TW283764B - Built-in self-test method for edge scanning circuit and the edge scanning circuit with built-in self-test capability - Google Patents
Built-in self-test method for edge scanning circuit and the edge scanning circuit with built-in self-test capabilityInfo
- Publication number
- TW283764B TW283764B TW84106200A TW84106200A TW283764B TW 283764 B TW283764 B TW 283764B TW 84106200 A TW84106200 A TW 84106200A TW 84106200 A TW84106200 A TW 84106200A TW 283764 B TW283764 B TW 283764B
- Authority
- TW
- Taiwan
- Prior art keywords
- edge scanning
- built
- self
- output
- test
- Prior art date
Links
Landscapes
- Test And Diagnosis Of Digital Computers (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
An edge scanning circuit with built-in self-test capability contains a logic circuit, plural serial input edge scanning cells, plural serial output edge scanning cells, and an acquisition port system for controlling the aforementioned cells. The plural serial input edge scanning cells connected with the input nodes of the logic circuit forms the input edge scanning registers. The plural serial output edge scanning cells connected with the output nodes of the logic circuit forms the output edge scanning registers. A built-in self-test method for edge scanning circuit includes the following steps. The acquisition port system offers a built-in self-test signal to the input and output edge scanning cells when the test starts. Upon receiving the test signal, recombine the input edge scanning registers to be a test sample generator for providing the logic circuit with the test sample within a period of certain clock number. Then recombine the output edge scanning registers to be an output response analyzer driven by the logic circuit within a period of certain clock number. Finally, scan the contents of the output registers and compare it with the prearranged pattern to detect the errors after the period of the certain clock number is finished.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW84106200A TW283764B (en) | 1995-06-16 | 1995-06-16 | Built-in self-test method for edge scanning circuit and the edge scanning circuit with built-in self-test capability |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW84106200A TW283764B (en) | 1995-06-16 | 1995-06-16 | Built-in self-test method for edge scanning circuit and the edge scanning circuit with built-in self-test capability |
Publications (1)
Publication Number | Publication Date |
---|---|
TW283764B true TW283764B (en) | 1996-08-21 |
Family
ID=51397804
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW84106200A TW283764B (en) | 1995-06-16 | 1995-06-16 | Built-in self-test method for edge scanning circuit and the edge scanning circuit with built-in self-test capability |
Country Status (1)
Country | Link |
---|---|
TW (1) | TW283764B (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI588503B (en) * | 2016-12-23 | 2017-06-21 | 英業達股份有限公司 | Testing circuit board with self-detection function and self-detection method thereof |
-
1995
- 1995-06-16 TW TW84106200A patent/TW283764B/en not_active IP Right Cessation
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI588503B (en) * | 2016-12-23 | 2017-06-21 | 英業達股份有限公司 | Testing circuit board with self-detection function and self-detection method thereof |
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Legal Events
Date | Code | Title | Description |
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MK4A | Expiration of patent term of an invention patent |