TW459999U - Test connector mechanism for automatic inserting groove module of testing platform - Google Patents

Test connector mechanism for automatic inserting groove module of testing platform

Info

Publication number
TW459999U
TW459999U TW89210742U TW89210742U TW459999U TW 459999 U TW459999 U TW 459999U TW 89210742 U TW89210742 U TW 89210742U TW 89210742 U TW89210742 U TW 89210742U TW 459999 U TW459999 U TW 459999U
Authority
TW
Taiwan
Prior art keywords
inserting groove
testing platform
test connector
connector mechanism
automatic inserting
Prior art date
Application number
TW89210742U
Other languages
Chinese (zh)
Inventor
Wen-Jie Lin
Jiun-Kai Lin
Guo-Lung Guo
Original Assignee
Asustek Comp Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Asustek Comp Inc filed Critical Asustek Comp Inc
Priority to TW89210742U priority Critical patent/TW459999U/en
Publication of TW459999U publication Critical patent/TW459999U/en

Links

TW89210742U 2000-06-22 2000-06-22 Test connector mechanism for automatic inserting groove module of testing platform TW459999U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW89210742U TW459999U (en) 2000-06-22 2000-06-22 Test connector mechanism for automatic inserting groove module of testing platform

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW89210742U TW459999U (en) 2000-06-22 2000-06-22 Test connector mechanism for automatic inserting groove module of testing platform

Publications (1)

Publication Number Publication Date
TW459999U true TW459999U (en) 2001-10-11

Family

ID=21669495

Family Applications (1)

Application Number Title Priority Date Filing Date
TW89210742U TW459999U (en) 2000-06-22 2000-06-22 Test connector mechanism for automatic inserting groove module of testing platform

Country Status (1)

Country Link
TW (1) TW459999U (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104237760A (en) * 2013-06-08 2014-12-24 京元电子股份有限公司 Testing device and testing method for semiconductor components
CN109848400A (en) * 2019-04-16 2019-06-07 北京联合荣大工程材料股份有限公司 The dry materials liner in dundish mold of weir plate mounting groove can be reserved

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104237760A (en) * 2013-06-08 2014-12-24 京元电子股份有限公司 Testing device and testing method for semiconductor components
CN104237760B (en) * 2013-06-08 2017-05-10 京元电子股份有限公司 Testing device and testing method for semiconductor components
CN109848400A (en) * 2019-04-16 2019-06-07 北京联合荣大工程材料股份有限公司 The dry materials liner in dundish mold of weir plate mounting groove can be reserved

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Legal Events

Date Code Title Description
GD4K Issue of patent certificate for granted utility model filed before june 30, 2004
MM4K Annulment or lapse of a utility model due to non-payment of fees