CN208172167U - A kind of semiconductor chip fine tuning test device - Google Patents
A kind of semiconductor chip fine tuning test device Download PDFInfo
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- CN208172167U CN208172167U CN201820186276.7U CN201820186276U CN208172167U CN 208172167 U CN208172167 U CN 208172167U CN 201820186276 U CN201820186276 U CN 201820186276U CN 208172167 U CN208172167 U CN 208172167U
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- block
- fixed block
- fixed
- semiconductor chip
- micromatic setting
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Abstract
The utility model discloses a kind of semiconductor chip fine tuning test device, including bracket base, intermediate fixed block, top braces device, upper and lower micromatic setting and left and right micromatic setting, intermediate fixed block is moving up and down to be arranged on bracket base, and top braces device is arranged on intermediate fixed block top and can move left and right relative to intermediate fixed block；Upper and lower fine adjustment installs on bracket base and intermediate fixed block, and left and right micromatic setting is arranged on intermediate fixed block and top braces device.The utility model novel and reasonable structure, micromatic setting up and down and left and right micromatic setting based on differential head realize the function of test bracket or more, left and right precise fine-adjustment, and operation is very convenient, so as to save debug time, improve production efficiency.
Description
Technical field
The utility model belongs to semiconductor die testing technical field, and in particular to a kind of semiconductor chip fine tuning test dress
It sets.
Background technique
At present in semiconductor die testing, as shown in Figure 1, test machine needs the socket being pressed into chip on PCB test board 1
In 2 groove, the contact on chip is made to be connected with the stitch of socket, the stitch on socket is connected with the contact of PCB circuit board, this
When form access, then on PCB test board input certain voltage check output the case where, different voltage can generate different
Access has different output in turn, exports and is consistent with the parameter needed as non-defective unit.
Test machine catches chip by suction nozzle, puts it into socket 2, and chip can only be placed on specific position by test machine,
Therefore we need to change the position of socket to guarantee that chip can be smoothly put into socket 2.Socket 2 is again spiral shell with PCB test board
Silk is fixed, opposing stationary, and PCB test board is again that screw is fixed with test bracket, opposing stationary, so we only need to adjust manually
Bracket is saved, changes the position of cradle top it is ensured that chip can be accurately pressed into socket.
Upper and lower and left and right adjusting function may be implemented in existing test bracket, and left and right adjusting device 3 is fixed on top
In support 4, moving left and right for top braces 4 is then realized by rotation screw 31, for example, when wanting top braces 4 to the right
When mobile, first the left side screw of left and right adjusting device 3 is unscrewed, then by the screw tightening on the right, top braces can be realized
It moves right.Up and down adjustment is similarly.There are a disadvantages for this regulative mode, can not accurately know rotation by screw adjusting
One angle is how many distance to be moved, however adjustable range often only needs between -1mm to+1mm in testing actually,
Adjustable range is smaller when fine tuning, and the screw pitch of M3 screw is 0.5mm, thus only may need to rotate in fine adjustment a circle less than,
It can not achieve the function of precise fine-adjustment.
Utility model content
Goal of the invention：In view of the deficienciess of the prior art, the purpose of the utility model is to provide an a kind of realization bracket left sides
The semiconductor chip fine tuning test device of right direction and up and down direction accurately adjusted.
Technical solution：In order to achieve the above-mentioned object of the invention, the technical solution adopted in the utility model is as follows：
A kind of semiconductor chip finely tunes test device, including bracket base, intermediate fixed block, top braces device, up and down
Micromatic setting and left and right micromatic setting, the intermediate fixed block is moving up and down to be arranged on bracket base, the top branch
Support arrangement is arranged on intermediate fixed block top and can move left and right relative to intermediate fixed block；The fine adjustment up and down installs
On bracket base and intermediate fixed block, the left and right micromatic setting is arranged on intermediate fixed block and top braces device.
Preferably, it is described up and down micromatic setting include the first block, the first fixed block and the first differential head, described first
Differential head is vertically provided on the first block and the first fixed block, and the first block is fixed on bracket base, and the first fixed block is solid
It is scheduled on intermediate fixed block.
Preferably, the left and right micromatic setting include the second block, the second fixed block and the second differential head, described second
Differential head is arranged on the second block and the second fixed block, and the second block is fixed on intermediate fixed block, and the second fixed block is fixed
On top braces device.
Preferably, the first differential head includes the first measuring staff, the first knob and the first fixing sleeve, described first is fixed
Set is fixed on the first fixed block, and first measuring staff is fixed on the first block.
Preferably, being provided with 2 thrusts ball bearing with flat seat, the thrust ball bearing with flat seat in first measuring staff front end
It is located at the two sides up and down of the first block.
Preferably, the second differential head includes the second measuring staff, the second knob and the second fixing sleeve, described second is fixed
Set is fixed on the second fixed block, and second measuring staff is fixed on the second block.
Preferably, being provided with 2 thrusts ball bearing with flat seat, the thrust ball bearing with flat seat in second measuring staff front end
It is located at the left and right sides of the second block.
Beneficial effect：Compared with prior art, the utility model has the following advantages that：
The utility model novel and reasonable structure, micromatic setting up and down and left and right micromatic setting based on differential head are real
The function of test bracket or more, left and right precise fine-adjustment is showed, operation is very convenient, so as to save debug time, improves
Production efficiency.
Detailed description of the invention
Fig. 1 is existing test bracket structural schematic diagram；
Fig. 2 is semiconductor chip fine tuning schematic structural diagram of testing device；
Fig. 3 is the structural schematic diagram of the micromatic setting up and down of semiconductor chip fine tuning test device.
Specific embodiment
The utility model is furtherd elucidate with reference to the accompanying drawing.
As shown in Figures 2 and 3, the semiconductor chip of the application finely tunes test device, including bracket base 1, centre are fixed
Block 2, top braces device 3, upper and lower micromatic setting and left and right micromatic setting, the intermediate setting moving up and down of fixed block 2 are being propped up
On frame pedestal 1, top braces device 3 is arranged on intermediate 2 top of fixed block and can move left and right relative to intermediate fixed block 2；On
Lower fine adjustment installs on bracket base 1 and intermediate fixed block 2, and left and right micromatic setting is arranged at intermediate fixed block 2 and top
In support device 3.
Upper and lower micromatic setting can realize the fine tuning up and down to bracket, and upper and lower micromatic setting is fixed including the first block 4, first
Block 5 and the first differential head 6, the first differential head 6 are vertically provided on the first block 4 and the first fixed block 5, and the first block 4 is fixed
On bracket base 1, the first fixed block 5 is fixed on intermediate fixed block 2.
First differential head 6 includes the first measuring staff 61, the first knob 62 and the first fixing sleeve 63, is opened on the first fixed block 5
If through-hole, the first fixing sleeve 63 passes through through-hole and is fixed on the first fixed block 5, and through-hole, the first measuring staff are opened up on the first block
61, which pass through through-hole, is fixed on the first block 4.
First measuring staff, 61 front end is provided with 2 thrusts ball bearing with flat seat 10, thrust ball bearing with flat seat 10 is using miniature flat
Face thrust ball bearing, thrust ball bearing with flat seat 10 are located at the two sides up and down of the first block 4, in the front end of the first measuring staff 61 benefit
M4 tooth hole is attacked with electric spark tapping technology, setting screw 11 is to plane outside the thrust ball bearing with flat seat 10 of 4 downside of the first block
Thrust ball bearing 10 is fixed.
Left and right micromatic setting can realize the left and right fine tuning to bracket, and left and right micromatic setting is fixed including the second block 7, second
Block 8 and the second differential head 9, the second differential head 9 are horizontally installed on the second block 7 and the second fixed block 8, and the second block 7 is fixed
On intermediate fixed block 2, the second fixed block 8 is fixed on top braces device 3.Second differential head 9 includes the second measuring staff 91, the
Two knobs 92 and the second fixing sleeve 93, the second fixed block 8 open up through-hole, and the second fixing sleeve 93 is fixed on second across through-hole and fixes
On block 8, the second block 7 opens up through-hole, and the second measuring staff 91 passes through through-hole and is fixed on the second block 7.
Second measuring staff, 91 front end is provided with 2 thrusts ball bearing with flat seat 10, thrust ball bearing with flat seat 10 is located at
M4 tooth hole is attacked using electric spark tapping technology in the front end of the second measuring staff 91 in the left and right sides of two blocks 7, right in the second block 7
Screw is arranged outside the thrust ball bearing with flat seat 10 of side to fix thrust ball bearing with flat seat 10.
The working principle of the utility model：
Up and down when fine tuning, the first knob 62 is rotated clockwise, the first measuring staff 61 can be rotated and be stretched relative to the first block 4
Long, since the first block 4 is fixed on bracket base 1, bracket base 1 is stationary state relative to board, the first measuring staff 61
Elongation can force the first fixed block 5 to move up, and intermediate fixed block 2 is driven to move up；Opposite, rotate counterclockwise the first rotation
Button 62 is, it can be achieved that intermediate fixed block 2 moves down, to the fine tuning up and down for being also achieved that bracket, and the first measuring staff 61 and screw
11 relative to the first block 4 rotation can be used two thrusts ball bearing with flat seat overcome.
When the fine tuning of left and right, the second knob 92 is rotated clockwise, the second measuring staff 91 can be rotated and be stretched relative to the second block 7
Long, since the second block 7 is fixed on top braces device 3, intermediate fixed block 2 is relative static conditions, the second measuring staff 91
Elongation can force the second fixed block 8 to be moved to the left, so that top braces device 3 be driven to be moved to the left；Opposite, it rotates counterclockwise
Second knob 92 is also achieved that the fine tuning of bracket, it can be achieved that top braces device 3 moves right, and the second measuring staff 91 and spiral shell
Silk 11 can be used two thrusts ball bearing with flat seat to overcome relative to the rotation of the second block 7.It is former in the chip for measuring size very little
Test bracket cannot be accomplished accurately to finely tune, between the test of the utility model when adjusting, it is only necessary to unclamp screw-adjusting
Differential head-tightens screw, easy to use.
The utility model novel and reasonable structure, micromatic setting up and down and left and right micromatic setting based on differential head are real
When having showed the function of test bracket or more, left and right precise fine-adjustment, and turning knob can be ignored by thrust ball bearing with flat seat
Measuring staff and screw can also rotate with bring adverse effect, and the first differential head and the second differential head use 0 range for arriving 13mm,
The mobile 0.5mm of the leading portion measuring staff that turns around every time, the displacement being capable of measuring can be accurate to 0.01mm, and can estimate reading one again,
It is accurate to reconcile 5, and operation is very convenient, so as to save debug time, improves production efficiency.
The above is only the preferred embodiment of the utility model, it is noted that for the common skill of the art
For art personnel, without departing from the principle of this utility model, several improvements and modifications can also be made, these improve and
Retouching also should be regarded as the protection scope of the utility model.
Claims (7)
1. a kind of semiconductor chip finely tunes test device, it is characterised in that：Including bracket base (1), intermediate fixed block (2), top
Portion's support device (3), upper and lower micromatic setting and left and right micromatic setting, intermediate fixed block (2) setting moving up and down exist
On bracket base (1), the top braces device (3) setting is on intermediate fixed block (2) top and can be relative to intermediate fixed block
(2) it moves left and right；The fine adjustment up and down installs on bracket base (1) and intermediate fixed block (2), the left and right fine tuning dress
It installs on intermediate fixed block (2) and top braces device (3).
2. semiconductor chip according to claim 1 finely tunes test device, it is characterised in that：The micromatic setting packet up and down
The first block (4), the first fixed block (5) and the first differential head (6) are included, the first differential head (6) is vertically provided at first gear
On block (4) and the first fixed block (5), the first block (4) is fixed on bracket base (1), and the first fixed block (5) is fixed on centre
On fixed block (2).
3. semiconductor chip according to claim 1 finely tunes test device, it is characterised in that：The left and right micromatic setting packet
The second block (7), the second fixed block (8) and the second differential head (9) are included, the second differential head (9) is arranged in the second block (7)
On the second fixed block, the second block (7) is fixed on intermediate fixed block (2), and the second fixed block (8) is fixed on top braces dress
It sets on (3).
4. semiconductor chip according to claim 2 finely tunes test device, it is characterised in that：The first differential head (6)
Including the first measuring staff (61), the first knob (62) and the first fixing sleeve (63), it is solid that first fixing sleeve (63) is fixed on first
Determine on block (5), first measuring staff (61) is fixed on the first block (4).
5. semiconductor chip according to claim 4 finely tunes test device, it is characterised in that：In first measuring staff (61)
Front end is provided with 2 thrusts ball bearing with flat seat (10), and the thrust ball bearing with flat seat (10) is located at the upper of the first block (4)
Lower two sides.
6. semiconductor chip according to claim 3 finely tunes test device, it is characterised in that：The second differential head (9)
Including the second measuring staff (91), the second knob (92) and the second fixing sleeve (93), it is solid that second fixing sleeve (93) is fixed on second
Determine on block (8), second measuring staff (91) is fixed on the second block (7).
7. semiconductor chip according to claim 6 finely tunes test device, it is characterised in that：In second measuring staff (91)
Front end is provided with 2 thrusts ball bearing with flat seat (10), and the thrust ball bearing with flat seat (10) is located at a left side for the second block (7)
Right two sides.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820186276.7U CN208172167U (en) | 2018-02-02 | 2018-02-02 | A kind of semiconductor chip fine tuning test device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820186276.7U CN208172167U (en) | 2018-02-02 | 2018-02-02 | A kind of semiconductor chip fine tuning test device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN208172167U true CN208172167U (en) | 2018-11-30 |
Family
ID=64383907
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201820186276.7U Active CN208172167U (en) | 2018-02-02 | 2018-02-02 | A kind of semiconductor chip fine tuning test device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN208172167U (en) |
-
2018
- 2018-02-02 CN CN201820186276.7U patent/CN208172167U/en active Active
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