TW373147B - Integrated management for semiconductor process data - Google Patents
Integrated management for semiconductor process dataInfo
- Publication number
- TW373147B TW373147B TW087110464A TW87110464A TW373147B TW 373147 B TW373147 B TW 373147B TW 087110464 A TW087110464 A TW 087110464A TW 87110464 A TW87110464 A TW 87110464A TW 373147 B TW373147 B TW 373147B
- Authority
- TW
- Taiwan
- Prior art keywords
- integrated management
- process data
- semiconductor process
- semiconductor
- semiconductor fabrication
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67276—Production flow monitoring, e.g. for increasing throughput
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Programme-control systems
- G05B19/02—Programme-control systems electric
- G05B19/418—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS], computer integrated manufacturing [CIM]
- G05B19/41845—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS], computer integrated manufacturing [CIM] characterised by system universality, reconfigurability, modularity
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B2219/00—Program-control systems
- G05B2219/30—Nc systems
- G05B2219/31—From computer integrated manufacturing till monitoring
- G05B2219/31427—Production, CAPM computer aided production management
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
- Y02P90/02—Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019980002895A KR100297371B1 (ko) | 1998-02-03 | 1998-02-03 | 반도체 공정 데이터 통합 관리 방법 |
Publications (1)
Publication Number | Publication Date |
---|---|
TW373147B true TW373147B (en) | 1999-11-01 |
Family
ID=19532382
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW087110464A TW373147B (en) | 1998-02-03 | 1998-06-29 | Integrated management for semiconductor process data |
Country Status (5)
Country | Link |
---|---|
US (1) | US6240331B1 (zh) |
JP (1) | JP3370281B2 (zh) |
KR (1) | KR100297371B1 (zh) |
CN (1) | CN1135491C (zh) |
TW (1) | TW373147B (zh) |
Families Citing this family (27)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6349341B1 (en) * | 1998-07-30 | 2002-02-19 | Advanced Micro Devices, Inc. | Method and system for providing inter-tier application control in a multi-tiered computing environment |
JP2000176799A (ja) * | 1998-12-08 | 2000-06-27 | Toshiba Corp | 生産製造計画システム |
US6640151B1 (en) | 1999-12-22 | 2003-10-28 | Applied Materials, Inc. | Multi-tool control system, method and medium |
WO2001082055A1 (en) * | 2000-04-25 | 2001-11-01 | Pri Automation, Inc. | Reticle management system |
US6952656B1 (en) * | 2000-04-28 | 2005-10-04 | Applied Materials, Inc. | Wafer fabrication data acquisition and management systems |
US6708074B1 (en) * | 2000-08-11 | 2004-03-16 | Applied Materials, Inc. | Generic interface builder |
US7188142B2 (en) | 2000-11-30 | 2007-03-06 | Applied Materials, Inc. | Dynamic subject information generation in message services of distributed object systems in a semiconductor assembly line facility |
US20020152046A1 (en) * | 2001-04-13 | 2002-10-17 | Velichko Sergey A. | Concurrent control of semiconductor parametric testing |
US7337088B2 (en) * | 2001-05-23 | 2008-02-26 | Micron Technology, Inc. | Intelligent measurement modular semiconductor parametric test system |
US7101799B2 (en) * | 2001-06-19 | 2006-09-05 | Applied Materials, Inc. | Feedforward and feedback control for conditioning of chemical mechanical polishing pad |
US7160739B2 (en) | 2001-06-19 | 2007-01-09 | Applied Materials, Inc. | Feedback control of a chemical mechanical polishing device providing manipulation of removal rate profiles |
US7698012B2 (en) | 2001-06-19 | 2010-04-13 | Applied Materials, Inc. | Dynamic metrology schemes and sampling schemes for advanced process control in semiconductor processing |
US7082345B2 (en) * | 2001-06-19 | 2006-07-25 | Applied Materials, Inc. | Method, system and medium for process control for the matching of tools, chambers and/or other semiconductor-related entities |
US6721618B2 (en) * | 2001-06-29 | 2004-04-13 | Miracom, Inc. | System and method for automatically generating semiconductor equipment communication standard (SECS) message source in SECS communication |
US7337019B2 (en) * | 2001-07-16 | 2008-02-26 | Applied Materials, Inc. | Integration of fault detection with run-to-run control |
TWI259341B (en) * | 2001-10-01 | 2006-08-01 | Semiconductor Energy Lab | Production system and method for a composite product |
US20030199112A1 (en) | 2002-03-22 | 2003-10-23 | Applied Materials, Inc. | Copper wiring module control |
US7162386B2 (en) | 2002-04-25 | 2007-01-09 | Micron Technology, Inc. | Dynamically adaptable semiconductor parametric testing |
US20040063224A1 (en) * | 2002-09-18 | 2004-04-01 | Applied Materials, Inc. | Feedback control of a chemical mechanical polishing process for multi-layered films |
WO2004046835A2 (en) | 2002-11-15 | 2004-06-03 | Applied Materials, Inc. | Method, system and medium for controlling manufacture process having multivariate input parameters |
US7010451B2 (en) * | 2003-04-17 | 2006-03-07 | Micron Technology, Inc. | Dynamic creation and modification of wafer test maps during wafer testing |
US6999897B2 (en) * | 2004-03-11 | 2006-02-14 | Powerchip Semiconductor Corp. | Method and related system for semiconductor equipment early warning management |
US8050793B1 (en) * | 2006-04-04 | 2011-11-01 | Advanced Micro Devices, Inc. | Method and apparatus for linking reticle manufacturing data |
JP4867537B2 (ja) * | 2006-09-19 | 2012-02-01 | 株式会社日立製作所 | 遠隔保守方法,産業用機器、および半導体装置 |
CN102542394A (zh) * | 2010-12-29 | 2012-07-04 | 沈阳中科博微自动化技术有限公司 | 半导体设备权限管理的方法 |
US8849440B2 (en) | 2012-05-31 | 2014-09-30 | International Business Machines Corporation | Manufacturing control based on a final design structure incorporating both layout and client-specific manufacturing information |
CN105491144A (zh) * | 2015-12-16 | 2016-04-13 | 新奥光伏能源有限公司 | 一种太阳能电池生产线及其远程控制方法与系统 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5606693A (en) * | 1991-10-02 | 1997-02-25 | International Business Machines Corporation | Distributed database management over a network |
JPH07141005A (ja) * | 1993-06-21 | 1995-06-02 | Hitachi Ltd | 半導体集積回路装置の製造方法および製造装置 |
US5777901A (en) * | 1995-09-29 | 1998-07-07 | Advanced Micro Devices, Inc. | Method and system for automated die yield prediction in semiconductor manufacturing |
US5778386A (en) * | 1996-05-28 | 1998-07-07 | Taiwan Semiconductor Manufacturing Company Ltd. | Global view storage management system for semiconductor manufacturing plants |
JPH10173021A (ja) * | 1996-12-12 | 1998-06-26 | Mitsubishi Electric Corp | 製造ライン解析方法及び製造ライン解析装置 |
-
1998
- 1998-02-03 KR KR1019980002895A patent/KR100297371B1/ko not_active IP Right Cessation
- 1998-06-29 TW TW087110464A patent/TW373147B/zh not_active IP Right Cessation
- 1998-08-18 US US09/135,652 patent/US6240331B1/en not_active Expired - Lifetime
- 1998-08-19 CN CNB981184618A patent/CN1135491C/zh not_active Expired - Fee Related
- 1998-08-24 JP JP23696798A patent/JP3370281B2/ja not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
JP3370281B2 (ja) | 2003-01-27 |
KR19990068948A (ko) | 1999-09-06 |
CN1225466A (zh) | 1999-08-11 |
CN1135491C (zh) | 2004-01-21 |
US6240331B1 (en) | 2001-05-29 |
KR100297371B1 (ko) | 2001-10-25 |
JPH11238658A (ja) | 1999-08-31 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |