TW399335B - Bipolar junction transitor of two segment operation range of high, low segment concentration - Google Patents

Bipolar junction transitor of two segment operation range of high, low segment concentration Download PDF

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TW399335B
TW399335B TW88100614A TW88100614A TW399335B TW 399335 B TW399335 B TW 399335B TW 88100614 A TW88100614 A TW 88100614A TW 88100614 A TW88100614 A TW 88100614A TW 399335 B TW399335 B TW 399335B
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Taiwan
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base region
polarity
bipolar transistor
base
region
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TW88100614A
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Chinese (zh)
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Jiun-Lin Tsai
Guo-Jou Liou
Chiou-Shian Peng
Ruei-Shing Liou
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Taiwan Semiconductor Mfg
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Abstract

This is a bipolar junction transistor of two segment operation range of high, low base region concentration. This bipolar junction transistor is manufactured on a substrate. It forms a buried layer with N type doping concentration on the substrate. Then, it forms a base region on the buried layer, which is a N type doping region. On the base region, it forms a first base region, which has P type doping concentration. The doping concentration is low. Then, it forms a second base region, which has P type doping concentration, on the first base region. Doping concentration is high. Finally, it forms a base region, which has N type doping region, on the second base region. It completes a bipolar junction transistor with two base doping concentrations.

Description

經浇部屮次找i?-^u-Tifi费合竹 A7 ----—__— B7__________ 五、發明説明() 5-1發明領域: 本發明是有關一種雙载子電晶體的結構設計,特別有關於 一種具有兩低基極濃度之雙載子電晶體。 5-2發明背景: 又载子連接電晶體(Bipolar Junction Transistor,BJT)是近代 最重要的半導體元件之一,也因此,美國貝爾實驗室(BellLab) 裏一群發明這項電子元件的科學家們,得到,’諾貝爾物理學獎,, 這項殊榮,以表彰他們對以後電子工業發展所提供的貢獻。 雙載子電晶體之所以稱為”雙載子”,是因為它是一種同時利用 電子與電#這兩種載子來傳導電流的電子元件。它的優點是 速度快,但是消耗大量的能量,所以當元件的積集度增加時, 散熱問題變成為雙載子電晶體應用的一大阻礙。因此,除了 在某些特殊的應用上還使用雙载子電晶體的設計,如高電能 元件(High Power Devices)及須要高速的邏輯電路以外,雙載 子電晶體已被金氧半場效電晶體(Metal Oxide Semiecmduetor Field Effect Transistor, MOSFET)所取代。 請參閱第一圖,圖中係顯不出一個雙載子電晶體的剖面示 意圖,此電晶體是製造在一基板1〇〇之上,在基板1〇〇之上 形成一 N型摻雜埋藏層110,一 N井區的N型集極13〇形成 在N型埋藏層110之上,雙載子電晶體的p型基極14〇形成 在N型集極130之上’基極接點150與N型射極16〇形成在 2 本紙张尺度適用t國國家標卒((,NS ) Λ4規格(210 X 297^^·^~~' ---- (請先閱讀背面之注意事項再填寫本頁) .裝Looking for i?-^ U-Tifi Feihezhu A7 through the pouring department ----——__— B7__________ V. Description of the invention () 5-1 Field of the invention: The present invention relates to the structure design of a double-carrier transistor In particular, it relates to a bipolar transistor having two low base concentrations. 5-2 Background of the Invention: Bipolar Junction Transistor (BJT) is one of the most important semiconductor components in modern times. Therefore, a group of scientists inventing this electronic component at BellLab in the United States, Received, 'Nobel Prize in Physics,' this honor in recognition of their contribution to the future development of the electronics industry. The reason why a bipolar transistor is called a "bipolar" is that it is an electronic component that uses both the electron and the electric # carriers to conduct current. Its advantage is that it is fast, but consumes a lot of energy, so when the degree of component accumulation increases, the problem of heat dissipation becomes a major obstacle for the application of bipolar transistor. Therefore, in addition to the design of bipolar transistors in some special applications, such as high power devices (High Power Devices) and logic circuits that require high speed, bipolar transistors have been used as metal-oxide half-field-effect transistors. (Metal Oxide Semiecmduetor Field Effect Transistor, MOSFET). Please refer to the first figure, which does not show a schematic cross-sectional view of a bipolar transistor. This transistor is fabricated on a substrate 100, and an N-type doped burying is formed on the substrate 100. Layer 110, an N-type collector 13 of an N-well region is formed on the N-type buried layer 110, and a p-type base 14 of a bipolar transistor is formed on the N-type collector 130 'base contact 150 and N-type emitters 160 are formed on 2 paper scales applicable to national standards ((, NS) Λ4 specifications (210 X 297 ^^^^ ~~ ') ---- (Please read the precautions on the back first (Fill in this page again)

Jse A7 B7 五、發明説明( p型基極140之上,並用一場氧化層12〇隔開此兩個區域。此 處所敘述的雙載子電晶體,是一種NPN型雙載子電晶體,分 別對電晶體的射極、基極與集極,摻入N型、p型與N型的 導電雜質,形成第一圖所示的結構。 請參閱第二圖,在此圖之中顯示出在雙載子電晶體之中, 摻雜濃度(Doping Concentration)對深度的關係圖,曲線A為 射極的N型導電雜質摻雜濃度,曲線B為基極的?型導電雜 質摻雜辰度’曲線C為集極的n型導電雜質摻雜濃度,使用 此三種摻雜濃度,製造出—個NpN型雙載子電晶體。 另一種雙載子電晶體結構,為射極與集極為p型半導體, 而中間的基極則為N型半導體,則被稱為pNp型雙載子電晶 體。通常電子的漂移率(M〇bility)較電洞為快,以p型半導體 做為基極的雙載子電晶體,因為少數载子為電子,其速度將 此較快’所以大多數的魏子電晶體都是採用卿的設計。 、下將用NPN型雙載子電晶體作為說明的例子,實際上這兩 種又載子電晶體的操作方式大致類似,僅需說明其中一 可。, 凊參閱第三圖,顯示一個卿型雙載子電晶體的簡單結 其中左側的N型半導體是作為射極,右側的㈣半導體 2為集極’中_ P型半導體是作為基極。在射極與基極 力Vbe偏壓’正電壓是接往基極,貞f Μ是接往射極。 ς極”集極之間施加_ Yu偏壓,正電壓接往集極,負電 i /主基極。射極輸出—電流1E,基極與集極分別輸入-電 B與在第三圖之中是顯示_種共射極組態(c。職⑽_ Λ4規格(210X297公釐) J--------^>裝—— (請先閱讀背面之注意事項再填寫本頁) l·訂 '•4 A7 B7 五、發明説明()Jse A7 B7 V. Description of the invention (above the p-type base 140 and separating the two areas with a field oxide layer 120. The bipolar transistor described here is an NPN bipolar transistor, respectively The emitter, base, and collector of the transistor are doped with N-type, p-type, and N-type conductive impurities to form the structure shown in the first figure. Please refer to the second figure, in which the Doping Concentration vs. Depth in Bipolar Transistors. Curve A is the N-type conductive impurity doping concentration at the emitter, and Curve B is the base type? Curve C is the doping concentration of the n-type conductive impurities at the collector. Using these three doping concentrations, an NpN type bipolar transistor is manufactured. The other bipolar transistor structure is an emitter and collector p-type. Semiconductor, and the middle base is an N-type semiconductor, which is called a pNp type bipolar transistor. Generally, electron mobility is faster than holes, and p-type semiconductors are used as the base. Bipolar transistor, because a few carriers are electrons, its speed will be faster, so most Weizi transistors are all designed by Qing. The NPN type bipolar transistor will be used as an example. In fact, the operation methods of these two types of carrier transistors are similar. Just explain one of them.凊 Refer to the third figure, showing a simple junction of a bipolar transistor. The N-type semiconductor on the left is used as the emitter, and the ㈣ semiconductor 2 on the right is used as the collector. _ P-type semiconductor is used as the base. Emitter and base force Vbe bias' Positive voltage is connected to the base, Zhen f M is connected to the emitter. _ Yu bias is applied between the collectors, the positive voltage is connected to the collectors, the negative current i / main Base. Emitter output-current 1E, base and collector input respectively-electricity B and shown in the third picture _ a variety of common emitter configuration (c. Position_ Λ4 specifications (210X297 mm) J- ------- ^ > Equipment—— (Please read the notes on the back before filling this page) l · Order '• 4 A7 B7 V. Description of the invention ()

Emitter)的迴路設計,這種電路設計可以當作一種開關來使用。 當VBE大於某一個起始電壓值之後,Ic便開始迅速增加;若VBE 小於這個起始電壓值,Ic將趨近於零,換句話說,雙載子電 晶體的Ic大小可以由VBE來控制。請參閱第四圖,當VBE大 於起始電壓時,顯示出Ic對VCE的關係圖。以上所述,為一 般電晶體的操作方式。 使用一般雙載子電晶體的結構,所得到的電流電壓曲線, 就如第四圖所示一樣,通常這種結構所用的基極、射極與集 極,都是各自具有一個摻雜濃度曲線,只有一個電流增益 (Current Gain),也就是說只有一個飽和_區域(Saturation Region),藉由調整結構與摻雜濃度的大小,以決定電晶體的 工作特性。 5-3發明目的及概述: 本發明揭露一種雙載子電晶體的結構,此電晶體的基極具 有兩種摻雜濃度,一具有低摻雜濃度的第一基極區域連接元件 的集極,一具有高摻雜濃度的第二基極區域形成在第一基極區 域之上,而射極製造在第二基極區域之上,形成一個雙載子電 晶體。利用上述的雙載子電晶體結構,於使用共射極迴路設計 時,整個元件相當於一個放大器來使用,集極電流Ic對集極與 射極間電壓VCE的關係圖之中,會出現兩個電流增益,一個發 生在低VCE電壓(約小於5伏特),另一個發生在高VCE電壓(約 大於8伏特)。 4 ^纸^度诚ili中國囤家#^ ( rNS ) Λ4規格(210X 297公f ) (請先閱讀背面之注意事項再填寫本頁) 丁 Λ A7 B7 、發明説明( x月的其中一個優點是:利用本發明的雙載子電晶體結 ,可以得到兩個電流增益,可將元件應用於高電壓電路之中。 \]本&明的另_個優點是:藉由調整本發 ,區域之接雜濃度,可改變雙載子電晶體的工=之 :別可作為—個電路關或者是當作—般的雙載子電晶體來使 用。 5-4圖式簡單說明: 本發明的許多發明目的與優點,將會因為參考下列的詳細 1明,變得更容易被财與瞭解,同時參酌下列的圖式加 明,其中: 第-圖係顯示習知技術之中,卿型雙載子電晶體的剖面 示意圖; 第-圖係顯示習知技術之中,NpN型雙載子電晶體之射極、 基極與集極的摻雜濃度曲線; 弟二圖係顯示習知技術之中,NPN型雙載子電晶體之共射 極迴路設計的簡單示意圖; 第四1係顯示習知技術之巾,雙載子電晶體使用共射極迴路 設計,所得到的電流電壓工作曲線; 第五圖係顯示本發明之中,具有高低基極濃度之NPN型雙 載子電晶體的剖面示意圖; 第六圖^顯示本發明之中,高低基極濃度之NPN型雙載子 電晶體之基極、射極與集極的摻雜濃度曲線; n I— I n n· I! n n n —l\)i n I I n n If T n u I I n 11¾. ,: ^ US. ^ (fs先閱讀背面之注意事項再填寫本頁) 本紙張尺4適州中國1S家標埤(rNS ) M说格( 210X297公箱) 部屮少標準局p'-τ消处合竹拉印欠 A7 ------B7 五、發明説明() — 第七圖係顯示本發明之NPN型雙載子電晶體的電流與電壓 的關係圖’在共射極迴路設計之下,具有兩個電流增 益; 第八圖係顯示本發明之NPN型雙載子電晶體的電流與電壓 關係圖’當電晶體的高濃度基極區域減少時,僅剩下 一個在高工作電壓時的電流增益;以及 第九圖係顯示本發明之NPN型雙載子電晶體的電流與電壓 關係圖’當低濃度基極區域的寬度減少時,此電晶體 的工作曲線就近似於一般的雙載子電晶體。 5-5發明詳細說明: 於本發明之中,揭露一種雙載子電晶體的結構,此雙載子 電晶體的基極具有兩種摻雜濃度曲線,分別為高摻雜濃度的第 二基極區域與低摻雜濃度的第一基極區域,此兩個基極區域當 作-個基極來使用,其他的集極與射極的結構,與—般的雙载 子電^體一樣。此雙載子電晶體被當作是一放大器來使用時, 也就是採用共射極迴路設計(c〇mm〇n Emitter)時,射極電流工c 對VCE電壓的關係圖,會有兩個電流增益,分別位於 塵與低工作電壓區之中,也就是分別在小於5伏特與大於8伏 特的工作電屋區間。利用此種具有高低基極濃度的雙載子電晶 體結構,★了在一般的低工作電壓之中會有—電流增益,在: 工作電塵之中’還會再產生—電流增益。因此,可將此電晶體 運用於高電壓電路或者是智慧電能控制系統之中。 6 本紙張歧制彳,®彡:料("^7X4規格(2「0X297公衆7 J--------I. (請先閲讀背面之注意事項再填寫本頁jEmitter) circuit design, this circuit design can be used as a switch. When VBE is greater than a certain initial voltage value, Ic begins to increase rapidly; if VBE is less than this initial voltage value, Ic will approach zero, in other words, the Ic size of the bipolar transistor can be controlled by VBE . Please refer to the fourth figure, when VBE is greater than the starting voltage, the relationship between Ic and VCE is displayed. The above is the operation mode of a general transistor. The current-voltage curve obtained using the structure of a general bipolar transistor is as shown in the fourth figure. Generally, the base, emitter and collector used in this structure each have a doping concentration curve. There is only one Current Gain, that is, only one Saturation Region. The structure and doping concentration are adjusted to determine the operating characteristics of the transistor. 5-3 Purpose and Summary of the Invention: The present invention discloses a structure of a bipolar transistor. The base of the transistor has two doping concentrations. One has a collector of the first base region connecting element with a low doping concentration. A second base region having a high doping concentration is formed over the first base region, and an emitter is fabricated over the second base region to form a bi-carrier transistor. Utilizing the above-mentioned double-carrier transistor structure, when using a common emitter circuit design, the entire component is equivalent to an amplifier. The relationship between the collector current Ic and the voltage between the collector and the emitter VCE will appear in Of these current gains, one at a low VCE voltage (about less than 5 volts) and the other at a high VCE voltage (about more than 8 volts). 4 ^ 纸 ^ 度 诚 ili 中国 仓 家 # ^ (rNS) Λ4 specifications (210X 297 male f) (Please read the precautions on the back before filling this page) Ding A7 B7, invention description (one of the advantages of x month Yes: By using the bipolar transistor junction of the present invention, two current gains can be obtained, and the component can be used in high-voltage circuits. \] Another advantage of this & Ming is: By adjusting the present, The doping concentration of the region can change the operation of the bipolar transistor. Do not use it as a circuit switch or as a bipolar transistor. 5-4 Schematic description of the invention: Many of the objects and advantages of the invention will become easier to be understood and understood by referring to the following detailed descriptions. At the same time, please refer to the following diagrams to clarify, among them: Figure-shows the conventional technology, the type Cross-section schematic diagram of a double-carrier transistor; Figure-Figure shows the doping concentration curves of emitter, base, and collector of NpN-type double-carrier transistors in the conventional technique; the second figure shows the conventional technique Among them, a simple schematic diagram of the common emitter circuit design of the NPN type bipolar transistor; Forty-one series display the conventional technology. The bipolar transistor uses a common emitter circuit design, and the current and voltage working curves are obtained. The fifth figure shows the NPN type dual load with high and low base concentration in the present invention. Cross-sectional schematic diagram of a daughter transistor; Figure 6 ^ shows the doping concentration curves of the base, emitter, and collector of NPN type bipolar transistor with high and low base concentration in the present invention; n I— I nn · I! Nnn —l \) in II nn If T nu II n 11¾.,: ^ US. ^ (Fs read the notes on the back before filling in this page) This paper ruler 4 Shizhou China 1S House Standard 埤 (rNS) M said grid (210X297 public box) Ministry of Standards and Industry Standard Bureau p'-τ elimination processing bamboo drawing A7 ------ B7 V. Description of the invention ()-The seventh picture shows the NPN double The relationship diagram of the current and voltage of the carrier transistor 'under the design of the common emitter circuit, it has two current gains; the eighth diagram is a diagram showing the relationship between the current and voltage of the NPN type double-carrier transistor of the present invention' When the high-concentration base region of the transistor is reduced, only one current gain at high operating voltage remains; and the ninth Lines showed the relationship between current and voltage according to the present invention FIG NPN type bipolar transistor apos When reducing the width of the low-concentration base region, the transistor of this curve approximates a general bipolar transistor. 5-5 Detailed description of the invention: In the present invention, the structure of a bipolar transistor is disclosed. The base of the bipolar transistor has two kinds of doping concentration curves, which are the second base with high doping concentration. Electrode region and the first base region with a low doping concentration. The two base regions are used as a base. The structure of other collectors and emitters is the same as that of a normal bipolar electric body. . When this bipolar transistor is used as an amplifier, that is, when the common emitter circuit design (c0mm 00n Emitter) is used, there are two graphs of the relationship between the emitter current c and the VCE voltage. The current gains are respectively located in the dust and low operating voltage regions, that is, in the working electric house intervals of less than 5 volts and greater than 8 volts, respectively. With this type of double-carrier electric crystal structure with high and low base concentration, the current gain will be present in the general low operating voltage, and the current gain will be generated in the working dust. Therefore, this transistor can be used in high voltage circuits or smart power control systems. 6 This paper distorts 彡, 彡: material (" ^ 7X4 specifications (2 "0X297 public 7 J -------- I. (Please read the precautions on the back before filling in this page j

A7 --------B7 五、發明説明^ ' ' """ 〜 請參閱第五圖,圖中係顯示出一個雙載子電晶體 意圖’此電晶體是製造在一基板100之上,此基曰板上:,示A7 -------- B7 V. Explanation of the invention ^ '' " " " ~ Please refer to the fifth figure, which shows the intention of a bipolar transistor. Above the base plate 100, the base plate is:

型石夕晶,在基板100之上形成-N型摻雜埋藏層11〇疋P-Type Shi Xijing, forming a -N-type doped buried layer 11〇P on the substrate 100

井區的N型集極13〇形成在N型摻雜埋藏層ΐι〇9之’ —N 子電晶體的第一基極區域142形成在N型集極13〇 雙载 第-基極區域142為-P井區。在第_基極區域14$ ’此 形成一第二基極區域14ι,此第二基極區域141也同樣θ中, P井區。在本發明之中,第二基極區域141的摻雜濃产疋日, 於第一基極區域142的摻雜濃度,此兩個區域形成—個具: 兩個摻雜濃度的基極。 a 在一較佳實施例之中,第一基極區域142的形成方法,是 利用同步摻雜化學氣相沈積製程(In_Situ D〇ped chemical Vapor Deposition),在N型摻雜埋藏層11〇之上,直接形成一 p型 換雜的早晶石夕層,通常利用此種製程技術,可以準療控制單 晶石夕層之中的摻雜濃度(Doped Concentration),形成一個低摻 雜濃度的區域。除此之外,第二基極區域141的形成方法, 是用離子佈植製程(Ion Implantation),在單晶石夕層之中,摻雜 入導電雜質’提高單晶矽層之中的摻雜濃度,形成一個高摻 雜濃度區域。 請繼續參閱第五圖,基極接點150與N型射極160形成 在P型基極140之上,並用一場氧化層120隔開此兩個區域。 在此較佳實施例之中所敘述的雙載子電晶體,是一種NPN型 雙載子電晶體’分別對電晶體的射極、基極與集極,摻入N 型、P型與N型的導電雜質’形成第五圖所示的結構。 本紙張尺度进用中Η®家標埤((’NS ) Λ4規格(210X 297公浼) J--------—— {請先閱讀背面之注意事項再填寫本頁} ί訂 經"部中忒標洋^Uc-T消资合竹社印髮 A7 B7 部 中 if. Μ -Τ 消 ji- 人 η a. 印 五、發明説明( 請參閱第六圖,在此圖之中顯示出在雙載子電晶體之中, 摻雜漢度(Doped Concentrati〇n)對深度的關係圖,曲線a 極的N型導電雜質摻雜濃度,曲線m為第二基極區域⑷ =型導電雜質摻雜濃度,曲線幻為第—基極區域142的p型 導電雜質掺雜濃度,曲線C為集極❹型導電雜質換雜濃度, $用此二種摻雜濃度,製造出—個卿型雙載子電晶體。當 …在第六圖之中,戶斤顯示的摻雜濃度曲線,僅是一個亍: 用來說明第二基極區域⑷與第-基極區域142之換^ 浪度間的關係。 ^雜 二明所用的結構,也可使用在另一種雙載子電晶體結構, /、射極與集極為半導體,而中_基極㈣Ν 即是贿型雙载子電晶體。雖然在本發明的詳細說明之令體曰 =ΡΝ型雙·電晶體作為㈣實施利,實際上,這= ^晶體的操作方式與結構大致類似,僅f說㈣中_種$ 心= 出一個集極電流1C對集極與射極間電 土1的關係圖。此種電流對電虔的關係圖 迴路設計(CG麵。nE讀㈣的情況之下,也就是=極 的電路設計,當—雔恭孚啻曰触 弟一圖所不 偏τ電晶體以這種方式加以操作時,此元 ' C電丨L對VCE電壓的關係圖。在本發明的 度的雙載子電w ™㈣具有聽基極濃 就是說在IV: 電流增益(CUrrem叫也 " V曲線上有兩個轉折點,分別位於古n 工作電壓的區門夕由 A 刀刎位於间工作電壓與低 B 。一般而言,具有兩個電流增 電晶體,盆笛-宜托T- 屯仙· h皿的雙載子The N-type collector 13 in the well region is formed in the first base region 142 of the N-type transistor in the N-type doped buried layer 909, which is formed in the N-type collector 130 dual-loaded first-base region 142. For -P well area. A second base region 14m is formed in the _th base region 14 $, and the second base region 141 is also the same in θ, the P well region. In the present invention, the next day the doping concentration of the second base region 141 is concentrated, the two regions form a base with two doping concentrations based on the doping concentration of the first base region 142. a In a preferred embodiment, the first base region 142 is formed by using a synchronous doping chemical vapor deposition process (In_Situ Doped Chemical Vapor Deposition) in the N-type doped buried layer 11〇. On the other hand, a p-type heterogeneous premature stone layer is directly formed. Generally, this process technology can be used to control the doped concentration in the monocrystalline stone layer to form a low-doped concentration layer. region. In addition, the method of forming the second base region 141 is to use an ion implantation process (Ion Implantation) to dope the single crystal layer with conductive impurities to increase the doping in the single crystal silicon layer. Impurity concentration, forming a high doping concentration region. Please continue to refer to the fifth figure. The base contact 150 and the N-type emitter 160 are formed on the P-type base 140, and the two regions are separated by a field oxide layer 120. The bipolar transistor described in this preferred embodiment is a type of NPN bipolar transistor. The emitter, base, and collector of the transistor are respectively mixed with N-type, P-type, and N-type. A conductive impurity of the type 'forms the structure shown in the fifth figure. This paper is used in the standard of Chinese paper ® house standard (('NS) Λ4 size (210X 297) 浼 J ------------ {Please read the precautions on the back before filling this page} ίOrder The " Ministry of Foreign Affairs ^ Uc-T Consumer Assets Co., Ltd. prints and issues A7 B7 in the ministry if. Μ -Τ 消 ji- person η a. Printing 5. Description of the invention (please refer to the sixth figure, in this figure It shows the relationship between doped concentration and depth in a bipolar transistor. The curve shows the doping concentration of N-type conductive impurities at the a pole, and the curve m is the second base region. = Type conductive impurity doping concentration, the curve is the p-type conductive impurity doping concentration of the first-base region 142, and curve C is the collector ❹-type conductive impurity doping concentration. -A Qing-type bipolar transistor. When ... In the sixth figure, the doping concentration curve shown by Hu Jin is only one 亍: It is used to explain the second base region ⑷ and the first base region 142. Change the relationship between degrees. ^ The structure used by Heming Erming can also be used in another bipolar transistor structure, the emitter and collector semiconductors, and the base ㈣Ν is a bridging type double-transistor transistor. Although it is described in the detailed description of the present invention that the PN type double-transistor is used as a practical implementation, in fact, the operation method of this crystal is roughly similar to the structure, only f says ㈣ 中 _ 种 $ 心 = give a collector current 1C vs. collector-emitter electric soil 1. The circuit diagram of the relationship between this current and the electric god (CG surface. In the case of nE reading ㈣ Next, it is the circuit design of = pole. When-雔 Gongfu 啻 said that the unbiased τ transistor operated in this way, the graph of the relationship of this element 'C 元 丨 L to VCE voltage. The invented degree of the double-carrier electric w ™ ㈣ has a very strong listening base, which means that at IV: the current gain (CUrrem is also called " V curve has two turning points, respectively located in the area of the ancient n operating voltage by the A knife刎 is located between the working voltage and low B. Generally speaking, there are two current-increasing crystals, the pedestal-yituo T-tunxian · h doublet

基極區域141的摻雜濃度係介於lx㈣到3X 8 (請先閱讀背面之注意事項再填寫本頁) 裝----^—-訂 A7 B7 五、發明説明( 1016/cm3之間,而第—基極區域142的掺雜濃度係介於4χι〇ΐ5 到8X1015/cm3之間;第一基極區域141的寬度係介於测到 8000埃之間’第二基極區域142的寬錢介於測到刪埃 之間。 、 利用具有兩個基極濃度的雙載子電晶體(mp〇iar Transis⑽’可以得到兩㈣流增益,其中的原因是在於:雙 載子電晶體的電流增益,與基極的寬度有關。對本發明之雙^ 子電晶體逐漸調高veE電壓,在低電壓的工作狀況之下(約在5 伏特以下)’由於卫作㈣不大’整個元件的操作方式,是以第 -基極區域與第二基極區域作為—個基極,所以此時會在低電 壓的情況之下,得到_個電流增益;在高電壓的工作狀況之下(約 在8伏特以上),在基極部份會出現較大的空乏區①叩㈣加 Μ_) ’涵蓋到第-基極區域,使得元件的卫作情況,僅以第 -基極區域作為元件的基極,也就是用濃度較高的區域作為基 極’⑽於讀的基極寬度會”,產生第二個電流增益。 月/閱第八圖’顯不另一個Ic電流對I電壓的關係圖。 *务明的具有高低基極濃度的雙载子電晶體,縮減第二基極 區域(也就是高摻雜濃度區域)的寬度,而且增加第—基極區域 (也二是低摻雜漠度區域)的寬度。一般說來,第一基極區域的 介於刪〇到15_埃之間,第二基極區域的寬度係介 :\3_埃之間’第一基極區域的雜濃度係介於lxl〇I5 10 /cm之間,第二基極區域的播雜濃度係介於 之間,會使得元件只具有-個電流增益,而且這 個電、肌增錢在高卫作電壓之I在低卫作電壓之中,集極電The doping concentration of the base region 141 is between lx㈣ to 3x 8 (please read the precautions on the back before filling this page). ---- ^-order A7 B7 V. Description of the invention (between 1016 / cm3, The doping concentration of the first base region 142 is between 4 × 10 × 5 and 8 × 1015 / cm3; the width of the first base region 141 is between 8000 angstroms and the width of the second base region 142. Money is between the measurement and the deletion of Angstroms. Using a two-carrier transistor with two base concentrations (mpioar Transis⑽ 'can get two current gains, the reason is that the current of the two-carrier transistor The gain is related to the width of the base. For the double transistor of the present invention, the veE voltage is gradually increased, and under low voltage operating conditions (below about 5 volts), the operation of the entire component is not large. The method uses the first base region and the second base region as a base, so at this time, under the condition of low voltage, _ current gain will be obtained; under high voltage working conditions (about 8 volts or more), a large empty area will appear in the base part ① 叩 ㈣Plus M_) ' Covering to the-base region, so that the component's operating conditions, only using the-base region as the base of the element, that is, using a region with a higher concentration as the base 'for reading the width of the base. Generates a second current gain. Month / See the eighth figure 'shows the relationship between another Ic current and I voltage. * Concise bipolar transistor with high and low base concentration, reducing the second base region ( That is, the width of the high-doped concentration region), and the width of the first base region (also the low-doped desert region) is increased. Generally speaking, the first base region is between 0 and 15 Å. Between, the width of the second base region is: \ 3_Angle 'the impurity concentration of the first base region is between lxlOI5 10 / cm, and the impurity concentration of the second base region is In between, the component will only have a current gain, and the electricity and muscle gains will be in the high power operating voltage, I will be in the low power operating voltage, and the collector will be charged.

Q 本紙张尺度 ^ ^ 裝------^訂----,--1^. (請先閱讀背面之注意事項再填寫本頁) B7 B7 經漪部中央標準局貝工消贽合作社印製 五、發明説明() 流Ic接近於零,也就是說,整個元件的電流增益是發生於高VCE 電壓的情況之下,而且其工作狀態類似於一個電路開關,僅在 VCE電壓大於某一個特定值時,才會有集極電流流通。 請參閱第九圖,顯示一個集極電流ic對電壓vCE之間的關 係圖。當本發明之雙載子電晶體之中,減小第一基極區域(也就 是低摻雜濃度區域)的寬度,以第二基極區域(高摻雜濃度區域) 作為雙載子電晶體的基極,元件的集極電流Ic對VCE電壓的關 係圖,與一般的雙載子電晶體一樣,電流增益會產生在低VeE 電壓時。 綜合上述的討論可知,在雙載子電晶體的基極之中,形成 具有兩個摻雜濃度的區域,藉由調整此兩個區域的寬度大小, 或者是使用高濃度或低濃度的摻雜區域,可調整電晶體的電流 增益,甚至於在同一個電晶體之中,得到一高VCE電壓電流增 益與一低veE電壓電流增益。 本發明以較佳實施例說明如上,而熟悉此領域技藝者,在 不脫離本發明之精神範圍内,當可作些許更動潤飾,其專利保 護範圍更當視後附之申請專利範圍及其等同領域而定。舉列來 說,本發明所用的具體實施例是NPN雙載子電晶體,但是並不 限於此種電晶體而已,PNP雙載子電晶體也同樣可以運用本發 明的結構,達到所欲達成的功效。 本紙張尺度適用中國國家標準(CNS ) Λ4規枯(210><2们公片) (請先閲讀背面之注意事項再填寫本頁 裝·Q Paper Size ^ ^ Pack ------ ^ Order ----,-1 ^. (Please read the precautions on the back before filling out this page) B7 B7 The Central Standards Bureau of the Ministry of Economic Affairs Cooperative printed 5. Description of the invention () The current Ic is close to zero, that is, the current gain of the entire component occurs under the condition of high VCE voltage, and its working state is similar to a circuit switch, only when the VCE voltage is greater than Collector current will flow only at a certain value. Please refer to the ninth figure, which shows a relationship between the collector current ic and the voltage vCE. In the bipolar transistor of the present invention, the width of the first base region (ie, the region with a low doping concentration) is reduced, and the second base region (the region with a high doping concentration) is used as the bipolar transistor. The relationship between the base current of the element and the collector current Ic of the device versus the VCE voltage is the same as that of a conventional bipolar transistor, and the current gain will be generated at a low VeE voltage. Based on the above discussion, it can be known that in the base of the bipolar transistor, a region with two doping concentrations is formed. By adjusting the width of the two regions, or using high or low concentration doping In this region, the current gain of the transistor can be adjusted, and even in the same transistor, a high VCE voltage current gain and a low veE voltage current gain are obtained. The present invention has been described above with reference to the preferred embodiments, and those skilled in the art can make some modifications and modifications without departing from the spirit of the present invention. Field-specific. For example, the specific embodiment used in the present invention is an NPN bipolar transistor, but it is not limited to such a transistor. The PNP bipolar transistor can also use the structure of the present invention to achieve the desired result. efficacy. This paper size applies the Chinese National Standard (CNS) Λ4 gauge (210 > < 2 men's film) (Please read the precautions on the back before filling this page.

、1T, 1T

Claims (1)

A8 B8 C8 D8 公告本 申請專利範圍 •—種具有兩種基極濃度的雙載子電晶體,至少包含: —半導體基板; -埋藏層,該埋藏層具有—第—極性,位於該半導體基板之 -li., —集極’具有該第一極性,位於該埋藏層之上; 第;基極區域,具有一第二極性,位於該集極之上,其中 該第一基極具有一第一摻雜濃度; 〃、 第一基極區域,具有一第二極性,位於該第一基極區域之 上,其中該第二基極區域具有一第二接雜漠度,而且該第 二摻雜濃度大於該第一摻雜濃度;以及 一射極’具有該第—極性,位於該第二基極區域之上。 2’如申請專利範圍帛1項所述之雙載子電晶體,其中該第—極 性為N型,該第二極性為p型。 ^ 3·如申請專利範圍帛!項所述之雙载子電晶體 性為P型,該第二極性^型。 I弟極 4·如申請專利範圍帛!項所述之雙載子電晶體,其中該第一美 極區域的摻雜濃度係介於4X10”到8xioWcm3之間。土 5·如申請專利範㈣1項所述之雙载子電晶體,其中該第二其 極區域的摻雜濃度係介於1X1016到3X10i6/cm3之間。 土 11 ----------—— (請先閲讀背面之注意事項再填寫本頁) 訂 經濟部中央標準局員工消费合作社印製 木紙張尺度適用中國國家標準(CN^4k^ ( 210X297^57 經濟部中央檩準局員工消費合作社印製 A8 B8 C8 D8 申請專利範圍 6·如申請專利範圍第i項所述之雙載子電晶體,其中該第_基 極區域的寬度係在5000到8000埃之間。 7_如申請專利範圍第i項所述之雙載子電晶體,其中該第二基 極區域的寬度係在2500到3000埃之間。 8·如申請專利範圍帛i項所述之雙載子電晶體,更包含一基極 接點,具有該第二極性,形成在該第二基極區域之上。 9·如申請專利範圍帛1項所述之雙載子電晶體,其中該第一基 極區域為—井區,該第二基極區域為-形成在該第-基極^ 域之中的另一井區。 ίο.一種作為開關的雙載子電晶體,至少包含: 一半導體基板; 一埋藏層,該埋藏層具有一第一極性,位於該半導體基板之 上; 集極,具有該第—極性,位於該埋藏層之上; 第Α基極區域,具有一第二極性,位於該集極之上,其中 該第一基極區域具有一第一摻雜濃度; 第一基極區域,具有一第二極性,位於該第一基極區域之 ^,其中該第二基極區域具有一第二摻雜濃度,而且該第 =摻雜濃度大於該第—摻雜濃度,該第二基極區域的寬度 遂小於該第一基極區域的寬度;以及 ^---:-----^叫裝------訂----Ί 1祿 ! (請先鬩讀背面之注意事項再填寫本頁) 12A8 B8 C8 D8 Announced patent scope of this application • —A bipolar transistor with two base concentrations, including at least: — a semiconductor substrate; — a buried layer with —first — polarity, located on the semiconductor substrate -li., —collector 'has the first polarity and is located above the buried layer; the first base region has a second polarity and is located above the collector, wherein the first base has a first Doping concentration; 〃, the first base region has a second polarity and is located above the first base region, wherein the second base region has a second doping degree, and the second doping The concentration is greater than the first doping concentration; and an emitter 'has the first polarity and is located above the second base region. 2 'The bipolar transistor according to item 1 of the scope of the patent application, wherein the first polarity is N-type and the second polarity is p-type. ^ 3 · If the scope of patent application is 帛! The bipolar transistor described in the item is P-type, and the second polarity ^ -type. I younger pole 4 · If the scope of patent application is 帛! The bipolar transistor described in the above item, wherein the doping concentration of the first US pole region is between 4X10 "and 8xioWcm3. 5. The bipolar transistor according to item 1 of the patent application, wherein The doping concentration of the second pole region is between 1X1016 and 3X10i6 / cm3. Soil 11 -------------- (Please read the precautions on the back before filling this page) The standard for printing wood and paper by the Consumer Cooperatives of the Central Standards Bureau of the Ministry of Foreign Affairs of the People's Republic of China (CN ^ 4k ^ (210X297 ^ 57) printed by the Consumer Cooperatives of the Central Procurement Bureau of the Ministry of Economic Affairs. A8 B8 C8 D8 The bipolar transistor described in item i, wherein the width of the _ base region is between 5000 and 8000 Angstroms. 7_ The bipolar transistor described in item i of the patent application range, wherein the first The width of the two base regions is between 2500 and 3000 angstroms. 8. The bipolar transistor as described in the scope of the patent application (i), further comprising a base contact having the second polarity and formed in the Above the second base region. 9. Double load as described in the scope of patent application (1) A transistor, in which the first base region is a well region, and the second base region is another well region formed in the first base region. Ίο. A double-carrier electricity as a switch The crystal includes at least: a semiconductor substrate; a buried layer having a first polarity above the semiconductor substrate; a collector having the first polarity above the buried layer; an A base region Has a second polarity and is located on the collector, wherein the first base region has a first doping concentration; the first base region has a second polarity and is located on the first base region ^ Wherein the second base region has a second doping concentration, and the third doping concentration is greater than the first doping concentration, the width of the second base region is then smaller than the width of the first base region; And ^ --- : ----- ^ 叫 装 ------ Order ---- Ί 1Lu! (Please read the precautions on the back before filling out this page) 12 Α8 Β8 C8 D8 經濟部中央標準局員工消費合作社印製 六、申請專利範圍 射極,具有該第一極性,位於該第二基極區域之 11.如申請專利範圍第10項所述之雙载子電晶體,其中該第一 極性為Ν型,該第二極性為ρ型。 12·如申請專利範圍第1〇項所述之雙載子電晶體,其中該第一 極性為Ρ型,該第二極性為Ν型。 13’如申印專利範圍第1〇項所述之雙載子電晶體,其中該第一 基極區域的摻雜濃度係介於1Χ1015到3xi〇i5/cm3之間。 14·如申請專利範圍第1〇項所述之雙載子電晶體,其中該第二 基極區域的摻雜濃度係介於1X1016到3xi〇i6/cm3之間。 15 _如申μ專利範圍第1 〇項所述之雙載子電晶體,其中該第一 基極區域的寬度係在10000到15000埃之間。 16.如申請專利範圍帛1〇項所述之雙載子電晶體,其中該第二 基極區域的寬度係在2500到3000埃之間。 17_如申μ專利範圍第1〇項所述之雙載子電晶體,更包含一基 極接點,具有該第二極性,形成在該第二基極區域之上。 18.如申請專利範圍第1〇項所述之雙載子電晶體,其中該第一 基極區域為一井區,該第二基極區域為一形成在該第一基極 13 本紙張適财國國家標準(CNS) Α4·_ (21QX297公幻 (請先閱讀背面之注意事項再填寫本頁) -装· 8 8 8 8 ABCD 申請專利範圍 區域之中的另一井區 經濟部中央標準局員工消費合作社印製 (請先閱讀背面之注意事項再填寫本頁) 裝· 訂 14 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公釐)Α8 Β8 C8 D8 Printed by the Consumer Cooperatives of the Central Standards Bureau of the Ministry of Economic Affairs 6. Patent application scope emitter with the first polarity, located in the second base region 11. Double-loading as described in item 10 of the scope of patent applications The daughter transistor, wherein the first polarity is N-type and the second polarity is p-type. 12. The bipolar transistor according to item 10 in the scope of the patent application, wherein the first polarity is P-type and the second polarity is N-type. 13 'The bipolar transistor according to item 10 of the scope of application for a patent, wherein the doping concentration of the first base region is between 1 × 1015 and 3xio5 / cm3. 14. The bipolar transistor described in item 10 of the scope of the patent application, wherein the doping concentration of the second base region is between 1 × 1016 and 3xio6 / cm3. 15 _ The bipolar transistor described in claim 10 of the patent application, wherein the width of the first base region is between 10,000 and 15,000 angstroms. 16. The bipolar transistor according to item 10 of the patent application, wherein the width of the second base region is between 2500 and 3000 Angstroms. 17_ The bipolar transistor described in claim 10 of the patent scope further includes a base contact having the second polarity and formed on the second base region. 18. The bipolar transistor described in item 10 of the scope of patent application, wherein the first base region is a well region, and the second base region is a 13-sheet paper formed on the first base electrode. National Standard of the Country (CNS) Α4 · _ (21QX297 public fantasy (please read the precautions on the back before filling out this page)-installed · 8 8 8 8 Central Standard of the Ministry of Economic Affairs of another well in the area covered by the ABCD Printed by the Bureau's Consumer Cooperative (please read the precautions on the back before filling out this page). Binding and binding 14 This paper size applies to China National Standard (CNS) A4 (210X297 mm)
TW88100614A 1999-01-15 1999-01-15 Bipolar junction transitor of two segment operation range of high, low segment concentration TW399335B (en)

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