TW533318B - Automatic die testing apparatus - Google Patents

Abstract

An automatic die testing apparatus capable of performing a testing operation onto plural units of dies at the same time is provided in the present invention. The main structure of the invention is described as follows. Plural parallel testing machines are disposed in the platen. The sliding-platform moving forward and backward includes the Y-axis moving platform, which is driven by a Y-axis step motor. The sliding-platform moving left and right, which includes an X-axis moving platform driven by an X-axis step motor, is disposed on the Y-axis moving platform. In addition, a rotation carrying-platform driven by a step motor is disposed on the X-axis moving platform; and the rising mechanism is driven by air pressure cylinder. For the rotation carrying-platform, the ascending path is set by incorporating the ascending stop lump and the ascending limit lump included in the ascending mechanism and the ascending fine-tune mechanism. For the descending, the descending path is set by incorporating the descending stop lump and the descending limit lump, and is provided for the user to adjust a path in accordance with the work. Additionally, a testing machine is disposed at the rear side of the rotation carrying-platform such that the chip can be sent to the testing needle board through the structure stated above after the chip is placed in the rotation carrying-platform. The adjustment and confirmation during the period are calibrated by the computer positioning-module. Furthermore, the invention is assembled in parallel such that the occupied area is decreased by more than a quarter and it is beneficial for placement of the testing machine. Moreover, plural kinds of structures can be very easily assembled from the simplification of the basic structure. Therefore, the application circuit with wider range can be constructed quickly so as to effectively reduce the production cost and raise the production efficiency for reaching the purpose of increasing the production competition-force.

Description

533318

"Background of the Invention" The bit is used in the manual mode in the 2_test mode, which is to place the crystal to be tested on the correct test point of the test machine. The error is caused by incorrect position and two-way errors during placement. Therefore = when testing with a test machine, because the test procedures are too complicated and inconvenient, the production time is more than 5 pm, which further reduces production efficiency and increases JL overhead, so the cost of production is higher, It takes a long time, and non-hanging is not economically beneficial; therefore, how to provide a motive for the invention of many people who can solve the above problems by stimulating the invention of this case. Die module device "Invented with experience, the purpose to technology. The machine includes a yaw axis, which is referred to by the transfer platform by the pneumatic mechanism." In view of this, and the constant shortcomings of the provision; There is an X-axis step on the υ-axis moving platform. The rotary cylinder drive, including those engaged in related industries, has been born for many years. Its primary 'also solves the original test action, which is connected to the forward and backward moving slide table. It is driven by a motor, and the rotating platform is equipped with a rotation mechanism, and the lifting mechanism is equipped with a lifting mechanism and a fine-tuning adjustment to set its rising path. The inventor of this case studied it with his own considerations, and finally made the invention an automatic Die testing device

On page 5, a number of parallel test machines are made for the grains of multiple units. The platform is driven by a Z axis step with left and right moving slides including motors, and the X car is driven by the carrier system. Into the motor drive and its rotating stage can be corrected by the ascending stop block and ascending limit block 533318 watt 1 "case number 90111377 5th, invention description (2) diameter, and when descending there is a descending stop and a The descending limit block cooperates to set its descending path for the user to adjust the path in accordance with the work. There is also a test machine behind the rotary carrier. When the die is placed in the rotary carrier, the rotary carrier can The die is sent to the test pin plate by the above structure, and the adjustment and confirmation during the period are corrected by the computer positioning module. In addition, the present invention is assembled in parallel, and the area occupied by the invention is reduced to less than one-fourth of a quarter ', which is very conducive to the placement of a remote test machine; as mentioned above, from the simplification of the basic structure, it is easy to cooperate to assemble a variety of structures. , And can quickly and easily construct a wide range of application lines, which can effectively reduce production costs, improve production efficiency, and increase competitiveness in production. "Technical content, characteristics and effects" as its purpose Understand the content of the present invention, and the effects that can be achieved, and are listed with drawings-specific examples, detailed descriptions are as follows: _ number description 1 ° ° test needle plate and test machine 2 ° ° rising mechanism and rising fine adjustment mechanism 3 ° ° Computer positioning module 4 ° ° Slide table 5 back and forth. ° Move the slide table left and right 6. ° Rotating stage 7. . Group A in situ

Page 6 533318 Case No. 90111377 A_ Year V. Description of the invention (3) 8 9 10 11 12 13 14 7 8 9 0 Existing test grain unloading image positioning correction moved to the test pin plate ascending tester startup test result output test Results The reading test machine is down and the display classification lights return to their original positions. The classification diagram according to the lights does not explain. The first diagram is a diagram of the organization structure of the die testing device. The second diagram is a schematic diagram of the unit location of the present invention. The third figure is the operation flow chart of the die test device. As shown in Figures 1 and 2, an automatic die test device can perform a test operation on the die of multiple units at the same time. It is set in the machine. There are several parallel testing machines, in which the forward-backward moving slide 4 includes a Y-axis moving platform, which is driven by a Y-axis stepping motor, and the Y-axis moving platform is provided with a left-right moving slide 5 including an X-axis. The mobile platform is driven by an X-axis stepping motor, and a rotary stage is provided on the X-axis mobile platform

Page 7 533318 ___ Case No. Q0111377 V. Description of the invention (4) 6, the rotary stage 6 is driven by the air pressure iris, and the bean mechanism 2 includes the ^ __ t. Path, and there is a descending path for the carrier when descending. After the second stage is provided with another 6, the rotary stage needle plate 1 is adjusted by a stepper motor. The rotary stage 6 can be driven by a rising stop groove block and a rising limit, a falling stop block and an unused one. The tester needs to cooperate to adjust a test machine. When the crystal 6 can be adjusted and confirmed by the above structure, the electric power can be used, and the lifting mechanism can be set by the lifting mechanism and the lifting fine-tuning block. Complete the path, and the rotating particles are placed in the rotating stage to send the die to the test brain positioning module 3 if there is a test discharge 9 test position with the rotation to be tested results of the test the rotation and other basic The cost of the statement is fast. The die shown in Figure 2 is straight, and the machine will be set by the electric conversion platform. At this time, the output will be 15 and the machine 1 will be returned to the original platform. The structure is very simplified and simplified. And improve the image brain Correction 1 The grain shift tester is turned on, and the machine 7 and the rotation position 19 are parallel. It is beneficial to the 'easy range and wide production efficiency. Classification 2 Position 1 1 and move to the computer of the test machine 1 4 The platform is assembled according to the light signal, and the test machine cooperates with the application of the group to produce it. If there is no 0, the chip will be placed at each position. Classification 2 〇 Finish the placement of the occupied area; In addition, install a variety of circuits, and then generate the in-situ grains of the competition group. It can be positive and correct. The results of the rising test can be read as the test product. Structure, the effective force reduction is 7, if it is performed until the test is confirmed, then connect to 1 of 3, and its test is 16, 18, program. To quarters, from and can reduce production goals

533 318 Friends, i 90I1M77 Description of invention (5) years

In order to make the present invention more show its progress and practicability, the points are listed as follows: Bamboo /, Yan 1, parallel assembly, the area occupied by it is reduced, which is very conducive to the placement of the test-testing machine. The simplification of the basic structure of σ 2 makes it easy to assemble a variety of structures and construct a wide range of application lines simply and quickly. Effectively reduce production costs. 4 Effectively improve test efficiency. Increase competitiveness in production. Because there is no need for excessive labor, the present invention is easy to test in large numbers and the test period is shortened. With industrial use value. Practical. The above-mentioned 'are only the preferred embodiments of the present invention. For example, any changes made by using the above-mentioned techniques and methods of the present invention should be included in the scope of rights of the invention. To sum up, ‘the present invention has already met the application requirements for invention patents, 提出 apply in accordance with the law’ and pray to the examiners of the Bureau to give the patent right of the invention.

Page 9

Claims (1)

533318 H 90111377 6.Scope of patent application Therefore, the automatic grain testing device can be used to test multiple units at the same time, in which the back and forth moving slide table is parallel-driven by a -γ step motor, and the moving platform is a sliding platform. The stage includes an X-axis moving platform, which is provided with :::: left and right movements, and the X-axis moving platform is provided with a rotary stepping motor drive and a stepping motor drive, and an upper shaft machine is provided. The red retransmission platform is set by an ascending mechanism and the upper setting; the ascending path, ... ίϊ = 1: the working adjustment path, and the load η :: the user needs to configure when the die is inserted into the frame μIΑ = There is another test machine behind the battlefront, and the structure sends the crystal to the \ "type needle can be corrected by the above-mentioned brain positioning module. 'Β〗' s ascension and confirmation will be through the electricity 'which is described in the : Classification of automatic die test device number, if there is no die, ,, in situ, if there is a test die directly according to the lamp, the die can be correctly placed to the order. 'The position can be determined by the image of the machine. Correct, then the rotation is corrected by the computer, so that each time, it rises to the test position, this day ^ turns flat Move the die to the test pin plate, and the test result will be taken out, and the machine will be turned on by the remaining test machine. After the die is tested, the machine will be tested, and the computer under the rotating platform will read the test result. Position, classified by the light number 'into'