TW281776B - - Google Patents
Info
- Publication number
- TW281776B TW281776B TW083102421A TW83102421A TW281776B TW 281776 B TW281776 B TW 281776B TW 083102421 A TW083102421 A TW 083102421A TW 83102421 A TW83102421 A TW 83102421A TW 281776 B TW281776 B TW 281776B
- Authority
- TW
- Taiwan
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
- G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
- G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
- G01P15/0894—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values by non-contact electron transfer, i.e. electron tunneling
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
- G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
- G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
- G01P15/0802—Details
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S438/00—Semiconductor device manufacturing: process
- Y10S438/978—Semiconductor device manufacturing: process forming tapered edges on substrate or adjacent layers
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE4311121 | 1993-04-05 |
Publications (1)
Publication Number | Publication Date |
---|---|
TW281776B true TW281776B (zh) | 1996-07-21 |
Family
ID=6484761
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW083102421A TW281776B (zh) | 1993-04-05 | 1994-03-19 |
Country Status (6)
Country | Link |
---|---|
US (1) | US5472916A (zh) |
EP (1) | EP0619495B1 (zh) |
JP (1) | JP3614460B2 (zh) |
KR (1) | KR100303386B1 (zh) |
DE (1) | DE59402800D1 (zh) |
TW (1) | TW281776B (zh) |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE59505439D1 (de) * | 1994-01-18 | 1999-04-29 | Siemens Ag | Tunneleffekt-sensor |
US5596194A (en) * | 1994-08-19 | 1997-01-21 | Hughes Aircraft Company | Single-wafer tunneling sensor and low-cost IC manufacturing method |
US5578843A (en) * | 1994-10-06 | 1996-11-26 | Kavlico Corporation | Semiconductor sensor with a fusion bonded flexible structure |
US5966617A (en) * | 1996-09-20 | 1999-10-12 | Kavlico Corporation | Multiple local oxidation for surface micromachining |
TW317651B (en) * | 1996-12-19 | 1997-10-11 | Mos Electronics Taiwan Inc | Method of preventing wafer edge region from generating peeling phenomena |
DE19915156A1 (de) * | 1999-03-27 | 2000-09-28 | Inst Halbleiterphysik Gmbh | Verfahren zur Herstellung dünner gleichförmiger Oxidschichten auf Silizium-Oberflächen |
US6580138B1 (en) | 2000-08-01 | 2003-06-17 | Hrl Laboratories, Llc | Single crystal, dual wafer, tunneling sensor or switch with silicon on insulator substrate and a method of making same |
US6674141B1 (en) | 2000-08-01 | 2004-01-06 | Hrl Laboratories, Llc | Single crystal, tunneling and capacitive, three-axes sensor using eutectic bonding and a method of making same |
US6555404B1 (en) | 2000-08-01 | 2003-04-29 | Hrl Laboratories, Llc | Method of manufacturing a dual wafer tunneling gyroscope |
US6630367B1 (en) | 2000-08-01 | 2003-10-07 | Hrl Laboratories, Llc | Single crystal dual wafer, tunneling sensor and a method of making same |
US6563184B1 (en) | 2000-08-01 | 2003-05-13 | Hrl Laboratories, Llc | Single crystal tunneling sensor or switch with silicon beam structure and a method of making same |
US6800912B2 (en) * | 2001-05-18 | 2004-10-05 | Corporation For National Research Initiatives | Integrated electromechanical switch and tunable capacitor and method of making the same |
US7118935B2 (en) * | 2003-03-31 | 2006-10-10 | Intel Corporation | Bump style MEMS switch |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5249772A (en) * | 1975-10-18 | 1977-04-21 | Hitachi Ltd | Process for production of semiconductor device |
FR2554638A1 (fr) * | 1983-11-04 | 1985-05-10 | Efcis | Procede de fabrication de structures integrees de silicium sur ilots isoles du substrat |
NL8400297A (nl) * | 1984-02-01 | 1985-09-02 | Philips Nv | Halfgeleiderinrichting voor het opwekken van een elektronenbundel. |
US4638669A (en) * | 1985-05-07 | 1987-01-27 | Massachusetts Institute Of Technology | Quantum tunneling cantilever accelerometer |
FR2599833B1 (fr) * | 1986-06-10 | 1992-02-14 | Metravib Sa | Capteur de grandeurs mecaniques integre sur silicium et procede de fabrication |
US4874463A (en) * | 1988-12-23 | 1989-10-17 | At&T Bell Laboratories | Integrated circuits from wafers having improved flatness |
US4943343A (en) * | 1989-08-14 | 1990-07-24 | Zaher Bardai | Self-aligned gate process for fabricating field emitter arrays |
EP0434330A3 (en) * | 1989-12-18 | 1991-11-06 | Seiko Epson Corporation | Field emission device and process for producing the same |
US5266530A (en) * | 1991-11-08 | 1993-11-30 | Bell Communications Research, Inc. | Self-aligned gated electron field emitter |
US5358908A (en) * | 1992-02-14 | 1994-10-25 | Micron Technology, Inc. | Method of creating sharp points and other features on the surface of a semiconductor substrate |
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1994
- 1994-03-09 EP EP94103621A patent/EP0619495B1/de not_active Expired - Lifetime
- 1994-03-09 DE DE59402800T patent/DE59402800D1/de not_active Expired - Fee Related
- 1994-03-19 TW TW083102421A patent/TW281776B/zh active
- 1994-03-25 US US08/217,854 patent/US5472916A/en not_active Expired - Lifetime
- 1994-03-31 JP JP08582794A patent/JP3614460B2/ja not_active Expired - Fee Related
- 1994-04-04 KR KR1019940007061A patent/KR100303386B1/ko not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
EP0619495A1 (de) | 1994-10-12 |
JP3614460B2 (ja) | 2005-01-26 |
DE59402800D1 (de) | 1997-06-26 |
KR100303386B1 (ko) | 2001-11-30 |
US5472916A (en) | 1995-12-05 |
EP0619495B1 (de) | 1997-05-21 |
JPH06350106A (ja) | 1994-12-22 |