TW558807B - Low profile, high density memory system - Google Patents

Low profile, high density memory system Download PDF

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Publication number
TW558807B
TW558807B TW91109091A TW91109091A TW558807B TW 558807 B TW558807 B TW 558807B TW 91109091 A TW91109091 A TW 91109091A TW 91109091 A TW91109091 A TW 91109091A TW 558807 B TW558807 B TW 558807B
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Taiwan
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scope
patent application
frequency semiconductor
semiconductor devices
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TW91109091A
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Chinese (zh)
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Zhineng Fan
Ai D Le
Che-Yu Li
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High Connector Density Inc
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Priority claimed from US09/835,123 external-priority patent/US6381164B1/en
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Abstract

The present invention provides a low profile, high density electronic package for high speed, high performance semiconductors, such as memory devices. It includes a plurality of modules having high speed, impedance-controlled transmission line buses, short interconnections between modules and, optionally, driver line terminators built into one of the modules, for maintaining high electrical performance. Suitable applications include microprocessor data buses and memory buses such as RAMBUS and DDR. The modules may be formed on conventional printed circuit cards with unpacked or packed memory chips attached directly to the memory module. Thermal control structures may be included to maintain the high density modules within a reliable range of operating temperatures.

Description

558807 五、發明說明(1) 【相關專利申請案】 本發明專利申請案係有關由Brown等人所提出之美國 第6,1 7 2,8 9 5號專利案之「具有内建高速匯流排終端之高 速記憶體模組」,及1999年12月9日共同申請中之美國專 利申請案號09/457, 776,及1 999年12月14日共同申請中之 美國專利申請案號09/461,065 ;2000年8月24日共同申請 中之美國專利中請案號0 9/645,860,09/645,859, 60/227, 689及09/645, 858 ;核發給Li等人之美國專利案號 第6, 264, 4 76之「用於高頻電器連接之金屬線節段基礎之 插入物」,該專利係以1 9 9 9年1 2月9日申請之美國專利申 請案號09/457, 776為基礎;核發給Fan等人之美國專利案 號第6, 3 1 2, 266之「承座格距陣列之載體」,該專利係以 20 0 0年8月24日申請之美國專利申請案號〇9/645, 86〇為基 礎;及1999年12月14日共同申請中之美國專利申請案號 09/46 1,0 65 ; 20 00年8月24日共同申請中之美國專利申^ 案號0 9/46 1,06 5及09/645, 8 58 ; 20 0 1年5月29日共同申請 中之美國專利申請案號09/866, 434,該專利是一/個以2(f〇〇 年8月24日暫定的之美國專利申請案號〇9/461,〇65為基 之非-暫定的應用;2001年1月31日申請之美國專利申姓 號09/772, 64丨以上各專利申請案指定為本發明專利 文獻。 【發明範疇】 本發明是有關於一種高密度、低厚度之電子封裝 尤指-種高效能’冑密度記憶體模組具有阻抗控制傳輪線558807 V. Description of the invention (1) [Related patent applications] This invention patent application is related to the US Patent No. 6, 1 7 2, 8 9 5 filed by Brown et al. High-Speed Memory Modules for Terminals ", and US Patent Application No. 09/457, 776 under joint application on December 9, 1999, and US Patent Application No. 09 / under joint application on December 14, 1999 461,065; U.S. Patent Application Nos. 0 9 / 645,860, 09 / 645,859, 60/227, 689, and 09 / 645,858, co-filed on August 24, 2000; U.S. issued to Li et al. Patent No. 6, 264, 4 76, "Inserts for the Foundation of Metal Wire Segments for High Frequency Electrical Connections", this patent is a US patent application filed on February 9, 1999 09/457, 776-based; issued to Fan et al., US Pat. No. 6, 3 1 2, 266, "Carriers for Arrays of Bearing Grids", which was filed on August 24, 2000 Based on U.S. Patent Application No. 09/645, 86; and U.S. Patent Application No. 09/46 1,0 65 in joint application on December 14, 1999; August 24, 2000 U.S. Patent Application No. 0 9/46 1, 06 5 and 09/645, 8 58 in the Japanese joint application; U.S. Patent Application No. 09/866, 434 in the joint application on May 29, 2001, This patent is a non-tentative application based on US Patent Application No. 09/461, 065 tentatively dated August 24, 2000; the United States of America filed January 31, 2001 The patent application number 09/772, 64 丨 and the above patent applications are designated as the patent documents of the present invention. [Scope of the invention] The present invention relates to a high-density, low-thickness electronic package, especially a high-performance '胄 density memory Body module has impedance control transmission line

第5頁 558807Page 5 558807

ϋ莫組以維護高電氣 匯流排,及可選擇地内建驅動線終端 效能之高密度、低厚度封裝。 【發明背景】 < 現今針對高速、高效能電子系統之 提供高電氣效能,高密产,及不β子封裝的趨勢疋 互連,已开f此:: 電路裝置間高可靠度 互連已形成攻些系統之重要部分。該系統可能 腦’-通訊網路裝置,一頭戴式「個人數位助 如此包含複數個互連之高可靠度模組, =發生失連(misc。繼ctiQns)是導致終端產;失敗J 原因。模組尤其是互連兩者儘可能的密集,使用最少之模 組佔用空f曰’,提供高電氣整體性,及提供模組佈線上最少 碰撞以及使主機板或系統板的搭配也是非 些情形中,例如膝上型電腦及頭戴式裝置,連接器及附屬 的電路構件之高度愈低愈好是很重要的。 、 當系統的密度及執行效能戲劇性地增加,因此對於互 連之規格具有迫切性。一種高電氣執行效能的方法是清楚 =即時提升信號之整體性(integr丨ty)。這可藉由具有屏 蔽之β亥荨互連以協助它們更接近地匹配系統所需之阻抗達 成。特別是當與場地-隔離(field-separability)耦合 時’這些高要求的需求,導致可能連接器解決方法很大的 變化。 此外,確保有效的維修,升級,及/或系統不同零件The Momo group maintains high-density, low-thickness packages that maintain high electrical busbars and optionally built-in driveline terminal performance. [Background of the Invention] < Nowadays, the trend of providing high electrical efficiency, high density production, and no beta sub-package for high-speed, high-performance electronic systems: interconnection, has been opened f: High-reliability interconnection between circuit devices has been formed Attack some important parts of the system. The system may be a brain-communication network device, a head-mounted "personal digital assistant" that includes a plurality of interconnected high-reliability modules, = misconnection (following ctiQns) is the cause of terminal production; failure J causes. Modules, especially the interconnects, are as dense as possible, using the least number of modules to take up space, providing high electrical integrity, and providing minimal collisions on the module wiring and matching the motherboard or system board. In situations such as laptops and head-mounted devices, the lower the height of the connectors and attached circuit components, the better. It is important that the density and performance of the system increase dramatically, so the specifications for the interconnection It is urgent. A method of high electrical execution efficiency is clear = Immediately improve signal integrity (integr 丨 ty). This can be shielded by βHynet interconnect to help them more closely match the impedance required by the system Achieved. Especially when coupled with field-separability 'these demanding requirements have led to significant changes in possible connector solutions. In addition, ensure effectiveness Repair, upgrade, and / or different parts of the system

558807 五、發明說明(3) 等等) ^更換(例如,連接器,卡,晶片,板子,模組 4要模組中之連接在工廠中是可重新實現的 (reworkable)。在一些情形中也有較高需求,在最炊 月b力在生產時例如,為了方便測試也是需要的 一承座格距陣列(land grid array,LGA)是一個如此 連接之範例,其中被連接之兩個主要平行電路構件中之每 一個具有複數個接觸點,該等接觸點以線性或二維陣列排 列。互連構件之陣列,被稱為插入物(interposer),被置 於連接之兩個陣列之間,且提供接觸點或接觸墊(pad)間 之電氣連接。為了更高密度互連且節省主機板實際空間, 增加之平行電路構件藉由外加之LGA連接器可能被堆疊且 電氣連接,以創造三維之封裝。在任何情形中,因為在腳 位-及-插座(pin-and-socket)型態互連中並不具備保持能 力,因此LGA連接需要一箝板(ciamping mechanism)機 構,以創造所需要之力,俾確保每一個接觸構件在使用時 被壓縮一適當量,以形成至電路構件所需之互連。而Lga 插入物可以以許多不同方式實現,其中最感興趣的實現方 式是描述在上述之待審中之美國專利申請案中。 現今’多樣化之軟體在高速數位計算裝置上執行需要 比以前更多且具更高之匯流排及時脈速度之動態隨機存取 記憶體(RAM)。為了確保快速的記憶體循環時間(cy c 1 e t i m e s) ’非常短’快速的上升脈衝被使用。但是當系統中 資料匯流排及時脈之速度增加時,用以服務複數個記憶體 558807 五、發明說明(4) 裝置之電氣驅動需求較使用較少記憶體時變得更加迫切。 記憶體系統之最大操作速度主要係由記憶體控制器及 δ亥專§己憶體裝置或該等匯流排之間的複數個電氣互連所決 定。當資料傳輸率增加時,經過該等電氣互連之信號傳輸 時間與信號之暫態時間相比將不再是可忽略的。在高匯流 排速度’這些互連的表現有如傳輸線網路(t ransmi ss丨〇η line networks)。此傳輸線網路之響應特徵定義該記憶體 匯流排之最大可使用速度。 在目前低厚度之記憶體封裝技術中,系統上實際可用 之δ己憶體數量係由記憶體晶片(ch丨pS )本身之容量,在該 吞己憶體卡或模組上可製造之實際電氣連接的數量及可用的 空間數量以提供額外之記憶體卡所決定。線驅動器或線接 收器之數量是記憶體卡或模組之另一項限制,該記憶體卡 或記憶體模組可以被雛菊輪式串接(daisy chained)。 在一般隨機存取記憶體系統中,因為在一定的時間區 間中只有一個位元可以存在匯流排中,該匯流排的速度主 要係由匯流排之信號設定時間(setup time)所決定。結 在目前個人電腦之記憶體系統中匯流排所能達到之最 高^料傳輸率是每秒266百萬位元(Mbits per sec〇nd)。 通常地,在此一般的記憶體系統中不需要或提供阻抗匹配 由Dell等人所提出有關可堆疊之記憶體卡之美國 963j/H號專利案之第一觀點,一些構件看起來與本發明’ 之二施例相類似。然而,更仔細閱讀後會顯示一些重558807 V. Description of the invention (3), etc.) ^ Replacement (for example, connector, card, chip, board, module 4 requires that the connection in the module is reworkable in the factory. In some cases There is also a high demand. For example, a land grid array (LGA) is needed for the convenience of testing during production. For example, the two connected grids are parallel. Each of the circuit components has a plurality of contact points arranged in a linear or two-dimensional array. An array of interconnecting components, called interposers, is placed between two arrays that are connected, And provide electrical connections between contact points or contact pads. In order to achieve higher density interconnection and save the actual space of the motherboard, additional parallel circuit components may be stacked and electrically connected by the addition of LGA connectors to create three-dimensional In any case, because pin-and-socket type interconnects do not have the ability to hold, the LGA connection requires a clamping mechanism. Structure to create the force needed to ensure that each contact member is compressed by an appropriate amount during use to form the interconnection to the circuit member. Lga inserts can be implemented in many different ways, of which the most interesting The implementation is described in the aforementioned pending US patent applications. Today's' various software execution on high-speed digital computing devices requires more dynamic random storage than ever before with higher bus and clock speeds RAM (RAM). In order to ensure fast memory cycle time (cy c 1 etimes) 'very short' fast rising pulses are used. However, when the speed of the data bus and clock in the system increases, it is used to serve multiple Memory 558807 V. Description of the invention (4) The electrical drive requirements of the device become more urgent than when less memory is used. The maximum operating speed of the memory system is mainly composed of the memory controller and the delta memory device. Or determined by the plurality of electrical interconnections between the busbars. When the data transmission rate increases, the signal transmission through the electrical interconnections Compared with the transient time of the signal, it will no longer be negligible. At high bus speeds, these interconnects will behave like transmi ss 丨 〇η line networks. The response characteristics of this transmission line network are defined The maximum usable speed of the memory bus. In the current low-thickness memory packaging technology, the amount of δ memory that is actually available on the system is determined by the capacity of the memory chip (ch 丨 pS) itself. The number of actual electrical connections that can be made on the memory card or module and the amount of available space are determined by the provision of additional memory cards. The number of line drivers or line receivers is another limitation of the memory card or module The memory card or the memory module can be daisy chained. In a general random access memory system, because only one bit can exist in a bus in a certain time zone, the speed of the bus is mainly determined by the setup time of the bus signal. The highest data transfer rate that a bus can achieve in the current memory systems of personal computers is 266 million bits per second (Mbits per sec). Generally, impedance matching is not required or provided in this general memory system. The first point of view of the U.S. Pat. The two examples are similar. However, reading it more carefully shows some weight

第8頁 558807 五、發明說明(5) 大之不同點。如圖1 -3所描述De 1 1之實施例是一個可堆疊 之6憶體卡之設計。該實施例描述一個可堆疊之記憶體卡 具有一個連接器插座附著(attached)至每一記憶體卡之上 表面且連接器之腳位(pins)附著至每一記憶體卡之下表 面。主機板上包括該等組合用插座。而此封裝技術能力適 當地工作在具有較低記憶體匯流排技術上,該等不具屏蔽 之感應的連接器腳位代表一電氣不連績地是足夠的以產生 有效的反射及電氣雜訊。此外,最上層卡之上表面上該等 不使用之插座當成一天線以干擾R F之拾取。從一可靠度/ 可製造性之觀點來看,此腳位及插座型方法開啟模組損壞 之可能性甚至只是一個腳位或插座被彎曲或其他的損壞。 在此情形中,該卡必須是可重新實現的或少量的。 而為了揭露之目的一以R A Μ B U S為基礎之記憶體模組被 選擇’顯而易見的是本發明所教示之原則不只可以被應用 至高速記憶體模組,例如雙倍資料讀取速率(DDR)SDRAM , 也可以應用至其他需要高速及高執行效能包括但不限於微 處理器,數位信號處理器及通訊應用及系統之各種電子封 裝結構。 為了達到更高之匯流排速度且,同時,允許較大之記 憶體容量,必須採用阻抗受控制之匯流排型態、。例如由加 州山景市RAMBUS公司所開發之RAMBUS技術顯示一記憶體組 態其中該等記憶體裝置被放置(封裝)在最多3個RAMBUS線 内記憶體模組(RIMM)上且在主機板上藉由一高速資料匯流 排互連。一個或更多之終端元件被放置在該主機板之高速Page 8 558807 V. Description of the Invention (5) The major differences. As shown in Figure 1-3, the De 1 1 embodiment is a stackable 6-memory card design. This embodiment describes a stackable memory card having a connector socket attached to the upper surface of each memory card and the pins of the connector attached to the lower surface of each memory card. The motherboard includes these combo sockets. And this packaging technology is capable of working properly with low memory bus technology. The pins of these unshielded inductive connectors represent an electrical failure, which is sufficient to generate effective reflections and electrical noise. In addition, the unused sockets on the upper surface of the uppermost card act as an antenna to interfere with the pickup of the RF. From a reliability / manufacturability point of view, the possibility of damage to this pin and socket-type method to open the module is even a pin or socket being bent or other damage. In this case, the card must be re-realizable or small. For the purpose of disclosure, a RAM module based on RAM bus was selected. It is obvious that the principles taught by the present invention can not only be applied to high-speed memory modules, such as double data read rate (DDR) SDRAM can also be applied to other electronic packaging structures that require high speed and high performance including, but not limited to, microprocessors, digital signal processors, and communication applications and systems. In order to achieve a higher bus speed and, at the same time, allow a larger memory capacity, it is necessary to use an impedance-controlled bus type. For example, the RAMBUS technology developed by the RAMBUS company in Mountain View, California shows a memory configuration in which the memory devices are placed (packaged) on up to 3 RAMBUS in-line memory modules (RIMM) and on the motherboard Interconnected by a high-speed data bus. One or more terminal components are placed on the motherboard at high speed

第9頁 558807 五、發明說明(6) 資料匯流排實際終點上。 操作上,該等位址/資料線離開主機板上之驅動線且 進入記憶體鏈(chain)上第一個以〇卡。該等相同位址/ 料線必須經由一完整’第二組連接離開該RIMM卡。在驅動 線到達它們的終端前此路徑連續的經過一第二且有時一 三RIMM模組。此記憶體/匯流排組態允許非常快速的 信號被傳輸在記憶體控制器及相對較長的匯流排之資料^ Ϊίΐ::線Ϊ些:流排允許複數個位元同時被傳輪至匯 抓排之母一線中。因此,可達到每秒8〇〇百萬位元之 傳輸率4至在將來可能出現更高速的資料傳輸率。身’ 該等匯流排之一個最重要特性是信號傳輸路徑之 阻抗被良好的控制。匯流排之一有效 特徵阻抗相匹配之終端(二“個么點;放置與匯流排之 及信號之完整性' 咖⑷以維護信號之傳真性 在採用該等匯流排之之系統中,該 是比-般數位信號之振幅小 之振幅 度(dv/dt)之限制。 疋導致該荨裝置之驅動強 依賴憶體匯流排之可靠操作非常 阻抗不匹配將導致說沿之 傳輸中錯誤。同時,维嘴% 士 v 此導致資料 第10頁 558807 五、發明說明(8) 上一半所需連 在一模 為更多 實際上 度被大 甚至可 模組及 所有記 都不具 。此種 前所揭 設計之 於具有 組或終 執行效 本發明 承座格 被封裝 因 體系統 徑之長 之減少 記憶體 當 體模組 可能的 形或之 U降低 本。對 終端模 之最大 當 創新的 以達到 被封裝 在更接 別是當 理結構 因 體封裝 比之 前 在一高 近該驅 記憶體 以散熱 此本發 接器腳位,此節省實質允許更多數量之晶片 組上。 記憶體可以被放置在單一卡ϋ 己憶 更:近該等驅動料’因此,所有匯流排: 為Γ卜通過外部接點之該等信號 ::到更多改良。同樣地亦減少習知技術之 外部終端電阻之間的匯流排路徑部分。 憶體模組必須完全相同時(例如,77 ί 創造一個只用來終端之分離模組ί 情形被顯示在稍後之實施例中。針 露之終端在模組上之情形,本發明之設計^ 複雜性及記憶體模組及主機板兩者之生產成 一至三個記憶體模組之記憶體系統,使用一 ^莫組當成是最&-個才莫組可幫助達成 能。 低厚度,選擇性自我終端之記憶體模組與 距陣列(land grid array,LGA)結合時/可 所能達到之密度更高。如此允許更多記憶體 度受限制之應用中。更多記憶體可以被部署 動器/接收器之處,因此降低路徑長度,特 模組是具自我終端時。可以包括複數個熱管 且因此增加可靠度。 明之目的係提供一種低厚度,高密度之記憶Page 9 558807 V. Description of the invention (6) The actual end point of the data bus. In operation, these address / data lines leave the drive lines on the motherboard and enter the first 0 card on the memory chain. The same address / material line must leave the RIMM card via a complete 'second set of connections. This path continues through a second and sometimes a third RIMM module before the drive lines reach their terminals. This memory / bus configuration allows very fast signals to be transmitted to the memory controller and relatively long bus data ^ ΐίΐ :: lineΐsome: The bus allows multiple bits to be transferred to the sink simultaneously Grab the mother in the line. As a result, a transmission rate of 800 million bits per second4 can be reached, and higher data rates may appear in the future. One of the most important characteristics of these buses is that the impedance of the signal transmission path is well controlled. One of the bus's effective characteristic impedance matching terminals (two "points; placement and the integrity of the bus and the signal ') In order to maintain the facsimile of the signal in the system using these buses, it is Limitation of amplitude (dv / dt) which is smaller than the amplitude of ordinary digital signals. 疋 Causes the drive of the device to rely strongly on the reliable operation of the memory bus. Very impedance mismatch will cause errors in transmission along the same time. V. %% v This leads to information on page 10 558807 V. Description of the invention (8) The first half needs to be connected in one mold to be more practically large or even modular and all records are not available. Designed to have group or final execution effect, the socket of the present invention is encapsulated due to the length of the body system, which reduces the possible shape of the memory module, or reduces the cost of the module. The biggest innovation of the terminal module is to achieve the The package is more connected because the physical structure of the package is higher than the previous drive memory to dissipate the pins of the transceiver, and this saving essentially allows for a larger number of chip sets. In order to be placed on a single card, I have recalled: nearly all the driving materials' so all the busbars: for these signals through the external contacts: to more improvements. Similarly, the externality of the conventional technology is also reduced. The part of the bus path between the termination resistors. When the memory modules must be identical (for example, 77 ί creates a separate module for termination only) The situation is shown in the later embodiment. The terminal of the pin dew is in In the case of modules, the design of the present invention ^ complexity and memory modules and motherboards are produced into a memory system with one to three memory modules, using a ^ mo group as the most &- Caimo group can help achieve energy. Low-density, selective self-terminated memory modules combined with land grid array (LGA) have a higher / achievable density. This allows more memory. Restricted applications. More memory can be deployed to the actuator / receiver, so the path length is reduced. When the special module is self-terminal. It can include multiple heat pipes and thus increase reliability. The purpose of Ming is to provide a The thickness of the high density memory

第12頁 558807Page 12 558807

五、發明說明(9) 本發明之另一目的係提供一種低厚度, 體封裝使用新穎的高密度連接器技術。 X 1 高密度之記憶 終端在該模組 本發明之另一目的係提供一種低厚度, 體模組,該記憶體模組選擇性地具有匯f排 上0 本發明之再-目的係提供-種低厚度,高密度之記憶體封 裝’該記憶體封裝可以有效地降低資料路徑長度,因而幫 助簡化高速數位電腦或類似系統中驅動器之電氣需求。 本發明之再一目的係提供一種低厚度,高密度之纪憶 體封裝’該記憶體封裝可以支援單一及兩個匯流排通道兩 種。 【發明概論】 本發明之目的係提供一種低厚度,高密度之電子封 裝,用於高速,高執行效能之半導體,例如記憶體裝置。 該記憶體模組選擇性地具有匯流排終端在該模組上。其包 括複數個模組具有高速,阻抗受控制之傳輸線匯流排,模 組間短的互連及可選擇的驅動線終端内建在該等模組之一 中,以維持高電氣執行效能。適合的應用包括但不限於微 處理器資料匯流排及記憶體匯流排例如RAMBUS及DDR。該 等模組可以未封裝或已封裝晶片直接附著在一般印刷電路 卡上以形成該等記憶體模組。使用具有匯流排終端直接附 著其在之該等記憶體模組改良信號之品質及整體性且因此 增強系統之執行效能。如此之設計亦可以減少匯流排離開 所需之連接,因此允許省下之連接容量被用於定址模組上5. Description of the invention (9) Another object of the present invention is to provide a novel high-density connector technology using a low-thickness, body package. X 1 high-density memory terminal is another module of the present invention, which is to provide a low-thickness, body module, the memory module selectively has a row f on the line 0. The purpose of the present invention is to provide- A low-thickness, high-density memory package 'This memory package can effectively reduce the data path length, thereby helping to simplify the electrical requirements of drives in high-speed digital computers or similar systems. Another object of the present invention is to provide a low-profile, high-density memory package. The memory package can support both single and two bus channels. [Introduction of Invention] The object of the present invention is to provide a low-thickness, high-density electronic package for high-speed, high-performance semiconductors, such as memory devices. The memory module optionally has a bus terminal on the module. It includes multiple modules with high-speed, impedance-controlled transmission line buses, short interconnections between modules, and optional drive line terminals built into one of these modules to maintain high electrical performance. Suitable applications include, but are not limited to, microprocessor data buses and memory buses such as RAMBUS and DDR. These modules can be directly attached to a general printed circuit card without packaging or packaged chips to form the memory modules. The use of these memory modules with a bus terminal directly attached to them improves the quality and integrity of the signal and therefore enhances the performance of the system. This design can also reduce the connection required for the bus to leave, thus allowing the saved connection capacity to be used for the addressing module

558807 五、發明說明(〗〇) _ _____ 額外的記憶體容量。可 度模組在一可靠的操作溫=f熱控制結構以維護該等高密 【圖式之簡單說明】 #園内。 為使 貴審查委員如 及其目的’兹“圖步瞭解本發明之結構、特徵 产· 幸又佳具體實施例之詳細說明如 圖la習知技藝中在主機# 體排列之示意圖; 機板具有匯流排終端之多卡記憶 圖lb疋斷面圖,放大顯示圖la習知技藝中一垂直的 =金的貫孔(pi a ted-through - hole)附著連接器及記憶體 是一斷面圖, 記憶體卡; 係顯示本發明 匯流排終端在 係顯示一斷面 體封裝; 係顯示本發明 有匯流排終端 是一斷面圖, 示本發明之第 流排終端在分 斷面圖,放大 放大顯示圖la習知技藝中一低厚度 第一個實施例中一低厚度之記憶體 主機板上之示意圖; 圖’擴大圖2 a之較佳實施例中之低 之第二個實施例中一低厚度之記 在最後=個記憶體卡上之示意圖;' 放大顯示圖3a中本發明一低厚声^ 三個實施例中一低厚度之記 離之終端卡上之示意圖·, … 排 顯示圖4a中本發明一低厚度記憶體 圖1 c 連接器及 圖2a 排列具有 圖2b 厚度記憶 圖3a 體排列具 圖3b 憶體封裝 圖4a係顯 列具有匯 圖4b是―558807 V. Description of the invention (〖〇) _ _____ Extra memory capacity. The module can operate at a reliable operating temperature = f thermal control structure to maintain these high densities. [Simplified description of the diagram] # 园内. In order for your reviewers and their objectives to understand the structure and features of the present invention, the detailed description of the specific embodiment is as shown in the schematic diagram of the arrangement of the host # body in the conventional art; the board has Multi-card memory map lb 疋 cross-section view of the bus terminal, enlarged view. A vertical = gold through-hole (pi a ted-through-hole) attachment connector and memory are cross-sectional views in the conventional art. Memory card; showing the bus terminal of the present invention showing a cross-section body package; showing the bus terminal of the present invention is a cross-sectional view showing the second bus terminal of the present invention in a sectional view, zoomed in Enlarged view shows a schematic diagram of a low-thickness memory motherboard on the first embodiment of the low-thickness embodiment of the conventional art; FIG. 'Enlarges the low-second second embodiment of the preferred embodiment of FIG. 2a A schematic diagram of a low-thickness note on the last memory card; 'Enlarged view shows a low-thickness sound of the present invention in FIG. 3a ^ A schematic diagram of a low-thickness note terminal card in the three embodiments. Shows a low-thickness note of the invention in Figure 4a Memories Figure 1c Connectors and Figure 2a Array with Figure 2b Thickness Memory Figure 3a Body Arrangement Figure 3b Memories Package Figure 4a is a display with a sink Figure 4b is-

第14頁 558807 五、發明說明(11) 封裝; ' 圖5a係顯不一記憶體裝置,接觸墊及習知技術丨龍卡間 之佈線;以及 圖5b係顯示與圖5a之習知技術比較本發明所揭露之實施例 中用以增加電氣執行效能之技術。 【較佳實施例之詳細說明】 一般說來,本發明係一種低厚度,高密度之電子封 裝’用於高速,高執行效能之半導體,例如由裸記憶體晶 片或一般記憶體晶片封裝所製成之記憶體裝置。該記憶體 模組選擇性地具有匯流排終端在該模組上。其包括複數個 模組具有高速,阻抗受控制之傳輸線匯流排,模組及主機 板間短的LGA互連及可選擇的驅動線終端内建在該等模組 之一中’以維持高電氣執行效能。可以包括熱控制結構以 維護該等高密度模組在一可靠的操作溫度範圍内。 請參照圖la,其繪示出習知技藝中一多卡(2卡)記憶 體系統1 0之示意圖。一般兩個插槽及三個插槽板子在主機 板12上需要終端,甚至在所有插槽都沒使用時還是需要缓 等終端。經由電氣雜訊信號品質被成比例地衰減,標準的 卡-在-板子上(card-on-board)連接器22,36提供RIMM卡 24,38及主機板12上電路之間的信號路徑。 而為了揭露之目的一以RAMBUS為基礎之記憶體模組被 選擇’顯而易見的是本發明所教示之原則不只可以被應用 至高速記憶體次系統,例如雙倍資料讀取速率 (DDR) SDRAM,也可以應用至其他需要高速及高執行效能包Page 14 558807 V. Description of the invention (11) Package; 'Figure 5a shows the different memory devices, contact pads and conventional technology 丨 wiring between dragon cards; and Figure 5b shows a comparison with the conventional technology of Figure 5a The technology disclosed in the disclosed embodiments is used to increase electrical performance. [Detailed description of the preferred embodiment] Generally speaking, the present invention is a low-thickness, high-density electronic package 'for high-speed, high-performance semiconductors, such as those made from bare memory chips or general memory chip packages Into a memory device. The memory module optionally has a bus terminal on the module. It includes multiple modules with high-speed, impedance-controlled transmission line buses, short LGA interconnects between the module and the motherboard, and optional drive line terminals built into one of these modules to maintain high electrical Performance. Thermal control structures may be included to maintain the high-density modules within a reliable operating temperature range. Please refer to FIG. 1a, which illustrates a schematic diagram of a multi-card (2 card) memory system 10 in the conventional art. Generally, the two-slot and three-slot boards need terminals on the motherboard 12, and even when all the slots are not in use, you need to wait for the terminals. The signal quality is proportionally attenuated via electrical noise. Standard card-on-board connectors 22, 36 provide the signal path between the RIMM cards 24, 38 and the circuitry on the motherboard 12. For the purpose of disclosure, a RAMBUS-based memory module was selected. It is obvious that the principles taught by the present invention can not only be applied to high-speed memory subsystems, such as double data read rate (DDR) SDRAM, Can also be applied to other packages that require high speed and high performance

第15頁 558807 五、發明說明(13) 成第二個RIMM卡38。相類似地,RAMBUS通道節段46,經由 印刷電路板之路徑最後到達終端48。 該等終端元件,例如電阻器,阻礙(1)1〇(^11^)電容器 及/或去麵合電容器也被放置在主機板12上。在到達終端 48之前所有RAMBUS通道信號必須通過兩個連接器22,36 且穿過兩個RIMM卡24,38。信號下降沿著RAMBUS通道發 生’特別是在連接器2 2及3 6。此外,有用的π真實資產"( real estate)在主機板12上是被充滿的。 RIMM卡24 ’ 38典型上是印刷電路板結構,包括環氧一 樹脂-基材料(例如FR4)且包含一個或更多導電(例如,信 號,電源及/或接地)層在其中。因為RAMBUS規格之迫切 性’該等信號路徑與該系統之阻抗必須匹配在百分之十 内。 以下圖lb及lc係繪示圖ia中之連接器22及36之水平及 垂直斷面圖。因為連接器22及36實質上是相同的,在圖lb 及1 c中只繪示連接器2 2。 請參照圖1 b ’其繪示出一斷面圖,放大顯示圖丨a習知 技藝中一垂直的錄金的-貫孔(plated-through-hole)附著 連接器及記憶體卡。連接器22,之該等彈力—負載接點23, 提供主機板12及RIMM卡24上接觸墊29之電氣連接。此種形 態之連接器2 2 ’是適用於貫孔附著或表面黏著 (surface-mount)附著至例如主機板12(圖ia)之結構,具 有貫孔附著型態在電氣上是較差的但卻較常使用。在另一 種情形中’該專彈力-負載接點23’導致大幅之電氣不連續Page 15 558807 V. Description of the invention (13) It becomes the second RIMM card 38. Similarly, the RAMBUS channel segment 46 reaches the terminal 48 via the path of the printed circuit board. Such terminal components, such as resistors, hinder (1) 10 (^ 11 ^) capacitors and / or de-bonding capacitors are also placed on the motherboard 12. All RAMBUS channel signals must pass through two connectors 22, 36 and pass through two RIMM cards 24, 38 before reaching terminal 48. A signal drop occurs along the RAMBUS channel ', especially at connectors 2 2 and 36. In addition, useful real estate is filled on the motherboard 12. RIMM card 24 ' 38 is typically a printed circuit board structure that includes an epoxy-resin-based material (e.g., FR4) and contains one or more conductive (e.g., signal, power, and / or ground) layers therein. Because of the urgency of the RAMBUS specification, these signal paths and the impedance of the system must match within 10 percent. The following figures lb and lc are horizontal and vertical sectional views of the connectors 22 and 36 in FIG. Because the connectors 22 and 36 are substantially the same, only the connector 22 is shown in FIGS. 1b and 1c. Please refer to FIG. 1 b ′, which is a cross-sectional view showing an enlarged view. In the conventional art, a vertical gold-plated-through-hole attachment connector and a memory card are shown. The connectors 22, the spring-load contacts 23, provide electrical connection of the contact pads 29 on the motherboard 12 and the RIMM card 24. This type of connector 2 2 'is suitable for through-hole attachment or surface-mount attachment to, for example, a motherboard 12 (Figure ia) structure. Having a through-hole attachment type is electrically inferior but More commonly used. In another case, the 'special spring-load contact 23' causes a large electrical discontinuity.

558807 五、發明說明(14) ------ =L尤其在今日之高匯流排速度。此阻抗不連續性顯然的 加電氣雜訊及導致反射之時間延遲。此外,此垂直形 態之連接器在低厚度之應用中是不可用的。 夕 請參照圖1 c,其繪示出一斷面圖,放大顯示圖丨&習知 技藝中一低厚度連接器及記憶體卡。連接器22,,之該等彈 力一負載接點23,,提供主機板12及RIMM卡24上接觸執?q夕 電氣連接。此形態之連接器22,主要地是適用 附著至例如主機板12(圖la)之結構。再次地,該等彈力一 負載接點2 3 ’導致大幅之電氣不連續性,尤其在今曰之高 匯流排速度。 n 連接器22’ ’之水平型態具有較低厚度以使其可使用在 較低厚度之應用中,但在多卡應用中需要更多主機板之實 際空間。一個本連接器之兩層堆疊版本是有效的,但因為 至彈力-負載接點之連接係較長的,該電氣不連續性及電 氣雜訊因此是更糟的。 s己憶體模組2 4,3 8上之記憶體裝置2 8之特定排列及位 置與特定之應用是非常相關的且對習知技術及本發明以下 之揭露不影響,但該等記憶體之數量是RAMBUS規格之主題 及限制。 根據本發明不同實施例之三種低厚度之記憶體排列在 以下被揭露’主要之不同係圖2 a及2 b之範例中顯示該匯流 排終端48係在主機板1 2上,圖3a及3b之範例中顯示該匯流 排終端48係在最後一個卡82上,及圖4a及4b之範例中顯示 該匯流排終端4 8係在分離之終端卡9 2上。558807 V. Description of the invention (14) ------ = L Especially at today's high bus speed. This impedance discontinuity obviously adds electrical noise and causes a time delay that causes reflections. In addition, this vertical connector is not available in low thickness applications. Please refer to FIG. 1c, which is a cross-sectional view showing an enlarged view of a low-thickness connector and a memory card in the conventional art. The connector 22, and the elastic-load contact 23, provide contact and execution on the motherboard 12 and the RIMM card 24? qxi Electrical connection. The connector 22 in this form is mainly a structure suitable for attachment to, for example, the motherboard 12 (Fig. 1a). Again, these spring-load contacts 2 3 ′ cause significant electrical discontinuities, especially at today's high bus speeds. The horizontal form of the n connector 22 '' has a lower thickness so that it can be used in lower thickness applications, but in multi-card applications it requires more real space on the motherboard. A two-layer stack version of this connector is effective, but because the connection to the spring-load contact is longer, the electrical discontinuities and electrical noise are worse. The specific arrangement and position of the memory device 2 8 on the memory module 2 4, 3 8 is very relevant to the specific application and does not affect the conventional technology and the following disclosure of the present invention, but these memories The number is the subject and limit of the RAMBUS specification. Three types of low-thickness memory arrays according to different embodiments of the present invention are disclosed below. The main differences are shown in the example of FIGS. 2 a and 2 b. The bus terminal 48 is shown on the motherboard 12, FIGS. 3 a and 3 b. The example shows that the bus terminal 48 is on the last card 82, and the examples in FIGS. 4a and 4b show that the bus terminal 48 is on a separate terminal card 92.

第18頁 558807 五、發明說明(15) -- 請參照圖2a,其繪示出本發明一低厚度記憶體卡系統5〇之 不思圖。再次的主機板12之部分顯示出具有實現RAMBUS記 憶體系統所需之支援電路。一個直接RAMBUS時脈產生器電 路14及一主裝置16包括一直接RAMBUS “^胞18與如上所 述之圖1 a習知技術之記憶體卡相同之方法被實施在主機板 12上。 違RAMBUS通道郎段20連接DRAC18至一 LGA連接器52。再次 地,該等RAMBUS通道節段20連接一般係由主機板12兩面板 上之印刷線路路徑(圖未示)所製成。LGA連接器5 2係放置 在主機板12及第一卡54之間,且提供其間之電氣互連。 LGA連接器52,64—般具有複數個短且有彈力的構件53(圖 2b)以容置主機板12上之接觸墊51,且再次地從第--^54 至第一卡66。較佳的是該LGA連接器52,64之外殼/載體49 具有熱擴展係數(coefficient of thermal expansion, CTE)以密切地匹配周圍卡54,66。 接觸構件5 3是一較佳結構且其構成請參考共同申請中之美 國專利申请案之教示且藉由其他兩個共同申請中之美國專 利申請案之教示更增強電氣及機械效能。與習知技術之腳 位及插座LGA連接器比較,本發明之連接器52,64提供效 能之提升’增加密度,較低高度,及一熱擴展係數(CTE) 以較佳地匹配周圍結構。此外,因為連接器52 , 64之每一 個接點需要較小的力量,對於已知之保留力量允許接點數 量的大幅增加。 RAMBUS通道節段2〇由匯流排進入區域56進入第一個卡54且Page 18 558807 V. Description of the invention (15)-Please refer to FIG. 2a, which illustrates a schematic diagram of a low-thickness memory card system 50 according to the present invention. The part of the motherboard 12 again is shown to have supporting circuits required to implement the RAMBUS memory system. A direct RAMBUS clock generator circuit 14 and a host device 16 include a direct RAMBUS cell 18 and the same method as the memory card of the conventional technology shown in FIG. 1a described above is implemented on the motherboard 12. Violating the RAMBUS The channel segment 20 connects the DRAC18 to an LGA connector 52. Again, the RAMBUS channel segment 20 connection is generally made by printed circuit paths (not shown) on the two panels of the motherboard 12. The LGA connector 5 The 2 series is placed between the main board 12 and the first card 54 and provides electrical interconnection therebetween. The LGA connectors 52, 64 generally have a plurality of short and resilient members 53 (Figure 2b) to accommodate the main board 12 on the contact pad 51, and again from-^ 54 to the first card 66. It is preferable that the housing / carrier 49 of the LGA connector 52, 64 has a coefficient of thermal expansion (CTE) In order to closely match the surrounding cards 54, 66. The contact member 53 is a better structure and its composition please refer to the teaching of the US patent application in the common application and the teaching of the US patent application in the other two common applications. Enhance electrical and mechanical performance. Compared with the LGA connector and the socket, the connectors 52 and 64 of the present invention provide an increase in performance, 'increased density, lower height, and a coefficient of thermal expansion (CTE) to better match the surrounding structure. In addition, because Each contact of the connectors 52, 64 requires less force, allowing a significant increase in the number of contacts for known retention forces. The RAMBUS channel segment 20 enters the first card 54 from the bus entry area 56 and

第19頁 558807 五、發明說明(16) 然後被連接至複數個單獨之記憶體裝置28經由裝置連接節 段58以附著至RIMM卡54。該RAMBUS通道然後經由一匯流排 離開區域60離開RIMM卡54,且RAMBUS通道62經過LGA連接 器64直接由第一個卡54至第二個卡66以取代回到主機板 12 〇 一RAMBUS通道進入部分68,一串列之記憶體裝置28, 一串列之裝置連接節段70,及一RAMBUS通道離開部分72組 成第二個卡66。相類似地,RAMBUS通道節段74,回程經由 連接器52,64之其他接觸構件53之較短距離最後到達終端 48。如習知技術之情形,該等終端元件,例如電阻器,阻 礙電容器及/或去耦合電容器也被放置在主機板12上。 卡54及66 (圖2b)典型上係由印刷電路板之環氧基-玻 璃-基(epoxy-glass-based)材料所組成(例如,FR4)且包 含一或多個導電層(例如,信號,電源及/或接地)在其 中。為了包括電氣執行效能,可佈線性,及熱執行效能等 其他理由各種材料可以被使用,但該環氧基-玻璃-基材料 是具價格-效益比且具有一價格-效益比且具有一熱擴展係 數(CTE)以較佳地匹配主機板12及連接器52,64。再次 地,因為RAMBUS電氣規格之迫切性,該信號路徑必須與系 統阻抗在百分之十範圍内匹配。 現在請參照圖3 a及3 b,顯示本發明之實施例中一低厚 度之記憶體卡系統80之示意圖。再次的主機板1 2之部分顯 示出具有實現RAMBUS記憶體系統所需之支援電路。一個直 接RAMBUS時脈產生器電路η及一主裝置16包括一直接Page 19 558807 V. Description of the Invention (16) It is then connected to a plurality of separate memory devices 28 via a device connection section 58 for attachment to the RIMM card 54. The RAMBUS channel then leaves the RIMM card 54 via a bus leaving area 60, and the RAMBUS channel 62 passes from the first card 54 to the second card 66 directly through the LGA connector 64 instead of returning to the motherboard 120. The RAMBUS channel enters Section 68, a series of memory devices 28, a series of device connection sections 70, and a RAMBUS channel exit section 72 form a second card 66. Similarly, the RAMBUS channel segment 74 returns to the terminal 48 via the shorter distances of the other contact members 53 of the connectors 52, 64. These termination elements, such as resistors, blocking capacitors and / or decoupling capacitors, are also placed on the motherboard 12 as is the case with conventional techniques. Cards 54 and 66 (Figure 2b) are typically composed of epoxy-glass-based materials (e.g., FR4) for printed circuit boards and include one or more conductive layers (e.g., signals , Power and / or ground). Various materials can be used for other reasons including electrical performance, wiring, and thermal performance, but the epoxy-glass-based material has a price-benefit ratio and has a price-benefit ratio and has a thermal Expansion factor (CTE) to better match motherboard 12 and connectors 52,64. Again, because of the urgency of the RAMBUS electrical specifications, this signal path must match the system impedance within ten percent. Referring now to Figs. 3a and 3b, a schematic diagram of a low-thickness memory card system 80 according to an embodiment of the present invention is shown. The part of the motherboard 12 again shows that it has the supporting circuits required to implement the RAMBUS memory system. A direct RAMBUS clock generator circuit η and a master device 16 include a direct

第20頁 558807 五、發明說明(17) RAMBUS ASIC胞18與如上所述之圖2a中實施例之記憶體卡 相同之方法被實施在主機板1 2上。第——^ 5 4也是沒有改 變。第二卡82包含一RAMBUS通道進入部分84,一串列之記 憶體裝置28,一串列之裝置連接節段86。但不像圖2a及2b 中之實施例終端48被直接黏著在卡82上,藉以減少RAMBUS 通道72及RAMBUS通道節段74所需之離開部份(圖2a)。藉由 減少一個完整、額外之接點集合,此額外之空間允許定址 額外之記憶體容量,且簡化並降低卡8 2之成本。在一情形 中可將印刷電路板由8層降為6層。將終端48直接黏著在卡 82上之另外一個好處是較少之雜訊被耦合至主機板1 2中, 潛在地增加整個系統之執行效能。 現在請參照圖4 a及4 b,顯示本發明之實施例中一低厚 度之記憶體卡系統90之示意圖。再次的主機板1 2之部分顯 示出具有實現RAMBUS記憶體系統所需之支援電路。一個直 接RAMBUS時脈產生器電路14及一主裝置16包括一直接 RAMBUS ASIC胞18與如上所述之圖2a及3a中實施例之記憶 體卡相同之方法被實施在主機板1 2上。但是為了得到較為 確定之應用,本實施例係由前面兩個實施例所延伸出。當 終端直接裝在卡上之好處已被了解後且如上所述之理由係 非常令人滿意的,由製造及邏輯觀點來看,完全相同的之 δ己憶體卡也同樣地需要。一種達成此需求之方法係由圖2 a 及2b中兩個卡54,66開始,但具有終端48黏著在分離之終 端卡92上。終端卡92更包含RAMBUS通道進入部分94且經由 連接器9 6被連接。Page 20 558807 V. Description of the invention (17) The RAMBUS ASIC cell 18 is implemented on the motherboard 12 in the same manner as the memory card of the embodiment shown in FIG. 2a. No. ^ 5 4 is also unchanged. The second card 82 includes a RAMBUS channel entry section 84, a series of memory devices 28, and a series of device connection sections 86. However, unlike the embodiment shown in Figs. 2a and 2b, the terminal 48 is directly adhered to the card 82, thereby reducing the required exit portion of the RAMBUS channel 72 and the RAMBUS channel segment 74 (Fig. 2a). By reducing a complete, extra set of contacts, this extra space allows addressing additional memory capacity and simplifies and reduces the cost of the card 82. In one case, the printed circuit board can be reduced from 8 layers to 6 layers. Another advantage of directly attaching the terminal 48 to the card 82 is that less noise is coupled into the motherboard 12, potentially increasing the performance of the entire system. Now referring to Figs. 4a and 4b, a schematic diagram of a low-thickness memory card system 90 according to an embodiment of the present invention is shown. The part of the motherboard 12 again shows that it has the supporting circuits required to implement the RAMBUS memory system. A direct RAMBUS clock generator circuit 14 and a host device 16 including a direct RAMBUS ASIC cell 18 are implemented on the motherboard 12 in the same manner as the memory card of the embodiment shown in Figs. 2a and 3a as described above. However, in order to obtain a more certain application, this embodiment is extended from the previous two embodiments. When the benefits of installing the terminal directly on the card have been understood and the reasons described above are very satisfactory, from the manufacturing and logical point of view, the same δ-memory card is also required. One way to achieve this is to start with the two cards 54, 66 in Figs. 2a and 2b, but with the terminal 48 adhered to the separate terminal card 92. The terminal card 92 further includes a RAMBUS channel access portion 94 and is connected via a connector 96.

558807 五、發明說明(18) 在本發明中,因為在腳位及插座型態互連中並未具有 一保留力量’一箝板機構(clamping fflechaniSffl)可被用來 創造所需力量以確保連接器52,64,96之每一個接觸構件 53被壓縮一適當地量以形成至該等電路元件所須之互連。 較佳的是該箝板機構在主機板丨2上並不需要任何附著孔, ,該等接觸構件53陣列上提供一受控制且統一之位移力 量,以避免CTE不匹配之問題,且是場地隔離的以方便使 用者維修及升級。558807 V. Description of the invention (18) In the present invention, because there is not a reserved force in the foot and socket type interconnection, a clamping fflechaniSffl can be used to create the required force to ensure the connection Each of the contact members 53 of the actuators 52, 64, 96 is compressed by an appropriate amount to form the interconnections required to the circuit elements. Preferably, the nipper mechanism does not require any attachment holes on the main board. The array of these contact members 53 provides a controlled and uniform displacement force to avoid the problem of CTE mismatch and is a venue. Isolated for user maintenance and upgrade.

雖然一個將卡54,66,82至主機板12排成直線之裝置 在本實施例中並未特別顯示出,但熟悉此技藝之人士當可 輕易的了解並加以實現。 該低密度記憶體卡系統50,8〇,9〇之自然散熱效率是低 的,因為記憶體裝置28從晶片或封裝至空氣缺乏一有效率 之熱轉換介質,且在氣流方向中缺乏一短的空氣通道(例 如與主機板12平行)。 因為今曰記憶體裝置28相對大之容量且在此密集的封 f中鄰近其他記_憶體裝置28之熱源產生使散熱更惡化。熱 管理結構(圖未示)可以被包含在本發明之系統中以最佳化 熱傳導及輻射,如此在不具熱增長下允許電路密度最大Although a device for aligning the cards 54, 66, 82 to the motherboard 12 is not particularly shown in this embodiment, those skilled in the art can easily understand and implement it. The low-density memory card system 50, 80, 90 has low natural heat dissipation efficiency, because the memory device 28 lacks an efficient heat transfer medium from the chip or package to the air, and lacks a short in the direction of the air flow. Air channel (for example, parallel to the motherboard 12). This is because the relatively large capacity of the memory device 28 and the heat generated by other memory devices 28 in this dense package f make the heat dissipation worse. Thermal management structures (not shown) can be included in the system of the present invention to optimize heat conduction and radiation, thus allowing maximum circuit density without thermal growth

化,此熱增長將使記憶體裝置28之執行效能及可靠度降 低0 熱管理結構之作用是從記憶體裝置28吸熱且可以用許 =方法去實施。它們可能像一層例如鋁之熱傳導材料般簡 單,藉由熱增強複合物或箝板附著或保持至記憶體裝置This thermal increase will reduce the performance and reliability of the memory device 28. The role of the thermal management structure is to absorb heat from the memory device 28 and can be implemented in a number of ways. They may be as simple as a layer of thermally conductive material, such as aluminum, attached or held to the memory device by a heat-reinforced composite or a nipper.

第22頁 558807 五、發明說明(19) 2 8。該熱管理結 幫助散熱。其他 熱管路,及熱電 本發明之技術中 雖然以上所 每個實施例都具 而易見的即複數 的材料及記憶體 些型態的變化皆 在下文中所 點。 與習知技術 被沿著單一邊緣 多法被最佳化放 力,可靠度及電 最佳化。 本發明如何 卡54, 66, 82上信 圖5b中。圖5a顯 墊29典型接線。 之長度係依記憶 所有信號經由相 3 6。如此將導致 延遲及雜訊耦合 構也可此更複雜且包括例如複數個鰭片以 方法可能包括使用液態熱轉移材料,薄的 裝置等。甚至其他解決散熱問題之方法在 將是顯而易見的。 揭露之三個實施例中為了揭露之目的顯示 有兩個記憶體卡裝置’在本技藝中將是顯 個參數例如數量’形狀規格,尺寸,及卡 裝置的數量及封裝係依需求而改變的。這 在本發明之範圍中。 述將是本發明在所有實施例中之利益及優 之RIMM卡24,38相比(其所有之接點必須 放置),所有卡54,66,82允許接觸墊以許 置以增加執行效能例如接點密度,接線能 氣及機械執行效能。如此也可將主機板12 提供一與習知技術(圖5 a)相比可以最佳化 號連接之電氣特性之方法之範例係顯示在 示該記憶體裝置28至RIMM卡24,38之接觸 該信號連接25至記憶體裝置28之接觸墊27 體裝置28之最小長度「L」而改變,因為 同之邊緣31進入及離開該等RIMM卡22, 本發明(圖5b)之該等信號連接不同之時間 ,藉由明智而審慎的將接觸墊55放置在卡Page 22 558807 V. Description of the Invention (19) 2 8. The thermal management junction helps dissipate heat. Other heat pipes, and thermoelectricity Although the technology of the present invention is easy to see in each of the above embodiments, that is, a plurality of materials and memories, these types of changes are described below. And the conventional technology is optimized along a single edge and multiple methods are optimized for power, reliability and electricity optimization. How the present invention is shown in Fig. 5b. Figure 5a shows a typical wiring of pad 29. The length is based on the memory of all signals through phase 3 6. This will lead to delay and noise coupling. The structure may also be more complicated and include, for example, a plurality of fins. Methods may include the use of liquid heat transfer materials, thin devices, etc. Even other solutions to thermal issues will be apparent. In the three disclosed embodiments, two memory card devices are shown for the purpose of disclosure. “In this technology, there will be obvious parameters such as the number, shape specifications, dimensions, and the number and packaging of card devices. . This is within the scope of the present invention. Compared with the RIMM card 24, 38 (all its contacts must be placed), all the cards 54, 66, 82 will allow the contact pads to be placed in order to increase the performance. Contact density, wiring energy and mechanical performance. In this way, an example of a method that can provide the motherboard 12 with an electrical characteristic that can optimize the number of connections compared with conventional technology (Figure 5a) is shown in the memory device 28 to the RIMM card 24, 38 contact The signal connection 25 is connected to the contact pad 27 of the memory device 28. The minimum length "L" of the body device 28 is changed because the same edge 31 enters and leaves the RIMM cards 22. The signal connections of the present invention (Figure 5b) At different times, place the contact pad 55 on the card wisely and carefully

第23頁 五、發明說明(20) 54,66,82上,最小化且等化該長度將是可 佳化卡54, 66, 82上所有信號連接57。 、 最 圖=中所顯示之最佳化方法的另外一 省實際所使用之空間。在一些情形中 即 82(圖明之大小及/或複雜性。在其他情之 空間可以被用來改善該等低密度記憶體卡 50, 80, 90 (圖2b,3b,4b)之電氣執行效能。在^ 等關鍵性的線路例如時脈線可以被藉由允許從;,該 (noisier)線路中分離/隔離以改善電氣執行效^ 信號之衰減沿著RAMBUS通道路徑產生, 連接器匕可以看到的是,與圖… 在二專 之所有rr長度’及所有之時間延長被=== 匯k排長度之減少可簡化匯流排上驅動器 低成本及增加可靠度。 J ^ 一般而言,較高記憶體存取速度可以藉由改善ramms通道 之品質而得到(例如’降低通道長度,通道延遲,串音 等)。該路徑長度之降低以及節省該等記憶體卡及終端之 間的Ϊ接器大幅改善電氣整體性。在一個範例中習知技術 連接益22’^2之電氣未屏蔽彈力負載接點23,,23"是 0· 150央吋尚,,在本發明中,連接器52, 64之接觸構件 長度只有0.060英吋長。當接觸構件53被封裝在一有屏蔽 外殼時(如前述共同申請中之美國專利案之一所教示)該電 氣不連續性被最最小化。在本發明中為了一個信 一 558807Page 23 V. Description of the invention (20) 54, 66, 82. Minimizing and equalizing the length will optimize all signal connections 57 on the card 54, 66, 82. The best way to optimize the method shown in the figure is the actual space used by another province. In some cases it is 82 (the size and / or complexity of the picture. In other cases, the space can be used to improve the electrical performance of these low-density memory cards 50, 80, 90 (Figures 2b, 3b, 4b). . In key circuits such as clocks can be separated from / isolated in the circuit to improve electrical performance. Signal attenuation is generated along the RAMBUS channel path. The connector can be seen. The result is that with the figure ... all the rr lengths in the second school and all the time extensions are reduced === the reduction of the bus k length can simplify the driver's low cost and increase the reliability of the bus. J ^ Generally speaking, High memory access speed can be obtained by improving the quality of the ramms channel (for example, 'reducing channel length, channel delay, crosstalk, etc.). The reduction of the path length and saving the connection between these memory cards and terminals The electrical integrity of the device is greatly improved. In one example, the electrical unshielded elastic load contact 23, 23 " of the conventional technology connection benefit 22 '^ 2 is 0. 150 center inches. In the present invention, the connector 52 , 64 contact member length It is 0.060 inches long. This electrical discontinuity is minimized when the contact member 53 is packaged in a shielded enclosure (as taught in one of the aforementioned U.S. patent applications). In the present invention, a letter A 558807

五、發明說明(21) 卡54橫越至第二卡66, 82,通過兩個長的,未屏蔽的,電 氣雜訊的連接器22,36及一 RAMBUS通道節段圖ia)是被 消除的。如此亦可簡化接線且/或降低主機板丨2之成本。 移除且變短之該等連接器改善了電磁干擾(EMI)之磁 化率(susceptibility)且亦降低主機板12及卡54, 66, 82之 射頻輻射。 與習知技術電路RIMM卡24, 38(圖la,ib)相比較,其只 允許一定數量(例如8或16)之記憶體裝置28,而+發明為^ 了密度最大化藉由允許記憶體裝置28之其他分割允許完全V. Description of the invention (21) Card 54 traverses to the second card 66, 82, through two long, unshielded, electrical noise connectors 22, 36 and a RAMBUS channel segment (Figure ia) is eliminated of. This can also simplify wiring and / or reduce the cost of the motherboard. Removing and shortening these connectors improves the susceptibility of electromagnetic interference (EMI) and also reduces the RF emissions of motherboard 12 and cards 54, 66, 82. Compared with the conventional technology circuit RIMM card 24, 38 (Fig. La, ib), it only allows a certain number (for example, 8 or 16) of the memory device 28, and + is invented to maximize the density by allowing memory Other divisions of device 28 allow complete

使用卡54,66,82上所有可使用之空間,否則將盔法凡王 成。 /延 雖然本發明已以較佳實施例揭露如上,然其並 限定士發明,任何熟悉此項技藝者,纟不脫離本發 神fe圍Θ ’當可作少許之更動與潤飾,因此本: 護fe圍當視後附之申請專利範圍所界定者為準。 保Use all available space on cards 54, 66, 82, otherwise the helmet will become king. / Extended Although the present invention has been disclosed as above in a preferred embodiment, it does not limit the invention of the scholar. Anyone who is familiar with this skill will not deviate from the fascination fe Θ 'when it can be modified and retouched a little, so this: Protective devices shall be subject to the definition of the scope of patent application attached. Guarantee

第25頁 558807 圖式簡單說明 【圖式之簡單說明】 圖1 a習知技藝中在主機板具有匯流排終端之多卡記憶 體排列之不意圖; 圖lb疋一斷面圖’放大顯示圖ia習知技藝中一垂直的 鍍金的-貫孔附著連接器及記憶體卡; 圖lc是一斷面圖,放大顯示圖la習知技藝中一低厚度 連接器及記憶體卡; 圖2a係顯示本發明第一個實施例中一低厚度之記憶體 排列具有匯流排終端在主機板上之示意圖; 圖2b係顯示一斷面圖,擴大圖2a之較佳實施例中之低 厚度記憶體封裝; 圖3a係顯示本發明之第二個實施例中一低厚度之記憶 排列具有匯流排終端在最後一個記憶體卡上之示意圖; 情#ϊΐ是一斷面圖’放大顯示圖3a中本發明一低厚度記 篤體封裝; · 列Iί項不本發明之第三個實施例中一低厚度之記憶體排 匯流排終端在分離之終端卡上之示意圖; 封裝?斷面圖,放大顯不圖4a中本發明一低厚度記憶體 :5佈I顯::記憶體裝置,接觸墊及習知技術2RIMM卡間 3 5用b t :: Γ ί圖58之習知技術比較本發明所揭露之實施例 甲用以增加電氣執行效能之技術。 【圖式元件標號說明】 第26頁 558807 圖式簡單說明 記憶體系統 10 主機板 12 RAMBUS時脈產生器電路 14 主裝置 16 直接RAMBUS ASIC 胞 18 RAMBUS通道節段 20 連接器 22 連接器 22, 連接器 22, ’ 彈力-負載接點 23, 彈力-負載接點 23, ’ RIMM 卡 24 信號連接 25 匯流排進入區域 26 接觸墊 27 記憶體裝置 28 接觸墊 29 裝置連接節段 30 邊緣 31 匯流排離開區域 32 RAMBUS通道節段 34 連接器 36 RIMM 卡 38 RAMBUS通道進入部分 40 裝置連接節段 42 RAMBUS通道節段 46 終端 48 外殼/栽體 49 記憶體卡系統 50 接觸墊 51 LGA連接器 52 彈力構件 53 RIMM 卡 54 接觸墊 55 匯流排進入區域 56 信號連接 57 裝置連接節段 58 匯流排離開區域 60 RAMBUS通道 62 LGA連接器 64 RIMM 卡 66 RAMBUS通道進入部分 68 裝置連接節段 70 RAMBUS通道離開部分 72 RAMBUS通道節段 74 記憶體卡系統 80 RIMM 卡 82 RAMBUS通道進入部分 84Page 25 558807 Brief description of the drawings [Simplified description of the drawings] Fig. 1 a Unintended arrangement of a multi-card memory arrangement having a bus terminal on the motherboard in the conventional art; A vertical gold-plated-through-hole attachment connector and a memory card in the ia technique; FIG. lc is a cross-sectional view showing an enlarged view of a low-thickness connector and a memory card in the la technique; FIG. 2a A schematic diagram showing a low-thickness memory arrangement with a bus terminal on a motherboard in the first embodiment of the present invention; FIG. 2b is a cross-sectional view showing an enlarged low-thickness memory in the preferred embodiment of FIG. 2a Package; Figure 3a is a schematic diagram showing a low-thickness memory arrangement with a bus terminal on the last memory card in the second embodiment of the present invention; Invent a low-thickness memory package; • The first embodiment of the third embodiment of the present invention is a schematic diagram of a low-thickness memory bus terminal on a separate terminal card; package? Sectional view, enlarged view. In Figure 4a, a low-thickness memory of the present invention: 5 cloth I display :: memory device, contact pad and conventional technology 2 RIMM card room 3 5 bt :: Γ Figure 58 Technical Comparison A technique for increasing the electrical performance of the embodiment A disclosed in the present invention. [Illustration of reference numerals of components of the figure] Page 26 558807 The diagram briefly illustrates the memory system 10 motherboard 12 RAMBUS clock generator circuit 14 main device 16 direct RAMBUS ASIC cell 18 RAMBUS channel segment 20 connector 22 connector 22, connection Device 22, 'elastic-load contact 23, elastic-load contact 23,' RIMM card 24 signal connection 25 bus entry area 26 contact pad 27 memory device 28 contact pad 29 device connection segment 30 edge 31 bus departure Area 32 RAMBUS channel segment 34 Connector 36 RIMM card 38 RAMBUS channel entry section 40 Device connection segment 42 RAMBUS channel segment 46 Terminal 48 Housing / plant 49 Memory card system 50 Contact pad 51 LGA connector 52 Elastic member 53 RIMM card 54 contact pad 55 bus entry area 56 signal connection 57 device connection section 58 bus exit area 60 RAMBUS channel 62 LGA connector 64 RIMM card 66 RAMBUS channel entry section 68 device connection section 70 RAMBUS channel exit section 72 RAMBUS Channel segment 74 Memory card system 80 RIMM card 82 RAMBUS channel entry section 84

第27頁 558807 圖式簡單說明 裝置連接節段 86 記憶體卡系統 90 終端卡 92 RAMBUS通道進入部分 94 連接器 96Page 27 558807 Brief description of the diagram Device connection section 86 Memory card system 90 Terminal card 92 RAMBUS channel entry section 94 Connector 96

Hi 第28頁Hi Page 28

Claims (1)

558807 、申請專利範® 1· 一種用於高頻半導體裝置之電子封裝,复 a)複數個電路構件,其具有一第一表面及一 面,有複數個接觸墊設置在第一表面 7人 之至少-:用,連接至一外界資料匯流排;“接觸塾中 、b)第電氣連接裝置,包括一接觸構件以 ^ 連,有效地連接至$ φ I # /、電氣互 之至Η固,:ί 路構件之第一表面上該等接觸墊中 個 M形成該外界資料匯流排之延伸· 個襄置被放置在該等電路構件之至少 伸; 擇^生地被連接至该外界資料匯流排之延 d)複數個接觸塾設 第二表面上,該等接觸塾中在Λ少個構更件延之/Λ—個之 匯流排; 個更延伸該外界資料 壓縮^第失Λ\置連接係/寸署著至該電路構件之至少一個,以 伸。 裝置有效地被連接至該資料匯流排之延 之電子封t:: ^::,1項一所述之用於高頻半導體裝置 置顯示-阻抗實質上與;特;阻:::且該匯流排終端裝 •如申請專利範圍第丨項所 -己。 之電子封裝,复推一丰A, 攻之用於高頻半導體裝置 置有效地連接:該;;線裝置,該排成直線裝 該第-電氣連接褒置之裝置排成個’以便將連接至 558807 -91inQnoi 今 γ 「曰〆^ 修if 六、申請專利“ ---- 4 ·如申請專利範圍第1項所述之用於高頻半導體裝置 、 之電子封装’其進一步包括第;電氣連接裝置設置在兩個 電路構件之間,且有效地連接炱該電路構件之至少一個之 第表面上該等接觸墊中之至少,個及該電路構件之第二 表面上該等接觸墊中之至少一個。 5·如申請專利範圍第4項所述之用於高頻半導體裝置 之電子封裝,其進一步包括排成直線裝置,該排成直線裝 置有效地連接至該等電路構件之灵少一個,以便將連接至 該第二電氣連接裝置之裝置排成〆直線。& 6 ·如申請專利範圍第2項所述之用於向頻半導體裝置 _ 之電子封裝,其中該匯流排終端装置包括下列電子零件群 組中之至少一種:複數個電阻器、複數個電容器及複數個 電感器。 7·如申請專利範圍第6項所述之用於高頻半導體裝置 之電子封裝,其中該等電阻器包括分散式&電阻器。 8·如申請專利範圍第6項所述之用於高頻半導體裝置 之電子封裝,其中該等電阻器包括/排阻器。 9·如申請專利範圍第e項所述之用於南頻半導體裝置 之電子封裝,其中該等電阻器包括一固態,阻裝置。 1 〇 ·如申請專利範圍第2項所述之用於向頻半導體裝置鲁 之電子封裝,其中該匯流排終端装置係置於該電子封裝之 外。 如申請專利範圍第2項所述之用頻半導體裝置 之電子封裝,其中該匯流排終端裝置係置於該等電路構件558807, patent application range 1 · An electronic package for high-frequency semiconductor devices, a) a plurality of circuit components, which has a first surface and a side, and a plurality of contact pads are arranged on the first surface for at least 7 people -: Used to connect to an external data bus; "contact 塾 中, b) the electrical connection device, including a contact member to connect ^, effectively connected to $ φ I # /, the electrical connection to the solid ,: ί Among the contact pads on the first surface of the road member, the M forms an extension of the external data bus. A placement is placed on at least the extension of the circuit components; the place of choice is connected to the external data bus. Extension d) a plurality of contacts are set on the second surface, and among these contacts, there are Λ fewer components and Λ—a bus; Extending the compression of the external data The device is effectively connected to at least one of the circuit components to extend. The device is effectively connected to the extension of the data bus t :: ^ ::, as described in item 1 for high-frequency semiconductor device installation. Display-impedance is essentially the same as; And the bus terminal device is installed in the same electronic package as the patent application No. 丨. It is re-launched by Yifeng A, which is used to connect high-frequency semiconductor devices effectively: this; line device, this line Straight install the first-electrical connection device in a row so as to connect to 558807 -91inQnoi this day "Yi ^^ repair if VI, apply for a patent" ---- 4 · As described in the first scope of the patent application It is used for high-frequency semiconductor devices, and electronic packaging. It further includes a first; an electrical connection device is provided between two circuit members, and effectively connects one of the contact pads on the first surface of at least one of the circuit members. At least one of the contact pads and the second surface of the circuit member. 5. The electronic package for a high-frequency semiconductor device as described in item 4 of the scope of the patent application, further comprising a linear device that is effectively connected to one of these circuit components, so that The devices connected to the second electrical connection device are aligned in a straight line. & 6 The electronic package for frequency-frequency semiconductor devices as described in item 2 of the scope of patent application, wherein the bus terminal device includes at least one of the following electronic component groups: a plurality of resistors, a plurality of capacitors And a plurality of inductors. 7. The electronic package for high-frequency semiconductor devices as described in item 6 of the scope of patent application, wherein the resistors include distributed & resistors. 8. The electronic package for high-frequency semiconductor devices as described in item 6 of the scope of patent application, wherein the resistors include / excluder. 9. The electronic package for a south frequency semiconductor device as described in item e of the patent application scope, wherein the resistors include a solid state, resistive device. 1 〇 An electronic package for a frequency-frequency semiconductor device as described in item 2 of the scope of patent application, wherein the bus terminal device is placed outside the electronic package. An electronic package for a frequency-consumption semiconductor device as described in item 2 of the scope of patent application, wherein the bus terminal device is placed on such circuit components 558807 ^ 91109001_f车乙月/日 J务正 六、申請專利範圍 之一〇 之電1 2 ·如申請專利範圍第2項所述之用於高頻半導體裝置 壯L ^封裝’進一步包括一終端模組且其中該匯流排終端 裝置係晉μ # ^ 於该終端模組上。 之電·如申請專利範圍第1項所述之用於高頻半導體裝置 ^ , τ η子封裝’其中該第一電氣連接裝置係為一承座格距陳 列(LGA)連接器。 干 置之14·如申請專利範圍第13項所述之用於高頻半導體襄 漆^It封裝’其中該承座格距陣列連接器是由高度連接 々提供之一以SuperbuttonTM為基礎之連接器。 之電·如申請專利範圍第1項所述之用於高頻半導體裝置 ^封裳’其中該等半導體裝置是一記憶體裝置。 之電子·如申請專利範圍第1項所述之用於高頻半導體裝置 表面I· $裝,其中該等電路構件包括接線裝置連接該第一 接觸塾接觸塾中之至少一個至該第二表面上之該等 τ心主少一個。 之雷1私如壯申請專利範圍第1項所述之用於高頻半導體裝置 路=子封裝’其中該等電路構件進一步包括一多層印刷電 之電H申請Λ利Λ圍·^=述之用於高頻半導體裝置 列群組之_· 專t導體裝置中至少-個包括至少下 裝(CSP、β / 薄,小型封裝(TS0P),晶片尺寸封 裝(CSP)及板上晶片封裝(c〇B)。 人t封 19.如巾s青專利I色15第1項所述之用於高頻半導體裝置558807 ^ 91109001_f car B month / day J Wuzheng VI, one of the scope of patent applications 0 2 Electricity 1 2 · The package for high-frequency semiconductor devices described in item 2 of the scope of patent application ^ The package further includes a terminal module And the bus terminal device is Jin μ # ^ on the terminal module. Electricity · For the high-frequency semiconductor device ^, τ η subpackage as described in the first item of the patent application scope, wherein the first electrical connection device is a socket grid array (LGA) connector. Dry Placed 14. For high-frequency semiconductor coatings as described in item 13 of the scope of the patent application ^ It package ', where the socket grid array connector is provided by a high connection. One of the connectors is based on SuperbuttonTM . Electricity · For high-frequency semiconductor devices as described in item 1 of the scope of the patent application ^ FengShang 'wherein the semiconductor devices are a memory device. Electronics · For surface mounting of high-frequency semiconductor devices as described in item 1 of the scope of patent application, wherein the circuit components include wiring devices connecting at least one of the first contact (contact) to the second surface There is one less of these τ heart masters. Zhilei 1 uses the high-frequency semiconductor device circuit described in item 1 of the patent application scope = sub-package ', where the circuit components further include a multilayer printed circuit. For high-frequency semiconductor device groups, at least one of the special t-conductor devices includes at least a download (CSP, β / thin, small package (TS0P), chip size package (CSP), and on-chip package ( c〇B)。 Person t seal 19. Used in high-frequency semiconductor devices as described in item 1 of patent I color 15 第31頁 558807 修正 號 9110 刪 1 六、申請專利範圍 之電子封裝,其中該等電路構件實質上係互相平行的。 20·如申請專利範圍第19項所述之用於高頻半導體裝 置,,子封裝,其進一步包括一外接印刷電路板結構且其 中^等電路構件實質上係與該外接印刷電路板結構平行。 21 ·如申請專利範圍第1項所述之用於高頻半導體裝置 之電子封裝,其進一步包括複數個熱管理結構。 22·如申請專利範圍第21項所述之用於高頻半導體裝 置之電子封裝,其中該等熱管理結構在與該至少一半導體 裝置熱接觸時,包括複數個熱-傳導鰭片。 2 3 ·如申請專利範圍第2 0項所述之用於高頻半導體裝 $之電子封裝,其中該外界資料匯流排包括至少兩個外界 貝料匯流排;該外界資料匯流排之延伸包括至少兩個資料 匯产址 * μ饼之延伸;且該等半導體裝置包括兩個至少一 導f' 且、置之群組,每一個群組被單獨地連接至該兩個資料 匯流排之延伸中之一個。 24·如申請專利範圍第1項所述之用於高頻半導體裝置 子封裝,其中該至少一個半導體裝置包括一接 悲在至Φ ^ 夕一個半導體裝置之第一表面上。 2 5 ‘ 士 置 ·如肀請專利範圍第24項所述之用於高頻半導體裝 塾之電了封裝’其中該等電路構件之一表面上之該等接觸 夕少一部分是被排成與該等半導體裝置之第一表面上 ^專接觸墊之實質型態相同。 2 0 j*n 置之 申請專利範圍第2 5項所述之用於高頻半導體裝 電子封骏,進一步包括複數個互連在該等電路構件之Page 31 558807 Amendment No. 9110 Deletion 1 VI. Electronic packaging within the scope of patent application, where the circuit components are essentially parallel to each other. 20. The sub-package for a high-frequency semiconductor device according to item 19 of the scope of application for a patent, further comprising an external printed circuit board structure, and the circuit components therein are substantially parallel to the external printed circuit board structure. 21-The electronic package for high-frequency semiconductor devices as described in item 1 of the scope of patent application, further comprising a plurality of thermal management structures. 22. The electronic package for a high-frequency semiconductor device as described in item 21 of the scope of patent application, wherein the thermal management structures include a plurality of heat-conducting fins when in thermal contact with the at least one semiconductor device. 2 3 · The electronic package for high-frequency semiconductor devices as described in item 20 of the scope of patent application, wherein the external data bus includes at least two external shells; the extension of the external data bus includes at least two Extensions of two data sink production sites * μ cake; and the semiconductor devices include two groups of at least one lead f ′, each group being individually connected to the extension of the two data buses One of them. 24. The sub-package for a high-frequency semiconductor device as described in item 1 of the scope of the patent application, wherein the at least one semiconductor device includes a first surface connected to a semiconductor device up to φ ^. 2 5 'Shiji · Please apply for the high-frequency semiconductor device electrical package described in the patent scope item 24', where a part of these contacts on one of the circuit components is arranged in line with Substrate contact pads on the first surface of these semiconductor devices have substantially the same shape. 2 0j * n sets the patent application scope of item 25 for high-frequency semiconductor devices and electronic seals, and further includes a plurality of interconnections between these circuit components. 第32頁 558807Page 558807 ϊίί:·型態及該等半導體裝置之至少-個之該等接觸 7 ·如申清專利範圍第2 6項所述之用於高頻半導體裝 子封裝,其中該等互連係接近於與長度相等,該長 又疋彳鈿短且調整長度以匹配該等互連之最小化長度。 j·如'請專利範圍第27項所述之用於高頻半導體裝 碎^仏子封政’其中該等互連係接近於與傳輸延遲相等, ^輸延遲是被縮短且調整傳輸延遲以匹配該等互連之最 小化傳輸延遲。 29 a) 面,有 之至少 b) 連,有 之至少 c) 一個表 伸,該 態,其 所組成 .一種用於高頻半導體裝置之電子封裝,豆包括· 複數個電路構件,其具有一第一表面及一/第二表 複數個接觸墊設置在該第一表面上,該等接觸墊中 一個用於連接至一外界資料匯流排; 第電氣連接裝置,包括一接觸構件以提供電氣互 效,連接至該電路構件之第一表面上該等; 個’以形成該外界資料匯流排之延伸· 至少一個半導體裝置被放置在該等電路構件之至少 :卞且選擇性地被連接至該外界資料匯流排之延 至少一個半導體裝置之該第一表面上包 係兩排或以上且彼此呈交錯及等距 d)複數個接觸墊設置在該等電路構件之至少一個 弟一表面上,該等接觸墊中之至少一個 資料匯流排; 個進-步延伸該外界ϊίί: · Type and at least one of these semiconductor devices 7 · For high-frequency semiconductor package packaging as described in item 26 of the patent claim, where the interconnections are close to the length Equal, the length is short and the length is adjusted to match the minimized length of the interconnects. j · As described in "Please apply for high-frequency semiconductor device shattering as described in item 27 of the Patent Scope, where the interconnection is close to the transmission delay, and the transmission delay is shortened and the transmission delay is adjusted to match the And other interconnects to minimize transmission delays. 29 a) surface, at least b) connected, and at least c) a surface extension, the state, and its composition. An electronic package for high-frequency semiconductor devices, beans include a plurality of circuit components, which have a The first surface and a plurality of contact pads of the first / second table are disposed on the first surface, one of the contact pads is used to connect to an external data bus; the second electrical connection device includes a contact member to provide electrical interaction To connect to the first surface of the circuit component; to form an extension of the external data bus; at least one semiconductor device is placed in the circuit component at least: 卞 and selectively connected to the The first surface of the external data bus that extends over at least one semiconductor device includes two or more rows that are staggered and equidistant from each other. D) a plurality of contact pads are disposed on at least one of the surfaces of the circuit components, the Wait for at least one data bus in the contact pad; each step further extends the outside world 第33頁 558807Page 33 558807 申請專利範圍 e)夹籍裝置,係附著至該電路構件 ™第一電氣連接裝置之該接觸構件; 少一個,以壓 伸二)=流排終端裝置有效地被連接至該資料匯流排之延 部分,Ιΐ等電路構件之-表面上之該等接觸塾之至少- 及等第二型態、,其係兩排或以上且彼此呈交錯 體裂置m接觸墊所組成,#質上與該至少-個半導 1之第一表面上之該等接觸墊之第一型態相同。 置之^如申請專利範圍第29項所述之用於高頻半導體f 導:::路構件之至少一個其進-步包括由 路構件之:ί 該等接觸墊之第一型態至該等電 連。之β亥專接觸墊之第二型態延伸之複數個組合墊及互 置之專利範圍第30項所述之用於高頻半導體裝 度是祜始其中該等互連係接近於與長度相等,該長 X 破縮短且調整長度以匹配該等互連之最小化長度。 3 2 ·如申睛專利範圍第g 1項所述之用於高頻半 ,其中該等互連係接近於與傳輸延遲相等 Μ辱輸延遲是被縮短且調整傳輸延遲以匹配該等互 小化傳輸延遲。 3 ·々申印專利範圍第2 9項所述之用於高頻半導體裝 置,電子封裝,其中該外界資料匯流排包括一特徵阻抗, 且為匯流排終端裝置顯示一阻抗實際地匹配該特徵阻抗。 34·如申請專利範圍第29項所述之用於高頻半導體裝Scope of patent application e) The folder device is the contact member attached to the circuit member ™ first electrical connection device; one less, to extend the second) = stream terminal device is effectively connected to the extension of the data bus , I 构件 and other circuit components-the surface of the contact 塾 at least-and the second type, which is composed of two or more rows and mutually staggered m contact pads, #quality on the at least The first forms of the contact pads on the first surface of each of the semiconductors 1 are the same. For the high-frequency semiconductors as described in item 29 of the scope of the patent application, at least one of the road members includes a step-by-step including: a first form of the contact pads to the Wait for electricity. The second type of β-Hai contact pads is extended by a plurality of combination pads and the mutual arrangement of the patent range No. 30 for high-frequency semiconductor devices is the beginning of which the interconnections are close to the same length, The long X-break is shortened and adjusted to match the minimum length of the interconnects. 3 2 · For high-frequency half as described in item g1 of Shenyan's patent scope, where the interconnections are close to the transmission delay. The transmission delay is shortened and the transmission delay is adjusted to match the mutual miniaturization. Transmission delay. 3. For high-frequency semiconductor devices and electronic packages as described in item 29 of the patent application scope, wherein the external data bus includes a characteristic impedance, and an impedance is displayed for the bus terminal device to actually match the characteristic impedance. . 34. For high-frequency semiconductor devices as described in item 29 of the scope of patent application ^58807^ 58807 線裝置有丄ΐ連2:;K括直線裝置,該排成直 將連接至哕黛3亥專第一電路構件之至少一個,以# 疋恢主w亥第一電氣 1U以便 35·如申&皇•衣罝之裝置排成一直線。 置之電子封f /7®第29項所述之用於高頻半導體裝 個電路構件ϊΗ 括第二電氣連接裝置設置在兩 之第—表面上ΐ莖ί有效地連接至該電路構件之至少一個 -表面上該等接觸墊中之至少一個。 稱件之第 置之· σ甲請專利範圍第35項所述之用於高頻半導體裝 線裳di:其進一步包括一排成直線裝置’該排成直 接至兮笛地連接至該等電路構件之至少一個,以便將連 ^第一電氣連接裝置之裝置排成一直線。 37·如申請專利範圍第33項所述之用於高頻半導體裝 之電子封裝,其中該匯流排終端裝置包括下列電 個電ί i 種:複數個電阻器、複數個電容器及複數 38.如申請專利範圍第37項所述之用於高頻半導體裝 之電子封裝,其中該等電阻器包括分散式電阻器。 39·如申請專利範圍第37項所述之用於高頻半導體裝 置之電子封裝,其中該等電阻器包栝一排阻器。 4 0 ·如申請專利範圍第3 7項所述之用於高頻半導體裝 置之電子封裝,其中該電阻器包栝一固態電阻裝置。 41·如申請專利範圍第33項所述之用於高頻半導體裝 置之電子封裝,其中該匯流排終端裝置係置於該電子封装 558807 一tS_91109091 月方6 日 修正 六、申請專利範圍 —---- — 之外。 置 42·如申請專利範圍第33項所述之用於高頻半導體裝 之電子封裴,其中該匯流排終端裝置係置於該等電路 件之一上。 1 43·如申請專利範圍第33項所述之用於高頻半導體裝 之電子封裝,進一步包括一終端模組且其中該匯流排終 端震置係置於該終端模組上。 、The line device has a 丄 ΐconnect 2:; K includes a straight line device, which is arranged to be connected to at least one of the first circuit components of the daidai 3 Hai special, with # 疋 主 主 主 亥 first electrical 1U to 35 · Rushen & Emperor Clothing's installations line up. The electronic seal f / 7® described in item 29 is used for mounting a circuit component for high-frequency semiconductors, including the second electrical connection device is provided on the first two surfaces. The stem is effectively connected to at least the circuit component. One-at least one of the contact pads on the surface. The first part of the claim is σ A. Please refer to item 35 of the patent scope for high-frequency semiconductor wiring. Di: it further includes a line of linear devices' the line is directly connected to the circuit At least one of the components for aligning the devices connected to the first electrical connection device. 37. The electronic package for high-frequency semiconductor devices according to item 33 of the scope of the patent application, wherein the bus terminal device includes the following electric types: a plurality of resistors, a plurality of capacitors, and a plurality of 38. The electronic package for high-frequency semiconductor devices as described in the scope of the patent application No. 37, wherein the resistors include distributed resistors. 39. The electronic package for high-frequency semiconductor devices as described in item 37 of the scope of application for a patent, wherein the resistors include a resistor. 40. The electronic package for high-frequency semiconductor devices according to item 37 of the scope of patent application, wherein the resistor includes a solid-state resistance device. 41. The electronic package for high-frequency semiconductor devices as described in item 33 of the scope of patent application, wherein the bus terminal device is placed in the electronic package 558807-tS_91109091 on the 6th of June. -Outside. Device 42. An electronic package for high-frequency semiconductor devices as described in item 33 of the scope of patent application, wherein the bus terminal device is placed on one of these circuit components. 1 43. The electronic package for high-frequency semiconductor devices according to item 33 of the scope of patent application, further comprising a terminal module, and wherein the terminal of the busbar is placed on the terminal module. , 44·如申請專利範圍第29項所述之用於高頻半導體裝 $之電子封裝,其中該其中該第一電氣連接裝置係為一承 座格距陣列(LGA)連接器。 45·如申請專利範圍第44項所述之用於高頻半導體裝 ^之$子封裝,其中該承座格距陣列連接器是由高度連接 密度公司所提供之一以SuperbuttonTM為基礎之連接器。 4 6.如申請專利範圍第29項所述之用於高頻半導體裝 置之電子封裝,其中該等半導體裝置中之至少一個是一 憶體裝置。44. The electronic package for high-frequency semiconductor devices as described in item 29 of the scope of patent application, wherein the first electrical connection device is a socket grid array (LGA) connector. 45. The sub-package for high-frequency semiconductor devices according to item 44 of the scope of patent application, wherein the socket grid array connector is a SuperbuttonTM-based connector provided by High Connection Density . 4 6. The electronic package for high-frequency semiconductor devices according to item 29 of the scope of patent application, wherein at least one of the semiconductor devices is a memory device. 4 7 ·如申請專利範圍第2 9項所述之用於高頻半導體裝 f之電子封裝,其中該等電路構件包括接線裝置連接該第 表面上之该等接觸墊中一個至該第二 等接觸塾中之至少一個。 表面… 48·如申請專利範圍第29項所述之用於高頻半導體裝 置之電子封裝,其中該等電路構件包括包括一多層印刷電 路卡。 4 9 ·如申睛專利範圍第2 9項所述之用於高頻半導體裝4 7 · The electronic package for high-frequency semiconductor devices described in item 29 of the scope of patent application, wherein the circuit components include wiring devices connecting one of the contact pads on the first surface to the second and so on Touch at least one of the tadpoles. Surface ... 48. An electronic package for a high-frequency semiconductor device as described in item 29 of the patent application scope, wherein the circuit components include a multilayer printed circuit card. 4 9 · For high-frequency semiconductor devices 558807 f 號 丄 六、申請專利範圍 >年&月_ 修正 。甲睛寻利範圍 裝’其中該等半導體裝置中至少一個包括至少 」 :裸晶片,薄,小型封裝(TS0P),晶片尺寸 封裝=SP)及板上晶>5封裝(C0B)。 •如申請專利範圍第29項所述之用於高頻半導體裝 置之3子封袈’其中該等電路構件實質上係互相平行的。 置之二子如封申/專甘利範圍第50項所述之用於高頻半導體裝 ^凌’其進一步包括一外接印刷電路板結構且其 中“ ^電路構件實質上係與該外接印刷電路板結構平行。 •如申睛專利範圍第2 9項所述之用於高頻半導體裝 置之3子封裝,進一步包括複數個熱管理結構。 •如申凊專利範圍第5 2項所述之用於高頻丰導艚奘 ί Ϊ Ϊ子封襄,其中該等熱管理結構在與該至少一半導體 裝f接觸時,包括複數個熱-傳導鰭片。 甏之5^·如申請專利範圍第29項所述之用於高頻半導體裝 誉料is冷f裝,其中該外界資料匯流排包括至少兩個外界 m淹排=排;該外界資料匯流排之延伸包括至少兩個資料 導2穿署延伸;且該等半導體裝置包括兩個至少包括一半 匯流排ίΐ:; 一個群組被單獨地連接至該兩個資料 〜咬伸中之一個。558807 f 丄 6. Scope of patent application > year & month_ amendment. Achieving profitability at least one of these semiconductor devices includes at least one of: a bare chip, a thin, small package (TS0P), a chip size package = SP), and a board-on-chip> 5 package (C0B). • 3 sub-packages for high-frequency semiconductor devices as described in item 29 of the scope of the patent application, wherein the circuit components are substantially parallel to each other. The second son is used for high-frequency semiconductor devices as described in Item 50 of the scope of the application / special application. It further includes an external printed circuit board structure, and the circuit components are substantially connected to the external printed circuit board structure. Parallel. • The three sub-packages for high-frequency semiconductor devices as described in item 29 of the Shenjing patent range, further including a plurality of thermal management structures.艚 奘 Ϊ Ϊ Ϊ 子 封 翔, wherein the thermal management structures, when in contact with the at least one semiconductor device, include a plurality of heat-conducting fins. 甏 之 5 ^ · As described in item 29 of the scope of patent application It is used for high-frequency semiconductor packaging materials, wherein the external data bus includes at least two external m flooding rows; the extension of the external data bus includes at least two data guides and 2 extensions; and The semiconductor devices include two busbars including at least one half: one group is individually connected to one of the two materials ~ bits.
TW91109091A 2001-04-13 2002-05-01 Low profile, high density memory system TW558807B (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8436254B2 (en) 2008-07-14 2013-05-07 Unimicron Technology Corp. Method of fabricating circuit board structure

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8436254B2 (en) 2008-07-14 2013-05-07 Unimicron Technology Corp. Method of fabricating circuit board structure

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