TW458281U - Structure improvement of test card fixture for motherboard tester - Google Patents

Structure improvement of test card fixture for motherboard tester

Info

Publication number
TW458281U
TW458281U TW88222162U TW88222162U TW458281U TW 458281 U TW458281 U TW 458281U TW 88222162 U TW88222162 U TW 88222162U TW 88222162 U TW88222162 U TW 88222162U TW 458281 U TW458281 U TW 458281U
Authority
TW
Taiwan
Prior art keywords
test card
structure improvement
card fixture
motherboard
tester
Prior art date
Application number
TW88222162U
Other languages
Chinese (zh)
Inventor
Ching-Mau Li
Original Assignee
Ect & Amp T Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ect & Amp T Inc filed Critical Ect & Amp T Inc
Priority to TW88222162U priority Critical patent/TW458281U/en
Publication of TW458281U publication Critical patent/TW458281U/en

Links

TW88222162U 1999-12-27 1999-12-27 Structure improvement of test card fixture for motherboard tester TW458281U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW88222162U TW458281U (en) 1999-12-27 1999-12-27 Structure improvement of test card fixture for motherboard tester

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW88222162U TW458281U (en) 1999-12-27 1999-12-27 Structure improvement of test card fixture for motherboard tester

Publications (1)

Publication Number Publication Date
TW458281U true TW458281U (en) 2001-10-01

Family

ID=21657978

Family Applications (1)

Application Number Title Priority Date Filing Date
TW88222162U TW458281U (en) 1999-12-27 1999-12-27 Structure improvement of test card fixture for motherboard tester

Country Status (1)

Country Link
TW (1) TW458281U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107121632A (en) * 2017-07-12 2017-09-01 深圳市迈创力科技有限公司 A kind of flying probe system

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107121632A (en) * 2017-07-12 2017-09-01 深圳市迈创力科技有限公司 A kind of flying probe system

Similar Documents

Publication Publication Date Title
HK1071941A1 (en) Self-test electronic assembly and test system
GB9814089D0 (en) Probe card for testing integrated circuit chips
SG72834A1 (en) Probe card suitable for inspection of multi-pin devices
DE69830255D1 (en) Test unit for testing connectors
GB2367912B (en) Apparatus for testing computer memory
GB9916835D0 (en) IC testing device
GB2347279B (en) Test fixture for matched impedance testing
TW411060U (en) Burn-in test socket
SG64938A1 (en) Ic test handler
AU3165701A (en) Test device for testing long objects
SG79250A1 (en) Ic testing apparatus
FR2780792B1 (en) ELECTRONIC CHIP TESTING APPARATUS
TW458281U (en) Structure improvement of test card fixture for motherboard tester
PL336978A1 (en) Strip-type test for performing an allergy diagnosis in vitro
GB2345974B (en) Meter tester
SG78307A1 (en) Ic test handler Ic test handler
TW382496U (en) Structure improvement for IC tester
TW408857U (en) Testing fixture of IC device
TW472889U (en) Fixture improvement of testing interface card slot
TW511711U (en) Test card of probe
TW516631U (en) Improved fixing structure of probe testing board
TW497717U (en) Base structure of probe card
DE19980524T1 (en) IC test device
GB9906826D0 (en) Sample tester
TW492619U (en) Socket fixing structure for testing adapting cards

Legal Events

Date Code Title Description
GD4K Issue of patent certificate for granted utility model filed before june 30, 2004
MM4K Annulment or lapse of a utility model due to non-payment of fees