TWD224736S - 用於測試積體電路的合規接地塊 - Google Patents

用於測試積體電路的合規接地塊 Download PDF

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Publication number
TWD224736S
TWD224736S TW111303418F TW111303418F TWD224736S TW D224736 S TWD224736 S TW D224736S TW 111303418 F TW111303418 F TW 111303418F TW 111303418 F TW111303418 F TW 111303418F TW D224736 S TWD224736 S TW D224736S
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TW
Taiwan
Prior art keywords
integrated circuits
testing integrated
ground block
compliant ground
design
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Application number
TW111303418F
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English (en)
Inventor
特賴伯格 瓦爾茨
喬亞爾 帕特
弗利格曼 萊斯利
Original Assignee
美商瓊斯科技國際公司
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Application filed by 美商瓊斯科技國際公司 filed Critical 美商瓊斯科技國際公司
Publication of TWD224736S publication Critical patent/TWD224736S/zh

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Abstract

【物品用途】;本設計是一種用於測試積體電路的合規接地塊。;【設計說明】;本設計是接觸針板陣列的一單一針板。

Description

用於測試積體電路的合規接地塊
本設計是一種用於測試積體電路的合規接地塊。
本設計是接觸針板陣列的一單一針板。
TW111303418F 2021-01-19 2021-07-19 用於測試積體電路的合規接地塊 TWD224736S (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US202129766911 2021-01-19
US29/766,911 2021-01-19

Publications (1)

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TWD224736S true TWD224736S (zh) 2023-04-11

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TW111303418F TWD224736S (zh) 2021-01-19 2021-07-19 用於測試積體電路的合規接地塊
TW111303419F TWD223708S (zh) 2021-01-19 2021-07-19 用於測試積體電路的合規接地塊
TW110303723F TWD223374S (zh) 2021-01-19 2021-07-19 用于測試積體電路的合規接地塊

Family Applications After (2)

Application Number Title Priority Date Filing Date
TW111303419F TWD223708S (zh) 2021-01-19 2021-07-19 用於測試積體電路的合規接地塊
TW110303723F TWD223374S (zh) 2021-01-19 2021-07-19 用于測試積體電路的合規接地塊

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TW (3) TWD224736S (zh)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWD205153S (zh) 2019-08-14 2020-06-11 浩暘工業股份有限公司 連接器端子

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWD205153S (zh) 2019-08-14 2020-06-11 浩暘工業股份有限公司 連接器端子

Also Published As

Publication number Publication date
TWD223374S (zh) 2023-02-01
TWD223708S (zh) 2023-02-11

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