TW283764B - Built-in self-test method for edge scanning circuit and the edge scanning circuit with built-in self-test capability - Google Patents

Built-in self-test method for edge scanning circuit and the edge scanning circuit with built-in self-test capability

Info

Publication number
TW283764B
TW283764B TW84106200A TW84106200A TW283764B TW 283764 B TW283764 B TW 283764B TW 84106200 A TW84106200 A TW 84106200A TW 84106200 A TW84106200 A TW 84106200A TW 283764 B TW283764 B TW 283764B
Authority
TW
Taiwan
Prior art keywords
edge scanning
built
self
output
test
Prior art date
Application number
TW84106200A
Other languages
Chinese (zh)
Inventor
Chinq-Horng Tsay
Fang-Diann Guo
Horng-Jinn-Hwa
Cherng-Wenn Wu
Original Assignee
Nat Science Council
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nat Science Council filed Critical Nat Science Council
Priority to TW84106200A priority Critical patent/TW283764B/en
Application granted granted Critical
Publication of TW283764B publication Critical patent/TW283764B/en

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  • Test And Diagnosis Of Digital Computers (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

An edge scanning circuit with built-in self-test capability contains a logic circuit, plural serial input edge scanning cells, plural serial output edge scanning cells, and an acquisition port system for controlling the aforementioned cells. The plural serial input edge scanning cells connected with the input nodes of the logic circuit forms the input edge scanning registers. The plural serial output edge scanning cells connected with the output nodes of the logic circuit forms the output edge scanning registers. A built-in self-test method for edge scanning circuit includes the following steps. The acquisition port system offers a built-in self-test signal to the input and output edge scanning cells when the test starts. Upon receiving the test signal, recombine the input edge scanning registers to be a test sample generator for providing the logic circuit with the test sample within a period of certain clock number. Then recombine the output edge scanning registers to be an output response analyzer driven by the logic circuit within a period of certain clock number. Finally, scan the contents of the output registers and compare it with the prearranged pattern to detect the errors after the period of the certain clock number is finished.
TW84106200A 1995-06-16 1995-06-16 Built-in self-test method for edge scanning circuit and the edge scanning circuit with built-in self-test capability TW283764B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW84106200A TW283764B (en) 1995-06-16 1995-06-16 Built-in self-test method for edge scanning circuit and the edge scanning circuit with built-in self-test capability

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW84106200A TW283764B (en) 1995-06-16 1995-06-16 Built-in self-test method for edge scanning circuit and the edge scanning circuit with built-in self-test capability

Publications (1)

Publication Number Publication Date
TW283764B true TW283764B (en) 1996-08-21

Family

ID=51397804

Family Applications (1)

Application Number Title Priority Date Filing Date
TW84106200A TW283764B (en) 1995-06-16 1995-06-16 Built-in self-test method for edge scanning circuit and the edge scanning circuit with built-in self-test capability

Country Status (1)

Country Link
TW (1) TW283764B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI588503B (en) * 2016-12-23 2017-06-21 英業達股份有限公司 Testing circuit board with self-detection function and self-detection method thereof

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI588503B (en) * 2016-12-23 2017-06-21 英業達股份有限公司 Testing circuit board with self-detection function and self-detection method thereof

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