TW507504B - Structure of electronic packaging solder joint - Google Patents
Structure of electronic packaging solder joint Download PDFInfo
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- TW507504B TW507504B TW90110868A TW90110868A TW507504B TW 507504 B TW507504 B TW 507504B TW 90110868 A TW90110868 A TW 90110868A TW 90110868 A TW90110868 A TW 90110868A TW 507504 B TW507504 B TW 507504B
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Description
5075U4 五、發明說明(l) _____ <發明技術範圍> 本發明係提供一括命 種焊錫球由一高於子封裝焊球結構(一),尤指一 上單成份或二種成‘二:溶溫度之球心、,外層包覆-層以 基板之封裝焊接時,之低溫系金屬,據以作為I C或 低溫層已充分成為液故:::未融T而具等高線,外層 ,且高熔點球心可叹ϋ外層流動性良好可確保吃錫能力 心提供之強度支g =重覆加溫而不變形,焊接成品有球 熔點球心可使用卓1右又低溫焊材之脆性影響有效減少,高 外層低熔點部份可肉f f之材备,使焊接成品保有強度, 的相容性要求而作各‘:的:錫能力、即母才與焊材 接溫度,故液溶時 3性;南熔點球心超過焊 免焊點龜裂,高炫點^ ^ ,收縮s少,可減少變形和避 焊點高度相同,3球心此保持一定的焊點高度,使每個 採低電阻Π以ΓΓ試作業會比較容易而可靠,球心可 宜之锡或锡銅合比本言’因球心係便 以降低者。 表層包復比較貝的低溫金屬,成本可 <么明之背景說明〉 -定作用是焊接微小部件0[提供可控制供給 溫度基板之溫度區域,以最適合基板封裝 流動、基π 範圍内進行。實際作業時因空氣 熱散熱不同而炎燮加法、貫際密度、零件等差異,吸 衫曰溫度的均怪。施焊時部份可能低於設定 第4頁 507504 五、發明說明(2) 溫度1 0 〇C或2 0 〇C等不… 士 焊錫凝結吃錫不良。如果J声二夺$較低溫的部份會出現 充份吃錫時,比較高溫的::會低溫的部份也能 (2?要“:第1圖所示)(1)表面塌陷 如果施行於二層以上 不均而高溫部份產生熔陷現^ 6曰=容易失敗,因溫度 板(5),焊錫(1)陷^ j而完全分離第二層基 第3圖所示),為一層基板(…。(參閱 多次加工性上,因應現時要求,夕 因施工上的困難必需採心二 焊點必須能承受多 帝上 就疋s兄重覆加溫時先前焊接好的捏赴舌 復加溫至熔點時,不能因焊點 π谇』重 裂:等其他情況而造成失敗,為龜 本發明之發明人從事電子基板封裝及直、 業多年,深知其電子基板封裝之製造方法^ i U °〇製造5075U4 V. Description of the invention (l) _____ < Technical scope of the invention > The present invention provides a single-type solder ball consisting of a sub-package solder ball structure (a), especially one on a single component or two on the 'two : The center of the melting temperature, the outer cover- When the layer is welded to the package of the substrate, the low-temperature metal is fully liquid as an IC or low-temperature layer. The high melting point core is amazed. The outer layer has good fluidity, which can ensure the strength support provided by the tin core. G = repeated heating without deformation. The welded product has a ball melting point center. The brittleness of the low temperature welding material can be used. Effectively reduce, the high outer layer and low melting point can be prepared from meat, so that the welded product retains strength and compatibility requirements are made according to :: tin capacity, that is, the temperature at which the mother is in contact with the welding material, so when the solution is dissolved 3; the center point of the south melting point exceeds the welding point without cracking, high-dazzling point ^ ^, less shrinkage s, can reduce the deformation and avoid the same height of the welding point, the 3 ball center maintains a certain welding point height, so that each mining Low resistance Π and ΓΓ test operation will be easier and more reliable. The ratio of tin or tin copper alloy made according to the present 'system will result to reduce by Globe. The surface layer covers the low-temperature metal with relatively low cost, and the cost can be less than the background description of Ma Ming. -The fixed function is to weld the small parts. [Provide the temperature range of the substrate that can be controlled and supplied to the substrate. In actual operation, due to the difference of air heat and heat dissipation, the differences in addition, interdensity, and parts are different, and the temperature of the shirt is strange. When soldering, the part may be lower than the setting. Page 4 507504 V. Description of the invention (2) The temperature is not 100 ° C or 20 ° C, etc .... The solder is not condensed or eaten properly. If the sound of the second sound of the J sound is relatively high, there will be enough tin when the temperature is relatively high :: The temperature will also be low (2? "": Shown in Figure 1) (1) The surface collapses if implemented It is uneven at the second layer or higher and the high temperature part is melted. 6 = = easy to fail. The second layer is completely separated due to the temperature plate (5) and solder (1). (See Figure 3). One layer of substrate (…. (See multiple times for processing, due to current requirements, due to construction difficulties, the second solder joint must be able to withstand the previous soldering process when the heating is repeated when the brother is repeatedly heated) When the tongue is reheated to the melting point, it cannot be caused by the solder joint π 谇 ’re-splitting: and other conditions that cause failure. For the inventor of the present invention, he has been engaged in electronic substrate packaging and industry for many years, and knows the manufacture of electronic substrate packaging. Method ^ i U ° 〇
=力於改”缺點’期使電子基板封裝更為實用U 之努力研究並屢為試作,終於發明出本 「 4 裝悍球結構(一)」者。 %月之電子封 <發明之簡要說明> 本發明之主要目# ’即在於消除上述各缺點 一種電子封裝焊球結構(一),豆悝緦沾山 ^ 1/、 、、容,、四辩夕诂、、:冰麻 '舜旺,、卜錫球由一南於外層融 /合1度之球〜外層包覆一層以上單成份或二種成份 之低溫系金屬,據以作為丨C或基板之封裝焊接時,焊= 第5頁 507504 五、發明說明(3) = 心未融溶而具等高線,外層液熔基板吃錫佳, iil 加工性、烊後強度佳、基板焊材相容性高、 二、便於測試、低電阻、成本低等功效,為其特徵者 (- f务::ί「目的,在於提供一種電子封裝焊球結構 而r主/、中烊錫球之球心可採便宜的錫或錫銅合全, 乂貝的低溫金屬僅作表層包覆,使 成本可以降低,為其特徵者。 ‘,,員減V很夕’ ίΐί禪種】子封裳谭球結構 球心未炫而能保持-定的;點高度Γ使每3錫球 ’測Πίΐ易進行而可靠,為其特徵: 佳實施例並技術、手段及其功效,兹舉一較 的、構造及特;㈡::”於r相信本發明上述之目 <發明之詳細說明〉 侍/木入而具體的瞭解。 本發明係提供一籀愈 兹為使其能進一步瞭太1焊球結構(-)設計者。 配合圖式再予說明於'.、本叙明之結構設計及技術,謹 參閱第3圖所示了二 主 要係對I C或電早其/種電子封裝焊球結構(一) 外層包覆一層以上單成 〇 )所為之發明,封襄焊接f焊錫球 件時,提供可控制供給_ ~☆曰)主要作用是焊接微 於外層融溶溫声之抹、、,疋各1之焊材。本發明係以 第6頁 五、發明說明(4) 伤或一種成份以上 錫球(2 〇 ),該 合基板(1 0 )封 。實際作業時因空 件等差異,吸熱散 可能低於設定溫度 時比較低溫的部份 高至比較低溫的部 出現焊錫表面塌陷 易失敗。」本發明 高線(3 〇 )(參 參閱苐5圖所示) 1 1 )側、第二層 焊點塌陷。高熔點 刀成為液溶故外層 就多次加工性 必然。多層封裝, 3接才能達要求, 覆加溫而不變形, 重覆加溫至熔點時 、龜裂·· ·等其 點球心(2 1 ) $ 2溫而不變形,因 人’夜炫但球心(2 之低熔點 焊錫球最 裝溫度2 氣流動、 熱不同而 1 0 °C 或 會出現焊 份也能充 。如果施 可避免以 閱第4圖 能確保每 基板(1 球心(2 流動性良 言,因應 因施工上 在這種情 也就是說 ,習用者 他情況而 參閱第5 為再次加 1 )未炫 系金屬(2 2 ) 外層得包覆一抗 2 3 0 °C 熱方法、 度的均怪 等不定, 吃錫不良 時,比較 層以上之 溫度問題 ,故二層 上下二側 皆能吃錫 融溶,外 保吃錫能 求發展, 必需採取 焊點必須 溫時先前 的再次液 敗。本發 ),所以 接溫度時 有一定的 1 0〜 基板加 影響溫= Efforts to improve the "disadvantages" period to make electronic substrate packaging more practical. U's hard research and repeated trials have finally invented the "4-pack structure (1)". Electronic seal of the month < Brief description of the invention > The main purpose of the present invention is to eliminate the above-mentioned shortcomings. An electronic package solder ball structure (a). Four debates 诂 ,,: ice hemp 'Shunwang, and a ball of tin that melts / combines with 1 degree from the south to the outer layer ~ the outer layer is coated with more than one layer of single-component or two-component low-temperature metals. When the substrate is packaged and soldered, the soldering = page 5 507504 V. Description of the invention (3) = The core is not melted and has a contour line. The outer liquid melted substrate has a good tin content, iil processability, post-strength strength, and substrate welding material compatibility. High performance, two, easy to test, low resistance, low cost, etc., are its characteristics (-f service :: "The purpose is to provide an electronic package solder ball structure and r main /, the center of the tin ball center Cheap tin or tin-copper can be used. The low-temperature metal of oyster shell is only covered by the surface layer, which can reduce the cost, which is its characteristic. The structure sphere center is not dazzled and can be maintained-fixed; the point height Γ makes every 3 solder balls 'testing' easy Reliable, its characteristics: The best embodiment, technology, means and effects, here are a comparison, structure and features; ㈡: "Yu believe that the above purpose of the present invention < detailed description of the invention > And the specific understanding. The present invention is to provide a designer to make it possible to further the design of the structure of the solder ball (-). The structure design and technology described in this description will be explained with reference to the drawings. Figure 3 shows the two main inventions for IC or electric early / a kind of electronic package solder ball structure (1) the outer layer is coated with more than one layer into a single 0) invention, when the f solder ball soldering, provide controllable Supply _ ~ ☆ said) The main role is to weld the welding material which is slightly less than the melting temperature of the outer layer. The present invention is based on page 6 V. Description of the invention (4) Injury or solder balls (20) with more than one component, and the composite substrate (1 0) is sealed. Due to differences in parts and the like during actual operation, the heat absorption may be lower than the lower temperature part at the set temperature. The lower to the lower temperature part may cause the solder surface to collapse and easily fail. The high wire (30) of the present invention (see Fig. 5) is shown on the side and the second layer of solder joints is collapsed. The high melting point of the knife becomes liquid-soluble, so the outer layer is repeatedly processable. Multi-layer packaging, 3 contacts can meet the requirements, repeated heating without deformation, and repeated heating to the melting point, cracking, etc. (2 1) $ 2 temperature without deformation, due to people's night But the ball core (2 low melting point solder ball with the highest temperature of 2 gas flow, different heat and 10 ° C or solder can be filled. If you can avoid it, please see Figure 4 to ensure that each substrate (1 ball center (2 Good words of fluidity, because of the situation in construction, that is, the user and other circumstances, refer to No. 5 is to add 1 again) Unglazed metal (2 2) The outer layer must be coated with primary antibody 2 3 0 ° C The thermal method and the degree are strange. When the tin is poor, the temperature problem above the layer is compared. Therefore, tin can be melted on the upper and lower sides of the second layer. The tin can be developed for external protection. The solder joint must be warmed. The previous liquid failed again. This hair), so when the temperature is connected, there is a certain 10 ~ substrate plus temperature
2 〇 °C 錫凝結 份吃錫 行於二 上二種 所示) 一焊點 2 )側 1 )未 好可確 現時要 的困難 況下, 重覆加 因焊點 造成失 圖所示 溫至焊 。乃保 ,以之 氧化層 的範圍 實際密 。施焊 習用者 。如果 南溫的 焊接將 因焊點 以上施 第一層 ,其中 層低溫 力。 多層封 多層、 能承受 焊接好 熔流動 明因有 可以忍 ,外層 支撐強 製成焊 。最適 内進行 度、零 時部份 :Γ此 溫度提 部份會 會很容 有一等 焊時( 基板( 不會有 層已充 裝將成 多次的 多次重 的焊點 而塌陷 一高熔 受重覆 雖然再 度而不20 ° C tin condensate can be eaten in two or two ways) 1 solder joint 2) side 1) In the difficult situation that can not be confirmed at present, repeat and add the temperature caused by the solder joint. weld. Naibo, the range of oxide layer is actually dense. Welding practitioners. If the South temperature welding will be the first layer due to the welding point, the lower layer of the force. Multi-layer sealing, multi-layer, can withstand good welding flow, it can be tolerated, the outer support is strong to make welding. Optimum internal progress, zero time part: Γ This temperature rise part will be very tolerant to a first-degree soldering time (substrate (there is no layer that has been filled into multiple heavy solder joints and collapsed into a high melting point) Although repeated, but not again
第7頁 507504 _ 圓·· 五、發明說明(5) 變形塌陷,所以本發明之焊錫球(2 〇 )可以 封裝作業變成可靠而容易施行。 曰/ 就焊錫強度言,基板上焊接母材的不同,甚至世 國環保問題而禁止使用含鉛之各種母材與垾材,不含鉛之 ί材主要ΐ 仍f ί錫’再合以其他低熔點金屬如鉍、銦 r(2;t二!金屬性脆強度不良。本發明高溶點球 (2 ^ )不3脆性金屬。低熔點金屬(2 Θ圖所不)只使用於外層之包覆。焊接。 ’ )提供之強度支撐。受低㈤陧w ^扣有球心(2 1 。 叉茯又低|烊材之脆性影響,可有效減少 電路ίίϊ 才成份的相容性言,基板在 應基板材質的相容性而設:有多焊材因 焊接成品未必有良好的強度。如=:的吃錫能力。但 ,材:指基板:用:提擇性的製造。 〒材.指焊錫球(solder 、·及焊接點上的材質 就凝固收縮量與應力言,封lnt)而言。 ,焊點呈液炼時,因A J錫焊點在基板上加溫 吃錫能力容易產生差 ^ :材質等其他因素影響, 。當凝固時,因形;的差::;:、=狀上會出現差異 v響凝固收縮量的不同,如 第8頁 507504 五 -、發明説明(6) ------- 果做雙層以上的焊接g本,、辞问 ,是焊點龜裂的主目。本發、::不同將產生極大應力 衣4 21),故液溶時變形較少故收缩量少,可減 少變形’和避免焊點龜裂。 又叹雒里乂 Ί減 就》則試*言,本發明便於 之高熔點球心< 2 1 )施煜日士二 為有一超過焊接溫度 芦融熔液會因夺^i t外層與基板(1〇)接觸外 Ϊ二而降低高度,即球體外層變形,内 口 Μ衣心、d丄)因未達熔點而保 问#〜丄+ 焊點(4 0 )保持一定的高产。户έ度。丈干接元成訏能使 點(4 0 )數目可能達數百:f同一基板(1 0 )上焊 持-定的焊點(4 〇$個二熔點球心、(…能保 4 1 )古声;te η ◦)问度’使母個焊點、測試碰觸點(Page 7 507504 _Circle ·· V. Description of the invention (5) Deformation and collapse, so the solder ball (20) of the present invention can be reliably and easily packaged. / In terms of soldering strength, the different soldering base materials on the substrate, and even the environmental protection issues of the world, prohibit the use of lead-containing base materials and metal materials. Lead-free materials are mainly ΐ tin ′ and other Low melting point metals such as bismuth and indium r (2; t two! Poor metallic brittle strength. The high melting point ball (2 ^) of the present invention is not 3 brittle metals. Low melting point metals (not shown in 2Θ) are only used in the outer layer Covering. Welding. ') Strength support provided. Affected by low ㈤ 陧 w ^ buckle with a ball center (2 1. Fork 茯 is also low | the brittleness of the metal can effectively reduce the compatibility of the circuit components. The substrate should be designed according to the compatibility of the substrate material: Many welding materials may not have good strength due to welding finished products. For example, =: ability to eat tin. However, material: refers to the substrate: use: selective manufacturing. 〒 material. Refers to solder balls (solder, · and solder joints) In terms of solidification shrinkage and stress, lnt). When the solder joint is liquid-smelted, the AJ solder joint is likely to have a poor heating ability on the substrate due to the temperature difference. ^: Material and other factors, when When solidifying, due to the shape of the difference ::;:, = there will be differences in the shape of v, depending on the amount of coagulation shrinkage, such as page 8 507504 V-, the description of the invention (6) ------- fruit double Welding above this layer, and rhetoric, is the main subject of cracks in the joints. This hairpin :: Different will cause great stress clothing 4 21), so less deformation when liquid dissolves, so less shrinkage, can reduce deformation 'And avoid cracks in the solder joints. "I sigh again and again" and then try to say that the high melting point sphere center of the present invention < 2 1) Shi Yu Ri Shi II is a melting solution that exceeds the soldering temperature due to the loss of the outer layer and the substrate ( 1) Reduce the height by contacting the outer outer shell, that is, the outer layer of the sphere is deformed, and the inner mouth M, the center of the garment, and the outer shell d.) Because the melting point is not reached, the ## 丄 + solder joint (40) is maintained at a high yield. Household degree. The number of points (40) can reach hundreds of points: the number of points (40) on the same substrate (10) can be fixed-fixed (40 $ two melting point sphere centers, (... can guarantee 4 1) ) Ancient sound; te η ◦) Interrogation 'makes female solder joints, test bumps (
4 1 )同度相同。所以測試作 业觸”,、占C 閱第7圖所示) ”曰比較谷易而可靠。(參 就電阻言,焊接點或焊點( 路連線,焊接^ ( 4 Q )的焊材巾基板上作電 皆為電的不良導體。榀 有的鈦、鉍、銦等 昇下降,在各二; = = ’使溫度上 良等情形發生。本發明可;不良;:::減,’功能不 。只用在焊材之表層而控制m =金屬(22 纤搔工作中並未融溶。所以球心 、乙丄) 用白金、黃金、銀、錫、錫穿、版1 ^ 1 )之成份可以使 等等低電阻金屬,而達到焊' 4 〇n _、銀鋼·· 就成本言,封裂焊以且的要求。 之合金’無錯錫焊锡為主要材料加叙(B"°或 —.— 五、發明說明(7)4 1) Same degree. Therefore, the test job is touched, "as shown in Figure 7 of the C reading)" It is easier and more reliable. (Refer to resistors, solder joints or solder joints (circuit connection, soldering ^ (4 Q)) Welding materials on the substrate of the welding towel are all poor conductors of electricity. Some titanium, bismuth, indium, etc. rise and fall. Each two; = = 'Make the temperature good and so on. The present invention can; Defect; ::: Minus,' Function not. Only used on the surface of the welding material to control m = metal (22 fiber does not melt in the work So the center of the ball, acetylene) With platinum, gold, silver, tin, tin piercing, version 1 ^ 1) can make low-resistance metals, etc., and achieve welding '4 〇n _, silver steel ... Cost statement, and the requirements of sealing and welding. The alloy 'error-free solder is the main material (B " ° or —.— V. Description of the invention (7)
i Γ ί他H點材料使其熔點降低。因為錫以外之4 A 便宜的錫或錫匕部份是比較 低者。 …,故使用量明顯少很多,成本可以降 (如m8圖所示,習用焊錫;東(7)置於基板(?) (C ) i -輕焊接後’有可能成為(b )圖之較正常戈 (C )圖所不之熔陷於基板(3 )上; 孕乂正㊉或 而本發明之焊錫球(2 〇 ) w 圖示)經焊接後,表層液 :心上:) f圖示)者。 八 、4丄」禾4(如6、 參閱第9圖所示,習用焊錫球(7 )置於第一 板(4 ) ( 5 )間(如a圖示)、經焊接、=層基 )圖之正常狀態或了此成為(b 之陷落形成斷路狀態;θ 4裂、變形狀態《(d )圖 1 ) ( 1 2 ) f曰1 (如e圖干=於弟一層基板(1 1 )未熔而形成支撐,佶Α你:焊接後,高熔點球心(2 佳狀態(如f、g、h圖二)了表層液熔之吃錫狀況於最 用性了 Ϊ:述2發明在同類產品中實有其極佳之進步實 本發明實已具備發明專利要件,羡峨^ 上述實施例,僅用以舉例請 發明精神之範圍,•習此項技心d:據以在不離本 有者憑之而作之各種變形、 507504 五、發明說明(8) 修飾與應用,均應包括於本發明之範疇者。 第4圖 第5圖 第6圖 第7圖 第8圖 第9圖 )之焊後具 之雙層烊 圖式簡單說明 <圖,之簡單說明〉 第1圖··係習用焊點局 ^ 2圖··係習用二層以 第3圖:係本發明電子 局部放大平面 係本發明電子 專兩線平面示 係本發明電子 後局部放大平 係本發明電子 前局部放大平 係本發明電子 試平面示意圖 係本發明與習 面示意圖。 係本發明與習 面示意圖。 <圖式之圖號說明> •習用部份· 部放大平面剖示圖。 上焊接局部放大平面剖示圖。 封裝焊球結構(—)之焊接前 示意圖。 封裝焊球結構( 意圖。 :裝焊球結構(-)之雙層烊 面示意圖。 封裝焊球結構(_ 面示意圖。 封裝焊球結構(-)之焊後測 用者單層焊接比較局部放大平 用者雙料接w㈣放大平 (1 )焊錫 (3 )基板 (5 )第二層基板 (7 )焊錫球 •本發明部份· (2 )塌陷 (4 )第一層基板 (6 )熔陷現象i Γ The H point material reduces its melting point. Because the 4 A cheaper tin or tin knives other than tin are the lower ones. …, So the usage is significantly less, and the cost can be reduced (as shown in m8, conventional solder; East (7) placed on the substrate (?) (C) i-after light soldering, it may become a comparison of (b) The normal Go (C) picture is not melted on the substrate (3); the solder ball (20) w of the present invention is welded, and the surface liquid: on the heart :) f picture )By. Eight, 4 "and 4 (as shown in Figure 6, see Figure 9, the conventional solder ball (7) is placed between the first plate (4) (5) (as shown in a), after welding, = layer base) The normal state of the picture may become (the state of b ’s formation of an open circuit; the state of θ 4 cracking and deformation “(d) FIG. 1) (1 2) f said 1 (such as e Tugan = Yudi substrate (1 1) Unmelted to form a support, 佶 Α you: After welding, the high melting point sphere center (2 best state (such as f, g, h Figure 2) the surface of the liquid melted tin condition is most useful: The similar products actually have their excellent progress. The present invention already has the elements of the invention patent. The above examples are only examples to illustrate the scope of the spirit of the invention. Various modifications made by some people, 507504 V. Description of the invention (8) Modifications and applications should be included in the scope of the present invention. Figure 4 Figure 5 Figure 6 Figure 7 Figure 8 Figure 9 ) Of the double-layered schematic diagram after welding < simple description of the diagram > Fig. 1 ... is a conventional solder joint station ^ 2 Fig. Is a conventional second layer with Fig. 3: It is an electronic part of the present invention The large plane is a two-line plane display of the electronic special plane of the present invention. The partial magnification plane of the electronic back of the present invention is a partial magnification plane of the electronic front of the present invention. The schematic diagram of the electronic test plane of the present invention is a schematic diagram of the present invention and practice. < Explanation of drawing number of the drawing > • Conventional part · Enlarged plan sectional view of the part. Partial enlarged plan sectional view of the upper welding part. Schematic diagram before welding of the package solder ball structure (—). Package solder ball structure (intent. : Schematic diagram of the double-layer surface of the solder ball structure (-). Schematic diagram of the package of the solder ball structure (_). The post-weld test of the package of the solder ball structure (-) is a single-layer welding comparison. Flat (1) Solder (3) Substrate (5) Second layer substrate (7) Solder ball • Part of the invention · (2) Collapse (4) First layer substrate (6) Melt phenomenon
507504 圖式簡單說明 (1 0 )電子基板 (1 2 )第二層基板 (21)球心 (3 0 )等高線 (4 1 )測試碰觸點 0 2 0 2 2 4 第一層基板 焊錫球 低熔點系金屬 焊點507504 Schematic description (1 0) Electronic substrate (1 2) Second layer substrate (21) Spherical center (3 0) Contour (4 1) Test contact 0 2 0 2 2 4 First layer substrate solder ball is low Melting point metal solder joint
第13頁Page 13
Claims (1)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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TW90110868A TW507504B (en) | 2001-05-03 | 2001-05-03 | Structure of electronic packaging solder joint |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
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TW90110868A TW507504B (en) | 2001-05-03 | 2001-05-03 | Structure of electronic packaging solder joint |
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TW507504B true TW507504B (en) | 2002-10-21 |
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TW90110868A TW507504B (en) | 2001-05-03 | 2001-05-03 | Structure of electronic packaging solder joint |
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TW (1) | TW507504B (en) |
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2001
- 2001-05-03 TW TW90110868A patent/TW507504B/en not_active IP Right Cessation
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