TW376641B - Image-sensor with many pixel-sensor-areas - Google Patents

Image-sensor with many pixel-sensor-areas

Info

Publication number
TW376641B
TW376641B TW087105256A TW87105256A TW376641B TW 376641 B TW376641 B TW 376641B TW 087105256 A TW087105256 A TW 087105256A TW 87105256 A TW87105256 A TW 87105256A TW 376641 B TW376641 B TW 376641B
Authority
TW
Taiwan
Prior art keywords
sensor
image
elements
areas
pixel
Prior art date
Application number
TW087105256A
Other languages
English (en)
Inventor
Michael Alger-Meunier
Original Assignee
Siemens Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens Ag filed Critical Siemens Ag
Application granted granted Critical
Publication of TW376641B publication Critical patent/TW376641B/zh

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/78—Readout circuits for addressed sensors, e.g. output amplifiers or A/D converters
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/71—Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors
    • H04N25/75—Circuitry for providing, modifying or processing image signals from the pixel array
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Facsimile Heads (AREA)
  • Facsimile Image Signal Circuits (AREA)
TW087105256A 1997-04-11 1998-04-08 Image-sensor with many pixel-sensor-areas TW376641B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19715214A DE19715214C1 (de) 1997-04-11 1997-04-11 Bildsensor mit einer Vielzahl von Bildpunkt-Sensorbereichen

Publications (1)

Publication Number Publication Date
TW376641B true TW376641B (en) 1999-12-11

Family

ID=7826261

Family Applications (1)

Application Number Title Priority Date Filing Date
TW087105256A TW376641B (en) 1997-04-11 1998-04-08 Image-sensor with many pixel-sensor-areas

Country Status (7)

Country Link
US (1) US6104844A (zh)
EP (1) EP0974226B1 (zh)
JP (1) JP2002502562A (zh)
KR (1) KR20010006248A (zh)
DE (2) DE19715214C1 (zh)
TW (1) TW376641B (zh)
WO (1) WO1998047280A1 (zh)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6956605B1 (en) * 1998-08-05 2005-10-18 Canon Kabushiki Kaisha Image pickup apparatus
EP1102323B1 (en) * 1999-11-19 2012-08-15 CSEM Centre Suisse d'Electronique et de Microtechnique SA - Recherche et Développement Method for detecting electromagnetic radiation using an optoelectronic sensor
US7067603B1 (en) 1999-12-22 2006-06-27 Exxonmobil Chemical Patents Inc. Adhesive alpha-olefin inter-polymers
USRE42739E1 (en) * 2000-12-19 2011-09-27 Harusaki Technologies, Llc Imager output signal processing
US7339621B2 (en) * 2001-12-13 2008-03-04 Psion Teklogix Systems, Inc. Imager output signal processing
JP4114540B2 (ja) * 2003-05-21 2008-07-09 日産自動車株式会社 イメージセンサー
EP1659778A1 (en) 2004-11-23 2006-05-24 Dialog Semiconductor GmbH A column averaging/row binning circuit for image sensor resolution adjustment in lower intensity light environment
EP1659776A1 (en) * 2004-11-23 2006-05-24 Dialog Semiconductor GmbH An image sensor having resolution adjustment employing an analog column averaging/row averaging for high intensity light or row binning for low intensity light
US7548261B2 (en) * 2004-11-30 2009-06-16 Digital Imaging Systems Gmbh Column averaging/row averaging circuit for image sensor resolution adjustment in high intensity light environment
US8213710B2 (en) * 2006-11-28 2012-07-03 Youliza, Gehts B.V. Limited Liability Company Apparatus and method for shift invariant differential (SID) image data interpolation in non-fully populated shift invariant matrix
US8040558B2 (en) 2006-11-29 2011-10-18 Youliza, Gehts B.V. Limited Liability Company Apparatus and method for shift invariant differential (SID) image data interpolation in fully populated shift invariant matrix
US10132925B2 (en) * 2010-09-15 2018-11-20 Ascentia Imaging, Inc. Imaging, fabrication and measurement systems and methods
JP6396214B2 (ja) 2012-01-03 2018-09-26 アセンティア イメージング， インコーポレイテッド 符号化ローカライゼーションシステム、方法および装置
US9739864B2 (en) 2012-01-03 2017-08-22 Ascentia Imaging, Inc. Optical guidance systems and methods using mutually distinct signal-modifying
US10126114B2 (en) 2015-05-21 2018-11-13 Ascentia Imaging, Inc. Angular localization system, associated repositionable mechanical structure, and associated method
US9654711B2 (en) * 2015-09-17 2017-05-16 Sony Semiconductor Solutions Corporation Power reduction for image sensor with raw image scaler
JP6879287B2 (ja) 2018-11-26 2021-06-02 株式会社デンソー 高周波スイッチ
CN115603755A (zh) * 2021-06-28 2023-01-13 恩智浦有限公司（Nl） ∑δ调制器及其方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2666714A1 (fr) * 1990-09-07 1992-03-13 Thomson Composants Militaires Detecteur d'image a pixels de grandes dimensions.
DE4123203C1 (en) * 1991-07-13 1992-10-29 Eligiusz Dipl.-Ing. 7538 Keltern De Wajda Solid state image converter - has radiation sensitive surface with regions of various densities of distribution of elements i.e. of different levels of resolution
US5659315A (en) * 1992-05-19 1997-08-19 Mandl; William J. Method and apparatus for multiplexed oversampled analog to digital modulation
US5302824A (en) * 1992-12-01 1994-04-12 Hughes Aircraft Company Measurement of relative detector gain
DE69426253T2 (de) * 1993-10-04 2001-06-21 Raytheon Co., Lexington Optisches System mit Kompensation des Bildebenenarrays
JP3550599B2 (ja) * 1994-02-03 2004-08-04 株式会社ニコン イメージセンサーシステム
DE19524577C2 (de) * 1994-10-12 1998-01-15 Karl Voelker Stiftung Der Fth Sensor für CCD-Kamera
JP2746154B2 (ja) * 1994-12-07 1998-04-28 日本電気株式会社 固体撮像素子
FR2735632B1 (fr) * 1995-06-14 1997-07-11 Commissariat Energie Atomique Dispositif et procede de numerisation pour detecteurs photosensibles et procede de lecture d'une matrice de detecteurs photoniques

Also Published As

Publication number Publication date
WO1998047280A1 (de) 1998-10-22
DE19715214C1 (de) 1998-07-02
US6104844A (en) 2000-08-15
EP0974226A1 (de) 2000-01-26
DE59802728D1 (de) 2002-02-21
JP2002502562A (ja) 2002-01-22
EP0974226B1 (de) 2001-11-21
KR20010006248A (ko) 2001-01-26

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