TW306626U - Test device for short circuit in between layers - Google Patents

Test device for short circuit in between layers

Info

Publication number
TW306626U
TW306626U TW085216669U TW85216669U TW306626U TW 306626 U TW306626 U TW 306626U TW 085216669 U TW085216669 U TW 085216669U TW 85216669 U TW85216669 U TW 85216669U TW 306626 U TW306626 U TW 306626U
Authority
TW
Taiwan
Prior art keywords
layers
short circuit
test device
test
short
Prior art date
Application number
TW085216669U
Other languages
Chinese (zh)
Inventor
Ping Zhang
Original Assignee
Extech Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Extech Electronics Co Ltd filed Critical Extech Electronics Co Ltd
Priority to TW085216669U priority Critical patent/TW306626U/en
Publication of TW306626U publication Critical patent/TW306626U/en

Links

TW085216669U 1996-10-30 1996-10-30 Test device for short circuit in between layers TW306626U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW085216669U TW306626U (en) 1996-10-30 1996-10-30 Test device for short circuit in between layers

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW085216669U TW306626U (en) 1996-10-30 1996-10-30 Test device for short circuit in between layers

Publications (1)

Publication Number Publication Date
TW306626U true TW306626U (en) 1997-05-21

Family

ID=54618896

Family Applications (1)

Application Number Title Priority Date Filing Date
TW085216669U TW306626U (en) 1996-10-30 1996-10-30 Test device for short circuit in between layers

Country Status (1)

Country Link
TW (1) TW306626U (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8441264B2 (en) 2009-10-16 2013-05-14 Industrial Technology Research Institute Station for detecting winding products and method for detecting inter-turn short circuit
TWI772075B (en) * 2020-08-06 2022-07-21 孕龍科技股份有限公司 Electric circuit line quality detection device
US11555849B2 (en) 2020-08-06 2023-01-17 Zeroplus Technology Co., Ltd. Detection device for detecting line quality of electric circuit

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8441264B2 (en) 2009-10-16 2013-05-14 Industrial Technology Research Institute Station for detecting winding products and method for detecting inter-turn short circuit
TWI772075B (en) * 2020-08-06 2022-07-21 孕龍科技股份有限公司 Electric circuit line quality detection device
US11555849B2 (en) 2020-08-06 2023-01-17 Zeroplus Technology Co., Ltd. Detection device for detecting line quality of electric circuit

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