TWD184865S - 導通檢查用探針接腳 - Google Patents
導通檢查用探針接腳Info
- Publication number
- TWD184865S TWD184865S TW105307491F TW105307491F TWD184865S TW D184865 S TWD184865 S TW D184865S TW 105307491 F TW105307491 F TW 105307491F TW 105307491 F TW105307491 F TW 105307491F TW D184865 S TWD184865 S TW D184865S
- Authority
- TW
- Taiwan
- Prior art keywords
- substrate
- continuity check
- article
- terminal
- design
- Prior art date
Links
- 239000000523 sample Substances 0.000 title abstract 2
- 239000000758 substrate Substances 0.000 abstract 2
- 238000005516 engineering process Methods 0.000 abstract 1
- 238000007689 inspection Methods 0.000 abstract 1
- 230000000007 visual effect Effects 0.000 abstract 1
Abstract
【物品用途】;本案設計之物品係安裝於IC插座之殼體，使用於基板對基板接合連接器等之導通檢查者。如「顯示使用狀態之參考圖」所示，本物品之前端部之左右兩端係於藉由IC插座之移動而與作為檢查對象之基板對基板接合連接器等之端子接觸後，於端子表面滑動移動而去除附著於端子表面之污垢，直至前端部中央之2個突起部與端子接觸為止。;【設計說明】;後視圖係與前視圖左右對稱而顯示。 本案設計係新穎獨特之樣式，藉由獨特地設計導通檢查用探針接腳，可顯現出先前技藝所未有之視覺效果。
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JPD2016-12510F JP1573405S (zh) | 2016-06-10 | 2016-06-10 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TWD184865S true TWD184865S (zh) | 2017-08-11 |
Family
ID=58472569
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW105307491F TWD184865S (zh) | 2016-06-10 | 2016-12-09 | 導通檢查用探針接腳 |
Country Status (2)
| Country | Link |
|---|---|
| JP (1) | JP1573405S (zh) |
| TW (1) | TWD184865S (zh) |
-
2016
- 2016-06-10 JP JPD2016-12510F patent/JP1573405S/ja active Active
- 2016-12-09 TW TW105307491F patent/TWD184865S/zh unknown
Also Published As
| Publication number | Publication date |
|---|---|
| JP1573405S (zh) | 2017-04-10 |
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