TWD225702S - Stand accessory for test and measurement instrument - Google Patents

Stand accessory for test and measurement instrument Download PDF

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Publication number
TWD225702S
TWD225702S TW111305708F TW111305708F TWD225702S TW D225702 S TWD225702 S TW D225702S TW 111305708 F TW111305708 F TW 111305708F TW 111305708 F TW111305708 F TW 111305708F TW D225702 S TWD225702 S TW D225702S
Authority
TW
Taiwan
Prior art keywords
test
measurement instrument
testing
stand accessory
measuring instruments
Prior art date
Application number
TW111305708F
Other languages
Chinese (zh)
Inventor
克里斯 瓦倫廷
尼爾 克雷頓
大衛 艾迪加
馬克 蓋斯福
泰勒 辛
布萊恩 霍倫伯格
史提夫 萊茵霍德
普拉尚 托塔
薩蒂亞 惠特洛克
Original Assignee
美商泰克特洛尼克斯公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 美商泰克特洛尼克斯公司 filed Critical 美商泰克特洛尼克斯公司
Publication of TWD225702S publication Critical patent/TWD225702S/en

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Abstract

【物品用途】;本設計的物品是測試及測量儀器用支架配件，該測試及測量儀器乃應用於測試及測量儀器領域中的電訊號測試及測量。;【設計說明】;(無)[Use of the item]; The item designed in this design is a bracket accessory for testing and measuring instruments. The testing and measuring instruments are used in electrical signal testing and measurement in the field of testing and measuring instruments. ;[Design description];(none)

Description

測試及測量儀器用支架配件Bracket accessories for test and measurement instruments

本設計的物品是測試及測量儀器用支架配件，該測試及測量儀器乃應用於測試及測量儀器領域中的電訊號測試及測量。The article of this design is a bracket accessory for a testing and measuring instrument, and the testing and measuring instrument is used for testing and measuring electrical signals in the field of testing and measuring instruments.

(無)(none)

TW111305708F 2021-09-29 2022-03-29 Stand accessory for test and measurement instrument TWD225702S (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US29/809,745 2021-09-29
US29/809,745 USD1003181S1 (en) 2021-09-29 2021-09-29 Test and measurement instrument and accessories

Publications (1)

Publication Number Publication Date
TWD225702S true TWD225702S (en) 2023-06-01

Family

ID=84227967

Family Applications (5)

Application Number Title Priority Date Filing Date
TW111305707F TWD225701S (en) 2021-09-29 2022-03-29 Test and measurement instrument with stand and battery
TW111301482F TWD224179S (en) 2021-09-29 2022-03-29 Test and measurement instrument
TW111305710F TWD225704S (en) 2021-09-29 2022-03-29 Test and measurement instrument
TW111305709F TWD225703S (en) 2021-09-29 2022-03-29 Battery accessory for test and measurement instrument
TW111305708F TWD225702S (en) 2021-09-29 2022-03-29 Stand accessory for test and measurement instrument

Family Applications Before (4)

Application Number Title Priority Date Filing Date
TW111305707F TWD225701S (en) 2021-09-29 2022-03-29 Test and measurement instrument with stand and battery
TW111301482F TWD224179S (en) 2021-09-29 2022-03-29 Test and measurement instrument
TW111305710F TWD225704S (en) 2021-09-29 2022-03-29 Test and measurement instrument
TW111305709F TWD225703S (en) 2021-09-29 2022-03-29 Battery accessory for test and measurement instrument

Country Status (3)

Country Link
US (1) USD1003181S1 (en)
JP (5) JP1731016S (en)
TW (5) TWD225701S (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109514396A (en) * 2019-01-17 2019-03-26 滦南县丰田五金农具制造有限公司 A kind of quincunx drum curved surface polishing machine and its polishing method
USD1006660S1 (en) * 2021-03-04 2023-12-05 Fluke Corporation Power quality analyzer

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD865489S1 (en) 2017-04-14 2019-11-05 Fluke Electronics Corporation Combined magnetic hanger and tilt stand for a portable test tool

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD340701S (en) * 1991-07-05 1993-10-26 Canon Kabushiki Kaisha Input and output terminal for electronic computers
USD345346S (en) * 1991-10-18 1994-03-22 International Business Machines Corp. Pen-based computer
USD354743S (en) * 1993-04-02 1995-01-24 Vieira Osvaldo B Microprocessor controlled road map
USD356548S (en) * 1993-05-27 1995-03-21 International Business Machines Corp. Enclosure of a hand held computer
USD355170S (en) * 1993-06-24 1995-02-07 Sharp Kabushiki Kaisha Computer
USD386099S (en) * 1996-06-24 1997-11-11 Machinexpert, LLC Portable machinery analyzer
US6437552B1 (en) * 2000-07-31 2002-08-20 Lecroy Corporation Automatic probe identification system
US7463015B2 (en) * 2006-12-29 2008-12-09 Tektronix, Inc. Time shifting signal acquisition probe system
USD742371S1 (en) * 2013-07-29 2015-11-03 Raytheon Company Mounted computer design
JP1553629S (en) * 2015-05-26 2016-07-11
JP1580182S (en) * 2016-10-28 2017-07-03
TWD201506S (en) 2018-05-15 2019-12-21 日商國際計測器股份有限公&#x5 Testing instrument (steering testing system)
USD898735S1 (en) * 2018-08-10 2020-10-13 Shenzhen Ugee Technology Co., Ltd Pen display
USD909899S1 (en) 2019-01-25 2021-02-09 Tektronix, Inc. Housing for a test and measurement instrument
JP1663342S (en) 2019-06-12 2020-07-13

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD865489S1 (en) 2017-04-14 2019-11-05 Fluke Electronics Corporation Combined magnetic hanger and tilt stand for a portable test tool

Also Published As

Publication number Publication date
JP1731016S (en) 2022-11-30
JP1743857S (en) 2023-05-11
JP1743919S (en) 2023-05-11
TWD224179S (en) 2023-03-11
TWD225701S (en) 2023-06-01
TWD225704S (en) 2023-06-01
JP1731015S (en) 2022-11-30
JP1731014S (en) 2022-11-30
TWD225703S (en) 2023-06-01
USD1003181S1 (en) 2023-10-31

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