TWD169174S - Thermogravimetric measuring device - Google Patents

Thermogravimetric measuring device

Info

Publication number
TWD169174S
TWD169174S TW103303364F TW103303364F TWD169174S TW D169174 S TWD169174 S TW D169174S TW 103303364 F TW103303364 F TW 103303364F TW 103303364 F TW103303364 F TW 103303364F TW D169174 S TWD169174 S TW D169174S
Authority
TW
Taiwan
Prior art keywords
sample
furnace tube
measuring device
furnace
heated
Prior art date
Application number
TW103303364F
Other languages
Chinese (zh)
Inventor
Hirohito Fujiwara
Original Assignee
Hitachi High Tech Science Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi High Tech Science Corp filed Critical Hitachi High Tech Science Corp
Publication of TWD169174S publication Critical patent/TWD169174S/en

Links

Abstract

【物品用途】;本設計的物品是熱重量測定裝置，為一種測定對象試料進行加熱時的重量變化之熱重量測定裝置(熱分析裝置)。;【設計說明】;使用時，將正面右前方的部分整個往前方滑動的話，由玻璃等製成的透明爐管及其周圍的加熱爐會成一體地前進，位於爐管內的天秤臂與安裝在其前端的試料夾具會在原本的位置露出來。將試料載置在已露出的試料夾具，使爐管與加熱爐後退，將天秤臂與試料夾具收容在爐管內，加熱爐管，並且測定試料的重量變化。加熱爐的上面中央部是形成圓形開口，在測定之際，從開口透過透明的爐管，來觀察加熱中的試料。[Use of article] The article designed in this design is a thermogravimetric measuring device, which is a thermogravimetric measuring device (thermal analysis device) that measures the weight change of the subject sample when it is heated. ;[Design Description];When in use, if the entire right front part of the front is slid forward, the transparent furnace tube made of glass and the surrounding heating furnace will move forward as one, and the scale arm located in the furnace tube The sample clamp installed on the front end will be exposed at its original position. The sample is placed on the exposed sample holder, the furnace tube and the heating furnace are retracted, the scale arm and the sample holder are accommodated in the furnace tube, the furnace tube is heated, and the weight change of the sample is measured. A circular opening is formed in the center of the upper surface of the heating furnace. During measurement, the heated sample can be observed through the opening through the transparent furnace tube.

TW103303364F 2014-02-28 2014-06-05 Thermogravimetric measuring device TWD169174S (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2014004228 2014-02-28

Publications (1)

Publication Number Publication Date
TWD169174S true TWD169174S (en) 2015-07-21

Family

ID=55026763

Family Applications (1)

Application Number Title Priority Date Filing Date
TW103303364F TWD169174S (en) 2014-02-28 2014-06-05 Thermogravimetric measuring device

Country Status (2)

Country Link
US (1) USD747227S1 (en)
TW (1) TWD169174S (en)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD755405S1 (en) * 2015-02-20 2016-05-03 Siemens Healthcare Diagnostics Inc. Enclosure cover for a diagnostic analyzer
JP1554487S (en) * 2015-08-03 2016-07-25
USD800331S1 (en) * 2016-06-29 2017-10-17 Click Diagnostics, Inc. Molecular diagnostic device
USD800914S1 (en) * 2016-06-30 2017-10-24 Click Diagnostics, Inc. Status indicator for molecular diagnostic device
USD800913S1 (en) * 2016-06-30 2017-10-24 Click Diagnostics, Inc. Detection window for molecular diagnostic device
JP1574851S (en) * 2016-08-29 2017-04-24
JP1588826S (en) * 2017-02-28 2017-10-23
USD858790S1 (en) * 2017-03-23 2019-09-03 Bonraybio Co., Ltd. Test meter
JP1680698S (en) * 2020-06-02 2021-03-08

Family Cites Families (9)

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Publication number Priority date Publication date Assignee Title
USD283107S (en) * 1983-07-29 1986-03-25 Miles Laboratories, Inc. Reflectance photometer
USD292979S (en) * 1985-04-26 1987-12-01 Prometrix Corporation Automatic semiconductor wafer tester
US5322360A (en) * 1993-03-05 1994-06-21 Leco Corporation Isothermal calorimeter
USD381756S (en) * 1994-09-21 1997-07-29 Hitachi, Ltd. Immunity analyzer
US6760679B1 (en) * 2001-01-26 2004-07-06 Ta Instruments-Waters, Llc Method and apparatus for positional calibration of a thermal analysis instrument
US6846455B1 (en) * 2001-01-26 2005-01-25 Ta Instruments-Waters, Llc Automatic sampling device
USD556914S1 (en) * 2005-10-21 2007-12-04 Sanyo Electric Co., Ltd. Gene amplification apparatus
USD638545S1 (en) * 2010-03-31 2011-05-24 Fujifilm Corporation Medical immunoassay device
USD689387S1 (en) * 2012-05-09 2013-09-10 Shimadzu Corporation Mass analyzer

Also Published As

Publication number Publication date
USD747227S1 (en) 2016-01-12

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