TW270176B - Process of using synchronous radiation light source of X-ray Absorption Near Edge Spectrum to measure amorphous material and device of using the same - Google Patents
Process of using synchronous radiation light source of X-ray Absorption Near Edge Spectrum to measure amorphous material and device of using the sameInfo
- Publication number
- TW270176B TW270176B TW84104108A TW84104108A TW270176B TW 270176 B TW270176 B TW 270176B TW 84104108 A TW84104108 A TW 84104108A TW 84104108 A TW84104108 A TW 84104108A TW 270176 B TW270176 B TW 270176B
- Authority
- TW
- Taiwan
- Prior art keywords
- ray absorption
- measured
- light source
- radiation light
- near edge
- Prior art date
Links
Abstract
A process of using synchronous radiation light source of X-ray Absorption Near Edge Spectrum to measure amorphous material, which comprises the following steps: (1) using synchronous radiation light source to generate an X-ray emission beam; (2) according the specific absorption spectrum range of elements of the material to be measured, selecting the wave number or energy of the X-ray beam, in which the generated X-ray absorption spectroscopy (XAS) includes: X-ray Absorption Near Edge Spectrum (XANES) and Extended X-ray Absorption Fine Structure (EXAFS); (3) monitoring the intensity of the incident XAS and performing scanning on the material to be measured so as to obtain at least one reference sample after scanning; and (4) based on the measured data such as phase change and refracted diffusion amplitude, etc. of the reference sample, comparing the data with the EXAFS and XANES of standard data of known material to be measured so as to analyze the correlation of the area structure and its material structure with the performance of the material to be measured.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW84104108A TW270176B (en) | 1995-04-26 | 1995-04-26 | Process of using synchronous radiation light source of X-ray Absorption Near Edge Spectrum to measure amorphous material and device of using the same |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW84104108A TW270176B (en) | 1995-04-26 | 1995-04-26 | Process of using synchronous radiation light source of X-ray Absorption Near Edge Spectrum to measure amorphous material and device of using the same |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TW270176B true TW270176B (en) | 1996-02-11 |
Family
ID=51396976
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW84104108A TW270176B (en) | 1995-04-26 | 1995-04-26 | Process of using synchronous radiation light source of X-ray Absorption Near Edge Spectrum to measure amorphous material and device of using the same |
Country Status (1)
| Country | Link |
|---|---|
| TW (1) | TW270176B (en) |
-
1995
- 1995-04-26 TW TW84104108A patent/TW270176B/en not_active IP Right Cessation
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MM4A | Annulment or lapse of patent due to non-payment of fees |