensitive resin composition according to any one of (3) to (16), wherein both A and B are benzene rings. (18) The photosensitive resin composition of any one of (1) to (17), which further contains a photopolymerization initiator and has negative photosensitive characteristics. (19) The photosensitive resin composition of any one of (17) to (17) further contains a compound capable of generating an acid from light, and has a positive photosensitive property. (20) —A method for forming a pattern, comprising applying the photosensitive resin composition of any one of (丨) to (19) to a substrate, drying and exposing the composition, developing the composition, and This composition is heated to form a pattern layer. (2 1) The patterning method of (20), wherein the linear radiation is used as a light source in the exposure step. (22) (2〇) or (21) patterning method, wherein the substrate is a paper with a diameter of up to 1 paper size applicable to Chinese national standards (CNSM4 specifications coffee x Qiao public hair) 311836 7 1225969 A7 B7-five, Description of the invention (8) Silicon wafers as small as 12 inches. (Please read the precautions on the back before filling out this page) (23) The electronic component has a patterned layer according to the method of any one of (20) to (22). (24) The electronic component of (23) is used for a semiconductor device, and the patterned layer is used for a surface protective film or an interlayer insulating film. Further objects, features and advantages of the present invention will be apparent from the detailed description of preferred embodiments hereinafter, taken in conjunction with the accompanying drawings. BRIEF DESCRIPTION OF THE DRAWINGS FIGS. 1A to 1E show a method of manufacturing a semiconductor device without a multilayer interconnection structure. Figures 2A to 2C schematically illustrate the use of negative and positive photosensitive resin compositions. Detailed description of the invention The functions of the negative and positive photosensitive resin compositions printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs are illustrated in Figures 2A to 2C. Fig. 2A shows that the ultraviolet light 24 is projected onto the photosensitive resin composition layer 22 through a photomask 20. Light 24 exposes part 26, leaving part wound 2 5 unexposed. In the negative photosensitive resin composition, the exposed portion is crosslinked or polymerized and then hardened, and the unexposed portion 25 is removed by a developer to remove the pattern of the exposed portion 26, as illustrated in FIG. 2C. In the positive photosensitive resin composition, the exposed portion 26 is made more soluble by the action of light. Thus, the exposed portion 26 is removed by the developer, leaving a pattern of the unexposed portion 25. As will be discussed later, the photosensitive resin composition of the present invention includes a negative type composition and a positive type composition. Before the photosensitive resin composition of the present invention contains aromatic polyimide, the paper size is applicable to Chinese National Standard (CNS) A4 (210 X 297 mm) 8 311836 1225969 B7 V. Description of the invention (9) The fluorene imine precursor contains repeating units with aromatic rings at least = in them. In particular, the precursors include aromatic polyamino acids; aromatic polyamino acids, which are derived from aromatic polyamino acids via some or all of the acetic acid groups; and aromatic polyamino acids Amine 'is derived from aromatic polyamines via partial or full amination of the carboxyl group of the aromatic polyamines. The aromatic polyfluorene imide precursor used in the present invention is preferably one in which the light transmittance of the thin film having a thickness of 1 m is transmitted through the precursor at a wavelength of 365 nm, preferably at least 3%, Better at least, and still better at least 10%. If the light transmittance is less than 1%, it is difficult to obtain a photosensitive resin composition which can be patterned into a high-resolution pattern with a good side view. A particularly good light transmittance is 10% to 80%. Polyimide precursors can be formed by applying a solution of a polyimide precursor to a solvent onto a substrate and then drying. The light transmittance through a polyimide film at a wavelength of 365 nanometers can be measured using a spectrophotometer (such as Hitachi υ_3410 from Hitachi). It is also better printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs. The aromatic polyfluorene imide precursor of the present invention is closed by a polyimide ring to form a polyfluorine film, and when deposited on a silicon wafer, it has a surplus The stress is not more than 25 million Baska. If the residual stress is more than 1 million basca, the disadvantage of the polyimide film made of the precursor-containing composition of the present invention is that when formed on a silicon wafer or when used on a silicon wafer, the silicon crystal The circle is warped and the residual stress inside the silicon wafer is large. More preferably, the residual stress according to the present invention is 0 to 20 million Baska. The residual stress of the polyimide film is measured at room temperature of 25 ° C, for example, using a film stress meter (such as the model Tencor FLX-2320). This paper size applies Chinese National Standard (CNS) A4 specification (210 X 297 public copy) 9 311836 1225969 A7 V. Description of the invention (10) The aromatic polyimide of the photosensitive resin composition according to the present invention is preferred The precursor has the above formula ⑴ repeating unit (staircase structure) in the repeating unit (please read the precautions on the back before filling in this page). In principle, the polyimide precursor with the structural formula described above satisfies the above requirements for the film at 365 millimeters. Microwavelength light transmittance and residual stress requirements of the resulting polyimide film. The repeating unit of human-made aromatic polyimide precursors usually indicates that the instruction contains the following units: containing acetic acid residues derived from tetra-acid dianhydride and the like derived from a starting character used as a precursor, and derived from It is also used as an amine residue of a diamine of another starting compound. In the above reaction plan, the structural unit of the formula may be a part of a carboxylic acid residue or a dicarboxylic acid residue or may be a part of a diamine residue or a monoamine residue. Particularly preferred is an aromatic polyfluorene imine precursor having a structural unit of formula (I), or more preferably a repeating unit of formula (11) because the precursor has a high rod-like structure after the imidization, and the reason The reason is that the residual stress of the polyimide is low. Formulas ⑴ and ’each represent a trivalent or tetravalent aromatic radical (but printed by Formula (II) as a tetravalent aromatic radical) by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs. The aromatic group referred to here is a group having an aromatic ring such as a benzene ring, a naphthalene ring, an anthracene ring, a pyridine ring, a furan ring, a quinoline ring, and the like. Two or more aromatic rings may be bonded to each other via any bond to obtain an aromatic group. However, it is preferred that the aromatic group contains an aromatic ring. The aromatic ring of this group may be substituted: preferably the X and Y diyl groups are bonded to A and 8 at the ortho or para position of the aromatic ring, for example, as shown in the following formula: Private paper scales apply Chinese national standards ( CNS) A4 specification (210 X 297 mm) 311836 1225969 V. Description of the invention (Π)

經濟部智慧財產局員工消費合作社印製 較佳於具有式(II)重複單位的聚醯亞胺前驅物中, 基係鍵結至重複單位的一叛 或對位位置。 ^位於芳香環之鄰位 式⑴及⑼之⑷及(B)之實例如後述^及^ (稱做「三基」基團)包括參環芳族基,例如蒽_2,3,6_三基: 芴2,3,6 一基等,雙玉衣芳族基,例如蔡三基,蔡· Μ,5·三基,喹琳'3>三基等;單環芳族基例如苯],2,4_ 三基,吡咬-2,3,5_三基,呋喃_2,3,‘三基等,全部皆可帶 有取代基。四價基(此處稱做「四基」基團)包括參環芳族 基:列如蒽_2,3,6,7-四基,苟_2,3,6,7_四基等;雙環芳族基例 如奈-2,3,6,7·四基,萘十4,5,8-四基,嗤啉-2,3,6,7-四基 等;單環芳族基例如苯·四基,吼咬_2,3,5,卜四基, 呋喃-2,3,4,5-四基等,全部皆可選擇性帶有取代基。其中 較佳為選擇性帶有取代基之單環芳族基;更佳為選擇性取 代苯四基;又更佳為選擇性取代苯β1,2,4,5-四基。 X及Υ各自分別表示至少一個非與Α或Β共軛的二價 基。特別二價基包括羰基,氧基,硫基,亞磺醯基(亦即含 有亞碉之二價基),確醯基(亦即含有礪之二價基),含1至 5個碳原子之選擇性取代伸烷基,選擇性取代亞胺基,選 擇f生取代伸碎燒基以及此等基之任一種組合。此等基團 令’較佳者為氧基,硫基,績醯基,選擇性取代亞▼基以 (請先閱讀背面之注音?事項再填寫本頁) Μ--------^--------- 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公髮) 11 311836 1225969 A7 ---— B7____ 五、發明說明(l2 ) 及選擇性取代伸矽烷基,原因在於包含前述任一基之聚醯 亞胺刖驅物之i線透射比及耐熱性良好。 A、B、X及Y基團具有的取代基包括一價取代基及二 價取代基。特別取代基包括含丨至丨〇個碳原子之選擇性分 支烷基;含1至10個碳原子之鹵原子取代選擇性分支烷基 (其中鹵原子包括氣、氟、碘及溴);含1至1〇個碳原子之 烯基,含1至10個碳原子之炔基;含6至2〇個碳原子之 芳族烴基如苯基,T基等;含丨至10個碳原子之烷氧基; 含1至10個碳原子之齒原子取代烷氧基(其中_原子包括 氣、氟、碘及溴);氰基;鹵原子(例如氣、氟、碘及溴); 象基,胺基,疊氮基,疏基;三燒基石夕院基,其中各個燒 基含1至5個碳原子;含2至5個碳原子之伸烷基;羰基; 叛基’亞胺基’氧基,硫基;亞續醯基;靖醯基;二燒基 伸石夕烧基,其中各個烷基含1至5個碳原子;以及前述的 組合。較佳取代基為含1至5個碳原子之烷基,含1至5 個碳原子之鹵原子取代烷基,含1至5個碳原子之烷氧基, 含1至5個碳原子之鹵原子取代烷氧基,芳族烴基以及含 2或3個碳原子之伸烧基。 包含A、B、X及Y之結構單位之較佳實例如後所述。 (請先閱讀背面之注意事項再填寫本頁) I裳--------訂-----I---線· 經濟部智慧財產局員工消費合作社印製 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 12 311836 1225969 A7 B7 五、發明說明(l3 經濟部智慧財產局員工消費合作社印製Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs. It is better than the polyimide precursors with repeating units of formula (II), which are bonded to the rebel or counterposition of the repeating units. ^ Examples of ortho-positions ⑴ and ⑼ and B and (B) located in the aromatic ring are described later ^ and ^ (referred to as "tri-group" groups) include paracyclic aromatic groups such as anthracene_2,3,6_ Three groups: 芴 2,3,6 one group, etc., double jade clothing aromatic groups, such as Tsai Sanji, Tsai M, 5.triyl, quinine '3> triyl, etc .; monocyclic aromatic groups such as benzene], 2,4_triyl, pyridine-2,3,5_triyl, furan_2,3, 'triyl, etc., all may have a substituent. Tetravalent radicals (referred to herein as "tetrayl" radicals) include paracyclic aromatic radicals: such as anthracene _2,3,6,7-tetrayl, _2,3,6,7_tetrayl, etc. ; Bicyclic aromatic groups such as naphthalene-2,3,6,7 · tetrayl, naphthalene ten 4,5,8-tetrayl, perylene-2,3,6,7-tetrayl, etc .; monocyclic aromatic groups For example, benzene · tetrayl, tetrazine_2,3,5, tetramethyl, furan-2,3,4,5-tetrayl, etc., all of which may optionally have a substituent. Among them, a monocyclic aromatic group optionally having a substituent is preferable; a phenyltetrayl group is selectively substituted; and a benzene β1,2,4,5-tetrayl group is more preferably substituted. X and Υ each represent at least one divalent group which is not conjugated to A or B, respectively. Special divalent radicals include carbonyl, oxy, thio, sulfenyl (i.e. a divalent radical containing fluorenyl), fluorenyl (i.e. a divalent radical containing Li), containing 1 to 5 carbon atoms Selective substitution of the alkylene group, selective substitution of the imino group, and selection of any combination of these groups. These groups make 'preferred' to be oxy, thio, hydrazone, and optionally substitute sub- ▼ groups (please read the note on the back? Matters before filling out this page) Μ -------- ^ --------- This paper size applies to China National Standard (CNS) A4 (210 X 297) 11 311836 1225969 A7 ----- B7____ 5. Description of the invention (l2) and optional replacement extension The reason for the silyl group is that the polyimide driver containing any of the foregoing groups has good i-ray transmittance and heat resistance. The substituents which the A, B, X and Y groups have include a monovalent substituent and a divalent substituent. Special substituents include selectively branched alkyl groups containing 丨 to 10 carbon atoms; halogen atoms containing 1 to 10 carbon atoms substituted selective branched alkyl groups (wherein halogen atoms include gas, fluorine, iodine, and bromine); Alkenyl groups of 1 to 10 carbon atoms, alkynyl groups of 1 to 10 carbon atoms; aromatic hydrocarbon groups of 6 to 20 carbon atoms such as phenyl, T group, etc .; Alkoxy; tooth atom containing 1 to 10 carbon atoms substituted alkoxy (where _atom includes gas, fluorine, iodine and bromine); cyano; halogen atom (such as gas, fluorine, iodine and bromine); elephant group , Amine group, azide group, thiol group; trialkyl group, each of which contains 1 to 5 carbon atoms; alkylene group containing 2 to 5 carbon atoms; carbonyl group; 'Oxy, sulfenyl; fluorenyl; fluorenyl; dialkylene sulphydryl, wherein each alkyl group contains 1 to 5 carbon atoms; and combinations of the foregoing. Preferred substituents are alkyl groups containing 1 to 5 carbon atoms, halogen-substituted alkyl groups containing 1 to 5 carbon atoms, alkoxy groups containing 1 to 5 carbon atoms, and alkyl groups containing 1 to 5 carbon atoms. Halogen atoms replace alkoxy groups, aromatic hydrocarbon groups, and elongation groups containing 2 or 3 carbon atoms. Preferred examples of the structural unit including A, B, X, and Y are described later. (Please read the precautions on the reverse side before filling out this page) I Sang -------- Order ----- I --- Line · Printed by the Intellectual Property Bureau of the Ministry of Economic Affairs, Consumer Cooperatives This paper is suitable for China National Standard (CNS) A4 Specification (210 X 297 mm) 12 311836 1225969 A7 B7 V. Description of Invention (l3 Printed by the Consumer Cooperative of Intellectual Property Bureau of the Ministry of Economic Affairs

---,---:-----•裝--------訂---------線#L (請先閱讀背面之注意事項再填寫本頁) 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 13 311836 1225969 經濟部智慧財產局員工消費合作社印製---, ---: ----- • Installation -------- Order --------- Line #L (Please read the precautions on the back before filling this page) This Paper size applies to China National Standard (CNS) A4 (210 X 297 mm) 13 311836 1225969 Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs

A7 五、發明說明(Μ ) 式(II)中,Z基為選擇性取代二價芳族基。通常此為起 始二胺殘基,係由二胺去除兩個胺基衍生而得。此基之特 例包括對-伸苯基,間_伸苯基,4,4,_伸聯苯基,4,4,_伸三 苯基,4,4’-氧伸二苯基,4,4,_亞甲基伸二苯基,4,4、硫酸 二苯基,4,4’-磺醯基伸二苯基以及4,4、羰基伸二苯基,全 部皆有取代基。較佳基為選擇性取代對_伸苯基,4,4,_伸聯 苯基及4,4’-伸三苯基,原因在於由包含前述任一基之前驅 物製備的聚醢亞胺之剩餘應力小之故。前述基之取代基包 括刖文就A、B、X及γ基所述。較佳取代基亦如前述。 較佳用於本發明之芳族聚醯亞胺前驅物可溶於水性驗 溶液。本發明之感光性樹脂組成物其包含此種鹼可溶前驅 物者可使用水性鹼溶液顯像,該水性鹼溶液對環境的不良 影響減至最低。 可溶於水性鹼溶液之具有式(I)結構單位之芳族聚醯 亞胺前驅物之較佳製法,為製造具有式(II)重複單位之前驅 物’式中Z為叛基或酴系經基。 由前驅物之i線透射比以及由前驅物製成的聚醯亞胺 之低應力及耐熱性觀點看來,以及為了於以正像方式顯 像,較佳式(II)之Z為結構式(III)基: (III) 式中,Z,表示單鍵,Ο, CH2,S或S02 ; R"至R18各自分 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 311836 ·裝--------訂--------- (請先閱讀背面之注意事項再填寫本頁) 1225969 A7 B7 五、發明說明(15 ) (請先閱讀背面之注意事項再填寫本頁) 別表示H,COOH,OH,含1至10個碳原子之烷基,含i 至10個碳原子之氟烷基,含1至10個碳原子之氟烷氧基 或鹵原子以及Rn至R18中之至少一者為C〇〇H或〇H。 式(ΠΙ)基團之較佳實例如後:A7 V. Description of the invention (M) In formula (II), the Z group is a optionally substituted divalent aromatic group. Usually this is the starting diamine residue, which is derived from the diamine by removing two amine groups. Specific examples of this group include p-phenylene, m-phenylene, 4,4, -biphenylene, 4,4, -triphenylene, 4,4'-oxyphenylene, 4,4, Methylene phenylene, 4,4, diphenyl sulfate, 4,4'-sulfonyl phenyl diphenyl, and 4,4, carbonyl phenyl diphenyl, all have substituents. Preferred groups are the selective substitution of p-phenylene, 4,4, -biphenylene and 4,4'-triphenylene because of the polyfluorene imide prepared from precursors containing any of the foregoing groups. The reason for the small residual stress. Substituents for the aforementioned groups include those described in the text for the A, B, X and γ groups. Preferred substituents are also as described above. The aromatic polyfluorene imide precursor preferably used in the present invention is soluble in an aqueous test solution. The photosensitive resin composition of the present invention, which contains such an alkali-soluble precursor, can be developed using an aqueous alkali solution, and the adverse effect of the aqueous alkali solution on the environment is minimized. A preferred method for preparing an aromatic polyfluorene imide precursor having the structural unit of formula (I) which is soluble in an aqueous alkaline solution is to produce a precursor having a repeating unit of formula (II), where Z is a tacky group or an actinide Jingji. From the viewpoint of the i-line transmittance of the precursor and the low stress and heat resistance of the polyimide made from the precursor, and in order to develop in a positive image mode, Z of the preferred formula (II) is a structural formula (III) Group: (III) In the formula, Z represents a single bond, 〇, CH2, S or S02; R " to R18 are each divided into paper sizes that apply the Chinese National Standard (CNS) A4 (210 X 297 mm) 311836 · Install -------- Order --------- (Please read the precautions on the back before filling this page) 1225969 A7 B7 V. Description of the invention (15) (Please read the back Please fill in this page again) Do not indicate H, COOH, OH, alkyl group with 1 to 10 carbon atoms, fluoroalkyl group with i to 10 carbon atoms, fluoroalkoxy group with 1 to 10 carbon atoms Or at least one of a halogen atom and Rn to R18 is COH or OH. Preferred examples of the group of formula (ΠΙ) are as follows:

式(Π)中,R1及R2各自分別表示羥基或一價有機基。 式(II)中R1及R2之較佳類別及比例係依據預期之組成物屬 於正型或負型而改變。 R1及R2之一價有機基舉例如後: 經濟部智慧財產局員工消費合作社印製 _ON + HR4R5-R6 -0_R6 或 -NH-R6 式中,R4及R5各自分別表示烴基,及r6表示一價有機基。 用於負型組成物,R6基團較佳為感光基團。感光基團 含有碳-碳未飽和雙鍵。含有碳_碳未飽和雙鍵之基團舉例 如後: -ON + HR4R5_R7 -Ο-R7 或 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公爱) 15 311836 1225969 A7 B7 經濟部智慧財產局員工消費合作社印製 五、發明說明Ο6 ) -NH-R7 式中’ R4及R5各自分別表示烴基,以及R7表示含有碳-碳未飽和雙鍵之一價有機基。 較佳R4及R5各自為含i至5個碳原子之烴基。也較 佳R7之含有碳-碳未飽和雙鍵之一價有機基,為例如丙烯 醯氧烷基或甲基丙烯醯氧烷基,其中烷基含丨至1〇個碳原 子。 至於負型感光性樹脂組成物,希望(但至少部份)較佳 由20至1〇〇莫耳%之組成芳族聚醯亞胺前驅物之重複單位 的羧酸殘基支鏈(式(II)中及R2基團)為帶有碳-碳未飽和 雙鍵之一價有機基。 對正型感光性樹脂組成物而言,較佳為羧基以及_〇_ R6或-NH-R6之一價有機基(式中,R6為不含碳-碳未飽和雙 鍵之一價有機基,例如烴基等)。烴基包括例如含1至 個碳原子之烷基,苯基,苄基等。於正型感光性樹脂組成 物’其令組成芳族聚醯亞胺前驅物之重複單位之叛酸殘基 的支鏈(於式(II)為R1及R2基團)為前述一價有機基,較佳 前驅物之二胺殘基含有鹼可顯像基(例如羧基,酚系羥基等) 例如式(III)基團。 具有式(I)結構式重複單位之芳族聚醯亞胺前驅物進 一步含有任何額外聚醯亞胺前驅物重複單位,但結構式(J) 以及聚酿亞胺的任何重複單位除外。該種情況下,具有式 (I)結構式之重複單位對組成前驅物之全部重複單位之比 | {列&無特別界定,但較佳控制為聚醯亞胺前驅物本身的 本紙張尺度適用中國國家標準(CNS)A4規格⑵G x 297公髮) (請先閱讀背面之注意事項再填寫本頁) -裝--------訂-------—線· 16 311836 1225969 (IV) A7 B7 五、發明說明(I7 ) 365毫微米透射比以及經由醯亞胺化反應衍生自前驅物< 聚醯亞胺之耐熱性及低熱膨脹性可滿足此處定義的要求。 特別希望具有式(I)結構式之重複單位對全部重複單位之 比係為10至100莫耳%,更佳50至100莫耳%之範圍。 用於本發明之芳族聚醯亞胺前驅物之分子量並未特別 定義,但其重量平均分子量較佳為10,000至200,000之範 圍。分子量係經由凝膠滲透層析術基於聚苯乙烯標準品測 定。 用於本發明之芳族聚醯亞胺前驅物可製自··一種酸成 分包含通式(IV)之四羧酸二酐: cx:x> Ο 〇 其中a、b、x及γ具有如式(I)之相同定義, 或其竹生物;以及一種胺成分包含H2N-Z-NH2之芳族二胺 (此處Z定義如式(II)),·以及選擇性一種可提供R1及R2殘 基給前驅物之化合物,其經由各種方法反應該等成分而製 備。 用於本發明之前驅物,具有式(I)結構式之重複單位係 不可或缺。但未妨礙本發明之效果,不含式(Ϊ)結構式之四 觀酸二酐,或其衍生物可組合具有式(I)結構式之四繞酸二 酐或其衍生物。 不具有式(I)結構式之四羧酸二酐較佳為具有剛性桿 Γ%先閱讀背面之注意事項與填寫本頁) i I n H ϋ H ϋ u n ϋ n — — — — —— I I ϋ I I 一口T I .^1 ϋ n I ϋ I I - 經濟部智慧財產局員工消費合作社印製 本、、氏張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐 17 311836 K25969 A7 五、發明說明(找) 狀結構的二酐,例如均苯四酸,3 3, 5,4 _聯本四羧酸等化 曰物之二酐。進一步較佳台紅 紙磁 '較佳-酐類包括例如下列各種芳族四 羧酸之二酐:例如硫二酞酸’氧二酞酸;3 3,4 4,二 綱四竣酸〜从萘四缓酸^从蔡四叛酸’ ^八 奈四叛酸’ 2,3,5,6__四㈣’ 3 4 9 1()_二蔡經苯四幾 酸,罐醯基二駄酸,間-三苯基_3,3’,4,4,_四緩酸,對·三笨 基-3,3,,4,4’_ 四錢,mm 六氟 _2 21(2 3七,4_ 二瘦苯基)丙烧,2,2-武(2,3_或3,4_二緩笨基)丙院,22_武 (4’-(2,3_或 3,4·二叛苯氧)苯基)丙烷,1,l,l,3,3,3_六氣_2,2 戴{4χ2,3-或3,4-二叛苯氧)苯基}丙燒’1,3_戴(3,4_竣苯幻 本’ 1,4-武(3,4-缓苯氧)笨,4,4,_武(34幾苯氧)二苯基喊, 4,4 _貳(3,4·羧苯氧)聯苯,以及其它通式(v)之芳族四羧酸 二酐:In formula (Π), R1 and R2 each represent a hydroxyl group or a monovalent organic group, respectively. The preferred categories and ratios of R1 and R2 in formula (II) are changed depending on whether the expected composition is positive or negative. Examples of monovalent organic radicals of R1 and R2 are as follows: printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs _ON + HR4R5-R6 -0_R6 or -NH-R6 where R4 and R5 each represent a hydrocarbon group, and r6 represents a Valent organic radical. For a negative composition, the R6 group is preferably a photosensitive group. Photosensitive groups contain carbon-carbon unsaturated double bonds. Examples of groups containing carbon_carbon unsaturated double bonds are: -ON + HR4R5_R7 -〇-R7 or the size of this paper applies Chinese National Standard (CNS) A4 (210 X 297 public love) 15 311836 1225969 A7 B7 Ministry of Economy Printed by the Intellectual Property Bureau's Consumer Cooperatives 5. Description of the invention 〇6) -NH-R7 where 'R4 and R5 each represent a hydrocarbon group, and R7 represents a monovalent organic group containing a carbon-carbon unsaturated double bond. Preferably, R4 and R5 are each a hydrocarbon group containing i to 5 carbon atoms. Also preferred is a monovalent organic group containing a carbon-carbon unsaturated double bond of R7, for example, a propylene alkyloxy group or a methacrylic alkyloxy group, wherein the alkyl group contains from 1 to 10 carbon atoms. As for the negative photosensitive resin composition, it is desirable (but at least partially) that the repeating unit of the carboxylic acid residue branching the aromatic polyfluorene imide precursor composed of 20 to 100 mol% is preferably (formula ( II) The neutralized R2 group) is a monovalent organic group having a carbon-carbon unsaturated double bond. For the positive photosensitive resin composition, a carboxyl group and a _〇_ R6 or -NH-R6 monovalent organic group are preferred (where R6 is a monovalent organic group containing no carbon-carbon unsaturated double bond). , Such as hydrocarbyl, etc.). The hydrocarbyl group includes, for example, an alkyl group having 1 to 6 carbon atoms, a phenyl group, a benzyl group and the like. In the positive photosensitive resin composition, the branching chain of the rebel residue (which is a group of R1 and R2 in the formula (II)) of the repeating unit constituting the aromatic polyimide precursor is the aforementioned monovalent organic group. The diamine residue of the preferred precursor contains an alkali developable group (for example, a carboxyl group, a phenolic hydroxyl group, etc.) such as a group of formula (III). Aromatic polyfluorene imide precursors having structural repeat units of formula (I) further contain any additional polyfluorine imide precursor repeat units, except for structural formula (J) and any repeat units of polyimide. In this case, the ratio of the repeating unit having the formula (I) to the total repeating units constituting the precursor | {Column & is not particularly defined, but is preferably controlled to the paper size of the polyimide precursor itself Applicable to China National Standard (CNS) A4 specification ⑵G x 297 (issued) (Please read the precautions on the back before filling out this page) -Installation -------- Order --------- Line · 16 311836 1225969 (IV) A7 B7 V. Description of the invention (I7) The transmittance of 365 nanometers and the derivative derived from the precursor via the amidation reaction < polyimide's heat resistance and low thermal expansion can meet the requirements defined here . It is particularly desirable that the ratio of the repeating unit having the structural formula (I) to all repeating units is in the range of 10 to 100 mole%, more preferably 50 to 100 mole%. The molecular weight of the aromatic polyfluorene imide precursor used in the present invention is not particularly defined, but its weight average molecular weight is preferably in the range of 10,000 to 200,000. Molecular weight was determined by gel permeation chromatography based on polystyrene standards. The aromatic polyfluorene imide precursor used in the present invention can be prepared from an acid component containing a tetracarboxylic dianhydride of the general formula (IV): cx: x > 〇 〇 wherein a, b, x and γ have such as The same definition of formula (I), or its bamboo organism; and an aromatic diamine (herein, Z is defined as formula (II)) with an amine component including H2N-Z-NH2, and optionally one can provide R1 and R2 Residue-to-precursor compounds, which are prepared by reacting these ingredients via various methods. For the precursors of the present invention, repeating units having the structural formula (I) are indispensable. However, the effect of the present invention is not impeded, and the tetrabasic acid dianhydride or the derivative thereof having the structural formula of the formula (i) may not be combined. The tetracarboxylic dianhydride without the formula (I) is preferably a rigid rod with Γ% (read the precautions on the back and fill in this page first) i I n H ϋ H ϋ un ϋ n — — — — — II ϋ II 一口 TI. ^ 1 ϋ n I ϋ II-Printed and printed scales of the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs are applicable to China National Standard (CNS) A4 (210 X 297 mm 17 311836 K25969 A7 V. Description of the invention (find) dianhydride with a structure, such as pyromellitic acid, 3 3, 5, 4 _ bis-tetracarboxylic acid and other dianhydrides. Further preferred Taiwan red paper magnetic 'preferred-anhydrides include For example, the following dianhydrides of various aromatic tetracarboxylic acids: for example, thiodiphthalic acid 'oxydiphthalic acid; 3 3,4 4, dibasic tetracarboxylic acid ~ from naphthalene tetrahydroacid ^ from Tsai tetrametaconic acid' ^ octa Tetra-acid '2,3,5,6__tetrapyrene' 3 4 9 1 () _ DiCai Jingjingtetrakidic acid, canthamidio diacid, m-triphenyl_3,3 ', 4, 4, _tetratonic acid, p-tribenzyl-3,3,, 4,4'_ four-money, mm hexafluoro_2 21 (2 3 seven, 4_ dilephenyl) propane, 2,2- Wu (2,3_ or 3,4_ Dibubenji C) C, 22_ Wu (4 '-(2,3_ or 3,4 · Diphenylphenoxy) phenyl Propane, 1, l, l, 3,3,3_hexagas_2,2 Dai {4χ2,3- or 3,4-diphenylphenoxy) phenyl} propane '1,3_dai (3, 4_Jun Benz Magic Book '1,4-Wu (3,4-Bent phenoxy) stupid, 4,4, _Wu (34 phenoxy) diphenyl shout, 4,4 _ 贰 (3,4 · Carboxyphenoxy) biphenyl, and other aromatic tetracarboxylic dianhydrides of general formula (v):

(V) 〇 0 經濟部智慧財產局員工消費合作社印製 (請先閱讀背面之注意事項再填寫本頁) 其中R’及R’’為相同或相異且各自分別表示含1至1〇個每 原子之烴基,以及s表示〇或任何整數。其中一或多個邊 可單獨或合併使用。至於四黢酸二酐衍生物例如包括四姜 酸類,四羧醯氣類等。 用於反應之式(IV)四叛酸二酐之用量較佳占其中使用 之全部四羧酸之10至100莫耳%。若用量小於10莫耳0/〇 則通過所生成的聚醯亞胺前驅物之i線透射比將下降。 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 18 311836 I 之25969 A7(V) 〇 Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs (please read the precautions on the back before filling out this page) where R 'and R' 'are the same or different and each represents 1 to 10 Hydrocarbon group per atom, and s represents 0 or any integer. One or more of these edges can be used individually or in combination. As for the tetraphosphonic acid dianhydride derivative, for example, tetra gingeric acid, tetracarboxylic hydrazone gas, and the like are included. The amount of the tetra-acid dianhydride of the formula (IV) used in the reaction is preferably 10 to 100 mol% of the total tetracarboxylic acid used therein. If the amount is less than 10 mol 0 / 〇, the i-ray transmittance through the generated polyfluorene imide precursor will decrease. This paper size applies to China National Standard (CNS) A4 (210 X 297 mm) 18 311836 I 25969 A7

五、發明說明(19 ) 方族一胺為任一種已知二胺,包括例如對 ^ (或間-)伸苯 暴二胺,2,4_(或2,5-,2,6-或3,5-)二胺基甲笨 -跄 i t + 2,5_(或 2,6-) 一胺基_對_二甲苯,2,4-(或2,5-或4,6·)二胺基_間一 笨,3,5-(或3,6-)二胺基-鄰甲苯,2,4-二胺基=一 # 3,6_二胺基均四甲苯,聯苯胺,鄰-甲苯胺, u τ 苯胺,4,4,- 一胺基三苯,1,5_(或2,6-)二胺基萘,2,7-二胺其梵 欺I芴,4,4,-(或 5 2,4’-或 2,2’-)二胺基二苯基 _,4 4,, +,4 _(或 3,4,-,J,3 _,2,4、或 2,2’-)二胺基二苯基甲烷,4,4,_(或 3 4,, 3,3’-’2,4’-或 2,2’-)二胺基二苯基碾,4,4,-(或 3,4,_,j 3,,2,4、或2,2’-)二胺基二苯基硫化物,4 4,〆 5 , 一本▼ _二胺, U,l,3,3,3-六氟_2,2_貳(4·胺基苯基)丙烷,2,2,_貳(三氟甲 基)聯苯胺,2,2,-貳(三氟甲氧)聯苯胺等。此等基團之一或 多個可單獨或合併使用。 一 下列任何基團可導入前驅物而使其變成可溶於水性驗 溶液: 緩濟部智慧財產局員工消費合作、社印製V. Description of the invention (19) The square monoamine is any of the known diamines, including, for example, p- (or m-) benzidine diamine, 2,4_ (or 2,5-, 2,6-, or 3) , 5-) diaminomethylbenzyl- 跄 it + 2,5_ (or 2,6-) monoamino_p-xylene, 2,4- (or 2,5- or 4,6 ·) diamine Phenyl-m-monobenzyl, 3,5- (or 3,6-) diamino-o-toluene, 2,4-diamino = mono # 3,6_-diamino mesitylene, benzidine, o- Toluidine, u τ aniline, 4,4,-monoaminotriphenyl, 1,5_ (or 2,6-) diaminonaphthalene, 2,7-diamine and its derivatives, 4,4,- (Or 5 2,4'- or 2,2 '-) diaminodiphenyl_, 4 4 ,, +, 4 _ (or 3,4,-, J, 3 _, 2, 4, or 2 , 2 '-) diaminodiphenylmethane, 4,4,-(or 3 4,3,3,3'-'2,4'- or 2,2'-) diaminodiphenyl mill, 4,4,-(or 3,4, _, j 3,2,4, or 2,2 '-) diaminodiphenyl sulfide, 4 4, 〆5, a book ▼ _diamine, U, l, 3,3,3-hexafluoro_2,2_2 (4-aminophenyl) propane, 2,2, _ 贰 (trifluoromethyl) benzidine, 2,2,-贰 ( Trifluoromethoxy) benzidine, etc. One or more of these groups can be used alone or in combination. -Any of the following groups can be introduced into precursors to make them soluble in water-based solutions: Employees' cooperation with the Intellectual Property Bureau of the Ministry of Economic Affairs

包含前述任何二胺基殘基之鹼溶性之芳族聚醯亞胺前 驅物具有於曝光後可藉鹼顯像、處理該材料個人有更安全 本紙“/:!過用中國國家標準(CNS)A4規格⑽χ 297公楚) 19 311836 -----------裝--------訂---------線卜 (請先閱讀背面之注意事項再填寫本頁) 1225969 A7 -------—§z_________ 五、發明說明(2〇 ) 的工作環境以及顯像廢液的處理簡單等優點。 (請先閱讀背面之注意事項再填寫本頁) 為了製造聚醯亞胺前驅物用之聚醯胺酸(式(π)其中R1 及R2皆為羥基),四羧酸二酐可經由開環加成聚合反應而 與一胺於有機;谷劑中反應。此例中,四叛酸二酐對二胺之 比較佳為0.7/1至1/0.7莫耳比之範圍。 反應典型係於有機溶劑中進行。使用的有機溶劑較佳 為可完全溶解所形成聚醯亞胺前驅物之質子惰性極性溶 劑’包括例如N-甲基-2-0比咯啶嗣,N,N-二甲基乙醯胺, N,N-—甲基甲醯胺,n,N-二甲基-2-咪唑啶酮,二甲亞楓, 四甲基尿素,六甲基鱗酸三醯胺,丁内醋等。 經濟部智慧財產局員工消費合作社印製 除了質子惰性極性溶劑外,也可使用國類,酯類,内 酯類,醚類,齒化烴類,烴類等。其中有用的溶劑包括丙 酮,二乙基甲酮,甲基乙基甲酮,甲基異丁基甲酮,環己 酮,乙酸甲酯,乙酸乙酯,乙酸丁酯,草酸二乙酯,丙二 酸一乙酉曰,碳酸一乙酿,δ-戊内醋,乙鍵,乙二醇二甲謎, 二乙二醇二甲醚’四氫呋喃,二噚烷,氣仿,二氣甲烷, 1,2-—氣乙烧’ 1,4_二氣丁烷,三氣乙烷,氣苯,鄰-二氣 苯,己烧,庚烷,辛燒,苯,甲苯,二甲苯等。可單獨或 合併使用一或多種此等有機溶劑。 用於製造式(II)聚醢亞胺前驅物,其中Rl及R2皆有一 個感光基以離子方式鍵結其上,聚釀胺酸可混合含有一個 胺基之丙稀酸系化合物。 帶有胺基欲用於離子鍵結感光基之丙烯酸系化合物包 括例如甲基丙烯酸N,N_二甲基胺基乙酯,甲基丙烯酸N,N- 本紙張尺度適用中國國家標準(CNS)A4規格(21〇 X 297公爱) 20 311836 經濟部智慧財產局員工消費合作社印製 1225969 A7 ^___B7___ 一 五、發明說明(21 ) 二乙基胺基乙酯’甲基丙浠酸n,n-二甲基胺基丙酯’甲基 丙烯酸N,N-二乙基胺基丙酯,丙烯酸N,N-二甲基胺基乙 酯,丙烯酸N,N-二乙基胺基乙酯,丙烯酸N,N-二甲基胺 基丙醋,丙稀酸-二乙基胺基丙醋’N,N_二f基胺基丙 烯醯胺,N,N-二甲基胺基乙基丙烯醯胺等。可單獨或合併 使用其中一或多個基團。 丙烯酸系化合物用量較佳相對於1 〇〇份重量比與其混 合的聚醯胺酸為1至200份重量比,更佳為5至150份重 量比。若用量小於1份重量比,則形成的聚醯亞胺前驅物 之感光性不佳。但它方面,若用量係大於200份重量比, 則形成的聚醯亞胺薄膜之耐熱性及機械性質不良。 為了製造聚醯亞胺前驅物用之聚醯胺酸酯類,四羧酸 二酐首先與醇化合物反應獲得四羧酸二酯,然後二酯與亞 磺醯氣等反應獲得四羧酸二酯二齒化物。隨後所得二鹵化 物於溶解於有機溶劑後,與二胺於含有脫氫南化物劑例如 吡啶等之有機溶劑反應,反應方式係將前者逐滴添加至後 者於溶劑之溶液進行。最後所得反應混合物倒入不良溶劑 如水等内,如此經過濾去除形成的沈澱及脫水。 至於用於負型感光性樹脂組成物之帶有感光基之聚醯 胺酸S旨類’使用的醇化合物較佳為未飽和醇化合物,包括 例如丙烯酸羥甲酯,甲基丙烯酸羥甲酯,丙烯酸羥乙酯, 甲基丙烯酸經乙酯,丙烯酸經丙酯,甲基丙稀酸經丙酯, 丙烯酸羥丁酯’甲基丙烯酸羥丁酯等。特佳為其中烷基鍵 部份含1至10個碳原子之羥烷基丙烯酸酯類及甲基丙烯酸 裝--------訂---------線 (請先閱讀背面之注意事項再填寫本頁) 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 21 311836 1225969 A7 五、發明說明(22 ) 酯類。 基之聚醯脸酿^於用於正型感光性樹脂組成物之不含感光 : 知類,使用的醇化合物較佳為飽和醇化合 Γ至;1 飽和醇化合物較佳為含1^個碳原子之貌基醇 類’包括例如甲醇’乙醇,正丙醇,異丙醇,正丁醇,第 一丁醇,第三丁醇,里丁妒 ^ %異丁醇,戊醇,2-戊醇,3-戊醇, 異戊醇’1-己醇,己酿,1 p ^ ^ 己醇夂己醇等。可單獨或合併使用 其中一或多種醇類。 、裝每四羧酸二酯類時,四羧酸酐對醇化合物之比較佳 為1/2至1/2.5莫耳比間,但最佳& 1/2莫耳比。四緩酸二 酐對驗之比較佳為1/0.001至1/3莫耳比間,及更佳為 1/0.005至1/2莫耳比。反應溫度較佳為1〇至6〇它,反應 時間較佳為3至24小時。 已知方法可用於製造四羧酸二酯二酐之次一步驟。例 如將亞磺醯氣逐滴添加至四羧酸二酯溶解於有機溶劑之溶 液中,以及與二酯反應。四羧酸二酯對亞磺醯氣之比較佳 為1/1·1至1/2.5莫耳比,及更佳為ln 5至1/2 2莫耳比。 經濟部智慧財產局員工消費合作社印製 反應溫度較佳為-20°C至40°C,以及反應時間較佳為j至 10小時。 本紙張尺度適用中國國家標準(CNS)A4規格(210 : 於次一步驟,先前生成的四羧酸二酯二由化物溶解於 有機溶劑,且與二胺於脫氫齒化劑如吡啶等存在下反應。 用於此項反應,二_化物溶液逐滴添加至二胺及脫氫由化 劑於有機溶劑之溶液獲得聚醯胺酸酯。反應後,反應混合 物倒入不良溶劑如水等内,所得沈殺藉過濾獲得,及脫水 311836 1225969 A7 五、發明說明(23 (請先閱讀背面之注音?事項再填寫本頁) 獲得期望的聚醯胺酸酯。使用的二胺總量對四羧酸二酯二 齒化物之比較佳為〇·6/1至1/〇 6莫耳比間,以及更佳為 〇·7/1至1/0.7莫耳比。反應溫度較佳為2〇。。至4〇。〇,以 及反應時間較佳為1至1 〇小時。脫氫鹵化劑對四艘酸二酯 二i化物之比較佳為18/1至2 2/1莫耳比,以及更佳為 1-9/1之比為ΐ·8/ΐ至2.2/1莫耳比間,更佳為丨9/1至2·ιπ 莫耳比。 為了製造聚酿亞胺前驅物用之聚醯胺酸醯胺類,可採 用如前文製造聚醯胺酸酯所用的相同方法,但使用單胺化 a物來替代醇化合物。單胺化合物包括例如甲基胺,乙基 胺,正丙基胺,異丙基胺,正丁基胺,第二丁基胺,第三 丁基胺’異丁基胺,1-戊基胺,2-戊基胺,3_戊基胺,異 戊基胺,1-己基胺,2-己基胺,3-己基胺,嗎啉,苯胺, 卞基胺’以及各種未飽和胺類例如丙稀酸胺基烧基酯類, 甲基丙烯酸胺基烷基酯類等。 經濟部智慧財產局員工消費合作社印製 本發明之感光性樹脂組成物的特徵為含有前述任一種 聚醯亞胺前驅物。可採用多種方法用以製造具有感光性的 組成物。 例如如前述具體實施例中,將含碳_碳未飽和雙鍵基引 進聚醯亞胺前驅物本身之支鏈之方法可用以製造具有可光 交聯結構之聚醯亞胺前驅物,如此可使包含該前驅物的組 成物變成感光性。可採用方法係於組成物内添加含有碳-碳未飽和鍵及胺基之化合物(例如胺基丙烯酸酯類),且其 可以離子方式鍵結至組成物之聚醯亞胺前驅物。也可採用 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 23 311836 經濟部智慧財產局員工消費合作社印製 1225969 A7 ____B7_____ 五、發明說明(24 ) 方法係加成含有一或多個碳-碳未飽和雙鍵之反應性單體 至組成物,如此使組成物變成具有感光性。此外,可採用 方法係添加感光性提供劑例如光酸產生劑、光鹼產生劑等 至組成物中。此等方法皆為業界已知。 原則上本發明之負型感光性樹脂組成物中,根據本發 明之5^釀亞胺刖驅物本身含有碳_碳未飽和雙鍵,否則係將 含有碳-碳未飽和雙鍵之化合物添加至組成物中。較佳組成 物進一步含有光聚合引發劑連同該等組成分。 光聚合引發劑包括例如麥可氏(Michler,S)酮,安息香 甲基醚’安息香乙基醚,安息香異丙基醚,2 -第三丁基蒽 酉比,2 -乙基蒽酿,4,4-貳(二乙基胺基)二苯甲酮,苯乙酮, 二苯甲酮,硫雜蒽嗣,2,2-二甲氧-2-苯基苯乙酮,卜羥環 己基苯基甲酮,2-甲基-[仁(甲硫基)苯基;|_2_嗎琳基_卜丙 酮聯笨甲醯,二苯基二硫化物,菲醒,2 -異丙基硫雜蒽 酮,核糖黃素四丁酸酯,2,6·貳(對_二乙基胺基苯甲醛)_4_ 甲基-4-吖環己_,N_乙基-^(對-氣苯基)甘胺酸,n_苯基 二乙醇胺,2-(鄰·乙氧羰基)肟基二苯基丙烷二酮,卜 苯基_2兴鄰-乙氧羰基)肟基丙_1·酮,3,3,4,4-四(第三丁基過 氧羰基)二苯甲_ , 3,3_羰基貳(7_二乙胺基香豆素),貳(環 戊二烯基)·貳[2,6-二氟·3_(吡啶基)苯基]鈦以及多種疊 氣化合物例如如下結構式之貳疊氮化物: -----------裝--------訂---------線 (請先閱讀背面之注咅?事項再填寫本頁) 本紙張尺倾财 24 311836 1225969Alkali-soluble aromatic polyfluorene imide precursors containing any of the aforementioned diamine residues can be developed with alkali after exposure, and the material is safer for personal use "/ :! Pass the Chinese National Standard (CNS) A4 specification (⑽χ 297 公 楚) 19 311836 ----------- install -------- order --------- line (please read the precautions on the back first) (Fill in this page) 1225969 A7 ----------- §z _________ 5. The working environment of invention description (2〇) and the advantages of simple processing waste liquid etc. (Please read the precautions on the back before filling in this page ) In order to make polyfluorinated acid for the precursor of polyfluoreneimide (wherein R1 and R2 are both hydroxyl groups), tetracarboxylic dianhydride can be reacted with monoamine through organic ring-opening addition polymerization; In this example, the ratio of tetrametamic acid dianhydride to diamine is preferably in the range of 0.7 / 1 to 1 / 0.7 mole ratio. The reaction is typically performed in an organic solvent. The organic solvent used is preferably Proton-inert polar solvents' that completely dissolve the polyfluorene imide precursor formed include, for example, N-methyl-2-0-pyrrolidinium, N, N-dimethylacetamide, N, N-methylmethyl Amine, n, N-dimethyl-2-imidazolidinone, dimethyl sulfene, tetramethyl urea, trimethylamine hexamethylphosphonic acid, butyrolactone, etc. Printed by the Consumer Cooperative of Intellectual Property Bureau, Ministry of Economic Affairs In addition to polar aprotic solvents, nationals, esters, lactones, ethers, toothed hydrocarbons, hydrocarbons, etc. can be used. Among the useful solvents include acetone, diethyl ketone, methyl ethyl methyl Ketone, methyl isobutyl ketone, cyclohexanone, methyl acetate, ethyl acetate, butyl acetate, diethyl oxalate, ethyl acetate, monoethyl carbonate, δ-valerolactone, ethyl bond, Dimethyl glycol mystery, Diethylene glycol dimethyl ether 'tetrahydrofuran, dioxane, gas-form, digas methane, 1,2--gas ethane', 1,4-digas butane, trigas ethane Gas benzene, o-digas benzene, hexane, heptane, octane, benzene, toluene, xylene, etc. One or more of these organic solvents can be used alone or in combination. It is used to make polyfluorene of formula (II) Amine precursors, in which R1 and R2 each have a photosensitive group bonded to it ionicly. Polyamine amino acid can be mixed with acrylic compounds containing an amine group. . Acrylic compounds with amine groups to be used for ion-bonding photosensitive groups include, for example, N, N-dimethylaminoethyl methacrylate, N, N methacrylic acid. This paper is in accordance with Chinese National Standards (CNS ) A4 specification (21 × X 297 public love) 20 311836 Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs 1225969 A7 ^ ___ B7___ One or five, the description of the invention (21) Diethylaminoethyl 'methylpropionate n, n-dimethylaminopropyl 'N, N-diethylaminopropyl methacrylate, N, N-dimethylaminoethyl acrylate, N, N-diethylaminoethyl acrylate , Acrylic acid N, N-dimethylaminopropyl acetate, acrylic acid-diethylaminopropylacetate 'N, N_difylaminoacrylamide, N, N-dimethylaminoethyl Acrylamide and so on. One or more of these groups may be used alone or in combination. The amount of the acrylic compound is preferably 1 to 200 parts by weight, and more preferably 5 to 150 parts by weight, based on 100 parts by weight of the polyamic acid mixed with it. If the amount is less than 1 part by weight, the sensitivity of the formed polyimide precursor is not good. However, if the amount is more than 200 parts by weight, the heat resistance and mechanical properties of the resulting polyfluorene imide film will be poor. In order to manufacture polyfluorinated esters of polyfluorinated imine precursors, tetracarboxylic dianhydride is first reacted with an alcohol compound to obtain a tetracarboxylic acid diester, and then the diester is reacted with sulfinic gas to obtain a tetracarboxylic diester. Bidentate. The resulting dihalide is then dissolved in an organic solvent and reacted with a diamine in an organic solvent containing a dehydronanide agent such as pyridine. The reaction method is to add the former dropwise to a solution of the latter in a solvent. The resulting reaction mixture is poured into a poor solvent such as water, and the precipitate formed and dehydrated are removed by filtration. As for the alcohol compound used in the photosensitive resin-containing polyamino acid S for the negative photosensitive resin composition, the unsaturated alcohol compound is preferably an unsaturated alcohol compound including, for example, methyl methacrylate, methyl methacrylate, Hydroxyethyl acrylate, ethyl methacrylate, propyl acrylic acid, methacrylic acid propyl, hydroxybutyl acrylate 'hydroxybutyl methacrylate, and the like. Particularly preferred are hydroxyalkyl acrylates and methacrylic acids in which the alkyl bond portion contains 1 to 10 carbon atoms .-------- Order --------- line (please first Read the notes on the reverse side and fill out this page) This paper size applies to the Chinese National Standard (CNS) A4 (210 X 297 mm) 21 311836 1225969 A7 V. Description of the invention (22) Ester. The base is not used for the positive photosensitive resin composition without photosensitivity: known, the alcohol compound used is preferably a saturated alcohol compound Γ to; 1 saturated alcohol compound preferably contains 1 ^ carbon Atom-based alcohols include, for example, methanol 'ethanol, n-propanol, isopropanol, n-butanol, first butanol, third butanol, lidin ^% isobutanol, pentanol, 2-pentyl alcohol Alcohol, 3-pentanol, isoamyl alcohol '1-hexanol, hexanol, 1 p ^^ hexanol, hexanol, and the like. One or more of these alcohols may be used alone or in combination. When the tetracarboxylic diesters are installed, the ratio of the tetracarboxylic anhydride to the alcohol compound is preferably between 1/2 and 1 / 2.5 mole ratio, but the best & 1/2 mole ratio. The comparison of tetramellitic dianhydride is preferably 1 / 0.001 to 1/3 mole ratio, and more preferably 1 / 0.005 to 1/2 mole ratio. The reaction temperature is preferably from 10 to 60, and the reaction time is preferably from 3 to 24 hours. Known methods can be used for the next step in the production of tetracarboxylic diester dianhydrides. For example, sulfenylpyridine gas is added dropwise to a solution in which a tetracarboxylic acid diester is dissolved in an organic solvent, and reacted with the diester. The comparison of the tetracarboxylic diester to sulfenyl is preferably 1/1 · 1 to 1 / 2.5 mole ratio, and more preferably ln 5 to 1/22 mole ratio. Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs The reaction temperature is preferably -20 ° C to 40 ° C, and the reaction time is preferably j to 10 hours. This paper size applies to China National Standard (CNS) A4 specifications (210: in the next step, the tetracarboxylic diester diester produced previously is dissolved in an organic solvent, and it is present with a diamine in a dehydrogenating agent such as pyridine, etc. For this reaction, a dioxide solution is added dropwise to the diamine and dehydrogenated to obtain a polyamidate from a solution of a chemical agent in an organic solvent. After the reaction, the reaction mixture is poured into a poor solvent such as water, etc. The obtained sinker is obtained by filtration and dehydration 311836 1225969 A7 V. Description of the invention (23 (Please read the note on the back? Matters before filling out this page) to obtain the desired polyamidate. The total amount of diamine used is tetracarboxylic The comparison of the acid diester bidentate is preferably from 0.6 / 1 to 1/06 mole ratio, and more preferably from 0.7 / 1 to 1 / 0.7 mole ratio. The reaction temperature is preferably 20. To 40.0, and the reaction time is preferably 1 to 10 hours. The comparison of the dehydrohalogenating agent to the four acid diesters is preferably 18/1 to 2 2/1 mole ratio, and more The preferred ratio is from 1-9 / 1 to 莫 · 8 / ΐ to 2.2 / 1 mole ratio, and more preferably from 9/1 to 2 · ιπ mole ratio. The polyamidoamines used for the imine precursor can be used in the same way as the polyaminoesters described above, but using monoamines instead of alcohol compounds. Monoamine compounds include, for example, methylamine, Ethylamine, n-propylamine, isopropylamine, n-butylamine, second butylamine, third butylamine 'isobutylamine, 1-pentylamine, 2-pentylamine, 3_ Amylamine, isoamylamine, 1-hexylamine, 2-hexylamine, 3-hexylamine, morpholine, aniline, fluorenylamine 'and various unsaturated amines such as acrylic acid aminoalkyl esters, Aminoalkyl methacrylates, etc. The photosensitive resin composition of the present invention printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs is characterized by containing any of the foregoing polyimide precursors. Various methods can be used for manufacturing A photosensitive composition. For example, as in the foregoing specific embodiment, a method of introducing a carbon-carbon unsaturated double bond group into the branch of the polyimide precursor itself can be used to produce a polyfluorene having a photocrosslinkable structure. An imine precursor can make a composition containing the precursor photosensitive. The method is to add a compound containing a carbon-carbon unsaturated bond and an amine group (for example, amine acrylates) to the composition, and it can be ionic bonded to the polyimide precursor of the composition. It can also be used This paper size applies to China National Standard (CNS) A4 (210 X 297 mm) 23 311836 Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs 1225969 A7 ____B7_____ V. Description of the invention (24) The method addition contains one or more Carbon-carbon unsaturated double bond reactive monomer to the composition, so that the composition becomes photosensitive. In addition, a method can be used to add a photosensitizer such as a photoacid generator, a photobase generator, etc. to the composition in. These methods are known in the industry. In principle, in the negative-type photosensitive resin composition of the present invention, the 5′-imine halide according to the present invention itself contains a carbon-carbon unsaturated double bond, otherwise a compound containing a carbon-carbon unsaturated double bond is added. Into the composition. The preferred composition further contains a photopolymerization initiator together with these components. Photopolymerization initiators include, for example, Michler (S) ketone, benzoin methyl ether 'benzoin ethyl ether, benzoin isopropyl ether, 2-third butyl anthracene ratio, 2-ethyl anthracene, 4 4,4- (diethylamino) benzophenone, acetophenone, benzophenone, thia anthracene, 2,2-dimethoxy-2-phenylacetophenone, hydroxycyclohexylphenyl Methanone, 2-methyl- [ren (methylthio) phenyl; | _2_morpholinyl_acetone dibenzidine, diphenyl disulfide, phenanthrene, 2-isopropylthioanthracene Ketone, riboflavin tetrabutyrate, 2,6 · fluorene (p-diethylaminobenzaldehyde) _4_methyl-4-acylcyclohexyl_, N_ethyl-^ (p-aerophenyl) Glycine, n-phenyldiethanolamine, 2- (o-ethoxycarbonyl) oximediphenylpropanedione, p-phenyl_2oxo-ethoxycarbonyl) oximepropanone-1, 3 , 3,4,4-Tetrakis (Third-butylperoxycarbonyl) dibenzoyl, 3,3_carbonylpyrene (7_diethylaminocoumarin), 贰 (cyclopentadienyl) · 贰[2,6-difluoro · 3_ (pyridyl) phenyl] titanium and a variety of azide compounds such as hydrazone azide of the following structural formula: ----------- pack ------ --Order --------- (Please read the back of the note Pou? Matters to fill out this page) this fiscal dumping paper size 243,118,361,225,969

五、發明說明(25 )V. Description of the invention (25)

(請先閱讀背面之注音?事項再填寫本頁) 經濟部智慧財產局員工消費合作社印製 ,、且成物之光聚合引發劑含量相對於1 〇〇 句重量比組 物之聚醯亞胺前驅物較佳為0 01至30份番| 至置比,及更{ 為0.05至10份重量比。若含量低於〇 〇1 、 、 ⑺蕙量比,則; 成物之感光性不佳。但若含量大於3 〇份重蕃 里篁比,則形成t 聚醯亞胺薄膜之機械性質變差。 本發明之負型感光性樹脂組成物可含有 6力〜種具有碳_ 碳未飽和雙鍵之可加成聚合化合物。可加成人 括例如二乙二醇二丙稀酸磨,三乙二醇二丙心合:: 二醇二丙烯酸酯,二乙二醇二甲基丙烯酸酯,二 甲基丙烯酸酯,四乙二醇二甲基丙烯酸酯,三羥甲基丙为 二丙烯酸酯,三羥甲基丙烷三丙烯酸酯,三羥甲基丙烷二 甲基丙烯酸酯,三羥甲基丙烷三f基丙烯酸酯,J,仁丁二 醇二丙烯酸酯,1,6-己二醇二丙烯酸酯,;!,扣丁二醇二甲羞 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 25 311836 1225969 經濟部智慧財產局員工消費合作社印製 A7 ------- -£1__ -------__ 五、發明說明(26 ) 丙埽&自日’ 1,6_己二醇一甲基丙稀酸醋,季戊四醇三丙稀 酸醋’季戊四醇四丙烯酸酯,季戊四醇三甲基丙烯酸醋, 季戊四醇四甲基丙烯酸酯,苯乙烯,二乙烯基苯,仁乙稀 基甲苯,4-乙烯基吡啶,N-乙烯基吡咯啶酮,2_羥乙基丙 烯酸酯,2_羥乙基甲基丙烯酸酯,1,3-丙烯醯氧-2 _羥丙烷, 1,3_甲基丙烯醯氧-2-羥丙烷,亞甲基貳丙烯醯胺,n,n_: 甲基丙烯醯胺,N-羥甲基丙烯醯胺等。其中一或多個基可 單獨或合併使用。 組成物中之可加成聚合化合物含量相對於1 〇〇份重量 比組成物之芳族聚醯亞胺前驅物為i至200份重量比。若 含量小於1份重量比,則組成物於顯像劑之溶解度及/或感 光度不良。但若含量大於200份重量比,則形成的聚醯亞 胺薄臈之機械性質變差。 自由基聚合抑制劑或延遲劑可添加至本發明之負型感 光性樹脂組成物俾增進組成物之儲存安定性。 自由基聚合抑制劑或延遲劑包括例如對-甲氧紛,二苯 基-對-苯醌,苯醌,氫醌,苯三酚,吩噻畊,間苯二紛, 鄰一确基本,對二確基苯’間二墙基苯,菲g昆,N _苯基_ 1 _ 萘基胺’ N -苯基-2-萘基胺,銅鐵靈(cup ferr on),吩噻哄, 2,5 -甲苯醒,單寧酸,對节基胺基紛,亞;g肖基胺類等。其 中一或多個基可單獨或合併使用。 組成物之自由基聚合抑制劑或延遲劑用量相對於1 〇 〇 份重量比組成物之芳族聚醯亞胺前驅物,較佳為〇 〇1至3〇 份重量比,及更佳為0.05至10份重量比。若含量係小於 ----·---:-----·裝--------訂---------線#l· (請先閱讀背面之注咅?事項再填寫本頁) 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 26 311836 1225969 A7(Please read the note on the back? Matters before filling out this page) Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs, and the photopolymerization initiator content of the product is relative to the weight of the polyimide of the compound The precursor is preferably from 0.01 to 30 parts by weight | to ratio, and more {from 0.05 to 10 parts by weight. If the content is less than 〇1, ⑺ 蕙, then the sensitivity of the product is not good. However, if the content is more than 30 parts by weight, the mechanical properties of the t-polyimide film become poor. The negative photosensitive resin composition of the present invention may contain 6 or more kinds of addition polymerizable compounds having carbon-carbon unsaturated double bonds. Additives such as Diethylene Glycol Dipropylene Acid Mill, Triethylene Glycol Dipropylene Blend :: Glycol Diacrylate, Diethylene Glycol Dimethacrylate, Dimethacrylate, Tetraethylene Glycol Alcohol dimethacrylate, trimethylolpropane as diacrylate, trimethylolpropane triacrylate, trimethylolpropane dimethacrylate, trimethylolpropane trifyl acrylate, J, Renbutanediol diacrylate, 1,6-hexanediol diacrylate;!, Butanediol dimethymethane Paper size applies to Chinese National Standard (CNS) A4 specifications (210 X 297 mm) 25 311836 1225969 Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs A7 --------£ 1__ -------__ V. Description of the invention (26) Bing & since the day '1, 6_Jiji Alcohol-Methyl Propionate, Pentaerythritol Tripropionate 'Pentaerythritol Tetraacrylate, Pentaerythritol Trimethacrylate, Pentaerythritol Tetramethacrylate, Styrene, Divinylbenzene, Menthyl Toluene, 4 -Vinylpyridine, N-vinylpyrrolidone, 2-hydroxyethyl acrylate, 2-hydroxyethyl methacrylic acid Esters, 1,3-propenyloxy-2-hydroxypropane, 1,3-methacrylic acid 2-hydroxypropane, methylene-propionamine, n, n_: methacrylamide, N- Hydroxymethacrylamide and the like. One or more of these groups can be used individually or in combination. The content of the addition polymerizable compound in the composition is from i to 200 parts by weight based on 100 parts by weight of the aromatic polyfluorene imide precursor. If the content is less than 1 part by weight, the solubility and / or sensitivity of the composition to the developer will be poor. However, if the content is more than 200 parts by weight, the mechanical properties of the resulting polyfluorene imine thin film become poor. A radical polymerization inhibitor or a retarder may be added to the negative photosensitive resin composition of the present invention to improve the storage stability of the composition. Free-radical polymerization inhibitors or retarders include, for example, p-methoxyphenone, diphenyl-p-benzoquinone, benzoquinone, hydroquinone, pyrogallol, phenothiagen, m-phenylene, o-one, basic, right Diacylbenzene 'm-di wallylbenzene, phenanthrene g-Kun, N_phenyl_1_naphthylamine' N-phenyl-2-naphthylamine, cup ferr on, phenothiazine, 2,5 -toluene, tannic acid, p-benzylamine group, sub-group; g, stilbylamines and so on. One or more of them may be used alone or in combination. The amount of the radical polymerization inhibitor or the retarder of the composition is preferably from 0.001 to 30 parts by weight, and more preferably from 0.05 to the aromatic polyimide precursor of the composition by weight. To 10 parts by weight. If the content is less than ---- · ---: ----- · install -------- order --------- line # l · (Please read the note on the back first 咅? Please fill in this page again) This paper size is applicable to China National Standard (CNS) A4 (210 X 297 mm) 26 311836 1225969 A7

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五、發明說明(28 ) 經濟部智慧財產局員工消費合作社印製 用。 為了提高組成物之硬化膜對基材的黏著性,組成物可 額外3有有機石夕燒化合物,銘螯合化合物,含石夕聚醯胺酸 類等中之任一者。 較佳有機矽烷化合物,包括例如γ_胺基丙基三甲氧矽 燒丫胺基丙基二乙氧石夕烧,乙稀基三乙氧石夕烧,γ-縮水甘 油基氧丙基二乙氧石夕烧,γ-甲基丙稀醯氧丙基三甲氧石夕 燒,三乙氧矽烷基丙基乙基胺基甲酸酯,Ν_(三乙氧石夕烧基 丙基)尿素等。鋁螯合化合物包括例如參(乙醯基丙酮酸根) 銘,二異丙酸乙醯基乙酸根鋁等。 本發明之感光性樹脂組成物經由浸塗、喷塗、網印、 旋塗等方式施用於矽晶圓基材、金屬基材、陶瓷基材等上, 及加熱乾燥去除大半溶劑,如此獲得於基材上形成非沾黏 薄膜。形成的薄膜厚度並無特殊限制,但鑑於包含該薄膜 之裝置的電路特性等,較佳為4至50微米,更佳為6至 40微米’又更佳為1〇至40微米,又更佳為2〇至35微米。 因本發明之感光性樹脂組成物可形成具有低剩餘應力 之聚醯亞胺薄膜,故可有利地用於大尺寸晶圓,例如直徑 12吋或以上的矽晶圓。 組成物之薄膜經由具有預定圖案的光罩暴露於光或其 它電磁輻射例如β或γ射線,以及隨後薄膜之未曝光區或曝 光區(依據為負或正活性決定)經由使用適當顯像劑顯像去 除,如此獲得圖案化薄膜。 本發明之感光性樹脂組成物有利於用於使用i線步進 -----------裝--------訂---------線 (請先閱讀背面之注意事項再填寫本頁) 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 28 311836 Π25969 A7 五、發明說明(29 ) (請先閱讀背面之注音?事項再填寫本頁} 器等進行i線曝光,但本發明非僅限於此項用途。除了f 線曝光外,本發明之組絲薄膜也可使㈣高廢采燈、投 射鏡、g線步進器以及使用任何其它投射器或紫外光、可 見光X射線、電子射線等光源使用接觸/近端投射器處 理。 顯像劑’包括例如包含良好溶劑之有機溶劑顯像劑(例 如n,n-二甲基甲醯胺,N,N•二甲基乙醯胺,N_甲基·2_吡 洛㈣等)’或良好溶劑與不良溶劑組成的混合溶劑顯像劑 (例如低級碳醇類,_類,水,芳族烴類等),以及強檢顯 像劑。若組成物之聚醯亞胺前驅物可溶解於水性鹼溶液, 則水性鹼溶液可用作為組成物薄膜之顯像劑。水性鹼溶液 例如為含有氫氧化鈉、氫氧化鉀、矽酸鈉、氫氧化四曱基 錄等中之任一者含量至多5重量%,且較佳i 5至3〇重量 %之水溶液。更佳顯像劑為含有氫氧化四甲基銨含量為15 至3.0重量%之水溶液。 經濟部智慧財產局員工消費合作社印製 界面活性劑及其它添加劑可添加至顯像劑。各種添加 劑(若有)含量相對於100份重量比顯像劑較佳為〇〇1至1〇 份重量比,及更佳0.1至5份重量比之範圍。 於顯像後,加工後的薄膜選擇性但較佳以水或不良溶 劑清洗,然後於約1〇〇t附近脫水,如此將圖案化薄膜穩 定化。然後圖案化薄膜加熱獲得具有良好耐熱性之低應力 解除圖案薄膜。 加熱溫度較佳為150至50(TC之範圍,及更佳2〇〇至 4〇〇°C。若加熱溫度係低於15(rc,則最終所得薄膜之機械 ¥紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 29 311836 Π25969 A7 B7 五、發明說明(3〇 ) 性質及熱特性不佳。若高於5〇(rC,則薄臈之機械性質及 熱特性由於熱分解及/或交聯故也將不佳。 (請先閱讀背面之注咅?事項再填寫本頁) 加熱時間較佳為〇·05至10小時。若加熱時間比〇 〇5 小時短’則所得薄膜之機械性質及熱特性不良。若比1 〇 小時更長’則所得薄膜之機械性質及熱特性也不佳。 本發明之感光性樹脂組成物可用於電子組件,例如半 導體裝置、多層互連板等。特別本發明組成物可用於半導 體裝置中形成表面保護膜及層間絕緣膜,或用於多層互連 板中形成層間絕緣膜等。 本發明之電子組件未經特別界定,只要其具有由該種 組成物製成的表面保護膜或層間絕緣膜即可,且可具有多 種結構。 本發明之電子組件之製法之一實例說明如後,其中以 半導體裝置之製造舉例說明。 經濟部智慧財產局員工消費合作社印製 第1Α圖至第1Ε圖顯示具有多層互連結構之半導體裝 置之製法。如所示,半導體基材1 (例如矽等製成的半導體 基材)具有電路元件以保護膜2(例如二氧化矽等)塗布,但 電路元件的預定部份除外;以及第一導電層3形成於該暴 露電路元件上。半導體基材根據旋塗法等(第1 A圖之步驟) 以薄膜4(例如樹脂等)塗布,作為層間絕緣膜。 其次’基於酚-酚醛清漆樹脂或其它相當的感光性樹脂 層5根據旋塗法形成於層間絕緣膜4上,以及形成窗6 A, 根據已知光刻技術(第1B圖步驟)經由該窗,層間絕緣膜4 之預定部份暴露至外側。 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 30 311836 經濟部智慧財產局員工消費合作社印製 Γ225969 A7 ____B7___ 五、發明說明(31 ) 各窗6 A下方之層間絕緣膜4根據乾蝕刻方法使用 氧、四氟化碳等蒸氣,選擇性蝕刻形成窗6B。其次,感光 性樹脂層5使用僅可蝕刻感光樹脂層5之蝕刻溶液完全去 除,但未蝕刻經由窗6B暴露於外側之第一導體層3(第1C 圖之步驟)。 其次根據已知光刻技術形成第二導體層7,其完全電 連結第一導體層3(第1D圖之步驟)。 為了形成有3層或更多層之多層互連結構,對各層重 複所述步驟。 其次’形成表面保護膜8(第1E圖之步驟)。所述實例中, 根據旋塗法形成表面保護膜,其中本發明之感光性樹脂組 成物施用於晶圓上及於其上乾燥。然後薄膜透過光罩曝 光,光罩具有以預定組件形成之窗6C之圖案。隨後曝光 後的薄膜使用水性鹼溶液顯像獲得預定圖案,然後圖案被 加熱而製造應力解除的圖案化樹脂薄膜。該樹脂薄膜保護 導體層不接觸外來應力α、α射線等,如此製成的半導體裝 置具有良好可靠性。 所示實例中’層間絕緣膜亦係由本發明之感光性樹脂 組成物形成。 將參照下列實例說明本發明之進一步細節,但絕非意 圖囿限本發明之範圍。 製造例1至3 : 間-甲苯胺之二胺成分及Ν-甲基-2-Π比咯啶酮(ΝΜΡ)溶 劑置於配備有攪拌器及溫度計之〗〇〇毫升燒瓶内,且於室 -----------裝--------訂---------線 411^ l· (請先閲讀背面之注音3事項再填寫本頁) 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公爱) 31 311836 1225969 A7 五、發明說明(32 ) (請先閱讀背面之注意事項再填寫本頁) 飢以攪拌溶解。所得溶液内加入下表丨所示酸成分,及攪 拌24小時獲得聚醯亞胺前驅物黏稠溶液。溶液於加 熱至其黏度達100泊(poiseK固體含量:25%重量比)。如此 獲得聚醯亞胺前驅物溶液(PAAq至pAA-3)。使用二胺成 刀、酸成分及NMP含量以及所得聚醯亞胺前驅物分子量 全部皆示於表1。 皇造你丨4 : 經濟部智慧財產局員工消費合作社印製 表1所示酸成分,半份N,N-二甲基乙醯胺(DMAc)溶 劑’及2當量甲基丙烯酸2-羥乙酯置於配備有攪拌器及溫 度計之100毫升燒瓶内。於室溫以攪拌加入2 2當量吡啶。 混合物進一步於60至7(rc攪拌1小時,然後冷卻至室溫 且授拌隔夜。混合物冷卻至〇°c,然後以攪拌逐滴加入2 6 當量亞磺醯氣。回復室溫後,混合物攪拌2小時而獲得醯 氣溶液。此外,間-甲苯胺之二胺成分,其餘部份的DMAc 及2當量吡啶置於配備有攪拌器及溫度計之1 〇〇毫升燒瓶 内’於室溫以攪拌溶解,然後冷卻至〇 °C。攪拌所得混合 物時’先前製備的醢氯溶液逐滴加入其中,所得混合物進 一步於室溫攪拌1小時而獲得聚醯亞胺前驅物溶液。此種 前驅物再度於離子交換水中沈澱,所得固體以水洗膝,然 後真空脫水而獲得聚醯亞胺前驅物(PAA-4)。二胺成分、酸 成分及DMAc用量以及所得聚醯亞胺前驅物分子量示於表 本紙張尺度適用中國國家標準(CNS)A4規格mo X 297公釐) 32 311836 1225969 A7V. Description of Invention (28) Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs. In order to improve the adhesion of the hardened film of the composition to the substrate, the composition may additionally include any one of an organic stone compound, a chelate compound, and a stone-containing polyamic acid. Preferred organic silane compounds include, for example, γ-aminopropyltrimethoxysilanylaminoaminodiethoxyxanthine, ethylene triethoxyxanthine, γ-glycidyloxypropyldiethyl Oxygen oxalate, γ-methyl propyl oxypropyltrimethoxy oxalate, triethoxysilyl propyl ethyl carbamate, N_ (triethoxy oxalyl propyl) urea, etc. . Aluminum chelate compounds include, for example, Ethyl (ethylpyruvate), aluminum diisopropylate, and the like. The photosensitive resin composition of the present invention is applied to silicon wafer substrates, metal substrates, ceramic substrates, etc. by means of dip coating, spray coating, screen printing, spin coating, etc., and is heated and dried to remove most of the solvent. A non-stick film is formed on the substrate. The thickness of the formed film is not particularly limited, but in view of the circuit characteristics and the like of the device including the film, it is preferably 4 to 50 microns, more preferably 6 to 40 microns, and more preferably 10 to 40 microns, and more preferably It is 20 to 35 microns. Since the photosensitive resin composition of the present invention can form a polyimide film with low residual stress, it can be advantageously used for large-size wafers, such as silicon wafers having a diameter of 12 inches or more. The film of the composition is exposed to light or other electromagnetic radiation such as beta or gamma rays through a photomask having a predetermined pattern, and the unexposed or exposed areas of the film (depending on the negative or positive activity) are subsequently developed by using an appropriate developer. Like removal, a patterned film is thus obtained. The photosensitive resin composition of the present invention is advantageous for using i-wire stepping ----------- installation -------- order --------- line (please Please read the notes on the back before filling this page) This paper size is applicable to China National Standard (CNS) A4 (210 X 297 mm) 28 311836 Π25969 A7 V. Description of the invention (29) (Please read the note on the back first? Matters Fill out this page again} for i-ray exposure, but the present invention is not limited to this purpose. In addition to f-ray exposure, the silk film of the present invention can also be used to step high waste lights, projection mirrors, and g-line. And any other projectors or light sources such as ultraviolet, visible X-rays, electron rays, etc. are processed using a contact / near-end projector. Developers include, for example, organic solvent developers (e.g., n, n-di Methylformamide, N, N • dimethylacetamide, N_methyl · 2_pyrrolidine, etc.) or mixed solvent imaging agents (such as lower alcohols, _, Water, aromatic hydrocarbons, etc.), and strong detection imaging agent. If the polyimide precursor of the composition can be dissolved in aqueous alkaline solution, An aqueous alkali solution can be used as a developer of the composition film. The aqueous alkali solution contains, for example, up to 5% by weight of any one of sodium hydroxide, potassium hydroxide, sodium silicate, tetramethyl hydroxide, and the like, and Preferred is an aqueous solution of 5 to 30% by weight. A more preferred developer is an aqueous solution containing tetramethylammonium hydroxide with a content of 15 to 3.0% by weight. The surfactant and other materials are printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs and others. Additives may be added to the developer. The content of various additives (if any) relative to 100 parts by weight of the developer is preferably from 0.01 to 10 parts by weight, and more preferably from 0.1 to 5 parts by weight. After development, the processed film is selectively but preferably washed with water or a poor solvent, and then dehydrated at about 100t, so that the patterned film is stabilized. Then the patterned film is heated to obtain a low heat resistance. Stress relief pattern film. The heating temperature is preferably in the range of 150 to 50 ° C, and more preferably in the range of 200 to 400 ° C. If the heating temperature is lower than 15 ° rc, the mechanical film size of the resulting film is ¥ paper size Applicable to China Standard (CNS) A4 (210 X 297 mm) 29 311836 Π25969 A7 B7 V. Description of the invention (30) The properties and thermal characteristics are not good. If it is higher than 50 (rC, the mechanical properties and thermal characteristics of the thin sheet) It will also be poor due to thermal decomposition and / or crosslinking. (Please read the note on the back? Matters before filling out this page) The heating time is preferably 0.05 to 10 hours. If the heating time is shorter than 0.05 hours 'The mechanical properties and thermal characteristics of the obtained film are poor. If it is longer than 10 hours', the mechanical properties and thermal characteristics of the obtained film are also not good. The photosensitive resin composition of the present invention can be used in electronic components such as semiconductor devices, Multilayer interconnect boards, etc. In particular, the composition of the present invention can be used for forming a surface protection film and an interlayer insulating film in a semiconductor device, or for forming an interlayer insulating film in a multilayer interconnection board. The electronic component of the present invention is not particularly limited as long as it has a surface protective film or an interlayer insulating film made of such a composition, and may have various structures. An example of the manufacturing method of the electronic component of the present invention will be described later, in which the manufacturing of a semiconductor device is taken as an example. Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs Figures 1A to 1E show the manufacturing method of a semiconductor device with a multilayer interconnection structure. As shown, the semiconductor substrate 1 (such as a semiconductor substrate made of silicon, etc.) has a circuit element coated with a protective film 2 (such as silicon dioxide, etc.), except for a predetermined portion of the circuit element; and the first conductive layer 3 Formed on the exposed circuit element. The semiconductor substrate is coated with a thin film 4 (for example, a resin or the like) according to a spin coating method or the like (step in FIG. 1A) as an interlayer insulating film. Next, a phenol-phenol novolac resin or other equivalent photosensitive resin layer 5 is formed on the interlayer insulating film 4 by a spin coating method, and a window 6 A is formed through the window according to a known photolithography technique (step 1B). A predetermined portion of the interlayer insulating film 4 is exposed to the outside. This paper size applies to China National Standard (CNS) A4 (210 X 297 mm) 30 311836 Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs Γ225969 A7 ____B7___ V. Description of the invention (31) Interlayer insulation film under each window 6 A 4 According to the dry etching method, a window 6B is formed by selective etching using vapors such as oxygen and carbon tetrafluoride. Next, the photosensitive resin layer 5 is completely removed by using an etching solution capable of etching only the photosensitive resin layer 5, but the first conductor layer 3 exposed to the outside through the window 6B is not etched (step in FIG. 1C). Next, a second conductor layer 7 is formed according to a known photolithography technique, which is completely electrically connected to the first conductor layer 3 (step in FIG. 1D). In order to form a multilayer interconnection structure having 3 or more layers, the steps are repeated for each layer. Next, a surface protection film 8 is formed (step in FIG. 1E). In the example, a surface protection film is formed according to a spin coating method, in which the photosensitive resin composition of the present invention is applied to a wafer and dried thereon. The film is then exposed through a reticle, which has a pattern of windows 6C formed with predetermined components. The subsequently exposed film was developed using an aqueous alkali solution to obtain a predetermined pattern, and the pattern was heated to produce a patterned resin film with stress relief. This resin film protects the conductor layer from contact with external stress α, α rays, and the like, and the semiconductor device thus manufactured has good reliability. In the example shown, the interlayer insulating film is also formed of the photosensitive resin composition of the present invention. Further details of the invention will be illustrated with reference to the following examples, but by no means intended to limit the scope of the invention. Production Examples 1 to 3: Diamine component of m-toluidine and N-methyl-2-Π-pyrrolidone (NMP) solvent were placed in a 100 ml flask equipped with a stirrer and a thermometer, and ----------- Install -------- Order --------- Line 411 ^ l · (Please read the note 3 on the back before filling this page) This The paper size applies the Chinese National Standard (CNS) A4 specification (210 X 297 public love) 31 311836 1225969 A7 V. Description of the invention (32) (Please read the precautions on the back before filling this page) Hungry to dissolve. The obtained solution was added with the acid components shown in the following Table 丨 and stirred for 24 hours to obtain a viscous solution of the polyimide precursor. The solution was heated to a viscosity of 100 poise (poiseK solid content: 25% by weight). Thus, a polyfluorene imide precursor solution (PAAq to pAA-3) was obtained. Table 1 shows the results of using diamine knife, acid content, NMP content, and molecular weight of the obtained polyimide precursor. Emperor Makes You 丨 4: Printed in Table 1 by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs, half of the N, N-dimethylacetamide (DMAc) solvent 'and 2 equivalents of 2-hydroxyethyl methacrylate The ester was placed in a 100 ml flask equipped with a stirrer and a thermometer. 22 equivalents of pyridine were added with stirring at room temperature. The mixture was further stirred at 60 to 7 ° C for 1 hour, then cooled to room temperature and allowed to stir overnight. The mixture was cooled to 0 ° C, and then 2 6 equivalents of sulfenylsulfonium gas were added dropwise with stirring. After returning to room temperature, the mixture was stirred A tritium solution was obtained in 2 hours. In addition, the diamine component of m-toluidine, the rest of DMAc and 2 equivalents of pyridine were placed in a 100 ml flask equipped with a stirrer and a thermometer, and dissolved at room temperature with stirring. , And then cooled to 0 ° C. When the resulting mixture was stirred, the previously prepared osmium chloride solution was added dropwise thereto, and the resulting mixture was further stirred at room temperature for 1 hour to obtain a polyfluorene imide precursor solution. This precursor was again exposed to ions. The precipitate was exchanged in water, and the obtained solid was washed with water and then dehydrated under vacuum to obtain a polyimide precursor (PAA-4). The diamine component, the acid component, the amount of DMAc, and the molecular weight of the obtained polyimide precursor are shown in the sheet Standards are applicable to China National Standard (CNS) A4 specifications mo X 297 mm 32 32311836 1225969 A7

五、發明說明(33 ) 表1 製造例1 i成分~~ (用量) 11.46克(25毫莫耳) 二胺成分 (用量) (25毫莫 耳) 溶劑 (用量) ΝΜΡ 50.29 克 聚醯亞胺 前驅物 PAA-1 ~~ 重量平均— 好量 108,000 製造例2 1〇·11克(25毫莫耳、 5.31 克 (25毫莫 耳) ΝΜΡ 46.25 克 PAA-2 113,000 製造例3 9.16克(25毫莫耳) 5·31 克 (25毫莫 耳) ΝΜΡ 43.40 克 PAA-3 74,000 製造例4 辦 10.11克(25毫莫耳) 5.31 克 (25毫莫 耳) DMAc 70克 PAA-4 41,000 實例1至3 : 於10克之製造例1至3製備之各聚醯亞胺前驅物溶液 (PAA-1至PAA-3中之任一者)添加〇 〇27克2 6_貳(4,_疊氮 基苯甲醛)冬羧環己ig(CA),0.027克4,4,-貳(二乙基胺基) 二苯甲酮(EBA)以及0.054克1-苯基-2-(鄰-乙氧羰基)后基 丙-1-酮(PDO)。於其中又加入甲基丙烯酸二甲基胺基丙酯 (MDAP),MDAP添加量為聚醯亞胺前驅物之羧基當量的相 等當量。以攪拌混合獲得實例1至3之感光性樹脂組成物 之均質溶液。 實例4 : (請先閱讀背面之注意事項再填寫本頁) 裝--------訂---------線一 經濟部智慧財產局員工消費合作社印製 2.50克之製造例4製備之聚醯亞胺前驅物(PAA-4)溶 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 33 311836 1225969 A7 B7 五、發明說明(34 ) (請先閱讀背面之注音?事項再填寫本頁) 解於5.83克γ-丁内酯,於其中添加〇·〇27克2,6-家(4,-叠氮 基苯甲醛)·4-羧環己酮(CA),0.027克4,4,-貳(二乙基胺基) 一本甲網(ΕΒ Α)以及0.054克1-苯基-2·(鄰-乙氧幾基)西基 丙-1-酮(PDO)。攪拌混合獲得實例4感光性樹脂組成物之 均質溶液。 如上製備之感光性樹脂組成物溶液經過濾分離。各別 藉旋塗逐滴施用至矽晶圓上,然後於1 〇〇熱板上加熱及 乾燥150秒以形成1 5微米薄膜於晶圓上。使用i線步進 裔’薄膜經圖案光罩曝光。於100 °C加熱60秒,然後使用 槳葉以N-甲基-2-Π比咯啶酮/水(75/25重量比)混合物顯像。 於100°C進一步加熱30分鐘,於200°C加熱30分鐘及於 3 50 °C加熱60分鐘,而獲得聚醯亞胺樹脂圖案。 製造例1至4製備之聚醯亞胺前驅物(PAA-1至PA A-4)之透射比,由前驅物製成之聚醯亞胺薄膜之熱膨脹係 數’矽晶圓上之聚醯亞胺薄膜之剩餘應力,以及聚醯亞胺 應力解除圖案之解析度根據下述方法測量及評估。資料示 於表2。 經濟部智慧財產局員工消費合作社印製 透射比量測如後:各聚醯亞胺前驅物(PAA-1至PAA_ 4)之樹脂溶液經旋塗施用於基材上,於85°c乾燥3分鐘, 然後於1 05 °C乾燥3分鐘。使用分光光度計測量所得薄膜 (厚度·· 10微米)之透射比。熱膨脹係數量測如下:厚10 微米之聚醯亞胺薄膜,係藉施用各聚醯亞胺前驅物(PAA-1 至PAA-4)樹脂溶液於基材上接著加熱乾燥形成,薄膜係於 10克負載下以1〇。(:/分鐘之速率加熱,及使用TMA測量其 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 34 311836 1225969 A7 B7 五、發明說明(35 ) 熱膨脹係數。剩餘應力測量如下:於6吋矽晶圓上由各種 感光性樹脂組成物形成聚醯亞胺薄膜,其剩餘應力係於25 °C使用薄膜應力計(坦科爾FLX-2320型號)測量。 為了量測感光性樹脂組成物之解析度,由各組成物形 成貫穿孔圖案。所形成的可顯像貫穿孔的最小尺寸指示接 受測試的樹脂組成物解析度。 表2 聚醯亞胺前 驅物 前驅物之i 線透射比 (%) 實例 實例2 實例 實例4 聚醯亞胺薄臈 之剩餘應力(百 萬巴斯卡) 解析度 微米 (請先閱讀背面之注咅?事項再填寫本頁) PAA-1 PAA-2 PAA-3 PAA-4 41 53 51 12 8 12 14 微米 5微米 6微米 6微米 經濟部智慧財產局員工消費合作社印製 例5及6,f造例9及10 : (1) 醯氣溶液之製備: 0.03莫耳量之表3所示酸酐,7.81克(〇·〇6莫耳)甲^ 丙烯酸2_羥乙酯(HEMA),4.75克(〇·〇6莫耳)口比咬,〇 〇1 克風酉昆及70毫升N,N-二甲基乙醯胺(DMAc)置於20〇毫: 四頸瓶,及於60°C攪拌2小時獲得透明溶液。溶液進一 於至授拌7小時。其次燒瓶以冰冷卻中,$ $ 7克(q 〇 7 莫耳)亞磺醯氣以10分鐘時間逐滴加入其中。此種混合身 進一步於室溫攪拌1小時獲得含醯氣之溶液。 (2) 聚醯亞胺前驅物之製造: 0 03莫耳量之表3所示二胺,5.06克(〇 〇64莫耳)吼 咬’ 〇〇1克氫醌及5〇毫升DMAc置於另—個2〇〇毫升迈V. Description of the invention (33) Table 1 Manufacturing Example 1 Ingredient i ~ (Amount) 11.46 g (25 mmol) Diamine component (amount) (25 mmol) Solvent (amount) NP 50.29 g Polyimide Precursor PAA-1 ~~ Weight average — good amount 108,000 Manufacturing Example 2 10 · 11 g (25 mmol, 5.31 g (25 mmol) NM 46.25 g PAA-2 113,000 Manufacturing Example 3 9.16 g (25 mmol) Moore) 5.31 grams (25 millimoles) NMP 43.40 grams PAA-3 74,000 Manufacturing Example 4 10.11 grams (25 millimoles) 5.31 grams (25 millimoles) DMAc 70 grams PAA-4 41,000 Examples 1 to 3: To 10 g of each of the polyfluorene imide precursor solutions (any of PAA-1 to PAA-3) prepared in Production Examples 1 to 3 was added 027 g of 2 6-fluorene (4, _ azido Benzaldehyde) winter carboxycyclohexyl ig (CA), 0.027 g 4,4, -fluorene (diethylamino) benzophenone (EBA) and 0.054 g 1-phenyl-2- (o-ethoxycarbonyl) ) Propylpropan-1-one (PDO). Then add dimethylaminopropyl methacrylate (MDAP), the amount of MDAP added is the equivalent of the carboxyl equivalent of the polyimide precursor. Mix with stirring Get the sensitivity of Examples 1 to 3 Homogeneous solution of resin composition. Example 4: (Please read the precautions on the back before filling out this page) Packing -------- Order --------- Line 1 Ministry of Economy Intellectual Property Bureau Staff Consumption Cooperative printed 2.50 grams of Polyimide Precursor (PAA-4) prepared in Manufacturing Example 4 The paper size is in accordance with China National Standard (CNS) A4 (210 X 297 mm) 33 311836 1225969 A7 B7 V. Invention Note (34) (Please read the note on the back? Matters and then fill out this page) Solution 5.83 g of γ-butyrolactone, add 0.027 g of 2,6-jia (4, -azidobenzaldehyde) ) · 4-Carboxycyclohexanone (CA), 0.027 g of 4,4, -fluorene (diethylamino), a benzyl ether (ΕΒΑ) and 0.054 g of 1-phenyl-2 · (o-ethoxy) A few bases) sylpropan-1-one (PDO). Stir and mix to obtain a homogeneous solution of the photosensitive resin composition of Example 4. The photosensitive resin composition solution prepared as above was separated by filtration. Each was applied dropwise by spin coating to On a silicon wafer, and then heated and dried on a 1000 hot plate for 150 seconds to form a 15 micron film on the wafer. The i-line stepper 'film was exposed through a patterned mask at 100 ° C was heated for 60 seconds, and then developed using a paddle with an N-methyl-2-Π ratio of pyrrolidone / water (75/25 weight ratio). The polyimide resin pattern was obtained by further heating at 100 ° C for 30 minutes, 200 ° C for 30 minutes, and 3 50 ° C for 60 minutes. The transmittances of the polyimide precursors (PAA-1 to PA A-4) prepared in Manufacturing Examples 1 to 4, and the thermal expansion coefficient of the polyimide film made of the precursors' Polyimide on a silicon wafer The residual stress of the amine film and the resolution of the polyimide stress relief pattern were measured and evaluated according to the following methods. The information is shown in Table 2. The measurement of the transmittance is printed as follows by the consumer cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs: the resin solution of each polyimide precursor (PAA-1 to PAA_ 4) is spin-coated on the substrate and dried at 85 ° c. Minutes, then dried at 105 ° C for 3 minutes. The transmittance of the obtained film (thickness · 10 µm) was measured using a spectrophotometer. The thermal expansion coefficient is measured as follows: Polyimide film with a thickness of 10 microns is formed by applying each polyimide precursor (PAA-1 to PAA-4) resin solution on the substrate and then heating and drying. The film is based on 10 10 g under load. (: / Min rate heating, and the paper size measured by TMA is applicable to Chinese National Standard (CNS) A4 specification (210 X 297 mm) 34 311836 1225969 A7 B7 V. Description of the invention (35) Thermal expansion coefficient. Residual stress measurement As follows: Polyimide films are formed from various photosensitive resin compositions on a 6-inch silicon wafer. The residual stress is measured at 25 ° C using a thin film stress meter (Tanker FLX-2320 model). For the resolution of the resin composition, the through-hole pattern is formed by each composition. The minimum size of the formed through-hole that can be developed indicates the resolution of the resin composition to be tested. Table 2 i of the polyimide precursor precursor Linear transmittance (%) Example Example 2 Example Example 4 Residual stress of polyimide thin film (million bska) Resolution in micrometers (please read the note on the back? Matters before filling this page) PAA-1 PAA -2 PAA-3 PAA-4 41 53 51 12 8 12 14 micrometers 5 micrometers 6 micrometers 6 micrometers Intellectual Property Bureau of the Ministry of Economic Affairs Employee Cooperatives Printing Examples 5 and 6, f Examples 9 and 10: (1) Radon solution Preparation: Table 3 of 0.03 Molar Acid anhydride, 7.81 g (0.06 mol) of methyl 2-hydroxyethyl acrylate (HEMA), 4.75 g (0.06 mol) of mouth-to-mouth bite, 0.001 g of Fentonium and 70 ml of N, N-dimethylacetamide (DMAc) was placed in a 200-milliliter: four-necked flask, and stirred at 60 ° C for 2 hours to obtain a transparent solution. The solution was added to the mixture for 7 hours. Next, the flask was cooled with ice, $ 7 g (q 〇07 mol) of sulfen gas is added dropwise over a period of 10 minutes. This mixture is further stirred at room temperature for 1 hour to obtain a solution containing gas. (2) Polyimide precursor Manufacture: 0 03 Molar of the diamine shown in Table 3, 5.06 g (0064 Molar) roar and bite '0.01 g of hydroquinone and 50 ml of DMAc in another 200 ml of Mai

經 濟 部 智 慧 財 產 局 員 工 消 費 合 作 社 印 製 1225969 五、發明說明(36 頦瓶内。瓶内混合物以冰冷卻(冷卻至不高於〗〇。。溫度)及 攪拌時,(1)製備的醯氣溶液以1小時時間逐滴添加入其 中。然後混合物進一步於室溫攪拌i小時及倒入i升水中。 如此沈澱的聚合物經過濾取出,洗兩次及真空脫水。所得 聚合物粉末溶解於γ-丁内酯(γ-BL)獲得經控制的黏度8〇 泊。如此製備聚醯亞胺前驅物溶液(PAEq,2,ρΑΕ_5,6卜 製造例7及S : (1) 醯氣溶液之製備: 0·03莫耳量之表3所示酸酐,〇〇6莫耳正丁醇,475 克(0.06莫耳)批啶及7〇毫升二甲基乙醯胺(dmAc)置 於200毫升四頸瓶内,及於6〇t攪拌2小時獲得透明溶 液。進一步於室溫攪拌7小時。其次燒瓶以冰冷卻,857 克(0·072莫耳)亞磺醢氣以10分鐘時間逐滴添加至其中。 又進一步於室溫攪拌1小時獲得含醯氣溶液。 (2) 聚醯亞胺前驅物之製造: 一份0.03莫耳表3所示二胺,5.06克(〇·〇64莫耳)π比 啶及50毫升DMAc置於另一個2〇〇毫升四頸瓶内。燒瓶 内混合物以冰冷卻(冷卻至不高於1〇t溫度)及擾拌時,(1) 製備之醯氣溶液以1小時時間逐滴添加至其中。然後混合 物進一步於室溫攪拌丨小時,然後倒入1升水中。如此沈 殿的聚合物經過濾取出,洗兩次及真空脫水。 所得聚合物粉末溶解於γ-丁内酯(γ-BL)獲得經控制的 黏度80泊。如此製備聚醢亞胺前驅物溶液(ραε_3,4)。 黏度使用Ε型黏度計(EHD型號得自東機工業公司)量 -----------裝--------訂---------線l· (請先閱讀背面之注意事項再填寫本頁} 本紙張尺度適用中國國家標準(CNS)A4規格(210 χ 297公釐) 36 311836 1225969 A7 B7 五、發明說明(38 ) 液顯像。於350 °C進一步加熱60分鐘而獲得聚醯亞胺樹脂 圖案。 (請先閱讀背面之注咅?事項再填寫本頁) 部份聚醯亞胺應力解除圖案進行溴化鉀_紅外光譜術 檢測,於約1780厘米-1獲得特定醯亞胺基吸收。 製造例5至1 〇製備之聚醯亞胺前驅物(pAE]至pAE_6) 之光透射比,矽晶圓上聚醯亞胺薄膜之剩餘應力,以及聚 醯亞胺應力解除圖案之解析度根據下述方法量測及評估。 資料示於表4。 透射比量測如下:各聚醯亞胺前驅物(PAE-1至PAE-6)之樹脂溶液藉旋塗施用於基材上,以及於85艽乾燥2分 鐘然後於105°C乾燥2分鐘。所得薄膜(厚度1〇微米)之透 射比係使用分光光度計量測。 剩餘應力量測如下:於5吋矽晶圓上,由各種感光性 樹脂組成物形成厚1 〇微米之聚醯亞胺薄膜,其剩餘應力係 使用薄膜應力計(坦科爾FLX-2320型號)量測。 經濟部智慧財產局員工消費合作社印製 為了測量感光性樹脂組成物之解析度,由各組成物形 成貫穿孔試驗圖案。形成的可顯像貫穿孔之最小尺寸指示 接受測試樹脂組成物的解析度。 實例5至8及比較例1及2形成的應力解除圖案,於 氮氣氛下於350 °C加熱60分鐘而獲得聚醯亞胺圖案。得自 實例5至8之應力解除圖案之聚醯亞胺圖案於橫截面具有 良好梯形側面圖,且以高解析度反映出原先應力解除圖案 之良好矩形側面圖。但得自比較例1及2之應力解除圖案 之聚醢亞胺圖案之橫載面為不利的倒梯形側面圖,反映出 本紙張尺度適用中國國家標準(CNS)A4規格(21〇 X 297公釐) 38 311836 1225969 A7 _B7 五、發明說明(39 ) 原先應力解除圖案之不利的倒梯形側面圖具有低解析度。 表3 酸成分 二胺成分 聚醯亞胺 前驅物 重量平均分 子量(Mw) 製造例5 MTXDA DDE-A PAE-1 41000 製造例6 SIXDA DDE-A PAE-2 33000 製造例7 MMXDA 2,2-HAB PAE-3 27000 製造例8 6FCDA 3,3-HAB PAE-4 30000 製造例9 s-BPDA DDE-A PAE-5 36000 製造例10 PMDA DDE-A PAE-6 32000 MTXDA:Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs, 1225969 V. Description of the invention (in a 36 颏 bottle. The mixture in the bottle is cooled with ice (cooled to no higher than 〖0 ... temperature), and (1) the radon gas prepared The solution was added dropwise over 1 hour. Then the mixture was further stirred at room temperature for i hours and poured into i liters of water. The polymer thus precipitated was removed by filtration, washed twice and dehydrated in vacuo. The resulting polymer powder was dissolved in γ -Butyrolactone (γ-BL) obtains a controlled viscosity of 80 poises. In this way, a polyfluorene imide precursor solution (PAEq, 2, ρΑΕ_5, 6b, Manufacturing Example 7 and S: (1) Preparation of a tritium gas solution : 0.03 Molar of the acid anhydride shown in Table 3, 006 Molar n-butanol, 475 g (0.06 Molar) of pyridine and 70 ml of dimethylacetamide (dmAc) in 200 ml of four Inside the flask, stir at 60t for 2 hours to obtain a transparent solution. Stir at room temperature for 7 hours. Next, the flask was cooled with ice, and 857 g (0.072 mol) of sulfinic acid was added dropwise over 10 minutes. To this, it was further stirred at room temperature for 1 hour to obtain radon-containing gas. (2) Manufacturing of polyimide precursors: One 0.03 mole of the diamine shown in Table 3, 5.06 g (0.064 mole) of pipiridine and 50 ml of DMAc were placed in another 200. In a four-necked milliliter flask. When the mixture in the flask is cooled with ice (cooled to a temperature not higher than 10t) and stirred, (1) the radon solution prepared is added dropwise to it over 1 hour. Then the mixture is further processed in Stir at room temperature for 1 hour, then pour into 1 liter of water. The polymer in Shen Dian was then taken out by filtration, washed twice and dehydrated under vacuum. The obtained polymer powder was dissolved in γ-butyrolactone (γ-BL) to obtain a controlled viscosity. 80 poises. In this way, a polyimide precursor solution (ραε_3, 4) was prepared. The viscosity was measured with an E-type viscometer (EHD model from Toki Industry Co., Ltd.). ----- Order --------- Line l · (Please read the precautions on the back before filling this page} This paper size applies to China National Standard (CNS) A4 (210 χ 297 mm) 36 311836 1225969 A7 B7 V. Description of the invention (38) Liquid development. Further heating at 350 ° C for 60 minutes to obtain polyimide resin pattern. (Please read first Note on the back? Please fill in this page again.) Part of the polyimide stress relief pattern was tested by potassium bromide_infrared spectroscopy, and specific imidate absorption was obtained at about 1780 cm-1. Manufacturing Examples 5 to 1 〇 The light transmittance of the prepared polyimide precursors (pAE) to pAE_6, the residual stress of the polyimide film on the silicon wafer, and the resolution of the polyimide stress relief pattern were measured according to the following methods and The information is shown in Table 4. The transmittance was measured as follows: a resin solution of each of the polyimide precursors (PAE-1 to PAE-6) was applied to the substrate by spin coating, and dried at 85 ° C for 2 minutes and then Dry at 105 ° C for 2 minutes. The transmittance of the obtained film (thickness: 10 micrometers) was measured using spectrophotometry. Residual stress was measured as follows: On a 5-inch silicon wafer, a polyimide film with a thickness of 10 microns was formed from various photosensitive resin compositions. The residual stress was measured using a thin film stress meter (Tanker FLX-2320 model) Measure. Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs. To measure the resolution of the photosensitive resin composition, a through-hole test pattern is formed from each composition. The minimum size of the visible through-hole formed indicates the resolution of the resin composition to be tested. The stress relief patterns formed in Examples 5 to 8 and Comparative Examples 1 and 2 were heated at 350 ° C for 60 minutes under a nitrogen atmosphere to obtain polyimide patterns. The polyimide patterns obtained from the stress relief patterns of Examples 5 to 8 had good trapezoidal side views in cross section and reflected the good rectangular side views of the original stress relief pattern with high resolution. However, the cross-section of the polyimide pattern obtained from the stress relief patterns of Comparative Examples 1 and 2 is an unfavorable inverted trapezoidal side view, which reflects that this paper scale is applicable to the Chinese National Standard (CNS) A4 specification (21 × 297 mm). (%) 38 311836 1225969 A7 _B7 V. Description of the invention (39) The disadvantageous inverted trapezoidal side view of the original stress relief pattern has low resolution. Table 3 Weight average molecular weight (Mw) of acid component diamine component polyfluorene imide precursor Production Example 5 MTXDA DDE-A PAE-1 41000 Production Example 6 SIXDA DDE-A PAE-2 33000 Production Example 7 MMXDA 2,2-HAB PAE-3 27000 Manufacturing Example 8 6FCDA 3,3-HAB PAE-4 30000 Manufacturing Example 9 s-BPDA DDE-A PAE-5 36000 Manufacturing Example 10 PMDA DDE-A PAE-6 32000 MTXDA:

(請先閱讀背面之注意事項再填寫本頁) SIXDA:(Please read the notes on the back before filling this page) SIXDA:

MMXDA: 經濟部智慧財產局員工消費合作社印製 6FCDA:MMXDA: Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs 6FCDA:

O s-BPDA :聯苯四羧酸二酐 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 39 311836 1225969 A7 B7 五、發明說明(4〇 ) PMDA ··均苯四酸二針 DDE-A:O s-BPDA: Biphenyltetracarboxylic dianhydride The paper size is applicable to Chinese National Standard (CNS) A4 (210 X 297 mm) 39 311836 1225969 A7 B7 V. Description of the invention (4〇) PMDA Acid two needle DDE-A:

2,2·ΗΑΒ:2,2 · ΗΑΒ:

3,3-ΗΑΒ:3,3-ΗΑΒ:

(請先閱讀背面之注意事項再填寫本頁) 表4 前驅物之i線 透射比(°/〇) 實例5 50 tm 6 35 實例7 — 一 20 實例8 15 [較例1 20 ^2 — — 0.1 1 剩餘應力 (百萬巴斯卡) 經濟部智慧財產局員工消費合作社印製 解析度 (微米) 本發明經由提供前述優異的感光性樹脂組成物可解決 先前技術未能解決的問題。特別本發明組成物之芳族聚醯 亞胺前驅物具有高i線透射比,經由醯亞胺化反應由該前 驅物衍生而得的聚醯亞胺樹脂具有低應力。此外前驅物薄 膜具有良好耐熱性、高度敏感性及高解析度等優點。 本發明之感光性樹脂組成物可使用對環保不具有不_ 影響的水性鹼溶液顯像。 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐)(Please read the precautions on the back before filling this page) Table 4 i-line transmittance of the precursor (° / 〇) Example 5 50 tm 6 35 Example 7 — One 20 Example 8 15 [Comparative example 1 20 ^ 2 — — 0.1 1 Residual stress (million basca) Printed resolution (micron) by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs The present invention can solve the problems that were not solved by the prior art by providing the aforementioned excellent photosensitive resin composition. In particular, the aromatic polyfluorene imide precursor of the composition of the present invention has a high i-ray transmittance, and the polyfluorene imine resin derived from the precursor through the fluorene imidization reaction has low stress. In addition, the precursor film has the advantages of good heat resistance, high sensitivity, and high resolution. The photosensitive resin composition of the present invention can be developed using an aqueous alkali solution that has no effect on the environment. This paper size applies to China National Standard (CNS) A4 (210 X 297 mm)

Claims (1)

擇驾外修正 Η3 二_充 第89119305號專利申請案 申請專利範圍修正本 (93年9月24曰) 1_ 一種感光性樹脂組成物’包含一種芳族聚醯亞胺前驅 物,以及光聚合引發劑,當該組成物為負型感光性組成 物時,或者可於光線中產生酸之化合物,當該组成物為 正型感光性組成物時,其中厚10微米之前驅物層具有 於365毫微米之光透射比至少1%,以及經由醯亞胺化 環閉合而由聚醯亞胺組成物製成且沈積於矽基材上之 厚10微米的聚醯亞胺薄膜可獲得剩餘應力至多25百萬 巴斯卡,其中該芳族聚醯亞胺前驅物具有通式(Γ)之結 構單位: Qi /Q2 . Ql /(^ Q匕Q2Optional external amendment Η3 Ⅱ-Patent No. 89119305 Patent Application Amendment to Patent Scope (September 24, 1993) 1_ A photosensitive resin composition 'comprising an aromatic polyimide precursor and photopolymerization initiation When the composition is a negative photosensitive composition, or a compound capable of generating an acid in light, when the composition is a positive photosensitive composition, the precursor layer having a thickness of 10 microns has a thickness of 365 millimeters. A light transmittance of at least 1% in micrometers, and a polyimide film of 10 micrometers in thickness made of a polyimide composition and deposited on a silicon substrate via a closed loop of the imidized ring can obtain a residual stress of up to 25 Million Baska, wherein the aromatic polyfluorene imide precursor has the structural unit of the general formula (Γ): Qi / Q2. Ql / (^ QdQ2 其中Q1及Q2分別表示氫或低級烷基,該低級 烷基可為i原子所取代;且X表示C或Si。 經濟部中央標準局員工福利委員會印製 2·如申請專利範圍第1項之感光性樹脂組成物,其中於波 長365毫微米之光透射比至少為5%。 3·如申請專利範圍第1項之感光性樹脂組成物,其中芳族 聚醢亞胺前驅物可溶於水性驗溶液。 4·如申請專利範圍第1項之感光性樹脂組成物,其中該感 光性樹脂組成物為負型感光性樹脂組成物。 5·如申請專利範圍第1項之感光性樹脂組成物,其中該感 1 (修正本)311836 本紙張尺度適用中國國家標準(CNS) Α4規格(210X297公楚) 1225969 H3 光性树脂組成物為正型感光性樹脂組成物。 6 · —種感光性樹脂組成物,包含一種芳族聚酿亞胺前驅 物,其中該芳族聚醯亞胺前驅物具有通式(I,)之結構單位:Q1 and Q2 each represent hydrogen or a lower alkyl group, and the lower alkyl group may be substituted by an i atom; and X represents C or Si. Printed by the Staff Welfare Committee of the Central Bureau of Standards of the Ministry of Economic Affairs 2. If the photosensitive resin composition of the first scope of the patent application, the light transmittance at a wavelength of 365 nm is at least 5%. 3. The photosensitive resin composition according to item 1 of the application, wherein the aromatic polyimide precursor is soluble in an aqueous test solution. 4. The photosensitive resin composition according to item 1 of the patent application scope, wherein the photosensitive resin composition is a negative photosensitive resin composition. 5. If the photosensitive resin composition of item 1 in the patent application scope, the sense 1 (revised version) 311836 This paper size is applicable to China National Standard (CNS) A4 specification (210X297) Chu 1225969 H3 The photosensitive resin composition is Positive type photosensitive resin composition. 6. A photosensitive resin composition comprising an aromatic polyimide precursor, wherein the aromatic polyimide precursor has a structural unit of the general formula (I,): 其中Q1及Q2分別表示氫或C!_6低級烷基,該低級 烷基可為#原子所取代;且X表示C或Si。 7·如申請專利範圍第6項之感光性樹脂組成物,其中具有 式(I)之結構式之芳族聚醯亞胺前驅物具有通式(Π)之重 複結構單位:Q1 and Q2 each represent hydrogen or a C! _6 lower alkyl group, and the lower alkyl group may be substituted by a # atom; and X represents C or Si. 7. The photosensitive resin composition according to item 6 of the application, wherein the aromatic polyfluorene imine precursor having the structural formula of the formula (I) has a repeating structural unit of the general formula (Π): 經濟部中央標準局員工福利委員會印製 其中Q及Q2分別表示氫或Cl_6低級烷基,該低級 烧基可為鹵原子所取代;X表示C或si; R1及R2各自 分別表示羥基或一價有機基;Z表示二價芳族基。 8-如申請專利範圍第7項之感光性樹脂组成物,其中式(π) 之R1或R2為含有感光基之一價有機基。 9·如申請專利範圍第8項之感光性樹脂組成物,其中式(π) 之R1或R2為下式基: -〇n+hr4r5-r6 -Ο-R6 或 本紙張尺度適用中國國家標準(CNS) A4規格(210X297公釐) 2 (修正本)311836 1225969 -NH-R6 式中,R4及R5各自合i 一 L一枝 , 目刀別表不烴基,及R6表示一 價有機基。 如申明專利範圍第9項之感光性樹脂組成物,其中V 為含有碳-碳未飽和雙鍵之基團。 〃 如申請專利範圍第9項之感光性樹脂组成物其中式⑼ 之R1或R2為下式基·· -ctn+hr4r5-r6 式中,R4及R5各自分別表示烴基,及R6表示含 有碳·碳未飽和雙鍵之一價有機基。 12.如申請專利範圍第7項之感光性樹脂組成物,其中式(ιι) 之R1或R2為: -0_R6 基, 式中’R表示一價有機基。 13·如申請專利範圍第項之感光性樹脂組成物,其中芳 族聚醯亞胺前驅物可溶於水性驗溶液。 經濟部中央標準局員工福利委員會印製 14. 如申請專利範圍第13項之感光性樹脂組成物,其中於 式(II)之Z為含有羧基或酚系羥基之基團。 15. 如申請專利範圍第14項之感光性樹脂組成物,其中式 (II)之Z為通式(in)之基團:Printed by the Staff Welfare Committee of the Central Bureau of Standards, Ministry of Economic Affairs, where Q and Q2 represent hydrogen or Cl_6 lower alkyl group, respectively, and the lower alkyl group may be replaced by a halogen atom; X represents C or si; R1 and R2 each represent hydroxyl or monovalent Organic group; Z represents a divalent aromatic group. 8- The photosensitive resin composition according to item 7 of the scope of patent application, wherein R1 or R2 of the formula (π) is a monovalent organic group containing a photosensitive group. 9. If the photosensitive resin composition of item 8 of the patent application scope, wherein R1 or R2 of the formula (π) is the base of the following formula: -〇n + hr4r5-r6 -〇-R6 or this paper size applies Chinese national standards ( CNS) A4 specification (210X297 mm) 2 (Revised version) 311836 1225969 -NH-R6 In the formula, R4 and R5 are each i-L branch, and the mesh is not a hydrocarbon group, and R6 represents a monovalent organic group. For example, the photosensitive resin composition of claim 9 of the patent scope, wherein V is a group containing a carbon-carbon unsaturated double bond. 〃 For example, the photosensitive resin composition in the ninth scope of the patent application, wherein R1 or R2 of formula 为 is the following formula ... -ctn + hr4r5-r6 where R4 and R5 each represent a hydrocarbon group, and R6 represents a carbon content. Carbon unsaturated double bond is a monovalent organic group. 12. The photosensitive resin composition according to item 7 of the scope of patent application, wherein R1 or R2 of the formula (ιι) is: a -0_R6 group, where 'R represents a monovalent organic group. 13. The photosensitive resin composition according to the scope of the patent application, wherein the aromatic polyimide precursor is soluble in an aqueous test solution. Printed by the Staff Welfare Committee of the Central Bureau of Standards of the Ministry of Economic Affairs. 14. If the photosensitive resin composition of the scope of patent application No. 13 is used, Z in the formula (II) is a group containing a carboxyl group or a phenolic hydroxyl group. 15. For example, the photosensitive resin composition of the scope of application for patent No. 14, wherein Z of the formula (II) is a group of the general formula (in): R1 R1 (III) 3 (修正本)311836 本紙張尺度適用中國國家標準(CNS) A4規格(210X297公釐) 1225969 式中,z’表示單鍵,〇, ch2,s或S02 ; R11至R1; 各自分別表示h,COOH,oh,含丨至1〇個碳原子之 烷基:含1至1〇個碳原子之氟院基,含^ 1〇個碳原 子之氟烷氧基或齒原子,以及其中選擇性地Rlls Rls 中之至少一者為COOH或OH。 16.如申請專利範園第a 15項中任—項之感光性樹脂組 成物,其進一步含有光聚合引發劑,及其具有負型感光 特性。 17·如申睛專利範圍第6 i 15項中任—項之感光性樹脂組 成物,其進一步含有可於光線中產生酸之化合物,及其 具有正型感光特性。 18· —種感光性樹脂組成物,包含芳族聚醯亞胺前驅物,其 中由該樹脂組成物藉醯亞胺化環閉合反應製備且沈積 於石夕基材上的厚1〇微米聚醯亞胺薄膜,具有於波長365 毫微米之光透射比至少為1%及殘餘應力至多25百萬 巴斯卡’其中芳族聚醯亞胺前驅物包括通式(Γ)重複單 位: 經濟部中央標準局員工福利委員會印製R1 R1 (III) 3 (revised version) 311836 This paper size applies Chinese National Standard (CNS) A4 specification (210X297 mm) 1225969 where z 'represents a single bond, ch, ch2, s or S02; R11 to R1; Each represents h, COOH, oh, an alkyl group containing from 1 to 10 carbon atoms: a fluorine radical containing 1 to 10 carbon atoms, a fluoroalkoxy group or a tooth atom containing ^ 10 carbon atoms, And wherein at least one of the Rlls Rls is COOH or OH. 16. The photosensitive resin composition according to any one of item a 15 of the patent application park, which further contains a photopolymerization initiator and has negative photosensitive characteristics. 17. The photosensitive resin composition as described in any one of items 6 to 15 in the patent scope of Shenyan, which further contains a compound capable of generating an acid in light, and has a positive photosensitive property. 18 · —A photosensitive resin composition comprising an aromatic polyfluorene imine precursor, wherein the resin composition is prepared by a polyimide ring closure reaction and is deposited on a stone evening substrate with a thickness of 10 micrometers. Imine film with a light transmittance of at least 1% at a wavelength of 365 nanometers and a residual stress of at most 25 million Baska 'wherein the aromatic polyfluorene imide precursor includes the formula (Γ) repeating unit: Central Ministry of Economic Affairs Printed by Standards Bureau Staff Welfare Committee 或 Q:xQ2 (I 其中Q1及Q2分別表示氫或Cl_6低級烷基,該低級 烧基可為齒原子所取代;且X表示C或Si。 19.一種形成圖案之方法,包含施用感光性樹脂組成物於基 材上以及乾燥’曝光該組成物,顯像該組成物,及加熱 本紙張尺度it财S @家標格(210χ29ϋ 4 (修正本)311836 1225969 H3 该組成物’其中該組成物包含感光性樹脂組成物,包含 芳族聚醯亞胺前驅物’其中由該樹脂組成物藉醯亞胺化 環閉合反應製備且沈積於石夕基材上的厚10微米聚醯亞 胺前驅物薄膜,具有於波長365毫微米之光透射比至少 為1 %及殘餘應力至多25百萬巴斯卡,且該芳族聚醯亞 胺前驅物具有通式(Γ)之結構單位:Or Q: xQ2 (I, where Q1 and Q2 represent hydrogen or Cl_6 lower alkyl group, respectively, the lower alkyl group may be substituted by a tooth atom; and X represents C or Si. 19. A method for forming a pattern, comprising applying a photosensitive resin The composition is dried on the substrate and the composition is exposed to light, the composition is developed, and the paper is heated on the paper scale @ 家 标 格 (210χ29ϋ 4 (revised version) 311836 1225969 H3 The composition 'wherein the composition Containing a photosensitive resin composition, including an aromatic polyfluorene imine precursor 'wherein the resin composition is prepared by a fluorinated ring closure reaction and is deposited on a Shixi substrate with a thickness of 10 micrometers of polyfluorene imide precursor Thin film with a light transmittance of at least 1% at a wavelength of 365 nanometers and a residual stress of at most 25 million Baska, and the aromatic polyfluorene imide precursor has a structural unit of the general formula (Γ): 或 V2 (I ) 經濟部中央標準局員工福利委員會印製 其中Q1及Q2分別表示氫或Cu低級烷基,該低級 燒基可為画原子所取代;且X表示C或Si。 2〇·如申請專利範圍第19項之方法,其中丨線係用於曝光 步驟作為光源。 21 ·如申請專利範圍第19或20項之方法,其中基材為具有 直徑至少12吋的矽晶圓。 22·—種電子組件,具有根據申請專利範圍第19項之方法 圖案化之層。 23·如申請專利範圍第22項之電子組件,其中該組件為半 導體裴置,及圖案化層為表面保護膜。 24·如申凊專利範圍第22項之電子組件,其中圖案化層為 層間絕緣膜。Or V2 (I) Printed by the Staff Welfare Committee of the Central Standards Bureau of the Ministry of Economics, where Q1 and Q2 represent hydrogen or Cu lower alkyl, respectively, and the lower alkyl group may be replaced by a drawing atom; and X represents C or Si. 20. The method according to item 19 of the patent application, wherein the line is used as the light source in the exposure step. 21 · The method according to item 19 or 20 of the patent application scope, wherein the substrate is a silicon wafer having a diameter of at least 12 inches. 22 · —An electronic component having a patterned layer according to the method of claim 19 of the scope of patent application. 23. The electronic component as claimed in claim 22, wherein the component is a semiconductor device, and the patterned layer is a surface protective film. 24. The electronic component of claim 22, wherein the patterned layer is an interlayer insulating film. A4規格(210X297公釐)A4 specifications (210X297 mm)
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Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001214056A (en) * 2000-01-31 2001-08-07 Hitachi Chemical Dupont Microsystems Ltd Positive photosensitive polyimide precursor composition, method for producing pattern and electronic part using the same
JP3773845B2 (en) * 2000-12-29 2006-05-10 三星電子株式会社 Positive photosensitive polyimide precursor and composition containing the same
CN1245665C (en) * 2001-09-26 2006-03-15 日产化学工业株式会社 Positive photosensitive polyimide resin composition
JP2007056196A (en) * 2005-08-26 2007-03-08 Tokyo Institute Of Technology Polyimide precursor composition, method for producing polyimide film and semiconductor device
US7745516B2 (en) * 2005-10-12 2010-06-29 E. I. Du Pont De Nemours And Company Composition of polyimide and sterically-hindered hydrophobic epoxy
ATE556118T1 (en) * 2006-03-29 2012-05-15 Sumitomo Bakelite Co RESIN COMPOSITION, PAINT, RESIN FILM AND SEMICONDUCTOR DEVICE WITH THE RESIN FILM
JP2008013646A (en) * 2006-07-05 2008-01-24 Fujifilm Corp Ink composition, inkjet recording method, printed matter, manufacturing method for planographic printing plate and planographic printing plate
JP2009227953A (en) * 2008-02-25 2009-10-08 Ube Ind Ltd Method for producing molding improved in solvent resistance
JP5707136B2 (en) * 2008-03-07 2015-04-22 エルジー・ケム・リミテッド Positive photosensitive polyimide composition
KR101660827B1 (en) * 2009-04-14 2016-09-28 닛산 가가쿠 고교 가부시키 가이샤 Photosensitive polyester composition for use in forming thermally cured film
US20120190802A1 (en) * 2011-01-26 2012-07-26 Nexolve Corporation Polyimide polymer from non-stoichiometric components
KR20130017664A (en) * 2011-08-11 2013-02-20 삼성전자주식회사 Methods uctor devices and methods of manufacturing the same
JP6436081B2 (en) * 2013-07-16 2018-12-12 日立化成株式会社 Photosensitive resin composition, film adhesive, adhesive sheet, adhesive pattern, semiconductor wafer with adhesive layer, and semiconductor device
US10019116B2 (en) * 2013-08-30 2018-07-10 Panasonic Intellectual Property Management Co., Ltd. Display device with adhesive layer and resin layer and manufacturing method therefor
US9519221B2 (en) * 2014-01-13 2016-12-13 Applied Materials, Inc. Method for microwave processing of photosensitive polyimides
JP2015135869A (en) * 2014-01-16 2015-07-27 株式会社テラプローブ Semiconductor device, and method of manufacturing semiconductor device
JP7088636B2 (en) * 2017-07-11 2022-06-21 旭化成株式会社 Semiconductor devices and their manufacturing methods
JP6810677B2 (en) * 2017-12-05 2021-01-06 信越化学工業株式会社 New tetracarboxylic dianhydride, polyimide resin and its manufacturing method, photosensitive resin composition, pattern forming method and cured film forming method, interlayer insulating film, surface protective film, electronic parts
CN111333837B (en) * 2020-01-07 2022-11-25 上海极紫科技有限公司 Positive photosensitive polyimide resin and preparation method thereof

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2180692B1 (en) 1972-04-18 1976-06-11 Metallgesellschaft Ag
JPS54109828A (en) 1978-02-17 1979-08-28 Asahi Chemical Ind Heat resistant photoresist composition
JPS5624343A (en) 1979-08-06 1981-03-07 Hitachi Ltd Photosensitive heat resistant polymer composition
US4515887A (en) 1983-08-29 1985-05-07 General Electric Company Photopatternable dielectric compositions, method for making and use
US4698295A (en) * 1984-11-16 1987-10-06 Ciba-Geigy Corporation Polyimides, a process for their preparation and their use, and tetracarboxylic acids and tetracarboxylic acid derivatives
CN1004490B (en) 1985-04-27 1989-06-14 旭化成工业株式会社 Solidable component
US4847359A (en) * 1986-06-30 1989-07-11 Ciba-Geigy Corporation Diamino-9,10-dihydroanthracenes and polyamide acid (esters) and polyimides derived therefrom
EP0321398B1 (en) * 1987-12-15 1994-08-17 Ciba-Geigy Ag Autophotocrosslinkable copolyimides and compositions of polyimides
DE68919453T2 (en) 1988-08-24 1995-03-30 Asahi Chemical Ind Precursors for a low thermal stress polymide and photopolymerizable composition containing a polymide precursor.
EP0416468A1 (en) * 1989-09-04 1991-03-13 Kabushiki Kaisha Toshiba Air-cooled motor for use in vehicles
CA2040994A1 (en) * 1990-05-08 1991-11-09 David D. Ngo Photoimageable polyimide coating
US5097000A (en) * 1990-05-23 1992-03-17 E. I. Du Pont De Nemours And Company 9,9-bis (perfluoroalkyl) xanthene, 9-aryl-9-perfluoroalkylxanthene, monomers and polymers derived therefrom
EP0520236A2 (en) 1991-06-25 1992-12-30 E.I. Du Pont De Nemours And Company Polyimides based on 9-aryl-9(perfluoroalkyl)-xanthene-2,3,6,7-dianhydride or 9,9'-bis(perfluoroalkyl)xanthene-2,3,6,7-dianhydride and benzidine derivatives
JPH06234916A (en) * 1993-02-09 1994-08-23 Central Glass Co Ltd Low-stress polyimide composition and precursor composition solution
JP3324250B2 (en) * 1993-02-25 2002-09-17 チッソ株式会社 Photosensitive resin composition
US5399655A (en) * 1993-10-29 1995-03-21 E. I. Du Pont De Nemours And Company Positive-working photodefinable polyimide precursors
DE69516035T2 (en) * 1994-05-23 2000-08-31 Sumitomo Electric Industries Method for producing a semiconductor covered with hard material
US5777068A (en) 1994-09-13 1998-07-07 Nippon Zeon Co., Ltd. Photosensitive polyimide resin composition
JP3168909B2 (en) 1995-04-13 2001-05-21 日立化成工業株式会社 Photosensitive resin composition, method for producing polyimide pattern, and method for producing semiconductor element
US6071667A (en) * 1995-04-13 2000-06-06 Hitachi Chemical Co., Ltd. Photosensitive resin composition containing a photosensitive polyamide resin
JPH10301279A (en) * 1997-04-22 1998-11-13 Hitachi Chem Co Ltd Photosensitive resin composition, production method of polyimide pattern and production method of semiconductor element

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US6342333B1 (en) 2002-01-29
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EP1087263A2 (en) 2001-03-28
JP2001147529A (en) 2001-05-29
EP1087263A3 (en) 2001-05-23
US6773866B2 (en) 2004-08-10
US20020098444A1 (en) 2002-07-25
KR100737206B1 (en) 2007-07-09
EP1087263B1 (en) 2012-07-04

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