TW577059B - Detecting classifying method and recording medium thereof - Google Patents

Detecting classifying method and recording medium thereof Download PDF

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Publication number
TW577059B
TW577059B TW91116204A TW91116204A TW577059B TW 577059 B TW577059 B TW 577059B TW 91116204 A TW91116204 A TW 91116204A TW 91116204 A TW91116204 A TW 91116204A TW 577059 B TW577059 B TW 577059B
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Taiwan
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data
optical
scope
patent application
item
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TW91116204A
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Chinese (zh)
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Kuang-Hua Chang
Chin-Lin Lin
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Prodisc Technology Inc
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Abstract

A detecting classifying method for detecting and classifying an optical device. The method includes receiving an optical data measured by and outputted from the optical apparatus, producing a detecting data according to the optical data, comparing the detecting data and a preset standard data so as to generate a classifying data, and storing the detecting data and classifying data. This invention also discloses a recording medium having a computer executable program for performing the mentioned method.

Description

577059 、發明說明(1) 【發明領域】 、本發明係關於一種檢測判級方法及記錄媒體,特別關 ;~種用以檢測並判級一光學元件的檢測判級方法及記錄 媒體。 【習知技術】 光電技術乃是目前科技發展的重要指標之一,而在光 2技術領域中’光學元件是其中極為重要的一項產品。光 學元件的應用範圍很廣,如薄膜濾光鏡(TFF)、高密度 多工分合器(DWDM )等。 办旦在光學元件製造完成之後,通常必須利用一光學儀器 :ΐ測光學元件的光學性質,並透過光學檢測判級裝置或 ^統來檢測及判級所製得的光學元件,然後才能夠順利進 行光學元件的儲存管理等程序。 、在習知的光學元件檢測判級過程中,通常是利用人工 ^式來#作儀器,然後利用手抄方式來記錄光學元件的檢 =結果。然而’利用人卫來作儀器及記錄資料不但耗費時 k長而且還會因為人的因素而增加了出錯的機率。 因此,如何能夠減少人為操作浪費的時間及出錯的機 率’實是當前光電技術的重要課題之一。 【發明概要】 怜、丨:對上ί問題,本發明之目的為提供-種能夠自動化 檢測並判級光學元件的檢測判級方法及記錄媒體。577059. Description of the invention (1) [Field of the invention] The present invention relates to a detection and grading method and a recording medium, and is particularly relevant; a detection and grading method and a recording medium for detecting and grading an optical element. [Knowledge technology] Optoelectronic technology is one of the important indicators of current scientific and technological development, and in the field of optical 2 technology, 'optical elements' is one of the most important products. Optical components have a wide range of applications, such as thin film filters (TFF), high-density multiplexers (DWDM), and so on. After the manufacture of optical components is completed, usually an optical instrument must be used: measuring the optical properties of the optical components, and detecting and grading the optical components through an optical detection and grading device or system, and then they can go smoothly. Programs such as storage management of optical components. In the conventional optical component inspection and grading process, the manual method is usually used as an instrument, and then the manual inspection method is used to record the inspection results of the optical components. However, using human health to make instruments and record data not only takes a long time, but also increases the probability of errors due to human factors. Therefore, how to reduce the wasted time and error rate caused by manual operation is really one of the important topics of the current optoelectronic technology. [Summary of the Invention] Concerning the above problem, the purpose of the present invention is to provide a detection and grading method and a recording medium capable of automatically detecting and grading optical elements.

577059577059

t達上述目的,依本發明之檢測判級方法 忐予儀器測量一光學元件所輸出之一次 括接\ 資料產生一檢測資#、比較檢:二、依據光學 以產生-判級資料、以及儲存及標準資料 :明中’光學資料係自光學儀器並透過一資料介:被;本 資料二ΐ:述,由於依本發明之檢測判級方法係直接透過 面接收光學元件的光學資料…能夠利用自動化 間光學元件,以減少人為操作所導致的時 【較佳實施例之詳細說明】 依本發明較佳實施例之檢 同的元件將以相同的參照 、 以下將參照相關圖式,說明 ,判級方法及記錄媒體,其中相 符號加以說明。 請參照圖1所示,依本發明較佳實施例之檢測判級方 〆1包括以下所述之程序1014 04。 出首先,程序1 〇 1接收一光學儀器測量一光學元件所輸 之一光學資料。在本實施例中,光學儀器可以是一光譜 ’而光學元件可以是薄膜濾光鏡、高密度多工分合器等 二度品。因此,當光學元件置於光學儀器中進行光譜掃 j分析時,光學儀器能夠量測出光學元件的一些光學性 、 例如圖2所示的光譜圖中每一點的波長值與1 e v e 1值, 此即為前述之光學資料。另外,在本實施例中,程序丨〇 1To achieve the above-mentioned purpose, according to the detection and grading method of the present invention, the instrument measures a single output output of an optical element to generate a test data #, comparative inspection: two, to generate-grade data based on optics, and to store And standard data: Mingzhong 'optical data is from optical instruments and passed through a data introduction: quilt; this data two narratives: described, because the detection and classification method according to the present invention directly receives the optical data of the optical element through the surface ... can be used Optical elements in automation room to reduce human-induced operations [Detailed description of the preferred embodiment] The identical components according to the preferred embodiment of the present invention will be referred to with the same reference, and the following will be explained with reference to related drawings Level method and recording medium, in which the phase symbols are explained. Please refer to FIG. 1, the detection method according to the preferred embodiment of the present invention 〆1 includes the program 1014 04 described below. First, the program 101 receives optical data from an optical device to measure an optical element. In this embodiment, the optical instrument may be a spectrum, and the optical element may be a second-order product such as a thin film filter, a high-density multiplexer, and the like. Therefore, when the optical element is placed in an optical instrument for spectral scanning analysis, the optical instrument can measure some optical properties of the optical element, such as the wavelength value and 1 eve 1 value of each point in the spectrogram shown in FIG. 2. This is the aforementioned optical information. In addition, in this embodiment, the program 丨 〇 1

577059 五、發明說明(3) 可以透過一 GPIB (general - purpose instrument bus)介 面、並列資料介面、串列資料介面(如USB介面)、可程 式規劃周邊介面(programmable peripheral interface )、單晶片微電腦控制1C (如805 1、8048等)、IEEE介面 (如IEEE488. 2、IEEE1 3 94 )等自光學儀器接收光學資 料。 在程序1 0 2中,接著依據所接收到的光學資料產生一 檢測資料。凡熟悉該項技術者都瞭解,光學資料顯示光學 元件在不同波長下的光學性質(如1 eve 1值),而檢測資 料是為了方便使用者快速瞭解光學元件之光學性質的一些 特定資料,例如中心波長(I )、pass band、stop band、峰值(peak )等等。以下舉例說明程序1〇2的流 程。 如圖3所示,在本實施例中,依據光學資料產生pass b a n d >料的流程包括以下數個步驟。首先步驟31分析光譜 圖(如圖2所示)以取得一峰值波長。接著在步驟32中取 得於光譜圖中單次送出資料的一間距波長。然後分別進行 步驟33a〜35a以及33b〜35b,以計算得到量測波長(+ )以及 量測波長(-)。詳言之,步驟33a係計算峰值波長與間距波 長的和,步驟34a從光譜圖中取得峰值波長與間距波長之 和所對應的level值,步驟35a判斷步驟34a所取得2level 值是否大於所需之範圍,而當level值未大於所需之範圍 時,重複進行步驟33a〜35a,#level值大於所需之範圍 時,則輸出峰值波長與間距波長之和以進行步驟36,從光577059 5. Description of the invention (3) Can be controlled through a GPIB (general-purpose instrument bus) interface, parallel data interface, serial data interface (such as USB interface), programmable peripheral interface (programmable peripheral interface), single-chip microcomputer control 1C (such as 805 1, 8048, etc.), IEEE interface (such as IEEE488. 2, IEEE1 3 94), etc. receive optical data from optical instruments. In the program 102, a detection data is then generated according to the received optical data. Anyone familiar with this technology knows that the optical data shows the optical properties of the optical element at different wavelengths (such as 1 eve 1 value), and the detection data is to facilitate users to quickly understand some specific data of the optical properties of the optical element, such as Center wavelength (I), pass band, stop band, peak, etc. The following example illustrates the flow of program 102. As shown in FIG. 3, in this embodiment, the process of generating a pass b a n d > material according to the optical data includes the following steps. First, step 31 analyzes the spectrogram (as shown in Fig. 2) to obtain a peak wavelength. Then, in step 32, a pitch wavelength of the data sent in a single shot in the spectrogram is obtained. Then perform steps 33a ~ 35a and 33b ~ 35b respectively to calculate the measurement wavelength (+) and measurement wavelength (-). In detail, step 33a calculates the sum of the peak wavelength and the interval wavelength, step 34a obtains the level value corresponding to the sum of the peak wavelength and the interval wavelength from the spectrogram, and step 35a determines whether the 2level value obtained in step 34a is greater than the required value. Range, and when the level value is not greater than the required range, repeat steps 33a to 35a. When the #level value is greater than the required range, the sum of the peak wavelength and the pitch wavelength is output to proceed to step 36.

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577059 五、發明說明(4) 譜圖中取得與峰值波長與間距波長之和相對應的level 值,·另外’步驟3 3 b係計算峰值波長與間距波長的差,步 驟34b從光譜圖中取得峰值波長與間距波長之差所對應的 level值,步驟35b判斷步驟34b所取得之level值是否大於 所需之範圍,而當level值未大於所需之範圍時,重複進' 行步驟33b〜35b,當level值大於所需之範圍時,則輸出峰 值波長與間距波長之差以進行步驟36。最後,步驟36將步 驟3 3 a〜3 5 a所得之和減去步驟3 3 b〜3 5 b所得之差,而所計算 求得之值即為光學元件之pass band。凡熟悉該項技術者 應當瞭解,上述之步驟同樣能夠應用於其他檢測資料的取 得。 請再參考圖1所示,程序1 〇3比較檢測資料與一預設之 標準資料,以便產生一判級資料。在本實施例中,標準資 料乃是廠商依據所需之光學元件的部分特性所制定出來的 標準值’舉例而言,標準資料可以規範所需光學元件之中 心波長的標準值為1 562.8·,且其pass band為〇.5nm等。 需注意者,標準資料所規範的標準值可以是光學元件的任 意一種特性。而由於檢測資料可以是中心波長、pass band、stop band、峰值等,因此,判級資料係相對地可 以是中心波長、pass band、stop band、峰值等資料的判 級結果。此外,程序1 03更可以對檢測資料的平坦度進行577059 V. Description of the invention (4) Obtain the level value corresponding to the sum of the peak wavelength and the interval wavelength in the spectrum chart. In addition, step 3 3 b is to calculate the difference between the peak wavelength and the interval wavelength. Step 34b is obtained from the spectrum chart. The level value corresponding to the difference between the peak wavelength and the pitch wavelength. Step 35b determines whether the level value obtained in step 34b is greater than the required range, and when the level value is not greater than the required range, repeat the steps 33b ~ 35b. When the level value is greater than the required range, the difference between the peak wavelength and the pitch wavelength is output to proceed to step 36. Finally, step 36 subtracts the difference obtained in steps 3 3 b to 3 5 b from the sum obtained in steps 3 3 a to 3 5 a, and the calculated value is the pass band of the optical element. Those familiar with this technology should understand that the above steps can also be applied to the acquisition of other test data. Please refer to FIG. 1 again. The program 103 compares the test data with a preset standard data in order to generate a judgment data. In this embodiment, the standard data is the standard value formulated by the manufacturer based on the required characteristics of some optical elements. For example, the standard data can regulate the standard value of the center wavelength of the required optical element 1 562.8 ·, And its pass band is 0.5nm and so on. It should be noted that the standard value specified in the standard data can be any characteristic of the optical element. And because the detection data can be the center wavelength, pass band, stop band, peak, etc., the rating data is relatively the result of the rating of the center wavelength, pass band, stop band, peak, and so on. In addition, the program 103 can perform the flatness of the test data.

分析判級,以便判斷光學元件之光學特性是否合乎平坦度 的標準。以下舉例說明程序1 〇 3的流程。 口 一 X 如圖4所示’在本實施例中,比較檢測資料與預設之 577059 五、發明說明(5) 標準資料以產生判級資料的、、* 八S,丨、# —本挪W ,〇叶的流私包括以下數個步驟。首先 /刀別進仃步驟418〜42&、步驄/11^>|01^ „ 』 卓μ』 ν 少驟411)〜42b、步驟41c〜42c以及 步驟41 d〜4 2 d,以分別取^呈^、丨十w 于檢測負料中的峰值、中心波 長、pass band以及量測孚+R危也描淮分 ^ , ^ E 』十垣度與標準資料中的峰值、中 心波長、pass band以及平垣度之標準值。接著步驟“分 別=斷檢測資料中的峰值是否合乎標準資料中的峰值、檢 測-貝料中的中心波長是否合乎標準資料中的中心波長、檢 測資料中的pass band是否合乎標準資料中的卯“ band、 以及測得之平坦度是否合乎平坦度之標準值。而當步驟43 的判斷結果皆為通過(pass)時,進行步驟44以便為所檢 測之光于元件產生一良品之判級資料;另外當步驟4 3判 斷檢測資料中的任一光學特性未合乎標準資料中訂定的條 件時’進行步驟45以便為所檢測之光學元件產生一不良品 之判級資料。凡熟悉該項技術者應當瞭解,上述之步驟同 樣能夠應用於其他檢測資料的判級。 程序1 04係儲存檢測資料及判級資料。在本實施例 中,檢測資料及判級資料可以儲存於一般的電子資料庫 中,因此,廠商能夠非常容易地從電子資料庫中取得光學 元件的檢測資料及判級資料’進而從檢測資料中可以檢視 光學元件的光學特性,從判級資料中更可以直接判斷光學 元件是合乎所需的光學產品之標準。 此外,請參照圖5所示,依本發明另一較佳實施例之 檢測判級方法2包括以下所述之程序2(Π〜206。 首先,在程序2 0 1中,一使用者係輸入一使用者資Analyze the grade to determine whether the optical characteristics of the optical element meet the criteria for flatness. The following illustrates the flow of the program 103.口 一 X As shown in FIG. 4 'In this embodiment, the detection data is compared with the preset 577059 V. Description of the invention (5) Standard data to generate rating data, * eight S, 丨, # — 本本W, 〇 Ye's private flow includes the following steps. First, don't enter the steps 418 ~ 42 &, step / 11 ^ > | 01 ^ „『 』μ』 ν less step 411) ~ 42b, steps 41c ~ 42c, and steps 41 d ~ 4 2 d, respectively Take ^, ^, and ^ w to detect the peak value, center wavelength, and pass band in negative material, and measure the + R hazard analysis ^, ^ E `` The ten degree and peak value, center wavelength, and The standard values of the pass band and the level of flatness. Then the steps "respectively = whether the peak value in the test data meets the peak value in the standard data, detection-whether the center wavelength in the shell material meets the center wavelength in the standard data, and the pass in the test data Whether the band conforms to the “band” in the standard data, and whether the measured flatness meets the standard value of flatness. When the judgment result of step 43 is a pass, step 44 is performed to detect the light. The component produces a good quality judgment; in addition, when step 4 3 judges that any of the optical characteristics in the test data does not meet the conditions specified in the standard data, step 45 is performed to generate a bad product judgment for the detected optical component. Grade information. Where familiar Those skilled in the art should understand that the above steps can also be applied to the classification of other testing data. Procedure 104 is to store testing data and rating data. In this embodiment, the testing data and rating data can be stored in general The electronic database, therefore, manufacturers can easily obtain the inspection data and rating data of optical components from the electronic database, and then can check the optical characteristics of optical components from the inspection data, and can directly judge from the rating data. The optical element is a standard of a desirable optical product. In addition, please refer to FIG. 5, and a method 2 for detecting and judging according to another preferred embodiment of the present invention includes the following procedures 2 (Π ~ 206. First, In the program 201, a user enters a user information.

577059 五、發明說明577059 V. Description of Invention

料,以便為士 < _ 中,使本程序中接收並儲存使用者資料。在本實施例 鈐入你田者可以透過使用者輸入介面,如滑鼠、鍵盤等, 輸入使用者資料。 才妾^ 氺μ馐抑,程序202輸出一控制訊號至光學儀器,以控制 子,杰測量光學元件。在本實施例中,可以透過前述之 所^輪出控制訊號至光學儀器,而光學儀器能夠依據 的控制訊號執行光學元件的量測動作。 在^下來的程序203〜206中,分別進行如前所述的程 4,其詳細說明係如前所述,故此不再闡述。 ^上所述’在依本發明較佳實施例之檢測判級方法2 次钮e t可以儲存使用者資料,所以廠商能夠於檢視檢測 1級資料時,同時檢視進行操作之使用者的資料, =,廠商能夠於檢視資料時更進一步比較並排除可能的 人為因素所造成的疏失。 #另卜本發明亦長1供一種記錄媒體,其係記錄一電腦 :讀取(readable )之檢測判級程式,其包括一資料接收 °弋馬片^又 檢測程式碼片段、一判級程式碼片段以及 一儲存程式碼片段。其係分別讓電腦執行前述之程序 101〜104。此外,依本發明較佳實施例之記錄媒體所記錄 的檢測判級程式可以更包括一使用者資料接收儲存程式碼 片一,以及一控制訊號輸出程式碼片段,其係分別讓電腦執 仃別述之程序201及程序202。有關上述各程序的詳 係如前所述,4文此不再闡述。 七、、田說月 綜上所述,由於依本發明較佳實施例之檢測判級方法 第10頁 577059 五、發明說明(7) 係直接透過GPIB介面接收光學元件的光 自動地比較由光學資料得到的檢測資 .i丄所以能夠 :並判級光學元件,故能夠減少人為操作;2料’以檢 費及人為疏失。 卞斤導致的時間浪 以上所述僅為舉合, 本發明之精神與範疇,而對其進行:η:。任何未脫離 應包含於後附之申請專利範'圍^…效修改或變更,均 577059 圖式簡單說明 【圖式簡單說明】 圖1為一流程圖 級方法的流程圖。 圖2為一示意圖 譜圖。 圖3為一流程圖 級方法中 圖4為 顯示依本發明較佳實施例之檢測判 顯不光學儀1量漁j丨光學元件的光 顯不在本發日月勒;/土 i 一 a較佳實施例之檢測判 依據光學> 料產生pass banri次 η 士,+ p s band資料的流程圖。 -流程圖,顯不在本發明龄杜也 t lt 丄 ^ β 1又佳實施例之檢測判Data, so as to help < _, so that user data is received and stored in this process. In this embodiment, a user who enters your field can input user data through a user input interface, such as a mouse or a keyboard. In order to control the optical element, the program 202 outputs a control signal to the optical instrument to control the optical element. In this embodiment, the control signal can be output to the optical instrument through the aforementioned control signals, and the optical instrument can perform the measurement operation of the optical element according to the control signal of. In the following procedures 203 to 206, the procedures 4 described above are performed respectively, and the detailed description is as described above, so it will not be described again. ^ As described above, in the detection and grading method according to the preferred embodiment of the present invention, the button et can store user data twice, so the manufacturer can view the data of the user who performed the operation at the same time when inspecting the level 1 data, = , Manufacturers can further compare and rule out possible human-induced negligence when viewing the data. # 别 卜 The present invention also has a long 1 for a recording medium, which records a computer: a readable detection and judgment program, which includes a data receiving ° 弋 马 片 ^ and detection code fragments, a judgment program Code snippet and a stored code snippet. It is to let the computer execute the aforementioned procedures 101 to 104 respectively. In addition, the detection judging program recorded in the recording medium according to the preferred embodiment of the present invention may further include a user data receiving storage code chip 1 and a control signal output code segment, which are respectively made by the computer to perform different operations. The procedures 201 and 202 are described. The details of the above procedures are as described above, and will not be explained in the following four articles. 7. Tian Yueyue In summary, due to the detection and grading method according to the preferred embodiment of the present invention, page 10, 577059 5. Description of the invention (7) The light received by the optical element directly through the GPIB interface is automatically compared by the optical The inspection data obtained from the data. I 丄 can: and judge optical components, so it can reduce human operations; 2 materials' inspection costs and human error. The time wave caused by the weight loss The above description is merely a combination, the spirit and scope of the present invention, and it is carried out: η :. Anything that does not deviate should be included in the appended patent application scope, 修改 ... Effective modification or change, all are 577059 Schematic description [Schematic description] Figure 1 is a flowchart of a flowchart-level method. Figure 2 is a schematic spectrum. FIG. 3 is a flowchart-level method. FIG. 4 is a diagram showing the detection and detection of the optical instrument according to the preferred embodiment of the present invention. The optical display of the optical element is not in the present day; The detection judgment of the preferred embodiment is based on the optical > flow chart for generating pass banri times, + ps band data. -Flow chart showing the detection judgment of the present embodiment of the present invention. Du lt 丄 ^ β 1

級方法中,比較檢測資料與預設之桿準次 ,u A # + f料以產生判級資 料的流程圖。 111 圖5為一流程圖,顯示依本發明萁 _ , _ ^ 月另—較佳實施例之檢In the method, the detection data is compared with the preset parity, u A # + f data to generate a flow chart of the judgment data. 111 FIG. 5 is a flowchart showing the inspection of the preferred embodiment according to the present invention.

測判級方法的流程圖。 H W U 【圖式符號說明】 1 檢測判級方法 101〜104 2 本發明較佳實施例之檢測判 檢測判級方法 級方法的流程 201〜206 31-36 41 a〜45 判級方法的流程 本發明另一較佳實施例之檢测 程序1 0 2的流程 程序1 0 3的流程Flow chart of the rating method. HWU [Illustration of Graphical Symbols] 1 Detecting and judging method 101 ~ 104 2 Detecting and judging method of the preferred embodiment of the present invention 201-206 31-36 41 a ~ 45 Detecting and judging method flow The present invention The flow of the detection procedure 1 0 2 of another preferred embodiment The flow of the procedure 1 0 3

第12頁Page 12

Claims (1)

577059577059 六、申請專利範圍 六、申請專利範圍 一種檢測判級方法,其係用以檢测、判級_ 件 料 包含: 、先予元 接收一光學儀器測量該光學元件所輸出之_光學資 依據該光學資料產生一檢測資料; 比較該檢測資料與一預設之標準資料以產 料;以及 座生-判級資 儲存該檢測資料及該判级資料。 2、如申請專利範圍第1項所述之檢測判級方法,复 學儀器係一光譜儀。 ,、中該光 3、 如申請專利範圍第1項所述之檢測判級方法,其中今“ 學元件係一薄膜濾光鏡(TFF,Thin Film Filter) 。°亥光 4、 如申請專利範圍第丨項所述之檢測判級方法,其係透過 一GPIB (general purpose instrument bus)介面自該光 學儀器接收該光學資料。 5、 如申請專利範圍第1項所述之檢測判級方法,更包含: ^ 輪出一控制訊號至該光學儀器以控制該光學儀器測量 該光學元件。6. Scope of patent application 6. Scope of patent application A method of detection and grading, which is used for detection and grading_ The materials include: 、 Xian Yuyuan receives an optical instrument to measure the output of the optical element _ optical data based on The optical data generates a test data; compares the test data with a preset standard data to produce materials; and the pedagogical-judgment asset stores the test data and the judging data. 2. As for the detection and grading method described in item 1 of the patent application scope, the resumption instrument is a spectrometer. , 中 中 光 3, The detection and grading method described in item 1 of the scope of patent application, in which the "learning element is a thin film filter (TFF, Thin Film Filter). ° 海 光 4, as in the scope of patent application The detection and grading method described in item 丨 is to receive the optical data from the optical instrument through a GPIB (general purpose instrument bus) interface. 5. The detection and grading method described in item 1 of the scope of patent application, and more Including: ^ Turning out a control signal to the optical instrument to control the optical instrument to measure the optical element. 577059 六、申請專利範圍 6、 如申請專利範圍第1項所述之檢測判級方法,其中該檢 測資料至少包含該光學元件之帶寬(band width )、峰 值、中心波長及平坦度。 7、 如申請專利範圍第1項所述之檢測判級方法,其中該標 準資料至少包含一標準光學元件之帶寬、峰值、中心波長 及平坦度。 8、如申請專利範圍第1項所述之檢測判級方法,更包含: 接收並儲存一使用者所輸入之一使用者資料。 種記錄媒體 、 ·~ 其係記錄一電腦可讀取(reaaaDJLe^i 之檢/則=,程式,該檢測判級程式包含: 測·*-二=接收程式碼片段,其係讓電腦接收一光學儀器 一元件所輪出之一光學資料; -檢測ϊ:程式碼片段,其係讓電腦依據該光學資料產生 —判級程式碼Η π _ 預設之棹準眷粗· 奴,其係讓電腦比較該檢測資料與一 -儲存dt 一判級資料;以及 判級資料。 匕’其係讓電腦儲存該檢測資料及該 1 〇如申請專利範 儀器係一光譜儀。 圍第9項所述之記錄媒體,其中該光學577059 6. Scope of patent application 6. The method of detection and grading described in item 1 of the scope of patent application, wherein the test data includes at least the bandwidth, peak value, center wavelength, and flatness of the optical element. 7. The detection and grading method described in item 1 of the scope of patent application, wherein the standard data includes at least the bandwidth, peak, center wavelength, and flatness of a standard optical element. 8. The method for detection and grading as described in item 1 of the scope of patent application, further comprising: receiving and storing a user data input by a user. A kind of recording media, · ~ It is recorded by a computer that can be read (reaaaDJLe ^ i check / rule =, program, the test judgement program includes: test * *-2 = receive code fragment, which allows the computer to receive a One of the optical data rotated by a component of an optical instrument; -Detection code: a code segment, which is generated by the computer based on the optical data.-Judgment code Η π _ Preset 棹 quasi-rough, slave, which is The computer compares the test data with the one-stored dt-grade data; and the graded data. It is for the computer to store the test data and the 10 as a patent application instrument is a spectrometer. Recording medium in which the optical 第14頁 577059 六、申請專利範圍 11、如申請專利範圍第9項所述之記錄媒體,其令誃風 元件係一薄膜濾光鏡。 μ 予 12、如申請專利範圍第9項所述之記錄媒體,其係讓電俨 透過一GPIB介面自該光學儀器接收該光學資料。 甸 1 3、如申請專利範圍第9項所述之記錄媒體,更包含: 一控制訊號輸出程式碼片段,其係讓電腦輪出一生 訊號至該光學儀器,以控制該光學儀器測量該光學元^ 1 4、如申請專利範圍第9項所述之記錄媒體, :料至少包含該光學元件之帶寬、峰值、中心波長;= 1 5、如申請專利範圍第9項所述之記錄媒體,其中該桿 ::巧少包含-標準光學元件之帶寬、峰值、中心波長及 干坦度。 1 6、如申請專利範圍第9項所述之記錄媒體,更包含: 一使用者資料接收儲存程式碼片段,其係讓電腦接收 並儲存一使用者所輸入之一使用者資料。 画Page 14 577059 VI. Application scope of patent 11. The recording medium as described in item 9 of the scope of application for patent, the wind element is a thin film filter. μ to 12. The recording medium as described in item 9 of the scope of the patent application, which is to allow the electric card to receive the optical data from the optical instrument through a GPIB interface. Dian 1 3. The recording medium described in item 9 of the scope of patent application, further comprising: a control signal output code segment, which allows a computer to output a lifetime signal to the optical instrument to control the optical instrument to measure the optical element ^ 1 4. The recording medium as described in item 9 of the scope of patent application, which includes at least the bandwidth, peak value, and center wavelength of the optical element; = 15 5. The recording medium as described in item 9 of the scope of patent application, where The rod ::: Includes-the bandwidth, peak, center wavelength, and dryness of standard optics. 16. The recording medium as described in item 9 of the scope of patent application, further comprising: a user data receiving storage code segment, which is for a computer to receive and store a user data input by a user. painting
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