TW539128U - IC testing socket with elastic probes - Google Patents
IC testing socket with elastic probesInfo
- Publication number
- TW539128U TW539128U TW90224193U TW90224193U TW539128U TW 539128 U TW539128 U TW 539128U TW 90224193 U TW90224193 U TW 90224193U TW 90224193 U TW90224193 U TW 90224193U TW 539128 U TW539128 U TW 539128U
- Authority
- TW
- Taiwan
- Prior art keywords
- testing socket
- elastic probes
- probes
- elastic
- socket
- Prior art date
Links
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW90224193U TW539128U (en) | 2001-12-31 | 2001-12-31 | IC testing socket with elastic probes |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW90224193U TW539128U (en) | 2001-12-31 | 2001-12-31 | IC testing socket with elastic probes |
Publications (1)
Publication Number | Publication Date |
---|---|
TW539128U true TW539128U (en) | 2003-06-21 |
Family
ID=29546955
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW90224193U TW539128U (en) | 2001-12-31 | 2001-12-31 | IC testing socket with elastic probes |
Country Status (1)
Country | Link |
---|---|
TW (1) | TW539128U (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7619429B2 (en) | 2003-10-20 | 2009-11-17 | Industrial Technology Research Institute | Integrated probe module for LCD panel light inspection |
TWI778403B (en) * | 2019-09-06 | 2022-09-21 | 南韓商李諾工業股份有限公司 | Test probe, method of manufacturing the same, and test socket supporting the same |
-
2001
- 2001-12-31 TW TW90224193U patent/TW539128U/en not_active IP Right Cessation
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7619429B2 (en) | 2003-10-20 | 2009-11-17 | Industrial Technology Research Institute | Integrated probe module for LCD panel light inspection |
TWI778403B (en) * | 2019-09-06 | 2022-09-21 | 南韓商李諾工業股份有限公司 | Test probe, method of manufacturing the same, and test socket supporting the same |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
GD4K | Issue of patent certificate for granted utility model filed before june 30, 2004 | ||
MK4K | Expiration of patent term of a granted utility model |