TW400537B - Method for manufacturing miniaturized device having corrugated diaphragm - Google Patents

Method for manufacturing miniaturized device having corrugated diaphragm Download PDF

Info

Publication number
TW400537B
TW400537B TW87121158A TW87121158A TW400537B TW 400537 B TW400537 B TW 400537B TW 87121158 A TW87121158 A TW 87121158A TW 87121158 A TW87121158 A TW 87121158A TW 400537 B TW400537 B TW 400537B
Authority
TW
Taiwan
Prior art keywords
film
micro
scope
wrinkled
patent application
Prior art date
Application number
TW87121158A
Other languages
Chinese (zh)
Inventor
Yau-Hua Shau
Jia-Wei Jang
Original Assignee
Shau Yau Hua
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shau Yau Hua filed Critical Shau Yau Hua
Priority to TW87121158A priority Critical patent/TW400537B/en
Application granted granted Critical
Publication of TW400537B publication Critical patent/TW400537B/en

Links

Landscapes

  • Micromachines (AREA)

Abstract

The invention provides a method for manufacturing miniaturized device having corrugated diaphragm, which utilizes different etch-back step to fabricate mini-circular corrugated diaphragm in one silicon chip for being used as a movable electrode plate, and the fixed electrode plate is composed of the aluminum film formed by thermal evaporating on a glass plate. Then, two electrode plates are joined to make the micro device, which could be applied in the fabrication of, for example, an actuator or the high sensitivity pressure gauge (capacitance typed) to achieve the benefit of lowering the manufacturing cost and the process time, and increasing the quantity in production and yield.

Description

五、發明說明(1) 【發明之範圍】 、本發明係有關於一種具皺褶薄膜之微型元件的製作方 法,且特別係一種以微型圓形皺褶薄膜作為移動電極,在 玻璃板上熱蒸鍍铭膜作為固定電極,以製作出靜 的方法》 、匕1十 【發明之背景】 ,近年來,微電子機械已多方發展應用於各種不同的領 域’例如有相當多的研究在探討作為微型幫浦(micro — pump)裝置的微型致動器(actuator)。對於微型幫浦致 動而s ,其的理論便有許多種,例如有採用壓電式(We — zoelectric)、空氣熱力式(therm〇pneumatic)、流 體電動力式(electrohydr〇dynamic )、靜電式(electr〇 — static)及電化學式(electr〇chemical)等等不同的 方法’其中又以靜電式致動器具有較它種致動器不受溫度 影響與製作簡易的特點。 一般而言’靜電式的微型元件係藉由在兩平行電極板 中升> 成相互吸引的靜電力所驅動。由過去的文獻中得知, 當微型裝置的機械結構涉及需有變形量大的機械元件時, 常常可見利用以皺褶式薄膜作為主要的核心設計之一。因 為皺褶薄膜之應力與應變比較均勻(線性),不會有應力 集中之現象’其結構比起一般平板式的薄膜也具有較高的 機械靈敏度;也就是說,元件在相同的負載下,皺褶薄膜 將產生較大的撓度變化,而這正是許多微型元件所必需具 備的特徵。因此,對於靜電式致動器所具有的移動式電極V. Description of the invention (1) [Scope of the invention] The present invention relates to a method for manufacturing a micro-component with a wrinkled film, and particularly relates to a micro-round wrinkled film as a moving electrode, which is heated on a glass plate. "Evaporation film as a fixed electrode to produce a static method", Dagger 10 [Background of the Invention] In recent years, microelectronic machinery has been developed in various ways and applied to a variety of different fields. Micro actuators for micro-pump devices. There are many types of micropump actuation theories, such as the use of piezoelectric (We — zoelectric), air thermodynamic (thermopneumatic), fluid electrodynamic (electrohydrdynamic), electrostatic (Electr0-static) and electrochemical (electr0chemical) and other methods' among them, electrostatic actuators have the characteristics of other types of actuators are less affected by temperature and easier to manufacture. Generally speaking, the 'electrostatic type micro-device is driven by electrostatic forces that are attracted to two parallel electrode plates and attract each other. It is known from the past literature that when the mechanical structure of a micro-device involves a mechanical element with a large amount of deformation, it is often seen that a pleated film is used as one of the main core designs. Because the stress and strain of the wrinkled film are relatively uniform (linear), there will be no stress concentration. Its structure also has higher mechanical sensitivity than the general flat film; that is, the components are under the same load. Wrinkled film will produce a large change in deflection, which is a necessary feature of many micro-components. Therefore, for a mobile electrode of an electrostatic actuator,

C:\Program Files\Patent\P-0223TW.ptd 第 4 頁C: \ Program Files \ Patent \ P-0223TW.ptd page 4

五、發明說明(2) ’甚至其它的致動器或其它的微型閥門、幫浦、壓力感測 器、加速度計等微型元件,都可見到皺褶薄膜理論的應用 請參照「 ACTUATORS” 期 and Dynamic with p+ S i1i 所形成的微型 約 4 5 0 β m 一深約為2 0 著利用氫酸鉀 在凹槽1 2的 褶1 4,如「 雜於所形成的 晶片1 0進行 極的製作。此 0,於基板2 後將兩電極接 元件。 然而,上 (1 )習 製作規則之圓 — active I on 刻出皺褶深度 第1圖」,其為Yang等人發表於"SENSORS & 刊A50 (1995 ) P15卜156 之"Fabrication Testing of Electrostatic Actuators con Diaphragms”論文中,有關以皺褶薄膜 元件的流程圖。如「圖1」所示,係先於一 厚的石夕晶片1 0上,以E P W蝕刻液定義出 的凹槽12 ’作為薄膜形成的區域;接 (K0H )溶液’以非等向性蝕刻蝕刻技術, 薄膜區域内定義出一深度約為丄4#m的皺 圖2」所示,然後進行一擴散製程,將硼摻 皺褶1 4 ;之後,請參照「第3圖」,對矽 背面蝕刻,形成皺褶薄膜丄6 ,完成移動電 由:,4」提供一玻璃材質基板2 0上形成一紹膜2 2作為固定電極之用,最 合(b〇nding)形成如「圖5」所示的微型 述的製程卻存在有至少下列的缺點: 知皺褶係以非等向性蝕刻的方式形成,無法 形敵禮型 <,-般若採用活性離子^V. Description of the invention (2) 'Even other actuators or other micro-valves, pumps, pressure sensors, accelerometers and other micro-components can see the application of the wrinkle film theory, please refer to the "ACTUATORS" period and The micro formed by Dynamic with p + S i1i is about 4 5 0 β m and the depth is about 2 0. The folds 1 4 of the groove 12 are made of potassium hydrogen acid. This 0, the two electrodes are connected to the component after the substrate 2. However, the circle of (1) to learn the production rule-active I on engraved the wrinkle depth Figure 1 ", which was published by Yang et al. In " SENSORS & Publication A50 (1995) P15, 156, " Fabrication Testing of Electrostatic Actuators con Diaphragms ", a flow chart about the use of wrinkled thin film elements. As shown in "Figure 1", it is preceded by a thick Shi Xi wafer On 10, the groove 12 'defined by the EPW etching solution is used as the area for forming the thin film; then the (K0H) solution' uses anisotropic etching and etching technology to define a depth of about 4 # m in the film area. Figure 2 ", and then a diffusion system After adding boron to the wrinkles 14; please refer to "Figure 3" to etch the back of the silicon to form a wrinkle film 丄 6 to complete the mobile power by: 4 "Provide a glass substrate 20 to form a shawl The film 22 is used as a fixed electrode. The process of forming the microstructure as shown in FIG. 5 has the following disadvantages: It is known that the wrinkles are formed by anisotropic etching. , Ca n’t be used as enemy etiquette <,-Principles using active ions ^

Etching,RiE)圚 姑、 J (Re )圓形皺褶的技術,w為 約1 0 # m為例,可能尊紅魯继 ~ J此要耗費幾小時到數十Etching, RiE) 圚 Gu, J (Re) round wrinkle technology, w is about 1 0 # m for example, may respect Hong Lu Ji ~ J this takes several hours to dozens

'發明說明(3) 小時,製程時間過長; 當高 成本 ,高能量的R I 卷且R 1 E的製程設備成本相 也過高。 叹可能要耗資千萬,因此製程的 (2 )「圖2』 刻石夕晶片的步驟才能 姓刻掉的部份與蝕刻 角,約為5 4 . 7。 槽’在相對位置上就 褶薄膜電極順利地與 铭電極間有足夠的間 的皺褶薄膜數量減少 褶薄膜形成的區域便 會受限制。 T之皺褶,需經由「圖3」中背面蝕 形成皺褶薄膜’而在背面蝕刻時,被 面形成有一夾角(「圖3」所示的0 ^ ,因此原先於「圖1」中形成的凹 必需保持適當的距離’這樣才能讓敏 鋁電極接合,並在接合後皺褶薄臈與 隙,但是如此一來矽晶片上所能形成 也就疋S兒,石夕晶片所能利用作為敏 無法提高,所以致動器的的產能當然 (3)上述致動器製作的步驟,是如「圖3」 为面蝕刻矽晶片形成皺褶薄膜,之後再如「圖: 將敏,薄膜電極與結電極接合,❻是,形成的敏指^眘 際上疋相當薄#,約在1 "m的範圍左右,而接合兩:極 時產生的接合應力卻可能會破壞掉所形成的皺褶薄膜, 此在實際生產的良率(yield )上便會有所影響。、因 【發明之目的及概述】 因此,本發明的目的便欲提供一種具皺褶薄膜之 元件,例如致動器或壓力計的製作方法,期能達到降= 作成本及製程時間,同時也能提高良率及產能。 -' 根據上述本發明之目的,所提供的微型元件形'Explanation of the invention (3) hours, the process time is too long; when the cost is high, the high-energy R I roll and the cost of the R 1 E process equipment are too high. The sigh may cost tens of millions of dollars, so the part of the process (2) "Figure 2" of the step of engraving the Shi Xi wafer can only be engraved and the etching angle, which is about 54.7. The groove pleats the film at the relative position. There is enough space between the electrode and the electrode to reduce the number of wrinkle films. The area where the wrinkle film is formed will be limited. The wrinkles of T need to be etched on the back side by forming a wrinkle film on the back side as shown in Figure 3 When the surface is formed with an included angle (0 ^ shown in "Figure 3", the recesses originally formed in "Figure 1" must be kept at an appropriate distance "so that the sensitive aluminum electrodes can be joined and the wrinkles are thin after joining.臈 and gaps, but in this way can be formed on the silicon wafer, 疋 疋, Shi Xi wafer can be used as a sensor can not be improved, so of course the capacity of the actuator (3) the above-mentioned actuator manufacturing steps, It is as shown in "Figure 3", and a wrinkled film is formed by etching the silicon wafer on the surface, and then it is shown as "Figure: the sensitive, thin film electrode and junction electrode are joined. 1 " m range, while joining two: extremely However, the bonding stress may destroy the formed wrinkled film, which will have an impact on the yield of the actual production. Because of the purpose and summary of the invention, the object of the present invention is to provide a The manufacturing method of a component with a wrinkled film, such as an actuator or a pressure gauge, is expected to reduce the cost and process time, and also improve the yield and productivity.-'According to the above-mentioned object of the present invention, Miniature element

五、發明說明(4) 至少包含: 提供一梦基板和一玻璃基板,玻璃基板上並形成有一 金屬薄膜; 於石夕基板上’蝕刻定義出一薄膜區域; 於薄膜區域上形成一保護層; 定義薄膜區域圖案,以等向性濕蝕刻形成一圓形皺褶 t 去除保護層,並將一離子摻雜入圓形皺褶以形成一皺 褶薄膜; 接合矽基板與玻璃基板,使金屬薄膜置於薄膜區域, 對應皺褶薄膜;以及 背面#刻梦基板’以暴露出皺褶薄膜。 基於圓形皱褶薄膜的複雜性以及重覆性,戶斤以將發展 出二系列的電腦程式來自動產生圓形圖案,以做為微細加 工時的光罩之用。#電式元件是由兩個電極板所組成分 別是定義在矽晶片的可移動電極板,及定 740的玻璃上的固定電極板。 V f 卜上中移動的電極板在薄膜區域形成之前,石夕基板 成有-絕緣層,以保護未有薄膜區域形成的石夕美 伴用-非等向㈣刻法钱刻形成-凹; ,=護層貝]疋作為㈣出凹溝時的遮罩,纟需於形成 :刖二!薄膜區域形成的石夕基板一面塗-層光阻作保 以一HF侧,。溶液_形成具有同心的圓二:層並再5. Description of the invention (4) At least: providing a dream substrate and a glass substrate, and a metal thin film is formed on the glass substrate; 'etching' to define a thin film region on the Shixi substrate; forming a protective layer on the thin film region; Define the pattern of the film area, and form a circular wrinkle by isotropic wet etching. Remove the protective layer, and dope an ion into the circular wrinkle to form a wrinkle film. Join the silicon substrate and the glass substrate to make the metal film. It is placed on the film area, corresponding to the wrinkled film; and the back side is carved with a substrate to expose the wrinkled film. Based on the complexity and repeatability of circular pleated films, Hu Jin will develop two series of computer programs to automatically generate circular patterns for use as photomasks for micro-processing. #Electrical components are composed of two electrode plates, which are respectively defined as a movable electrode plate on a silicon wafer and a fixed electrode plate on the glass of 740. Before the moving electrode plate in V f is formed on the thin film area, the Shixi substrate is formed with an insulating layer to protect Shi Ximei, which is not formed in the thin film area, with a non-isotropic engraving method. = Shell shell] 的 As a mask when digging out the groove, 纟 needs to be formed: 刖 二! One side of the Shi Xi substrate formed in the film region is coated with a layer of photoresist for protection on an HF side. Solution_ form a circle with concentric two: layer and then

五、發明說明(5) 製作擴f法將硼離子摻雜至矽基板,完成皺褶薄膜電極的 成鋁骐所Ζί電極的部份則是以熱蒸鍍法在玻璃基板上形 阻di:電極,之前需作-前置定位對準’係以-光 片:過程已接近完成的判斷,至於背面钱刻石夕晶 因此可ϊ 作㈣的阻插(一topped), 易獲侍最後的皺褶圖案。 敵褶ΐϊ明刻技術研製靜電式元件的圓形 形敵袍阁安^ 化費低廉的情況下快速製作出具有圓 統整體微纟、知電極。另外又以新的背面蝕刻方式,改善傳 揾古二工(bulk mi cr〇ma chining )的缺點,並且 =阳片表面的利用率。在本發明的製程設計中,更僅 需二個光罩即可完成靜電式元件的製作。 此外,因考量薄膜結構的機械強度下,選擇製作2 , 階二ί ί:皺褶薄膜進行測試’ W用薄膜反射光影像的灰 Ρ *來預估作為致動器時的致動能力,結果2 . 5〆 =的薄膜在1 5伏特的電壓輸入下,致動器薄膜中心能 產生約1em的撓度變化。 為讓本發明之上述和其他目的、特徵、和優點明 ..懂,下文特舉一較佳實施例,並配合所附圖式,作詳 細說明如下。 圖式說明: 第1〜4圖繪示習知一種具皺褶薄膜之靜電式元件的V. Description of the invention (5) Fabrication method is doped with boron ions to the silicon substrate to complete the formation of the wrinkled thin-film electrode. The part of the electrode is formed on the glass substrate by thermal evaporation method di: The electrode needs to be made before-pre-alignment and alignment 'is based on-light film: the judgment of the process is almost completed, as for the engraved stone Xijing on the back, it can be used as a topped, which is easy to get the last Wrinkled pattern. The enemy's pleated engraving technology develops a round-shaped enemy robe with electrostatic components. At a low cost, it can quickly produce an integrated micro-electrode with a circular system. In addition, a new backside etching method is used to improve the disadvantages of bulk mi croma chining, and the utilization rate of the surface of the positive film. In the process design of the present invention, only two photomasks are needed to complete the fabrication of the electrostatic component. In addition, considering the mechanical strength of the thin film structure, we chose to make 2, Tier 2 ί ί: Wrinkle film for testing 'W Gray film * with film reflection light image to estimate the actuation ability when used as an actuator, the result 2.5. 5〆 = thin film At a voltage input of 15 volts, the center of the actuator thin film can produce a deflection change of about 1em. In order to make the above and other objects, features, and advantages of the present invention clear, a preferred embodiment is described below in detail with reference to the accompanying drawings, as follows. Description of the drawings: Figures 1 to 4 show conventional electrostatic components with a wrinkled film.

C:\Program Files\Patent\P-0223TW. ptd 第 IM9 五、發明說明(6) 製作流程圖; 的製圖緣示根據本發明之-種微型元件實施例 的微型元件製程實施 第14〜16圖繪示圖5〜 例中所需的三個光罩的圖案;以及 知方:i I較:8圊繪示以本發明方法形成的致動器與習 【實施例說明】 本實施例採用等向,括# 極,其可由「圖5〜]n J研製微型元件的敏槽薄膜電 首先,請參照「第。的流;圖來說明。 褶薄膜形成的基底。由於矽蝕矽基板1 0作為皺 方向產生不同情況隨著石夕晶圓結晶圖樣的 ,^ 0 σ ^ 异蝕刻的速率取決於晶體結晶的方向 # θ Φ ^ 1 、厂特定方向上矽晶體的蝕刻最有效率,一 .§二η n f的速率會依下列梦晶體的排列順序依序減弱 .(1 〇 〇) > ( 1 1 〇) > ( i 1丄),因此本實例中 :採用早晶矽(100)的矽基板1〇 (4英吋的p型矽 基板,8 — 12〇hm— cm,單面拋光,厚度約325 〜375#m)。取得矽基板1Q之後必須先進行初步清 洗Umtial cleaning)的步驟,係利用標準的r c a清 洗程序除去石夕晶圓表面的顆與雜質。 接著,請參照「第6圖」,在上述的矽基板丄〇上形 成一層絕緣層3 2 ,例如為利用濕式氧化(wet 〇xida — tion)所形成的一層厚度約6 〇 〇 〇A的二氧化矽(Si〇2C: \ Program Files \ Patent \ P-0223TW. Ptd Section IM9 V. Description of the invention (6) Production flow chart; The drawing edge shows the implementation of the micro device manufacturing process according to the micro device embodiment of the present invention. Figures 14 ~ 16 5 patterns of the three photomasks shown in the examples are shown; and the knowing party: i I: 8: the actuators and exercises formed by the method of the present invention are illustrated. [Description of the embodiment] This embodiment uses, etc. Directions, including # poles, can be developed in "Figure 5 ~] n J. The thin film of the micro cell is first described with reference to the flow of the". ". The substrate formed by the pleated film. Since the silicon substrate is etched by silicon 10 As the wrinkle direction produces different conditions. With the crystal pattern of the Shixi wafer, the rate of ^ 0 σ ^ hetero-etching depends on the direction of crystal crystallization # θ Φ ^ 1, the silicon crystal etching in the specific direction of the plant is the most efficient, one. § The rate of two η nf will be sequentially weakened according to the order of the following dream crystals. (100) > (1 1〇) > (i 1 丄), so in this example: early crystal silicon (100) Silicon substrate 10 (4-inch p-type silicon substrate, 8 — 120 hm — cm, polished on one side, thickness 325 ~ 37 5 # m). After obtaining the silicon substrate 1Q, the steps of preliminary cleaning (Umtial cleaning) must be performed first. The standard rca cleaning procedure is used to remove particles and impurities on the surface of the Shixi wafer. Then, please refer to "Figure 6". An insulating layer 3 2 is formed on the silicon substrate 丄 above, for example, a layer of silicon dioxide (Si〇2) having a thickness of about 6,000 A formed by wet oxidation (wet oxidation).

C:\ProgramFiles\Patent\P-0223TW.ptd 第 9 頁 ),ί。其主要的作用是作為後續在蝕刻出皺褶薄膜區域時 ’能保護未形成皺褶薄膜的矽基板1 〇部份。 再緊接著參照「第7圖」,將於上述形成絕緣層3 表·面利用如「圖14 I戶斤开·一, ji J, a 薄腺先罩1疋義出一具凹槽的 、Q , 3 4,所採用的方法為以氫酸鉀(K〇H )溶液蝕 乂的非等向性蝕刻。而為了蝕刻掉薄膜區域3 4上的二 八2層3 2 ,矽基板1 〇需先浸泡在B〇E的溶液内約七 71 ’然後再將矽基板1 〇表面以溫度約為6 0 t,濃;&: 糾為3 〇 wt %的KOH進行約二十分鐘的蝕刻,這樣可以又 ,刻出約6 . 1 /i m的钱刻深度。所要形成的敏褶薄 將在此凹槽的薄膜區域34内製作。 、 然後,請參照「第8圖」,再次於上述蝕刻出的 部位再形成一層保護層3 β ,例如同樣是以濕式梟 、所形成的一厚度約8 0 〇 〇Α的二氧化矽層。保護層 的主要作用是提供後績形成皺褶時,作為皺褶平 的蝕刻遮罩。 伋條紋 之後,請參照「第g圖」,將於前述的薄膜區域3 士形成所要的皺褶薄膜。所採用的方法是完全與習知以j 能量R I E技術絕然不同的等向性蝕刻方式。也正因= 用濕ii刻技術形成皺褶薄骐,所以習知R〗E所需投; 向價設備可免去,而且在製程的速度上也不需如R丨^ 輒要耗費幾個小時以上的時間。本實例中以濕式蝕刻 皺褶所需搭配的光罩2的圖形如「圖1 5」所示,為二 有同心圓形條紋4 2的光罩。在製作圓形皺褶時,;基^C: \ ProgramFiles \ Patent \ P-0223TW.ptd on page 9), ί. Its main function is to protect the silicon substrate 10 portion where the wrinkled film is not formed when the wrinkled film area is etched later. Next, referring to "Figure 7", the surface and surface of the insulating layer 3 will be formed as described in "Figure 14 I. ji J, a, ji J, a thin gland cover 1" to define a grooved, Q, 34. The method used is anisotropic etching with a solution of potassium hydroxide (KOH). To etch away the 282 layer 3 2 on the thin film region 34, the silicon substrate 1 It needs to be immersed in the solution of BOE for about 71 ', and then the surface of the silicon substrate 10 is etched at a temperature of about 60 t, &: it is corrected to 30 wt% KOH for about twenty minutes In this way, a money engraving depth of about 6. 1 / im can be engraved. The sensitive folds to be formed will be made in the film region 34 of this groove. Then, refer to "Figure 8" and repeat the above A protective layer 3 β is further formed on the etched part, for example, a silicon dioxide layer having a thickness of about 800 Å is also formed by a wet process. The main function of the protective layer is to provide a smooth etching mask for wrinkles when wrinkles are formed. After drawing the stripes, please refer to "Figure g", and form the desired wrinkled film in the film area 3 as described above. The method used is a completely different isotropic etching method from the conventional j-energy R I E technology. It is also because of the formation of thin wrinkles with wet engraving technology, so it is known that R〗 E requires investment; the price equipment can be eliminated, and the speed of the process does not need to be as much as R 丨 ^ 辄More than hours. The pattern of the photomask 2 required for the wet etching of the wrinkles in this example is shown in FIG. 15 and is a photomask having two concentric circular stripes 4 2. When making round wrinkles, the base ^

10 =老面(即未有薄膜區域3 4形成的一面)需要先涂_ 一f光阻(ph〇t0resist )保護起來,接著,在光罩2的" 遮蔽下,先以B0E溶液去除薄膜區域3 4上的二氧化石夕 層3 6 ’大約將整個矽基板1 〇浸泡在b 〇 e溶液中約九 分鐘]便可藉此去除約8 〇 〇 〇 A厚度的二氧化矽層3' 6 ’而形成如圖示中的多數個圓形凹洞3 6 2的部份。然後 ’再將石夕基板1 〇浸於例如HF_HN03_H2〇溶液中,以體積 比約為1 : 1 〇 : 5的調配混合液,經約四分鐘的操作時 間便可產生約lOvm的多數個凹溝38 ,於薄膜區域3 4内形成所要的圓形皺褶。然而,若藉由改變光罩2的圖 案,便可定義出具有不同圖案的皺褶,例如為具螺旋狀線 條(convoluted )的皺褶。因此,本發明皺褶薄膜的形狀 可視需求,藉由光罩2的提供,製作出所要求的皺褶圖案 」,除去石夕 進行一離子 散(d i f fus ide » Grade DIA. x 〇 中’將硼參 件如在周圍 約 2 . 5 /z ’矽化硼坡 成’所以要 基板1 0皺褶表 摻雜的製程以形 ion )法,利用 BN-HT 1100 , 0 4")在N2 ( 雜在矽中,完成 溫度1 1 0 °C下 m厚的硼薄膜4 璃(boros i1i -去除此B S G。 而後’請參照「第1 〇圖 面部份的二氧化矽3 6後,將 成皺褶薄膜。本實施例採用擴 平面式擴散設備(Boron Nitr Part No. F40040 > Size 4" 1 0 1 )和02 ( 2 5 0 m 1 ) 硼離子的擴散製程。操作的條 ,約耗時1 . 5個小時可產生 0。此外,在硼離擴散過程中 cate glass,B S G )也會形10 = the old side (ie, the side without the film area 3 4) needs to be coated with a photoresist (ph0t0resist), and then, under the mask of the photomask 2, remove the film with B0E solution first The silicon dioxide layer 3 6 'on the area 34 is approximately immersed the entire silicon substrate 10 in the b oe solution for about nine minutes], thereby removing the silicon dioxide layer 3' with a thickness of about 8000 A. 6 'and form a plurality of circular recesses 3 6 2 as shown in the figure. Then 'immerse the Shixi substrate 10 in, for example, a solution of HF_HN03_H2〇, and prepare a mixed solution with a volume ratio of about 1: 10: 5, and after about four minutes of operation time, a plurality of grooves of about 10 vm can be generated. 38. A desired circular wrinkle is formed in the film area 34. However, if the pattern of the mask 2 is changed, wrinkles with different patterns can be defined, for example, wrinkles with spiral lines (convoluted). Therefore, the shape of the wrinkle film of the present invention can be made according to the requirements, and the required wrinkle pattern can be produced by providing the photomask 2 ", and Shi Xi is removed to perform an ion dispersion (dif fus ide» Grade DIA. X 〇 中 '将 Boron For example, the parts around 2.5 / z 'Boron silicide slope into' so the substrate 10 wrinkle surface doping process using the shape ion method, using BN-HT 1100, 0 4 ") in N2 ( In silicon, the boron film 4 m (boros i1i-remove this BSG at a temperature of 110 ° C) will be wrinkled after seeing "silicon dioxide 36 in the figure 10". Thin film. In this embodiment, a flattened diffusion device (Boron Nitr Part No. F40040 > Size 4 " 1 0 1) and 02 (2 50 m 1) diffusion process of boron ions are used. The operating strips take about 1 time. 5 hours can produce 0. In addition, cate glass (BSG) will also form during the boron ion diffusion process.

=以利用約四十分鐘於9 Ο 0 t環境下的洱式A 序,接著再以"b〇ron dilution"的步驟土化程 浸泡約五十分鐘,便會幫助除去B S G,如此便形:: 為硼的皺稽薄膜 '然而,除此之外,敵褶薄膜 ,因此應視鈹褶薄膜的應用採用相心質ί 擴散裂程形成所要的皺褶薄膜。 再由「第1 1圖」來說明固定電極板的製作。 AfeU11」戶斤示,將一金屬薄膜18形成於-玻璃 土 u上’例如是以熱蒸鍍(thermal evaporation ) 法在Py rex #7740的玻璃(直徑4英寸,厚度〇 . 5 mm,密度為2 . 23g//cm3 ,熱膨脹係數約為 5xl〇 — 7 (〇 〜30Q °c)),形成一厚約 〇·5 的鋁膜。其中「圖16」所示的光罩3便是用來定義 1J1定電極中鋁膜的圖案,光罩3上所形成的一溝槽44, 疋田本發明之微型元件作為致動器時,致動器應用於一醫 學用微型幫浦中,量測例如血液中的紅血球特性,紅血球 可經由溝槽4 4中心滴入而沿溝槽4 4的管道進入致動器 中作量測。而於鋁膜2 2蒸鍍上玻璃基板5 0之後,還得 放入Η3Ρ04 : ΗΝ03 : CH3C00H : Η20,體積溶度比約 5 0 : 2 : 1 0 : 9的混合液中,將溫度控制在約6 0。(:左右, 浸泡約5 0秒。 最後,經由「第12、13圖」的製程完成微型元件 的製作。 如「圖1 2」所示,進行玻璃基板2 0與矽基板1 0= Using about 40 minutes in the 9A sequence under the condition of 9 〇 0 t, and then soaking for about 50 minutes in the soilization process of the "bron dilution" step, it will help to remove BSG, so it will be shaped ::: Wrinkle film for boron 'However, besides, it is an enemy pleated film, so the beryllium pleated film should be used depending on the application of the phase centroid diffusion diffusion process to form the desired pleated film. The production of the fixed electrode plate will be described with "Fig. 11". AfeU11 "shows that a metal thin film 18 is formed on the glass soil u ', for example, a glass (4 inches in diameter, 0.5 mm in thickness, and a density of 4 inches in diameter by Py rex # 7740 by a thermal evaporation method). 2.23g // cm3, the thermal expansion coefficient is about 5 × 10—7 (0 ~ 30Q ° C)), forming an aluminum film with a thickness of about 0.5. Among them, the photomask 3 shown in FIG. 16 is used to define the pattern of the aluminum film in the 1J1 fixed electrode. A groove 44 formed on the photomask 3 is caused when the miniature component of the present invention is used as an actuator. The actuator is used in a medical micropump to measure, for example, the characteristics of red blood cells in the blood. The red blood cells can be dripped in through the center of the groove 44 and enter the actuator along the channel of the groove 44 for measurement. After the aluminum film 22 is vapor-deposited on the glass substrate 50, it must be placed in a mixed solution of Η3Ρ04: ΗΝ03: CH3C00H: Η20, and a volumetric solubility ratio of about 50: 2: 1 0: 9 to control the temperature at About 60. (: Left and right, soak for about 50 seconds. Finally, the micro-device manufacturing is completed through the process of "Figures 12 and 13". As shown in "Figure 12", the glass substrate 20 and the silicon substrate 10

五、發明說明(10) 接合(anod i c bond i ng )時,必需先作前置定位的對準, 例如係採用Kar 1 Suss A1 i gner機台完成。並且接合時例 如可利用光阻(photoresist)當作接合劑(bonding agent)。在初步定位(pre-bonding)三分鐘後,接合改 用例如Kar 1 Suss SB6 Bonder機台,在操作條件:溫度4 6〇〇’電壓100〇\/',電流2.1〇]11六(1113叉·), 大氣壓力之下進行,需時約5 0分鐘。當通過的最大電流 降係原來的三分之一時,表示接合的過程接近完成。 然後’如 圖1 3」所示,背面钱刻(backside etching)石夕基板1 〇 ’直到暴露出领薄膜4 〇才停止。 可見「圖1 0」中進行的硼離擴散具有兩個目的:一的用 來形成2 . 5 厚的薄膜電極’另一目的是用來當背面 蚀刻的阻撞(etch-stopped )之用。 若以上述本發明方法形成的微型元件作為致動器的應 用’可藉由「第1 6、1 7圖」的比較,說明習知方法所 形成如「圖4」的致動器,及以本發明方法形成如「圖工 3」的致動器,在相同載面積基板上,所能形成的致動器 的數量’可很明顯可看ί,本發明方法形成的致動器之間 从不似習知方法要保留-相當大的間,巨,因此對基板表面 7 =而昇了許多,當然產量上也就會提高。 【本發明之效果】 本發明的製程只需單拋 (1 )從使用的碎基板來看 光的晶片,可節省晶片成本。 (2)製程中僅採用三道光罩即可 在製作光罩的成V. Description of the invention (10) When bonding (anod i c bond i ng), it is necessary to perform pre-position alignment first, for example, it is completed by Kar 1 Suss A1 i gner machine. In addition, for example, a photoresist can be used as a bonding agent during bonding. After three minutes of preliminary positioning (pre-bonding), the bonding is changed to, for example, a Kar 1 Suss SB6 Bonder machine, under operating conditions: temperature 4600 ′, voltage 100 ′, current 2.10] 11 six (1113 fork ·), Under atmospheric pressure, it takes about 50 minutes. When the maximum current drop is one third of the original value, it indicates that the joining process is almost complete. Then, "as shown in Fig. 13", the backside etching of the stone evening substrate 10 is not stopped until the collar film 40 is exposed. It can be seen that the boron ion diffusion performed in "Fig. 10" has two purposes: one is to form a 2.5-thick thin-film electrode, and the other is to be used for back-etching (etch-stopped). If the above-mentioned application of the micro-component formed by the method of the present invention is used as an actuator ', the comparison of "Figures 16 and 17" can be used to explain the actuator formed by the conventional method as "Figure 4", and The method of the present invention forms actuators such as "drawer 3". The number of actuators that can be formed on a substrate of the same load area can be clearly seen. Not like the conventional method to keep-quite large, huge, so 7 = on the substrate surface has increased a lot, of course, the yield will also increase. [Effects of the present invention] The manufacturing process of the present invention only needs to throw a single wafer (1) from the perspective of the broken substrate used, which can save wafer costs. (2) Only three masks can be used in the manufacturing process.

本上降低一半’不僅如此 程所需的時間也就愈短, 誤差。 ’使用的光罩數愈小,完成的製 還可降低製程中因對準而造成的 φ ^ „本發明於背面蝕刻所使用的蝕刻液為ΚΟΗ ’而 D 面姓刻或其它製程的蝕刻有採用E P W的蝕刻液 彳因E P W有劇毒,因此可減小製程的危險性。 (4 )本f明在接合矽基板與玻璃基板時不似習知 板有薄薄的敵褶薄冑,因此不 為接合造成皴 褶薄的損壞。 (5 )本發明採用接合矽基板和玻璃基板之後,再背 面姓刻石夕基板,可保護已形成的皺褶薄膜的結構,同時可 隔絕蝕刻時蝕刻液侵入兩電極板之間的縫隙。 (+6 )由於碎基板是整個背面蝕刻的方式,所以當蝕 刻至硕薄膜的姓刻阻擋層時,皺褶圖案便自然就會浮現出 來’因此背面蝕刻的時間就相當容易掌握。 (7 )本發明的背面蝕刻方式與習知不同,主要是改 f傳統整體微細加工的缺點,使基板表面的利用率提高。 習知背面钱刻方式’往往造成兩個V型槽間的區域(如圖 1 7所不)無法利用,因而大大降低了晶片表面的利用率 ’藉由改善此點缺點’本發明的製程可充分利用整片基板 的表面,使元件產量大幅提昇。Not only does this reduce by half 'not only the time required for this process is also shorter, the error is. 'The smaller the number of photomasks used, the finished system can also reduce the φ caused by the alignment during the process. ^' The etching solution used in the back surface etching of the present invention is ΚΟΗ ', and the etching of the D surface name or other processes has EPW is used as an etchant because EPW is highly toxic, so it can reduce the risk of the process. (4) This f is not as thin as conventional boards when it joins silicon substrates and glass substrates. (5) In the present invention, after the silicon substrate and the glass substrate are joined, the backside is engraved with a stone substrate, which can protect the structure of the formed wrinkle film, and at the same time, it can block the intrusion of the etching solution during etching. The gap between the two electrode plates. (+6) Since the broken substrate is the way of etching the entire back surface, when the etched barrier layer of the film is etched, the wrinkle pattern will naturally emerge. It is quite easy to grasp. (7) The backside etching method of the present invention is different from the conventional method, which mainly improves the disadvantages of the traditional overall microfabrication and improves the utilization rate of the substrate surface. The conventional backside money engraving method often causes The area between the V-grooves (not shown in Figure 17) cannot be used, thus greatly reducing the utilization rate of the wafer surface. 'By improving this disadvantage,' the process of the present invention can make full use of the surface of the entire substrate to make the component Production has increased significantly.

(8 )本發明採用等向性濕蝕刻技術製作圓形皺褶薄 膜’此一等向性濕式蝕刻在製程的花費上僅需四分鐘左右 ’即可達到1 〇 β m左右的蝕刻深度,較之傳統以R I E(8) The present invention uses an isotropic wet etching technique to produce a circular pleated film. 'This isotropic wet etching only takes about four minutes in the process cost' to reach an etching depth of about 10 m, Compared with the traditional RIE

C:\ProgramFiles\Pateivt\P-0223TW.ptd 第 14 頁C: \ ProgramFiles \ Pateivt \ P-0223TW.ptd page 14

的非等向性蝕刻,蝕刻同樣的深度,必需 數十小時,很明顯可看出速度上提昇;m幾小:至 性濕式蝕刻只需花費幾十元的蝕刻液成本: 皺的f ?,較之R1E的設備動輒需數千ΐ的經費 ,在成本上也疋大大的減少了。因此,以本發明等向性濕 蝕刻技術比高能量R I Ε設備省時,可提供—個既快速又 實惠的方式來製作圓形皺褶薄膜》 综上所述,雖然本發明已以一較佳實施例揭露如上, 然其並非用以限定本發明’任何熟習此技藝者在不脫離 本發明之精神和範圍内,當可作些許之更動與潤飾,例如 若將敵褶電極板的皺褶圖案改成迴旋狀線條,類似於應變 計(strain guage )之導線,另一邊固定電極板不用鍍鋁 膜’就可以改做成壓阻式壓力計’可以針對低壓力、風壓 或血壓量測蛇圍提供南靈敏度的量測。同樣的,致動器也 可反向細作為電容式的加速度计。因此本發明之保護範圍 當視後附之申請專利範圍所界定者為準。 【圖式之符號說明】 10 12 14Non-isotropic etching, the same depth of etching, it must take tens of hours, it is obvious that the speed increase; m is small: to the wet etching only cost tens of yuan of etching solution cost: wrinkled f? Compared with R1E equipment, which requires thousands of dollars in expenses, the cost is also greatly reduced. Therefore, using the isotropic wet etching technology of the present invention saves time compared to high-energy RI E equipment, it can provide a fast and affordable way to make a circular wrinkled film "In summary, although the present invention has been compared with The preferred embodiment is disclosed above, but it is not intended to limit the present invention. 'Any person skilled in the art can make some modifications and retouches without departing from the spirit and scope of the present invention, for example, if the enemy folds the electrode plate's folds The pattern is changed into a convoluted line, similar to a strain gauge (strain guage) wire. The fixed electrode plate on the other side can be converted into a piezoresistive pressure gauge without an aluminum coating. It can measure low pressure, wind pressure or blood pressure. Shewei provides a measure of south sensitivity. Similarly, the actuator can also be reversed as a capacitive accelerometer. Therefore, the scope of protection of the present invention shall be determined by the scope of the attached patent application. 【Illustration of Symbols】 10 12 14

•碎基板 .·凹槽 ..皺褶 皺摺薄膜 金屬薄膜 玻璃基板 •.鋁膜• Broken substrate. · Groove: Wrinkled Wrinkled film Metal film Glass substrate • Aluminum film

五、發明說明(13) •絕緣層 薄膜區域 •保護層 .·凹溝 •硼薄膜 圓形條紋 ..溝槽 .•凹洞 .·光罩 3 2··· 3 4··· 3 6··· 3 8··· 4 0··· 4 2··· 4 4··· 3 6 2·· 1 、2 、3 IIB· C:\PrograniFiles\Patent\P-0223TW_ptd 第 16 頁V. Description of the invention (13) • Insulation film area • Protective layer • Grooves • Boron film circular stripes • Grooves • Recesses • Photomask 3 2 ··· 3 4 ··· 3 6 · ·· 3 8 ·· 4 0 ··· 4 2 ··· 4 4 ·· 3 6 2 ·· 1 2 3 3 IIB · C: \ PrograniFiles \ Patent \ P-0223TW_ptd page 16

Claims (1)

六、申請專利範圍 一種具皺褶薄膜之微型元件的製作方法,至少包含下 列步驟: 3 提供一矽基板和一玻璃基板’該玻璃基板上形成有— 金屬薄膜; ~ 於該矽基板上,蝕刻定義出一薄膜區域; 於該薄膜區域上形成一保護層; 疋義該薄膜區域圖案,以等向性滿姓刻形成—固^ 6 4羽· A 圓形皺 去除該保護層,並將一離子摻雜入該圓形皺糟以 一皺褶薄膜; ’成 接合該矽基板與該玻璃基板,使該金屬薄膜置於^ , 膜區域,對應該皺褶薄膜;以及 '忒薄 背面蝕刻該矽基板’以暴露出該皺褶薄膜。 2、如申請專利範圍第1項所述具皺褶薄骐之微型_ 製作方法,其中該金屬膜為以熱蒸鍍法所苹=件的 〇.5em的鋁膜。 、厚約 3、如申請專利範圍第1項所述具皺褶薄媒之微 製作方法,其中形成該薄膜區域之前,更包人7^件的 基板上係先形成一絕緣層。 i 3於该矽 4、如申請專利範圍第3項所述具皺褶薄膜之微〗_ 製作方法,其中該絕緣層係為以濕式氧化法^•疋件的 厚度約為6000A的一二氧化矽層。 '所形成’ 5 如申請專利範圍第4項所述具皺褶薄膜 製作方法,其中形成該薄膜區域之前, 之微型元件的6. Scope of patent application A method for manufacturing a micro-component with a wrinkled film, including at least the following steps: 3 Provide a silicon substrate and a glass substrate 'the glass substrate is formed with a metal film; ~ on the silicon substrate, etching Define a thin film area; form a protective layer on the thin film area; define the pattern of the thin film area and form it with an isotropic full name—solid ^ 6 4 feathers · A circular wrinkle to remove the protective layer, and Ions are doped into the circular wrinkle to form a wrinkled film; 'to join the silicon substrate and the glass substrate, so that the metal film is placed in the film region, corresponding to the wrinkled film; and A silicon substrate 'to expose the wrinkled film. 2. The method for making a micro-wrinkled thin film as described in item 1 of the scope of the patent application, wherein the metal film is an aluminum film of 0.5em that is obtained by thermal evaporation. 3, as thick as 3. The microfabrication method for wrinkled thin media as described in item 1 of the scope of the patent application, wherein an insulating layer is first formed on the substrate that includes 7 ^ pieces before forming the film area. i 3 In the silicon 4, as described in item 3 of the scope of the patent application, the micro-wrinkled film is made __ The manufacturing method, wherein the insulating layer is made of a wet oxidation method ^ • the thickness of the piece is about 6000A Silicon oxide layer. 'Formed' 5 The method for manufacturing a wrinkled film as described in item 4 of the scope of patent application, wherein before forming the film region, 該二氡化矽層The silicon dioxide layer C:\Program Files\Patent\P-0223TW. ptd 第 17 頁 六、申請專利範圍 ' — 係以一Β Ο E溶液去除’時間約費時7分鐘。 6、 如申請專利範圍第1項所述具皺褶薄膜之微型元件的 製作方法,其中該薄膜區域係利用—非等向性蝕刻法 ,以一KOH溶液蝕刻約2 0分鐘,形成深度約為6 / 1 Arn的一凹槽。 7、 如申請專利範圍第6項所述具皺褶薄膜之微型元件的 製作方法,其中該ΚΟίΙ溶液的濃度約3 〇 wt %,操作 溫度約為6 0。(:。 8、 如申請專利範圍第1項所述具皺褶薄膜之微型元件的 製作方法’其中該保護層為以濕式氧化法所形成,厚 度約為8 0 〇 〇A的一二氧化矽層,作為蝕刻出該等 凹溝時的遮罩。 9、 如申請專利範圍第1項所述具皺褶薄膜之微型元件的 製作方法,其中形成該等凹溝之前’未有該薄臈區域 形成的該矽基板一面係塗有一層光阻保護。 1 ◦、如申請專利範圍第1項所述具皺褶薄膜之微型元件 的製作方法,其中該皺褶的形成,係先以一 B 〇 E溶 液,操作時間約為9分鐘,以除去約8 Ο Ο 〇 A的該 保護層;之後再以體積比為1 : 1 0 : 5的一HF-Η N 0 3 - Η 2 0溶液,操作時間約為4分鐘’以钮刻形成約 1 0 /zm深度的該皺褶。 11、如申請專利範圍第1項所述具皺褶薄膜之微型元件 的製作方法’其中該皱權薄嫉係由—擴散法摻雜一删 離子所形成。C: \ Program Files \ Patent \ P-0223TW. Ptd page 17 6. Scope of patent application — — It takes about 7 minutes to remove it with a Beta E solution. 6. The method for manufacturing a micro-component with a wrinkled film as described in item 1 of the scope of the patent application, wherein the film region is etched with a KOH solution for about 20 minutes using an anisotropic etching method to form a depth of about 20 minutes. A groove for 6/1 Arn. 7. The method for manufacturing a micro-component with a wrinkled film as described in item 6 of the scope of the patent application, wherein the concentration of the KOΙ solution is about 30 wt%, and the operating temperature is about 60. (:. 8. The method for manufacturing a micro-component with a wrinkled film as described in item 1 of the scope of the patent application, 'wherein the protective layer is formed by a wet oxidation method and has a thickness of about 8000 A. A silicon layer is used as a mask when the recesses are etched. 9. A method for manufacturing a micro-component with a wrinkled film as described in item 1 of the scope of the patent application, wherein the recesses are not formed before the recesses are formed. One side of the silicon substrate formed in the area is coated with a layer of photoresist protection. 1 ◦ The manufacturing method of a micro-component with a wrinkled film as described in item 1 of the scope of the patent application, wherein the formation of the wrinkle is preceded by a B 〇E solution, the operation time is about 9 minutes to remove the protective layer of about 8 〇 〇 〇A; and then a HF-Η N 0 3-Η 2 0 solution with a volume ratio of 1: 10: 5, The operation time is about 4 minutes 'to form the wrinkles with a depth of about 10 / zm with a button. 11. A method for manufacturing a micro-component with a wrinkled film as described in item 1 of the scope of patent application', wherein the wrinkles are thin It is formed by doping a deletion ion by a diffusion method. C:\Program Files\Patent\P-〇223TW. ptd 第 18 買 /、'申請專利範圍 如申清專利範圍第1 1項所述具敏褶薄膜之微型元 件的製作方法,其中該硼離子擴散製程的操作條件為 。·利用一平面式擴散設備,以N2和02在溫度約1 1 〇 C下’耗時約1 . 5個小時形成約2 . 5 /z m的硼薄 膜。 '如申請專利範圍第1項所述具皺褶薄膜之微型元件 的製作方法,其中接合該矽基板與該玻璃基板之前需 作—前置定位對準。 4、 如申請專利範圍第1項所述具皺褶薄膜之微型元件 的製作方法,其中接合該矽基板與該玻璃基板係以一 光阻當作接合劑,於溫度約4 6 0 t:,電壓約1 0 0 〇 v ’最大電流約2 · 1 m A,費時約5 0分鐘即完 成。 5、 如申請專利範圍第1 4項所述具皺褶薄膜之微型元 件的製作方法,其中藉由最大電流降至原來的三分之 —時’以判斷接合的過程已接近完成。 6、 如申請專利範圍第1項所述具皺褶薄膜之微型元件 的製作方法,其中背面蝕刻該矽晶片係以該皺褶薄膜 為餘刻的阻擋(etch-stopped)。 7、 如申請專利範圍第1項所述具皺褶薄膜之微型元件 的製作方法,其中該微型元件包含為一致動器和一感 測器。 8、一種具皺褶薄膜之微型元件的製作方法’至少包含 下列步驟:C: \ Program Files \ Patent \ P-〇223TW. Ptd No. 18 Buy /, 'Applicable patent scope is as described in claim 11 of the patent scope, a method for manufacturing a micro-element with a pleated film, wherein the boron ion diffuses The operating conditions of the process are. • Using a flat-type diffusion device, N2 and O2 were formed at a temperature of about 110 ° C for about 1.5 hours to form a thin film of boron of about 2.5 / zm. 'As in the method for manufacturing a micro-component with a wrinkled film as described in item 1 of the scope of the patent application, it is required to perform a pre-positioning alignment before joining the silicon substrate and the glass substrate. 4. The method for manufacturing a micro-component with a wrinkled film as described in item 1 of the scope of the patent application, wherein the bonding of the silicon substrate and the glass substrate uses a photoresist as a bonding agent at a temperature of about 460 t: The voltage is about 100 volts. The maximum current is about 2 · 1 m A, which takes about 50 minutes to complete. 5. According to the method for manufacturing a micro-component with a wrinkled film as described in item 14 of the scope of the patent application, it is judged that the joining process is almost completed by reducing the maximum current to one-third of the original time. 6. The method for manufacturing a micro-component with a wrinkled film as described in item 1 of the scope of the patent application, wherein the silicon wafer is etch-stopped by etching the silicon wafer on the back surface. 7. The method for manufacturing a micro-component with a wrinkled film as described in item 1 of the scope of patent application, wherein the micro-component comprises an actuator and a sensor. 8. A method for manufacturing a micro-component with a wrinkled film 'includes at least the following steps: C:\ProgramFiles\Patent\P-0223TW.ptd 第 19 頁 六、申請專利範圍 提供一矽基板和一玻璃基板; 於該矽基板上,蝕刻定義出一薄膜區域; 於該薄膜區域上形成一保護層; 定義該薄膜區域圖案,以等向性濕蝕刻形成一圓形皺 褶; 去除該保護層,並將一離子摻雜入該圓形皺褶以形成 一皺褶薄膜; 接合該矽基板與該玻璃基板;以及 背面蝕刻該矽基板,以暴露出該皺褶薄膜。 1 9、如申請專利範圍第1 8項所述具皺褶薄膜之微型元 件的製作方法,其中該微型元件包含一壓阻式壓力計 和一電容式加速度計。C: \ ProgramFiles \ Patent \ P-0223TW.ptd Page 19 6. The scope of the patent application provides a silicon substrate and a glass substrate; on the silicon substrate, a thin film area is defined by etching; a protection is formed on the thin film area Layer; defining the pattern of the film region to form a circular wrinkle by isotropic wet etching; removing the protective layer and doping an ion into the circular wrinkle to form a wrinkle film; bonding the silicon substrate and The glass substrate; and the silicon substrate is etched on the back surface to expose the wrinkled film. 19. The method for manufacturing a micro-element with a wrinkled film as described in item 18 of the scope of patent application, wherein the micro-element includes a piezoresistive pressure gauge and a capacitive accelerometer. C:\Program F iles\Patent\P-0223TW.ptd 第 20 頁C: \ Program Files \ Patent \ P-0223TW.ptd page 20
TW87121158A 1998-12-18 1998-12-18 Method for manufacturing miniaturized device having corrugated diaphragm TW400537B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW87121158A TW400537B (en) 1998-12-18 1998-12-18 Method for manufacturing miniaturized device having corrugated diaphragm

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW87121158A TW400537B (en) 1998-12-18 1998-12-18 Method for manufacturing miniaturized device having corrugated diaphragm

Publications (1)

Publication Number Publication Date
TW400537B true TW400537B (en) 2000-08-01

Family

ID=21632359

Family Applications (1)

Application Number Title Priority Date Filing Date
TW87121158A TW400537B (en) 1998-12-18 1998-12-18 Method for manufacturing miniaturized device having corrugated diaphragm

Country Status (1)

Country Link
TW (1) TW400537B (en)

Similar Documents

Publication Publication Date Title
JP3741723B2 (en) Method for manufacturing micromachined suspension member for sensor
CN106829846B (en) Semiconductor device and method for manufacturing the same
US6878638B2 (en) Multi-level integrated circuit for wide-gap substrate bonding
JP2582229B2 (en) Method of manufacturing silicon diagram and silicon pressure sensor
CN112573477B (en) Preparation process flow of miniature electric field sensing device based on electrostatic force and piezoresistive effect
Han et al. Parylene-diaphragm piezoelectric acoustic transducers
TW400537B (en) Method for manufacturing miniaturized device having corrugated diaphragm
CN107195801B (en) A kind of OLED minitype displayer and its anode linkage method
JP2000155030A (en) Manufacture of angular velocity sensor
JP3950628B2 (en) Method for manufacturing a broad membrane mask
TW588013B (en) Micro ion pump for a low-pressure microdevice microenclosure
KR20020016117A (en) The Fabrication Process For Microphone Using The MEMS
TW200941573A (en) Method for manufacturing semiconductor device
CN108760100A (en) A kind of preparation method of differential pressure pressure sensor
TWI336900B (en) Method for forming micromachined structures
JP2022001403A (en) Method for manufacturing microelectronic device comprising membrane suspended above cavity
JP2000260670A (en) Silicon wafer and manufacture thereof
JP2004207570A (en) Stencil mask and its producing process
US20050069687A1 (en) Apparatus and method for making a tensile diaphragm with a compressive region
JP5067019B2 (en) Manufacturing method of mechanical quantity detection sensor
JP2003156509A (en) Semiconductor accelerometer and method of manufacturing the same
TW442829B (en) Manufacturing method of corrugated diaphragm
TWI313040B (en) Etching method for forming deep trench.
CN101311105A (en) Nano beam structure produced using no-electrode electrochemical corrosion self-stop and method thereof
Sarajlic et al. Bulk micromachining technology for fabrication of two-level MEMS in standard silicon substrate

Legal Events

Date Code Title Description
GD4A Issue of patent certificate for granted invention patent
MM4A Annulment or lapse of patent due to non-payment of fees