TW539128U - IC testing socket with elastic probes - Google Patents

IC testing socket with elastic probes

Info

Publication number
TW539128U
TW539128U TW90224193U TW90224193U TW539128U TW 539128 U TW539128 U TW 539128U TW 90224193 U TW90224193 U TW 90224193U TW 90224193 U TW90224193 U TW 90224193U TW 539128 U TW539128 U TW 539128U
Authority
TW
Taiwan
Prior art keywords
testing socket
elastic probes
probes
elastic
socket
Prior art date
Application number
TW90224193U
Other languages
Chinese (zh)
Inventor
Jen-Fang Wang
Wen-Jen Ke
Original Assignee
Via Tech Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Via Tech Inc filed Critical Via Tech Inc
Priority to TW90224193U priority Critical patent/TW539128U/en
Publication of TW539128U publication Critical patent/TW539128U/en

Links

TW90224193U 2001-12-31 2001-12-31 IC testing socket with elastic probes TW539128U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW90224193U TW539128U (en) 2001-12-31 2001-12-31 IC testing socket with elastic probes

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW90224193U TW539128U (en) 2001-12-31 2001-12-31 IC testing socket with elastic probes

Publications (1)

Publication Number Publication Date
TW539128U true TW539128U (en) 2003-06-21

Family

ID=29546955

Family Applications (1)

Application Number Title Priority Date Filing Date
TW90224193U TW539128U (en) 2001-12-31 2001-12-31 IC testing socket with elastic probes

Country Status (1)

Country Link
TW (1) TW539128U (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7619429B2 (en) 2003-10-20 2009-11-17 Industrial Technology Research Institute Integrated probe module for LCD panel light inspection
TWI778403B (en) * 2019-09-06 2022-09-21 南韓商李諾工業股份有限公司 Test probe, method of manufacturing the same, and test socket supporting the same

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7619429B2 (en) 2003-10-20 2009-11-17 Industrial Technology Research Institute Integrated probe module for LCD panel light inspection
TWI778403B (en) * 2019-09-06 2022-09-21 南韓商李諾工業股份有限公司 Test probe, method of manufacturing the same, and test socket supporting the same

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Legal Events

Date Code Title Description
GD4K Issue of patent certificate for granted utility model filed before june 30, 2004
MK4K Expiration of patent term of a granted utility model