TWD187435S - Probe for eddy current inspection - Google Patents

Probe for eddy current inspection

Info

Publication number
TWD187435S
TWD187435S TW106301589F TW106301589F TWD187435S TW D187435 S TWD187435 S TW D187435S TW 106301589 F TW106301589 F TW 106301589F TW 106301589 F TW106301589 F TW 106301589F TW D187435 S TWD187435 S TW D187435S
Authority
TW
Taiwan
Prior art keywords
probe
eddy current
current inspection
inspected
item
Prior art date
Application number
TW106301589F
Other languages
Chinese (zh)
Inventor
Yoshiyasu Makino
Original Assignee
新東工業股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 新東工業股份有限公司 filed Critical 新東工業股份有限公司
Publication of TWD187435S publication Critical patent/TWD187435S/en

Links

Abstract

【物品用途】;本設計的物品是渦流檢查用探子,於渦流檢查所使用的探子,使被檢查對象物定位於探子之內側部分的狀態,來激勵被檢查對象,藉此進行渦流檢查。;【設計說明】;後視圖與前視圖相對稱,後視圖省略。[Purpose of the item]; The item of this design is a probe for eddy current inspection. The probe used in eddy current inspection allows the object to be inspected to be positioned inside the probe to excite the object to be inspected, thereby performing eddy current inspection. ;[Design Description];The rear view is symmetrical to the front view, and the rear view is omitted.

TW106301589F 2016-10-03 2017-03-27 Probe for eddy current inspection TWD187435S (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JPD2016-21518F JP1580264S (en) 2016-10-03 2016-10-03

Publications (1)

Publication Number Publication Date
TWD187435S true TWD187435S (en) 2017-12-21

Family

ID=59217154

Family Applications (2)

Application Number Title Priority Date Filing Date
TW106301588F TWD187434S (en) 2016-10-03 2017-03-27 Probe for eddy current inspection
TW106301589F TWD187435S (en) 2016-10-03 2017-03-27 Probe for eddy current inspection

Family Applications Before (1)

Application Number Title Priority Date Filing Date
TW106301588F TWD187434S (en) 2016-10-03 2017-03-27 Probe for eddy current inspection

Country Status (3)

Country Link
US (2) USD830208S1 (en)
JP (1) JP1580264S (en)
TW (2) TWD187434S (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD929880S1 (en) * 2019-11-03 2021-09-07 Jinhe Lan Laser probe head
USD954971S1 (en) * 2019-12-19 2022-06-14 Father Flanagan's Boys' Home Neural net adaptor

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05500416A (en) * 1990-04-17 1993-01-28 アイオワ ステイト ユニヴァーシティ リサーチ ファンデイション,インコーポレイテッド Light guided image generation device and method
US5532591A (en) * 1992-02-27 1996-07-02 Logue; Delmar L. Apparatus for detecting surface flaws in cylindrical articles by means of asymmetric magnetic detection
USD381030S (en) * 1995-11-21 1997-07-15 Avi Tepman Sputtering target
USD431867S (en) * 1999-03-22 2000-10-10 Biostar, Incorporated Immunoassay test device
USD450000S1 (en) * 2000-02-24 2001-11-06 Ann F. Koo Multiple environment testing chamber
USD571831S1 (en) * 2005-07-29 2008-06-24 Tokyo Electron Limited Top panel for microwave introduction window of a plasma processing apparatus
USD571833S1 (en) * 2005-07-29 2008-06-24 Tokyo Electron Limited Top panel for microwave introduction window of plasma processing apparatus
USD579809S1 (en) * 2006-09-08 2008-11-04 United Pacific Industries Inc. Gauge cover with visor
WO2009089393A1 (en) * 2008-01-10 2009-07-16 Aria Enterprises, Inc. Customizable modular multi-function communication device
US8333116B2 (en) * 2010-06-30 2012-12-18 Westinghouse Electric Company Llc Inspection vehicle for a turbine disk
KR101376541B1 (en) * 2012-05-22 2014-03-19 조선대학교산학협력단 Apparatus for detection defect using the different kind magnetic sensor
USD697224S1 (en) * 2012-10-26 2014-01-07 Paragonix Technologies Inc. Lid for a tissue transport system
USD747267S1 (en) * 2013-03-15 2016-01-12 Samsung Electronics Co., Ltd. Charger for an electronic device
USD744360S1 (en) * 2014-01-06 2015-12-01 Sintokogio, Ltd. Probe for peening inspection
USD782973S1 (en) * 2015-03-19 2017-04-04 Bluesmart Technology Corporation Wireless charger
USD798807S1 (en) * 2015-09-15 2017-10-03 Anhui Huami Information Technology Co., Ltd. Charger
USD810015S1 (en) * 2016-02-12 2018-02-13 Axonics Modulation Technologies, Inc. Charging station
USD797042S1 (en) * 2016-03-18 2017-09-12 Halo2Cloud Llc Portable battery
USD808901S1 (en) * 2016-05-03 2018-01-30 Meemoobaby Ltd. Charging base

Also Published As

Publication number Publication date
TWD187434S (en) 2017-12-21
USD830208S1 (en) 2018-10-09
USD830865S1 (en) 2018-10-16
JP1580264S (en) 2020-06-29

Similar Documents

Publication Publication Date Title
TWD172069S (en) Portion of a holder
TWD167955S (en) Portion of biosensor
TWD172286S (en) Portion of a lamp
MX2021006791A (en) Methods and compositions for detecting misfolded proteins.
TWD171189S (en) Container
TWD177977S (en) Jukebox stand with optional jukebox
TWD170170S (en) Skin moisture meter for an accessary to be connected to a cell-phone socket
TWD174634S (en) Scoop
TWD168170S (en) Portion of a balloon holder
TWD187435S (en) Probe for eddy current inspection
TWD171567S (en) Portion of a soap holder
TWD165508S (en) Portion of meter
TWD172410S (en) electrical connector
TWD163644S (en) A portion of a meter
TWD187437S (en) Probe for eddy current inspection
TWD165507S (en) Portion of meter
TWD194296S (en) Biopsy device handle
TWD183378S (en) Residual stress measuring device
TWD180087S (en) Probe pin for continuity test
TWD168961S (en) Lamp testing device
TWD187308S (en) Voltage indicator lighting arrangement
TWD183379S (en) Residual stress measuring device
TWD165506S (en) Portion of meter
TWD187430S (en) Fiber inspection probe
TWD186173S (en) Part of the test piece