TW522217B - Device and method for detecting external appearance - Google Patents
Device and method for detecting external appearance Download PDFInfo
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Description
522217 五 發明說明(1) 本發明係有關於一種外觀檢測 別是有關於-種可確實去除外觀不良產方法,特 觀檢測裝置及其檢測方法。 屋 '-之被動元件之外 被動元件(例如,MLCC)在製 试機測試電性並包裝於紙帶中出貨 1而、’星過包裝測 裝t使用的包裝機H ’其可檢測產品電::: =件的包 本身對產品外觀並無檢測能力,因此, /、i裝,但 常混入包裝中出貨,造成出貨良率的降的產品也 觀的檢測,目前大都以人工抽檢的方式達曰、了達到外 人工抽檢需以現成的套裝視 八的。 式來做只能藉由算出電極及本體:視覺處理的方 判斷外觀檢測的目的,但這種方式失、、尺寸來作為 不適用: θ因為下述幾個原因而522217 V. Description of the invention (1) The present invention relates to an appearance inspection, and in particular, to a method for reliably removing appearance defects, a special inspection device and a detection method thereof. House'- passive components other than passive components (for example, MLCC) are tested in a test machine to test the electrical properties and are packaged in paper tapes for shipment. Electricity ::: The package itself does not have the ability to detect the appearance of the product. Therefore, / and i packs are often mixed into the package and shipped, and the products that cause the drop in the yield rate are also inspected. At present, most of them are manual. The sampling method is up to date, and the external manual sampling test must be performed in a ready-made suit. The formula can only be calculated by calculating the electrode and the body: the visual processing method to determine the purpose of the appearance inspection, but this method is not suitable for the following reasons: θ because of the following reasons
1.面積及尺寸的限制在外觀檢測時較 内部的-些沾;亏、破損及邊緣不良等缺陷二3二反而是 的部分’例如第1圖所示的電極,因此如疋舄較為關心 及尺寸的計算將無法完全檢測出不良品;單純使用面積 2 ·對於如第2圖所示之例子,左電 中f:’的破損會使其所量測到的面積仍然符合、要較見又但' 產品偏移面積量測區域太多時,所| ΰ S 差,因為面積量測區域並不會隨產口 J無面積將會有誤 0 t m S丨延座σσ自動調聲· 3·如果對電極各位置之長寬採第3圖之’ 在電極内X、γ方向設定所要求取的 方法未取,其 出電極各段之長度,但此方法之:::於則=圖自為動求1. The limitation of area and size is more contaminated than the internal ones during appearance inspection; defects such as defects, breakage, and poor edges are the parts that are opposite to each other, such as the electrode shown in Figure 1. Therefore, Rugao is more concerned about and The calculation of the size will not be able to fully detect the defective product; simply use the area 2 · For the example shown in Figure 2, the damage of f: 'in the left power will still make the measured area still consistent with However, when there are too many measurement areas for product offset area, so | ΰ S is poor, because the area measurement area will not be wrong with the production port J without area 0 tm S 丨 extension σσ automatic tuning · 3 · If the length and width of each position of the electrode are taken as shown in Figure 3, the method required to set the X and γ directions in the electrode is not taken, and the length of each segment of the electrode, but this method: :: 于 则 = 图 自For action
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五、發明說明S 電極内各段的寬度都在 的部分已經產生變形内凹的現象,、^内,但事實上中間 圖則為另外一種誤判的例+以及應、硯為不良品;第4 4·由於產品本身會有凹凸不平的 =方式所得到的影像並不理想, ,因此普通的打 如第5圖所示。 所以块判的機率相當高, 有叛於此,本發明之目的 =種適用於外觀檢測裝置及其檢測方法而提供 疋!ί t觀不良產品,而使出貨的良率:大提:去除被 待測物外觀的影像偵測裝置;用 ^ .用以读 /原,以及用以補強光源的光補強裝置。、先至待測物的光 又在本發明中,光源以相對於影像 方式設置,且光補強裝、d裝置為傾斜的 另外,旦彡德居、日丨壯 為反先鏡而反光鏡為半環形 卜衫像偵測裝置為電荷耦合裝置。 巧千衣形, ^在本毛明中,提供一種外觀檢測方法,句枯· r 铖(、一待測物;(b)偵測待 ^括·(a) 量:ηΛ影像邊緣上取複數個量測點,且算出 斷待測物之外觀是否符合規格。 ^用強化值判 方白ί ί ί::中’外觀檢測方法更包括:(g)提供水平 乃向才示竿挑圍值,南丨田—1卜-rm , 1 、丨 W用在上述步驟(d )中的量測點,計算 ^2217 五、發明說明(3) __ 仅於同一水平線上的兩量 向檫準範圍值比較,藉度1長度與水平方 啗。 判斷待測物之内部是否具有缺 平方的3檢測方法更包括:⑻提供與水 古利用在上述步驟⑷中的量測點,計算位於與水平圍線 ^同-垂直線上的兩量測點間的長度’將長度 =向標準範圍值比較,藉此判斷待測物之内部是否^有缺 又在本發明中’外觀檢測方法更包括:u)提供内缺 陪範圍值’利用在上述步驟(b)中的影像,偵測待測物的 内缺陷’將内缺陷與内缺陷範圍值比較,藉此判斷待測物 之内缺陷是否符合規格。 ' 以下,就圖式說明本發明之外觀檢測裝置及其檢測方 法的實施例。 81式簡單說明 第1、2圖係顯示被動元件之外觀缺陷之示意圖; 第3、4圖係顯示藉由習知方法而導致誤判的例子; 第5圖係顯示藉由習知裝置而導致誤判的例子; 第6圖係顯示本發明之外觀檢測裝置之示意圖; 第7圖係顯示藉由本發明之裝置而使影像品質改善的 例子;以及 第8a-8d圖係顯示本發明之外觀檢測方法之示意圖。V. Description of the invention The part where the width of each segment in the S electrode has been deformed and indented, but in the middle, but in fact, the middle figure is another example of misjudgment + and should be regarded as defective; 4. The image obtained by the product itself is uneven. The normal image is shown in Figure 5. Therefore, the probability of block judgment is quite high, and it is rebellious. The purpose of the present invention is to provide a kind of appearance detection device and its detection method. ί t observe bad products, so that the yield rate of shipment: big mention: remove the image detection device of the appearance of the test object; use ^. to read / original, and to strengthen the light source to strengthen the light source device. In the present invention, the light first arrives at the object to be measured. In the present invention, the light source is set relative to the image, and the light-reinforcing device and the d device are tilted. In addition, once the light source and the light source are set as mirrors, The semi-circular blouse image detection device is a charge coupled device. Qiao Qianyi, ^ In this Maoming, an appearance detection method is provided. · 枯 r 铖 (, an object to be tested; (b) detection to be included. (A) Amount: ηΛ take a plurality of quantities on the edge of the image Measure the point, and calculate whether the appearance of the object to be tested meets the specifications. ^ Use the reinforced value to judge Fang Bai ί ί :: Medium 'The appearance detection method further includes: (g) The level provided is to indicate the value of the pole, south丨 Tian—1bu-rm, 1 and 丨 W are used in the measurement point in the above step (d) to calculate ^ 2217 V. Description of the invention (3) __ Comparison of two quantitative direction ranges only on the same horizontal line , The length is 1 degree and the horizontal square 啖. The 3 detection methods to determine whether the inside of the object to be tested has a missing square 3 detection methods further include: ⑻Provide and use the measurement points in the above step , to calculate the location and horizontal perimeter ^ The length between the two measuring points on the same-vertical line is compared with the length = to the standard range value, so as to determine whether the inside of the object to be tested is flawed or not. In the present invention, the appearance detection method further includes: Missing range value 'Use the image in step (b) above to detect the internal defect of the object to be tested' Defects within the range value is compared with the defect, thereby determining the analyte of defects is within specifications. 'Hereinafter, embodiments of the appearance detection device and the detection method of the present invention will be described with reference to the drawings. Type 81 is briefly explained. Figures 1 and 2 are schematic diagrams showing the appearance defects of passive components. Figures 3 and 4 are examples of misjudgments caused by conventional methods. Figure 5 is a diagram of misjudged by conventional devices. Fig. 6 shows a schematic diagram of the appearance detection device of the present invention; Fig. 7 shows an example of improving the image quality by the device of the present invention; and Figs. 8a to 8d show the appearance detection method of the present invention. schematic diagram.
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[符號說明] 1 0 0〜被動元件之外觀檢測裝置、 1 〇〜影像偵測裝置、 2 〇〜光源、 3 〇〜光補強裝置、 31〜反光鏡、 4 0〜承載裝置、 4 0 1〜承載部、 2 0 0〜被動元件。[Symbol description] 1 0 ~ Appearance detection device for passive components, 1〇 ~ Image detection device, 2〇 ~ Light source, 3 0 ~ Light reinforcement device, 31 ~ Reflector, 40 ~ Carrier device, 4 0 ~ 1 ~ Carrying section, 200 ~ passive components.
參考第6圖’本發明之外觀檢測裝置 裝置10、光源20、光補強農置3】 0包括影像债測 測裝置!◦可用以债測放置於承==以。;影像债 ""::22〇°r ^ 1 -^ 偵測裝動元侧,其以相對於影像 20的方式設置,用 :w又置,光補強裝置30以面對光源 31 ;藉由上述之影傻7光源20,其可為一半環形反光鏡 間的設置關係,可由、、测褒置10、光源20、光補強裝置30 而改善影像品質不声光補強裝置30將光源20之光反射補強 所示,將其與第5圖的門邊’改善後之影像品質如第7圖 較不易產生誤判之_比較’可明顯得知藉由本發明之裝置 價況。 以下參考第8a 固、 圖說明本發明之被動元件之外觀檢Refer to FIG. 6 'Appearance detection device of the present invention Device 10, light source 20, light-reinforcing farming device 3] 0 Including image debt measurement device! ◦ It can be used for debt measurement and placed in the bearing ==. ; Image debt " " :: 22〇 ° r ^ 1-^ Detecting the mounting element side, which is set in a manner relative to the image 20, with: w set, the light reinforcement device 30 to face the light source 31; With the above-mentioned Shadow Fool 7 light source 20, it can be the setting relationship between half-ring reflectors. The image quality can be improved by using, measuring, setting 10, light source 20, and light reinforcement device 30. Sound light and light reinforcement device 30 will light source 20 As shown in the reflection enhancement of the light, comparing it with the door edge of FIG. 5 'improved image quality is less prone to misjudgment as shown in FIG. 7 _ comparison', it is obvious that the price of the device according to the present invention. The following describes the appearance inspection of the passive component of the present invention with reference to Figure 8a.
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五、發明說明(5) 測方法’其包括下列步· 載裝置40之承栽邻4〇1卜驟.耳先將被動元件2〇〇設置於承 被動元件200之^傻 三接著藉由影像偵測裝置1〇偵測 line,如第8a“象2 =像之邊緣的平均線^ 點,且算出量平影像邊緣上取複數個量測 示,且分別為乂。 X χ ί )的長/( ί第83圖中之箭頭所 度算出平均線的桿準差2(在^ J 2里測點至平均線的長 备^ ^ ¥ 知旱差(在第83圖中之右邊為正,左邊Α 丄,/ 氣=,[(x。2 + v + V + …+ 二择,X·取产為了讓邊緣粗縫特性強化將量測點至平均 線的長度为別加上標準差(亦即,丨χ ' 數個強化值uw0、Xwi、Xw2...Xwn),且利。^值判 元件之外觀是否符合規格,亦即藉由強化值皮二 =寡即可判斷產品邊緣是否太過粗糙或凹、凸太嚴重的 又,在邊緣的缺陷算完後,再算產品内部χ、γ 個位置之長度值,首先,提供一水平方向標準範圍值;並 利用在上述步驟中的量測點,計算位於同一水平線上 量測點間的長度,將長度與水平方向標準範圍值比較, 此判斷被動元件之内部是否具有缺陷;接著提供一與水^ 方向標準範圍值的量測方向垂直的垂直方向標準範^值, 利用在上述步驟中的量測點,計算位於與水平線垂直的 一垂直線上的兩量測點間的長度,將長度與垂直方向標^ 範圍值比較,藉此判斷被動元件之内部是否具有缺陷了’ 此’當内部有缺陷存在時’其長度必然會較小,如第$ b固V. Description of the invention (5) Testing method 'It includes the following steps: The supporting device 40 of the carrier device 40 is set. The passive component 200 is first set on the passive component 200. The detection device 10 detects a line, such as the 8th "image 2 = the average line ^ point of the edge of the image, and calculates a number of measurements on the edge of the leveling image, each of which is 乂. The length of X χ) / (ί Calculated by the arrow in Figure 83 of the average line accuracy 2 (measured to the average line in ^ J 2 long ^ ^ ¥ Know the drought difference (the right side in Figure 83 is positive, Α Α on the left, / qi =, [(x. 2 + v + V +… + two choices, X · Production In order to strengthen the edge thick seam characteristics, the length of the measurement point to the average line should be plus the standard deviation ( That is, 丨 χ 'several enhancement values uw0, Xwi, Xw2 ... Xwn), and it is good. The value of ^ judges whether the appearance of the component meets the specifications, that is, whether the edge of the product is judged by the enhancement value Pi Er = Widow. Too rough or concave, convex too serious, and after calculating the edge defects, calculate the length value of χ and γ positions inside the product. First, provide a standard range value in the horizontal direction; Use the measurement points in the above steps to calculate the length between the measurement points located on the same horizontal line, and compare the length with the standard range value in the horizontal direction to determine whether the interior of the passive component has defects; then provide a standard with the water ^ direction The standard value of the vertical direction in which the measurement direction of the range value is perpendicular. Using the measurement points in the above steps, calculate the length between two measurement points on a vertical line perpendicular to the horizontal line, and mark the length and the vertical direction ^ The range value is compared to judge whether there is a defect inside the passive component. 'This' when there is an internal defect', its length must be smaller, such as the $ b solid
522217 五、發明說明(6) 所不:反之如果產品外凸,其長度值必然會較大,如第8c 圖所示’藉此我們可過濾掉内部有缺陷的產品。 又▲,可利用 Matrix Imaging Library(MIL 6·1)的 力此針對產品内部找出具狹長缺陷的部分,如此可 彌補^狹長部分難以判斷的缺撼;詳而言之,&第8d圖所 :祜Ϊ供二内缺陷範圍值’利用在上述步驟中的影像,偵 此判斷:動Ϊ:缺陷,#内缺陷與内缺陷範圍值比較,藉 被動70件之内缺陷是否符合規袼。 精由本發明之势 _ ^ _ 品,且使出貨的和方法,可確實去除外觀不良產 從ffiM的良率大大提 雖然本發明已 ^ 限定本發日月,任何孰:u貫施例揭露如上,然其並非用以 神和範圍内,當可^ A項技藝者,在不脫離本發明之精 護範圍當視後附之申二^之更動與潤飾,因此本發明之保 Τ明辱利範圍所界定者為準。522217 V. Description of the invention (6) What it does not: Conversely, if the product is convex, its length value will inevitably be larger, as shown in Figure 8c. ’By this way, we can filter out defective products inside. Also ▲, you can use the power of Matrix Imaging Library (MIL 6 · 1) to find the narrow and short defects in the product, so that it can make up for the lack of judgment of the narrow and long sections; in detail, & Figure 8d : "For the second internal defect range value ', use the image in the above steps to detect this judgment: Dynamic: Defect, compare the internal defect range with the internal defect range value, and check whether the internal defect within 70 pieces meets the regulations. The product of the present invention is refined, and the method and method of shipment can indeed remove the appearance of bad products. The yield of ffiM is greatly improved. Although the present invention has been ^ limited to the date and time of the issue, any 孰: u Executive Example Exposure As above, however, it is not intended to be used within the scope of God. When an artist of item A can be considered without altering the scope of the present invention, he shall attach the modification and retouching of the attached application II. Therefore, the guarantee of the present invention is insulting. The scope of interest shall prevail.
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TW90131322A TW522217B (en) | 2001-12-18 | 2001-12-18 | Device and method for detecting external appearance |
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