TW353798B - Method of producing landed layer of via - Google Patents

Method of producing landed layer of via

Info

Publication number
TW353798B
TW353798B TW086117761A TW86117761A TW353798B TW 353798 B TW353798 B TW 353798B TW 086117761 A TW086117761 A TW 086117761A TW 86117761 A TW86117761 A TW 86117761A TW 353798 B TW353798 B TW 353798B
Authority
TW
Taiwan
Prior art keywords
layer
landed
producing
forming
semiconductor substrate
Prior art date
Application number
TW086117761A
Other languages
Chinese (zh)
Inventor
zong-han Li
Original Assignee
United Microelectronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by United Microelectronics Corp filed Critical United Microelectronics Corp
Priority to TW086117761A priority Critical patent/TW353798B/en
Application granted granted Critical
Publication of TW353798B publication Critical patent/TW353798B/en

Links

Landscapes

  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)

Abstract

A method of producing a landed layer of via, which comprises the following steps: providing a semiconductor substrate; forming a landed layer on the semiconductor substrate; forming a wiring line on the landed layer; forming an inter-metallic dielectric layer on the wiring line, the landed layer and the semiconductor substrate; and removing a portion of the inter-metallic dielectric layer thereby forming at least a via and exposing the wiring line.
TW086117761A 1997-11-26 1997-11-26 Method of producing landed layer of via TW353798B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW086117761A TW353798B (en) 1997-11-26 1997-11-26 Method of producing landed layer of via

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW086117761A TW353798B (en) 1997-11-26 1997-11-26 Method of producing landed layer of via

Publications (1)

Publication Number Publication Date
TW353798B true TW353798B (en) 1999-03-01

Family

ID=57940171

Family Applications (1)

Application Number Title Priority Date Filing Date
TW086117761A TW353798B (en) 1997-11-26 1997-11-26 Method of producing landed layer of via

Country Status (1)

Country Link
TW (1) TW353798B (en)

Similar Documents

Publication Publication Date Title
TW373256B (en) A semiconductor device having discontinuous insulating regions and the manufacturing method thereof
TW344892B (en) Method of forming a semiconductor metallization system and structure therefor
HU9500783D0 (en) Method and apparatus for producing integrated circuit devices
AU6015596A (en) Semiconductor device, wiring board for mounting semiconducto r and method of production of semiconductor device
EP0738014A3 (en) Manufacturing method of semiconductor device having capacitor
EP1073106A3 (en) Method for reducing oxidation of an interface of a semiconductor device and resulting device
EP0853337A4 (en) Method and mold for manufacturing semiconductor device, semiconductor device, and method for mounting the device
WO2003034484A3 (en) A method for forming a layered semiconductor structure and corresponding structure
TW345742B (en) Method for producing integrated circuit capacitor
TW356572B (en) Method for forming metal wiring of semiconductor devices
MY118901A (en) Method for manufacturing a photoresist pattern defining a small opening and method for manufacturing semiconductor device using the same
TW358986B (en) Metal layer patterns of a semiconductor device and a method for forming the same
TW346664B (en) Mixed-mode IC separated spacer structure and process for producing the same
TW357405B (en) Method for pre-shaping a semiconductor substrate for polishing and structure
EP0365854A3 (en) Semiconductor device having a multi-layered wiring structure
TW353798B (en) Method of producing landed layer of via
EP0851490A3 (en) Semiconductor device and process for production thereof
TW349251B (en) Semiconductor device and process for producing the same
AU6341396A (en) Method for characterizing defects on semiconductor wafers
TW327237B (en) Semiconductor device and method for forming the same
TW337610B (en) Structure with reduced stress between a spin-on-glass layer and a metal layer and process for producing the same
TW346661B (en) A method for manufacturing a semiconductor device
TW345695B (en) Process for producing gate oxide layer
TW374853B (en) Dry etching method of thin film and method for manufacturing thin film semiconductor device
TW331699B (en) Fabricating a surface laminar circuit