TW444415B - Light emitting diode die and the manufacturing method thereof - Google Patents
Light emitting diode die and the manufacturing method thereof Download PDFInfo
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444415 五、發明說明(i) 【發明之範圍】 本發明係有關於一種發光二極體晶粒及其製造方法, 特別針對一種在一不透光之基板上成長發光二極體化合物 半導體材料的製程,提供一種可提升發光二極體之發光效 率的製造方法。 【發明之背景】 利用發光二極體(Light Emitting Diode,LED)當 做顯示器或光源產生器的技術係為已知,其中傳統LED晶 粒的結構如「第1圖」所示,其中包括:一基板 (Substrate) 1 0 ,係為神化鎵(GaAs)等不透光介質;一 磊晶層(Expitary Layer)2 0 ,係成長在基板1 0上,其 為發光二極體化合物半導體材料;一正面電極3 0以及一 背面電極4 0 。 •傳統LED製作時,在部份化合物半導體材料基板1 〇 上之限制,致使LED晶粒在發光時,光子被基板1 〇吸收 而不透光(如「第2圖」所示),此種受材料本身結構特 性,造成LED晶粒在發光時,大大減低了光子射出的效率 ,而使得發光效率無法有效顯現之缺陷,這在傳統LED晶 粒的製作過程中,是無法避免的障礙。 【發明之目的及概述】 因此,本發明的目的便欲提供一種不同於習知L E D晶 粒的結構,係利用一蝕刻製程從磊晶層下方移去部份基板 的面積,而得到一似香菇狀結構之LED晶粒,以使LED晶粒 在被點亮時,光子可從磊晶層下方移去基板之區域射出,444415 V. Description of the invention (i) [Scope of the invention] The present invention relates to a light-emitting diode crystal grain and a method for manufacturing the same, and particularly relates to a method for growing a light-emitting diode compound semiconductor material on an opaque substrate. The manufacturing process provides a manufacturing method capable of improving luminous efficiency of a light emitting diode. [Background of the invention] The technology of using a light emitting diode (LED) as a display or a light source generator is known. The structure of a traditional LED die is shown in "Figure 1", which includes: Substrate 1 0 is an opaque medium such as gallium (GaAs); an epitaxial layer 2 0 is grown on the substrate 10, which is a light-emitting diode compound semiconductor material; The front electrode 30 and a back electrode 40. • Limitations on the substrate 10 of some compound semiconductor materials during the manufacture of traditional LEDs, so that when the LED die emits light, photons are absorbed by the substrate 10 and do not transmit light (as shown in "Figure 2"). Due to the structural characteristics of the material, when the LED die is emitting light, the efficiency of photon emission is greatly reduced, and the defect that the luminous efficiency cannot be effectively displayed is an unavoidable obstacle in the manufacturing process of the traditional LED die. [Objective and Summary of the Invention] Therefore, the object of the present invention is to provide a structure different from the conventional LED die, which uses an etching process to remove a part of the substrate area from below the epitaxial layer to obtain a mushroom-like structure. LED die with a structure like structure, so that when the LED die is lit, photons can be emitted from the area where the substrate is removed under the epitaxial layer,
4 444 1 5 五、發明說明(2) 以提升LED晶粒的發光效率。 根據上述本發明之目的,所提供的發光二極體晶粒的 製造方法至少包含下列步驟: (1 )提供一基板,其中該基板係為不透光材質(如 坤化鎵(GaAs))製成; (2 )於該基板上,成長一具有發光二極體架構之磊 晶層,以形成·一蟲晶片*其中蟲晶層係為發光二極體化合 物半導體材料; (3 )將金屬(如P型的金-鈹合金,或N型的金-鍺合 金)鍍到該磊晶片的正面上,再經退火生成正面電極; (4 )將金屬(如P型的金-鈹合金,或N型的金-鍺合 金)錄到该蟲晶片的背面上,再經退火生成背面電極; (5 )以切割方式或平台蝕刻方式(如乾式蝕刻或濕 式蝕刻),於該磊晶片上蝕刻出複數個凹槽; (6 )以濕式或乾式蝕刻方式,於該凹槽中針對該基 板進行蝕刻,而從該磊晶層下方移去部份該基板的面積; 以及 (7 )切割該蟲晶片以形成發光二極體晶粒。 其中本發明真正的技術核心是在步驟(5 )〜(7 ) ,至於步驟(1 )〜(4)的目的只是製成一具有正背面 電極的磊晶片,以供後續製程使用,因此雖在步驟(1 ) 〜(4 )之間尚包含某些細部製程,同時這些細部製程是 可以隨著製程設備、製程規劃而有所變化的,例如在磊晶 片上形成正背面電極的過程中,可能需要鍍上保護層、絕4 444 1 5 V. Description of the invention (2) To improve the luminous efficiency of the LED die. According to the above-mentioned object of the present invention, a method for manufacturing a light-emitting diode crystal grain includes at least the following steps: (1) providing a substrate, wherein the substrate is made of an opaque material (such as GaAs) (2) growing an epitaxial layer with a light-emitting diode structure on the substrate to form a worm wafer * wherein the worm-crystal layer is a light-emitting diode compound semiconductor material; (3) a metal ( For example, a P-type gold-beryllium alloy, or an N-type gold-germanium alloy) is plated on the front surface of the epitaxial wafer, and then annealed to generate a front electrode; (4) a metal (such as a P-type gold-beryllium alloy, or N-type gold-germanium alloy) is recorded on the back of the worm wafer, and then annealed to generate the back electrode; (5) Etching on the epitaxial wafer by cutting or platform etching (such as dry etching or wet etching). A plurality of grooves; (6) etching the substrate in the groove by wet or dry etching, and removing a part of the area of the substrate from below the epitaxial layer; and (7) cutting the Insect wafers to form light-emitting diode grains. Among them, the true technical core of the present invention is in steps (5) to (7). As for the purpose of steps (1) to (4), only an epitaxial wafer with front and back electrodes is prepared for subsequent processes. Some detailed processes are still included between steps (1) to (4). At the same time, these detailed processes can be changed with the process equipment and process planning. For example, in the process of forming the front and back electrodes on the epitaxial wafer, it may be Need to be coated
第5頁 4444 1 5 五、發明說明(3) 緣層以及導電層等的相關製程;或是在步驟(1)〜(4 )之間有些製程可以省略,如步驟(3 )與步驟(4 )之 退火步驟即可合併,亦即先將金屬分別鍍到磊晶片的正背 面,以形成正背面電極之後,再同時進行退火程序,但不 論是那一種製程,只要能製成一具有正背面電極的蟲晶片 ,都可以進行後續的蝕刻步驟,因此在本發明中並不針對 這其間的步驟加以詳述,而只針對步驟(5 )〜(7 )中 的相關技術加以討論。 為讓本創作之上述和其他目的、特徵和優點能更明顯 易懂,下文特舉一較佳實施例,並配合所附圖式,作詳細 說明如下: 【圖式簡單說明】 第1圖,係為傳統LED晶粒的構造示意圖。 第2圖,顯示「第1圖」中L E D晶粒的發光示意圖。 第3 a — 3 e圖,係為本發明之香菇狀L E D晶粒的製 造流程圖。 第4圖,係為本發明之香菇狀LED晶粒的構造示意 圖。 第5圖,顯示「第4圖」中香菇狀LED晶粒的發光示 意圖。 【實施例說明】 請參閱「3 a — 3 e圖」,係為本發明之香菇狀LED 晶粒的製造流程圖,其中圖3 a是表示已完成正背面電極 製作的磊晶片結構,其包括:Page 5 4444 1 5 V. Description of the invention (3) Related processes such as marginal layer and conductive layer; or some processes between steps (1) to (4) can be omitted, such as steps (3) and (4) ) Annealing steps can be combined, that is, the metal is plated on the front and back of the epitaxial wafer to form the front and back electrodes, and then the annealing process is performed at the same time, but no matter which process, as long as a The worm wafer of the electrode can be subjected to subsequent etching steps. Therefore, in the present invention, the steps in between are not described in detail, and only the related technologies in steps (5) to (7) are discussed. In order to make the above and other purposes, features, and advantages of this creation more comprehensible, a preferred embodiment is given below in conjunction with the accompanying drawings for detailed description as follows: [Schematic description of the drawings] Figure 1, It is a schematic diagram of the structure of a traditional LED die. Fig. 2 is a schematic diagram showing the light emission of the L E D crystal grains in "Fig. 1". Figures 3a to 3e are flowcharts of the manufacturing process of the mushroom-shaped LED particles of the present invention. Fig. 4 is a schematic diagram showing the structure of the mushroom-shaped LED crystal grains of the present invention. Fig. 5 shows the luminescence of the mushroom-shaped LED crystal grains shown in "Fig. 4". [Embodiment description] Please refer to "3a-3e", which is a flowchart of manufacturing the mushroom-shaped LED die of the present invention, in which Fig. 3a shows the structure of the epitaxial wafer which has completed the fabrication of the front and back electrodes. :
4444 1 5 五、發明說明(4) 一基板(Substrate)l 〇 ,係由砷化鎵(GaAs)等不透 光介質製成; 一磊晶層(Expitary Layer) 2 0,係成長在該基板1 〇上,以形成一磊晶片,其中磊晶層2 0為發光二極體化 合物半導體材料,如鋁砷化鎵單異質結構或雙異質結構 (AlGaAs SH or DH Structure)及四元銘姻鎵鱗 (InGaAlP )材料; 一正面電極3 0 ,其形成方式係利用錢鍵(或蒸錄) 方式將金屬(例如P型的金-鈹合金,或N型的金-鍺合金) 鍵到遙晶片正面’並經退火以形成歐姆接觸(Ohmic Contact)的正面電極3 0 ;以及 一背面電極4 0 ,其形成方式係利用濺鍍(或蒸鐘) 方式將金屬(例如P型的金-鈹合金,或N型的金-鍺合金) 鍍到磊晶片的背面,並經退火以形成歐錦接觸(〇 h m i c Contact)的背面電極4 0 。 其中本發明所揭露之製程,係在正背面電極完成金屬 與半導體間之歐姆接觸後(如「圖3 a」所示),再利用 一蝕刻製程從磊晶層2 0下方移去部份基板1 〇的面積, 使蟲晶層2 0的下方未完全與基板1 〇接觸,而使led晶 粒在被點亮時,光子可從遙晶層2 0下方移去基板1 〇之 區域射出,而不會被基板1 〇吸收,可提升發光效率。 在本發明中,為了要確實保證經此兹刻製程後可從蠢 晶層2 0的下方移去部份基板1 〇的面積,特將上述之银 刻製程分成兩步驟實施,第一步驟是先利用切割方式或平4444 1 5 V. Description of the Invention (4) A substrate 10 is made of opaque medium such as gallium arsenide (GaAs); an epitaxial layer 20 is grown on the substrate 10, to form an epitaxial wafer, in which the epitaxial layer 20 is a light emitting diode compound semiconductor material, such as aluminum gallium arsenide single heterostructure or double heterostructure (AlGaAs SH or DH Structure) and quaternary indium gallium Scale (InGaAlP) material; a front electrode 30, which is formed by bonding a metal (such as a P-type gold-beryllium alloy, or an N-type gold-germanium alloy) to a remote chip using a money bond (or vapor deposition) method. Front side 'and annealed front electrode 3 0 to form an ohmic contact (Ohmic Contact); and a back electrode 40, formed by sputtering (or steaming bell) the metal (such as a P-type gold-beryllium alloy) , Or N-type gold-germanium alloy) is plated on the back surface of the epitaxial wafer and annealed to form a back electrode 40 of the Ohmic Contact. The process disclosed in the present invention is to remove a part of the substrate from below the epitaxial layer 20 by an etching process after the front and back electrodes have completed ohmic contact between the metal and the semiconductor (as shown in FIG. 3a). An area of 10, so that the lower part of the worm crystal layer 20 is not completely in contact with the substrate 10, and when the led crystal grains are lit, photons can be emitted from the area where the substrate 10 is removed from under the telecrystal layer 20, Instead of being absorbed by the substrate 10, the luminous efficiency can be improved. In the present invention, in order to ensure that the area of a part of the substrate 10 can be removed from below the stupid crystal layer 20 after this inscription process, the above-mentioned silver inscription process is specifically divided into two steps. The first step is First use cutting method or flat
第7頁 444415 五、發明說明(5) 台蝕刻方式(MESA etching)使磊晶片形成複數個凹槽2 2 (如「圖3 - b」所示),'接著再以濕式蝕刻(W e t Etching)或乾式蝕刻(Dry Etching)方式,於該凹槽2 2 中針對基板1 0進行蝕刻,而從磊晶層2 0下方移去部份 基板1 〇的面積。 其中關於在第一蝕刻步驟中所形成之複數個凹槽2 2 的外觀形狀並沒有限制,可以是V型、倒门型或是圓型, 而在本發明所揭露的實施例中凹槽2 2外觀是如「圖3-b」所示的V型半穿形式,其中關於在此步驟中所使用的 切割與平台蝕刻方式的實施態樣有很多種,例如可利用一 切割刀以進行切割方式,而平台蝕刻方式又包括有濕式蝕 刻與乾式蝕刻兩種,前者主要是利用化學反應來進行磊晶 片的蝕刻’而後者主要是利用物理的作用來進行磊晶片的 飯刻(但並不完全是)’如電漿蝕刻(Plasma Etching)、 /賤擊钱刻(Sputtering Etching)或是反應性離子蝕刻 ^active Ion Etching,RIE)等,無論是那一種蝕刻方 式’只要能達到使磊晶片形成複數個凹槽2 2的目的,都 可以在本發.明中實施。 其中本實施例所揭露之V型半穿形式的定義為:縱向 蚀刻深度(Η )大於磊晶層2 0的厚度(h ),至於H必需要大 多少,在本發明中則沒有限制,端看使用者的設計, = Μ在此步驟中,若是縱向蝕刻深度(H )愈大於磊晶層 ^ 2的厚度(h)時’愈能確保在進行下一蝕刻步驟之後, 在基板1 0與磊晶層2 0接觸的界面間,基板1 〇的截面Page 7 444415 V. Description of the invention (5) The MESA etching method enables the wafer to form a plurality of grooves 2 2 (as shown in "Fig. 3-b"), followed by wet etching (W et Etching) or Dry Etching, the substrate 10 is etched in the groove 22, and the area of a part of the substrate 10 is removed from below the epitaxial layer 20. The appearance shape of the plurality of grooves 2 2 formed in the first etching step is not limited, and may be a V-shape, an inverted gate type, or a round shape. In the embodiment disclosed in the present invention, the groove 2 2 The appearance is a V-shaped semi-penetrating form as shown in "Figure 3-b". There are many implementations of the cutting and platform etching methods used in this step. For example, a cutting knife can be used for cutting. The platform etching method includes wet etching and dry etching. The former mainly uses chemical reactions to etch the epitaxial wafers, and the latter mainly uses physical effects to perform the epitaxial wafer etching (but not Completely) 'such as Plasma Etching, / Sputtering Etching, or Reactive Ion Etching (active Ion Etching, RIE), etc., no matter which kind of etching method', as long as it can achieve the epitaxial wafer The purpose of forming the plurality of grooves 22 can be implemented in the present invention. The definition of the V-type semi-penetrating form disclosed in this embodiment is: the longitudinal etching depth (Η) is greater than the thickness (h) of the epitaxial layer 20, as for how much H must be greater, there is no limitation in the present invention. According to the user's design, = Μ In this step, if the longitudinal etching depth (H) is greater than the thickness (h) of the epitaxial layer ^ 2, the more it can ensure that after the next etching step, the substrate 10 and Cross-section of substrate 10 between interfaces where epitaxial layer 20 contacts
4 4 4 4 1 9 五、 發明說明(6) 積 定 會 小 於 磊 晶 層 2 0 的 戴 面 積 5 而 達 到 本 發 明 的 @ 的 J 因 此 y 也 可 在 第 — 刻 步 驟 時 , 使 縱 向 钱 刻 深 度(H) 等 於 或 小 於 磊 晶 層 2 0 的 厚 度(h) (如 「圖3 - e J 所 示 ) , 待 進 行 下 —· 刻 步 驟 時 再 蚀 刻 較 多 部 份 的 晶 層 2 0 J .— 樣 可 以 達 到 相 同 目 的 〇 其 中 不 管 在 第 * 刻 步 驟 是 形 成 如 厂 圖 3 -b j 或 厂 圖 3 一 6 一 所示 ,都接著進行第二蝕刻步驟 其中本發 明 所 揭 露 之 第 二 刻 步 驟 是 利 用 濕 式 或 乾 式 刻 方 式 從 晶 層 2 0 下 方 移 去 部 份 基 板 1 0 的 面 積 而 在 本 發 明 所 揭 路 的 實 施 例 中 是 利 用 —» 濕 式 刻 方 式 > 以 移 去 部 份 基 板 1 0 的 面 積 y 為 達 此 — 的 本 發 明 係 選 擇 一 4k 刻 液 5 使 該 银 刻 液 對 磊 晶 層 2 0 的 银 刻 速 率(定義為R1 ) 小 於 對 基 板 1 0 的 4k 刻 速 率 (定義為R2) 或 是 選 擇 性 只 钱 刻 基 板 1 0 的 面 積 造 成 在 刻 過 程 中 晶 層 2 0 被 钮 刻 的 面 積 會 小 於 基 板 1 0 被 刻 的 面 積 > 而 形 成 如 厂 圖 3 -c j 所示之香 益 狀 結 構 的 晶 片 其 中 使 用 者 可 以 藉 由 改 變 蚀 刻 液 的 種 類 或 組 成 比 例 來 加 以 控 制 此 刻 液 對 晶 層 2 0 與 基 板 1 0 之 刻 速 率(R1 R2) 的 大 小 » 而 加 以 控 制 磊 晶 層 2 0 與 基 板 1 0 被 Μ 刻 的 面 積 其 中 當 R1 值 愈 小 於R2 值 時 代 表 蚀 刻 液 的 選 擇 性 愈 南 亦 即 敍 刻 液 與 基 板 1 0 之 間 的 反 應 性 愈 強 } 造 成 基 板 1 0 被 姓 刻 的 面 積 愈 多 而 當 R1 值 遠 遠 小 於1?2 值 時 因 刻 液 對 基 板 1 0 的 反 應 性 太 強 故 只 會 姓 刻 基 板 1 0 〇 而 關 於 4k 刻 液 所 4k 刻 基 板 1 0 面 積 的 大 小 並 沒 有 限4 4 4 4 1 9 V. Description of the invention (6) The product will be smaller than the wear area 5 of the epitaxial layer 20 and reach the J of the present invention @. Therefore, y can also be used to make the vertical money engraving depth in the first step. (H) is equal to or less than the thickness (h) of the epitaxial layer 20 (as shown in "Fig. 3-e J"), and a larger portion of the crystal layer 20 J is etched when the next step is performed. The same purpose can be achieved. No matter whether the step * is formed as shown in Fig. 3-bj or Fig. 3-6-, the second etching step is followed by the second etching step disclosed in the present invention. Wet or dry engraving removes the area of a part of the substrate 10 from under the crystal layer 20 and in the embodiment disclosed in the present invention, it uses— »Wet Engraving> to remove part of the substrate 1 0 The area y is so that the present invention selects a 4k etch solution 5 to make the silver The etching rate of the epitaxial layer 20 by the etching solution (defined as R1) is lower than the 4k etching rate of the substrate 10 (defined as R2) or the area of the substrate 1 0 is selectively etched to cause the crystal layer during the etching process. 2 0 The area to be engraved will be smaller than the area to be engraved on the substrate. 10> A wafer with a fragrant structure as shown in the factory's Fig. 3-cj is formed. The user can change the type or composition ratio of the etching solution to Control the size of the etching rate (R1 R2) of the crystal layer 2 0 and the substrate 1 0 at this moment, and control the area etched by the epitaxial layer 2 0 and the substrate 1 0 by M. Where the value of R1 is smaller than the value of R2, it represents The more selective the etching solution is, that is, the stronger the reactivity between the etching solution and the substrate 10 is, the more the area of the substrate 10 is engraved by the surname. When the R1 value is much smaller than the value of 1? 2, the etching solution Reactivity to substrate 1 0 is too strong, so only the substrate 1 0 There is no limit to the size of the 10 area of the 4k engraved base plate.
444415 玉、發明說明(7) 制’只要能達到本發明的目的即可,只是當基板1 〇被蝕 刻的面積愈多,會使光子被基板1 〇吸收的比率愈低,使 LED晶粒的發光效率愈高,但是這並不是表示可以無限量 地蝕刻基板1 0的面積,尚需考慮整個LED晶粒的構造, 因此使用者可依基板1 Q 、磊晶層2 0的材質、R1以及R2 等因素’而適時地選擇蝕刻液的種類,以求達到最大的發 光效率。 而在本實施例中所使用的蝕刻液是由氨水(NH40H)與 雙氧水(Η 2 0 2 )所組成的混合液,其中使用者可藉由調整氨 水與雙氧水的混合比率,以調整蝕刻液對磊晶層2 0與基 板1 0的钮刻速率,而在本發明所揭露的較佳實施例中是 在室溫下以同比率之氨水與雙氧水的混合液(即ΝΗ40Η : Η 2 0 2 == 1 : 1 )所蝕刻出來的效果最佳,其蝕刻後的香菇狀結 構之蟲晶片如「圖3-c」所示。 當得到如「圖3- c」所示的結構後,再藉由一切割 刀將此香兹狀結構之蟲晶片截切成一個·一個的晶粒,如 「圖3-d」所示,至此步驟為止,即完成本發明之具有 香菇狀結構的LED晶粒的製作。 而為了要更清楚說明本發明之香菇狀結構的LED晶粒 與傳統LED晶粒的不同,特將「圖3 - d」中的一個LED晶 粒放大來加以說明’如「第4圖」所示。將「第1圖」與 「第4圖」相比較’即可明顯地看出在「第4圖」中磊晶 層2 0的下方並未完全與基板1 〇接觸,亦即遙晶層2 〇 下方的部份面積是裸空於外界環境,因此在L e D被點亮時444415 Jade, description of the invention (7) As long as the purpose of the present invention can be achieved, only when the area of the substrate 10 is etched more, the ratio of photons absorbed by the substrate 10 will be lower, and the The higher the luminous efficiency, but this does not mean that the area of the substrate 10 can be etched indefinitely. The structure of the entire LED die still needs to be considered. Therefore, the user can select the material of the substrate 1 Q, epitaxial layer 20, R1, and Factors such as R2 and so on, select the type of etching solution in a timely manner to achieve the maximum luminous efficiency. The etching solution used in this embodiment is a mixed solution composed of ammonia (NH40H) and hydrogen peroxide (Η 2 0 2). The user can adjust the ratio of the etching solution by adjusting the mixing ratio of ammonia and hydrogen peroxide. The engraving rate of the epitaxial layer 20 and the substrate 10, and in the preferred embodiment disclosed in the present invention is a mixed solution of ammonia water and hydrogen peroxide at the same ratio at room temperature (that is, NΗ40Η: Η 2 0 2 = = 1: 1) The effect of the etching is the best. The worm-shaped structure of the insect wafer after the etching is as shown in FIG. 3-c. After obtaining the structure as shown in "Figure 3-c", this worm-shaped wafer with a zirconium structure is cut into one and one grains by a cutting knife, as shown in "Figure 3-d". Up to this step, the fabrication of the LED die with a mushroom-shaped structure of the present invention is completed. In order to more clearly explain the difference between the LED chip of the mushroom-shaped structure of the present invention and the traditional LED chip, an LED chip in "Figure 3-d" is enlarged to explain it, as shown in "Figure 4" Show. Comparing "Fig. 1" with "Fig. 4", it can be clearly seen that in the "Fig. 4", the epitaxial layer 20 is not completely in contact with the substrate 10, that is, the remote crystal layer 2 〇Part of the area below is bare to the outside environment, so when L e D is lit
第10頁 4444 1 5 五、 發明說明(8) , 其 光 子 可 從 晶 層 2 0 下 方 的 裸 空 區 域 射 出 ( 如 厂 第 5 圖 J 所 示 ) 以 減 少 光 子 被 基 板 1 0 吸 收 的 比 率 可 提 升 LED的發光效率 〇 雖 缺 本 發 明 係 以 較 佳 實 施 例 揭 露 如 上 m 其 並 非 用 以 限 定 本 範 圍 5 任 何 熟 習 此 技 藝 者 在 不 脫 離 本 創 作 之 精 神 和 範 圍 内 當 可 作 些 許 之 更 動 與 潤 飾 例 如 本 發 明 之LED 晶 粒 的 外 觀 並 不 限 於 香 菇 形 狀 也 可 改 為 其 它 的 幾 何 形 狀 3 此 可 藉 由 融 刻 液 的 選 擇 刻 製 程 的 規 劃 而 達 成 其 在 實 施 上 並 不 困 難 , 另 外 從 一 基 板 製 成 具 有 正 背 面 電 極 的 晶 片 之 間 的 製 程 也 可 作 iBb 改 變 因 為 本 發 明 的 重 點 是 在 後 續 的 银 刻 製 程 因 此 在 刻 製 程 之 前 的 流 程 都 可 以 更 換 y * 不 會 影 響 後 續 的 刻 製 程 因 此 只 要 能 達 成 本 發 明 之 藉 由 刻 製 程 從 '—' 磊 晶 層 下 方 移 去 部 份 基 板 面 積 以 使 光 子 可 從 蟲 晶 層 下 方 基 板 移 去 之 區 域 射 出 而 提 升LED晶 粒 發 光 效 率 的 目 的 不 論 是 何 種 技 術 手 段 都 是 可 以 在 本 發 明 中 被 實 施 因 此 本 創 作 之 保 護 範 圍 當 視 後 附 之 中 請 專 利 範 圍 所 界 定 者 為 準 0 [ 發 明 之 功 效 ] 由 於 本 發 明 藉 由 4k 刻 製 程 從 一 蟲 晶 層 下 方 移 去 部 份 基 板 面 積 J 可 使LED晶粒在被點亮時 ,其光子可從磊晶層下 方 基 板 移 去 之 區 域 射 出 減 少 光 子 被 基 板 吸 收 的 比 率 y 可 提 升LED晶粒的發光效率 3 [ 圖 式 符 號 之 說 明 1 0 基 板Page 10 4444 1 5 V. Description of the invention (8), the photons can be emitted from the bare space under the crystal layer 20 (as shown in Figure 5 of the factory) to reduce the absorption rate of photons by the substrate 10 can be increased The luminous efficiency of LEDs. Although the present invention is disclosed in a preferred embodiment, it is not intended to limit the scope. 5 Anyone skilled in this art can make some changes and decorations without departing from the spirit and scope of this creation. For example, The appearance of the LED die of the present invention is not limited to the shape of shiitake mushrooms, but can also be changed to other geometric shapes. 3 This can be achieved through the planning of the selective engraving process of the melting and engraving solution, and its implementation is not difficult. The process of forming a wafer with front and back electrodes can also be changed for iBb because the focus of the present invention is on the subsequent silver engraving process and therefore the The process can be replaced by y * will not affect the subsequent engraving process, so as long as the cost of the invention can be removed by the engraving process from the '-' epitaxial layer part of the substrate area so that photons can be removed from the substrate under the worm crystal layer The purpose of improving the luminous efficiency of the LED die by shooting out the area can be implemented in the present invention regardless of any technical means. Therefore, the scope of protection of this creation shall be subject to the definition in the patent scope as attached. 0 [ Efficacy of the invention] Since the present invention removes a part of the substrate area J from a worm crystal layer through a 4k engraving process, when the LED die is lit, its photons can be emitted from the area removed by the substrate under the epitaxial layer. Decreasing the ratio of photons absorbed by the substrate can improve the luminous efficiency of the LED die. 3 [Explanation of Symbols 1 0 Substrate
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CN102280550A (en) * | 2011-08-16 | 2011-12-14 | 苏州纳方科技发展有限公司 | LED (Light Emitting Diode) chip with improved light emitting structure and preparation method thereof |
CN107393817A (en) * | 2017-07-25 | 2017-11-24 | 江苏长电科技股份有限公司 | A kind of chip structure and its manufacture method |
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Publication number | Priority date | Publication date | Assignee | Title |
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CN102280550A (en) * | 2011-08-16 | 2011-12-14 | 苏州纳方科技发展有限公司 | LED (Light Emitting Diode) chip with improved light emitting structure and preparation method thereof |
CN102280550B (en) * | 2011-08-16 | 2015-05-20 | 苏州纳方科技发展有限公司 | LED (Light Emitting Diode) chip with improved light emitting structure and preparation method thereof |
CN107393817A (en) * | 2017-07-25 | 2017-11-24 | 江苏长电科技股份有限公司 | A kind of chip structure and its manufacture method |
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